JPH0136574B2 - - Google Patents

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Publication number
JPH0136574B2
JPH0136574B2 JP19795981A JP19795981A JPH0136574B2 JP H0136574 B2 JPH0136574 B2 JP H0136574B2 JP 19795981 A JP19795981 A JP 19795981A JP 19795981 A JP19795981 A JP 19795981A JP H0136574 B2 JPH0136574 B2 JP H0136574B2
Authority
JP
Japan
Prior art keywords
amount
rice
receiving element
light
reflected light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP19795981A
Other languages
Japanese (ja)
Other versions
JPS5899735A (en
Inventor
Toshihiko Satake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Satake Engineering Co Ltd
Original Assignee
Satake Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Satake Engineering Co Ltd filed Critical Satake Engineering Co Ltd
Priority to JP19795981A priority Critical patent/JPS5899735A/en
Publication of JPS5899735A publication Critical patent/JPS5899735A/en
Publication of JPH0136574B2 publication Critical patent/JPH0136574B2/ja
Granted legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/342Sorting according to other particular properties according to optical properties, e.g. colour
    • B07C5/3425Sorting according to other particular properties according to optical properties, e.g. colour of granular material, e.g. ore particles, grain

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Adjustment And Processing Of Grains (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、米粒精白度測定装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a rice grain polishing level measuring device.

〔従来の技術〕[Conventional technology]

精米作用とは、米粒の組織を外周から内部へ向
かつて順次除去し、米粒の内部組織を露出させる
作用であり、原料玄米を精米して白米にしたとき
の白米生産量の割合は精米歩留り(単に、歩留り
とも言う)ということばで表わされ、一般に次式
で示されている。
Rice polishing is an action that sequentially removes the structure of rice grains from the periphery to the inside, exposing the internal structure of the rice grains. When raw brown rice is milled into white rice, the ratio of white rice production is determined by the milling yield ( It is expressed simply as yield (also simply called yield) and is generally expressed by the following formula.

歩留り(%)=白米総重量/玄米総重量×100 この歩留りの良否は、原料玄米の性状や精米技
術により左右されるが、通常、糠層は玄米全体の
6%、胚は2%程度の割合を占めているので、原
料が理想的なものであれば、歩留りは90%前後に
なる。歩留りに影響を及ぼす要因としては糠層
の厚さ・堅さ胚の大きさ・離脱性被害粒及び
未熟粒の混入率米の剛度・含水率等がある。
Yield (%) = Total weight of white rice / Total weight of brown rice x 100 The quality of this yield depends on the properties of raw brown rice and rice milling technology, but normally the bran layer accounts for 6% of the total brown rice, and the embryo accounts for about 2%. If the raw materials are ideal, the yield will be around 90%. Factors that affect the yield include the thickness and hardness of the bran layer, the size of the embryo, the contamination rate of detached damaged grains and immature grains, the stiffness of the rice, and the moisture content.

このように、歩留りとは原料玄米に対する製品
(白米)の収量をいうのであり、例えば、むら搗
(つ)き等による精米後の米質の良否(商品的価
値)を直接判定するものではない。
In this way, yield refers to the yield of the product (white rice) relative to the raw material brown rice, and does not directly determine the quality (commercial value) of the rice after milling, for example, by uneven pounding. .

これに対し、糠層と胚が精米によつてどの程度
取り除かれて白くなつたか、つまり、米質(商品
的価値)の度合いを判定するものとして、精白度
(搗精率)という表わし方が用いられている。
On the other hand, the term milling degree (milling rate) is used to judge the extent to which the bran layer and embryo are removed during rice polishing, or in other words, the degree of rice quality (commercial value). It is being

