JPH01284315A - Filter device - Google Patents

Filter device

Info

Publication number
JPH01284315A
JPH01284315A JP11313988A JP11313988A JPH01284315A JP H01284315 A JPH01284315 A JP H01284315A JP 11313988 A JP11313988 A JP 11313988A JP 11313988 A JP11313988 A JP 11313988A JP H01284315 A JPH01284315 A JP H01284315A
Authority
JP
Japan
Prior art keywords
resist
filter
air
passed
filtered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11313988A
Other languages
Japanese (ja)
Inventor
Koji Kobayashi
孝司 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP11313988A priority Critical patent/JPH01284315A/en
Publication of JPH01284315A publication Critical patent/JPH01284315A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To efficiently and easily remove the impurities, particles, and air in a resist, etc., by providing an air vent respectively at the upper parts of the front and rear liq. chambers of a filter. CONSTITUTION:A liq. to be filtered such as a resist is introduced into a housing 1 from an intake 3. The air 5 in the resist 2 is firstly discharged to the outside through the air vent mechanism 6, before the resist is passed through the filter 4. The resist is then passed through the filter 4, and the impurities and particles contained in the resist are removed. In this case, the air 8 passed through the filter 4 along with the resist is accumulated at the upper part of the filter, and then removed through the air vent mechanism 9. Accordingly, since the filtered resist does not contain air, the number of the defective products having a nonuniform film thickness distribution is remarkably reduced.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、フィルターの前後に溜まったエアーを取り除
(エアー抜き機構を有するフィルター装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a filter device having an air bleed mechanism for removing air accumulated before and after a filter.

従来の技術 従来の液体用フィルター装置、例えば、レジストを濾過
する場合、第2図に概略断面図で示す装置が用いられる
。同図において、1はレジストを蓄えるハウジング、2
は濾過する前のレジスト、3はハウジング内に濾過する
前のレジストの取り入れ口、4はフィルターで、液中不
純物・粒子をトラップ、またエアーの通過を防止するも
の、5はフィルターを通過することができずにハウジン
グ上部に溜まったエアー、6はハウジング上部に溜まっ
たエアーを取り除くエアー抜き機構、7はフィルターに
より濾過されたレジスト、8はレジストと共にフィルタ
ーを通過してしまったエアー、10は濾過されたレジス
トを外部へ取り出し口である。この装置によると、レジ
スト2はハウジング1内に取り入れられ、フィルター4
により、液中不純物・粒子はトラップされ、またエアー
5はフィルターを通ることが困難であるため、フィルタ
ー前段よりエアー抜き機構6によってハウジング外部へ
取り出されることによりレジストを濾過し、外部へ供給
される。
2. Description of the Related Art A conventional liquid filter device, for example, when filtering resist, is used as shown in a schematic cross-sectional view in FIG. In the figure, 1 is a housing for storing resist; 2 is a housing for storing resist;
3 is the resist before filtration, 3 is the inlet for the resist before filtration into the housing, 4 is the filter that traps impurities and particles in the liquid and also prevents air from passing through, 5 is the resist that passes through the filter 6 is an air release mechanism that removes the air that has accumulated at the top of the housing, 7 is the resist that has been filtered by the filter, 8 is the air that has passed through the filter together with the resist, 10 is the filtered air This is the port for taking out the resist to the outside. According to this device, the resist 2 is taken into the housing 1 and the filter 4
Impurities and particles in the liquid are trapped by this, and since it is difficult for the air 5 to pass through the filter, the resist is filtered by being taken out to the outside of the housing by the air bleed mechanism 6 from the front stage of the filter, and then supplied to the outside. .

発明が解決しようとする課題 フィルター装置はレジストがフィルターを通過すること
ができ、かつ液中不純物・粒子をトラップできるように
、通常、0.2μmの大きさのものが用いられている。
Problems to be Solved by the Invention A filter device having a size of 0.2 μm is usually used so that the resist can pass through the filter and impurities and particles in the liquid can be trapped.

このため、エアーはフィルターを通過する場合がある。Therefore, air may pass through the filter.

