JPH0128544B2 - - Google Patents

Info

Publication number
JPH0128544B2
JPH0128544B2 JP56051475A JP5147581A JPH0128544B2 JP H0128544 B2 JPH0128544 B2 JP H0128544B2 JP 56051475 A JP56051475 A JP 56051475A JP 5147581 A JP5147581 A JP 5147581A JP H0128544 B2 JPH0128544 B2 JP H0128544B2
Authority
JP
Japan
Prior art keywords
signal line
voltage
signal
electronic circuit
voltage range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56051475A
Other languages
Japanese (ja)
Other versions
JPS57166733A (en
Inventor
Masaru Uya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP56051475A priority Critical patent/JPS57166733A/en
Publication of JPS57166733A publication Critical patent/JPS57166733A/en
Publication of JPH0128544B2 publication Critical patent/JPH0128544B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/01Modifications for accelerating switching
    • H03K19/017Modifications for accelerating switching in field-effect transistor circuits
    • H03K19/01707Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits
    • H03K19/01721Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits by means of a pull-up or down element

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Electronic Switches (AREA)
  • Logic Circuits (AREA)
  • Static Random-Access Memory (AREA)

Description

【発明の詳細な説明】 本発明は、バスラインのようなデイジタル電圧
信号を伝送する信号線の負荷容量に帰因する信号
伝搬の遅延を減少させて、信号伝搬速度を速くす
る電子回路であり、特に、デイジタル集積回路中
の信号線に適用すれば極めて大きな効果のある電
子回路を提供するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention is an electronic circuit that increases the signal propagation speed by reducing the delay in signal propagation caused by the load capacitance of a signal line such as a bus line that transmits a digital voltage signal. In particular, the present invention provides an electronic circuit that is extremely effective when applied to signal lines in digital integrated circuits.

デイジタル電圧信号をのせて、離れた場所にあ
る受信ゲートにまで運ぶ信号線は少なからず配線
抵抗、容量を有し、信号の伝搬は遅れる。特に、
マイクロコンピユータのバスラインのような
MOS集積回路中の信号線は、寄生容量とゲート
入力容量が多いのと、信号線をドライブする
MOSトランジスタのインピーダンスが比較的大
きいため、信号伝搬の遅延が著しい。
A signal line that carries a digital voltage signal and carries it to a receiving gate located at a remote location has considerable wiring resistance and capacitance, which delays signal propagation. especially,
Like the bus line of a microcomputer
Signal lines in MOS integrated circuits have a large amount of parasitic capacitance and gate input capacitance, as well as the amount of power required to drive the signal lines.
Since the impedance of the MOS transistor is relatively large, the delay in signal propagation is significant.

第1図は、CMOS集積回路中の信号線の電圧
の変化を示す。時刻t1で、信号線をドライブする
ゲートの1つが低レベルから高レベルに遷移する
と、信号線の負荷容量とドライブ・ゲートの出力
インピーダンスの大きさでほぼ決まるカーブで破
線の如く、受信ゲートの入力に現われる。
CMOSゲートの閾電圧は通常、電源電圧VDDの半
分の値でこれをVTHとすると、破線のカーブが
VTHに達する時刻tBで受信ゲートが“0”→“1”
を受けとる。即ち、信号線での伝搬遅延はtB−t1
である。
FIG. 1 shows changes in voltage on signal lines in a CMOS integrated circuit. At time t 1 , when one of the gates driving the signal line transitions from low level to high level, the receiving gate changes as shown by the broken line with a curve approximately determined by the load capacitance of the signal line and the output impedance of the drive gate. appears in the input.
The threshold voltage of a CMOS gate is normally half the power supply voltage V DD , and if this is V TH , then the dashed curve is
At time t B when V TH is reached, the reception gate changes from “0” to “1”
receive. In other words, the propagation delay on the signal line is t B −t 1
It is.

