JPH01298724A - Semiconductor substrate supporting boat - Google Patents
Semiconductor substrate supporting boatInfo
- Publication number
- JPH01298724A JPH01298724A JP12931988A JP12931988A JPH01298724A JP H01298724 A JPH01298724 A JP H01298724A JP 12931988 A JP12931988 A JP 12931988A JP 12931988 A JP12931988 A JP 12931988A JP H01298724 A JPH01298724 A JP H01298724A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- semiconductor substrate
- support
- protrusion
- gap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 58
- 239000004065 semiconductor Substances 0.000 title claims abstract description 47
- 238000005229 chemical vapour deposition Methods 0.000 claims description 3
- 229920000620 organic polymer Polymers 0.000 abstract description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 6
- 229910052814 silicon oxide Inorganic materials 0.000 abstract description 6
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 abstract description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- 229910000077 silane Inorganic materials 0.000 abstract description 5
- 239000006227 byproduct Substances 0.000 abstract description 4
- 238000006243 chemical reaction Methods 0.000 abstract description 4
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 230000008021 deposition Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 description 5
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000006555 catalytic reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 description 1
- 150000001282 organosilanes Chemical class 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体基板支持ボートに関し、特に竪型減圧化
学気相堆積装置に使用される半導体基板支持ボートに関
する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor substrate support boat, and more particularly to a semiconductor substrate support boat used in a vertical reduced pressure chemical vapor deposition apparatus.
減圧化学気相堆積(以下LPGVDと略記)は半導体集
積回路¥J逍工程において多用され、多結晶シリコン膜
、窒化シリコン膜、酸化シリコン膜等の形成に使用され
ている。また、最近の半導体基板の大口径化およびこれ
に伴なう半導体基板支持ボートの大型化によって総重量
が増大し、これらの移動が容易な竪型LPGVD装置が
主流になりつつある。Low pressure chemical vapor deposition (hereinafter abbreviated as LPGVD) is frequently used in semiconductor integrated circuit manufacturing processes, and is used to form polycrystalline silicon films, silicon nitride films, silicon oxide films, and the like. In addition, the recent increase in the diameter of semiconductor substrates and the accompanying increase in the size of semiconductor substrate support boats has increased the total weight, and vertical LPGVD devices that are easy to move are becoming mainstream.
従来、竪型LPGVD装置に使用されている半導体基板
支持ボートを図を用いて説明する。第3図(a) 、
(b)に示すように、従来の半導体基板支持ボートは複
数本の支持棒31に、半導体基板を搭載する支持円板3
2.32・・・が上下に複数段固定され、各段の支持円
板32の中央に半導体基板34が載置される。また支持
円板32には外周縁から中央部にかけて半導体基板搬送
治具を抜差しする溝33か設けられており、該湧33内
に治具を抜差しすることにより基板34の支持円板32
上への搬出入を行っている。A semiconductor substrate support boat conventionally used in a vertical LPGVD device will be explained with reference to the drawings. Figure 3(a),
As shown in (b), in the conventional semiconductor substrate support boat, a support disk 3 on which a semiconductor substrate is mounted is mounted on a plurality of support rods 31.
2.32... are fixed in a plurality of stages vertically, and a semiconductor substrate 34 is placed in the center of the support disk 32 of each stage. Further, the support disk 32 is provided with a groove 33 extending from the outer periphery to the center thereof into which a semiconductor substrate transfer jig is inserted and removed.
Carrying in and out of the building is being carried out.
半導体集積回路装置の層間絶縁膜として使用されるシリ
コン酸化膜をLPCVD法で形成する場合、反応ガスと
してシラン(SiH,)と酸素(02)を用いる方法と
、有機シラン、例えば、テトラエトキシシラン(TE0
1)を用いる方法とがある。後者の方法は段差に対する
被覆性に潰れ、この方法は最近の高度集積化された半導
体集積回路装置の製造工程に適しているとされている。When forming a silicon oxide film used as an interlayer insulating film of a semiconductor integrated circuit device by the LPCVD method, there are two methods: using silane (SiH, ) and oxygen (02) as reaction gases, and using an organic silane, such as tetraethoxysilane ( TE0
There is a method using 1). The latter method has poor coverage of steps, and is said to be suitable for the manufacturing process of recent highly integrated semiconductor integrated circuit devices.
