JPH0125347Y2 - - Google Patents
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- Publication number
- JPH0125347Y2 JPH0125347Y2 JP1982147161U JP14716182U JPH0125347Y2 JP H0125347 Y2 JPH0125347 Y2 JP H0125347Y2 JP 1982147161 U JP1982147161 U JP 1982147161U JP 14716182 U JP14716182 U JP 14716182U JP H0125347 Y2 JPH0125347 Y2 JP H0125347Y2
- Authority
- JP
- Japan
- Prior art keywords
- receiving coil
- closed
- output
- receiving
- coil
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002184 metal Substances 0.000 claims description 19
- 229910052751 metal Inorganic materials 0.000 claims description 19
- 238000007689 inspection Methods 0.000 claims description 15
- 230000001360 synchronised effect Effects 0.000 claims description 15
- 230000005672 electromagnetic field Effects 0.000 claims description 5
- 238000004092 self-diagnosis Methods 0.000 claims description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 15
- 238000010586 diagram Methods 0.000 description 10
- 229910052742 iron Inorganic materials 0.000 description 7
- 229910001220 stainless steel Inorganic materials 0.000 description 6
- 239000010935 stainless steel Substances 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- 238000012790 confirmation Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000003745 diagnosis Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- -1 ferrous metals Chemical class 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Description
【考案の詳細な説明】
この考案は、金属検出コイルの動作、感度の確
認をテストピースを実際に流すことなく実施でき
るようにした金属検出器の自己診断回路に関する
ものである。[Detailed Description of the Invention] This invention relates to a self-diagnosis circuit for a metal detector that allows confirmation of the operation and sensitivity of a metal detection coil without actually running a test piece through it.
従来、金属検出器は正しく動作しているか、あ
るいは必要な感度で金属片が検知できるようにな
つているかなどの確認は、テスト用のピースとし
て鉄またはステンレスの標準球を検査ラインに人
手により流して確認を行つていた。しかし、この
方法ではその都度生産ラインを停止させ、人が操
作しなければ確認できないため、生産がストツプ
したり、人手が必要であつた。また、異物混入の
発見を目的とするのに、検出感度が不足した場合
は、不良品がそのまゝ良品として流れてしまうと
同時に、この障害の発見が困難で、安全側に動作
するとは限らない欠点があつた。 Traditionally, to check whether a metal detector is working properly or whether it can detect metal pieces with the required sensitivity, a standard iron or stainless steel ball is manually run through an inspection line as a test piece. I was checking. However, with this method, the production line must be stopped each time, and confirmation cannot be made without human intervention, resulting in production stoppages and the need for human intervention. Furthermore, if the detection sensitivity is insufficient even though the purpose is to detect foreign matter contamination, defective products will be passed on as non-defective products, and at the same time, it will be difficult to detect this fault, and operation may not always be safe. It had some flaws.
上記従来例をさらに図面により説明する。 The above conventional example will be further explained with reference to the drawings.
第１図は従来の金属検出器の回路図の一例であ
る。この図で、１は高周波電源、２は送信コイル
で、高周波電源１から電圧〓ｅPで励振される。３
ａ，３ｂは受信コイルで、両者の接続点は接地さ
れており、送信コイル２と電磁的に結合してお
り、かつ送信コイル２との間に被検査物Ｍの通る
検査ライン４が形成されている。そして、被検査
物Ｍが通過しないとき、あるいは通過してもそれ
が金属を持つていないときには、受信コイル３
ａ，３ｂには等しい誘起電圧〓ｅ1，〓ｅ2が発生す
る。５は可変抵抗器等からなる位相調整器で、摺
動片５ａは接地され、これを第１図で上方側、す
なわち、受信コイル３ａ側に移動すると受信コイ
ル３ａ側の並列抵抗が小さくなり、第２図のベク
トル図に示すように、誘起電圧〓ｅ1の位相が進ん
で〓ｅ′1となり、誘起電圧〓ｅ2との差〓ｅ′1−〓ｅ2
＝〓ｅD
は、〓ｅ1に対しほぼ90゜進みのベルクトル〓ｅDとな
る。 FIG. 1 is an example of a circuit diagram of a conventional metal detector. In this figure, 1 is a high-frequency power source, and 2 is a transmitting coil, which is excited by the voltage e P from the high-frequency power source 1. 3
Reference numerals a and 3b are receiving coils, the connection point between the two is grounded, and is electromagnetically coupled to the transmitting coil 2, and an inspection line 4 through which the inspected object M passes is formed between the transmitting coil 2 and the transmitting coil 2. ing. When the object M to be inspected does not pass, or even if it passes but does not have metal, the receiving coil 3
Equal induced voltages 〓e 1 , 〓e 2 are generated at a and 3b. Reference numeral 5 designates a phase adjuster consisting of a variable resistor, etc., and a sliding piece 5a is grounded. When this is moved upward in FIG. 1, that is, toward the receiving coil 3a side, the parallel resistance on the receiving coil 3a side becomes smaller. As shown in the vector diagram in Figure 2, the phase of the induced voltage 〓e 1 advances to become 〓e' 1 , and the difference from the induced voltage 〓e 2 is 〓e' 1 -〓e 2
=〓e D
becomes Berctor 〓e D , which is approximately 90° ahead of 〓e 1 .
