JPH01289206A - Voltage-dependent nonlinear resistance element and manufacture thereof - Google Patents

Voltage-dependent nonlinear resistance element and manufacture thereof

Info

Publication number
JPH01289206A
JPH01289206A JP63119515A JP11951588A JPH01289206A JP H01289206 A JPH01289206 A JP H01289206A JP 63119515 A JP63119515 A JP 63119515A JP 11951588 A JP11951588 A JP 11951588A JP H01289206 A JPH01289206 A JP H01289206A
Authority
JP
Japan
Prior art keywords
voltage
added
mol
promoted
lif
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63119515A
Other languages
Japanese (ja)
Inventor
Iwao Ueno
巌 上野
Yasuo Wakahata
康男 若畑
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63119515A priority Critical patent/JPH01289206A/en
Publication of JPH01289206A publication Critical patent/JPH01289206A/en
Pending legal-status Critical Current

Links

Landscapes

  • Thermistors And Varistors (AREA)

Abstract

PURPOSE:To remove noise of a low voltage and the like by a method wherein Sr is contained excessively and one or more of CeO2, Y2O3 and La2O3, one or more of Si, Cu, Co and Mn and one or more of Sn and Zr are respectively added to SrTiO3 containing Li and F. CONSTITUTION:An SrTiO3 powder is used as a raw material, Sr is added excessively so as to make 1.001<=Sr/Ti<=1.05, then, lattice defect is increased, a semiconductor property is promoted, in addition, when another element, e.g., Ce, Y or La, is substituted for Sr, an atomic property is controlled and the semiconductor property is promoted. When another element, e.g., Sn or Zr, is substituted for Ti, a strain is caused in a crystal structure, and the semiconductor property is promoted. Then, when SiO2, CuO, Co2O3 and MnCO3 are added, these are segregated at a grain boundary, the grain boundary is made a high resistance and varistor characteristic is revealed. In addition, when LiF is added and this assembly is fired in a reducing atmosphere or in an atmosphere of nitrogen, a sintering operation is promoted by a liquid sintering operation. By this setup, it is possible to obtain an element which can protect a semiconductor and a circuit from a noise and static electricity.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、電子機器、電気機器で発生する異常高電圧、
ノイズ、パルス、静電気から半導体及び回路を保護する
ところのSrTiO3を主成分とする電圧依存性非直線
抵抗体素子及びその製造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to abnormal high voltages generated in electronic equipment and electrical equipment,
The present invention relates to a voltage-dependent nonlinear resistor element mainly composed of SrTiO3 that protects semiconductors and circuits from noise, pulses, and static electricity, and a method for manufacturing the same.

従来の技術 従来、各種電子機器、電気機器で発生する異常高電圧、
ノイズ、パルス、静電気除去のためにバリスタ特性を有
するSiCバリスタやZnO系バリスタが使用されてき
た。このようなバリスタの電圧−電流特性は近似的に次
式のように表すことができる。
Conventional technology Conventionally, abnormal high voltages generated in various electronic devices and electrical devices,
SiC varistors and ZnO-based varistors having varistor characteristics have been used to remove noise, pulses, and static electricity. The voltage-current characteristics of such a varistor can be approximately expressed as in the following equation.

r=(v7c)α ここで、工は電流、vB電圧、Cはバリスタ固有の定数
であり、αは電圧非直線指数である。
r=(v7c)α Here, engineering is current, vB voltage, C is a constant specific to the varistor, and α is a voltage nonlinear index.

SiCバリスタの電圧非直線指数αは2〜7程度、Zn
O系バリスタではαが60にも及ぶものがある。
The voltage non-linearity index α of SiC varistor is about 2 to 7, Zn
Some O-type varistors have α as high as 60.

このようなバリスタは、比較的高い電圧の吸収には優れ
た性能を有しているが、誘電率が低く、固有の静電容量
が小さいため、バリスタ電圧以下の低い電圧や周波数の
高いものの吸収に対してはほとんど効果を示さない。ま
た、誘電損失tanδが6〜10%と大きい。
Such varistors have excellent performance in absorbing relatively high voltages, but due to their low dielectric constant and small inherent capacitance, they are difficult to absorb low voltages below the varistor voltage or high frequencies. shows almost no effect on Further, the dielectric loss tan δ is as large as 6 to 10%.

一方、低電圧のノイズなどの除去には、見掛けの誘電率
εが5X10’程度で、誘電損失tanδが1%前後の
半導体コンデンサが利用されている。
On the other hand, semiconductor capacitors with an apparent dielectric constant ε of about 5×10' and a dielectric loss tan δ of about 1% are used to remove low-voltage noise.

しかし、このような半導体コンデンサは、サージなどに
よりある限度以上の電圧、電流が印加されると破壊した
り、コンデンサとしての機能を果たさなくなる。そこで
近年、5rTiO5を主成分とし、バリスタ特性と、コ
ンデンサ特性の両方の機能を有するものが開発されてき
ている。
However, such semiconductor capacitors break down or cease to function as a capacitor when a voltage or current exceeding a certain limit is applied due to a surge or the like. Therefore, in recent years, materials containing 5rTiO5 as a main component and having both varistor and capacitor characteristics have been developed.

発明が解決しようとする課題 5rTiOxを主成分とする容量性バリスタは、バリス
タ電圧が高い、電圧非直線指数αが小さい、見掛は誘電
率εが小さい、容量温度特性が良くないと言う問題を有
しておシ、全ての特性を同時に満足するものは未だに得
られていない。さらに、焼結温度、再酸化温度が高いこ
とから、エネルギー量の消費が多いと言う問題を有して
いる。従って、5rTiO5を主成分とする容量性バリ
スタにおいて、バリスタ電圧が低い、電圧非直線指数α
が大きい、見掛は誘電率εが大きい、容量温度特性が良
いと言う条件を同時に満たし、さらに焼成温度や再酸化
温度が低温で行える必要がある。
Problem to be Solved by the Invention 5r Capacitive varistors whose main component is TiOx have the following problems: high varistor voltage, small voltage nonlinearity index α, apparently small dielectric constant ε, and poor capacitance temperature characteristics. However, a product that satisfies all the characteristics at the same time has not yet been obtained. Furthermore, since the sintering temperature and reoxidation temperature are high, there is a problem in that a large amount of energy is consumed. Therefore, in a capacitive varistor whose main component is 5rTiO5, the varistor voltage is low, the voltage nonlinearity index α
It is necessary to simultaneously satisfy the following conditions: a large dielectric constant, a large apparent dielectric constant ε, and good capacitance-temperature characteristics, and furthermore, the firing temperature and reoxidation temperature must be low.

