JPH01319907A - Method for adjusting resistance value of thick film resistor - Google Patents

Method for adjusting resistance value of thick film resistor

Info

Publication number
JPH01319907A
JPH01319907A JP63152656A JP15265688A JPH01319907A JP H01319907 A JPH01319907 A JP H01319907A JP 63152656 A JP63152656 A JP 63152656A JP 15265688 A JP15265688 A JP 15265688A JP H01319907 A JPH01319907 A JP H01319907A
Authority
JP
Japan
Prior art keywords
thick film
resistance value
resistor
land
film resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63152656A
Other languages
Japanese (ja)
Inventor
Toshiaki Kumabayashi
熊林 敏明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Corp, Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Corp
Priority to JP63152656A priority Critical patent/JPH01319907A/en
Publication of JPH01319907A publication Critical patent/JPH01319907A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To adjust a resistance value readily by connecting a thick film resistor between land pieces, performing trimming, and connecting a chip resistor between other land pieces when the resistance value is to be decreased. CONSTITUTION:A thick film resistor 5 is connected between a pair of first land pieces 4a. The resistance value is made large by trimming. Thus, a specified resistance R1 is obtained. When the resistance value becomes too high, a chip resistor 6 is connected between a pair of second land pieces 4b. The resistor 6 is mounted by overlapping on the thick film resistor 5. When the resistance value of the resistor 6 is R2, the resistance value R becomes R1.R2/(R1+R2). In this way, the resistance value can be adjusted readily.

Description

【発明の詳細な説明】 A、産業上の利用分野 本発明は、厚膜混成集積回路における厚膜抵抗′の抵抗
値調整方法に関する。
DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a method for adjusting the resistance value of a thick film resistor in a thick film hybrid integrated circuit.

B0発明の概要 本発明は、一対のランド間に厚膜抵抗を接続し、トリミ
ングした後に抵抗値を減少させる厚膜抵抗の抵抗値調整
方法において、 一対のランドの夫々を複数のランド片で形成するととも
に、いずれかのランド片どうしの間に厚膜抵抗を接続し
、トリミング後に他のランド片どうしのa!]にチップ
抵抗を接続することにより、トリミング後に短絡用のラ
ンドを接続しなくてもずむようにしたものである。
B0 Summary of the Invention The present invention provides a method for adjusting the resistance value of a thick film resistor in which the thick film resistor is connected between a pair of lands and the resistance value is reduced after trimming, in which each of the pair of lands is formed from a plurality of land pieces. At the same time, a thick film resistor is connected between any of the land pieces, and after trimming, the a! of the other land pieces is connected. ] By connecting a chip resistor to the terminal, there is no need to connect a shorting land after trimming.

C,従来の技術 厚膜混成集積回路の厚膜抵抗における抵抗値は、トリミ
ングによって調整される。即ち、目的とずる抵抗値Rよ
りも小さい0.4R〜0.8Rの厚膜抵抗を作成し、ト
リミングによってRに設定する。
C. Prior Art The resistance value in a thick film resistor of a thick film hybrid integrated circuit is adjusted by trimming. That is, a thick film resistor of 0.4R to 0.8R, which is smaller than the desired resistance value R, is created and set to R by trimming.

トリミングの方法としては、主としてレーザトリミング
法が用いられる。レーザトリミング法は、レーザ光によ
り第5図に示す厚膜抵抗Iの一部を溶かすか蒸発させて
スリット2を形成し、厚膜抵抗1の抵抗値を増大さ仕る
ものである。なお、厚膜抵抗1は、ハンダ付けにより、
一対のランド3a。
As a trimming method, a laser trimming method is mainly used. In the laser trimming method, a portion of the thick film resistor I shown in FIG. 5 is melted or evaporated using a laser beam to form a slit 2, thereby increasing the resistance value of the thick film resistor 1. Note that the thick film resistor 1 is soldered to
A pair of lands 3a.

3b間に接続される。3b.