しかしながら、従来のフィルター装置ではフィルターを
通過しない工アーを取り除くエアー抜き機構は有してい
たが、フィルターを通過してしまったエアーを取り除く
エアー抜き機構は有していないため、レジスト中にエア
ーが存在したままスピンコーティングしてしまい、膜厚
分布に重大な影響を及ぼしていた。
However, although conventional filter devices have an air bleed mechanism to remove air that does not pass through the filter, they do not have an air bleed mechanism to remove air that has passed through the filter. Spin coating was performed while the particles were present, which had a serious effect on the film thickness distribution.

また、フィルタを通過したエアーはレジストの流れによ
り外部へ押し出すしかなく、レジストを多量に使用して
しまうという問題があった。
In addition, the air that has passed through the filter has no choice but to be pushed out by the flow of the resist, resulting in the problem of using a large amount of resist.

本発明はフィルターを通過したエアーも除去することが
できるフィルター装置を提供することを目的とする。
An object of the present invention is to provide a filter device that can also remove air that has passed through the filter.

課題を解決するための手段 この問題点を解決するため、本発明のフィルター装置は
、フィルターの前段および後段の液室上部に、おのおの
、エアーを取り除くエアー抜き機構をそなえたものであ
る。
Means for Solving the Problems In order to solve this problem, the filter device of the present invention is provided with air bleed mechanisms for removing air, respectively, above the liquid chambers at the front and rear stages of the filter.

作用 このフィルター装置により、レジスト中の不純物・粒子
及びエアーを効率良くしかも容易に取り除くことができ
る。
Function: With this filter device, impurities, particles, and air in the resist can be efficiently and easily removed.

実施例 以下に本発明の実施例であるフィルター装置について第
1図を参照し説明する。図中の符号で、1はレジストを
蓄えるハウジング、2は濾過する前のレジスト、3はハ
ウジングに濾過する前のレジストを取り入れる所、4は
フィルター、5はフィルターを通過することができずに
ハウジング上部に溜まったエアー、6はハウジング上部
に溜まったエアーを取り除くエアー抜き機構、7はフィ
ルターにより濾過されたレジスト、8はレジストと共に
フィルターを通過してフィルター上部に溜まったエアー
を示す。第2図の構成と異なるのは、フィルター上部に
溜まったエアー8を取り除(ためのエアー抜き機構9を
設けた点である。
EXAMPLE A filter device which is an example of the present invention will be described below with reference to FIG. In the figure, 1 is the housing that stores the resist, 2 is the resist before being filtered, 3 is where the resist is taken into the housing before being filtered, 4 is the filter, and 5 is the housing where the resist cannot pass through the filter. The air accumulated at the upper part, 6 is an air release mechanism for removing the air accumulated at the upper part of the housing, 7 is the resist filtered by the filter, and 8 is the air which passed through the filter together with the resist and accumulated at the upper part of the filter. The difference from the configuration shown in FIG. 2 is that an air bleed mechanism 9 is provided to remove air 8 accumulated in the upper part of the filter.

なお、濾過されたレジストの外部への取り出し口10は
、従来装置と同じである。このようにフィルターを通過
することができずにハウジング上部に溜まったエアー5
を取り除(エアー抜き機構6とフィルターを通過してし
まってフィルター上部で溜まったエアー8を取り除くエ
アー抜き機構9とを併せて備えることにより、フィルタ
ーにより濾過されたレジストは液中不純物・粒子及びエ
アーを取り除く能力が30%向上した。
Note that the outlet 10 for taking out the filtered resist to the outside is the same as in the conventional apparatus. In this way, the air that cannot pass through the filter and accumulates at the top of the housing 5
The resist filtered by the filter is free from impurities, particles, and The ability to remove air has been improved by 30%.

