JPH02111006A - Manufacture of grain-boundary insulated semiconductor porcelain capacitor - Google Patents

Manufacture of grain-boundary insulated semiconductor porcelain capacitor

Info

Publication number
JPH02111006A
JPH02111006A JP26472088A JP26472088A JPH02111006A JP H02111006 A JPH02111006 A JP H02111006A JP 26472088 A JP26472088 A JP 26472088A JP 26472088 A JP26472088 A JP 26472088A JP H02111006 A JPH02111006 A JP H02111006A
Authority
JP
Japan
Prior art keywords
grain
semiconductor porcelain
insulated
agent
grain boundary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26472088A
Other languages
Japanese (ja)
Other versions
JPH0648665B2 (en
Inventor
Toshiaki Kachi
敏晃 加地
Hiroshi Tamura
博 田村
Masasada Maeda
昌禎 前田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP26472088A priority Critical patent/JPH0648665B2/en
Publication of JPH02111006A publication Critical patent/JPH02111006A/en
Publication of JPH0648665B2 publication Critical patent/JPH0648665B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To reduce an irregularity in a capacity of a capacitor and to prevent a characteristic from being deteriorated by a method wherein a semiconductor porcelain, a grain-boundary insulating agent and a diffusing agent to which a glass powder of 1 to 100weight% against the grain-boundary insulating agent has been added are mixed, this mixture is stirred and heat-treated, and a grain boundaries of the semiconductor porcelain are insulated. CONSTITUTION:A semiconductor porcelain, a grain-boundary insulating agent used to make grain boundaries of the semiconductor porcelain insulated and a diffusing agent to which a glass powder of 1 to 100weight% against the grain-boundary insulating agent has been added are mixed; while this mixture is being stirred, it is heat- treated; grain boundaries of the semiconductor porcelain are insulated. Plated electrodes are formed on both main surfaces of the semiconductor porcelain whose grain boundary has been insulated. The semiconductor porcelain, the grain-boundary insulating agent and the diffusing agent composed of the glass powder are mixed; while this mixture is being stirred, it is heated; the grain boundaries of the semiconductor porcelain are insulated; accordingly, a coating amount of the diffusing agent and a heat distribution during a heat treatment are made uniform; it is possible to eliminate an irregularity in a diffusion energy.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、電極としてメッキ電極を用いる粒界絶縁型半
導体磁器コンデンサの製造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method of manufacturing a grain boundary insulated semiconductor ceramic capacitor using a plated electrode as an electrode.

(従来技術) 従来、この種の粒界絶縁型半導体磁器コンデンサの製造
方法には、特開昭57−30310号公報に記載された
ものがある。
(Prior Art) A conventional method for manufacturing this type of grain boundary insulated semiconductor ceramic capacitor is described in Japanese Patent Laid-Open No. 57-30310.

この粒界絶縁型磁器コンデンサの製造方法は、粒界絶縁
型半導体磁器コンデンサの電極としてこれまで用いてき
た銀電極に代わる低コストのメッキ電極を用いるために
案出されたものである。
This method of manufacturing a grain boundary insulated ceramic capacitor was devised to use a low-cost plated electrode in place of the silver electrode that has been used hitherto as an electrode for a grain boundary insulated semiconductor ceramic capacitor.

具体的には、チタン酸ストロンチウムを主体とする半導
体磁器に、ビスマス、銅、鉛、ホウ素などからなる粒界
絶縁化剤とガラス粉末とを混合してなる拡散剤を塗布し
、熱拡散して粒界を絶縁化したのち、両主表面に無電解
メッキによってメッキ電極を形成するものである。
Specifically, a diffusing agent made by mixing a grain boundary insulating agent made of bismuth, copper, lead, boron, etc. and glass powder is applied to semiconductor porcelain mainly made of strontium titanate, and then thermally diffused. After insulating the grain boundaries, plating electrodes are formed on both main surfaces by electroless plating.

(従来技術の問題点) しかしながら、上述した粒界絶縁型半導体磁器コンデン
サの製造方法では、粒界絶縁化剤とガラス粉末とを混合
した拡散剤を塗布する工程があるために、工程数が増え
、コストも増加した。
(Problems with the prior art) However, in the method for manufacturing the grain boundary insulated semiconductor ceramic capacitor described above, the number of steps increases because there is a step of applying a diffusion agent that is a mixture of a grain boundary insulating agent and glass powder. , costs also increased.

また、拡散剤の塗布量や熱処理時の熱分布のバラツキに
よって生じる拡散剤の拡散エネルギーのバラツキ、ある
いは拡散剤が塗布された部分とされない部分があること
によるガラス粉末の拡散度合の変化によって、コンデン
サの容量にバラツキが生じ特性が劣化することがあった
In addition, variations in the diffusion energy of the diffusing agent caused by variations in the amount of the diffusing agent applied or the heat distribution during heat treatment, or changes in the degree of diffusion of the glass powder due to the fact that some parts are coated with the diffusing agent and others are not, can cause damage to the capacitor. There were cases where variations occurred in the capacity and the characteristics deteriorated.

