JPH0130095B2 - - Google Patents
Info
- Publication number
- JPH0130095B2 JPH0130095B2 JP55154650A JP15465080A JPH0130095B2 JP H0130095 B2 JPH0130095 B2 JP H0130095B2 JP 55154650 A JP55154650 A JP 55154650A JP 15465080 A JP15465080 A JP 15465080A JP H0130095 B2 JPH0130095 B2 JP H0130095B2
- Authority
- JP
- Japan
- Prior art keywords
- test
- leak
- test object
- test chamber
- leak detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 68
- 239000000523 sample Substances 0.000 claims description 22
- 238000012935 Averaging Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/22—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
- G01M3/226—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators
- G01M3/229—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators removably mounted in a test cell
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/202—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Examining Or Testing Airtightness (AREA)
Description
【発明の詳細な説明】
〔発明の目的〕
(産業上の利用分野)
本発明は、被試験物のリーク量を検査するリー
クテスト装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a leak test device for testing the leakage amount of a test object.
(従来の技術)
第1図にリークテスト装置によるいわゆる積分
法と呼ばれるリーク検査の方法を示す。第1図に
おいて、1は密閉容器で形成されたテストチエン
バ、2はプローブガス3が充填された被試験物、
4はテストチエンバ1に設けられた吸引口、5は
吸引ポンプを内蔵するリークデテクタの検出部、
6はリークデテクタの測定部である。(Prior Art) FIG. 1 shows a leak test method called the so-called integral method using a leak test device. In FIG. 1, 1 is a test chamber formed of a closed container, 2 is a test object filled with probe gas 3,
4 is a suction port provided in the test chamber 1; 5 is a detection part of a leak detector with a built-in suction pump;
6 is a measuring section of the leak detector.
いま、被試験物2の体積を差し引いたテストチ
エンバ1の内容積をV(CC)とし、被試験物2の
リーク量をL(cc/sec)、放置時間をT(sec)と
すれば、T時間放置後のテストチエンバ1内空間
のプローブガスの濃度Aは、
A=L×T/V ………(1)
と表わせる。テストチエンバ1にプローブガスを
充填した被試験物2を入れ、一定時間T後に、リ
ークデテクタ5,6によりテストチエンバ1内の
プローブガスの濃度Aを測定すれば、(1)式から被
試験物のリーク量Lを知ることができる。 Now, if the internal volume of the test chamber 1 after subtracting the volume of the test object 2 is V (CC), the leakage amount of the test object 2 is L (cc/sec), and the standing time is T (sec), then T The concentration A of the probe gas in the space inside the test chamber 1 after standing for a period of time can be expressed as A=L×T/V (1). If the test chamber 1 is filled with the test object 2 filled with probe gas and the concentration A of the probe gas in the test chamber 1 is measured after a certain period of time T by the leak detectors 5 and 6, then from equation (1), the test object leaks. The quantity L can be known.
(発明が解決しようとする課題)
上記の方法の利点は、リークデテクタの最高感
度に限界があつても、放置時間を長くすれば、極
めて微小なリーク量まで検知できることであり、
被試験物の全体のリーク量が一度に検査できるこ
とである。しかしながら、テストチエンバ内が大
気圧のときは、プローブガスの拡散係数や比重な
どの関係から、テストチエンバ内の空間のプロー
ブガスの濃度が必ずしも均一にならない。このこ
とは、測定に際しての吸引箇所や被試験物のリー
ク箇所の如何により検知したリーク量が異なつて
くることになり、検査品質の不均一さなどを招く
という欠点がある。そこで本発明は、上記の欠点
を解消できるとともに、被試験物におけるリーク
点も検知できるリークテスト装置を実現すること
を課題とし、本発明の目的もそこにある。(Problem to be Solved by the Invention) The advantage of the above method is that even if there is a limit to the maximum sensitivity of the leak detector, it is possible to detect even the smallest amount of leak if left for a long time.
The entire leakage amount of the test object can be inspected at once. However, when the inside of the test chamber is at atmospheric pressure, the concentration of the probe gas in the space inside the test chamber is not necessarily uniform due to the relationship between the diffusion coefficient and specific gravity of the probe gas. This has the drawback that the detected leakage amount varies depending on the suction point during measurement and the leakage point of the test object, leading to non-uniformity in inspection quality. SUMMARY OF THE INVENTION Therefore, an object of the present invention is to realize a leak test device that can eliminate the above-mentioned drawbacks and also detect leak points in a test object, and that is also an object of the present invention.