玄米粒は、中核部をなす澱粉層、すなわち内胚
乳部とその外周を包被する糠層とからなり、糠層
は外糠層(42〜48μ)と内糠層(25〜40μ)とか
らなる。さらに、外糠層は外壁をなす果皮とその
内壁面にある種皮とからなり、内糠層は外胚乳と
糊粉層(アリユーロン層)とで構成される。とこ
ろで、外糠層を剥いだ粉体を、その色より黒糠と
称し、内糠層まで削つたものを白糠と呼び、内糠
層の糊粉層まで全て取り除いた状態を精白度100
%とし、玄米を0%とする。しかしながら、糊粉
層の中には食味の成分の一つとなる蛋白質及び油
脂分が含まれているから、糊粉層は食飯用の白米
にとつて重要成分であり、糊粉層を全て除去した
白米は、いわゆる澱粉白米となり、酒造用には適
しても食飯用にはならない。したがつて適正な精
白度とは糊粉層を幾分残して精米した精白米を意
味する。
Brown rice grains consist of a starch layer that forms the core, that is, the endosperm, and a bran layer surrounding the outer periphery, and the bran layer consists of an outer bran layer (42-48μ) and an inner bran layer (25-40μ). Become. Furthermore, the outer bran layer consists of the pericarp forming the outer wall and the seed coat on the inner wall surface, and the inner bran layer consists of the ectosperm and the aleurone layer. By the way, the powder from which the outer bran layer has been removed is called black bran because of its color, and the powder that has been ground down to the inner bran layer is called white bran, and the state where all the inner bran layer has been removed, including the aleurone layer, is called black bran, and when the inner bran layer has been completely removed, it has a polishing level of 100.
%, and brown rice is 0%. However, the aleurone layer contains proteins and fats and oils, which are one of the flavor components, so the aleurone layer is an important component for polished rice for consumption, and the aleurone layer is completely removed. The polished rice becomes so-called starch white rice, which is suitable for sake brewing but not for eating. Therefore, an appropriate level of polishing means polished rice that has been polished with some aleurone layer remaining.

前述したように、精米作用が外糠層から内糠層
に進むにしたがい、しだいに米粒の白度が上昇
し、この上昇率はほぼ比例的であることから、従
来、米粒の白さの度合いを測定して白度と称し、
この値を精白度と同様の意味に解していた。
As mentioned above, as the rice polishing process progresses from the outer bran layer to the inner bran layer, the whiteness of the rice grain gradually increases, and this rate of increase is almost proportional. is measured and called whiteness,
This value was interpreted to have the same meaning as the degree of fineness.

白さの度合を測定する白度計は、積分球を用
い、試料米に照射した光量に対して試料から反射
する反射光量を光電管で受光し、その反射率を求
めるものであり、その測定値は酸化マグネシウム
の極微粉の白さを100、真黒を0としたときの割
合で示される。
A whiteness meter that measures the degree of whiteness uses an integrating sphere to receive the amount of light reflected from the sample with a phototube relative to the amount of light irradiated on the sample rice, and calculates the reflectance, and the measured value is expressed as a percentage when the whiteness of ultrafine magnesium oxide powder is 100 and the pure blackness is 0.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところが、白度計によつて求めた白さの度合
は、米粒表面から反射した光量のみであり、米粒
を透過する光量及び米粒内に吸収される光量が加
味されてなく、精白度とは無関係の値である。例
えば、精米直後、わずかに白糠の付着した白米
は、これを十分除去・琢磨した白米より、はるか
に高い値の白度となる。これは米粒面が光沢を帯
びて密面を呈すると、面反射の傾向によつて乱反
射光量が減少し、透過光量が増加するからであ
り、進行している精白度に対して逆の値であるか
ら、この値は精白度に無関係の値であることを証
明している。すなわち、従来測定していた白度は
米粒表面からの反射光量のみであり、米粒表面状
態により、すなわち糠の付着した米粒、表面がザ
ラザラの米粒は乱反射のため白度が高く表示さ
れ、また、表面が滑面のものは乱反射が少なく白
度が低く表示される。そのために白度をもつて精
白度となすことは当を得ない思想である。
However, the degree of whiteness determined by a whiteness meter is only the amount of light reflected from the surface of the rice grain, and does not take into account the amount of light that passes through the rice grain and the amount of light that is absorbed within the rice grain, and has nothing to do with the degree of whiteness. is the value of For example, white rice with a slight amount of white bran attached to it immediately after milling has a much higher whiteness value than white rice that has been sufficiently removed and polished. This is because when the rice grain surface becomes glossy and dense, the amount of diffusely reflected light decreases due to the tendency of surface reflection, and the amount of transmitted light increases, which is the opposite value to the progressing whiteness. This proves that this value is unrelated to the degree of polishing. In other words, the whiteness that was conventionally measured was only the amount of light reflected from the surface of the rice grain, and depending on the surface condition of the rice grain, that is, rice grains with bran attached or grains with a rough surface may display high whiteness due to diffuse reflection. If the surface is smooth, there will be less diffused reflection and the whiteness will be lower. For this reason, it is an unreasonable idea to equate whiteness with refinement.