しかし、トリミングをした後に抵抗値を下げる必要を生
じる場合があり、このような場合には、従来は厚膜抵抗
1の一部を短絡したり、厚膜抵抗lと並列にチップ抵抗
を接続している。
However, there are cases where it is necessary to lower the resistance value after trimming, and in such cases conventionally short-circuiting a part of thick film resistor 1 or connecting a chip resistor in parallel with thick film resistor 1 is used. ing.

D1発明が解決しようとする課題 ところが、いずれの方法においても接続作業が必要であ
るためにハンダ付は作業を行わねばならず、製造工程に
大幅な遅れを生じる。また、チップ抵抗を接続するため
のランドを新たに設けねばならず、実用的でない。
D1 Problems to be Solved by the Invention However, since connection work is required in either method, soldering work must be performed, which causes a significant delay in the manufacturing process. Further, it is necessary to newly provide a land for connecting the chip resistor, which is not practical.

そこで本発明は、斯かる課題を解決した厚膜抵抗の抵抗
値調整方法を提供することを目的とする。
Therefore, an object of the present invention is to provide a method for adjusting the resistance value of a thick film resistor that solves the above problem.

E1課題を解決するための手段 斯かる目的を達成するための本発明の構成は、厚膜抵抗
を接続する一対のランドの夫々を、寸法の異なる複数の
厚膜抵抗を並列に接続できるように、予め複数のランド
片によって形成し、いずれかのランド片どうしの間に厚
膜抵抗を接続し、トリミングした後に抵抗値を減少させ
る場合は、他のランド片ど゛うしの間にデツプ抵抗を接
続するようにしたことを特徴とする。
Means for Solving Problem E1 The structure of the present invention for achieving the above object is such that each of a pair of lands connecting thick film resistors can be connected in parallel with a plurality of thick film resistors having different dimensions. , when forming a thick film resistor in advance with multiple land pieces, connecting a thick film resistor between any of the land pieces, and reducing the resistance value after trimming, connect a deep resistor between the other land pieces. It is characterized by being connected.

F9作用 ランドのうち、いずれかのランド片どうしの間に厚膜抵
抗を接続し、トリミングをして抵抗値を大きくする。
A thick film resistor is connected between any of the land pieces among the F9 action lands and trimmed to increase the resistance value.

抵抗値が大きくなりすぎた場合は、他のランド片どうし
の間にチップ抵抗を接続して抵抗値を小さくする。
If the resistance value becomes too large, connect a chip resistor between other land pieces to reduce the resistance value.

G、実施例 以下、本発明を図面に示す第1.第2実施例に基づいて
詳細に説明する。
G. Examples Below, the present invention is illustrated in the drawings in Section 1. This will be explained in detail based on the second embodiment.

(a)第1実施例 まず、第1実施例を第1図、第2図に基づいて説明する
(a) First Embodiment First, a first embodiment will be described based on FIGS. 1 and 2.

この実施例では、一対のランド4として、長方形の第1
ランド片4aと第2ランド片4bとを一体に成形したも
のを用いる。
In this embodiment, a rectangular first land 4 is used as the pair of lands 4.
The land piece 4a and the second land piece 4b are integrally molded.

まず、第1図(a)に示すように一対の第1ランド片4
&どうしの間に厚膜抵抗5を接続し、トリミングによっ
て抵抗値を大きくすることで所定の値R1を得る。この
ときの電気的等価回路を第2図(a)に示す。なお、斜
線部はハンダ付は部分である。
First, as shown in FIG. 1(a), a pair of first land pieces 4
A thick film resistor 5 is connected between &, and the resistance value is increased by trimming to obtain a predetermined value R1. The electrical equivalent circuit at this time is shown in FIG. 2(a). Note that the shaded areas are the parts that are soldered.

抵抗値が大きくなりすぎた場合は、第1図(b)に示す
ように一対の第2ランド片4bどうしの間にチップ抵抗
6を接続する。チップ抵抗6は厚膜抵抗5上に重ねて実
装され、チップ抵抗6の抵抗値をR1とすると、このと
きの電気的等価回路は第2図(b)のようになる。
If the resistance value becomes too large, a chip resistor 6 is connected between the pair of second land pieces 4b as shown in FIG. 1(b). The chip resistor 6 is mounted on the thick film resistor 5, and assuming that the resistance value of the chip resistor 6 is R1, the electrical equivalent circuit at this time is as shown in FIG. 2(b).

