JPH01301574A - Production of substrate for forming plated circuit and production of circuit board using said substrate - Google Patents
Production of substrate for forming plated circuit and production of circuit board using said substrateInfo
- Publication number
- JPH01301574A JPH01301574A JP13199888A JP13199888A JPH01301574A JP H01301574 A JPH01301574 A JP H01301574A JP 13199888 A JP13199888 A JP 13199888A JP 13199888 A JP13199888 A JP 13199888A JP H01301574 A JPH01301574 A JP H01301574A
- Authority
- JP
- Japan
- Prior art keywords
- phase
- substrate
- forming
- heat
- sio2 content
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 54
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 239000011521 glass Substances 0.000 claims abstract description 22
- 238000005191 phase separation Methods 0.000 claims abstract description 17
- 238000010438 heat treatment Methods 0.000 claims abstract description 14
- 238000000034 method Methods 0.000 claims description 26
- 239000004020 conductor Substances 0.000 claims description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 39
- 238000007747 plating Methods 0.000 abstract description 23
- 235000012239 silicon dioxide Nutrition 0.000 abstract description 18
- 229910052751 metal Inorganic materials 0.000 abstract description 14
- 239000002184 metal Substances 0.000 abstract description 14
- 239000000377 silicon dioxide Substances 0.000 abstract description 14
- 239000000919 ceramic Substances 0.000 abstract description 12
- 229910052681 coesite Inorganic materials 0.000 abstract description 11
- 229910052906 cristobalite Inorganic materials 0.000 abstract description 11
- 229910052682 stishovite Inorganic materials 0.000 abstract description 11
- 229910052905 tridymite Inorganic materials 0.000 abstract description 11
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract description 10
- 239000000203 mixture Substances 0.000 abstract description 9
- 239000002253 acid Substances 0.000 abstract description 5
- 229910052783 alkali metal Inorganic materials 0.000 abstract description 4
- 150000001340 alkali metals Chemical class 0.000 abstract description 4
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 abstract description 4
- 239000011248 coating agent Substances 0.000 abstract description 4
- 238000000576 coating method Methods 0.000 abstract description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 4
- 230000000694 effects Effects 0.000 abstract description 3
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 abstract description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 abstract description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 abstract description 2
- 229910052796 boron Inorganic materials 0.000 abstract description 2
- KZHJGOXRZJKJNY-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Si]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O KZHJGOXRZJKJNY-UHFFFAOYSA-N 0.000 abstract description 2
- 229910052744 lithium Inorganic materials 0.000 abstract description 2
- -1 lithium or sodium Chemical class 0.000 abstract description 2
- 229910052863 mullite Inorganic materials 0.000 abstract description 2
- 150000003839 salts Chemical class 0.000 abstract description 2
- 229910052708 sodium Inorganic materials 0.000 abstract description 2
- 239000011734 sodium Substances 0.000 abstract description 2
- 239000004327 boric acid Substances 0.000 abstract 1
- 229910052810 boron oxide Inorganic materials 0.000 abstract 1
- 239000011247 coating layer Substances 0.000 abstract 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 abstract 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 8
- 229910052802 copper Inorganic materials 0.000 description 8
- 239000010949 copper Substances 0.000 description 8
- 239000003153 chemical reaction reagent Substances 0.000 description 7
- 239000010453 quartz Substances 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 6
- 239000000843 powder Substances 0.000 description 6
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 230000004913 activation Effects 0.000 description 3
- 239000011230 binding agent Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000010304 firing Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- 239000004576 sand Substances 0.000 description 3
