JPH01270244A - Gate array integrated circuit - Google Patents
Gate array integrated circuitInfo
- Publication number
- JPH01270244A JPH01270244A JP9852988A JP9852988A JPH01270244A JP H01270244 A JPH01270244 A JP H01270244A JP 9852988 A JP9852988 A JP 9852988A JP 9852988 A JP9852988 A JP 9852988A JP H01270244 A JPH01270244 A JP H01270244A
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- chip
- integrated circuit
- gate array
- patterns
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003014 reinforcing effect Effects 0.000 abstract description 6
- 230000002159 abnormal effect Effects 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 5
- 230000002787 reinforcement Effects 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
Landscapes
- Design And Manufacture Of Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
【発明の詳細な説明】
皮血豆ヱ
本発明はゲートアレイ集積回路に関し、特に複数のセル
を有するゲートアレイ集積回路に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a gate array integrated circuit, and more particularly to a gate array integrated circuit having a plurality of cells.
良土韮l
従来この種のゲートアレイ集積回路においては、顕rR
鏡等を用いて検査を行い、チップ上の異常な箇所を見つ
けていた。その従来のゲートアレイ集積回路を第2図を
用いて説明する6図は従来のゲートアレイ集積回路のチ
ップ1を示す概略図であり、2は入出力パッド、3は内
部セルアレイ列、4はグランド強化配線パターンである
。Ryodochi Conventionally, in this type of gate array integrated circuit, the
They inspected the chip using a mirror and found any abnormalities on the chip. The conventional gate array integrated circuit will be explained using FIG. 2. FIG. 6 is a schematic diagram showing a chip 1 of the conventional gate array integrated circuit, 2 is an input/output pad, 3 is an internal cell array column, and 4 is a ground. This is a reinforced wiring pattern.
このようなチップ1上で異常な箇所を発見した場合にお
いて、その箇所の位置を知るなめにはセルアレイの端か
ら数えるか、入出力バットからの相対的な位置によりセ
ルや配線パターンの位置を表現する等の手段しかなかっ
た。そのため、モニタ図等との照合を行う際、図面上の
同一箇所を探すのが非常に困難であるという欠点があっ
た。When such an abnormal location is found on chip 1, the best way to find the location is to count from the edge of the cell array, or express the location of the cell or wiring pattern by the relative position from the input/output bat. There was no other way but to do so. Therefore, when comparing with monitor drawings, etc., there is a drawback that it is very difficult to find the same location on the drawing.
1皿座1週
本発明の目的は、チップ上で異常な箇所を発見した際に
、図面上の同一箇所を容易に探すことができるゲートア
レイ集積回路を提供することである。An object of the present invention is to provide a gate array integrated circuit in which when an abnormal location is found on a chip, the same location on a drawing can be easily searched for.
北涯し11成
本発明のゲートアレイ集積回路は、複数のセルを有する
ゲートアレイ集積回路であって、少なくとも前記セルの
位置を示す文字パターンを有することを特徴とする。A gate array integrated circuit according to the present invention is a gate array integrated circuit having a plurality of cells, and is characterized in that it has a character pattern indicating at least the position of the cell.
尺生」 以下、図面を用いて本発明の詳細な説明する。"Shakushu" Hereinafter, the present invention will be explained in detail using the drawings.
第1図は本発明によるゲートアレイ集積回路の一実施例
の概略図であり、第2図と同等部分は同一符号により示
されている。図においては、内部セルアレイ列3の各セ
ル間を結ぶ通常の信号配線層である1層及び2層(図示
せず)の上部のグランド強化配線層である3層にグラン
ド強化配線パターン4が設けられており、このグランド
強化配線パターン4にロゲーションの目安となる文字パ
ターン5及び6(ただし、実際には抜き文字となる)を
設けることにより配線領域を侵すことなく各セルの位置
を表示することができるのである。FIG. 1 is a schematic diagram of an embodiment of a gate array integrated circuit according to the present invention, and parts equivalent to those in FIG. 2 are designated by the same reference numerals. In the figure, a ground reinforcing wiring pattern 4 is provided in the third layer, which is a ground reinforcing wiring layer, above the first and second layers (not shown), which are normal signal wiring layers connecting each cell of the internal cell array column 3. The position of each cell can be displayed without encroaching on the wiring area by providing character patterns 5 and 6 (however, they are actually blank characters) that serve as a guide for rogation in this ground reinforcement wiring pattern 4. This is possible.