ところで、今、電圧VLとVHとの間の電圧範囲
でのみ、信号線の電圧を急速に上昇させる機能を
もつ回路が作動したとすれば、時刻t2以後は実線
のようになり、信号線の伝搬遅延はtA〜t1にま
で、即ち、tB〜tAの時間短縮される。このとき、
信号線の容量をC、ドライブ・ゲートの出力抵抗
をRとして、電圧がVLからVHまでの間に電源VDD
から等価抵抗rで上記容量Cを充電したものとす
れば、t1からt2までと、t3以後はCRの時定数をも
つ曲線であり、t2からt3まではC(Rr)の時
定数をもつ曲線となる。ただし、は並列抵抗値
を示す。rをRに比し十分に小さくとることで、
この効果が大きくなる。信号線の電圧がVLから
V4の間は電圧を急速に上昇させればよいから、
上記Cを充電する機能を有するものなら何でもよ
い。本発明の実施例では、第2図の8に示す如く
PチヤネルMOSトランジスタで容量Cを充電し
ている。
By the way, if a circuit with the function of rapidly increasing the voltage of the signal line operates only in the voltage range between voltages V L and V H , then after time t 2 the circuit will look like the solid line, The propagation delay of the signal line is reduced to tA to t1 , that is, the time tB to tA . At this time,
Assuming that the capacitance of the signal line is C and the output resistance of the drive gate is R, the power supply V DD is set between the voltage V L and V H.
Assuming that the above capacitance C is charged with an equivalent resistance r from It becomes a curve with a time constant. However, indicates the parallel resistance value. By setting r sufficiently small compared to R,
This effect becomes larger. Signal line voltage from V L
Since it is only necessary to increase the voltage rapidly during V 4 ,
Any device may be used as long as it has the function of charging the above C. In the embodiment of the present invention, the capacitor C is charged with a P-channel MOS transistor as shown at 8 in FIG.

第1図では、信号線の電圧が“0”から“1”
への遷移の場合であるが、全く同様に、“1”か
ら“0”への遷移の場合には、VTHを含んでいる
電圧範囲VH〜VL(“0”→“1”の場合のVL,VH
と同じである必要は全くない)で、急速に容量C
を放電して急速に電圧を下降させればよい。この
とき、“1”→“0”の伝搬遅延が大幅に短縮さ
れる。
In Figure 1, the voltage on the signal line changes from “0” to “1”.
Similarly, in the case of a transition from “1” to “0”, the voltage range V H to V L (from “0” to “1”) that includes V TH V L , V H in case
), and the capacity C rapidly increases
All you have to do is discharge the voltage and rapidly lower the voltage. At this time, the propagation delay from "1" to "0" is significantly shortened.

第2図に本発明の一実施例を示す。 FIG. 2 shows an embodiment of the present invention.

1はCMOS集積回路中の比較的負荷容量の大
きい長い信号線である。10は信号線の負荷容量
を集中定数的に表わした容量Cである。12は信
号線1に信号をのせる送信側の回路のバツフアで
ある。11はバツフア12の出力抵抗を等価的に
表わした抵抗である。2は信号線1の電圧が電圧
VHより大か否かを検出するVH検出回路であり、
信号線1の電圧aが0<a<VHのときは“0”、
VH≦a<VDDのときには“1”となる。3は2と
同様に信号線1の電圧が検出手段VLより大か否
かを検出するVL検出回路であり、信号線1の電
圧aが、0<a<VLのときは“0”、VL≦a<
VDDのときには“1”となる。VLは、VL<VH
関係にある。4,5,6,7はそれぞれ、インバ
ータ、R−Sラツチ、NORゲート、NANDゲー
トである。8,9はそれぞれ、PチヤネルMOS
トランジスタ、NチヤネルMOSトランジスタで
あり、ドレインが信号線1に接続されている。
1 is a long signal line with a relatively large load capacity in a CMOS integrated circuit. 10 is a capacitance C representing the load capacitance of the signal line in the form of a lumped constant. Reference numeral 12 denotes a buffer of a circuit on the transmitting side that carries a signal onto the signal line 1. 11 is a resistance equivalently representing the output resistance of the buffer 12. 2 is the voltage of signal line 1
This is a V H detection circuit that detects whether or not it is greater than V H.
When voltage a of signal line 1 is 0<a<V H , “0”;
It becomes "1" when V H ≦a<V DD . 3 is a V L detection circuit that detects whether the voltage of the signal line 1 is higher than the detection means V L like 2, and when the voltage a of the signal line 1 is 0<a<V L , it is "0". ”, V L ≦a<
It becomes "1" when V DD . V L has a relationship of V L <V H. 4, 5, 6, and 7 are an inverter, an R-S latch, a NOR gate, and a NAND gate, respectively. 8 and 9 are P channel MOS
The transistor is an N-channel MOS transistor, and its drain is connected to the signal line 1.