(課題を解決するための手段)
本発明のリークテスト装置は、プローブガスを
充填した被試験物を密閉容器で形成されたテスト
チエンバ内に収納して放置し、被試験物からリー
クしたプローブガスを前記テストチエンバ内に蓄
積させ、蓄積されたプローブガスの量により被試
験物のリーク量を検査するリークテスト装置にお
いて、前記テストチエンバの複数箇所に設けられ
た複数個の吸引口と、これら各吸引口にそれぞれ
接続された配管と、これら各配管にそれぞれ設け
られた弁と、これらの弁を時間間隔をおいて一定
時間だけ順次開放する弁開閉手段と、この手段に
より開閉される弁および前記配管を介して前記テ
ストチエンバ内の気体を吸引する吸引ポンプと、
この吸引ポンプにより吸引された気体内のプロー
ブガス濃度を測定するリークデテクタと、このリ
ークデテクタから得られる各弁開放時の濃度出力
の大小を比較する手段と、前記リークデテクタか
ら得られる濃度出力を積分・平均化して前記被試
験物のリーク量を測定する平均化回路とを具備す
るように構成される。
(Means for Solving the Problems) The leak test device of the present invention stores a test object filled with a probe gas in a test chamber formed of a sealed container and leaves it there, and detects the probe gas leaking from the test object. In a leak test device that tests the amount of leakage of a test object based on the amount of probe gas accumulated in the test chamber, a plurality of suction ports provided at a plurality of locations in the test chamber, and a plurality of suction ports at each of these suction ports are provided. pipes connected to each other, valves provided in each of these pipes, a valve opening/closing means for sequentially opening these valves for a certain period of time at time intervals, a valve opened and closed by this means, and a valve provided on each of the pipes, a suction pump that suctions the gas in the test chamber;
A leak detector for measuring the probe gas concentration in the gas sucked by the suction pump; a means for comparing the concentration output obtained from the leak detector when each valve is opened; and a means for comparing the concentration output obtained from the leak detector. and an averaging circuit that measures the amount of leakage of the object under test by integrating and averaging.
(作用)
本発明のリークテスト装置においては、各弁を
閉にした状態でプローブガスを充填した被試験物
をテストチエンバ内に収納し一定時間放置する。
一定時間経過後、吸引ポンプを始動し、各弁を時
間間隔をおいて順次一定時間だけ開にする。各弁
がそれぞれ開になつたときのリークデテクタの濃
度出力の大小を比較することにより、リーク点が
被試験物のどこにあるかを知ることができる。そ
して、各弁がそれぞれ開になつているときのリー
クデテクタの濃度出力を平均化回路にて積分・平
均化して平均濃度を求めれば、この濃度値はテス
トチエンバ内におけるプロブーガスの平均濃度を
示しているので
A=L×T/V ………(1)
から被試験物のリーク量Lを知ることができる。(Function) In the leak test apparatus of the present invention, a test object filled with probe gas is housed in a test chamber with each valve closed and left for a certain period of time.
After a certain period of time has elapsed, the suction pump is started and each valve is sequentially opened for a certain period of time at time intervals. By comparing the magnitude of the concentration output of the leak detector when each valve is opened, it is possible to know where the leak point is located in the test object. Then, if the concentration output of the leak detector when each valve is open is integrated and averaged by the averaging circuit to obtain the average concentration, this concentration value indicates the average concentration of probe gas in the test chamber. Therefore, the leakage amount L of the test object can be found from A=L×T/V (1).
(実施例)
以下、図面に示した実施例に基づいて本発明を
詳細に説明する。第2図に本発明一実施例のリー
クテスト装置を示す。第2図において、1はテス
トチエンバ、2はプローブガス3が充填された被
試験物、S1,S2,S3,S4はテストチエンバ1の4
箇所に設けられた吸引口、P1,P2,P3,P4はそ
れぞれ前記各吸引口に接続された配管、V1,V2,
V3,V4はそれぞれ前記配管P1,P2,P3,P4にそ
れぞれ設けられた弁である。また、この各弁から
の配管を1本に集合し、吸引ポンプPMを介して
リークデテクタLDに接続する。そして、各弁V1
〜V4は、図示していない弁開閉手段により、第
3図aに示すように、所定の時間間隔をおいて一
定時間だけ順次開放される。第2図において、1
0は平均化回路で、各弁V1〜V4の順次の開放時
にリークデテクタLDから得られる濃度出力を積
分・平均化してテストチエンバ1内におけるプロ
ーブガスの平均濃度を算出し、それに基づいて被
試験物のリーク量を求める。(Example) Hereinafter, the present invention will be explained in detail based on the example shown in the drawings. FIG. 2 shows a leak test device according to an embodiment of the present invention. In Fig. 2, 1 is a test chamber, 2 is a test object filled with probe gas 3, and S 1 , S 2 , S 3 , and S 4 are 4 of test chamber 1.