- 229910000030 sodium bicarbonate Inorganic materials 0.000 description 3
- 235000017557 sodium bicarbonate Nutrition 0.000 description 3
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-M Bicarbonate Chemical compound OC([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-M 0.000 description 1
- BTBUEUYNUDRHOZ-UHFFFAOYSA-N Borate Chemical compound [O-]B([O-])[O-] BTBUEUYNUDRHOZ-UHFFFAOYSA-N 0.000 description 1
- 101100087393 Caenorhabditis elegans ran-2 gene Proteins 0.000 description 1
- 239000001856 Ethyl cellulose Substances 0.000 description 1
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 230000018199 S phase Effects 0.000 description 1
- 206010070834 Sensitisation Diseases 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 230000001680 brushing effect Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- SQIFACVGCPWBQZ-UHFFFAOYSA-N delta-terpineol Natural products CC(C)(O)C1CCC(=C)CC1 SQIFACVGCPWBQZ-UHFFFAOYSA-N 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 229920001249 ethyl cellulose Polymers 0.000 description 1
- 235000019325 ethyl cellulose Nutrition 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000012770 industrial material Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 1
- PIBWKRNGBLPSSY-UHFFFAOYSA-L palladium(II) chloride Chemical compound Cl[Pd]Cl PIBWKRNGBLPSSY-UHFFFAOYSA-L 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000008313 sensitization Effects 0.000 description 1
- 230000001235 sensitizing effect Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 229940116411 terpineol Drugs 0.000 description 1
- HPGGPRDJHPYFRM-UHFFFAOYSA-J tin(iv) chloride Chemical compound Cl[Sn](Cl)(Cl)Cl HPGGPRDJHPYFRM-UHFFFAOYSA-J 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/381—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the substrate
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、めっき回路形成用基板の製造法及び該基板を
用いた配線板の製造法に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for manufacturing a plated circuit forming substrate and a method for manufacturing a wiring board using the substrate.
(従来の技術) 最近の工業材料は2種々の機能性が要求され。(Conventional technology) Modern industrial materials are required to have two types of functionality.
特にセラミックスの分野においては、セラミックスの表
面を活性化して印刷性や密着性を高め金属。Particularly in the field of ceramics, the surface of ceramics is activated to improve printability and adhesion to metals.
ガラス組成物等を直接強固に密着させる方法が強く要求
されている。There is a strong demand for a method that directly and firmly adheres glass compositions and the like.
セラミックスに金属、ガラス組成物等を密着させる方法
としては9例えば未焼成のセラミックスと金属とを同時
に焼結して強固な密着強さを出す同時焼成法、焼結した
セラミックスにガラス粉と金属粉との混合ペーストを印
刷、焼付ける厚膜焼成法がある。Examples of methods for adhering metals, glass compositions, etc. to ceramics are 9. For example, simultaneous sintering of unfired ceramics and metal to achieve strong adhesion strength, and sintered ceramics with glass powder and metal powder. There is a thick film firing method that prints and bakes a paste mixed with
(発明が解決しようとする課題)
しかしながら、同時焼成法は9弱還元雰囲気中で150
0〜1600”Cの温度で焼結するため製造工程が煩雑
であり、コス、トが高いという欠点がある。(Problem to be solved by the invention) However, the simultaneous firing method is
Since it is sintered at a temperature of 0 to 1600''C, the manufacturing process is complicated, and it has the drawbacks of high cost and cost.
また、厚膜印刷焼成法は、金属とセラミックスとの密着
はガラスを介して行なわれるため、密着力は低く、金属
にAu、Ag、Pd等の貴金属を用いるためコストが高
いという欠点がある。Further, the thick film printing and firing method has disadvantages in that the adhesion between the metal and the ceramic is achieved through glass, so the adhesion is low, and the cost is high because noble metals such as Au, Ag, and Pd are used as the metal.
これらの欠点に対して、金属を安価にセラミツがある。To address these drawbacks, ceramics are cheaper than metals.
これらの方法は、アルミナなどの焼結したセラミックス
をフッ酸、水酸化ナトリウム等の酸、アルカリの溶液に
浸漬して表面を粗化した後1表面を感受性化し、さらに
活性化処理して銅めっき。These methods first roughen the surface by immersing sintered ceramics such as alumina in an acid or alkali solution such as hydrofluoric acid or sodium hydroxide, then sensitize the surface, and then perform an activation treatment to plate copper. .
ニッケルめっき等を行ない、金属を密着させるものであ
る。Nickel plating is applied to make the metal adhere tightly.