本発明は、このような点に鑑みてなされたもので、低電
圧のノイズなどの除去が可能な5rTiOsを主成分と
する電圧依存性非直線抵抗体素子及びその製造方法を提
供することを目的とするものである。
The present invention has been made in view of the above points, and an object of the present invention is to provide a voltage-dependent nonlinear resistor element mainly composed of 5rTiOs, which can eliminate low-voltage noise, and a method for manufacturing the same. That is.

課題を解決するための手段 上記のような問題点を解決するために本発明は、Srと
Ti(7)比が1,001≦Sr/Ti≦1.05とな
るように過剰のSrを含有し、さらにLiとFを合計で
0.007〜0,500 wt%含有したSrTi0g
に、CeO2゜Y2O3,La2O5のうち少なくとも
一種類以上を0、1〜5.Omo1%と、Si 、 C
u 、 Coo 、 Mn Oうち少なくとも一種類以
上の元素を酸化物、炭酸化物などの各種の形のいずれか
の形にして0.1〜2.Omo1%と、Sn 、 Zr
のうち少なくとも一種類以上の元素を酸化物などの各種
の形のいずれかの形にして0.1 ”−1,0mo1%
含ませてなる電圧依存性非直線抵抗体素子を提供するも
のであシ、またその内部に含まれる水溶性塩が0.05
0 wt%以下(但し、Owt%は含まず)とした電圧
依存性非直線抵抗体素子を提供するものである。さらに
、本発明は、平均粒径がO0Sμm以下の5rT105
粉末を原料として1.001≦Sr/Ti≦1.05と
なるようにSr化合物を添加し、さらにLiFを0.7
〜乙Omo1%と、aeo2 ,Y2O3,La2O5
のうち少なくとも一種類以上を0.1〜5.□ mo1
%と、Si 、 Cu 。
Means for Solving the Problems In order to solve the above-mentioned problems, the present invention includes a method that contains excess Sr so that the ratio of Sr and Ti (7) is 1,001≦Sr/Ti≦1.05. 0g of SrTi containing a total of 0.007 to 0,500 wt% of Li and F.
and at least one of CeO2゜Y2O3 and La2O5 at 0, 1 to 5. Omo1%, Si, C
At least one element among u, Coo, and MnO is made into any of various forms such as oxides and carbonates, and the content is 0.1 to 2. Omo1%, Sn, Zr
0.1"-1.0mo1% of at least one element among the above in the form of any of various forms such as oxides
The present invention provides a voltage-dependent non-linear resistor element containing a water-soluble salt of 0.05%.
The present invention provides a voltage-dependent nonlinear resistor element having a voltage dependency of 0 wt% or less (excluding Owt%). Furthermore, the present invention provides 5rT105 with an average particle size of O0Sμm or less.
Using the powder as a raw material, an Sr compound was added so that 1.001≦Sr/Ti≦1.05, and LiF was further added to 0.7
~ Omo1%, aeo2, Y2O3, La2O5
At least one kind of 0.1 to 5. □ mo1
%, Si, Cu.

Go 、 Mnのうち少なくとも一種類以上の元素を酸
化物、炭酸化物などの各種の形のいずれかの形にして0
.1〜2.0IIO1%と、  Sn 、 Zrのうち
少なくとも一種類以上の元素を酸化物などの各種の形の
いずれかの形にして0.1〜1.0mol%添加した混
合粉末を成形し、還元雰囲気中や窒素雰囲気中で100
0〜1400℃の温度で焼成し、その後、500〜9o
o℃で焼付は可能な導電性ペーストを用い、上記焼成後
の素子に500〜900℃で焼付けて電極を形成するか
、または上記焼成後の素子を空気中で600〜100O
℃の熱処理を行った後に500〜900℃で焼付けて電
極を形成し、内部に含まれる水溶性塩が0,05o w
t%以下(但し、0wt%は含まず)とした電圧依存性
非直線抵抗体素子の製造方法を提供するものである。
At least one element among Go and Mn is made into any of various forms such as oxides and carbonates.
.. Molding a mixed powder in which 1% to 2.0IIO and 0.1 to 1.0 mol% of at least one or more elements among Sn and Zr are added in the form of any of various forms such as oxides, 100 in a reducing atmosphere or nitrogen atmosphere
Calcinate at a temperature of 0~1400℃, then 500~9o
Using a conductive paste that can be baked at 0°C, bake the fired element at 500 to 900°C to form an electrode, or heat the fired element in air at 600 to 100°C.
℃ heat treatment and then baking at 500-900℃ to form an electrode, and the water-soluble salt contained inside is 0.05oW.
The present invention provides a method for manufacturing a voltage-dependent nonlinear resistor element having a voltage dependence of t% or less (excluding 0 wt%).

作用 一般に5rTiOsを半導体化させるには1強制還元す
るか、もしくは半導体化促進剤を添加し還元雰囲気焼成
するかである。しかし、これだけでは半導体化促進剤の
種類によって半導体化が進まない場合がある。そこで、
5rTiOsを化学量論よりSr過剰、またはで1過剰
にすると、格子欠陥が増加し半導体化が促進される。さ
らに、Srを他の元素、例えばOe 、τ、 Laで置
換すると、原子化制御により半導体化が促進される。ま
た、T1を池の元素、Sn 、 Zrで置換すると、結
晶構造に歪みを生じ半導体化が促進される。
Function Generally, in order to convert 5rTiOs into a semiconductor, it is either forcedly reduced or a semiconductor conversion accelerator is added and fired in a reducing atmosphere. However, with this alone, semiconductor formation may not proceed depending on the type of semiconductor formation accelerator. Therefore,
When 5rTiOs is made to have an excess of Sr or 1 excess of Sr than the stoichiometry, lattice defects increase and semiconductor formation is promoted. Furthermore, when Sr is replaced with other elements such as Oe, τ, and La, semiconductor formation is promoted through atomization control. Furthermore, when T1 is replaced with an element such as Sn or Zr, the crystal structure is distorted and semiconductor formation is promoted.