そこで本発明は、白米粒を透過する光線の光量
及び白米表面からの反射光線の光量により、精白
度を求めることのできる米粒精白度測定装置を提
供することを技術的課題とする。
Therefore, the technical object of the present invention is to provide a rice grain polishing degree measuring device that can determine the polishing degree based on the amount of light that passes through the polished rice grains and the amount of light that is reflected from the surface of the polished rice.

〔問題点を解決するための手段〕[Means for solving problems]

前記問題点を解決するため本発明は、積分球の
一方に光源装置を、他方にこの光源装置からの光
を受ける試料流路を設け、光源装置側からこの試
料流路に向けて設けた反射光受光素子と、光源装
置の反対側から前記試料流路に向けて設けた透過
光受光素子とをそれぞれ設けると共に、前記反射
光受光素子からの反射光量に係数を乗じたもの
と、前記透過光受光素子からの透過光量に係数を
乗じたものとの和により、精白度を出力するよう
にした演算装置を設けるという技術的手段を講じ
た。
In order to solve the above-mentioned problems, the present invention provides a light source device on one side of an integrating sphere, a sample flow path for receiving light from the light source device on the other side, and a reflection light source provided from the light source device side toward the sample flow path. A light receiving element and a transmitted light receiving element provided toward the sample flow path from the opposite side of the light source device are provided, and the amount of reflected light from the reflected light receiving element multiplied by a coefficient, and the transmitted light A technical measure was taken to provide an arithmetic unit that outputs the degree of brightness based on the sum of the amount of transmitted light from the light-receiving element multiplied by a coefficient.

〔作用〕[Effect]

試料米粒は、測定部に設けた透過光受光素子及
び反射光受光素子によつて透過光量と反射光量と
を受光され、透過光量は透過度検出回路に、反射
光量は反射度検出回路にそれぞれ入力される。そ
して、反射度検出回路では照射光量に対する反射
光量の比である反射度(反射率)を求めて、その
反射度に精白度換算のための係数値を乗じて精白
度を求める。
The amount of transmitted light and the amount of reflected light from the sample rice grain are received by the transmitted light receiving element and the reflected light receiving element provided in the measuring section, and the transmitted light amount is input to the transmittance detection circuit, and the reflected light amount is input to the reflectance detection circuit. be done. Then, the reflectance detection circuit determines the reflectance (reflectance), which is the ratio of the amount of reflected light to the amount of irradiated light, and multiplies the reflectance by a coefficient value for converting the brightness to determine the brightness.

〔実施例〕〔Example〕

以下、本発明の好適な実施例を図面に基づいて
説明する。第1図は本実施例の概略断面図、第2
図はその電気回路図である。
Hereinafter, preferred embodiments of the present invention will be described based on the drawings. Figure 1 is a schematic sectional view of this embodiment, Figure 2
The figure is its electrical circuit diagram.

精白度計1の積分球2の左側に集光レンズ4、
単色光フイルター7、熱線吸収フイルター6及び
光源ランプ5を設け、積分球2の右側に上部に投
入シヤツター9を、下部に排出シヤツター10を
装置した試料流路3を設け、試料流路3内には基
準色板を備えた標柱8を設ける。試料流路3の下
端には排出路14を接続し、その上部に振動装置
11を備えた振動送穀樋12を連絡し、試料タン
ク13の穀粒を流路抵抗増減装置(図示せず)の
調節によつて定量的に、かつ連続的に試料流路3
に流下して供給する。そして、試料流路3を介し
て光源装置の反対側には透過光受光素子15A
を、積分球2の下部側には反射光受光素子15B
を、それぞれ設ける。
A condenser lens 4 is placed on the left side of the integrating sphere 2 of the precision meter 1.
A monochromatic light filter 7, a heat ray absorption filter 6, and a light source lamp 5 are provided, and a sample channel 3 is provided on the right side of the integrating sphere 2, with an input shutter 9 at the top and a discharge shutter 10 at the bottom. A marker post 8 equipped with a reference color plate is provided. A discharge channel 14 is connected to the lower end of the sample flow channel 3, and a vibrating grain feeding trough 12 equipped with a vibration device 11 is connected to the upper end of the discharge channel 14, and the grains in the sample tank 13 are connected to a flow channel resistance increasing/reducing device (not shown). Quantitatively and continuously by adjusting the sample flow path 3
Flows down and supplies it. A transmitted light receiving element 15A is located on the opposite side of the light source device via the sample flow path 3.
There is a reflected light receiving element 15B on the lower side of the integrating sphere 2.
are provided respectively.