一方特開昭61−208855号公報にはセラミック基
板上に結晶化ガラス層を形成し、以下上記と同様の方法
で結晶化ガラス層の表面を粗化した後、感受性化、活性
化処理、銅めっき、ニッケルめっき等を施して金属を密
着する方法が示される。On the other hand, in JP-A-61-208855, a crystallized glass layer is formed on a ceramic substrate, and after the surface of the crystallized glass layer is roughened by the same method as above, sensitization, activation treatment, copper A method of adhering metal by applying plating, nickel plating, etc. is shown.
しかしながら上記の方法では用いる基板の材質に制限が
あり1例えば非晶質ガラス基板に対しては、良好な粗化
表面が得られないため、めっき回路形成用基板には適用
できないという問題がある。However, the above method has a problem in that it cannot be applied to a substrate for forming a plating circuit because there are restrictions on the material of the substrate to be used, and a good roughened surface cannot be obtained for, for example, an amorphous glass substrate.
本発明は従来のめつき法による金属被膜形成が困難だっ
た非晶質ガラス基板に対しても、めっき法で強固な金属
被膜を形成することが可能なめっき回路形成用基板の製
造法及び該基板を用いた配線板の製造法を提供すること
を目的とするものである。The present invention provides a method for manufacturing a substrate for plating circuit formation, on which a strong metal film can be formed by plating, even on amorphous glass substrates on which it is difficult to form a metal film by conventional plating methods. The object of the present invention is to provide a method for manufacturing a wiring board using a substrate.
(8題を解決するだめの手段)
本発明は絶縁性基板の表面に、熱処理により分た後、
8i02の含有量の少ない相の部分だけ除去するめつ
き回路形成用基板の製造法及び絶縁性基板の表面に、熱
処理により分相ガラスを形成する分相成分を塗布し、つ
いで熱処理して81o2の含有量の多い相とSiO2の
含有量の少ない相とに分相させた後、 5i02の含
有量の少ない部分だけ除去しためつき回路形成用基板を
形成し、ついで前記基板上にめっき法により導体回路を
形成する配線板の製造法に関する。(Means for Solving the 8 Problems) The present invention provides the following method:
A method for manufacturing a plated circuit forming substrate that removes only the phase portion with a low content of 8i02, and a phase splitting component that forms a phase splitting glass by heat treatment is applied to the surface of an insulating substrate, and then heat treatment is performed to remove the phase part containing 81o2. After phase separation into a phase with a high content of SiO2 and a phase with a low content of SiO2, only the portion with a low content of 5i02 is removed to form a board for forming a fixed circuit, and then a conductive circuit is formed on the board by a plating method. The present invention relates to a method of manufacturing a wiring board that forms a wiring board.
本発明において絶縁性基板は、絶縁性であれば特に制限
はないが、ガラス基板及びアルミナ、ムライト等のセラ
ミック基板を用いることが好ましい。またガラス基板は
非晶質ではあるが、絶縁性。In the present invention, the insulating substrate is not particularly limited as long as it is insulative, but it is preferable to use a glass substrate and a ceramic substrate such as alumina or mullite. Although the glass substrate is amorphous, it is insulating.
耐熱性に優れ、誘電率が低いという点で石英基板を用い
ることが好塘しい。It is preferable to use a quartz substrate because it has excellent heat resistance and a low dielectric constant.
熱処理により分相ガラスを形成する分相成分としては9
例えばSio2を主成分とし、これとリチウム、ナトリ
ウム等のアルカリ金属、これらのアルカリ金属の酸化物
もしくは塩、又はこれらとほう素、はう未酸化物、はう
酸もしくはほう酸塩との混合物が用いられる。The phase splitting component that forms phase splitting glass by heat treatment is 9.
For example, the main component is Sio2, and a mixture of this and an alkali metal such as lithium or sodium, an oxide or salt of these alkali metals, or a mixture of these with boron, unoxidized material, halic acid or borate is used. It will be done.
分相成分の塗布方法は、浸漬法、はけ塗り法。The phase separation component can be applied by dipping or brushing.