次に、5i02 、 CuO、Co2O3、MncOs
を添加すると、これらが粒界に偏析し、粒界を高抵抗化
させ、バリスタ特性を発現させる。
Next, 5i02, CuO, Co2O3, MncOs
When added, these segregate at the grain boundaries, making the grain boundaries high in resistance and exhibiting varistor properties.

またさらに、この時、本発明のようにLiFを添加し、
還元雰囲気や窒素雰囲気中で焼成すると、580C付近
でSrO−TiO2−LiF系の液相を形成し、液相焼
結によシ焼結が促進される。ま次、との液相を介して5
rriO5が溶解析出し粒成長が起こる。これにより低
温焼結が可能な焼結体素子を得ることができ、焼結のた
めのエネルギー量を削減することができることとなる。
Furthermore, at this time, LiF is added as in the present invention,
When fired in a reducing atmosphere or nitrogen atmosphere, a SrO-TiO2-LiF system liquid phase is formed at around 580C, and sintering is promoted by liquid phase sintering. 5 through the liquid phase with
rriO5 is dissolved and grain growth occurs. As a result, it is possible to obtain a sintered body element that can be sintered at a low temperature, and the amount of energy for sintering can be reduced.

しかし、ここでT1過剰であるとLi2TiO3を形成
するため、5rT103の焼結性が抑制される。従って
、Sr過剰が望まれる。しかし、Sr過剰もある限度を
超すと。
However, if T1 is excessive here, Li2TiO3 is formed, which suppresses the sinterability of 5rT103. Therefore, excess Sr is desired. However, if Sr excess exceeds a certain limit.

粒成長が抑制され焼結性が低下することや、焼結体素子
に水溶性塩を過剰に含むため、信頼性や寿命特性に影響
を与える。
Grain growth is suppressed and sinterability is reduced, and the sintered element contains an excessive amount of water-soluble salt, which affects reliability and life characteristics.

また、 SrTiO5に対するLiFの添加量は焼成温
度と密度に関係しており、低温焼結のためには、ある程
度以上のLiFを添加しなければならない。
Furthermore, the amount of LiF added to SrTiO5 is related to the sintering temperature and density, and for low-temperature sintering, a certain amount of LiF must be added.

そして、この場合、添加したLiFが焼成中に飛散し、
これによって焼成用のサヤ、炉壁9発熱体などが侵され
たり、信頼性や寿命特性を著しく低下させるという実用
上の問題点を有している。しかし、本発明者らは研究の
結果、後述するようにSrTiO5の原料粒径を微細化
してO−5μm以下の原料を用いることにより、 Li
Fの添加量を低減しても低温焼結が可能であることを見
出した。従って、これらのことから焼成時のLiFの飛
散、残存1の抑制、及び焼結体素子の信頼性や寿命特性
を向上させることが可能である。
In this case, the added LiF scatters during firing,
This poses a practical problem in that the firing pod, the heating element of the furnace wall 9, etc. are attacked, and the reliability and life characteristics are significantly reduced. However, as a result of our research, the present inventors found that by reducing the raw material particle size of SrTiO5 and using a raw material of O-5 μm or less, as described later, Li
It has been found that low-temperature sintering is possible even when the amount of F added is reduced. Therefore, from these reasons, it is possible to suppress LiF scattering and residual 1 during firing, and to improve the reliability and life characteristics of the sintered body element.

次に、雰囲気焼成の温度を10oO〜1400℃に規定
したのは、同じく後述するように10o。
Next, the temperature of the atmosphere firing was specified to be 10oO to 1400°C, as will be described later.

℃未満では焼結体素子に含まれるLiとFの残存量がo
、6o0Wt%よりも多いため、信頼性や電気特性に影
響を与えることと、焼結密度が低いためである。また、
1400℃を超えると多孔質となり、焼成密度が低下す
るためである。
Below ℃, the remaining amount of Li and F contained in the sintered element is o.
, 6o0 Wt%, which affects reliability and electrical properties, and also because the sintered density is low. Also,
This is because when the temperature exceeds 1,400°C, it becomes porous and the fired density decreases.

従ッテ、Sr過剰のSrTiO3にCeO2,Y2O5
+La2O3のうち少なくとも一種類以上と、5in2
゜CuO、Co2O3、MnCO3のうち少なくとも一
種類以上と、5n02 、 ZrO2のうち少なくとも
一種類以上を添加して得られた焼結体と、Sr過剰の5
rTiOsにCeO2,Y2O5+ Il&205のう
ち少なくとも一種類以上と、5i02 、 CuO、C
o2O3、Mn005のうち少なくとも一種類以上と、
5n02 、 ZrO2のうち少なくとも一種類以上及
びLiFを添加し最終的に得られる焼結体とでは、微細
溝造、電気特性が著しく異なり、互いに全く別の組成物
であると考えられる。
Jutte, CeO2, Y2O5 to SrTiO3 with excess Sr
+At least one type of La2O3 and 5in2
゜A sintered body obtained by adding at least one kind among CuO, Co2O3, and MnCO3 and at least one kind among 5n02 and ZrO2, and a sintered body obtained by adding at least one kind among CuO, Co2O3, and MnCO3;
rTiOs with at least one kind of CeO2, Y2O5+ Il&205, 5i02, CuO, C
At least one or more of o2O3 and Mn005,
The sintered body finally obtained by adding at least one of 5n02, ZrO2, and LiF has significantly different fine grooves and electrical properties, and is considered to be a completely different composition from each other.

実施例 以下に本発明について、実施例を挙げて具体的に説明す
る。
EXAMPLES The present invention will be specifically described below with reference to Examples.

(実施例1) まず、SrTiO5 (平均粒径0,6μm ) 、 
5rCO3,第1成分のCeO2,Y2O5l La2
O3−第2成分の8102、第3成分のZrO2及びI
、iFを下記第1表に示す組成比になるように秤量し、
混合した。これ’に乾燥後、 o、ts wt%ポリビ
ニルアルコール溶液のバインダーを添加し、1時間混合
し造粒した。
(Example 1) First, SrTiO5 (average particle size 0.6 μm),
5rCO3, first component CeO2, Y2O5l La2
O3 - second component 8102, third component ZrO2 and I
, iF were weighed to have the composition ratio shown in Table 1 below,
Mixed. After drying, a binder of o,ts wt% polyvinyl alcohol solution was added to this, and the mixture was mixed for 1 hour and granulated.