上記と反対方向に位相調整器５の摺動片５ａを
動かすと、誘起電圧〓ｅ2の位相が進んで〓ｅ′2とな
り、誘起電圧〓ｅ1との差〓ｅ′2−〓ｅ1＝〓ｅDとなり
、
〓ｅ2に対しほぼ90゜進みのベクトル〓ｅDとなる。６
は可変抵抗器等からなる振幅調整器で、６ａはそ
の摺動片であり、これを移動させることによつ
て、〓ｅ1−〓ｅ2＝〓ｅDの〓ｅ1と〓ｅ2をとり出す比
が変
る。例えば振幅調整器６の摺動片６ａを第１図で
上方側、すなわち受信コイル３ａ側に移動する
と、それまで〓ｅ1と〓ｅ2が平衡して０であつた出力
〓ｅDが〓ｅ1の出力の増加により第３図のベクトル図
に示すように〓ｅ1と同相で現われる。７は増幅器
であり、８ａ，８ｂは同期検波器、９は移相器で
ある。 When the sliding piece 5a of the phase adjuster 5 is moved in the opposite direction to the above, the phase of the induced voltage 〓e 2 advances to become 〓e' 2 , and the difference from the induced voltage 〓e 1 is 〓e' 2 −〓e 1 ＝〓e D ,
= A vector leading by approximately 90 degrees with respect to e 2 = e D. 6
is an amplitude adjuster consisting of a variable resistor, etc., and 6a is its sliding piece. By moving this, 〓e 1 -〓e 2 =〓e D〓e 1 and 〓e 2 The extraction ratio changes. For example, when the sliding piece 6a of the amplitude adjuster 6 is moved upward in FIG . As the output of e 1 increases, it appears in phase with e 1 as shown in the vector diagram of FIG. 7 is an amplifier, 8a and 8b are synchronous detectors, and 9 is a phase shifter.
このような構成の従来の金属検出器において
は、検査ライン４に被検査物Ｍを流さない状態
で、位相調整器５と振幅調整器６とを調整し、同
期検波器８ａ，８ｂから出力が出ないようにして
おき、次いで鉄の標準球を検査ライン４に流した
とき、受信コイル３ａを通過するときは誘起電圧
〓ｅ1が、また、受信コイル３ｂを通過するときは
誘起電圧〓ｅ2が増加するので、同期検波器８ａか
ら出力が得られる。したがつて、この場合は同期
検波器８ａの出力の有無からその金属検出器の動
作が正常かどうかが判別できる。 In the conventional metal detector having such a configuration, the phase adjuster 5 and the amplitude adjuster 6 are adjusted without the object to be inspected M flowing through the inspection line 4, and the output from the synchronous detectors 8a and 8b is adjusted. Then, when the iron standard ball is passed through the inspection line 4, the induced voltage 〓e 1 is generated when it passes through the receiving coil 3a, and the induced voltage 〓e 1 when it passes through the receiving coil 3b. 2 increases, an output is obtained from the synchronous detector 8a. Therefore, in this case, it can be determined from the presence or absence of the output of the synchronous detector 8a whether or not the metal detector is operating normally.