次に、第2図の実施例の動作について説明す
る。第3図に、第2図の各部S,a〜gの出力電
圧波形S,a〜gとP,Nチヤネル・トランジス
タ8,9のON、OFF状態を示す。バツフア12
の入力Sが時刻t1で“0”→“1”、時刻t4
“1”→“0”と変化した場合に対応した各部の
波形である。“0”→“1”の遷移途中の時刻t2
からt3の間でのみゲート7の出力が低レベルとな
りPチヤネル・トランジスタ8がONし、一方
“1”→“0”の遷移途中の時刻t5からt6の間で
のみゲート6の出力が高レベルとなりNチヤネ
ル・トランジスタ9がONしているのが分かる。
第3図のタイムチヤートでは、分かり易くするた
めt2〜t3とt5〜t6の時間が現実のものに比らべて
伸長されて、逆にその他の部分が圧縮されて表わ
してある。信号線の信号伝搬遅延は、“0”→
“1”、“1”→“0”の場合、それぞれ,tA−t1
tB−t4となる。
Next, the operation of the embodiment shown in FIG. 2 will be explained. FIG. 3 shows the output voltage waveforms S, a to g of each section S, a to g in FIG. 2, and the ON and OFF states of the P and N channel transistors 8 and 9. Batsuhua 12
These are waveforms of various parts corresponding to the case where the input S changes from "0" to " 1 " at time t1 and from "1" to "0" at time t4 . Time t 2 during the transition from “0” to “1”
The output of the gate 7 becomes low level only between t3 and t3 , and the P channel transistor 8 turns on, while the output of the gate 6 becomes low only between the time t5 and t6 during the transition from "1" to "0". It can be seen that the voltage becomes high level and the N-channel transistor 9 is turned on.
In the time chart shown in Figure 3, the times from t 2 to t 3 and from t 5 to t 6 are expanded compared to the actual time, and other parts are compressed to make it easier to understand. . The signal propagation delay of the signal line is “0”→
In the case of “1” and “1”→“0”, respectively, t A −t 1 ,
t B −t 4 .

このように、VH,VL検出回路、インバータ、
RSラツチ、2個のNANDゲートにより、Pチヤ
ンネルおよびNチヤンネルトランジスタを導通さ
せることにより、信号線の負荷容量を急速に充放
電することができ、信号の伝達遅延は大きく短縮
される。
In this way, the V H , V L detection circuit, inverter,
By making the P-channel and N-channel transistors conductive using the RS latch and two NAND gates, the load capacitance of the signal line can be rapidly charged and discharged, and the signal transmission delay can be greatly shortened.

第3図のaに見られる如く、本発明の目的のた
めには、VL<VTH<VHとなる必要があり、急速に
一方向に遷移する電圧範囲(VLからVHまで)が、
その信号線の電圧を入力とする全てのゲートの閾
電圧VTH1,VTH2,………,VTHoを含む、即ち、
VL<(VTH1,VTH2,………,VTHo)<VHとなる必
要がある。
As seen in Figure 3a, for the purpose of the present invention, it is necessary that V L < V TH < V H , and the voltage range changes rapidly in one direction (from V L to V H ). but,
Including the threshold voltages V TH1 , V TH2 , ......, V THo of all gates that input the voltage of the signal line, that is,
It is necessary that V L < (V TH1 , V TH2 , ......, V THo ) < V H.

本発明の効果は、マイクロ・コンピユータのバ
スラインのように、多数のゲートの入出力に接続
された信号線の場合に極めて大きくなる。つまり
容量の大きなバスを急速にドライブするために
は、バスに出力が接続されている全てのゲートの
出力トランジスタのgmを大きくとる必要があ
り、面積が大きくなる。このゲートの数が多いの
で、全体としてはかなりな面積をとつてしまう。
これは、集積回路の集積度と電力消費を悪化させ
ることになる。これに対し、バスに接続されるゲ
ートは全て適度な大きさにしておき、信号線に1
個だけ本発明の回路をつけておけば、面積の増加
は必要最少限になる。
The effects of the present invention are extremely significant in the case of a signal line connected to inputs and outputs of a large number of gates, such as a bus line of a microcomputer. In other words, in order to rapidly drive a bus with a large capacity, it is necessary to increase the gm of the output transistors of all the gates whose outputs are connected to the bus, which increases the area. Since there are a large number of gates, the total area will be large.
This will degrade the density and power consumption of the integrated circuit. On the other hand, all gates connected to the bus should be of appropriate size, and one gate should be connected to the signal line.
If only one circuit of the present invention is provided, the increase in area will be kept to a minimum.