造粒後、1ton/、Jの圧力で12φX 1 、O(
mm )の円板状に成形し、次に空気中で400℃、1
時間脱バインダーを行った。その後、N2:H2=1o
:1の還元雰囲気中で1000〜1400℃、2時間焼
成した。このようにして得られた第1図。
After granulation, 12φX 1, O(
mm), and then heated in air at 400°C for 1
Time binder removal was performed. Then N2:H2=1o
:1000 to 1400°C for 2 hours in a reducing atmosphere. FIG. 1 obtained in this way.

第2図に示す焼結体1の両面に、外周を残すようにして
ムぎなどの導電性ペーストをスクリーン印刷し、500
〜900℃、10〜6o分の条件で焼付け、焼結体素子
の再酸化を行うと同時に電極2゜3を形成した。
A conductive paste such as wheat was screen printed on both sides of the sintered body 1 shown in Fig. 2, leaving the outer periphery.
Baking was performed at ~900°C for 10~6°C to reoxidize the sintered element and at the same time form electrodes 2°3.

このようにして得られた還元雰囲気中、で130゜℃、
2時間焼成した素子(電極はムgペーストを8oo℃、
15分で焼付けて形成)の電気特性、さらに素子内部に
含まれるLiとyの残存量、同じく素子内部に含まれる
Li 、 F 、 Sr原子を含む水溶性塩の含有量及
び信頼性試験の結果を下記第2表に示す。ここで、素子
内部に含まれる水溶性塩の含有量は、次の方法により解
析した。まず、焼結した素子を粉砕し、それに水を加え
10分間煮沸し、ろ通抜、Li 、 Srはフレーム原
子吸光、Fはイオン電極法により調べた。さらに、信頼
性試験の評価法としては、焼結した素子を温度90℃。
In the reducing atmosphere thus obtained, at 130°C,
The element was fired for 2 hours (the electrodes were made of mug paste at 80°C,
(formed by baking in 15 minutes), the remaining amounts of Li and y contained inside the element, the content of water-soluble salts containing Li, F, and Sr atoms also contained within the element, and the results of reliability tests. are shown in Table 2 below. Here, the content of water-soluble salt contained inside the element was analyzed by the following method. First, the sintered element was crushed, water was added to it, it was boiled for 10 minutes, it was filtered out, Li and Sr were examined by flame atomic absorption, and F was examined by the ion electrode method. Furthermore, as an evaluation method for reliability testing, the sintered element was heated at 90°C.

湿度90〜96%の耐湿負荷雰囲気中に600時間放置
し、素子を室温中に48時間放置した後、試験前と後で
の容量変化率を比較した。
After leaving the device in a humidity-resistant load atmosphere with a humidity of 90 to 96% for 600 hours and leaving the device at room temperature for 48 hours, the rate of change in capacity before and after the test was compared.

(以下余白) まず、上記第1.第2表について解説すると、試料点1
〜9,16,17.22〜24.31〜33.36.3
7.44〜62は比較例であり、本発明の請求範囲外で
ある。これらの焼結体素子では、密度がa、es 〜a
、s、!//cd (理論密度の67〜94%)と低い
念め、バリスタとしての特性に適していないもの、また
は容量変化率が大きく、信頼性や電気特性に影響し、バ
リスタとしての特性に適していないものである。これに
対し、その飴の本発明にかかる試料悪10〜15.18
〜21.25〜30,34,35.38〜43では、焼
結体の密度が5−0g/i以上(理論密度の96%以上
)と高く、バリスタとしての特性に適しているものであ
る。さらに、容量変化率が小さく、信頼性や電気特性に
影響せず、バリスタとしての特性に適しているものであ
る。
(Left below) First, let's start with the above 1. To explain Table 2, sample point 1
~9,16,17.22~24.31~33.36.3
7.44 to 62 are comparative examples and are outside the scope of the claims of the present invention. In these sintered elements, the density is a, es ~ a
,s,! //cd (67-94% of theoretical density), which is not suitable for varistor characteristics, or has a large capacitance change rate, which affects reliability and electrical characteristics, and is not suitable for varistor characteristics. It's something that doesn't exist. On the other hand, the sample quality according to the present invention of the candy was 10 to 15.18.
~21.25~30, 34, 35.38~43, the density of the sintered body is as high as 5-0 g/i or more (96% or more of the theoretical density), and is suitable for characteristics as a varistor. . Furthermore, the capacitance change rate is small, does not affect reliability or electrical characteristics, and is suitable for characteristics as a varistor.

ここで、第3図はSrTiO5の平均粒径を変え、その
池の組成比、焼成温度などの条件は全て上記試料A10
と同一にした場合において、5rTiO5の平均粒径と
焼結体素子の焼結密度との関係を示す図であり、5rT
iOsの平均粒径が0.5μm以下の場合には、LiF
の添加量が0.7mo1%と少なくとも低温焼結が可能
であることを示している。しかし、SrTiO5の平均
粒径が0.5μmを超えると、低温焼結では焼結体素子
の焼結密度が低く、バリスタとしての特性に適していな
いものである。
Here, in FIG. 3, the average particle size of SrTiO5 is changed, and the conditions such as the composition ratio of the pond and the firing temperature are all the same as the above sample A10.
FIG. 2 is a diagram showing the relationship between the average particle size of 5rTiO5 and the sintered density of the sintered element when the 5rTiO5
When the average particle size of iOs is 0.5 μm or less, LiF
The amount added is 0.7 mo1%, which indicates that at least low-temperature sintering is possible. However, if the average particle size of SrTiO5 exceeds 0.5 μm, the sintered element will have a low sintered density in low-temperature sintering, making it unsuitable for properties as a varistor.

また、LiとFの残存量を規定したのは、LiとFはS
rTiO5と反応し、SrO−TiO2−LiF 系の
液相を形成する。そして、液相焼結により焼結性を促進
させる効果があるが、LiとFの残存量が0.007 
wt%未満では、焼結体の密度が向上せず、LiFの添
加効果が得られないためである。一方、残存量が0.5
00wt%を超えると素子が多孔質となシ、焼結密度が
低下することと、素子内部にLi 、 F 原子を含む
水溶性塩の含有量が増加し、信頼性や電気特性に影響す
るためである。
In addition, the remaining amounts of Li and F were specified because Li and F are S
It reacts with rTiO5 to form a SrO-TiO2-LiF system liquid phase. Liquid phase sintering has the effect of promoting sinterability, but the residual amount of Li and F is 0.007
This is because if the amount is less than wt%, the density of the sintered body will not improve and the effect of adding LiF will not be obtained. On the other hand, the remaining amount is 0.5
If it exceeds 00 wt%, the element becomes porous, the sintered density decreases, and the content of water-soluble salts containing Li and F atoms increases inside the element, which affects reliability and electrical characteristics. It is.

