JPH01298724A - Semiconductor substrate supporting boat - Google Patents

Semiconductor substrate supporting boat

Info

Publication number
JPH01298724A
JPH01298724A JP12931988A JP12931988A JPH01298724A JP H01298724 A JPH01298724 A JP H01298724A JP 12931988 A JP12931988 A JP 12931988A JP 12931988 A JP12931988 A JP 12931988A JP H01298724 A JPH01298724 A JP H01298724A
Authority
JP
Japan
Prior art keywords
substrate
semiconductor substrate
support
protrusion
gap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12931988A
Other languages
Japanese (ja)
Inventor
Kenji Okamura
健司 岡村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP12931988A priority Critical patent/JPH01298724A/en
Publication of JPH01298724A publication Critical patent/JPH01298724A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To eliminate the formation of an organic polymer film at the time of deposition of a silicon oxide film using organic silane and to improve the manufacturing yield of a semiconductor integrated circuit device by forming a protrusion between a semiconductor substrate and a supporting disc to form a gap, and evacuating the rear side of the substrate. CONSTITUTION:A supporting protrusion 13 is set highly in its height, and, when a semiconductor substrate 14 is supported, an air gap for evacuating gas to be introduced to the rear face side of the substrate and a gap used also as a groove for removing and inserting a semiconductor substrate transfer jig are provided between the substrate 14 and a supporting disc 12. The substrate 14 is placed on the protrusion 13, and supported. The substrate 14 is moved by inserting and removing the jig in a space between the substrate 14 and the disc 12. Accordingly, the air gap between the substrate 14 and the disc 12 is sufficiently large, and reaction by-product is rapidly discharged, and no organic polymer is generated.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体基板支持ボートに関し、特に竪型減圧化
学気相堆積装置に使用される半導体基板支持ボートに関
する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor substrate support boat, and more particularly to a semiconductor substrate support boat used in a vertical reduced pressure chemical vapor deposition apparatus.

〔従来の技術〕[Conventional technology]

減圧化学気相堆積(以下LPGVDと略記)は半導体集
積回路¥J逍工程において多用され、多結晶シリコン膜
、窒化シリコン膜、酸化シリコン膜等の形成に使用され
ている。また、最近の半導体基板の大口径化およびこれ
に伴なう半導体基板支持ボートの大型化によって総重量
が増大し、これらの移動が容易な竪型LPGVD装置が
主流になりつつある。
Low pressure chemical vapor deposition (hereinafter abbreviated as LPGVD) is frequently used in semiconductor integrated circuit manufacturing processes, and is used to form polycrystalline silicon films, silicon nitride films, silicon oxide films, and the like. In addition, the recent increase in the diameter of semiconductor substrates and the accompanying increase in the size of semiconductor substrate support boats has increased the total weight, and vertical LPGVD devices that are easy to move are becoming mainstream.

従来、竪型LPGVD装置に使用されている半導体基板
支持ボートを図を用いて説明する。第3図(a) 、 
(b)に示すように、従来の半導体基板支持ボートは複
数本の支持棒31に、半導体基板を搭載する支持円板3
2.32・・・が上下に複数段固定され、各段の支持円
板32の中央に半導体基板34が載置される。また支持
円板32には外周縁から中央部にかけて半導体基板搬送
治具を抜差しする溝33か設けられており、該湧33内
に治具を抜差しすることにより基板34の支持円板32
上への搬出入を行っている。
A semiconductor substrate support boat conventionally used in a vertical LPGVD device will be explained with reference to the drawings. Figure 3(a),
As shown in (b), in the conventional semiconductor substrate support boat, a support disk 3 on which a semiconductor substrate is mounted is mounted on a plurality of support rods 31.
2.32... are fixed in a plurality of stages vertically, and a semiconductor substrate 34 is placed in the center of the support disk 32 of each stage. Further, the support disk 32 is provided with a groove 33 extending from the outer periphery to the center thereof into which a semiconductor substrate transfer jig is inserted and removed.
Carrying in and out of the building is being carried out.

