JPH01302816A - Vertical type heat treatment device - Google Patents
Vertical type heat treatment deviceInfo
- Publication number
- JPH01302816A JPH01302816A JP13363588A JP13363588A JPH01302816A JP H01302816 A JPH01302816 A JP H01302816A JP 13363588 A JP13363588 A JP 13363588A JP 13363588 A JP13363588 A JP 13363588A JP H01302816 A JPH01302816 A JP H01302816A
- Authority
- JP
- Japan
- Prior art keywords
- pipe
- discharge
- reaction
- heating
- heat treatment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010438 heat treatment Methods 0.000 title claims abstract description 42
- 238000001816 cooling Methods 0.000 abstract description 16
- 239000007789 gas Substances 0.000 abstract description 12
- 239000012495 reaction gas Substances 0.000 abstract description 8
- 239000000126 substance Substances 0.000 abstract description 8
- 230000007246 mechanism Effects 0.000 abstract description 6
- 239000010453 quartz Substances 0.000 abstract description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 5
- 238000007796 conventional method Methods 0.000 abstract description 4
- 239000011810 insulating material Substances 0.000 abstract description 2
- 238000007599 discharging Methods 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 19
- 239000004065 semiconductor Substances 0.000 description 11
- DLYUQMMRRRQYAE-UHFFFAOYSA-N tetraphosphorus decaoxide Chemical compound O1P(O2)(=O)OP3(=O)OP1(=O)OP2(=O)O3 DLYUQMMRRRQYAE-UHFFFAOYSA-N 0.000 description 10
- 239000010408 film Substances 0.000 description 9
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 5
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 5
- 229910052698 phosphorus Inorganic materials 0.000 description 5
- 239000011574 phosphorus Substances 0.000 description 5
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 4
- 238000012423 maintenance Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000007723 transport mechanism Effects 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
Abstract
Description
【発明の詳細な説明】
[発明の目的]
(産業上の利用分野)
本発明は、半導体ウェハ等の被処理基板を加熱して処理
する縦型熱処理装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a vertical heat treatment apparatus for heating and processing a substrate to be processed, such as a semiconductor wafer.
(従来の技術)
従来、半導体ウェハ等の被処理基板を加熱して薄膜形成
、熱拡散等の処理を施す加熱処理装置としては、反応管
をほぼ水平に配設した横型熱処理装置が主に用いられて
いたが、近年は、ウェハ搬入、搬出の容易さの点から反
応管をほぼ垂直に配設した縦型熱処理装置が多く用いら
れるようになってきた。(Prior art) Conventionally, as a heat treatment apparatus for heating a substrate to be processed such as a semiconductor wafer to perform processes such as thin film formation and thermal diffusion, horizontal heat treatment apparatuses in which reaction tubes are arranged almost horizontally have been mainly used. However, in recent years, vertical heat treatment apparatuses in which reaction tubes are arranged almost vertically have come into widespread use in view of the ease of loading and unloading wafers.
すなわち、このような縦型熱処理装置では、石英等から
なる円筒状の反応管は、ほぼ垂直に配設されており、石
英等からなるウェハボートに間隔を設けて積層する如く
多数の半導体ウェハを配置して、例えば上下動可能とさ
れた搬送機構によって、反応管内へ下方から半導体ウェ
ハをロード・アンロードするよう構成されている。この
ような縦型熱処理装置では、反応管内壁とウェハボート
とを非接触でロード・アンロードすることが容易に可能
である、占有面積が少ない、処理半導体ウェハの大口径
化が容品である等の利点を有する。In other words, in such a vertical heat treatment apparatus, a cylindrical reaction tube made of quartz or the like is arranged almost vertically, and a large number of semiconductor wafers are stacked at intervals on a wafer boat made of quartz or the like. The semiconductor wafer is loaded and unloaded from below into the reaction tube by a transport mechanism that is arranged so as to be able to move up and down, for example. Such a vertical heat treatment apparatus has the advantages of being able to easily load and unload the reaction tube inner wall and the wafer boat without contact, occupying a small area, and increasing the diameter of semiconductor wafers to be processed. It has the following advantages.