次に、ステンレスの標準球を検査ライン４に流
すと、この標準球の中を渦電流が流れることによ
りロスが生ずる。すなわち、標準球が通過する受
信コイル３ａまたは３ｂの抵抗成分が変化するの
で、位相調整器５を動かしたのと等価になり、こ
れにより出力〓ｅDが現われる。この出力は誘起電
圧〓ｅ1に対し90゜進んだベクトルであるので、同期
検波器８ｂから出力が得られる。したがつて、こ
の場合は同期検波器８ｂの出力の有無からその金
属検出器の動作が正常かどうかが判別できる。 Next, when a stainless steel standard ball is passed through the inspection line 4, an eddy current flows through the standard ball, causing a loss. That is, since the resistance component of the receiving coil 3a or 3b through which the standard sphere passes changes, this is equivalent to moving the phase adjuster 5, and as a result, the output 〓e D appears. Since this output is a vector advanced by 90 degrees with respect to the induced voltage 〓e1 , the output is obtained from the synchronous detector 8b. Therefore, in this case, it can be determined from the presence or absence of the output of the synchronous detector 8b whether or not the metal detector is operating normally.
上記の動作をまとめて示すと第４図、第５図の
ようになる。 The above operations are summarized as shown in FIGS. 4 and 5.
第４図は被検査物として、イに示すように鉄の
標準球MFeを検査ライン４に流したとき、同期検
波器８ａ，８ｂの出力をロとハに示したものであ
る。鉄の場合には同期検波器８ｂの出力は０であ
り、同期検波器８ｂの出力はその標準球MFeの速
度に応じた正弦波形となる。すなわち、受信コイ
ル３ａを通過中は〓ｅ1＞〓ｅ2となり、受信コイル３
ｂを通過中は〓ｅ1＜〓ｅ2となる。 FIG. 4 shows the outputs of the synchronous detectors 8a and 8b in (b) and (c) when a standard iron ball M Fe , as shown in (a), is passed through the inspection line 4 as an object to be inspected. In the case of iron, the output of the synchronous detector 8b is 0, and the output of the synchronous detector 8b has a sine waveform corresponding to the speed of the standard ball M Fe . That is, while passing through the receiving coil 3a, 〓e 1 >〓e 2 , and the receiving coil 3
While passing through b, 〓e 1 <〓e 2 .
また、第５図は被検査物としてイに示すように
ステンレスの標準球MSUSを検査ライン４に流し
たとき、同期検波器８ａ，８ｂの出力をロとハに
示したものである。ステンレスの場合には同期検
波器８ａの出力は０であり、同期検波器８ｂの出
力は標準球MSUSの速度に応じた正弦波形となる。
そして、受信コイル３ａを標準球MSUSが通過す
るときは、誘起電圧〓ｅ1の位相が進み、受信コイ
ル３ｂを標準球MSUSが通過するときは、誘起電
圧〓ｅ2の位相が進み、それぞれの周期検波信号は、
正、負の両極性の出力となる。 Moreover, FIG. 5 shows the outputs of the synchronous detectors 8a and 8b in (b) and (c) when a stainless steel standard ball M SUS as shown in (a) is passed through the inspection line 4 as an object to be inspected. In the case of stainless steel, the output of the synchronous detector 8a is 0, and the output of the synchronous detector 8b has a sine waveform corresponding to the speed of the standard sphere M SUS .
When the standard sphere M SUS passes through the receiving coil 3a, the phase of the induced voltage 〓e 1 advances, and when the standard sphere M SUS passes through the receiving coil 3b, the phase of the induced voltage 〓e 2 advances, Each periodic detection signal is
Outputs have both positive and negative polarity.
しかしながら、上記の従来の金属検出器では、
テストピースとして鉄およびステンレスの標準球
MFe，MSUSを人手により検査ライン４に流さなく
てはならない等の欠点があることは既述したとお
りである。 However, with the above conventional metal detector,
Iron and stainless steel standard balls as test pieces
As already mentioned, there are drawbacks such as the need to manually flow M Fe and M SUS into the inspection line 4.
この考案は、上述の欠点を解消するためになさ
れたもので、受信コイルの一方に閉ループの回路
を組み込んでおき、この閉ループの回路をスイツ
チにより開閉することで、テストピースを検査ラ
インに流したのと同等の位相変化または振幅変化
を出力に与えるようにして自己診断ができるよう
にしたものである。以下この考案について説明す
る。 This idea was made to eliminate the above-mentioned drawbacks. A closed loop circuit was built into one side of the receiving coil, and by opening and closing this closed loop circuit with a switch, the test piece was passed through the inspection line. It is possible to perform self-diagnosis by giving the output a phase change or amplitude change equivalent to that of the This idea will be explained below.
