JPH02105440A - Extension of semiconductor wafer - Google Patents

Extension of semiconductor wafer

Info

Publication number
JPH02105440A
JPH02105440A JP63258620A JP25862088A JPH02105440A JP H02105440 A JPH02105440 A JP H02105440A JP 63258620 A JP63258620 A JP 63258620A JP 25862088 A JP25862088 A JP 25862088A JP H02105440 A JPH02105440 A JP H02105440A
Authority
JP
Japan
Prior art keywords
adhesive tape
semiconductor wafer
extension
cylindrical tool
pressure air
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63258620A
Other languages
Japanese (ja)
Inventor
Takashi Togashi
冨樫 貴司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63258620A priority Critical patent/JPH02105440A/en
Publication of JPH02105440A publication Critical patent/JPH02105440A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To reduce a frictional resistance acting between an adhesive tape and a cylindrical tool for extension use and to easily obtain a stable and uniform extension amount of a wafer by a method wherein an air layer is formed between the adhesive tape and the cylindrical tool for extension use by using high-pressure air and an extension operation is executed. CONSTITUTION:A cylindrical tool 4 for extension use is provided with a flat ring 3 and a high-pressure air supply part 5. An adhesive tape 2 where a wafer 1 has been pasted is held by the flat ring 3 and is set at an end face of the cylindrical tool 4 for extension use; while high-pressure air 8 is being supplied to the inside of the cylindrical tool 4 for extension use from the high-pressure supply part 5, a load 6 is applied to the flat ring 3 and a semiconductor wafer 1 is extended. During this process, the high-pressure air 8 supplied to the inside of the cylindrical tool 4 pushes the semiconductor wafer 1 upward, tries to escape to the outside through the end face and forms an air layer 7; since a frictional resistance between the adhesive tape 2 and the end face of the cylindrical tool 4 for extension use can be reduced remarkably, a uniform extension stroke is always given to the adhesive tape 2; the semiconductor wafer can be divided smoothly into elements while equal intervals are being kept.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体ウェハースの引伸し方法に関し、特に粘
着テープを介するウェハースの引伸し方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for stretching a semiconductor wafer, and more particularly to a method for stretching a wafer through an adhesive tape.

〔従来の技術〕[Conventional technology]

従来、半導体ウェハースを引伸すには、第2図に示すよ
うに、フラットリング3が保持する粘着テープ2を、フ
ッ素系樹脂でコーティング9を施すとか、又は複数個の
ベアリングを取付ける等の手段を設けて周辺部で清ら・
かに運動できるようにした引伸し用円筒具4を用い、こ
の端面上を滑らせながら引伸す方法がとられている。
Conventionally, in order to stretch a semiconductor wafer, as shown in FIG. 2, methods such as coating the adhesive tape 2 held by the flat ring 3 with a fluororesin 9 or attaching a plurality of bearings have been used. Set it up and clean it in the surrounding area.
A method is used in which a cylindrical enlarging tool 4, which can be moved in a straight line, is used and the enlarging tool is slid on the end surface of the enlarging tool.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、上述した従来のウェハースの引伸し方法
は、引伸し用円筒具4の端面に粘着テープ2が直接接し
た状態で引伸しが行われる為、矢印の如く荷重6を加え
たとき両者の接点に摩擦抵抗が生じ、この摩擦抵抗によ
り引伸し力が接点より内側にある粘着テープ2に十分に
作用せVに外側に大きく働き、接点より外側が内側より
多く伸びる。その結果、実際に必要とされるウェハース
の引伸し量を得る為には、必要量以上の引伸しストロー
ツで粘着テープ2を引伸す必要があり、安定した引伸し
量を確保する事が難しいという欠点がある。特に引伸し
ストロークの限られた装置では、半導体装置の組立に必
要十分な引伸し量が得られない場合がある。
However, in the conventional wafer stretching method described above, stretching is performed with the adhesive tape 2 in direct contact with the end surface of the cylindrical tool 4 for stretching, so when a load 6 is applied as shown by the arrow, frictional resistance is generated at the contact point between the two. Due to this frictional resistance, a stretching force sufficiently acts on the adhesive tape 2 located inside the contact point, exerting a large outward force on V, and the outside of the contact point stretches more than the inside. As a result, in order to obtain the actually required amount of stretching of the wafer, it is necessary to stretch the adhesive tape 2 with more stretching strokes than the required amount, which has the disadvantage that it is difficult to secure a stable amount of stretching. . In particular, in devices with a limited enlargement stroke, it may not be possible to obtain a sufficient amount of enlargement for assembling semiconductor devices.

本発明の目的は、上記の問題点に鑑み、粘着テープに常
に均一に引伸しストロークを与え得る半導体ウェハース
の引伸し方法を提供することである。
SUMMARY OF THE INVENTION In view of the above-mentioned problems, an object of the present invention is to provide a method for stretching a semiconductor wafer, which can always apply a uniform stretching stroke to an adhesive tape.

〔課題を解決するための手段〕[Means to solve the problem]

本発明によれば、半導体ウェハースの引伸し方法は、フ
ラットリングと高圧空気供給部とを備える引伸し用円筒
具を準備する工程と、上面に半導体ウェハースを貼布す
る粘着テープを前記フラットリングで保持させて前記引
伸し用円筒具の端面にセットする工程と、前記高圧空気
供給部から引伸し用円筒具内に高圧空気を供給して前記
半導体ウェハースを上方に押上げ端面近傍に空気層を形
成しつつ前記フラットリング上に荷重を加える粘着テー
プの引伸し工程とを備えることを含んで構成される。
According to the present invention, a method for enlarging a semiconductor wafer includes the steps of preparing a cylindrical enlarging tool including a flat ring and a high-pressure air supply unit, and holding an adhesive tape on the upper surface of which a semiconductor wafer is attached by the flat ring. and setting the semiconductor wafer on the end face of the enlarging cylindrical tool, and supplying high pressure air from the high pressure air supply section into the enlarging cylindrical tool to push the semiconductor wafer upward and forming an air layer near the end face. and stretching the adhesive tape to apply a load onto the flat ring.