発明の効果 本発明によれば、レジスト中の不純物・粒子及びエアー
を取り除く能力が向上したことにより、レジスト膜厚分
布の上下幅は500A以下に抑えられ、膜厚分布の不均
一な不良品が著しく減少し、半導体装置製造の歩留りの
向上に効果大であることが実証された。またフィルター
内にエアーが溜まることが無くなり、レジストによりエ
アーを外部へ押し出すことが不用になったため、レジス
トの使用量を約5%減少させることができ、生産性の向
上の面でも大きな効果があった。
Effects of the Invention According to the present invention, by improving the ability to remove impurities, particles, and air in the resist, the vertical width of the resist film thickness distribution can be suppressed to 500A or less, and defective products with uneven film thickness distribution can be reduced. It has been demonstrated that this is highly effective in improving the yield of semiconductor device manufacturing. In addition, since air no longer accumulates inside the filter and it is no longer necessary to push air out through the resist, the amount of resist used can be reduced by approximately 5%, which has a significant effect on improving productivity. Ta.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のフィルター装置の断面図、第2図は従
来のフィルター装置の断面図である。 1・・・・・・レジストを蓄えるハウジング、2・・・
・・・濾過前のレジスト、3・・・・・・レジスト取り
入れ口、4・・・・・・フィルター、5・・・・・・フ
ィルターを通過しなかったエアー、6・・・・・・フィ
ルターを通過しなかったエアーを取り出すエアー抜き機
構、7・・・・・・濾過されたレジスト、8・・・・・
・フィルターを通過したエアー、9・・・・・・フィル
ターを通過したエアーを取り出すエアー抜き機構、10
・・・・・・レジスト取り出し口。 代理人の氏名 弁理士 中尾敏男 ほか1名ノーーーハ
ウジング′ 2−=’P通前Lシしヌト j−−一シジヌト麻5ノ入れ口 6−−フィルター2i遠しrinl・■エアー9−−−
フィルクーと値遁しへコア−1第2図
FIG. 1 is a sectional view of a filter device of the present invention, and FIG. 2 is a sectional view of a conventional filter device. 1...Housing for storing resist, 2...
...Resist before filtration, 3...Resist intake, 4...Filter, 5...Air that did not pass through the filter, 6... Air bleed mechanism for taking out air that has not passed through the filter, 7...Filtered resist, 8...
・Air that has passed through the filter, 9... Air bleed mechanism that takes out air that has passed through the filter, 10
...Regist ejection port. Name of agent: Patent attorney Toshio Nakao and 1 other person No-housing'2-='P front L shi nut j--1 syji nut hemp 5 slot 6--filter 2i far rinl・■ air 9-- −
Philku and Value Release Core-1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] フィルターの前段および後段の液室上部にエアー抜き機
構を有し、前記液室中の気泡を取り除くことのできるフ
ィルター装置。
A filter device that has an air vent mechanism above the liquid chambers in the front and rear stages of the filter, and can remove air bubbles in the liquid chambers.
JP11313988A 1988-05-10 1988-05-10 Filter device Pending JPH01284315A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11313988A JPH01284315A (en) 1988-05-10 1988-05-10 Filter device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11313988A JPH01284315A (en) 1988-05-10 1988-05-10 Filter device

Publications (1)

Publication Number Publication Date
JPH01284315A true JPH01284315A (en) 1989-11-15

Family

ID=14604551

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11313988A Pending JPH01284315A (en) 1988-05-10 1988-05-10 Filter device

Country Status (1)

Country Link
JP (1) JPH01284315A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0551414U (en) * 1991-12-19 1993-07-09 いすゞ自動車株式会社 Oil tank filter structure
WO2005088685A1 (en) * 2004-03-16 2005-09-22 Hirata Corporation Treatment liquid feeding system and filter device
JP2007258367A (en) * 2006-03-22 2007-10-04 Matsushita Electric Ind Co Ltd Chemical solution supplying apparatus and manufacturing method of semiconductor device
JP2009021448A (en) * 2007-07-12 2009-01-29 Shin Etsu Chem Co Ltd Cleaning method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01262908A (en) * 1988-04-12 1989-10-19 Nec Corp Chemical fluid filter

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01262908A (en) * 1988-04-12 1989-10-19 Nec Corp Chemical fluid filter

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0551414U (en) * 1991-12-19 1993-07-09 いすゞ自動車株式会社 Oil tank filter structure
WO2005088685A1 (en) * 2004-03-16 2005-09-22 Hirata Corporation Treatment liquid feeding system and filter device
JP2007258367A (en) * 2006-03-22 2007-10-04 Matsushita Electric Ind Co Ltd Chemical solution supplying apparatus and manufacturing method of semiconductor device
JP4646234B2 (en) * 2006-03-22 2011-03-09 パナソニック株式会社 Chemical supply device and method for manufacturing semiconductor device
JP2009021448A (en) * 2007-07-12 2009-01-29 Shin Etsu Chem Co Ltd Cleaning method

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