第６図はこの考案の一実施例を示すものであ
る。この図において、１０は閉ループ状の電気回
路で、送信コイル２と、受信コイル３ａとの相互
に結合された電磁界内で受信コイル３ａ側に設置
される。１１はスイツチであり、この閉成によつ
て電気回路１０は閉ループが形成される。１２は
同じく閉ループ状の電気回路で、これは受信コイ
ル３ｂ側に設けられる。１３は直流電源、１４は
スイツチであり、このスイツチ１４の閉成によつ
て直流電源１３から電気回路１２に電流が流れ
る。 FIG. 6 shows an embodiment of this invention. In this figure, reference numeral 10 denotes a closed-loop electric circuit, which is installed on the receiving coil 3a side within the electromagnetic field of the transmitting coil 2 and the receiving coil 3a, which are mutually coupled. 11 is a switch, and when this switch is closed, a closed loop is formed in the electric circuit 10. Reference numeral 12 denotes a closed-loop electric circuit, which is provided on the receiving coil 3b side. 13 is a DC power source, and 14 is a switch. When the switch 14 is closed, current flows from the DC power source 13 to the electric circuit 12.
次に動作について説明する。 Next, the operation will be explained.
今、スイツチ１１を投入して電気回路１０を閉
ループにすると、この閉ループに誘起電圧による
電流が流れてロスを発生する。これは受信コイル
３ａのインダクタンスを減少させたことになり、
丁度、ステンレス等の非鉄金属を検出したのと等
価となる。そのため、実際に検査ライン４にテス
トピースを流さないで、自己診断ができることに
なる。 Now, when the switch 11 is turned on and the electric circuit 10 is made into a closed loop, a current due to the induced voltage flows through this closed loop, causing a loss. This reduces the inductance of the receiving coil 3a,
This is equivalent to detecting non-ferrous metals such as stainless steel. Therefore, self-diagnosis can be performed without actually passing the test piece through the inspection line 4.
次にスイツチ１４を閉じると、直流電源１３か
ら電気回路１２に電流が流れる。この電流により
発生する磁界により受信コイル３ｂの磁界が増加
し、受信コイル３ｂのインダクタンスが増加した
ことになり、鉄を検出したのと等価となる。その
ため、この場合も実際に検査ライン４にテストピ
ースを流さないで、自己診断することができる。 Next, when the switch 14 is closed, current flows from the DC power supply 13 to the electric circuit 12. The magnetic field generated by this current increases the magnetic field of the receiving coil 3b, and the inductance of the receiving coil 3b increases, which is equivalent to detecting iron. Therefore, in this case as well, self-diagnosis can be performed without actually passing the test piece through the inspection line 4.
第７図はこの考案の他の実施例で、電気回路１
０のループ中に可変抵抗器１５を挿入したもので
ある。これにより誘導電流が制限されるため、受
信コイル３ａ，３ｂの誘起電圧の差が小さくな
り、等価的に小さな金属を検出したかのように作
用する。 FIG. 7 shows another embodiment of this invention, in which the electric circuit 1
A variable resistor 15 is inserted into the zero loop. Since the induced current is thereby limited, the difference between the induced voltages between the receiving coils 3a and 3b becomes small, and it acts as if equivalently a small metal was detected.
第８図はこの考案のさらに他の実施例で、電気
回路１２のループ中に可変抵抗器１５を挿入した
例である。この例で、直流電源１３の代りに高周
波電源を用い、可変抵抗器１５に代えて移相回路
を用いてもよい。 FIG. 8 shows still another embodiment of this invention, in which a variable resistor 15 is inserted into the loop of the electric circuit 12. In this example, a high frequency power source may be used instead of the DC power source 13, and a phase shift circuit may be used instead of the variable resistor 15.
第９図もこの考案の他の実施例を示すもので、
１６，１７は受信コイル３ａ，３ｂのシールド管
であり、これを電気回路１０，１２の代りに用い
たものである。 FIG. 9 also shows another embodiment of this invention.
16 and 17 are shield tubes for the receiving coils 3a and 3b, which are used in place of the electric circuits 10 and 12.