さらに、拡散エネルギーのバラツキによって、粒子間に
拡散剤が不均一に介在するため、結合強度にもバラツキ
が生じ抗折強度が弱く、メッキ工程でワレやカケなどの
不良が生じることがあった。
Furthermore, due to variations in diffusion energy, the diffusing agent is unevenly interposed between particles, resulting in variations in bonding strength, resulting in weak bending strength, which may result in defects such as cracking and chipping during the plating process.

そこで本発明は、上述した問題点を解決しようとしたも
のであり、粒界絶縁型半導体磁器コンデンサの電極とし
てメッキ電極を用いても銀電惰と同等の電気特性、信頼
性をもち、しかも高抗折強度でメッキ工程でのワレ、カ
ケを減少することができる粒界絶縁型半導体磁器コンデ
ンサの製造方法を提供することを目的とするものである
Therefore, the present invention is an attempt to solve the above-mentioned problems, and even if plated electrodes are used as the electrodes of grain boundary insulated semiconductor ceramic capacitors, they have the same electrical characteristics and reliability as silver electrodes, and have high performance. It is an object of the present invention to provide a method for manufacturing a grain boundary insulated semiconductor ceramic capacitor that can reduce cracking and chipping during the plating process due to its bending strength.

(問題点を解決するための手段) 本発明の粒界絶縁型半導体磁器コンデンサの製造方法は
、 半導体磁器を準備する工程と、 この半導体磁器と、この半導体磁器の粒界を絶縁化する
粒界絶縁化剤およびこの粒界絶縁化剤に対して1重量5
c〜100重量%のガラス粉末を添加してなる拡散剤と
を混合して撹拌しながら熱処理し半導体磁器の粒界を絶
縁化する工程と、粒界が絶縁化された半導体磁器の両主
表面にメッキ電極を形成する工程、 とからなる。
(Means for Solving the Problems) The method for manufacturing a grain boundary insulated semiconductor ceramic capacitor of the present invention includes a step of preparing semiconductor ceramic, and a grain boundary for insulating the grain boundaries of the semiconductor ceramic and the semiconductor ceramic. 1 weight 5 for the insulating agent and this grain boundary insulating agent
c - A process of insulating the grain boundaries of the semiconductor porcelain by mixing with a diffusing agent made by adding 100% by weight of glass powder and heat-treating the mixture while stirring, and both main surfaces of the semiconductor porcelain with the grain boundaries insulated. A process of forming a plating electrode on the plated electrode.

(作用) 本発明の粒界絶縁型半導体磁器コンデンサの製造方法に
よれば、半導体磁器と、粒界絶縁化剤およびガラス粉末
とからなる拡散剤とを混合して撹拌しながら熱処理し半
導体磁器の粒界をを絶縁化するので、拡散剤の塗布量や
熱処理時の熱分布が均一となり、拡散エネルギーのバラ
ツキがなくなる。
(Function) According to the method for manufacturing a grain boundary insulated semiconductor ceramic capacitor of the present invention, semiconductor ceramics and a diffusing agent consisting of a grain boundary insulating agent and glass powder are mixed and heat-treated while stirring. Since the grain boundaries are insulated, the amount of diffusion agent applied and the heat distribution during heat treatment are uniform, and variations in diffusion energy are eliminated.

また、拡散剤が塗布されない部分がなくなるので、ガラ
ス粉末の拡散度合が変化することがなくなる。
Furthermore, since there are no areas to which the diffusing agent is applied, the degree of diffusion of the glass powder does not change.

(実施例) 以下に、本発明の粒界絶縁型半導体磁器コンデンサの製
造方法を詳細に説明する。
(Example) Below, a method for manufacturing a grain boundary insulated semiconductor ceramic capacitor of the present invention will be described in detail.

まず、5rTiO3(99、0mo1%)とY2O3(
1、Om。
First, 5rTiO3 (99, 0mo1%) and Y2O3 (
1. Om.

)%)からなる混合物を1150℃で2時間仮焼したの
ち、バインダーを加えて造粒し、直径1.0mm厚みQ
、4mmの円板状に成形した。そして、この円板状に成
形した成形物を1100℃で2時間予備焼成を行ない、
さらにN−11からなる還元雰囲気中において1430
℃で3時間焼成し、半導体磁器を得た。
)%) was calcined at 1150°C for 2 hours, a binder was added and the mixture was granulated to give a diameter of 1.0 mm and a thickness of Q.
, and was molded into a 4 mm disk shape. Then, this disc-shaped molded product was pre-fired at 1100°C for 2 hours,
Furthermore, in a reducing atmosphere consisting of N-11, 1430
It was fired at ℃ for 3 hours to obtain semiconductor porcelain.