(発明が解決しようとする課題)
上記説明の縦型熱処理装置を用いて成膜を行う場合、膜
の種類によって各種の反応ガスを反応管内に流通させる
が、高温とされた反応管から排気されるガス中の物質が
、その温度低下に伴い排気経路に付着する場合がある。(Problems to be Solved by the Invention) When forming a film using the vertical heat treatment apparatus described above, various reaction gases are passed through the reaction tube depending on the type of film. Substances in the gas may adhere to the exhaust path as the temperature decreases.
例えばリンを含む膜の成膜を行う場合、フォスフイン(
PH3)等のガスを反応管内に流通させるが、この時五
酸化リン(P2O3)等が排気経路等に付着する。この
ため、このような付着物を除去するためのメンテナンス
が必要となり、生産性が悪化するという問題がある。For example, when depositing a film containing phosphorus, phosphine (
A gas such as PH3) is passed through the reaction tube, but at this time, phosphorus pentoxide (P2O3) and the like adhere to the exhaust path. Therefore, maintenance is required to remove such deposits, resulting in a problem of deterioration of productivity.
本発明は、かかる従来の事情に対処してなされたもので
、排気経路に反応管から排気されるガス中の物質が付着
することを防止することができ、従来に比べて生産性の
向上を図ることのできる縦型熱処理装置を提供しようと
するものである。The present invention has been made in response to such conventional circumstances, and can prevent substances in the gas exhausted from the reaction tube from adhering to the exhaust route, resulting in improved productivity compared to the prior art. The purpose of this invention is to provide a vertical heat treatment apparatus that can achieve the desired results.
[発明の構成]
(課題を解決するための手段)
すなわち本発明は、ほぼ垂直に配設された筒状の反応管
内に所定のガスを流通させ加熱を行う縦型熱処理装置に
おいて、前記反応管内から排気を行う排気経路に加熱す
る手段を設けたことを特徴とする。[Structure of the Invention] (Means for Solving the Problems) That is, the present invention provides a vertical heat treatment apparatus that performs heating by circulating a predetermined gas in a cylindrical reaction tube disposed approximately vertically. The present invention is characterized in that heating means is provided in the exhaust path through which exhaust air is discharged from the air.
(作 用)
上記構成の本発明の縦型熱処理装置では、排気経路を加
熱する手段によって排気経路を例えば付着物の融点以上
の温度に加熱しておくことにより、排気経路に反応管か
ら排気されるガス中の物質が付着することを防止する。(Function) In the vertical heat treatment apparatus of the present invention having the above configuration, by heating the exhaust route to a temperature higher than the melting point of deposits by means of heating the exhaust route, the exhaust route is heated from the reaction tube to the exhaust route. This prevents substances in the gas from adhering to the surface.
そして、このガス中の物質は、例えば冷却トラップによ
って捕捉する。The substances in this gas are then captured, for example, by a cold trap.
したがって、排気管内に付着した付着物を除去するため
のメンテナンスが不必要となり、従来に較べて生産性の
向上を図ることができる。Therefore, maintenance for removing deposits that have adhered to the inside of the exhaust pipe is unnecessary, and productivity can be improved compared to the conventional method.
(実施例) 以下本発明の実施例を図面を参照して説明する。(Example) Embodiments of the present invention will be described below with reference to the drawings.
例えば石英等から円筒状に構成された反応管(プロセス
チューブ)1は、ほぼ垂直に配設されており、この反応
管1を囲繞する如く筒状、ヒータ2および図示しない均
熱管、断熱材等が設けられている。また、この反応管1
の上部および下部には、それぞれ所定の反応ガスを導入
・排気するための反応ガス導入管3および排気管4が接
続されており、排気管4には、冷却トラップ5および排
気装置6が介挿されている。そして、排気管4の反応管
1との接続部と冷却トラップ5との間には、この排気管
4内を加熱するための手段例えばテープヒータ等からな
る加熱機構7が配設されている。For example, a cylindrical reaction tube (process tube) 1 made of quartz or the like is arranged almost vertically, and surrounding the reaction tube 1 are a cylindrical heater 2, a heat equalizing tube (not shown), a heat insulating material, etc. is provided. In addition, this reaction tube 1
A reaction gas introduction pipe 3 and an exhaust pipe 4 for introducing and exhausting a predetermined reaction gas are connected to the upper and lower parts of the reactor, respectively, and a cooling trap 5 and an exhaust device 6 are inserted into the exhaust pipe 4. has been done. A heating mechanism 7 consisting of a means for heating the inside of the exhaust pipe 4, such as a tape heater, is disposed between the connection part of the exhaust pipe 4 with the reaction tube 1 and the cooling trap 5.