次に、第2図に基づいて演算装置を形成する演
算回路Aについて説明する。積分球2に設けた反
射光受光素子15Bを反射白度検出回路17の増
幅器18に連結するとともに、減算器19、A/
D変換器20及び比較器21を直列状に連結し、
比較器21は標柱値設定器22に連結するととも
にその出力側を増幅度調節器23を介して前記増
幅器18に連結する。また、増幅器18の出力側
を分岐して暗電流記憶回路24を介して減算器1
9に連結するとともに、減算器19の出力側を分
岐し、乗算器25及びA/D変換器26を介して
加算装置27に連結してある。一方、透過光受光
素子15Aは透過度検出回路16の増幅器28か
ら乗算器29、A/D変換器30を介して加算装
置27に連結される。また、加算装置27には品
種別補正回路31を接続するとともに、その出力
側を精白度表示器32に接続する。
Next, the arithmetic circuit A forming the arithmetic device will be explained based on FIG. The reflected light receiving element 15B provided on the integrating sphere 2 is connected to the amplifier 18 of the reflected whiteness detection circuit 17, and the subtracter 19, A/
A D converter 20 and a comparator 21 are connected in series,
The comparator 21 is connected to a marker value setter 22 and its output side is connected to the amplifier 18 via an amplification adjuster 23. Further, the output side of the amplifier 18 is branched and connected to the subtracter 1 via the dark current storage circuit 24.
9, and the output side of the subtracter 19 is branched and connected to an adder 27 via a multiplier 25 and an A/D converter 26. On the other hand, the transmitted light receiving element 15A is connected from the amplifier 28 of the transmittance detection circuit 16 to the adder 27 via a multiplier 29 and an A/D converter 30. Further, a product type correction circuit 31 is connected to the adding device 27, and its output side is connected to a precision display 32.

なお、前記反射白度検出回路17の減算器19
では、積分球2の暗電流を記憶した暗電流記憶回
路24の出力を減算器19に入力してその暗電流
値を受光素子の受光量から減算し、比較器21で
は、標柱値設定器22の設定値と受光素子からの
受光量とを比較し、その比較差により増幅度調節
器23を介して増幅器18の増幅度を変化して標
柱値と一致するように調節する。
Note that the subtracter 19 of the reflection whiteness detection circuit 17
Then, the output of the dark current storage circuit 24 that stores the dark current of the integrating sphere 2 is input to the subtracter 19, and the dark current value is subtracted from the amount of light received by the light receiving element. The set value of is compared with the amount of light received from the light receiving element, and based on the comparison difference, the amplification degree of the amplifier 18 is changed via the amplification degree adjuster 23 to adjust it to match the marker value.

以上の構成において、増幅器18からの反射光
量に基づいた反射度と増幅器28からの透過光量
に基づいた透過度及び品種別補正回路31からの
出力によつて計算される加算装置27の計算値、
すなわち、照射光量を基準値とすると精白度は次
の式によつて表される。
In the above configuration, the calculated value of the adding device 27 is calculated based on the reflectance based on the amount of reflected light from the amplifier 18, the transmittance based on the amount of transmitted light from the amplifier 28, and the output from the product type correction circuit 31;
That is, when the amount of irradiated light is taken as a reference value, the degree of brightness is expressed by the following formula.

精白度=α×(反射光量)+β×(透過光量)+H なお、α、βは精白度に換算するための係数
(実験的に求めた数値)、Hは米粒の品種別補正値
である。
Polishing degree = α × (reflected light amount) + β × (transmitted light amount) + H Note that α and β are coefficients (values determined experimentally) for converting to polishing degree, and H is a correction value for each type of rice grain.