次に、Bi−Pb−Cu−B系のガラス粉末とBi20
3−PbO−CuOとを第1表に示す割合で混合した混
合物である拡散剤を、上記半導体磁器の1.5重量%に
なるように秤量した。
Next, Bi-Pb-Cu-B glass powder and Bi20
A diffusing agent, which is a mixture of 3-PbO-CuO and 3-PbO-CuO in the proportions shown in Table 1, was weighed so as to account for 1.5% by weight of the semiconductor ceramic.

次に、この拡散剤を上記半導体磁器1000個とともに
円筒形の匣の中へ入れ、この匣が炉内で回転することに
よって匣内で半導体磁器と拡散剤を混合して撹拌しなが
ら、酸化雰囲気中、1120℃で1時間熱処理を行ない
、半導体磁器の粒界を絶縁化した。
Next, this diffusing agent is placed in a cylindrical box together with 1000 pieces of the semiconductor porcelain, and as this box rotates in the furnace, the semiconductor porcelain and the diffusing agent are mixed and stirred in the box, and an oxidizing atmosphere is created. Heat treatment was performed at 1120° C. for 1 hour to insulate the grain boundaries of the semiconductor ceramic.

次に、熱処理後の半導体磁器の端面にメッキレジストを
塗布した後、無電解メッキによって半導体磁器の両主表
面にニッケルメッキ電極を形成し、粒界絶縁型半導体磁
雅コンデンサを得た。
Next, a plating resist was applied to the end face of the heat-treated semiconductor porcelain, and then nickel-plated electrodes were formed on both main surfaces of the semiconductor porcelain by electroless plating to obtain a grain boundary insulated semiconductor magnetic capacitor.

このようにして得られた粒界絶縁型半導体磁器コンデン
サについて、静電容量(nF)、標準偏差昏尋、溶着率
(%)、抗折強度(kg)ワレ・カケ不良率(%)! および誘電損失(%)を測定し、この結果を第1表に示
した。
Regarding the grain boundary insulated semiconductor ceramic capacitor thus obtained, the capacitance (nF), standard deviation, welding rate (%), bending strength (kg), crack/chip defect rate (%)! and dielectric loss (%) were measured, and the results are shown in Table 1.

方法によって作製された粒界絶縁型半導体磁器コンデン
サである。
This is a grain boundary insulated semiconductor ceramic capacitor fabricated by this method.

また、第1表中において粒界絶縁化剤Aは13 i 2
03−PbO−CuOの組成で重量比が40:40:2
0であり、粒界絶縁化剤BはB i 203−PbO−
CuOの組成で重量比が90:2:8である。
In addition, in Table 1, grain boundary insulating agent A is 13 i 2
03-PbO-CuO composition with a weight ratio of 40:40:2
0, and the grain boundary insulating agent B is B i 203-PbO-
The CuO composition has a weight ratio of 90:2:8.

さらに、第1表中においてガラス粉末CはBi203−
PbO−CuO−B203の組成で重量比が30:30
:10:30であり、ガラス粉末りは旧203−PbO
−CuO−B203の組成で重量比が25:20:25
:30である。
Furthermore, in Table 1, glass powder C is Bi203-
PbO-CuO-B203 composition with a weight ratio of 30:30
:10:30, and the glass powder was old 203-PbO.
-CuO-B203 composition with a weight ratio of 25:20:25
:30.

この第1表から明らかなように、試料No、 l 。As is clear from this Table 1, sample No. 1.

7のようにガラス粉末の添加量が粒界絶縁化剤に対して
1重量%より小さい場合、試1111No、5.11の
ようにガラス粉末の添加量が粒界絶縁化剤に対して10
0重量%より大きい場合、または試料No。
When the amount of glass powder added is less than 1% by weight relative to the grain boundary insulating agent as in 7, the amount of glass powder added is less than 1% by weight relative to the grain boundary insulating agent as in Trial 1111No.5.11.
If it is greater than 0% by weight, or sample no.

6のように従来の製造方法で作製した場合のいずれの場
合と比較しても、静電容量のバラツキが小さく、抗折強
度も大きい。また、ワレ、カケ不良率が低いので良品率
が高くなる。
Compared to any of the cases manufactured using conventional manufacturing methods such as No. 6, the variation in capacitance is small and the bending strength is also large. In addition, since the defective rate of cracks and chips is low, the rate of non-defective products is high.

なお、本発明の説明において、無電解メッキによってニ
ッケルメッキ電極を形成したものを示したが、ニッケル
メッキ電極に限るものではなく、銅メッキ電極等でもよ
い。
In the description of the present invention, a nickel plated electrode formed by electroless plating is shown, but the present invention is not limited to a nickel plated electrode, and a copper plated electrode or the like may be used.

