JPH0126493B2 - - Google Patents
Info
- Publication number
- JPH0126493B2 JPH0126493B2 JP57140085A JP14008582A JPH0126493B2 JP H0126493 B2 JPH0126493 B2 JP H0126493B2 JP 57140085 A JP57140085 A JP 57140085A JP 14008582 A JP14008582 A JP 14008582A JP H0126493 B2 JPH0126493 B2 JP H0126493B2
- Authority
- JP
- Japan
- Prior art keywords
- field effect
- insulated gate
- circuit
- gate field
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Bipolar Integrated Circuits (AREA)
- Bipolar Transistors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14008582A JPS5930029A (ja) | 1982-08-12 | 1982-08-12 | 温度検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14008582A JPS5930029A (ja) | 1982-08-12 | 1982-08-12 | 温度検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5930029A JPS5930029A (ja) | 1984-02-17 |
| JPH0126493B2 true JPH0126493B2 (enExample) | 1989-05-24 |
Family
ID=15260605
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14008582A Granted JPS5930029A (ja) | 1982-08-12 | 1982-08-12 | 温度検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5930029A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61233330A (ja) * | 1985-04-09 | 1986-10-17 | Nec Corp | 温度センサ回路 |
| JP4768339B2 (ja) | 2005-07-15 | 2011-09-07 | 株式会社リコー | 温度検出回路およびそれを用いた発振周波数補正装置 |
| US9004756B2 (en) * | 2012-04-10 | 2015-04-14 | Freescale Semiconductor, Inc. | Temperature sensor |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5799789A (en) * | 1980-12-12 | 1982-06-21 | Seiko Instr & Electronics Ltd | Semiconductor thermo-sensitive element |
-
1982
- 1982-08-12 JP JP14008582A patent/JPS5930029A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5930029A (ja) | 1984-02-17 |
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