また、上記冷却トラップ5は、第2図および第3図に示
すように構成されている。すなわち、例えば石英等から
ほぼ円柱状に形成されたトラップ容器20には、底部中
央に四部21が形成されており、その上側周縁部には接
線方向に沿って入口配管22が、上側中央部には出口配
管23が接続されている。また、トラップ容器20の内
部には、円筒状に形成された仕切り板24が底面との間
に間隔を設けて上側から設けられており、人口配管22
から流入した気体が図示矢印の如く螺旋状に回転しなが
ら下降し、この後上昇して出口配管23から導出される
如く構成されている。そして、このトラップ容器20は
、水冷ジャケット25内に嵌挿され、その外側および内
側(四部21)から高能率で冷却可能に構成されている
。Further, the cooling trap 5 is constructed as shown in FIGS. 2 and 3. That is, a trap container 20 formed of, for example, quartz or the like into a substantially cylindrical shape has a four part 21 formed at the center of the bottom, an inlet pipe 22 along the tangential direction at the upper peripheral edge, and an inlet pipe 22 at the upper center part. is connected to the outlet pipe 23. Further, inside the trap container 20, a cylindrical partition plate 24 is provided from above with a space between it and the bottom surface, and the artificial pipe 22
The structure is such that the gas flowing in from the pipe descends while rotating spirally as shown by the arrow in the figure, and then rises and is led out from the outlet pipe 23. This trap container 20 is fitted into a water cooling jacket 25 and is configured to be able to be cooled with high efficiency from the outside and inside (four parts 21).
さらに、反応管1の下方には、搬送機構とじて上下動可
能とされたボートエレベータ8が配設されている。この
ボートエレベータ8上には、保温筒9が設けられており
、この保温筒9は、多数の半導体ウェハ10が間隔を設
けて積層される如く載置されたウェハボート11を支持
可能に構成されている。そして、このボートエレベータ
8により、ウェハボート11に載置された半導体ウェハ
10を反応管1の下部開口から反応管1内にロード・ア
ンロードするよう構成されている。Further, a boat elevator 8 is provided below the reaction tube 1 and is capable of moving up and down together with the transport mechanism. A heat insulating cylinder 9 is provided on the boat elevator 8, and the heat insulating cylinder 9 is configured to be able to support a wafer boat 11 on which a large number of semiconductor wafers 10 are stacked at intervals. ing. The boat elevator 8 is configured to load and unload the semiconductor wafers 10 placed on the wafer boat 11 into the reaction tube 1 from the lower opening of the reaction tube 1 .
上記構成のこの実施例の縦型熱処理装置では、ヒータ2
により反応管1内を予め所定温度例えば数百度程度に加
熱しておき、ボートエレベータ8を上昇させてウェハボ
ート11に載置された半導体ウェハ10を反応管1内壁
に非接触で反応管1内にロードする。そして、反応ガス
導入管3から反応管1内に所定の反応ガス、例えば、S
’iH4,02、B2 H6、PH3等を導入し、上記
半導体ウェハ10を加熱処理後排気装置6によって排気
管4から排気することにより成膜を行う。In the vertical heat treatment apparatus of this embodiment having the above configuration, the heater 2
The inside of the reaction tube 1 is heated in advance to a predetermined temperature, for example, about several hundred degrees, and the boat elevator 8 is raised to raise the semiconductor wafer 10 placed on the wafer boat 11 into the reaction tube 1 without contacting the inner wall of the reaction tube 1. Load into. Then, a predetermined reaction gas, for example, S
'iH4,02, B2 H6, PH3, etc. are introduced, and after the semiconductor wafer 10 is heated, it is evacuated from the exhaust pipe 4 by the exhaust device 6 to form a film.
この時、例えば反応ガスとしてPH3等を使用し、リン
を含む膜の成膜を行う場合は、加熱機構7により排気管
4内を例えば150℃程度に加熱するとともに、冷却ト
ラップ5の水冷ジャケット25に冷却水を循環させてト
ラップ容器20の冷却を行う。したがって、例えば生成
された五酸化リンは、排気管4内に付着することなく、
冷却トラップ5のトラップ容器20内に流入し、螺旋状
に回転しながら下降、上昇する際に、遠心力および冷却
の効果によりこのトラップ容器20内に捕捉される。す
なわち、排気管4の温度は扱うガスの種類によって予め
設定することにより、自動的に最適な温度に設定可能で
ある。At this time, when forming a film containing phosphorus using, for example, PH3 as a reaction gas, the heating mechanism 7 heats the inside of the exhaust pipe 4 to, for example, about 150°C, and the water cooling jacket 25 of the cooling trap 5 The trap container 20 is cooled by circulating cooling water. Therefore, for example, the generated phosphorus pentoxide does not adhere to the inside of the exhaust pipe 4.