半導体集積回路装置の層間絶縁膜として使用されるシリ
コン酸化膜をLPCVD法で形成する場合、反応ガスと
してシラン(SiH,)と酸素(02)を用いる方法と
、有機シラン、例えば、テトラエトキシシラン(TE0
1)を用いる方法とがある。後者の方法は段差に対する
被覆性に潰れ、この方法は最近の高度集積化された半導
体集積回路装置の製造工程に適しているとされている。
When forming a silicon oxide film used as an interlayer insulating film of a semiconductor integrated circuit device by the LPCVD method, there are two methods: using silane (SiH, ) and oxygen (02) as reaction gases, and using an organic silane, such as tetraethoxysilane ( TE0
There is a method using 1). The latter method has poor coverage of steps, and is said to be suitable for the manufacturing process of recent highly integrated semiconductor integrated circuit devices.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、上述した従来の半導体基板支持ボートを
使用して有機シランによるシリコン酸化膜を形成すると
、半導体基板の表面においては良好なシリコン酸化膜が
得られるものの、裏面においてはしばしば黒色の有機ポ
リマーの形成か認められる。これは半導体基板34と支
持円板32との間に存在する微小な空隙に有機シランが
侵入し、表面触媒反応を起こすか、炭素(C)や水素(
H)を含んだ副生成物が微小な空隙を通って完全に排気
することができずにポリマー化すると考えられる。
However, when forming a silicon oxide film using organosilane using the conventional semiconductor substrate support boat described above, although a good silicon oxide film is obtained on the front surface of the semiconductor substrate, black organic polymer is often formed on the back surface. or recognized. This is because organic silane enters the minute voids existing between the semiconductor substrate 34 and the support disk 32 and causes a surface catalytic reaction, or carbon (C) or hydrogen (
It is thought that by-products containing H) cannot be completely exhausted through minute voids and are polymerized.

この黒色の有機ポリマーは弗化水素酸(HF)等の酸に
溶けない、しかも、粗な膜質であり、容易に基板裏面よ
り剥離して、半導体集積回路装置の製造歩留りを低下さ
せるという大きな問題があった。
This black organic polymer is insoluble in acids such as hydrofluoric acid (HF), and has a rough film quality that easily peels off from the backside of the substrate, resulting in a major problem in that it reduces the manufacturing yield of semiconductor integrated circuit devices. was there.

本発明の目的は前記課題を解決した半導体基板ボートを
提供することにある。
An object of the present invention is to provide a semiconductor substrate boat that solves the above problems.

〔発明の従来技術に対する相違点〕[Differences between the invention and the prior art]

上述した従来の半導体基板支持ボートに対し、本発明は
半導体基板と半導体基板支持円板の間に空隙を設け、反
応副生成物の速やかな排気を可能にするという相違点を
有する。
The present invention differs from the conventional semiconductor substrate support boat described above in that a gap is provided between the semiconductor substrate and the semiconductor substrate support disk, thereby allowing reaction byproducts to be quickly exhausted.

〔課題を解決するための手段〕[Means to solve the problem]

上記目的を達成するため、本発明は、竪型減圧化学気相
堆積装置に使用される半導体基板支持ボートにおいて、
半導体基板を搭載する支持体に、半導体基板と支持体と
の間に隙間を設けて該基板を支持する複数の突起を有す
るものである。
In order to achieve the above object, the present invention provides a semiconductor substrate support boat used in a vertical reduced pressure chemical vapor deposition apparatus.
A support body on which a semiconductor substrate is mounted has a plurality of protrusions that support the substrate with a gap provided between the semiconductor substrate and the support body.

〔実施例〕〔Example〕

以下、本発明の実施例を図により説明する。 Embodiments of the present invention will be described below with reference to the drawings.

(実施例1) 第1図(a)は本発明の実施例1を示す縦断面図、第1
図(b)は同横断面図である。
(Example 1) FIG. 1(a) is a longitudinal sectional view showing Example 1 of the present invention.
Figure (b) is a cross-sectional view of the same.