また、言い換えれば製造過程において、添加するLiF
の添加量もこのLiとFの残存量から自ずと規制される
ものである。すなわち、LiFの添加量は0.7〜7.
0mol%となる。
In other words, in the manufacturing process, LiF added
The amount of addition of Li and F is naturally regulated based on the remaining amounts of Li and F. That is, the amount of LiF added is 0.7 to 7.
It becomes 0 mol%.

次に、SrTiO5のSr/Ti比を1.001〜1.
05に規定したのは、Sr/Ti 比が1−001未満
では試料点1〜8に示すように焼結体密度が向上しない
ためである。これは焼結過程でLiF (!: Srτ
105が反応し、Li2Ti0.を形成し5rT103
の焼結性を抑制するためと考えられる。一方、 Sr/
Ti比が1,05を超えると試料点44〜62に示すよ
うに焼結体素子の密度が向上しない。これは、Srの含
有量が増え過ぎたために粒成長が抑制され、焼結性が低
下するためである。またこの場合、素子内部にSr原子
を含む水溶性塩の含有量が増加し、信頼性や電気特性に
影響するためである。
Next, the Sr/Ti ratio of SrTiO5 was set to 1.001 to 1.
The reason why it is specified as 05 is that when the Sr/Ti ratio is less than 1-001, the density of the sintered body does not improve as shown in sample points 1 to 8. This is caused by LiF (!: Srτ
105 reacts, Li2Ti0. form 5rT103
This is thought to be due to the suppression of sinterability. On the other hand, Sr/
When the Ti ratio exceeds 1.05, the density of the sintered element does not improve as shown at sample points 44 to 62. This is because the Sr content increases too much, which suppresses grain growth and reduces sinterability. Further, in this case, the content of water-soluble salts containing Sr atoms inside the element increases, which affects reliability and electrical characteristics.

また、M11成のCeO2、7203、1,1L2Q4
の添加量を規定したのは、G’02. Y2O3,La
2O5は、SrTiO3中のSrと置換し、原子化制御
により半導体化を促進させる効果を示すが、少なくとも
一種類以上が0.I 1101%未満では、試料&22
,23゜24に示すように添加効果が得られず、半導体
化が抑制され、誘電率εが劣化し、またバリスタ電圧が
高いため、高容量、低バリスタ電圧の特徴を示さないた
めである。一方、5.Q no1%を超えると、試料&
31.32.33に示すように半導体化が抑制されるこ
とと、焼結性が低下するためである。
In addition, M11-formed CeO2, 7203, 1,1L2Q4
The amount of addition was specified in G'02. Y2O3, La
2O5 substitutes for Sr in SrTiO3 and exhibits the effect of promoting semiconductor formation through atomization control, but at least one type is 0. I less than 1101%, sample &22
, 23 and 24, the addition effect is not obtained, the semiconductor formation is suppressed, the dielectric constant ε deteriorates, and the varistor voltage is high, so the characteristics of high capacitance and low varistor voltage are not exhibited. On the other hand, 5. Q: If it exceeds 1%, the sample &
This is because, as shown in 31.32.33, semiconductor formation is suppressed and sinterability is reduced.

さらに、素子内部に含まれる水溶性塩の含有量をo、o
eso wt%以下と規定したのは、0.050wt%
を超えると第4図に示すように耐湿負荷での容量変化率
が上昇し、信頼性や電気特性に影響を与える°ためであ
る。
Furthermore, the content of water-soluble salts contained inside the element is o, o
The eso wt% or less stipulated is 0.050wt%.
This is because if the value exceeds 100%, the rate of change in capacity under humidity-resistant load increases as shown in FIG. 4, which affects reliability and electrical characteristics.

次に、焼成温度を1000〜14oO℃に規定したのは
、第5図に示すように1000℃未満では焼結体素子に
含まれるLiと2の残存量が0−500wt%よりも多
くなるため、信頼性や電気特性に影響を与えることと、
焼結密度が低いためである。
Next, the firing temperature was set at 1000 to 140°C because, as shown in Figure 5, below 1000°C, the residual amount of Li and 2 contained in the sintered element becomes greater than 0 to 500 wt%. , affecting reliability and electrical characteristics;
This is because the sintered density is low.

また、1000℃を超えると多孔質となり、焼結密度が
低下するためである。この第6図は試料点36をベース
として焼成温度とLi、Fの残存量との関係を見たもの
である。
Further, if the temperature exceeds 1000°C, the material becomes porous and the sintered density decreases. This FIG. 6 shows the relationship between the firing temperature and the remaining amounts of Li and F based on the sample point 36.

(実施例2) 次に、Sr/Ti比、LiF 、 Ce102 、72
03.La2O5の添加量を固定し、下記第3表に示す
ように第2成分の5i02 、 CuO、Co2O3、
MnCO3の組成を変えて、その池は上記実施例1と同
様の方法で混合。
(Example 2) Next, the Sr/Ti ratio, LiF, Ce102, 72
03. The amount of La2O5 added was fixed, and the second component 5i02, CuO, Co2O3,
The composition of MnCO3 was changed and the pond was mixed in the same manner as in Example 1 above.

造粒、成形、電極焼付けを行い、下記第4表に示すよう
に各種特性を測定した。
Granulation, molding, and electrode baking were performed, and various properties were measured as shown in Table 4 below.

(以下余白) まず、上記第31M4表について解説すると、試料点1
〜4.16〜18は比較例であシ、本発明の請求範囲外
である。これに対し、その池の本発明にかかる試料7%
5〜14は5i02 、 CuO。
(Left below) First, to explain Table 31M4 above, sample point 1
-4.16-18 are comparative examples and are outside the scope of the claims of the present invention. In contrast, 7% of the sample according to the present invention in that pond
5-14 are 5i02, CuO.

co2o5 、 MnCO3の添加効果が得られるもの
である。ここで、第2成分の8102 、 OuO、C
o2O3。
The effect of adding co2o5 and MnCO3 can be obtained. Here, the second component 8102, OuO, C
o2O3.

