JPH0141940B2 - - Google Patents
Info
- Publication number
- JPH0141940B2 JPH0141940B2 JP56045534A JP4553481A JPH0141940B2 JP H0141940 B2 JPH0141940 B2 JP H0141940B2 JP 56045534 A JP56045534 A JP 56045534A JP 4553481 A JP4553481 A JP 4553481A JP H0141940 B2 JPH0141940 B2 JP H0141940B2
- Authority
- JP
- Japan
- Prior art keywords
- correction
- data
- flaw detection
- distance
- amplitude correction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/4463—Signal correction, e.g. distance amplitude correction [DAC], distance gain size [DGS], noise filtering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
Landscapes
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Signal Processing (AREA)
- Engineering & Computer Science (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56045534A JPS57160059A (en) | 1981-03-30 | 1981-03-30 | Correction of distance/amplitude curve |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56045534A JPS57160059A (en) | 1981-03-30 | 1981-03-30 | Correction of distance/amplitude curve |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57160059A JPS57160059A (en) | 1982-10-02 |
| JPH0141940B2 true JPH0141940B2 (enExample) | 1989-09-08 |
Family
ID=12722050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56045534A Granted JPS57160059A (en) | 1981-03-30 | 1981-03-30 | Correction of distance/amplitude curve |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57160059A (enExample) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5298582A (en) * | 1976-02-14 | 1977-08-18 | Mitsubishi Electric Corp | Ultrasonic flaw detector |
-
1981
- 1981-03-30 JP JP56045534A patent/JPS57160059A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57160059A (en) | 1982-10-02 |
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