以下、具体的作動について説明する。試料タン
ク13から試料流路3に試料穀粒が流入され、光
源ランプ5からの光線は、試料流路3内の米粒に
照射されるとともに、試料から積分球2内に反射
する反射光量は反射光受光素子15Bによつて受
光される。この受光信号は増幅器18によつて増
幅されるとともに減算器19によつて暗電流を差
し引かれた後、乗算器25に入力されるのである
が、この信号は分岐されてA/D変換器20を介
して比較器21に入力し、標柱値設定器22の設
定値と比較して、その比較差を増幅度調節器23
を介して増幅器18にフイードバツクし、増幅器
18の増幅率を変化させて標柱8に設けた基準色
板と一致するよう補正する。なお、この増幅器1
8の補正回路は、透過度検出回路16における増
幅器28にも設けられる(図示せず)。減算器1
9から乗算器25に入力した信号は、係数αを乗
じてA/D変換され、加算装置27に入力され
る。
The specific operation will be explained below. Sample grains flow into the sample flow path 3 from the sample tank 13, and the light beam from the light source lamp 5 is irradiated onto the rice grains in the sample flow path 3, and the amount of reflected light reflected from the sample into the integrating sphere 2 is reflected. The light is received by the light receiving element 15B. This light reception signal is amplified by an amplifier 18 and the dark current is subtracted by a subtracter 19, and then input to a multiplier 25. This signal is branched and sent to an A/D converter 20. is input to the comparator 21 via the comparator 21 and compared with the set value of the marker value setter 22, and the comparison difference is inputted to the amplification degree adjuster 23.
The amplification factor of the amplifier 18 is changed so that it matches the reference color plate provided on the marker post 8. Note that this amplifier 1
The correction circuit No. 8 is also provided in the amplifier 28 in the transmittance detection circuit 16 (not shown). Subtractor 1
The signal input from 9 to the multiplier 25 is multiplied by a coefficient α, A/D converted, and input to the adder 27 .

一方、積分球2から入射する光線は、試料流路
3内の米粒を透過して透過光受光素子15Aによ
つて受光され、この信号は増幅器28によつて乗
算器29に入力される。
On the other hand, the light beam incident from the integrating sphere 2 passes through the rice grains in the sample channel 3 and is received by the transmitted light receiving element 15A, and this signal is input to the multiplier 29 by the amplifier 28.

乗算器29で係数βを乗じた透過光受光素子1
5Aの信号は、加算装置27において、前記A/
D変換器30から入力される反射光受光素子15
Bの信号と加算されるとともに、品種別補正回路
31からの係数Hを加えて精白度表示器32に出
力し、精白度(%)として表示する。
Transmitted light receiving element 1 multiplied by coefficient β by multiplier 29
The 5A signal is added to the A/
Reflected light receiving element 15 input from the D converter 30
This signal is added to the signal B, and the coefficient H from the product type correction circuit 31 is added thereto and output to the whiteness display 32, where it is displayed as whiteness (%).

前記品種別補正値を設けたのは、標準米に対し
て糊粉層の厚い品種(寒冷地に多い)と糊粉層の
薄い品種(温暖地方に多い)とがあり、同じ精白
作用を施しても糊粉層の厚い品種は糊粉層の薄い
ものに比して白度が上がらないこと、また、乳白
粒が多い品種及び作柄では、透過光量が少なく、
反射光量が多いことが知られており、このような
品種の違いに応じて補正をする必要があるからで
ある。
The above-mentioned correction values for each type of rice were established because there are varieties with a thick aleurone layer (common in cold regions) and varieties with a thin aleurone layer (common in warm regions) compared to standard rice. However, varieties with a thick aleurone layer do not have higher whiteness than those with a thinner aleurone layer, and varieties and crops with many milky white grains have a low amount of transmitted light.
This is because it is known that the amount of reflected light is large, and it is necessary to make corrections depending on the differences in product types.

第3図は別の実施例を示す演算回路図Bであ
る。この実施例の場合は、先の実施例における品
種別補正回路31に代えて、反射白度検出回路1
7A及び透過白度検出回路16Aに玄米反射度記
憶装置33および玄米透過度記憶装置35を設
け、それぞれ減算器34及び36を介在させたも
のである。この場合の精白度は次式で表わされ
る。
FIG. 3 is an arithmetic circuit diagram B showing another embodiment. In this embodiment, instead of the product type correction circuit 31 in the previous embodiment, a reflection whiteness detection circuit 1
7A and the transmission whiteness detection circuit 16A are provided with a brown rice reflectivity storage device 33 and a brown rice transmittance storage device 35, with subtractors 34 and 36 interposed therebetween, respectively. The degree of polishing in this case is expressed by the following formula.

