JPH0161674U - - Google Patents
Info
- Publication number
- JPH0161674U JPH0161674U JP15710287U JP15710287U JPH0161674U JP H0161674 U JPH0161674 U JP H0161674U JP 15710287 U JP15710287 U JP 15710287U JP 15710287 U JP15710287 U JP 15710287U JP H0161674 U JPH0161674 U JP H0161674U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- measuring
- rail
- sides
- probe pins
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 5
- 239000000523 sample Substances 0.000 claims description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15710287U JPH0161674U (env) | 1987-10-13 | 1987-10-13 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15710287U JPH0161674U (env) | 1987-10-13 | 1987-10-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0161674U true JPH0161674U (env) | 1989-04-19 |
Family
ID=31436250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15710287U Pending JPH0161674U (env) | 1987-10-13 | 1987-10-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0161674U (env) |
-
1987
- 1987-10-13 JP JP15710287U patent/JPH0161674U/ja active Pending
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