この場合、チップ内周辺のグランド強化配線パターン4
に200[/Jfi]間隔(A)で数字の抜き文字パタ
ーン5及び6を縦方向及び横方向に設けている。この文
字パターン5及び6により、目的のセルや配線パターン
の位置を容易かつ正確に表わすことが可能である。その
ため、図面上の同一箇所を容易に探すことができるので
ある。In this case, the ground reinforcement wiring pattern 4 around the inside of the chip
Numeral cut-out character patterns 5 and 6 are provided in the vertical and horizontal directions at intervals of 200[/Jfi] (A). These character patterns 5 and 6 make it possible to easily and accurately represent the position of a target cell or wiring pattern. Therefore, it is possible to easily find the same location on the drawing.
また、本実施例においてはグランド強化配線パターン上
に抜き文字の文字パターンを設けるため容易に実現が可
能であり、新たに文字パターン用の層を設番づる必要も
ないのである。Further, in this embodiment, since the character pattern of cut-out characters is provided on the ground reinforcing wiring pattern, it can be easily realized, and there is no need to create a new layer for the character pattern.
なお、本実施例においては文字パターンとして算用数字
を用いているが、代りにアルファベットを用いてrA、
B、C・・・」のパターンを用いたり、両者を併用して
も同様の効果が得られることは明らかである。In addition, in this embodiment, arithmetic numerals are used as character patterns, but alphabets are used instead, such as rA,
It is clear that similar effects can be obtained by using the patterns "B, C..." or by using both in combination.
魚曹しと舛釆
以上説明したように本発明は、ゲートアレイ集積回路に
おいて、チップ上にセルや配線パターンの位置を示す文
字パターンを設けることにより、顕微鏡等でチエツクし
て異常な箇所を発見した際にチップ内の位置を正確、か
つ容易に表現することができ、モニタ図との照合も容易
にできるという効果がある。As explained above, the present invention provides a gate array integrated circuit with character patterns indicating the positions of cells and wiring patterns on the chip so that abnormalities can be detected by checking with a microscope or the like. When doing so, the position within the chip can be expressed accurately and easily, and the comparison with the monitor diagram can be easily performed.
第1図は本発明の実施例によるゲートアレイ集積回路の
概略図、第2図は従来のゲートアレイ集積回路の概略図
である。
主要部分の符号の説明
1・・・・・・LSIチップ
2・・・・・・入出力パッド
3・・・・・・内部セルアレイ列
4・・・・・・グランド強化配線パターン5.6・・・
・・・文字パターンFIG. 1 is a schematic diagram of a gate array integrated circuit according to an embodiment of the present invention, and FIG. 2 is a schematic diagram of a conventional gate array integrated circuit. Explanation of symbols of main parts 1... LSI chip 2... Input/output pad 3... Internal cell array column 4... Ground reinforcement wiring pattern 5.6.・・・
...Character pattern
Claims (1)
て、少なくとも前記セルの位置を示す文字パターンを有
することを特徴とするゲートアレイ集積回路。(1) A gate array integrated circuit having a plurality of cells, the gate array integrated circuit having at least a character pattern indicating the position of the cell.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9852988A JPH01270244A (en) | 1988-04-21 | 1988-04-21 | Gate array integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9852988A JPH01270244A (en) | 1988-04-21 | 1988-04-21 | Gate array integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01270244A true JPH01270244A (en) | 1989-10-27 |
Family
ID=14222203
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9852988A Pending JPH01270244A (en) | 1988-04-21 | 1988-04-21 | Gate array integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01270244A (en) |
-
1988
- 1988-04-21 JP JP9852988A patent/JPH01270244A/en active Pending
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