第１０図はこの考案の応用例を示すものであ
る。この例では、受信コイル３ａ，３ｂにループ
状の電気回路１０ａ，１０ｂと、スイツチ１１
ａ，１１ｂを設け、第１１図に示すように、実際
の金属が２つの受信コイル３ａ，３ｂを通過する
のと同じタイミングでスイツチ１１ａをオンと
し、次にスイツチ１１ｂをオンとすれば、出力と
して第１１図のハに示すような波形が得られる。 FIG. 10 shows an example of application of this invention. In this example, loop-shaped electric circuits 10a and 10b are connected to the receiving coils 3a and 3b, and a switch 11 is connected to the receiving coils 3a and 3b.
a, 11b, and as shown in FIG. 11, if the switch 11a is turned on at the same timing as the actual metal passes through the two receiving coils 3a, 3b, and then the switch 11b is turned on, the output will be As a result, a waveform as shown in FIG. 11C is obtained.
なお、上記の実施例では閉ループ状の電気回路
１０，１２等を受信コイル３ａ，３ｂの内側に設
けたが、これは送信コイル２と受信コイル３ａま
たは３ｂの結合された電磁界内であればどこでも
よい。また、受信コイル３ａ，３ｂのうち少なく
とも一方に閉ループ状の電気回路を設ければよ
い。さらに、スイツチ１１，１４等は機械的スイ
ツチ、リレー等の外、アナログスイツチ、トラン
ジスタなど電子的なものも使用しうることは云う
までもない。また、直流電源１３にかえ、交流電
源のほか、高周波電源１を共用してもよい。 In the above embodiment, the closed-loop electric circuits 10, 12, etc. were provided inside the receiving coils 3a, 3b, but this is possible if the closed-loop electric circuits 10, 12, etc. are within the electromagnetic field where the transmitting coil 2 and receiving coil 3a or 3b are coupled. Anywhere is fine. Further, a closed loop electric circuit may be provided in at least one of the receiving coils 3a and 3b. Furthermore, it goes without saying that the switches 11, 14, etc. may be not only mechanical switches and relays, but also electronic switches such as analog switches and transistors. Further, instead of the DC power supply 13, the high frequency power supply 1 may be used in common in addition to an AC power supply.
以上詳細に説明したように、この考案は受信コ
イルの少なくとも一方の送信コイルと結合する電
磁界内に閉ループ状の電気回路を設け、この電気
回路を電源を介して、または介さずに閉ループを
形成させるスイツチを設けたので、スイツチの開
閉のみで、実際に検査ラインにテストピースを流
すことなく金属検出器の動作の良、不良を自己診
断することができる。そして、閉ループ状の電気
回路の直列抵抗や印加電圧を変化させ受信コイル
のインダクタンスを増加または減少させることに
より、検出感度の確認を容易に行うことができ
る。さらに、スイツチとして半導体スイツチ等を
用いることにより、高速な診断が可能であり、実
際の被検査物の検査中のわずかのあき時間を利用
して自動診断を行うことができる。かように、こ
の考案によれば、実際にテストピースを流すこと
なく、金属検出器の動作の良、不良を診断でき、
しかも自動化無人化で行えるため高い信頼度で行
える利点がある。 As explained in detail above, this invention provides a closed-loop electrical circuit within the electromagnetic field that couples the receiving coil with at least one of the transmitting coils, and forms a closed-loop electrical circuit with or without a power source. By simply opening and closing the switch, it is possible to self-diagnose whether the metal detector is working well or not, without actually running a test piece through the inspection line. The detection sensitivity can be easily confirmed by increasing or decreasing the inductance of the receiving coil by changing the series resistance of the closed-loop electric circuit or the applied voltage. Furthermore, by using a semiconductor switch or the like as the switch, high-speed diagnosis is possible, and automatic diagnosis can be performed using a small amount of idle time during the actual inspection of the object to be inspected. In this way, according to this invention, it is possible to diagnose whether a metal detector is working properly or poorly without actually running a test piece.
Moreover, it has the advantage of being highly reliable because it can be done automatically and unmanned.
