JPS61281100A - Production of silicon single crystal - Google Patents

Production of silicon single crystal

Info

Publication number
JPS61281100A
JPS61281100A JP12172785A JP12172785A JPS61281100A JP S61281100 A JPS61281100 A JP S61281100A JP 12172785 A JP12172785 A JP 12172785A JP 12172785 A JP12172785 A JP 12172785A JP S61281100 A JPS61281100 A JP S61281100A
Authority
JP
Japan
Prior art keywords
crucible
silicon
single crystal
raw material
cylinder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12172785A
Other languages
Japanese (ja)
Other versions
JPH0566351B2 (en
Inventor
Masato Matsuda
正人 松田
Masami Nakanishi
正美 中西
Osamu Suzuki
修 鈴木
Kazuo Fukumura
福村 和夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP12172785A priority Critical patent/JPS61281100A/en
Publication of JPS61281100A publication Critical patent/JPS61281100A/en
Publication of JPH0566351B2 publication Critical patent/JPH0566351B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To obtain the titled single crystal having large diameter and high quality, in high yield, by charging a silicon raw material into a silicon cylinder having higher height than the crucible, putting the cylinder into the crucible, and melting the silicon raw material to effect the growth of a single crystal. CONSTITUTION:A graphite protector 14 is attached to the top of a supporting shaft 13 placed rotatably in the lower chamber 11 of an apparatus for the pulling up of silicon single crystal. A crucible 15 made of e.g. quartz is put into the graphite protector 14 and is made to be heatable with the carbon heater 19. A pull chamber 12 for the pulling up of silicon single crystal is placed above the quartz crucible. A cylinder 16 made of silicon and having higher height than the crucible is inserted into the crucible 15, and a polycrystalline silicon raw material and impurities 17 are charged into the cylinder 16. The apparatus is evacuated while passing an inert gas therethrough, and the carbon heater 19 is electrified with the electrode 18 and heated to melt the raw materials 17 and the cylinder 16. The seed crystal attached to the pulling up shaft is dipped into the molten raw materials while rotating the crucible 15, and a single crystal is pulled up.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明はシリコン単結晶の製造方法の改良に関する。[Detailed description of the invention] [Technical field of invention] The present invention relates to improvements in a method for manufacturing silicon single crystals.

〔発明の技術的背景〕[Technical background of the invention]

シリコン単結晶は主にチョクラルスキー法により製造さ
れている。この方法は、チャンバー内にルツボを回転自
在に支持し、このルツボ内にポリシリコン原料を装填し
、ルツボ周囲に配設されたカーボンヒーターにより加熱
してポリシリコン原料を溶融させた後、この溶融シリコ
ンに種結晶を浸して引上げることによりシリコン単結晶
を成長させるものである。
Silicon single crystals are mainly produced by the Czochralski method. In this method, a crucible is rotatably supported in a chamber, a polysilicon raw material is loaded into the crucible, the polysilicon raw material is heated by a carbon heater placed around the crucible, and then the polysilicon raw material is melted. A silicon single crystal is grown by dipping a seed crystal into silicon and pulling it up.

従来、ポリシリコン原料のルツボへのチャージは、第2
図に示すように、単に例えば石英ルツボ1内に塊状のポ
リシンコン原料2を詰め込むことにより行なわれている
Conventionally, the charging of polysilicon raw materials into the crucible was done in the second stage.
As shown in the figure, this is simply carried out by filling a polysyncon raw material 2 in the form of a block into a quartz crucible 1, for example.

第2図に示すようなチャージ方法では、ポリシリコン原
料を加熱・溶融したとき、溶融シリコンの融液面はルツ
ボlの上端よりもかなり下がった位置となる。
In the charging method shown in FIG. 2, when the polysilicon raw material is heated and melted, the surface of the molten silicon is considerably lower than the upper end of the crucible l.