The suction ports provided at the locations, P 1 , P 2 , P 3 , and P 4 are pipes connected to the respective suction ports, V 1 , V 2 ,
V 3 and V 4 are valves provided in the pipes P 1 , P 2 , P 3 and P 4 , respectively. In addition, the pipes from each valve are collected into one pipe and connected to the leak detector LD via the suction pump PM. And each valve V 1
-V4 are sequentially opened for a certain period of time at predetermined time intervals, as shown in FIG. 3a, by a valve opening/closing means (not shown). In Figure 2, 1
0 is an averaging circuit that integrates and averages the concentration output obtained from the leak detector LD when each valve V 1 to V 4 is sequentially opened, calculates the average concentration of the probe gas in the test chamber 1, and calculates the average concentration of the probe gas in the test chamber 1 based on this. Determine the leakage amount of the test object.
上記のように構成された本発明一実施例のリー
クテスト装置においては、各弁V1〜V4を閉にし
た状態でプローブガス3を充填した被試験物2を
テストチエンバ1内に収納し一定時間放置する。
一定時間経過後、吸引ポンプPMを始動し、図示
していない弁開閉手段により、第3図aに示すよ
うに、弁V1から順次弁V4まで所定の時間間隔を
おいてそれぞれ一定時間だけ弁を開にする。これ
により、吸引口S1,S2,S3,S4近傍の気体が順次
リークデテクタLDに送り込まれる。 In the leak test apparatus according to the embodiment of the present invention configured as described above, the test object 2 filled with the probe gas 3 is housed in the test chamber 1 with each valve V 1 to V 4 closed, and Leave it for a while.
After a certain period of time has elapsed, the suction pump PM is started, and as shown in FIG . Open the valve. As a result, the gas near the suction ports S 1 , S 2 , S 3 , and S 4 is sequentially sent to the leak detector LD.
そこで、各弁V1〜V4がそれぞれ開になつたと
きのリークデテクタLDの濃度出力の大小を図示
していない手段により(あるいは検査員により)
比較することにより、リーク点が被試験物2のど
こにあるかを知ることができる。すなわち、第3
図bに示すようにリークデテクタLDの濃度出力
がなつたとすれば、リーク点は吸引口S4の近傍に
あることがわかる。勿論、吸引口を多くすればす
るほどリーク点がより正確にわかる。 Therefore, the magnitude of the concentration output of the leak detector LD when each valve V 1 to V 4 is opened is determined by means not shown (or by an inspector).
By comparing, it is possible to know where the leak point is located in the test object 2. That is, the third
If the concentration output of the leak detector LD drops as shown in FIG. b, it can be seen that the leak point is near the suction port S4 . Of course, the more suction ports there are, the more accurately the leak point can be determined.
また、各弁V1〜V4がそれぞれ開になつたとき
のリークデテクタLDの濃度出力は平均化回路1
0に順次入力され、平均化回路10にて積分・平
均化を行なつて平均濃度が算出され、
A=L×T/V ………(1)
に基く演算により被試験物1のリーク量Lが求め
られる。 In addition, when each valve V 1 to V 4 is opened, the concentration output of the leak detector LD is determined by the averaging circuit 1.
The average concentration is calculated by integrating and averaging in the averaging circuit 10, and the leakage amount of the test object 1 is calculated based on A=L×T/V (1). L is required.
以上詳述したように本発明によれば、積分法に
よるリーク検査において、テストチエンバ内のプ
ローブガス濃度の不均一に基く測定誤差の発生の
問題を解消できるばかりでなく、さらに、複数個
の吸引口からの時間間隔をおいた一定時間だけの
サンプリングにより、各吸引口近傍のプローブガ
ス濃度の不均一を利用して各サンプリング毎のリ
ークデテクタの濃度出力の比較から被試験物のリ
ーク点を知ることも可能なリークテスト装置を提
供できる。
As described in detail above, according to the present invention, in a leak test using the integral method, it is possible not only to solve the problem of measurement errors caused by non-uniformity of the probe gas concentration in the test chamber, but also The leak point of the test object can be found by comparing the concentration output of the leak detector for each sampling by sampling at a certain time interval from We can also provide a leak test device that can perform
第1図は積分法によるリークテスト装置の従来
例を示す概略図、第2図は本発明一実施例のリー
クテスト装置を示す系統図、第3図a,bはそれ
ぞれ第2図の装置における弁の開動作のタイムチ
ヤートおよび各弁の開動作時のリークデテクタ出
力を示すグラフである。
1……テストチエンバ、2……被試験物、3…
…プローブガス、10……平均化回路、S1,S2,
S3,S4……吸引口、P1,P2,P3,P4……配管、
V1,V2,V3,V4……弁、PM……吸引ポンプ、
LD……リークデテクタ。
FIG. 1 is a schematic diagram showing a conventional example of a leak test device using the integral method, FIG. 2 is a system diagram showing a leak test device according to an embodiment of the present invention, and FIGS. 3 is a graph showing a time chart of a valve opening operation and a leak detector output at the time of each valve opening operation. 1... Test chamber, 2... Test object, 3...