MnC05の添加量を規定したのは、これらの添加剤を
添加すると、これらが粒界に偏析し、粒界を高抵抗化さ
せ、バリスタ特性を発現させる効果を示すが、0−1 
mo1%未満では、試料A1〜4に示すようにバリスタ
特性を改善する効果がないためである。一方、 2.0
mol%を超えると試料&16〜1Bに示すように粒界
にこの添加剤が極端に偏析し、バリスタ電圧が上昇する
と共に誘電率や焼結密度が低下するためである。
The reason for specifying the amount of MnC05 added is that when these additives are added, they segregate at the grain boundaries, make the grain boundaries high in resistance, and have the effect of developing varistor properties.
This is because if the mo is less than 1%, there is no effect of improving the varistor characteristics as shown in samples A1 to A4. On the other hand, 2.0
This is because when the mol% is exceeded, this additive is extremely segregated at the grain boundaries as shown in samples &16 to 1B, and the varistor voltage increases and the dielectric constant and sintered density decrease.

(実施例3) 次に、Sr/Ti比、LiF 、第1成分のCaO2。(Example 3) Next, the Sr/Ti ratio, LiF, and the first component CaO2.

τ205 + ”205 +第2成分の5i02 、 
CuO、Co2O3。
τ205 + "205 + 5i02 of the second component,
CuO, Co2O3.

MnCO3の添加量を固定し、下記第6表に示すように
第3成分の5n02 、 ZrO2の組成を変えて、そ
の他は上記実施例1.2と同様の方法で混合、造粒、成
形、電極焼付けを行い、下記第6表に示すように各種特
性を測定した。
The amount of MnCO3 added was fixed, and the compositions of the third component 5n02 and ZrO2 were changed as shown in Table 6 below, but otherwise mixing, granulation, molding, and electrodes were carried out in the same manner as in Example 1.2 above. Baking was performed and various properties were measured as shown in Table 6 below.

(以下余白) まず、上記第6.第6表について解説すると、試料&1
〜2.9〜10は比較例であり、本発明の請求範囲外で
ある。これに対し、その他の本発明にかかる試料&3〜
Bは5n02 、 ZrO2の添加効果が得られるもの
である。ここで、第3成分の5n02 、 ZrO2の
添加量を規定したのは、これらの添加剤を添加すると、
5rTiOg中の丁1と置換し。
(Left below) First, let's start with the above 6. To explain Table 6, sample &1
-2.9 to 10 are comparative examples and are outside the scope of the claims of the present invention. In contrast, other samples &3~ according to the present invention
B is 5n02, which provides the effect of adding ZrO2. Here, the addition amount of the third component 5n02 and ZrO2 was specified because when these additives are added,
Replaced with 1 in 5rTiOg.

結晶構造に歪みを生じ半導体化が促進され、結果として
誘電率が増加する効果が期待されるが。
It is expected that this will cause distortion in the crystal structure and promote semiconducting, resulting in an increase in the dielectric constant.

O−1mo1%未満では、試料/a1〜2に示すように
誘電率を増加する効果がないためである。一方1、0m
ol%を超えると、試料点9〜1oに示すように半導体
化及び粒成長が抑制され、誘電率。
This is because if O-1mol is less than 1%, there is no effect of increasing the dielectric constant as shown in samples /a1 and /a2. On the other hand, 1.0m
When it exceeds ol%, semiconductor formation and grain growth are suppressed, as shown in sample points 9 to 1o, and the dielectric constant decreases.

tanδ、焼結密度などの特性が劣化するためである。This is because properties such as tan δ and sintered density deteriorate.

なお、本発明の実施例では、一部の組み合わせについて
示したが池の組み合わせでも同様の効果があることを確
認した。さらに、本発明の実施例では、Li、F の添
加剤としてLiFを用いたが、他のLiと?化合物を添
加し複合反応させたLiFでも同様の効果を得られるこ
とは言うまでもない。
In addition, although some combinations were shown in the examples of the present invention, it was confirmed that a similar effect could be obtained with a combination of ponds. Furthermore, in the examples of the present invention, LiF was used as an additive for Li and F, but what about other Li? It goes without saying that similar effects can be obtained with LiF in which a compound is added and a complex reaction is carried out.

そして、Sr過剰の5rT105を作成するに当たシ、
5rCO5を添加したが、酸化物や水酸化物などの形で
用いても良く、さらにはSrを含む各種塩類の形で用い
ても同様の効果を得られることは言うまでもない。
Then, when creating 5rT105 with excess Sr,
Although 5rCO5 is added, it goes without saying that it may be used in the form of oxides or hydroxides, and even in the form of various salts containing Sr, similar effects can be obtained.

さらにまた、第2成分としてのCuO、Co2O3。Furthermore, CuO and Co2O3 as the second component.

MnC03,第3成分としての5n02 、 ZrO2
にライても、これら酸化物、炭酸化物以外の形で使用し
ても良く、例えば水酸化物や、さらには各種塩類の形で
用いても良いものである。
MnC03, 5n02 as the third component, ZrO2
It may be used in a form other than these oxides and carbonates, for example, in the form of a hydroxide or various salts.

そして、上記の実施例では、焼成を還元雰囲気中で行う
場合について説明したが、これは窒素雰囲気中で焼成を
行うようにしても良いものである。
In the above embodiments, the case where the firing is performed in a reducing atmosphere has been described, but the firing may be performed in a nitrogen atmosphere.

しかし、窒素雰囲気中で焼成を行った場合は、半導体化
が若干しにくい面があるため、還元雰囲気中で焼成を行
うよりも若干高温度(1300〜14oO℃)側で焼成
する方が特性上は好ましいものである。
However, when firing in a nitrogen atmosphere, it is somewhat difficult to convert into a semiconductor, so firing at a slightly higher temperature (1300 to 14oC) is better for characteristics than firing in a reducing atmosphere. is preferable.

さらに、上記の実施例では、焼結体の両面にAgペース
トなどの500〜900℃で焼付は可能な導電性ペース
トを印刷し、600〜900℃で焼付け、焼結体素子の
再酸化を行うと同時に電極を形成する場合について説明
したが、これは従来より一般的に行われているように、
焼成後の素子を空気中で500〜1000℃の熱処理を
行い、焼結体素子の再酸化を行った後に、上記導電性ペ
ーストを500〜900℃で焼付けて電極を形成するよ
うにしても良いものである。
Furthermore, in the above example, a conductive paste such as Ag paste that can be baked at 500 to 900°C is printed on both sides of the sintered body, and the sintered body element is reoxidized by baking at 600 to 900°C. We have explained the case where electrodes are formed at the same time, but this is commonly done in the past.
The fired element may be heat treated in air at 500 to 1000°C to reoxidize the sintered element, and then the conductive paste may be baked at 500 to 900°C to form the electrode. It is something.