精白度=α1×(白米反射光量−玄米反射光量) +β1×(白米透過光量−玄米透過光量) なお、α1、β1は先の実施例と同様に、実験的に
求めた係数である。
Polishing degree = α 1 × (Amount of reflected light of polished rice - Amount of reflected light of brown rice) + β 1 × (Amount of transmitted light of polished rice - Amount of transmitted light of brown rice) Note that α 1 and β 1 are coefficients determined experimentally as in the previous example. be.

本実施例においては、先の実施例と同様に透過
光受光素子15A及び反射光受光素子15Bによ
つて受光された光量は、それぞれ透過度検出回路
16A及び反射度検出回路17Aに取り込まれ
る。そして、前記各受光量を、玄米透過度記憶装
置35及び玄米反射度記憶装置33に記憶された
当該米粒の玄米における透過光量及び反射光量の
測定値によつて減算し、各々加算装置27Aに入
力して前記計算式によつて精白度を求め、精白度
表示器32Aに表示する。この場合も品種別補正
回路をもうけた場合と同様に、品種や作柄の違い
にもかかわらず正確な精白度を求めることができ
る。その余の構成及び作用は、先の実施例と同様
であるので説明を省略する。
In this embodiment, as in the previous embodiment, the amount of light received by the transmitted light receiving element 15A and the reflected light receiving element 15B is taken into the transmittance detection circuit 16A and the reflectance detection circuit 17A, respectively. Then, each of the received light amounts is subtracted by the measured values of the amount of transmitted light and the amount of reflected light in the brown rice of the rice grains stored in the brown rice transmittance storage device 35 and the brown rice reflectance storage device 33, and each is input to the adding device 27A. Then, the degree of whiteness is calculated using the above formula and displayed on the degree of whiteness display 32A. In this case as well, as in the case where a variety-specific correction circuit is provided, accurate whiteness can be determined regardless of differences in variety or crop. The rest of the structure and operation are the same as those of the previous embodiment, so their explanation will be omitted.

〔発明の効果〕〔Effect of the invention〕

以上述べたように、本発明によれば以下のとお
り顕著な効果を奏する。すなわち、透過光量及
び、反射光量を検出し、各検出値に精白度換算の
ための係数を乗じた後、透過光検出値と反射光検
出値とを加算し、さらに、品種あるいは作柄等の
性状に応じた補正を行うことにより、乱反射光だ
けの白度計あるいは各種試薬による煩しい判定に
比し、容易に正確な精白度が求められ、これをも
つて実際の商品の品位を評価することができるも
のである。
As described above, according to the present invention, the following remarkable effects are achieved. In other words, the amount of transmitted light and the amount of reflected light are detected, each detected value is multiplied by a coefficient for converting whiteness, the transmitted light detected value and the reflected light detected value are added, and the properties such as variety or crop are calculated. By making corrections according to the whiteness, it is easier to obtain accurate whiteness compared to complicated judgments using a whiteness meter or various reagents that only use diffusely reflected light, and this can be used to evaluate the quality of the actual product. It is something that can be done.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明実施例の概略断面図、第2図は
その電気回路図、第3図は別の実施例の電気回路
図である。 1……精白度計、2……積分球、3……試料流
路、4……集光レンズ、5……光源ランプ、6…
…熱線吸収フイルター、7……単色光フイルタ
ー、8……標柱、9……投入シヤツター、10…
…排出シヤツター、11……振動装置、12……
振動送穀樋、13……試料タンク、14……排出
路、15A……透過光受光素子、15B……反射
光受光素子、16,16A……透過白度検出回
路、17,17A……反射白度検出回路、18…
…増幅器、19……減算器、20……A/D変換
器、21……比較器、22……標柱値設定器、2
3……増幅度調節器、24……暗電流記憶回路、
25……乗算器、26……A/D変換器、27,
27A……加算装置、28……増幅器、29……
乗算器、30……A/D変換器、31……品種別
補正回路、32,32A……精白度表示器、33
……玄米反射度記憶装置、34……減算器、35
……玄米透過度記憶装置、36……減算器。
FIG. 1 is a schematic sectional view of an embodiment of the present invention, FIG. 2 is an electrical circuit diagram thereof, and FIG. 3 is an electrical circuit diagram of another embodiment. DESCRIPTION OF SYMBOLS 1... Whiteness meter, 2... Integrating sphere, 3... Sample channel, 4... Condensing lens, 5... Light source lamp, 6...
... Heat ray absorption filter, 7 ... Monochromatic light filter, 8 ... Signpost, 9 ... Insertion shutter, 10 ...
...Ejection shutter, 11...Vibration device, 12...
Vibrating grain feeder, 13...Sample tank, 14...Discharge path, 15A...Transmitted light receiving element, 15B...Reflected light receiving element, 16, 16A...Transmitted whiteness detection circuit, 17, 17A...Reflection Whiteness detection circuit, 18...
... Amplifier, 19 ... Subtractor, 20 ... A/D converter, 21 ... Comparator, 22 ... Marker value setter, 2
3...Amplification adjuster, 24...Dark current memory circuit,
25... Multiplier, 26... A/D converter, 27,
27A...Addition device, 28...Amplifier, 29...
Multiplier, 30... A/D converter, 31... Product type correction circuit, 32, 32A... Sharpness indicator, 33
...Brown rice reflectance storage device, 34...Subtractor, 35
...Brown rice transparency storage device, 36...Subtractor.