〔背景技術の問題点〕[Problems with background technology]

上記チョクラルスキー法において、シリコン単結晶の生
産量を増加させるためには、ポリシリコン原料のチャー
ジ量を多くすればよいことは明らかである。一方、シリ
コン単結晶の品質を向上させるためには、ルツボの高さ
を低くして溶融シリコンの温度勾配を小さくすることが
望ましいことがわかってきている。上記の生産量の増大
と品質の向上とはいずれもシリコン単結晶の歩留り向上
につながる。
In the above-mentioned Czochralski method, it is clear that in order to increase the production amount of silicon single crystals, it is sufficient to increase the amount of charge of the polysilicon raw material. On the other hand, in order to improve the quality of silicon single crystals, it has been found that it is desirable to reduce the height of the crucible to reduce the temperature gradient of molten silicon. Both of the above-mentioned increases in production volume and improvements in quality lead to improvements in the yield of silicon single crystals.

しかし、第2図に示すような従来の方法によりポリシリ
コン原料をチャージした場合、溶融シリコンとルツボの
上端との位置関係はルツボ高さによってそれほど変化し
ない、このため、シリコン単結晶の品質を重視して、高
さの低いルツボに従来の方法でポリシリコン原料をチャ
ージした場合には、溶融シリコンの融液の深さが浅くな
り、原料のチャージ量が少なくなってシリコン単結晶の
生産量が減少してしまう、したがって、シリコン単結晶
の歩留りが期待するほど向上しないという欠点があった
However, when polysilicon raw materials are charged using the conventional method shown in Figure 2, the positional relationship between the molten silicon and the top of the crucible does not change much depending on the height of the crucible, so the quality of the silicon single crystal is important. When polysilicon raw materials are charged in a low-height crucible using the conventional method, the depth of the molten silicon melt becomes shallow, the amount of charged raw materials decreases, and the production amount of silicon single crystals decreases. Therefore, there was a drawback that the yield of silicon single crystals was not improved as much as expected.

〔発明の目的〕[Purpose of the invention]

本発明は上記事情を考慮してなされたものであり、高さ
の低いルツボへのシリコン原料のチャージ量を増加させ
、品質の向上及び生産量の増加を図ることにより、歩留
りを大幅に向上し得るシリコン単結晶の製造方法を提供
しようとするものである。
The present invention has been made in consideration of the above circumstances, and by increasing the amount of silicon raw material charged into a low-height crucible to improve quality and increase production volume, it is possible to significantly improve yield. The purpose of the present invention is to provide a method for producing silicon single crystals.

〔発明の概要〕[Summary of the invention]

本発明のシリコン単結晶の製造方法は、ルツボ内にルツ
ボ高さよりも高さの高いシリコン製の筒状体を収容し、
この筒状体内にシリコン原料を装填した後、加熱してシ
リコン原料及び筒状体を溶融させることを特徴とするも
のである。
The method for producing a silicon single crystal of the present invention includes accommodating a cylindrical body made of silicon with a height higher than the height of the crucible in a crucible,
The method is characterized in that after a silicon raw material is loaded into the cylindrical body, the silicon raw material and the cylindrical body are melted by heating.

このような方法によれば、ルツボの高さが低い場合でも
シリコン製の筒状体の高さを変えることにより、ルツボ
を完全に満たす量のシリコン原料をチャージすることが
できる。したがって、シリコン単結晶の品質を向上する
とともに生産量を増加することができ1歩留りを大幅に
向上することができる。
According to this method, even if the height of the crucible is low, by changing the height of the silicon cylindrical body, it is possible to charge an amount of silicon raw material that completely fills the crucible. Therefore, it is possible to improve the quality of the silicon single crystal, increase the production amount, and significantly improve the yield.

なお、本発明において、シリコン製の筒状体は単なる筒
体でもよいし、底面を設けた容器でもよい。また、筒状
体の断面形状は円筒状又はそれ以外の任意の形状とする
ことができる。
In the present invention, the silicone cylindrical body may be a simple cylindrical body or may be a container provided with a bottom surface. Further, the cross-sectional shape of the cylindrical body can be cylindrical or any other arbitrary shape.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の実施例を第1図に示す引上装置を参照し
て説明する。
Hereinafter, embodiments of the present invention will be described with reference to a lifting device shown in FIG.

第1図において、下部チャンバー11は上面及び底面に
開口が設けられており、その上部にはシリコン単結晶を
引上げるためのプルチャンバー12が設けられている。
In FIG. 1, a lower chamber 11 has openings on its top and bottom surfaces, and a pull chamber 12 for pulling a silicon single crystal is provided above the opening.