目的とする抵抗値をRとすると、r(、R1,ntの関
係は以下のようになる。
When the target resistance value is R, the relationship between r(, R1, and nt is as follows.

この結果、Rの値は、チップ抵抗6を接続することによ
り、厚膜抵抗5のみの場合よりも小さくなる。
As a result, by connecting the chip resistor 6, the value of R becomes smaller than when only the thick film resistor 5 is used.

なお、チップ抵抗6を実装する工程が増えるが、マウン
タで行うことにより1秒以内で可能なため、工程上の影
響は少ない。
Note that although the process of mounting the chip resistor 6 is increased, since it can be done within one second by using a mounter, there is little impact on the process.

(b)第2実施例 次に、第2実施例を第3図に基づいて説明する。(b) Second embodiment Next, a second embodiment will be described based on FIG.

第3図(λ)に示すように、本実施例では、−対のラン
ドとして、コの字形状であって順次に大きくなる第1ラ
ンド片7aと第2ランド片7bと第3ランド片7cとを
一体に成形したものを用いる。
As shown in FIG. 3 (λ), in this embodiment, as a pair of lands, a first land piece 7a, a second land piece 7b, and a third land piece 7c, which are U-shaped and increase in size sequentially. Use one that is integrally molded with.

このように大きさの異なる複数のランド片を有するので
、第3図(a)〜(c)に示すように大きさの異なる厚
膜抵抗8a、8b、8cであっても、第1ランド片7a
、第2ランド片7b、第3ランド片7cのいずれかにハ
ンダ付けすることによって対応できる。゛つまり、厚膜
抵抗のサイズが変更されてもランドを変更しなくてもよ
く製造工程に影響を与えない。従来は、第4図(a)〜
(c)に示ずように厚膜抵抗8a、8b、8c毎に異な
る大きさのランド9.to、11を用いていたため、厚
膜抵抗のサイズを変更するにはランドを変えねばならな
かった。
Since it has a plurality of land pieces of different sizes in this way, even if the thick film resistors 8a, 8b, and 8c have different sizes as shown in FIGS. 3(a) to 3(c), the first land piece 7a
, the second land piece 7b, or the third land piece 7c by soldering. In other words, even if the size of the thick film resistor is changed, there is no need to change the land and the manufacturing process is not affected. Conventionally, Fig. 4(a) ~
As shown in (c), each thick film resistor 8a, 8b, 8c has a land 9 of a different size. Since 11 was used, it was necessary to change the land in order to change the size of the thick film resistor.

厚膜抵抗の抵抗値を小さくする場合には、第1実施例と
同様にして、厚膜抵抗が接続されていない他のランド片
どうしの間にチップ抵抗を接続すればよい。
In order to reduce the resistance value of the thick film resistor, the chip resistor may be connected between other land pieces to which the thick film resistor is not connected, as in the first embodiment.

H0発明の詳細 な説明したように、本発明による厚膜抵抗の抵抗値調整
方法によれば、複数のランド片からなるランドを用いる
ので、厚膜抵抗の抵抗値を小さくする場合に、新たにラ
ンドをハンダ付けするという作業を行うことなくチップ
抵抗を厚膜抵抗と並列に取り付けることができる。
As described in detail of the H0 invention, according to the method for adjusting the resistance value of a thick film resistor according to the present invention, a land consisting of a plurality of land pieces is used. Chip resistors can be mounted in parallel with thick film resistors without the need to solder lands.

また、ランドが寸法の異なる複数のランド片で構成され
るので、厚膜抵抗の大きさが異なる場合でも同一のラン
ドで対応でき、汎用性がある。
Furthermore, since the land is composed of a plurality of land pieces having different dimensions, the same land can be used even when thick film resistors have different sizes, providing versatility.