印刷法等の方法があるが1本発明ではこのような方法に
制限するものではない。There are methods such as printing, but the present invention is not limited to these methods.
分相成分を塗布した後の熱処理は2通常の電気炉を使用
し、大気中で行なうことが好ましい。また温度は9分相
成分の組成により適宜決定される。The heat treatment after applying the phase separation component is preferably carried out in the atmosphere using an ordinary electric furnace. Further, the temperature is appropriately determined depending on the composition of the 9-separated phase components.
分相した表面からSiO□の含有量の少ない相の部分だ
け除去するには9分相したガラス基板を水又は希塩酸、
希硫酸、希硝酸等の低濃度の酸に浸漬することが好まし
く、超音波振動子等を用いて機械的な振動を併用すれば
さらに好ましい。To remove only the portion of the phase with low SiO
It is preferable to immerse in a low concentration acid such as dilute sulfuric acid or dilute nitric acid, and it is more preferable to use mechanical vibration using an ultrasonic vibrator or the like.
めっき回路形成用基板上にめっきを施す方法についても
制限はなく、従来公知の方法2例えば塩化スズ、塩化パ
ラジウム等でめっき回路形成用基板の表面を感受性化、
活性化した後鍋、ニッケル等のめっきを施せばよい。There are no restrictions on the method of plating on the plating circuit forming substrate, and conventionally known methods such as sensitizing the surface of the plating circuit forming substrate with tin chloride, palladium chloride, etc.
After activation, plating with nickel or the like may be applied.
(実施例) 以下本発明の詳細な説明する。(Example) The present invention will be explained in detail below.
実施例1 炭酸水素ナトリウム(NaHCO3、和光紬薬製。Example 1 Sodium hydrogen carbonate (NaHCO3, manufactured by Wako Tsumugi Pharmaceutical Co., Ltd.).
試薬特級)10.99.はう酸(Hs BO3、和光紬
薬製、試薬特級)19.69及び珪砂(関東化学制)3
5、09を秤量し、均一に混合した後白金るつぼに入れ
、電気炉中で1450℃で3時間保持して溶融した。そ
の後急冷し、ついで溶融物をメノウ製のボールミルで粉
砕して平均粒径が2μmの分相成分粉末を得た。Reagent special grade) 10.99. Hydrolic acid (Hs BO3, manufactured by Wako Tsumugi Pharmaceutical, special grade reagent) 19.69 and silica sand (Kanto Chemical System) 3
5 and 09 were weighed, mixed uniformly, placed in a platinum crucible, and held at 1450° C. for 3 hours in an electric furnace to melt. Thereafter, it was rapidly cooled, and then the melt was ground in an agate ball mill to obtain a phase-separated component powder with an average particle size of 2 μm.
得られた分相成分粉末30gにエチルセルロース(和光
紬薬製、45Cp)1.89及びテルピネオール(和光
紬薬製、試薬1級)12gを添加して播潰機(自動混線
機)で均一に混合して分相成分ペーストを得た。1.89 g of ethyl cellulose (Wako Tsumugi Pharmaceutical Co., Ltd., 45Cp) and 12 g of terpineol (Wako Tsumugi Pharmaceutical Co., Ltd., reagent grade 1) were added to 30 g of the obtained phase-separated component powder and mixed uniformly with a crusher (automatic mixer). A phase separation component paste was obtained.
