JPH0129241Y2 - - Google Patents

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Publication number
JPH0129241Y2
JPH0129241Y2 JP11421684U JP11421684U JPH0129241Y2 JP H0129241 Y2 JPH0129241 Y2 JP H0129241Y2 JP 11421684 U JP11421684 U JP 11421684U JP 11421684 U JP11421684 U JP 11421684U JP H0129241 Y2 JPH0129241 Y2 JP H0129241Y2
Authority
JP
Japan
Prior art keywords
crucible
gas
single crystal
manufacturing apparatus
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11421684U
Other languages
Japanese (ja)
Other versions
JPS6130077U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11421684U priority Critical patent/JPS6130077U/en
Publication of JPS6130077U publication Critical patent/JPS6130077U/en
Application granted granted Critical
Publication of JPH0129241Y2 publication Critical patent/JPH0129241Y2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【考案の詳細な説明】[Detailed explanation of the idea]

〔産業上利用分野〕 本考案はチヨクラルスキー法による単結晶製造
装置に関するものである。 〔従来技術〕 チヨクラルスキー法による単結晶の育成は、る
つぼを加熱し、るつぼ内の原料を融解したのち、
種結晶を融液に浸し、その種結晶を引上げること
によつて行なわれる。この方法において、高品質
な単結晶を育成するため、固液界面の垂直方向の
温度分布に適当な勾配を持たせる必要がある。そ
のため、るつぼ周囲を耐火物で囲んだり、るつぼ
の加熱方法を検討し、適正な温度勾配を持たせて
いる。しかし、単結晶の育成が進行していくと、
るつぼ内の原料融液の量が減少していくために、
固液界面が結晶育成初期よりも下がり、固液界面
直上のるつぼ壁が加熱されるつぼがアフターヒー
ター効果を示すため、温度勾配が大きく変化して
しまい結晶の品質が低下する原因となる。 従来、上述のような垂直方向の温度勾配の変化
を防ぐため、るつぼの加熱源である高周波加熱用
コイルの位置を上下させる方法がとられている
が、結晶育成初期の温度勾配を忠実に再現させる
ことは難しく、とくに結晶下部での品質の低下は
避けられない状況であつた。 〔考案の目的〕 本考案の目的は、上述の欠点を除去し、結晶育
成初期の温度勾配を結晶育成後期においても保つ
ことができる単結晶製造装置を提供することであ
る。 〔考案の構成〕 本考案によれば、るつぼを備え、チヨクラルス
キー法を用いる単結晶製造装置において、該るつ
ぼの壁直上に放射状に配列され、前記るつぼ内に
ガスを吐出するための少なくとも3本のガス管
と、該ガスの吐出量を調節するための調節機構と
を有することを特徴とする単結晶製造装置が得ら
れる。 〔考案の実施例〕 以下本考案について実施例に基づいて説明す
る。 まず第1図a及びbを参照して、本考案による
単結晶製造装置の構造について説明すると、図示
のように耐火性の支持ケース1内にはるつぼ2が
配置されるとともに支持ケース1の外部には高周
波コイル3が配置されている。 るつぼ2の壁直上でしかもこの壁のわずか内側
には図示のように放射状に等間隔に3本のガス管
4が配列され、このガス管4の噴出口は下側に向
けられている。(なおガス管の材質は育成される
結晶種により異なる。)。このガス管4はガス量調
節部5を介して図示のように流量計6に接続さ
れ、さらにガスボンベ7に接続されている。 るつぼ2内にSiなどの原料を入れ、高周波コイ
ル3によつてるつぼ2を加熱して原料を溶融し、
種結晶(図示せず)をこの融液8に浸して、種結
晶を引きあげて単結晶を育成するわけであるが、
この時ガスボンベ7から例えばN2などのガスが
送られ、しかもこのガスの量はガス量調節部5に
よつて調整され3本のガス管4に均等にガスが流
れるようになつている。またガスの流量は流量計
によつて計測される。 次に第2図a及びb、第3図a,b及びcを参
照して、上述した構造の単結晶製造装置を用い
て、考案者が単結晶を製造した結果について説明
する。 この単結晶の製造においては、内径50mm、深さ
50mmのるつぼを用い、るつぼ内にはるつぼの上端
から5mmの位置まで原料融液が装入されている。
またこの時ガス管を通して流した雰囲気ガスは
O2であり、下記の表に原料融液の位置即ち固液
界面の位置と流量計に示されたガス流量との関係
を示す。
[Industrial Application Field] The present invention relates to a single crystal manufacturing apparatus using the Czyochralski method. [Prior art] To grow a single crystal using the Czyochralski method, after heating a crucible and melting the raw materials in the crucible,
This is done by dipping a seed crystal into a melt and pulling it up. In this method, in order to grow a high-quality single crystal, it is necessary to provide an appropriate gradient in the temperature distribution in the vertical direction of the solid-liquid interface. For this reason, the crucible is surrounded by refractories and methods of heating the crucible are studied to create an appropriate temperature gradient. However, as single crystal growth progresses,
As the amount of raw material melt in the crucible decreases,