以上、説明したように、本発明によれば、IC
化されたマイクロコンピユータのバスラインの如
き、負荷容量が大きいにもかかわらず、高速のデ
イジタル信号伝搬が要求される信号線の信号伝搬
遅延時間を大幅に短縮することができ、しかも、
簡単な回路構成で実現できて、特にデイジタル集
積回路に応用したとき、極めて価値の高いもので
ある。
As explained above, according to the present invention, the IC
It is possible to significantly reduce the signal propagation delay time of signal lines that require high-speed digital signal propagation despite the large load capacity, such as the bus lines of microcomputers that have been
It can be realized with a simple circuit configuration and is extremely valuable especially when applied to digital integrated circuits.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の要点を説明するための図、第
2図は本発明の一実施例の電子回路の具体的回路
図、第3図は第2図の回路各部の出力信号波形図
である。 1……信号線、2……VH検出回路、3……VL
検出回路、8……Pチヤネル・トランジスタ、9
……Nチヤネル・トランジスタ。
Figure 1 is a diagram for explaining the main points of the present invention, Figure 2 is a specific circuit diagram of an electronic circuit according to an embodiment of the present invention, and Figure 3 is a diagram of output signal waveforms of various parts of the circuit in Figure 2. be. 1...Signal line, 2...V H detection circuit, 3...V L
Detection circuit, 8...P channel transistor, 9
...N-channel transistor.

Claims (1)

【特許請求の範囲】 1 2値電圧信号を伝送する信号線の電圧を検出
する検出手段と、上記検出手段の出力で制御され
上記信号線に電流を流し込む流入手段と、上記検
出手段の出力で制御され上記信号線から電流を流
し出す流出手段とを具備し、上記信号線の電圧
が、第1の電圧と第2の電圧とにはさまれた所定
の電圧範囲に上記第1の電圧を越えて入つた場合
は、上記信号線の電圧が上記所定の電圧範囲にあ
る時にだけ上記流入手段が上記信号線に電流を流
し込み、上記信号線の電圧が、上記第2の電圧を
下まわつて上記所定の電圧範囲に入つた場合に
は、上記信号線の電圧が上記所定の電圧範囲にあ
る時にだけ、上記流出手段が上記信号線から電流
を流し出すことを特徴とする電子回路。 2 所定の電圧範囲が、信号線に入力が接続され
た全ての論理回路の入力論理電圧を含むことを特
徴とする特許請求の範囲第1項に記載の電子回
路。 3 流入手段と流出手段が半導体スイツチである
ことを特徴とする特許請求の範囲第1項に記載の
電子回路。 4 流入手段がPチヤネル・トランジスタであ
り、流出手段がNチヤネル・トランジスタである
ことを特徴とする特許請求の範囲第3項に記載の
電子回路。
[Claims] 1. A detection means for detecting the voltage of a signal line transmitting a binary voltage signal, an inflow means for flowing a current into the signal line controlled by the output of the detection means, and an inflow means for flowing a current into the signal line controlled by the output of the detection means; a controlled outflow means for flowing a current from the signal line, the voltage of the signal line being within a predetermined voltage range sandwiched between the first voltage and the second voltage; If the voltage of the signal line exceeds the second voltage range, the inflow means causes current to flow into the signal line only when the voltage of the signal line is within the predetermined voltage range, and the voltage of the signal line falls below the second voltage. An electronic circuit characterized in that, when the voltage of the signal line falls within the predetermined voltage range, the outflow means causes current to flow out from the signal line only when the voltage of the signal line is within the predetermined voltage range. 2. The electronic circuit according to claim 1, wherein the predetermined voltage range includes input logic voltages of all logic circuits whose inputs are connected to the signal line. 3. The electronic circuit according to claim 1, wherein the inflow means and the outflow means are semiconductor switches. 4. Electronic circuit according to claim 3, characterized in that the inflow means are P-channel transistors and the outflow means are N-channel transistors.
JP56051475A 1981-04-06 1981-04-06 Electronic circuit Granted JPS57166733A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56051475A JPS57166733A (en) 1981-04-06 1981-04-06 Electronic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56051475A JPS57166733A (en) 1981-04-06 1981-04-06 Electronic circuit

Publications (2)

Publication Number Publication Date
JPS57166733A JPS57166733A (en) 1982-10-14
JPH0128544B2 true JPH0128544B2 (en) 1989-06-02

Family

ID=12887971

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56051475A Granted JPS57166733A (en) 1981-04-06 1981-04-06 Electronic circuit

Country Status (1)

Country Link
JP (1) JPS57166733A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59181829A (en) * 1983-03-31 1984-10-16 Toshiba Corp Output buffer circuit of semiconductor element
US4621208A (en) * 1984-09-06 1986-11-04 Thomson Components - Mostek Corporation CMOS output buffer
JPH0720060B2 (en) * 1985-08-14 1995-03-06 株式会社東芝 Output circuit device
EP0911970A3 (en) * 1997-10-09 2001-01-10 Lucent Technologies Inc. Edge detection circuit
JP4588144B2 (en) * 1998-11-10 2010-11-24 川崎マイクロエレクトロニクス株式会社 Sample hold circuit

Also Published As

Publication number Publication date
JPS57166733A (en) 1982-10-14

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