ここで、本発明において、上記実施例に示すように焼結
体素子の再酸化処理と電極形成が同時に行えることとな
った理由は、一つにはLiFの添加によって低温焼結が
可能になったことにより、再酸化が低温で起こり易いた
めである。また、今一つはyイオンの影響によシ、焼結
体素子の酸素欠陥が多いために、Agペーストなどを印
刷し低温で焼付けても再酸化が起こシ易いことによるも
のである。
Here, in the present invention, one of the reasons why the reoxidation treatment of the sintered body element and the electrode formation can be performed simultaneously as shown in the above example is that low temperature sintering is possible due to the addition of LiF. This is because reoxidation tends to occur at low temperatures. Another problem is that due to the influence of y ions, the sintered element has many oxygen defects, so re-oxidation is likely to occur even if Ag paste or the like is printed and baked at a low temperature.

このようにして得られた素子はバリスタ電圧が比較的低
く、α、誘電率が大きく、信頼性に優れているといった
特性を同時に満足するため、ノイズや静電気の抑制に有
効であり、誘電率が大きいことから、立ち上がりの鋭い
急峻波パルスに対しても優れた応答性を示す。
The device obtained in this way simultaneously satisfies the characteristics of a relatively low varistor voltage, a large α, a large dielectric constant, and excellent reliability, so it is effective in suppressing noise and static electricity, and has a low dielectric constant. Because of its large size, it exhibits excellent responsiveness even to steep wave pulses with a sharp rise.

発明の効果 以上に示したように本発明によれば、バリスタ電圧が比
較的低く、α、誘電率が太き(−tanδが小さく、信
頼性に優れているといった特性を同時に満足することが
できる。
Effects of the Invention As shown above, according to the present invention, it is possible to simultaneously satisfy the characteristics of relatively low varistor voltage, large α and dielectric constant (small -tan δ, and excellent reliability). .

従来のZnO系バリスタに比べ、バリスタ電圧が比較的
低く、α、誘電率が大きいため、ノイズや静電気といっ
た立ち上がりの鋭い急峻波パルスに対して極めて有効で
ある。
Compared to conventional ZnO-based varistors, the varistor voltage is relatively low and α and dielectric constant are large, so it is extremely effective against steep wave pulses with a sharp rise such as noise and static electricity.

従って、本発明によれば、ノイズ、静電気から半導体及
び回路を保護することのできる素子を得ることができ、
その実用上の効果は極・めて大きいものである。
Therefore, according to the present invention, it is possible to obtain an element that can protect semiconductors and circuits from noise and static electricity.
Its practical effects are extremely large.

また、従来の5rTiO5系バリスタの焼結温度が14
00’C以上であったのに比べ、本発明では10oO〜
14oO℃の比較的低温で焼結が可能となシ、焼結過程
のエネルギー量の削減が期待されるものである。
In addition, the sintering temperature of the conventional 5rTiO5 varistor is 14
Compared to 00'C or more, the present invention has a temperature of 10oO~
Since sintering can be performed at a relatively low temperature of 14oO<0>C, it is expected that the amount of energy in the sintering process will be reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による素子を示す上面図、第2図は同断
面図、fJcs図は本発明を説明するための5rTiO
5の平均粒径と焼結密度との関係を示す図、第4図は同
じく水溶性塩の含有量と容量変化率との関係を示す図、
第6図は同じく焼成温度とLi。 Fの残存量との関係を示す図である。 1・・・・・・焼結体、2.3・・・・・・電極。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名J 第3図 一子力濫憾 ←12 一家量費化午 5全(幻    5
FIG. 1 is a top view showing an element according to the present invention, FIG. 2 is a sectional view thereof, and the fJcs diagram is a 5rTiO
Figure 4 is a diagram showing the relationship between the average particle size and sintered density of No. 5, and Figure 4 is a diagram showing the relationship between the content of water-soluble salt and the rate of change in capacity.
Figure 6 also shows the firing temperature and Li. It is a figure showing the relationship with the residual amount of F. 1... Sintered body, 2.3... Electrode. Name of agent: Patent attorney Toshio Nakao and 1 other person

Claims (3)