...Probe gas, 10...Averaging circuit, S 1 , S 2 ,
S 3 , S 4 ... Suction port, P 1 , P 2 , P 3 , P 4 ... Piping,
V 1 , V 2 , V 3 , V 4 ... Valve, PM ... Suction pump,
LD...Leak detector.
Claims (1)
で形成されたテストチエンバ内に収納して放置
し、被試験物からリークしたプローブガスを前記
テストチエンバ内に蓄積させ、蓄積されたプロー
ブガスの量により被試験物のリーク量を検査する
リークテスト装置において、前記テストチエンバ
の複数箇所に設けられた複数個の吸引口と、これ
ら各吸引口にそれぞれ接続された配管と、これら
各配管にそれぞれ設けられた弁と、これらの弁を
時間間隔をおいて一定時間だけ順次開放する弁開
閉手段と、この手段により開閉される弁および前
記配管を介して前記テストチエンバ内の気体を吸
引する吸引ポンプと、この吸引ポンプにより吸引
された気体内のプローブガス濃度を測定するリー
クデテクタと、このリークデテクタから得られる
各弁開放時の濃度出力の大小を比較する手段と、
前記リークデテクタから得られる濃度出力を積
分・平均化して前記被試験物のリーク量を測定す
る平均化回路とを具備したことを特徴とするリー
クテスト装置。1. A test object filled with probe gas is stored in a test chamber formed of a sealed container and left to stand, probe gas leaking from the test object is accumulated in the test chamber, and the amount of probe gas accumulated is A leak test device for inspecting the amount of leakage of a test object includes a plurality of suction ports provided at a plurality of locations in the test chamber, pipes connected to each of these suction ports, and valves provided respectively to each of these pipes. a valve opening/closing means that sequentially opens these valves for a certain period of time at time intervals; a suction pump that suctions gas in the test chamber through the valves opened and closed by this means and the piping; and this suction pump. a leak detector for measuring the probe gas concentration in the gas sucked by the leak detector; and a means for comparing the magnitude of the concentration output obtained from the leak detector when each valve is opened;
A leak test device comprising: an averaging circuit that integrates and averages the concentration output obtained from the leak detector to measure the leak amount of the test object.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15465080A JPS5779422A (en) | 1980-11-05 | 1980-11-05 | Leak test device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15465080A JPS5779422A (en) | 1980-11-05 | 1980-11-05 | Leak test device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5779422A JPS5779422A (en) | 1982-05-18 |
JPH0130095B2 true JPH0130095B2 (en) | 1989-06-16 |
Family
ID=15588862
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15465080A Granted JPS5779422A (en) | 1980-11-05 | 1980-11-05 | Leak test device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5779422A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN214748689U (en) * | 2021-02-08 | 2021-11-16 | 明达实业(厦门)有限公司 | Air leakage detection structure and test cover structure of inflatable product |
CN112763152A (en) * | 2021-02-08 | 2021-05-07 | 明达实业(厦门)有限公司 | Air leakage detection method of inflatable product |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5240999A (en) * | 1975-09-29 | 1977-03-30 | Sanken Solar Kk | Photoelectric control circuit for fault lamp |
JPS5471688A (en) * | 1977-11-18 | 1979-06-08 | Ishikawajima Harima Heavy Ind | Method of detecting leakage from secondary barrier for membraneetype tank |
-
1980
- 1980-11-05 JP JP15465080A patent/JPS5779422A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5240999A (en) * | 1975-09-29 | 1977-03-30 | Sanken Solar Kk | Photoelectric control circuit for fault lamp |
JPS5471688A (en) * | 1977-11-18 | 1979-06-08 | Ishikawajima Harima Heavy Ind | Method of detecting leakage from secondary barrier for membraneetype tank |
Also Published As
Publication number | Publication date |
---|---|
JPS5779422A (en) | 1982-05-18 |
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