しかしながら、上述した従来の半導体基板支持ボートを
使用して有機シランによるシリコン酸化膜を形成すると
、半導体基板の表面においては良好なシリコン酸化膜が
得られるものの、裏面においてはしばしば黒色の有機ポ
リマーの形成か認められる。これは半導体基板34と支
持円板32との間に存在する微小な空隙に有機シランが
侵入し、表面触媒反応を起こすか、炭素(C)や水素(
H)を含んだ副生成物が微小な空隙を通って完全に排気
することができずにポリマー化すると考えられる。However, when forming a silicon oxide film using organosilane using the conventional semiconductor substrate support boat described above, although a good silicon oxide film is obtained on the front surface of the semiconductor substrate, black organic polymer is often formed on the back surface. or recognized. This is because organic silane enters the minute voids existing between the semiconductor substrate 34 and the support disk 32 and causes a surface catalytic reaction, or carbon (C) or hydrogen (
It is thought that by-products containing H) cannot be completely exhausted through minute voids and are polymerized.
この黒色の有機ポリマーは弗化水素酸(HF)等の酸に
溶けない、しかも、粗な膜質であり、容易に基板裏面よ
り剥離して、半導体集積回路装置の製造歩留りを低下さ
せるという大きな問題があった。This black organic polymer is insoluble in acids such as hydrofluoric acid (HF), and has a rough film quality that easily peels off from the backside of the substrate, resulting in a major problem in that it reduces the manufacturing yield of semiconductor integrated circuit devices. was there.
本発明の目的は前記課題を解決した半導体基板ボートを
提供することにある。An object of the present invention is to provide a semiconductor substrate boat that solves the above problems.
上述した従来の半導体基板支持ボートに対し、本発明は
半導体基板と半導体基板支持円板の間に空隙を設け、反
応副生成物の速やかな排気を可能にするという相違点を
有する。The present invention differs from the conventional semiconductor substrate support boat described above in that a gap is provided between the semiconductor substrate and the semiconductor substrate support disk, thereby allowing reaction byproducts to be quickly exhausted.
上記目的を達成するため、本発明は、竪型減圧化学気相
堆積装置に使用される半導体基板支持ボートにおいて、
半導体基板を搭載する支持体に、半導体基板と支持体と
の間に隙間を設けて該基板を支持する複数の突起を有す
るものである。In order to achieve the above object, the present invention provides a semiconductor substrate support boat used in a vertical reduced pressure chemical vapor deposition apparatus.
A support body on which a semiconductor substrate is mounted has a plurality of protrusions that support the substrate with a gap provided between the semiconductor substrate and the support body.
以下、本発明の実施例を図により説明する。 Embodiments of the present invention will be described below with reference to the drawings.
(実施例1)
第1図(a)は本発明の実施例1を示す縦断面図、第1
図(b)は同横断面図である。(Example 1) FIG. 1(a) is a longitudinal sectional view showing Example 1 of the present invention.
Figure (b) is a cross-sectional view of the same.
図において、半導体基板14を搭載する複数の支持円板
12.12・・・を複数本の支持棒11.11・・・に
て支持して上下に複数段配設し、各段の支持円板12上
に背の高い複数の支持突起13.13・・・を植設する
。In the figure, a plurality of support disks 12, 12... on which semiconductor substrates 14 are mounted are supported by a plurality of support rods 11, 11..., arranged in multiple stages vertically, and a support circle of each stage is shown. A plurality of tall support protrusions 13, 13... are planted on the plate 12.
本実施例の支持突起13は背が高く設定しであることに
より、半導体基板14を支持する際に該基板14と支持
円板12どの間に、基板裏面側に廻り込むガスの排気を
行う空隙及び半導体基板搬送治具を抜差しする清を兼務
する隙間を形成する。The support protrusions 13 of this embodiment are set tall, so that when supporting the semiconductor substrate 14, there is a gap between the substrate 14 and the support disk 12 for exhausting gas that has gone around to the back side of the substrate. Also, a gap is formed that also serves as a space for inserting and removing the semiconductor substrate transport jig.
実施例において、半導体基板14は支持突起13上に置
かれ支持される。半導体基板14の移動は半導体基板1
4と支持円板12との間の空間に半導体搬送治具を抜差
しすることにより行う。In the embodiment, the semiconductor substrate 14 is placed on and supported by the support protrusion 13 . The movement of the semiconductor substrate 14 is
This is done by inserting and removing a semiconductor transport jig into and from the space between 4 and the support disk 12.