〔実施例〕〔Example〕

以下図面を参照して本発明の詳細な説明する。 The present invention will be described in detail below with reference to the drawings.

第1図(a)および(b)は本発明の一実施例を示す半
導体ウェハースの引伸し工程図である。
FIGS. 1(a) and 1(b) are drawings of a semiconductor wafer enlargement process showing an embodiment of the present invention.

本実施例によれば、フラットリング3と高圧空気供給部
5とを備えた引伸し用円筒具4が準備され、ウェハース
1を貼付けられた粘着テープ2がフラットリング3に保
持されて引伸し用円筒具4の端面にセットされる〔第1
図(a)〕。ここで高圧空気供給部5から引伸し用円筒
具4の内部に高圧空気8を供給しながらフラットリング
3に荷重6を加え、半導体ウェハース1の引伸しを行う
〔第1図(b)〕。この際、円筒具4内部に供給された
高圧空気8が半導体ウェハース1を上方に押上げ端面を
通り外部に逃げようとして空気層7を形成し、粘着テー
プ2と引伸し用円筒具4の端面との間の摩擦抵抗を著し
く低減させることができるので、粘着テープ2に常に均
一の引伸しストロークが与えられる。すなわち、半導体
ウェハースの素子分割は等間隔を保ちつつきわめてスム
ーズに行われる。
According to this embodiment, a cylindrical enlarging tool 4 including a flat ring 3 and a high-pressure air supply section 5 is prepared, and the adhesive tape 2 to which the wafer 1 is attached is held by the flat ring 3, and the enlarging cylindrical tool [1st
Figure (a)]. Here, a load 6 is applied to the flat ring 3 while supplying high-pressure air 8 from the high-pressure air supply section 5 to the inside of the cylindrical tool 4 for enlarging, and the semiconductor wafer 1 is enlarged [FIG. 1(b)]. At this time, the high-pressure air 8 supplied inside the cylindrical tool 4 pushes the semiconductor wafer 1 upward and tries to escape to the outside through the end surface, forming an air layer 7, which causes the adhesive tape 2 and the end surface of the enlarging cylindrical tool 4 to Since the frictional resistance between the adhesive tapes 2 and 2 can be significantly reduced, a uniform stretching stroke is always given to the adhesive tape 2. That is, the semiconductor wafer is divided into elements very smoothly while maintaining equal intervals.

〔発明の効果〕〔Effect of the invention〕

以上詳細に説明したように、本発明によれば、高圧空気
を使い粘着テープと引伸し用円筒具の間に空気の層を作
り引伸しが行われるので、粘着テープと引伸し用円筒具
の間に作用する摩擦抵抗を低減し、ウェハースの引伸し
ロスの発生を抑制することができ、常に安定かつ均一な
ウェハースの引伸し量を容易に得ることができる。
As explained in detail above, according to the present invention, enlarging is performed by creating a layer of air between the adhesive tape and the cylindrical enlarging tool using high-pressure air. It is possible to reduce the frictional resistance caused by the stretching of the wafer, suppress the occurrence of wafer stretching loss, and easily obtain a stable and uniform amount of wafer stretching at all times.

・・・テフロンコーティング。...Teflon coating.

Claims (1)

【特許請求の範囲】[Claims] フラットリングと高圧空気供給部とを備える引伸し用円
筒具を準備する工程と、上面に半導体ウェハースを貼布
する粘着テープを前記フラットリングで保持させて前記
引伸し用円筒具の端面にセットする工程と、前記高圧空
気供給部から引伸し用円筒具内に高圧空気を供給して前
記半導体ウェハースを上方に押上げ端面近傍に空気層を
形成しつつ前記フラットリング上に荷重を加える粘着テ
ープの引伸し工程とを備えることを特徴とする半導体ウ
ェハースの引伸し方法。
a step of preparing a cylindrical tool for enlarging that includes a flat ring and a high-pressure air supply section; a step of holding an adhesive tape for pasting a semiconductor wafer on the upper surface with the flat ring and setting it on an end surface of the cylindrical tool for enlarging; , an adhesive tape stretching step in which high pressure air is supplied from the high pressure air supply section into the cylindrical stretching tool to push the semiconductor wafer upward and apply a load on the flat ring while forming an air layer near the end surface; A method for enlarging a semiconductor wafer, comprising:
JP63258620A 1988-10-13 1988-10-13 Extension of semiconductor wafer Pending JPH02105440A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63258620A JPH02105440A (en) 1988-10-13 1988-10-13 Extension of semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63258620A JPH02105440A (en) 1988-10-13 1988-10-13 Extension of semiconductor wafer

Publications (1)

Publication Number Publication Date
JPH02105440A true JPH02105440A (en) 1990-04-18

Family

ID=17322808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63258620A Pending JPH02105440A (en) 1988-10-13 1988-10-13 Extension of semiconductor wafer

Country Status (1)

Country Link
JP (1) JPH02105440A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013122958A (en) * 2011-12-09 2013-06-20 Lintec Corp Sheet application apparatus and application method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119007A (en) * 1985-11-20 1987-05-30 三菱電機株式会社 Manufacture of semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119007A (en) * 1985-11-20 1987-05-30 三菱電機株式会社 Manufacture of semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013122958A (en) * 2011-12-09 2013-06-20 Lintec Corp Sheet application apparatus and application method

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