下部チャンバー11の底面の開口からは支持軸13が回
転自在に挿入され、その上端に黒鉛製の保護体14及び
その内部の石英等からなるルツボ15を支持している。
A support shaft 13 is rotatably inserted through an opening in the bottom of the lower chamber 11, and supports a graphite protector 14 and a crucible 15 made of quartz or the like inside the support shaft 13 at its upper end.

このルツボ15内にはシリコン棒を溶接して形成された
筒体16が収容され、その内部にポリシリコン原料17
が装填される。
A cylindrical body 16 formed by welding a silicon rod is housed in the crucible 15, and a polysilicon raw material 17 is contained inside the cylindrical body 16.
is loaded.

また、下部チャンバー11内にはその底面を貫通して電
極18.18が挿入され、これらの上部に前記保護体4
の周囲を囲むように設けられたカーボンヒーター8と接
続されている。更に、カーボンヒーター19の外周には
保温筒20が配設されている。
Furthermore, electrodes 18 and 18 are inserted into the lower chamber 11 through its bottom surface, and the protector 4 is placed above the electrodes 18 and 18.
It is connected to a carbon heater 8 provided so as to surround the periphery of the carbon heater 8. Furthermore, a heat retaining cylinder 20 is arranged around the outer periphery of the carbon heater 19.

上記引上装置を用いたシリコン単結晶の引上げは、以下
にようにして行なわれる。すなわち、まずルツボ15内
に収容されたシリコンからなる筒体16内にポリシリコ
ン原料及び不純物を装填した状態で、不活性ガスを流し
ながら減圧にする。
Pulling of a silicon single crystal using the above-mentioned pulling apparatus is carried out as follows. That is, first, polysilicon raw materials and impurities are loaded into a cylindrical body 16 made of silicon housed in a crucible 15, and the pressure is reduced while flowing an inert gas.

次に、電極18.18からカーボンヒーター19へ通電
して加熱することによりルツボ15内のポリシリコン原
料17及び筒体16を溶融する0次いで、ルツボ15を
回転させた状態で溶融シリコンに図示しない種結晶を浸
し、この種結晶を保持している引上軸を回転させながら
引上げることにより、シリコン単結晶を成長させる。
Next, the polysilicon raw material 17 and cylinder 16 in the crucible 15 are melted by applying electricity to the carbon heater 19 from the electrodes 18 and 18 to heat them. A silicon single crystal is grown by dipping a seed crystal and pulling it up while rotating the pulling shaft holding the seed crystal.

このような方法によれば、ルツボ15の高さが低い場合
でも、筒体16の高さを変えることにより、溶融した際
にルツボ15を完全に満たすまでポリシリコン原料をチ
ャージすることができる。
According to such a method, even when the height of the crucible 15 is low, by changing the height of the cylinder 16, the polysilicon raw material can be charged until the crucible 15 is completely filled when melted.

事実、ルツボの直径を14インチとした場合、従来のポ
リシリコン原料のチャージ方法ではルツボ高さが250
mmで最大チャージ量が25kgであったのに対し1本
発明方法ではルツボ高さが200mmで最大チャージ量
を30kgとすることができた。また、任意の高さのル
ツボ内にルツボの上端までを完全に満たす量のポリシリ
コン原料をチャージできることが確認された。
In fact, if the diameter of the crucible is 14 inches, the height of the crucible will be 250 mm using the conventional charging method for polysilicon raw materials.
1 mm, the maximum charge amount was 25 kg, but in the method of the present invention, the maximum charge amount could be 30 kg when the crucible height was 200 mm. It was also confirmed that it was possible to charge polysilicon raw material in an amount to completely fill the crucible up to the top of the crucible at any height.

したがって1本発明方法によれば、ルツボ内の溶融シリ
コンの温度分布を均一化して引上げられるシリコン単結
晶の品質を向上するとともに生産量を増加することがで
き1歩留りを大幅に向上することができる。
Therefore, according to the method of the present invention, it is possible to uniformize the temperature distribution of molten silicon in the crucible, improve the quality of the pulled silicon single crystal, and increase the production amount, thereby significantly improving the yield. .