【特許請求の範囲】[Claims] (1)SrとTiの比が1.001≦Sr/Ti≦1.
05となるように過剰のSrを含有し、さらにLiとF
を合計で0.007〜0.500wt%含有したSrT
iO_3に、CeO_2,Y_2O_3,La_2O_
3のうち少なくとも一種類以上を0.1〜5.0mol
%と、Si,Cu,Co,Mnのうち少なくとも一種類
以上の元素を酸化物,炭酸化物などの各種の形のいずれ
かの形にして0.1〜2.0mol%と、Sn,Zrの
うち少なくとも一種類以上の元素を酸化物などの各種の
形のいずれかの形にして0.1〜1.0mol%含ませ
てなる電圧依存性非直線抵抗体素子。
(1) The ratio of Sr and Ti is 1.001≦Sr/Ti≦1.
Contains excess Sr so that it becomes 05, and further contains Li and F.
SrT containing 0.007 to 0.500 wt% in total
iO_3, CeO_2, Y_2O_3, La_2O_
0.1 to 5.0 mol of at least one of 3.
%, 0.1 to 2.0 mol% of at least one element among Si, Cu, Co, and Mn in any of various forms such as oxides and carbonates, and 0.1 to 2.0 mol% of Sn, Zr. A voltage-dependent nonlinear resistor element containing 0.1 to 1.0 mol% of at least one element among them in the form of any of various forms such as oxides.
(2)請求項1記載の電圧依存性非直線抵抗体素子に含
まれる水溶性塩が0.050wt%以下(但し0wt%
は含まず)であることを特徴とする電圧依存性非直線抵
抗体素子。
(2) The water-soluble salt contained in the voltage-dependent nonlinear resistor element according to claim 1 is 0.050 wt% or less (however, 0 wt%
A voltage-dependent nonlinear resistor element characterized in that:
(3)SrTiO_3の平均粒径が0.5μm以下の粉
末を原料として1.001≦Sr/Ti≦1.05とな
るようにSr化合物を添加し、さらにLiFを0.7〜
7.0mol%と、CeO_2,Y_2O_3,La_
2O_3のうち少なくとも一種類以上を0.1〜5.0
mol%と、Si,Cu,Co,Mnのうち少なくとも
一種類以上の元素を酸化物,炭酸化物などの各種の形の
いずれかの形にして0.1〜2.0mol%と、Sn,
Zrのうち少なくとも一種類以上の元素を酸化物などの
各種の形のいずれかの形にして0.1〜1.0mol%
添加した混合粉末を成形し、還元雰囲気中や窒素雰囲気
中で1000〜1400℃の温度で焼成し、その後、5
00〜900℃で焼付け可能な導電性ペーストを用い、
上記焼成後の素子に500〜900℃で焼付けて電極を
形成するか、または上記焼成後の素子を空気中で500
〜1000℃の熱処理を行った後に500〜900℃で
焼付けて電極を形成し、内部に含まれる水溶性塩が0.
050wt%以下(但し、0Wt%は含まず)であるこ
とを特徴とする電圧依存性非直線抵抗体素子の製造方法
(3) Using SrTiO_3 powder with an average particle size of 0.5 μm or less as a raw material, add an Sr compound so that 1.001≦Sr/Ti≦1.05, and further add 0.7 to 0.7 μm of LiF.
7.0 mol% and CeO_2, Y_2O_3, La_
0.1 to 5.0 of at least one type of 2O_3
Sn,
0.1 to 1.0 mol% of at least one element of Zr in any of various forms such as oxides
The added mixed powder is molded and fired at a temperature of 1000 to 1400°C in a reducing atmosphere or nitrogen atmosphere, and then
Using a conductive paste that can be baked at 00-900℃,
The fired element is baked at 500 to 900°C to form an electrode, or the fired element is heated at 500°C in air.
After heat treatment at ~1000°C, the electrode is baked at 500~900°C, and the water-soluble salt contained inside is reduced to 0.
A method for manufacturing a voltage-dependent nonlinear resistor element, characterized in that the voltage is 0.050 wt% or less (excluding 0 Wt%).
JP63119515A 1988-05-17 1988-05-17 Voltage-dependent nonlinear resistance element and manufacture thereof Pending JPH01289206A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63119515A JPH01289206A (en) 1988-05-17 1988-05-17 Voltage-dependent nonlinear resistance element and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63119515A JPH01289206A (en) 1988-05-17 1988-05-17 Voltage-dependent nonlinear resistance element and manufacture thereof

Publications (1)

Publication Number Publication Date
JPH01289206A true JPH01289206A (en) 1989-11-21

Family

ID=14763180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63119515A Pending JPH01289206A (en) 1988-05-17 1988-05-17 Voltage-dependent nonlinear resistance element and manufacture thereof

Country Status (1)

Country Link
JP (1) JPH01289206A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0497502A (en) * 1990-08-14 1992-03-30 Murata Mfg Co Ltd Electronic device
US5644284A (en) * 1994-04-27 1997-07-01 Matsushita Electric Industrial Co., Ltd. Temperature sensor
CN101800282A (en) * 2010-02-20 2010-08-11 同济大学 Application of strontium stannate titanate film
CN102255043A (en) * 2010-05-20 2011-11-23 同济大学 Method for improving resistive storage performance of strontium titanate stannate thin film
JPWO2013058227A1 (en) * 2011-10-20 2015-04-02 株式会社村田製作所 Multilayer semiconductor ceramic capacitor with varistor function and manufacturing method thereof

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0497502A (en) * 1990-08-14 1992-03-30 Murata Mfg Co Ltd Electronic device
US5644284A (en) * 1994-04-27 1997-07-01 Matsushita Electric Industrial Co., Ltd. Temperature sensor
CN101800282A (en) * 2010-02-20 2010-08-11 同济大学 Application of strontium stannate titanate film
CN102255043A (en) * 2010-05-20 2011-11-23 同济大学 Method for improving resistive storage performance of strontium titanate stannate thin film
JPWO2013058227A1 (en) * 2011-10-20 2015-04-02 株式会社村田製作所 Multilayer semiconductor ceramic capacitor with varistor function and manufacturing method thereof
US9105603B2 (en) 2011-10-20 2015-08-11 Murata Manufacturing Co., Ltd. Laminate type semiconductor ceramic capacitor with varistor functionality and method for manufacturing the same

Similar Documents

Publication Publication Date Title
JPH01289206A (en) Voltage-dependent nonlinear resistance element and manufacture thereof
JPS63312616A (en) Semiconductor porcelain composition
JPH03138905A (en) Voltage dependent non-linear ceramic resistor and its manufacture
JP2808775B2 (en) Varistor manufacturing method
JPH01289205A (en) Voltage-dependent nonlinear resistance element and manufacture thereof
JP2725405B2 (en) Voltage-dependent nonlinear resistor porcelain and method of manufacturing the same
JPH01289202A (en) Voltage-dependent nonlinear resistance element and manufacture thereof
JP2727693B2 (en) Voltage-dependent nonlinear resistor porcelain composition and method for manufacturing varistor
JP2808777B2 (en) Varistor manufacturing method
JPS606535B2 (en) porcelain composition
JPH07201531A (en) Voltage non-linear resistor porcelain composition and voltage non-linear resistor porcelain
JPH01289204A (en) Voltage-dependent nonlinear resistance element and manufacture thereof
JP2555791B2 (en) Porcelain composition and method for producing the same
JP3598177B2 (en) Voltage non-linear resistor porcelain
JP2808778B2 (en) Varistor manufacturing method
JPH01289203A (en) Voltage-dependent nonlinear resistance element and manufacture thereof
JP2737280B2 (en) Ceramic capacitor and method of manufacturing the same
JPS61271802A (en) Voltage non-linear resistor ceramic composition
JPH01289207A (en) Voltage-dependent nonlinear resistance element and manufacture thereof
JP2555790B2 (en) Porcelain composition and method for producing the same
JP2630156B2 (en) Semiconductor porcelain composition and method for producing the same
JP2638599B2 (en) Voltage non-linear resistor ceramic composition
JP2990627B2 (en) Varistor manufacturing method
JP2646734B2 (en) Ceramic capacitor and method of manufacturing the same
JPS62252902A (en) Porcelain compound for voltage nonlinear resistance unit