本発明の半導体基板支持体ボートにおいては、半導体基
板14と支持円板12との空隙が充分に大きく、反応副
生成物が速やかに排気され、有機ポリマーを生じること
がない。In the semiconductor substrate support boat of the present invention, the gap between the semiconductor substrate 14 and the support disk 12 is sufficiently large, so that reaction by-products are quickly exhausted and no organic polymer is produced.
(実施例2)
第2図(a)は本発明の実施例2を示す縦断面図、第2
図(b)は同横断面図である。(Example 2) FIG. 2(a) is a vertical sectional view showing Example 2 of the present invention.
Figure (b) is a cross-sectional view of the same.
本実施例は、支持突起23の高さを、基板裏面側に廻り
込むカスを排気するに充分な隙間を基板14と支持円板
12との間に設けるに必要な高さに設定し、半導体搬送
治具を抜差しする講24を支持円板12に別途設けたも
のである6本実繕例において支持突起23により基板1
4と支持円板12どの間に隙間が形成されるため、基板
14の裏面に有機ポリマーを生成することはない。In this embodiment, the height of the support protrusion 23 is set to the height necessary to provide a gap between the substrate 14 and the support disk 12 sufficient to exhaust the debris that goes around to the back side of the substrate, and In the repair example, the support protrusions 23 are used to attach and remove the substrate 1 using the support protrusions 23.
Since a gap is formed between the substrate 4 and the support disk 12, no organic polymer is produced on the back surface of the substrate 14.
実施例2においては、半導体基板搬送治具川の空間は溝
24にて確保されるので、支持突起23の寸法は最小限
でよく、その結果、半導体基板14の表面と支持円板1
2表面との高低差が実施例1と比較して小さく、膜厚の
半導体基板面内均一性か向上するという効果がある。In the second embodiment, the space between the semiconductor substrate transfer jig and the support disk 1 is secured by the groove 24, so the size of the support protrusion 23 can be minimized, and as a result, the surface of the semiconductor substrate 14 and the support disk 1 are
The difference in height between the two surfaces is smaller than that in Example 1, and the uniformity of the film thickness within the surface of the semiconductor substrate is improved.
以上説明したように本発明は半導体基板と支持円板の間
に突起を設けて隙間を形成して積極的に基板裏面側を排
気することにより、有機シランを用いた酸化シリコン膜
堆積時において、有機ポリマー膜を生成することかなく
、その結果、半導体集積回路装置の製造歩留りを向上で
きるという効果かある。As explained above, the present invention provides a protrusion between the semiconductor substrate and the support disk to form a gap and actively exhausts the back side of the substrate, thereby reducing the amount of organic polymer when depositing a silicon oxide film using organic silane. This method has the effect of improving the manufacturing yield of semiconductor integrated circuit devices without forming a film.
第1図(a)は本発明の実施例1を示す縦断面図、第1
図(b)は同横断面図、第2図(a)は本発明の実施例
2を示す縦断面図、第2図(b)は同横断面図、第3図
(a)は従来例を示す縦断面図、第3図fb)は同横断
面図である。
11・・・支持棒 12・・・支持円板13
・・・支持突起 14・・・半導体基板24・
・・半導体基板搬送用涌
特許出願人 日本電気株式会社
(a)
(b)
第1図FIG. 1(a) is a vertical cross-sectional view showing Embodiment 1 of the present invention.
FIG. 2(b) is a cross-sectional view of the same, FIG. 2(a) is a vertical cross-sectional view showing Example 2 of the present invention, FIG. 2(b) is a cross-sectional view of the same, and FIG. 3(a) is a conventional example. FIG. 3 fb) is a cross-sectional view of the same. 11...Support rod 12...Support disk 13
...Support protrusion 14...Semiconductor substrate 24.