このように、厚膜抵抗の変更やチップ抵抗の取り付けが
容易であり、製造工程に与える影響が少ない。
In this way, it is easy to change the thick film resistor and attach the chip resistor, and there is little impact on the manufacturing process.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図〜第3図は本発明による厚膜抵抗の抵抗値調整方
法に係り、第1図(a)、(b)は第1′実施例を示す
抵抗値調整方法の説明図、第2図(a)、(b)は第1
図(a)、(b)と対応して示す回路図、第3図(a)
、(b)、(c)は第2実施例を示す厚膜抵抗の取付図
、第4図は従来の厚膜抵抗の取付図、第5図はトリミン
グの説明図である。 5.8a、8b、8cm厚膜抵抗、4.7−・・ランド
、4a、7a・・・第1ランド片、4b、7b・・・第
2ランド片、6・・・デツプ抵抗、7c・・・第3ラン
ド片。 第1図    第2図 抵抗値調整方法の説明図       第一図(a)、
(b)と対応(第一実施例)          して
示す回路図4.7 ランド 4a、7a・・第一ラノド片 4b、7b  第ニラノド片 5.8a、8b、8cm[膜抵抗 6・チップ抵抗 7c・第三ラッド片 第5図 トリミングの説明図 第3図 (第二実施例) 第4図 膜厚抵抗の取付図 (従来) (b)
1 to 3 relate to a method for adjusting the resistance value of a thick film resistor according to the present invention, and FIGS. Figures (a) and (b) are the first
Circuit diagram shown in correspondence with figures (a) and (b), Fig. 3 (a)
, (b) and (c) are installation diagrams of a thick film resistor showing the second embodiment, FIG. 4 is an installation diagram of a conventional thick film resistor, and FIG. 5 is an explanatory diagram of trimming. 5.8a, 8b, 8cm thick film resistor, 4.7-... Land, 4a, 7a... First land piece, 4b, 7b... Second land piece, 6... Depth resistor, 7c... ...Third land piece. Fig. 1 Fig. 2 Explanatory diagram of the resistance value adjustment method Fig. 1 (a),
Corresponding to (b) (first embodiment) Circuit diagram shown as 4.7 Lands 4a, 7a...1st rand piece 4b, 7b 5th rand piece 5.8a, 8b, 8cm [membrane resistor 6, chip resistor 7c・Third rad piece Figure 5 Explanatory diagram of trimming Figure 3 (second embodiment) Figure 4 Installation diagram of film thickness resistor (conventional) (b)

Claims (1)

【特許請求の範囲】[Claims] (1)厚膜抵抗を接続する一対のランドの夫々を、寸法
の異なる複数の厚膜抵抗を並列に接続できるように、予
め複数のランド片によって形成し、いずれかのランド片
どうしの間に厚膜抵抗を接続し、トリミングした後に抵
抗値を減少させる場合は、 他のランド片どうしの間にチップ抵抗を接続するように
したことを特徴とする厚膜抵抗の抵抗値調整方法。
(1) Each of a pair of lands for connecting thick film resistors is formed in advance from multiple land pieces so that multiple thick film resistors with different dimensions can be connected in parallel, and between any of the land pieces A method for adjusting the resistance value of a thick film resistor, characterized in that when reducing the resistance value after connecting the thick film resistor and trimming, the chip resistor is connected between other land pieces.
JP63152656A 1988-06-21 1988-06-21 Method for adjusting resistance value of thick film resistor Pending JPH01319907A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63152656A JPH01319907A (en) 1988-06-21 1988-06-21 Method for adjusting resistance value of thick film resistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63152656A JPH01319907A (en) 1988-06-21 1988-06-21 Method for adjusting resistance value of thick film resistor

Publications (1)

Publication Number Publication Date
JPH01319907A true JPH01319907A (en) 1989-12-26

Family

ID=15545206

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63152656A Pending JPH01319907A (en) 1988-06-21 1988-06-21 Method for adjusting resistance value of thick film resistor

Country Status (1)

Country Link
JP (1) JPH01319907A (en)

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