次に寸法がsoxsomm角、厚さが1mmで、純度が
96チのアルミナ基板(日立化成工業製、商標名ハロツ
クス、商品名552)及び上記と同寸法の石英板の表面
に上記で得た分相成分ペーストを8μmの厚さにスクリ
ーン印刷し、乾燥後電気炉に入れ、5℃/分の昇温速度
で450℃まで昇温し、450℃で1時間保持して脱バ
インダーを行なった。この後15°C/分の昇温速度で
900℃まで昇温し、900℃で10分間保持して分相
成分ペーストを焼付け、さらに10℃/分の降温速度で
700℃まで降温し、700℃で3時間保持してSiO
2の含有量の多い相とSiO2の含有量の少ない相とに
分相させ、ついで炉冷した。冷却後60’Cに加熱した
濃度がINのHCl中に24時間浸漬して5i02の含
有量の少ない相の部分を除去(溶出)シ、さらに純水中
で5分間超音波洗浄してめっき回路形成用基板を得た。Next, the amount obtained above was applied to the surface of an alumina substrate (manufactured by Hitachi Chemical Co., Ltd., trade name: Harox, product name 552) with dimensions of soxsom square, thickness of 1 mm, and purity of 96 cm and a quartz plate of the same dimensions as above. The phase component paste was screen printed to a thickness of 8 μm, dried, placed in an electric furnace, heated to 450° C. at a heating rate of 5° C./min, and held at 450° C. for 1 hour to remove the binder. After that, the temperature was raised to 900 °C at a temperature increase rate of 15 °C/min, held at 900 °C for 10 minutes to bake the phase separation component paste, and further lowered to 700 °C at a temperature decrease rate of 10 °C/min. Hold at ℃ for 3 hours to remove SiO
The mixture was separated into a phase containing a large amount of SiO2 and a phase containing a small amount of SiO2, and then cooled in a furnace. After cooling, the plating circuit was heated to 60'C and immersed in HCl with a concentration of IN for 24 hours to remove (elute) the phase with low 5i02 content, and then ultrasonically cleaned in pure water for 5 minutes to complete the plating circuit. A substrate for formation was obtained.
得られためつき回路形成用基板の表面に無電解鋼めっき
(日立化成工業製、商品名Cu5t 2000を使用)
を4時間行ない、銅被膜を全面に8μmの厚さに施した
。Electroless steel plating (manufactured by Hitachi Chemical Co., Ltd., trade name Cu5t 2000 was used) on the surface of the obtained board for forming a matte circuit.
This was carried out for 4 hours, and a copper coating was applied to the entire surface to a thickness of 8 μm.
次に銅被膜上に通常公知の方法でレジスト膜を形成し、
露光、現像、エツチング、レジスト膜の剥離等の工程を
経て寸法が2X2mの導体配線を形成した配線板を得た
。Next, a resist film is formed on the copper film by a commonly known method,
Through steps such as exposure, development, etching, and peeling off of the resist film, a wiring board with conductor wiring having dimensions of 2×2 m was obtained.
得られた配線板の密着強度を測定したところ。The adhesion strength of the resulting wiring board was measured.
アルミナ基板9石英基板ともZ、 Okg/ran2以
上の値を示し良好であった。Both the alumina substrate and 9 quartz substrates showed good values of Z, Okg/ran2 or more.
実施例2 炭酸水素ナトリウム(NaHCCll 、和光紬薬製。Example 2 Sodium hydrogen carbonate (NaHCCll, manufactured by Wako Tsumugi Pharmaceutical Co., Ltd.).
試薬特級)13.69.はう酸(H3BO3、和光紬薬
製、試薬特級)35.6g及び珪砂(関東化学数)25
9を秤量し、均一に混合した後白金るつぼに入れ、電気
炉中で1150℃で3時間保持して溶融した。その後急
冷し、以下実施例1と同様の方法で粉砕して分相成分粉
末を得、さらにペースト化して分相成分ペーストを得た
。Reagent special grade) 13.69. 35.6 g of phosphoric acid (H3BO3, manufactured by Wako Tsumugi Pharmaceutical Co., Ltd., reagent grade) and silica sand (Kanto Chemical Number) 25
9 was weighed, mixed uniformly, placed in a platinum crucible, and held at 1150° C. for 3 hours in an electric furnace to melt. Thereafter, it was rapidly cooled and ground in the same manner as in Example 1 to obtain a phase-separated component powder, which was further made into a paste to obtain a phase-separated component paste.