Claims (1)

【特許請求の範囲】 1 積分球の一方に光源装置を、他方にこの光源
装置からの光を受ける試料流路を設け、光源装置
側からこの試料流路に向けて設けた反射光受光素
子と、光源装置の反対側から前記試料流路に向け
て設けた透過光受光素子とをそれぞれ設けると共
に、前記反射光受光素子からの反射光量に係数を
乗じたものと、前記透過光受光素子からの透過光
量に係数を乗じたものとの和により、精白度を出
力するようにした演算装置を設けたことを特徴と
する米粒精白度測定装置。 2 前記演算装置は、前記反射光量と透過光量と
の和に、米粒の品種によつて定められる補正値を
加算して精白度を出力するようにした特許請求の
範囲第1項記載の米粒精白度測定装置。 3 前記演算装置は、前記試料を白米として算出
した前記和から、前記試料を玄米として算出した
前記和を減算して精白度を出力するようにした特
許請求の範囲第1項記載の米粒精白度測定装置。
[Scope of Claims] 1. A light source device is provided on one side of an integrating sphere, a sample channel for receiving light from the light source device is provided on the other side, and a reflected light receiving element and a reflected light receiving element are provided from the light source device side toward the sample channel. , and a transmitted light receiving element provided toward the sample flow path from the opposite side of the light source device, and the amount of reflected light from the reflected light receiving element multiplied by a coefficient, and the amount of reflected light from the transmitted light receiving element multiplied by a coefficient. 1. A rice grain milling degree measuring device characterized by being provided with an arithmetic device configured to output milling degree by the sum of the amount of transmitted light multiplied by a coefficient. 2. The rice grain polishing according to claim 1, wherein the calculation device outputs the polishing degree by adding a correction value determined by the variety of rice grains to the sum of the amount of reflected light and the amount of transmitted light. Degree measuring device. 3. Rice grain polishing degree according to claim 1, wherein the arithmetic unit is configured to output the polishing degree by subtracting the sum calculated using the sample as brown rice from the sum calculated using the sample as white rice. measuring device.
JP19795981A 1981-12-08 1981-12-08 Measuring apparatus for polished degree of rise grain Granted JPS5899735A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19795981A JPS5899735A (en) 1981-12-08 1981-12-08 Measuring apparatus for polished degree of rise grain

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19795981A JPS5899735A (en) 1981-12-08 1981-12-08 Measuring apparatus for polished degree of rise grain

Publications (2)

Publication Number Publication Date
JPS5899735A JPS5899735A (en) 1983-06-14
JPH0136574B2 true JPH0136574B2 (en) 1989-08-01

Family

ID=16383155

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19795981A Granted JPS5899735A (en) 1981-12-08 1981-12-08 Measuring apparatus for polished degree of rise grain

Country Status (1)

Country Link
JP (1) JPS5899735A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6384558U (en) * 1986-11-21 1988-06-02

Also Published As

Publication number Publication date
JPS5899735A (en) 1983-06-14

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