図において、半導体基板14を搭載する複数の支持円板
12.12・・・を複数本の支持棒11.11・・・に
て支持して上下に複数段配設し、各段の支持円板12上
に背の高い複数の支持突起13.13・・・を植設する
In the figure, a plurality of support disks 12, 12... on which semiconductor substrates 14 are mounted are supported by a plurality of support rods 11, 11..., arranged in multiple stages vertically, and a support circle of each stage is shown. A plurality of tall support protrusions 13, 13... are planted on the plate 12.

本実施例の支持突起13は背が高く設定しであることに
より、半導体基板14を支持する際に該基板14と支持
円板12どの間に、基板裏面側に廻り込むガスの排気を
行う空隙及び半導体基板搬送治具を抜差しする清を兼務
する隙間を形成する。
The support protrusions 13 of this embodiment are set tall, so that when supporting the semiconductor substrate 14, there is a gap between the substrate 14 and the support disk 12 for exhausting gas that has gone around to the back side of the substrate. Also, a gap is formed that also serves as a space for inserting and removing the semiconductor substrate transport jig.

実施例において、半導体基板14は支持突起13上に置
かれ支持される。半導体基板14の移動は半導体基板1
4と支持円板12との間の空間に半導体搬送治具を抜差
しすることにより行う。
In the embodiment, the semiconductor substrate 14 is placed on and supported by the support protrusion 13 . The movement of the semiconductor substrate 14 is
This is done by inserting and removing a semiconductor transport jig into and from the space between 4 and the support disk 12.

本発明の半導体基板支持体ボートにおいては、半導体基
板14と支持円板12との空隙が充分に大きく、反応副
生成物が速やかに排気され、有機ポリマーを生じること
がない。
In the semiconductor substrate support boat of the present invention, the gap between the semiconductor substrate 14 and the support disk 12 is sufficiently large, so that reaction by-products are quickly exhausted and no organic polymer is produced.

(実施例2) 第2図(a)は本発明の実施例2を示す縦断面図、第2
図(b)は同横断面図である。
(Example 2) FIG. 2(a) is a vertical sectional view showing Example 2 of the present invention.
Figure (b) is a cross-sectional view of the same.

本実施例は、支持突起23の高さを、基板裏面側に廻り
込むカスを排気するに充分な隙間を基板14と支持円板
12との間に設けるに必要な高さに設定し、半導体搬送
治具を抜差しする講24を支持円板12に別途設けたも
のである6本実繕例において支持突起23により基板1
4と支持円板12どの間に隙間が形成されるため、基板
14の裏面に有機ポリマーを生成することはない。
In this embodiment, the height of the support protrusion 23 is set to the height necessary to provide a gap between the substrate 14 and the support disk 12 sufficient to exhaust the debris that goes around to the back side of the substrate, and In the repair example, the support protrusions 23 are used to attach and remove the substrate 1 using the support protrusions 23.
Since a gap is formed between the substrate 4 and the support disk 12, no organic polymer is produced on the back surface of the substrate 14.