〔発明の効果〕〔Effect of the invention〕

以上詳述した如く本発明方法によれば、シリコン単結晶
の歩留りを大幅に向上することができ、ひいては今後の
シリコン単結晶の大口径化にも充分に対応できるもので
ある。
As described in detail above, according to the method of the present invention, the yield of silicon single crystals can be greatly improved, and furthermore, it can fully cope with the future increase in the diameter of silicon single crystals.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例におけるポリシリコン原料のチ
ャージ方法を説明するためのシリコン単結晶引上装置の
断面図、第2図は従来のポリシリコン原料のチャージ方
法を示す断面図である。 11・・・チャン/<−,12・・・ゾルチャンバー、
13・・・支持軸、14・・・保護体、15・・・ルツ
ボ、16・・・筒体、17・・・ポリシリコン原料、1
8・・・電極、19・・・カーボンヒーター、20・・
・保温筒。
FIG. 1 is a cross-sectional view of a silicon single crystal pulling apparatus for explaining a method of charging a polysilicon raw material in an embodiment of the present invention, and FIG. 2 is a cross-sectional view showing a conventional method of charging a polysilicon raw material. 11... Chang/<-, 12... Sol chamber,
13... Support shaft, 14... Protector, 15... Crucible, 16... Cylindrical body, 17... Polysilicon raw material, 1
8... Electrode, 19... Carbon heater, 20...
・Heat insulation tube.

Claims (1)

【特許請求の範囲】[Claims] チャンバー内にルツボを回転自在に支持し、このルツボ
内でシリコン原料を溶融し、この溶融シリコンに種結晶
を浸して引上げることによりシリコン単結晶を製造する
にあたり、前記ルツボ内にルツボ高さよりも高さの高い
シリコン製の筒状体を収容し、この筒状体内にシリコン
原料を装填した後、加熱してシリコン原料及び筒状体を
溶融させることを特徴とするシリコン単結晶の製造方法
A crucible is rotatably supported in a chamber, a silicon raw material is melted in this crucible, and a seed crystal is immersed in the molten silicon and pulled up to produce a silicon single crystal. A method for producing a silicon single crystal, which comprises accommodating a tall cylindrical body made of silicon, loading a silicon raw material into the cylindrical body, and then heating to melt the silicon raw material and the cylindrical body.
JP12172785A 1985-06-05 1985-06-05 Production of silicon single crystal Granted JPS61281100A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12172785A JPS61281100A (en) 1985-06-05 1985-06-05 Production of silicon single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12172785A JPS61281100A (en) 1985-06-05 1985-06-05 Production of silicon single crystal

Publications (2)

Publication Number Publication Date
JPS61281100A true JPS61281100A (en) 1986-12-11
JPH0566351B2 JPH0566351B2 (en) 1993-09-21

Family

ID=14818382

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12172785A Granted JPS61281100A (en) 1985-06-05 1985-06-05 Production of silicon single crystal

Country Status (1)

Country Link
JP (1) JPS61281100A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5069741A (en) * 1987-03-20 1991-12-03 Mitsubishi Kinzoku Kabushiki Kaisha Method of manufacturing quartz double crucible assembly
KR101209118B1 (en) 2010-04-20 2012-12-06 주식회사 윈젠 Polysilicon manufacturing electrode, apparatus for welding polysilicon manufacturing electrode and method for welding thereof
JP2019199374A (en) * 2018-05-16 2019-11-21 住友金属鉱山株式会社 Method for charging powdery raw material

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5069741A (en) * 1987-03-20 1991-12-03 Mitsubishi Kinzoku Kabushiki Kaisha Method of manufacturing quartz double crucible assembly
KR101209118B1 (en) 2010-04-20 2012-12-06 주식회사 윈젠 Polysilicon manufacturing electrode, apparatus for welding polysilicon manufacturing electrode and method for welding thereof
JP2019199374A (en) * 2018-05-16 2019-11-21 住友金属鉱山株式会社 Method for charging powdery raw material

Also Published As

Publication number Publication date
JPH0566351B2 (en) 1993-09-21

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