JPH0141922B2 - - Google Patents
Info
- Publication number
- JPH0141922B2 JPH0141922B2 JP61002001A JP200186A JPH0141922B2 JP H0141922 B2 JPH0141922 B2 JP H0141922B2 JP 61002001 A JP61002001 A JP 61002001A JP 200186 A JP200186 A JP 200186A JP H0141922 B2 JPH0141922 B2 JP H0141922B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- reflected
- foreign
- inspected
- foreign object
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP200186A JPS61180128A (ja) | 1986-01-10 | 1986-01-10 | 物体表面検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP200186A JPS61180128A (ja) | 1986-01-10 | 1986-01-10 | 物体表面検査装置 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP135679A Division JPS5594145A (en) | 1978-01-27 | 1979-01-12 | Method of and device for inspecting surface of article |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61180128A JPS61180128A (ja) | 1986-08-12 |
JPH0141922B2 true JPH0141922B2 (enrdf_load_stackoverflow) | 1989-09-08 |
Family
ID=11517184
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP200186A Granted JPS61180128A (ja) | 1986-01-10 | 1986-01-10 | 物体表面検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61180128A (enrdf_load_stackoverflow) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3087384B2 (ja) * | 1991-10-08 | 2000-09-11 | 松下電器産業株式会社 | 異物検査装置 |
JP5019849B2 (ja) | 2006-11-02 | 2012-09-05 | 株式会社ブリヂストン | タイヤの表面検査方法および装置 |
JP2014052217A (ja) * | 2012-09-05 | 2014-03-20 | Dainippon Printing Co Ltd | 異物検査装置、異物検査方法 |
CN105222728A (zh) * | 2015-09-14 | 2016-01-06 | 深圳市星源材质科技股份有限公司 | 一种锂电池隔膜表面平整度的检测装置及其方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5631540B2 (enrdf_load_stackoverflow) * | 1973-01-26 | 1981-07-22 |
-
1986
- 1986-01-10 JP JP200186A patent/JPS61180128A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61180128A (ja) | 1986-08-12 |
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