...Semiconductor substrate transfer wheel Patent applicant: NEC Corporation (a) (b) Figure 1
Claims (1)
板支持ボートにおいて、半導体基板を搭載する支持体に
、半導体基板と支持体との間に隙間を設けて該基板を支
持する複数の突起を有することを特徴とする半導体基板
支持ボート。(1) In a semiconductor substrate support boat used in a vertical reduced pressure chemical vapor deposition apparatus, a support body on which a semiconductor substrate is mounted has a plurality of support bodies supporting the substrate with a gap provided between the semiconductor substrate and the support body. A semiconductor substrate support boat characterized by having a protrusion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12931988A JPH01298724A (en) | 1988-05-26 | 1988-05-26 | Semiconductor substrate supporting boat |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12931988A JPH01298724A (en) | 1988-05-26 | 1988-05-26 | Semiconductor substrate supporting boat |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01298724A true JPH01298724A (en) | 1989-12-01 |
Family
ID=15006637
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12931988A Pending JPH01298724A (en) | 1988-05-26 | 1988-05-26 | Semiconductor substrate supporting boat |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01298724A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006303512A (en) * | 2006-04-27 | 2006-11-02 | Hitachi Kokusai Electric Inc | Semiconductor manufacturing apparatus and method, and boat |
JP2010199618A (en) * | 2010-05-18 | 2010-09-09 | Hitachi Kokusai Electric Inc | Semiconductor manufacturing apparatus, semiconductor manufacturing method and boat |
CN106711065A (en) * | 2015-11-17 | 2017-05-24 | 株式会社Eugene科技 | Substrate processing apparatus and substrate processing method using the same |
-
1988
- 1988-05-26 JP JP12931988A patent/JPH01298724A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006303512A (en) * | 2006-04-27 | 2006-11-02 | Hitachi Kokusai Electric Inc | Semiconductor manufacturing apparatus and method, and boat |
JP2010199618A (en) * | 2010-05-18 | 2010-09-09 | Hitachi Kokusai Electric Inc | Semiconductor manufacturing apparatus, semiconductor manufacturing method and boat |
CN106711065A (en) * | 2015-11-17 | 2017-05-24 | 株式会社Eugene科技 | Substrate processing apparatus and substrate processing method using the same |
JP2017098534A (en) * | 2015-11-17 | 2017-06-01 | ユ−ジーン テクノロジー カンパニー.リミテッド | Substrate processing apparatus and substrate processing method using the same |
CN106711065B (en) * | 2015-11-17 | 2019-11-05 | 株式会社Eugene科技 | Substrate processing device and the Method of processing a substrate for using the substrate processing device |
US10793949B2 (en) | 2015-11-17 | 2020-10-06 | Eugene Technology Co., Ltd. | Substrate processing apparatus and substrate processing method using the same |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5932286A (en) | Deposition of silicon nitride thin films | |
US6499427B1 (en) | Plasma CVD apparatus | |
JP3207832B2 (en) | CVD reactor and method for producing epitaxially grown semiconductor wafers | |
US7479187B2 (en) | Method for manufacturing silicon epitaxial wafer | |
CN112201568A (en) | Method and equipment for epitaxial growth of silicon wafer | |
JPH05152215A (en) | Film formation device | |
JPH01298724A (en) | Semiconductor substrate supporting boat | |
US20040053513A1 (en) | Method for production of semiconductor components | |
US20060226557A1 (en) | Semiconductor substrate with occurrence of slip suppressed and method of manufacturing the same | |
WO2003088332A1 (en) | Method for forming silicon epitaxial layer | |
JPH0831752A (en) | Cleaning and coating of reaction chamber of cvd system | |
US5460691A (en) | Method of treating surface of semiconductor substrate | |
JPS6228569B2 (en) | ||
JP4066881B2 (en) | Surface treatment method, silicon epitaxial wafer manufacturing method, and silicon epitaxial wafer | |
JP2005039153A (en) | Substrate processing apparatus and method of manufacturing semiconductor device | |
JP2983084B2 (en) | Thin film forming method and vacuum film forming apparatus using this method | |
JP2003183837A (en) | Semiconductor device manufacturing process and substrate treating device | |
JP3201970B2 (en) | Semiconductor film formation method | |
JP2983322B2 (en) | Manufacturing method of epitaxial wafer | |
JPH06168914A (en) | Etching process | |
JPH0758035A (en) | Heat treatment jig for semiconductor wafer | |
JP2766100B2 (en) | Method for removing unreacted gas in reduced pressure vapor phase growth apparatus | |
JPH0625859A (en) | Cvd film forming device and plasma cleaning method | |
JP2776921B2 (en) | Plasma etching method and plasma etching apparatus | |
CN111850510A (en) | In-situ cleaning method for PECVD (plasma enhanced chemical vapor deposition) equipment and corresponding PECVD equipment |