The solid-liquid interface is lower than it was at the beginning of crystal growth, and the crucible wall directly above the solid-liquid interface is heated, which causes an afterheater effect, resulting in a large change in temperature gradient, which causes a decline in crystal quality. Conventionally, in order to prevent changes in the vertical temperature gradient as described above, the method used was to move the high-frequency heating coil, which is the heating source of the crucible, up and down, but this method faithfully reproduces the temperature gradient during the initial stage of crystal growth. It was difficult to achieve this, and deterioration in quality, especially in the lower part of the crystal, was unavoidable. [Purpose of the invention] An object of the invention is to provide a single crystal manufacturing apparatus that eliminates the above-mentioned drawbacks and can maintain the temperature gradient at the early stage of crystal growth even in the latter stage of crystal growth. [Structure of the invention] According to the invention, in a single crystal production apparatus that includes a crucible and uses the Czyokralski method, at least three A single crystal manufacturing apparatus is obtained, which is characterized by having a main gas pipe and an adjustment mechanism for adjusting the discharge amount of the gas. [Examples of the invention] The invention will be described below based on examples. First, the structure of the single crystal manufacturing apparatus according to the present invention will be explained with reference to FIGS. A high-frequency coil 3 is arranged at. Immediately above the wall of the crucible 2 and slightly inside the wall, three gas pipes 4 are arranged radially at equal intervals as shown in the figure, and the ejection ports of the gas pipes 4 are directed downward. (The material of the gas pipe varies depending on the type of crystal being grown.) This gas pipe 4 is connected to a flow meter 6 as shown in the figure via a gas amount adjusting section 5, and is further connected to a gas cylinder 7. A raw material such as Si is placed in a crucible 2, and the crucible 2 is heated by a high frequency coil 3 to melt the raw material.
A seed crystal (not shown) is immersed in this melt 8, and the seed crystal is pulled up to grow a single crystal.
At this time, a gas such as N 2 is sent from the gas cylinder 7, and the amount of this gas is adjusted by the gas amount adjusting section 5 so that the gas flows equally through the three gas pipes 4. Further, the gas flow rate is measured by a flow meter. Next, with reference to FIGS. 2a and 2b and FIGS. 3a, b, and c, the inventor will explain the results of manufacturing a single crystal using the single crystal manufacturing apparatus having the above-described structure. In manufacturing this single crystal, the inner diameter is 50 mm, the depth is
A 50 mm crucible is used, and the raw material melt is charged into the crucible to a position 5 mm from the top of the crucible.
Also, the atmospheric gas flowed through the gas pipe at this time was
The table below shows the relationship between the position of the raw material melt, that is, the position of the solid-liquid interface, and the gas flow rate indicated by the flow meter.