第１図は従来の金属検出器の一例を示す回路
図、第２図、第３図は第１図の回路の動作を説明
するためのベクトル図、第４図、第５図は同じく
第１図の回路の動作を説明するための送、受信コ
イルの配置と出力波形を示す図、第６図はこの考
案の一実施例を示す構成略図、第７図、第８図、
第９図はそれぞれこの考案の他の実施例を示す構
成略図、第１０図はこの考案の応用例を示す構成
略図、第１１図は第１０図の応用例の動作説明の
ための要部の波形図である。
図中、１は高周波電源、２は送信コイル、３
ａ，３ｂは受信コイル、４は検査ライン、５は位
相調整器、６は振幅調整器、７は増幅器、８ａ，
８ｂは同期検波器、９は移相器、１０，１２は閉
ループ状の電気回路、１１，１４はスイツチ、１
３は直流電源である。
Fig. 1 is a circuit diagram showing an example of a conventional metal detector, Figs. 2 and 3 are vector diagrams for explaining the operation of the circuit in Fig. 1, and Figs. A diagram showing the arrangement of transmitting and receiving coils and output waveforms to explain the operation of the circuit shown in the figure, FIG. 6 is a schematic diagram of the configuration showing one embodiment of this invention, FIGS. 7 and 8,
Fig. 9 is a schematic diagram showing the configuration of another embodiment of this invention, Fig. 10 is a schematic diagram of the arrangement showing an applied example of this invention, and Fig. 11 is a schematic diagram of the main part for explaining the operation of the applied example of Fig. 10. FIG. In the figure, 1 is a high frequency power supply, 2 is a transmitting coil, and 3
a, 3b are receiving coils, 4 is an inspection line, 5 is a phase adjuster, 6 is an amplitude adjuster, 7 is an amplifier, 8a,
8b is a synchronous detector, 9 is a phase shifter, 10 and 12 are closed-loop electric circuits, 11 and 14 are switches, 1
3 is a DC power supply.
Claims (1)
コイルの電磁界内に被検査物が流れる検査ライン
をはさんで設置された２つの受信コイルと、この
２つの受信コイルの両出力信号の差の出力信号を
前記交流信号と同期した信号で同期検波する同期
検波器とからなる金属検出器において：前記受信
コイルの少なくとも一方の前記送信コイルと結合
する電磁界内に、この受信コイルのインダクタン
スを増加または減少させるための閉ループ状の電
気回路を設け、さらにこの電気回路の閉ループを
閉開するスイツチを設けたことを特徴とする金属
検出器の自己診断回路。 A transmitting coil driven by an alternating current signal, two receiving coils installed across the inspection line in which the test object flows within the electromagnetic field of this transmitting coil, and the difference between the output signals of these two receiving coils. In a metal detector comprising a synchronous detector that synchronously detects an output signal with a signal synchronized with the alternating current signal: increasing the inductance of the receiving coil in an electromagnetic field coupled with at least one of the transmitting coils; 1. A self-diagnosis circuit for a metal detector, characterized in that a closed-loop electric circuit is provided to reduce or reduce the amount of metal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14716182U JPS5953292U (en) | 1982-09-30 | 1982-09-30 | Metal detector self-diagnosis circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14716182U JPS5953292U (en) | 1982-09-30 | 1982-09-30 | Metal detector self-diagnosis circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5953292U JPS5953292U (en) | 1984-04-07 |
| JPH0125347Y2 true JPH0125347Y2 (en) | 1989-07-28 |
Family
ID=30327337
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14716182U Granted JPS5953292U (en) | 1982-09-30 | 1982-09-30 | Metal detector self-diagnosis circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5953292U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019203782A (en) * | 2018-05-23 | 2019-11-28 | 株式会社島津製作所 | Magnetic substance inspection apparatus |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6392571U (en) * | 1986-12-04 | 1988-06-15 | ||
| JP2011237287A (en) * | 2010-05-11 | 2011-11-24 | Eminet Co Ltd | Metal detecting device |
| JP5466994B2 (en) * | 2010-05-11 | 2014-04-09 | 一般財団法人雑賀技術研究所 | Metal detector |
| JP5819627B2 (en) * | 2011-04-11 | 2015-11-24 | 国立大学法人豊橋技術科学大学 | Method for detecting magnetic metallic foreign matter and apparatus therefor |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54123989A (en) * | 1978-03-17 | 1979-09-26 | Sumitomo Metal Ind | Method of inspecting sensitivity of magnetismmsensitive element of magnetic flaw detector |
-
1982
- 1982-09-30 JP JP14716182U patent/JPS5953292U/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54123989A (en) * | 1978-03-17 | 1979-09-26 | Sumitomo Metal Ind | Method of inspecting sensitivity of magnetismmsensitive element of magnetic flaw detector |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019203782A (en) * | 2018-05-23 | 2019-11-28 | 株式会社島津製作所 | Magnetic substance inspection apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5953292U (en) | 1984-04-07 |
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