この分相成分ペーストを実施例1で用いたアルミナ基板
と石英基板の表面に6μmの厚さにスクリーン印刷し、
乾燥後電気炉に入れ、5℃/分の昇温速度で450℃ま
で昇温し、450℃で1時間保持して脱バインダーを行
なった。この後15℃/分の昇温速度で800℃まで昇
温し、SOO℃で10分間保持して分相成分ペーストを
焼付け。This phase separation component paste was screen printed to a thickness of 6 μm on the surfaces of the alumina substrate and quartz substrate used in Example 1.
After drying, it was placed in an electric furnace, heated to 450°C at a rate of 5°C/min, and held at 450°C for 1 hour to remove the binder. Thereafter, the temperature was raised to 800°C at a temperature increase rate of 15°C/min and held at SOO°C for 10 minutes to bake the phase separation component paste.
さらに10°C/分の降温速度で5506C4で降温し
、550℃で2時間保持して5in2の含有量の多い相
と5i01の含有量の少ない相とに分相させ。Further, the temperature was lowered to 5506C4 at a cooling rate of 10°C/min, and held at 550°C for 2 hours to cause phase separation into a phase with a high content of 5in2 and a phase with a low content of 5i01.
ついで炉冷した。Then it was cooled in the oven.
以下実施例1と同様の工程を経てめっき回路形成用基板
を得、さらに銅めつきを行ない配線板を得た。Thereafter, a plating circuit forming substrate was obtained through the same steps as in Example 1, and copper plating was further performed to obtain a wiring board.
得られた配線板の密着強度を測定したところ。The adhesion strength of the resulting wiring board was measured.
アルミナ基板9石英基板とも2.0 kg/rran”
以上の値を示し良好であった。2.0 kg/rran for both alumina substrate and 9 quartz substrates
The results showed good results.
実施例3
炭酸水素す) IJウム(N aHcOs l和光紬薬
製。Example 3 Hydrogen carbonate) IJum (NaHcOsl manufactured by Wako Tsumugi Pharmaceutical Co., Ltd.)
試薬特級)10.89及び珪砂(関東化学数)46.0
9を秤量し、均一に混合した後白金るつぼに入れ。Reagent special grade) 10.89 and silica sand (Kanto chemical number) 46.0
Weigh 9, mix it evenly, and then put it in a platinum crucible.
電気炉中で1150℃で3時間保持して溶融した。It was held at 1150° C. for 3 hours in an electric furnace to melt it.
その後急冷し、以下実施例1と同様の方法で粉砕して分
相成分粉末を得、さらにペースト化して分相成分ペース
トを得た。Thereafter, it was rapidly cooled and ground in the same manner as in Example 1 to obtain a phase-separated component powder, which was further made into a paste to obtain a phase-separated component paste.
この分相成分ペーストを実施例1で用いたアルミナ基板
と石英基板の表面に6μmの厚さにスクリーン印刷し、
乾燥後電気炉に入れ、5°C/分の昇温速度で450’
C−1で昇温し、450℃で1時間保持して脱バインダ
ーを行なった。この後15℃/分の昇温速度で870℃
まで昇温し、870℃で10分間保持して分相成分ペー
ストを焼付け。This phase separation component paste was screen printed to a thickness of 6 μm on the surfaces of the alumina substrate and quartz substrate used in Example 1.
After drying, put it in an electric furnace and heat it for 450' at a heating rate of 5°C/min.
The temperature was raised at C-1 and held at 450°C for 1 hour to remove the binder. After this, the temperature was increased to 870°C at a heating rate of 15°C/min.
The temperature was raised to 870°C for 10 minutes to bake the phase separation component paste.
さらに10℃/分の降温速度で700℃まで降温し、7
00℃で1時間保持してSiO2の含有量の多い相とS
iO2の含有量の少ない相とに分相させ。The temperature was further lowered to 700℃ at a cooling rate of 10℃/min, and 7
After holding at 00℃ for 1 hour, the phase with high SiO2 content and S
Phase separation into a phase with low iO2 content.
ついで炉冷した。Then it was cooled in the oven.
以下実施例1と同様の工程を経てめっき回路形成用基板
を得、さらに銅めっきを行ない配線板を得た。Thereafter, a plating circuit forming substrate was obtained through the same steps as in Example 1, and copper plating was further performed to obtain a wiring board.