When it flows into the trap container 20 of the cooling trap 5 and descends and rises while rotating spirally, it is captured in the trap container 20 due to centrifugal force and cooling effects. That is, by setting the temperature of the exhaust pipe 4 in advance according to the type of gas to be handled, it is possible to automatically set the temperature to the optimum temperature.
そして、所定時開成膜を行った後、反応ガスの流通を停
止させ、ボートエレベータ8を下降させることによりウ
ェハボート11に載置された半導体ウェハ10を反応管
1からアンロードして、半導体ウェハ10に所定膜厚の
膜を形成する。After performing open film formation at a predetermined time, the flow of the reaction gas is stopped, and the boat elevator 8 is lowered to unload the semiconductor wafers 10 placed on the wafer boat 11 from the reaction tube 1. A film of a predetermined thickness is formed on 10.
すなわち、この実施例の縦型熱処理装置では、排気管4
の反応管1との接続部と冷却トラップ5との間に、例え
ばテープヒータ等からなる加熱機構7が配設されている
ので、この加熱機構7により排気管4内を加熱すること
により、リンを含む膜の成膜を行う際に生成される五酸
化リンの排気管4内への付着を防止することができる。That is, in the vertical heat treatment apparatus of this embodiment, the exhaust pipe 4
A heating mechanism 7 consisting of, for example, a tape heater is disposed between the connection part with the reaction tube 1 and the cooling trap 5. By heating the inside of the exhaust pipe 4 with this heating mechanism 7, the phosphorus is removed. It is possible to prevent phosphorus pentoxide generated when forming a film containing phosphorus from adhering to the inside of the exhaust pipe 4.
また、この五酸化リンは、冷却トラップ5によって捕捉
されるので外部に排出されることもなく、捕捉された五
酸化リンは水冷ジャケット25からトラップ容器20を
取り外し洗浄することにより簡単に除去することができ
る。したがって、従来のように排気管4内に付着した付
着物を除去するためのメンテナンスを行う必要がなく、
従来に較べて生産性の向上を図ることができる。Further, since this phosphorus pentoxide is captured by the cooling trap 5, it is not discharged to the outside, and the captured phosphorus pentoxide can be easily removed by removing the trap container 20 from the water cooling jacket 25 and cleaning it. I can do it. Therefore, there is no need to perform maintenance to remove deposits that have adhered to the inside of the exhaust pipe 4, as in the conventional case.
Productivity can be improved compared to the conventional method.
なお、上記実施例では、リンを含む膜の成膜を行う場合
について説明したが、その他の物質が排気管4内に付着
する場合についても、例えば排気管4内をその物質の融
点以上の温度に加熱することによって、その付むを防止
することができることはもちろんである。さらに排気系
の加熱手段としてテープヒータを用いた例について説明
したが、加熱手段であれば何れでもよく、例えばランプ
加熱、ヒータ加熱など何れでもよい。In the above embodiment, a case was explained in which a film containing phosphorus was formed. However, in the case where other substances adhere to the inside of the exhaust pipe 4, for example, the inside of the exhaust pipe 4 may be heated to a temperature higher than the melting point of the substance. Of course, it is possible to prevent this from sticking by heating it to Further, although an example has been described in which a tape heater is used as a heating means for the exhaust system, any heating means may be used, such as lamp heating or heater heating.
[発明の効果]
上述のように、本発明の縦型熱処理装置では、排気経路
に反応管から排気されるガス中の物質が付着することを
防止することができ、従来に比べて生産性の向上を図る
ことができる。[Effects of the Invention] As described above, in the vertical heat treatment apparatus of the present invention, it is possible to prevent substances in the gas exhausted from the reaction tube from adhering to the exhaust path, resulting in improved productivity compared to the conventional method. You can improve your performance.
