JPH0141922B2 - - Google Patents

Info

Publication number
JPH0141922B2
JPH0141922B2 JP61002001A JP200186A JPH0141922B2 JP H0141922 B2 JPH0141922 B2 JP H0141922B2 JP 61002001 A JP61002001 A JP 61002001A JP 200186 A JP200186 A JP 200186A JP H0141922 B2 JPH0141922 B2 JP H0141922B2
Authority
JP
Japan
Prior art keywords
light
reflected
foreign
inspected
foreign object
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP61002001A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61180128A (ja
Inventor
Masakuni Akiba
Hiroto Nagatomo
Jun Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP200186A priority Critical patent/JPS61180128A/ja
Publication of JPS61180128A publication Critical patent/JPS61180128A/ja
Publication of JPH0141922B2 publication Critical patent/JPH0141922B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP200186A 1986-01-10 1986-01-10 物体表面検査装置 Granted JPS61180128A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP200186A JPS61180128A (ja) 1986-01-10 1986-01-10 物体表面検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP200186A JPS61180128A (ja) 1986-01-10 1986-01-10 物体表面検査装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP135679A Division JPS5594145A (en) 1978-01-27 1979-01-12 Method of and device for inspecting surface of article

Publications (2)

Publication Number Publication Date
JPS61180128A JPS61180128A (ja) 1986-08-12
JPH0141922B2 true JPH0141922B2 (enrdf_load_stackoverflow) 1989-09-08

Family

ID=11517184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP200186A Granted JPS61180128A (ja) 1986-01-10 1986-01-10 物体表面検査装置

Country Status (1)

Country Link
JP (1) JPS61180128A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3087384B2 (ja) * 1991-10-08 2000-09-11 松下電器産業株式会社 異物検査装置
JP5019849B2 (ja) 2006-11-02 2012-09-05 株式会社ブリヂストン タイヤの表面検査方法および装置
JP2014052217A (ja) * 2012-09-05 2014-03-20 Dainippon Printing Co Ltd 異物検査装置、異物検査方法
CN105222728A (zh) * 2015-09-14 2016-01-06 深圳市星源材质科技股份有限公司 一种锂电池隔膜表面平整度的检测装置及其方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5631540B2 (enrdf_load_stackoverflow) * 1973-01-26 1981-07-22

Also Published As

Publication number Publication date
JPS61180128A (ja) 1986-08-12

Similar Documents

Publication Publication Date Title
US4342515A (en) Method of inspecting the surface of an object and apparatus therefor
US4740079A (en) Method of and apparatus for detecting foreign substances
US5717485A (en) Foreign substance inspection apparatus
JP3140664B2 (ja) 異物検査方法及び装置
JP2671241B2 (ja) ガラス板の異物検出装置
US7643139B2 (en) Method and apparatus for detecting defects
US6144446A (en) Method and apparatus for inspecting foreign substance
JPS61100932A (ja) 露光装置
US6853446B1 (en) Variable angle illumination wafer inspection system
JPS6330570B2 (enrdf_load_stackoverflow)
JP2999712B2 (ja) 端部欠陥検査方法とその装置
US6521889B1 (en) Dust particle inspection apparatus, and device manufacturing method using the same
JPS63143831A (ja) 面板欠陥検出光学装置
KR101036455B1 (ko) 하프 미러를 이용한 타원계측기
WO2001013098A1 (en) Variable angle illumination wafer inspection system
JPH0141922B2 (enrdf_load_stackoverflow)
JPH0238951A (ja) 異物検出装置及び方法
JP2506725B2 (ja) パタ−ン欠陥検査装置
JPS60122359A (ja) 光学検査装置
JP3336392B2 (ja) 異物検査装置及び方法
JPH0646182B2 (ja) マスク上の異物検査装置およびその方法
EP0598582B1 (en) Inspection method and apparatus
US10641713B1 (en) Phase retardance optical scanner
JPH09218162A (ja) 表面欠陥検査装置
JPH04344447A (ja) 透明ガラス基板の欠陥検出装置