JPH0166061U - - Google Patents

Info

Publication number
JPH0166061U
JPH0166061U JP1987161772U JP16177287U JPH0166061U JP H0166061 U JPH0166061 U JP H0166061U JP 1987161772 U JP1987161772 U JP 1987161772U JP 16177287 U JP16177287 U JP 16177287U JP H0166061 U JPH0166061 U JP H0166061U
Authority
JP
Japan
Prior art keywords
component
conveyance path
television camera
passage groove
chip parts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1987161772U
Other languages
English (en)
Japanese (ja)
Other versions
JPH065614Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987161772U priority Critical patent/JPH065614Y2/ja
Priority to KR1019890002517A priority patent/KR0122739B1/ko
Publication of JPH0166061U publication Critical patent/JPH0166061U/ja
Application granted granted Critical
Publication of JPH065614Y2 publication Critical patent/JPH065614Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1987161772U 1987-08-28 1987-10-22 チップ部品自動外観検査機における部品搬送機構 Expired - Lifetime JPH065614Y2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1987161772U JPH065614Y2 (ja) 1987-10-22 1987-10-22 チップ部品自動外観検査機における部品搬送機構
KR1019890002517A KR0122739B1 (ko) 1987-08-28 1989-02-28 칩-형 부품(chip-type components)을 분류하고 칩-형 부품의 외관을 광학적으로 점검하기 위한 방법과 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987161772U JPH065614Y2 (ja) 1987-10-22 1987-10-22 チップ部品自動外観検査機における部品搬送機構

Publications (2)

Publication Number Publication Date
JPH0166061U true JPH0166061U (enrdf_load_stackoverflow) 1989-04-27
JPH065614Y2 JPH065614Y2 (ja) 1994-02-09

Family

ID=31445003

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987161772U Expired - Lifetime JPH065614Y2 (ja) 1987-08-28 1987-10-22 チップ部品自動外観検査機における部品搬送機構

Country Status (1)

Country Link
JP (1) JPH065614Y2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002341407A (ja) * 2001-05-15 2002-11-27 Shibuya Kogyo Co Ltd 被検査物の撮影装置
CN113514755A (zh) * 2021-06-11 2021-10-19 天津津航计算技术研究所 一种pcb板围框电性能自动检测装置及方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6046055U (ja) * 1983-09-06 1985-04-01 村田精工株式会社 パ−ツの上下面検査装置
JPS60261274A (ja) * 1984-06-08 1985-12-24 Seiei Kosan Kk 集積回路等検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6046055U (ja) * 1983-09-06 1985-04-01 村田精工株式会社 パ−ツの上下面検査装置
JPS60261274A (ja) * 1984-06-08 1985-12-24 Seiei Kosan Kk 集積回路等検査装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002341407A (ja) * 2001-05-15 2002-11-27 Shibuya Kogyo Co Ltd 被検査物の撮影装置
CN113514755A (zh) * 2021-06-11 2021-10-19 天津津航计算技术研究所 一种pcb板围框电性能自动检测装置及方法

Also Published As

Publication number Publication date
JPH065614Y2 (ja) 1994-02-09

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