第1図は本発明の一実施例の縦型熱処理装置を示す構成
図、第2図は第1図の冷却トラップの上面図、第3図は
第2図の冷却トラップの縦断面図である。
1・・・・・・反応管、2・・・・・・ヒータ、3・・
・・・・反応ガス導入管、4・・・・・・排気管、5・
・・・・・冷却トラップ、6・・・・・・排気装置、7
・・・・・・加熱機構、8・・・・・・ボートエレベー
タ、9・・・・・・保温筒、10・・・・・・半導体ウ
エノ1.11・・・・・・ウェハボー1゜
出願人 チル相撲株式会社
代理人 弁理士 須 山 佐 −
第1図FIG. 1 is a configuration diagram showing a vertical heat treatment apparatus according to an embodiment of the present invention, FIG. 2 is a top view of the cooling trap shown in FIG. 1, and FIG. 3 is a longitudinal sectional view of the cooling trap shown in FIG. 2. . 1...Reaction tube, 2...Heater, 3...
... Reaction gas introduction pipe, 4 ... Exhaust pipe, 5.
...Cooling trap, 6...Exhaust device, 7
... Heating mechanism, 8 ... Boat elevator, 9 ... Heat insulation cylinder, 10 ... Semiconductor wafer 1.11 ... Wafer bow 1° Applicant Chill Sumo Co., Ltd. Agent Patent Attorney Sasa Suyama - Figure 1
Claims (1)
スを流通させ加熱を行う縦型熱処理装置において、 前記反応管内から排気を行う排気経路に加熱する手段を
設けたことを特徴とする縦型熱処理装置。(1) A vertical heat treatment apparatus that heats a predetermined gas by flowing it through a cylindrical reaction tube arranged almost vertically, characterized in that a means for heating is provided in an exhaust path that exhausts air from the inside of the reaction tube. Vertical heat treatment equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63133635A JP2668019B2 (en) | 1988-05-31 | 1988-05-31 | Vertical heat treatment equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63133635A JP2668019B2 (en) | 1988-05-31 | 1988-05-31 | Vertical heat treatment equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01302816A true JPH01302816A (en) | 1989-12-06 |
JP2668019B2 JP2668019B2 (en) | 1997-10-27 |
Family
ID=15109430
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63133635A Expired - Fee Related JP2668019B2 (en) | 1988-05-31 | 1988-05-31 | Vertical heat treatment equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2668019B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0271513A (en) * | 1988-09-06 | 1990-03-12 | Tel Sagami Ltd | Semiconductor manufacturing apparatus |
JPH03185715A (en) * | 1989-12-14 | 1991-08-13 | Mitsubishi Electric Corp | Semiconductor manufacturing device |
WO2009034898A1 (en) * | 2007-09-12 | 2009-03-19 | Tokyo Electron Limited | Film forming apparatus and film forming method |
US8506713B2 (en) | 2007-09-12 | 2013-08-13 | Tokyo Electron Limited | Film deposition apparatus and film deposition method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61242011A (en) * | 1985-04-19 | 1986-10-28 | Matsushita Electric Ind Co Ltd | Vapor-phase growth device |
JPS6295817A (en) * | 1985-10-22 | 1987-05-02 | Mitsubishi Electric Corp | Photo cvd equipment |
JPS62149841U (en) * | 1986-03-17 | 1987-09-22 |
-
1988
- 1988-05-31 JP JP63133635A patent/JP2668019B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61242011A (en) * | 1985-04-19 | 1986-10-28 | Matsushita Electric Ind Co Ltd | Vapor-phase growth device |
JPS6295817A (en) * | 1985-10-22 | 1987-05-02 | Mitsubishi Electric Corp | Photo cvd equipment |
JPS62149841U (en) * | 1986-03-17 | 1987-09-22 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0271513A (en) * | 1988-09-06 | 1990-03-12 | Tel Sagami Ltd | Semiconductor manufacturing apparatus |
JPH03185715A (en) * | 1989-12-14 | 1991-08-13 | Mitsubishi Electric Corp | Semiconductor manufacturing device |
WO2009034898A1 (en) * | 2007-09-12 | 2009-03-19 | Tokyo Electron Limited | Film forming apparatus and film forming method |
US8506713B2 (en) | 2007-09-12 | 2013-08-13 | Tokyo Electron Limited | Film deposition apparatus and film deposition method |
Also Published As
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JP2668019B2 (en) | 1997-10-27 |
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