JPH01282401A - 金属基体被覆材の厚さを測定する装置と方法 - Google Patents

金属基体被覆材の厚さを測定する装置と方法

Info

Publication number
JPH01282401A
JPH01282401A JP1024073A JP2407389A JPH01282401A JP H01282401 A JPH01282401 A JP H01282401A JP 1024073 A JP1024073 A JP 1024073A JP 2407389 A JP2407389 A JP 2407389A JP H01282401 A JPH01282401 A JP H01282401A
Authority
JP
Japan
Prior art keywords
probe
coating
measuring
measuring device
thermoelectromotive force
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1024073A
Other languages
English (en)
Japanese (ja)
Inventor
John R M Viertl
ジョン・ルエディガー・マダー・ビエートル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JPH01282401A publication Critical patent/JPH01282401A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP1024073A 1988-02-03 1989-02-03 金属基体被覆材の厚さを測定する装置と方法 Pending JPH01282401A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US153,292 1988-02-03
US07/153,292 US4920319A (en) 1988-02-03 1988-02-03 Method and apparatus for determining the thickness of a coating on a metal substrate

Publications (1)

Publication Number Publication Date
JPH01282401A true JPH01282401A (ja) 1989-11-14

Family

ID=22546570

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1024073A Pending JPH01282401A (ja) 1988-02-03 1989-02-03 金属基体被覆材の厚さを測定する装置と方法

Country Status (5)

Country Link
US (1) US4920319A (OSRAM)
JP (1) JPH01282401A (OSRAM)
CH (1) CH678762A5 (OSRAM)
DE (1) DE3902096A1 (OSRAM)
GB (1) GB2215470A (OSRAM)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994016288A1 (de) * 1993-01-12 1994-07-21 Drm, Dr. Müller Ag Verfahren und vorrichtung zur messung der dicke eines filterkuchens
US5430376A (en) * 1993-06-09 1995-07-04 General Electric Company Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects
US5544953A (en) * 1994-05-18 1996-08-13 General Electric Co. Rolling-ball thermoelectric potential probe and housing for nondestructive testing of metallic and semiconductor objects
US6242926B1 (en) * 1999-01-12 2001-06-05 Ipec Precision, Inc. Method and apparatus for moving an article relative to and between a pair of thickness measuring probes to develop a thickness map for the article
DE10001516B4 (de) * 2000-01-15 2014-05-08 Alstom Technology Ltd. Zerstörungsfreies Verfahren zur Bestimmung der Schichtdicke einer metallischen Schutzschicht auf einem metallischen Grundmaterial
JP3705736B2 (ja) * 2000-08-29 2005-10-12 株式会社リガク 熱電気測定装置の試料組立体
DE102004021450B4 (de) * 2004-04-30 2006-08-10 Hochschule Magdeburg-Stendal (Fh) Messverfahren und Anordnung zur Bestimmung metallischer Oberflächenschichten auf metallischen Werkstücken
KR100846783B1 (ko) * 2005-11-30 2008-07-16 삼성전자주식회사 불량기판 검출장치 및 방법
US10060830B2 (en) * 2014-06-09 2018-08-28 United Technologies Corporation In-situ system and method of determining coating integrity of turbomachinery components
CN104034250B (zh) * 2014-06-30 2016-08-24 山东中科普锐检测技术有限公司 涂层测厚仪温度补偿测量方法
US9582621B2 (en) 2015-06-24 2017-02-28 Globalfoundries Inc. Modeling localized temperature changes on an integrated circuit chip using thermal potential theory
DE102019112238A1 (de) * 2019-05-10 2020-11-12 HELLA GmbH & Co. KGaA Verfahren zur Kontrolle der Beschichtung eines elektronischen Bauteils

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA624746A (en) * 1961-08-01 J. Martin Edward Method and apparatus for thickness measurement
US2972882A (en) * 1952-08-12 1961-02-28 Gen Motors Corp Apparatus for measuring coating thicknesses
US3016732A (en) * 1952-10-01 1962-01-16 Gen Motors Corp Measurement of coating thicknesses by thermal means
US2750791A (en) * 1952-11-06 1956-06-19 Gen Motors Corp Thermoelectric instrument for testing materials
GB768448A (en) * 1954-03-08 1957-02-20 British Non Ferrous Metals Res Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials
GB858345A (en) * 1956-04-06 1961-01-11 British Non Ferrous Metals Res Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials
SU110354A1 (ru) * 1957-03-11 1957-11-30 Л.М. Суворов Способ определени толщины гальванического покрыти
US4419416A (en) * 1981-08-05 1983-12-06 United Technologies Corporation Overlay coatings for superalloys

Also Published As

Publication number Publication date
CH678762A5 (OSRAM) 1991-10-31
US4920319A (en) 1990-04-24
GB2215470A (en) 1989-09-20
GB8902289D0 (en) 1989-03-22
DE3902096A1 (de) 1989-08-17

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