実施例2においては、半導体基板搬送治具川の空間は溝
24にて確保されるので、支持突起23の寸法は最小限
でよく、その結果、半導体基板14の表面と支持円板1
2表面との高低差が実施例1と比較して小さく、膜厚の
半導体基板面内均一性か向上するという効果がある。
In the second embodiment, the space between the semiconductor substrate transfer jig and the support disk 1 is secured by the groove 24, so the size of the support protrusion 23 can be minimized, and as a result, the surface of the semiconductor substrate 14 and the support disk 1 are
The difference in height between the two surfaces is smaller than that in Example 1, and the uniformity of the film thickness within the surface of the semiconductor substrate is improved.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は半導体基板と支持円板の間
に突起を設けて隙間を形成して積極的に基板裏面側を排
気することにより、有機シランを用いた酸化シリコン膜
堆積時において、有機ポリマー膜を生成することかなく
、その結果、半導体集積回路装置の製造歩留りを向上で
きるという効果かある。
As explained above, the present invention provides a protrusion between the semiconductor substrate and the support disk to form a gap and actively exhausts the back side of the substrate, thereby reducing the amount of organic polymer when depositing a silicon oxide film using organic silane. This method has the effect of improving the manufacturing yield of semiconductor integrated circuit devices without forming a film.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)は本発明の実施例1を示す縦断面図、第1
図(b)は同横断面図、第2図(a)は本発明の実施例
2を示す縦断面図、第2図(b)は同横断面図、第3図
(a)は従来例を示す縦断面図、第3図fb)は同横断
面図である。 11・・・支持棒      12・・・支持円板13
・・・支持突起     14・・・半導体基板24・
・・半導体基板搬送用涌 特許出願人  日本電気株式会社 (a) (b) 第1図
FIG. 1(a) is a vertical cross-sectional view showing Embodiment 1 of the present invention.
FIG. 2(b) is a cross-sectional view of the same, FIG. 2(a) is a vertical cross-sectional view showing Example 2 of the present invention, FIG. 2(b) is a cross-sectional view of the same, and FIG. 3(a) is a conventional example. FIG. 3 fb) is a cross-sectional view of the same. 11...Support rod 12...Support disk 13
...Support protrusion 14...Semiconductor substrate 24.
...Semiconductor substrate transfer wheel Patent applicant: NEC Corporation (a) (b) Figure 1

Claims (1)

【特許請求の範囲】[Claims] (1)竪型減圧化学気相堆積装置に使用される半導体基
板支持ボートにおいて、半導体基板を搭載する支持体に
、半導体基板と支持体との間に隙間を設けて該基板を支
持する複数の突起を有することを特徴とする半導体基板
支持ボート。
(1) In a semiconductor substrate support boat used in a vertical reduced pressure chemical vapor deposition apparatus, a support body on which a semiconductor substrate is mounted has a plurality of support bodies supporting the substrate with a gap provided between the semiconductor substrate and the support body. A semiconductor substrate support boat characterized by having a protrusion.
JP12931988A 1988-05-26 1988-05-26 Semiconductor substrate supporting boat Pending JPH01298724A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12931988A JPH01298724A (en) 1988-05-26 1988-05-26 Semiconductor substrate supporting boat

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12931988A JPH01298724A (en) 1988-05-26 1988-05-26 Semiconductor substrate supporting boat

Publications (1)

Publication Number Publication Date
JPH01298724A true JPH01298724A (en) 1989-12-01

Family

ID=15006637

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12931988A Pending JPH01298724A (en) 1988-05-26 1988-05-26 Semiconductor substrate supporting boat

Country Status (1)

Country Link
JP (1) JPH01298724A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006303512A (en) * 2006-04-27 2006-11-02 Hitachi Kokusai Electric Inc Semiconductor manufacturing apparatus and method, and boat
JP2010199618A (en) * 2010-05-18 2010-09-09 Hitachi Kokusai Electric Inc Semiconductor manufacturing apparatus, semiconductor manufacturing method and boat
CN106711065A (en) * 2015-11-17 2017-05-24 株式会社Eugene科技 Substrate processing apparatus and substrate processing method using the same

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006303512A (en) * 2006-04-27 2006-11-02 Hitachi Kokusai Electric Inc Semiconductor manufacturing apparatus and method, and boat
JP2010199618A (en) * 2010-05-18 2010-09-09 Hitachi Kokusai Electric Inc Semiconductor manufacturing apparatus, semiconductor manufacturing method and boat
CN106711065A (en) * 2015-11-17 2017-05-24 株式会社Eugene科技 Substrate processing apparatus and substrate processing method using the same
JP2017098534A (en) * 2015-11-17 2017-06-01 ユ−ジーン テクノロジー カンパニー.リミテッド Substrate processing apparatus and substrate processing method using the same
CN106711065B (en) * 2015-11-17 2019-11-05 株式会社Eugene科技 Substrate processing device and the Method of processing a substrate for using the substrate processing device
US10793949B2 (en) 2015-11-17 2020-10-06 Eugene Technology Co., Ltd. Substrate processing apparatus and substrate processing method using the same

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