得られた配線板の密着強度を測定したところ。The adhesion strength of the resulting wiring board was measured.
アルミナ基板9五英基板とも2.0kg/m”以上の値
を示し良好であった。All of the alumina substrates and 9 five-English substrates had values of 2.0 kg/m'' or more, which were good.
比較例1
アルミナ基板上に非晶質ガラス層を形成したグレーズド
基板(日立化成工業類)及び石英基板をそれぞれ20℃
に保持し、たフッ酸(HF、和光紬薬製、試薬)中に浸
漬し、さらに純水中で十分に水洗した後実施例1と同様
の方法で無電解銅めっきを行ない配線板を得た。Comparative Example 1 A glazed substrate with an amorphous glass layer formed on an alumina substrate (Hitachi Chemical) and a quartz substrate were heated at 20°C.
After holding it in water and immersing it in hydrofluoric acid (HF, Wako Tsumugi Co., Ltd., reagent), and washing it thoroughly in pure water, electroless copper plating was performed in the same manner as in Example 1 to obtain a wiring board. Ta.
得られた配線板を観察したところグレーズド基板1五英
基板とも銅めっき不析出部や9表面に膨れが多数発生し
、密着力の評価を行なうに至らなかった。When the obtained wiring boards were observed, many bulges were observed in the non-copper plating areas and on the surface of 9 for both the glazed substrates 1 and 5, and it was not possible to evaluate the adhesion.
(発明の効果)
本発明によれば、めっき法による金属被膜形成が困難だ
った非晶質ガラス基板に対して、セラミックスのように
めっき法で強固な金属被膜を形成表
することが可能なめつき回路形成用基板お↓び該基板を
用いた配線板を得ることができる。(Effects of the Invention) According to the present invention, it is possible to form a strong metal film on an amorphous glass substrate, on which it has been difficult to form a metal film using a plating method, like ceramics. A circuit-forming substrate and a wiring board using the substrate can be obtained.
Claims (2)
成する分相成分を塗布し,ついで熱処理してSiO_2
の含有量の多い相とSiO_2の含有量の少ない相とに
分相させた後,SiO_2の含有量の少ない相の部分だ
け除去することを特徴とするめつき回路形成用基板の製
造法。1. A phase splitting component that forms phase splitting glass is applied to the surface of the insulating substrate by heat treatment, and then heat treatment is performed to form SiO_2.
A method for manufacturing a plated circuit board, which comprises separating the phase into a phase with a high content of SiO_2 and a phase with a low content of SiO_2, and then removing only the portion of the phase with a low content of SiO_2.
成する分相成分を塗布し,ついで熱処理してSiO_2
の含有量の多い相とSiO_2の含有量の少ない相とに
分相させた後,SiO_2の含有量の少ない相の部分だ
け除去しためつき回路形成用基板を形成し,ついで前記
基板上にめつき法により導体回路を形成することを特徴
とする配線板の製造法。2. A phase splitting component that forms phase splitting glass is applied to the surface of the insulating substrate by heat treatment, and then heat treatment is performed to form SiO_2.
After phase separation into a phase with a high content of SiO_2 and a phase with a low content of SiO_2, only the portion of the phase with a low content of SiO_2 is removed to form a plated circuit forming substrate. A method for manufacturing a wiring board, characterized by forming a conductor circuit by a pinning method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13199888A JPH01301574A (en) | 1988-05-30 | 1988-05-30 | Production of substrate for forming plated circuit and production of circuit board using said substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13199888A JPH01301574A (en) | 1988-05-30 | 1988-05-30 | Production of substrate for forming plated circuit and production of circuit board using said substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01301574A true JPH01301574A (en) | 1989-12-05 |
Family
ID=15071165
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13199888A Pending JPH01301574A (en) | 1988-05-30 | 1988-05-30 | Production of substrate for forming plated circuit and production of circuit board using said substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01301574A (en) |
-
1988
- 1988-05-30 JP JP13199888A patent/JPH01301574A/en active Pending
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