JPH0197551U - - Google Patents
Info
- Publication number
- JPH0197551U JPH0197551U JP19544787U JP19544787U JPH0197551U JP H0197551 U JPH0197551 U JP H0197551U JP 19544787 U JP19544787 U JP 19544787U JP 19544787 U JP19544787 U JP 19544787U JP H0197551 U JPH0197551 U JP H0197551U
- Authority
- JP
- Japan
- Prior art keywords
- electrode needle
- wafer
- support frame
- terminal
- pellet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000008188 pellet Substances 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19544787U JPH0414933Y2 (pt) | 1987-12-22 | 1987-12-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19544787U JPH0414933Y2 (pt) | 1987-12-22 | 1987-12-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0197551U true JPH0197551U (pt) | 1989-06-29 |
| JPH0414933Y2 JPH0414933Y2 (pt) | 1992-04-03 |
Family
ID=31486125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19544787U Expired JPH0414933Y2 (pt) | 1987-12-22 | 1987-12-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0414933Y2 (pt) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012089680A (ja) * | 2010-10-20 | 2012-05-10 | Micronics Japan Co Ltd | 半導体測定装置 |
| JP2012174873A (ja) * | 2011-02-21 | 2012-09-10 | Shibasoku:Kk | 試験装置 |
| JP2013120887A (ja) * | 2011-12-08 | 2013-06-17 | Mitsubishi Electric Corp | 半導体試験装置および半導体試験方法 |
| JP2015049137A (ja) * | 2013-09-02 | 2015-03-16 | 三菱電機株式会社 | 半導体チップ試験装置及び方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012141197A (ja) * | 2010-12-28 | 2012-07-26 | Advantest Corp | 試験装置 |
-
1987
- 1987-12-22 JP JP19544787U patent/JPH0414933Y2/ja not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012089680A (ja) * | 2010-10-20 | 2012-05-10 | Micronics Japan Co Ltd | 半導体測定装置 |
| JP2012174873A (ja) * | 2011-02-21 | 2012-09-10 | Shibasoku:Kk | 試験装置 |
| JP2013120887A (ja) * | 2011-12-08 | 2013-06-17 | Mitsubishi Electric Corp | 半導体試験装置および半導体試験方法 |
| JP2015049137A (ja) * | 2013-09-02 | 2015-03-16 | 三菱電機株式会社 | 半導体チップ試験装置及び方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0414933Y2 (pt) | 1992-04-03 |