〔考案の効果〕[Effect of idea]

以上説明したように本考案による単結晶装置を
用いれば、結晶育成の初期から後期に至るまで一
定の垂直方向の温度分布が得られ、品質の良好な
単結晶を製造することができるという利点があ
る。
As explained above, by using the single crystal apparatus according to the present invention, a constant vertical temperature distribution can be obtained from the early stage to the late stage of crystal growth, and the advantage is that it is possible to produce high-quality single crystals. be.

【図面の簡単な説明】[Brief explanation of drawings]

第1図aは本考案による単結晶製造装置の要部
を示す平面図、第1図bは本考案による単結晶製
造装置の要部を示す側断面図、第2図aは結晶育
成の初期段階におけるるつぼと固液界面の位置関
係を示すための図、第2図bは本考案による単結
晶製造装置を用いて単結晶を製造する場合におい
て、第2図aに示す状態における垂直方向の温度
分布を示すための図、第3図aは結晶育成の後期
段階におけるるつぼと固液界面の位置関係を示す
ための図、第3図bは従来の単結晶製造装置を用
いて単結晶を製造する場合において、第3図aに
示す状態における垂直方向の温度分布を示すため
の図、第3図cは本考案による単結晶製造装置を
用いて単結晶を製造する場合において、第3図a
に示す状態における垂直方向の温度分布を示すた
めの図である。 1……耐火性の支持ケース、2……るつぼ、3
……高周波コイル、4……ガス管、5……ガス量
調整部、6……流量計、7……ガスボンベ、8…
…原料融液、9……単結晶。
Figure 1a is a plan view showing the main parts of the single crystal manufacturing apparatus according to the present invention, Figure 1b is a side sectional view showing the main parts of the single crystal manufacturing apparatus according to the invention, and Figure 2a is the initial stage of crystal growth. FIG. 2b is a diagram showing the positional relationship between the crucible and the solid-liquid interface in each step, and FIG. 2b shows the vertical direction in the state shown in FIG. Figure 3a is a diagram showing the temperature distribution, Figure 3a is a diagram showing the positional relationship between the crucible and the solid-liquid interface in the later stages of crystal growth, and Figure 3b is a diagram showing the positional relationship between the crucible and the solid-liquid interface in the latter stages of crystal growth. FIG. 3c is a diagram showing the temperature distribution in the vertical direction in the state shown in FIG. 3a in the case of manufacturing a single crystal, and FIG. a
FIG. 3 is a diagram showing the vertical temperature distribution in the state shown in FIG. 1... Fireproof support case, 2... Crucible, 3
...High frequency coil, 4...Gas pipe, 5...Gas amount adjustment section, 6...Flowmeter, 7...Gas cylinder, 8...
... Raw material melt, 9... Single crystal.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] るつぼを備え、チヨクラルスキー法を用いる単
結晶製造装置において、該るつぼの壁直上に放射
状に配列され、前記るつぼ内にガスを吐出するた
めの少なくとも3本のガス管と、該ガスの吐出量
を調節するための調節機構とを有することを特徴
とする単結晶製造装置。
A single crystal manufacturing apparatus comprising a crucible and using the Czyochralski method, at least three gas pipes arranged radially directly above the wall of the crucible for discharging gas into the crucible, and a discharge amount of the gas. A single crystal manufacturing apparatus characterized by having an adjustment mechanism for adjusting.
JP11421684U 1984-07-28 1984-07-28 Single crystal manufacturing equipment Granted JPS6130077U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11421684U JPS6130077U (en) 1984-07-28 1984-07-28 Single crystal manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11421684U JPS6130077U (en) 1984-07-28 1984-07-28 Single crystal manufacturing equipment

Publications (2)

Publication Number Publication Date
JPS6130077U JPS6130077U (en) 1986-02-22
JPH0129241Y2 true JPH0129241Y2 (en) 1989-09-06

Family

ID=30673243

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11421684U Granted JPS6130077U (en) 1984-07-28 1984-07-28 Single crystal manufacturing equipment

Country Status (1)

Country Link
JP (1) JPS6130077U (en)

Also Published As

Publication number Publication date
JPS6130077U (en) 1986-02-22

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