さらに、半導体磁器と拡散剤を混合して撹拌しながら熱
処理を行う際、匣の中に半導体磁器と拡散剤を入れ、回
転させながら熱処理を行う方法を示したが、これに限る
ものではなく、匣を前後あるいは左右に移動させながら
熱処理を行う方法でもよい。
Furthermore, when heat-treating a mixture of semiconductor porcelain and a diffusing agent while stirring, we have shown a method in which the semiconductor porcelain and diffusing agent are placed in a box and heat-treated while being rotated, but the method is not limited to this. The heat treatment may be performed while moving the box back and forth or left and right.

(発明の効果) 以上のように、本発明の粒界絶縁型半導体磁器コンデン
サの製造方法を用いれば、拡散剤の拡散エネルギーが均
一となり、安定に粒界を絶縁化することができる。また
、このことによってコンデンサの静電容量のバラツキあ
るいはワレ、カケ等の不良率を小さくすることができる
ので、粒界絶縁型半導体磁器コンデンサの信頼性を向上
することができる。
(Effects of the Invention) As described above, by using the method for manufacturing a grain boundary insulated semiconductor ceramic capacitor of the present invention, the diffusion energy of the diffusing agent becomes uniform, and grain boundaries can be stably insulated. Furthermore, this makes it possible to reduce variations in the capacitance of the capacitor or the defect rate such as cracks and chips, thereby improving the reliability of the grain boundary insulated semiconductor ceramic capacitor.

Claims (1)

【特許請求の範囲】 半導体磁器を準備する工程と、 この半導体磁器と、この半導体磁器の粒界を絶縁化する
粒界絶縁化剤およびこの粒界絶縁化剤に対して1重量%
〜100重量%のガラス粉末を添加してなる拡散剤とを
混合して撹拌しながら熱処理し半導体磁器の粒界を絶縁
化する工程と、 粒界が絶縁化された半導体磁器の両主表面にメッキ電極
を形成する工程、 とからなる粒界絶縁型半導体磁器コンデンサの製造方法
[Claims] A step of preparing semiconductor porcelain, the semiconductor porcelain, a grain boundary insulating agent for insulating the grain boundaries of the semiconductor porcelain, and 1% by weight of the grain boundary insulating agent.
A process of insulating the grain boundaries of the semiconductor porcelain by mixing with a diffusing agent made by adding ~100% by weight of glass powder and heat-treating the mixture while stirring, and a process of insulating the grain boundaries of the semiconductor porcelain on both main surfaces of the semiconductor porcelain whose grain boundaries have been insulated. A method for manufacturing a grain boundary insulated semiconductor ceramic capacitor, comprising: forming a plated electrode.
JP26472088A 1988-10-20 1988-10-20 Method for manufacturing grain boundary insulated semiconductor ceramic capacitor Expired - Fee Related JPH0648665B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26472088A JPH0648665B2 (en) 1988-10-20 1988-10-20 Method for manufacturing grain boundary insulated semiconductor ceramic capacitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26472088A JPH0648665B2 (en) 1988-10-20 1988-10-20 Method for manufacturing grain boundary insulated semiconductor ceramic capacitor

Publications (2)

Publication Number Publication Date
JPH02111006A true JPH02111006A (en) 1990-04-24
JPH0648665B2 JPH0648665B2 (en) 1994-06-22

Family

ID=17407246

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26472088A Expired - Fee Related JPH0648665B2 (en) 1988-10-20 1988-10-20 Method for manufacturing grain boundary insulated semiconductor ceramic capacitor

Country Status (1)

Country Link
JP (1) JPH0648665B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2492933A2 (en) 2011-02-24 2012-08-29 Murata Manufacturing Co., Ltd. Grain Boundary-Insulated Semiconductor Ceramic, Semiconductor Ceramic Capacitor, and Method for Producing Semiconductor Ceramic Capacitor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2492933A2 (en) 2011-02-24 2012-08-29 Murata Manufacturing Co., Ltd. Grain Boundary-Insulated Semiconductor Ceramic, Semiconductor Ceramic Capacitor, and Method for Producing Semiconductor Ceramic Capacitor
JP2012171852A (en) * 2011-02-24 2012-09-10 Murata Mfg Co Ltd Grain boundary-insulated semiconductor ceramic, semiconductor ceramic capacitor, and method for producing the semiconductor ceramic capacitor
US8476179B2 (en) 2011-02-24 2013-07-02 Murata Manufacturing Co., Ltd. Grain boundary-insulated semiconductor ceramic, semiconductor ceramic capacitor, and method for producing semiconductor ceramic capacitor

Also Published As

Publication number Publication date
JPH0648665B2 (en) 1994-06-22

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