JPS6335946B2 - - Google Patents

Info

Publication number
JPS6335946B2
JPS6335946B2 JP57169646A JP16964682A JPS6335946B2 JP S6335946 B2 JPS6335946 B2 JP S6335946B2 JP 57169646 A JP57169646 A JP 57169646A JP 16964682 A JP16964682 A JP 16964682A JP S6335946 B2 JPS6335946 B2 JP S6335946B2
Authority
JP
Japan
Prior art keywords
phase
amplitude
induced voltage
inspection line
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57169646A
Other languages
Japanese (ja)
Other versions
JPS5960278A (en
Inventor
Masahiro Tarui
Fujio Kamata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP57169646A priority Critical patent/JPS5960278A/en
Publication of JPS5960278A publication Critical patent/JPS5960278A/en
Publication of JPS6335946B2 publication Critical patent/JPS6335946B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V13/00Manufacturing, calibrating, cleaning, or repairing instruments or devices covered by groups G01V1/00 – G01V11/00

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Geophysics And Detection Of Objects (AREA)

Description

【発明の詳細な説明】 この発明は、金属検出コイルの動作、感度の確
認をテストピースを実際に流すことなく実施でき
るようにした自己診断式金属検出器に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a self-diagnostic metal detector that allows confirmation of the operation and sensitivity of a metal detection coil without actually running a test piece through it.

従来、金属検出器は正しく動作しているか、あ
るいは必要な感度で金属片が検知できるようにな
つているかなどの確認は、テスト用のピースとし
て鉄またはステンレスの標準球を検査ラインに人
手により流して確認を行つていた。しかし、この
方法ではその都度生産ラインを停止させ、人が操
作しなければ確認できないため、生産がストツプ
したり、人手が必要であつた。また、異物混入の
発見を目的とするのに、検出感度が不足した場合
は、不良品がそのま、良品として流れてしまうと
同時に、この障害の発見が困難で、安全側に動作
するとは限らない欠点があつた。
Traditionally, to check whether a metal detector is working properly or whether it can detect metal pieces with the required sensitivity, a standard iron or stainless steel ball is manually run through an inspection line as a test piece. I was checking. However, with this method, the production line must be stopped each time, and confirmation cannot be made without human intervention, resulting in production stoppages and the need for human intervention. Furthermore, if the detection sensitivity is insufficient even though the purpose is to detect foreign matter contamination, defective products will be passed on as good products, and at the same time, it will be difficult to detect this fault, and operation may not always be safe. It had some flaws.

上記従来例をさらに図面により説明する。 The above conventional example will be further explained with reference to the drawings.

第1図は従来の金属検出器の回路図の一例であ
る。この図で、1は高周波電源、2は送信コイル
で、高周波電源1から電圧e〓pで励振される。3
a,3bは受信コイルで、両者の接続点は接地さ
れており、送信コイル2と電磁的に結合してお
り、かつ送信コイル2との間に被検査物Mの通る
検査ライン4が形成されている。そして、被検査
物Mが通過しないときには、受信コイル3a,3
bには等しい誘起電圧e〓1,e〓2が発生する。5は可
変抵抗器等からなる位相調整器で、摺動片5aは
接地され、これを第1図で上方側、すなわち、受
信コイル3a側に移動すると受信コイル3a側の
並列抵光が小さくなり、第2図のベクトル図に示
すように、誘起電圧e〓1の位相が進んでe〓′1となり、
誘起電圧e〓2との差e〓′1−e〓2=e〓Dは、e〓1に対し
ほぼ90゜
進みのベクトルe〓Dとなる。
FIG. 1 is an example of a circuit diagram of a conventional metal detector. In this figure, 1 is a high-frequency power source, 2 is a transmitting coil, and is excited by a voltage e〓p from the high-frequency power source 1. 3
Reference numerals a and 3b are receiving coils, and the connection point between the two is grounded and electromagnetically coupled to the transmitting coil 2, and an inspection line 4 through which the inspected object M passes is formed between the transmitting coil 2 and the transmitting coil 2. ing. When the inspected object M does not pass, the receiving coils 3a, 3
Equal induced voltages e〓 1 and e〓 2 are generated at b. 5 is a phase adjuster consisting of a variable resistor, etc., and the sliding piece 5a is grounded, and when this is moved upward in FIG. 1, that is, toward the receiving coil 3a side, the parallel resistance on the receiving coil 3a side becomes smaller. , as shown in the vector diagram in Figure 2, the phase of the induced voltage e〓 1 advances to become e〓′ 1 ,
The difference e〓′ 1 −e〓 2 = e〓 D from the induced voltage e〓 2 becomes a vector e〓 D that leads e〓 1 by approximately 90°.

上記と反対方向に位相調整器5の摺動片5aを
動かすと、誘起電圧e〓2の位相が進んでe〓′2となり、
誘起電圧e〓1との差e〓′2−e〓1=e〓Dとなり、e〓2
対しほ
ぼ90゜進みのベクトルe〓Dとなる。6は可変抵抗器
等からなる振幅調整器で、6aはその摺動片であ
り、これを移動させることによつて、e〓1−e〓2=e〓D
のe〓1とe〓2をとり出す比が変る。例えば振幅調整器
6の摺動片6aを第1図で上方側、すなわち受信
コイル3a側に移動すると、それまでe〓1とe〓2が平
衝して0であつた出力e〓Dが、e〓1の出力の増加によ
り第3図のベクトル図に示すようにe〓1と同相で現
われる。7は増幅器であり、8a,8bは同期検
波器、9は移相器である。
When the sliding piece 5a of the phase adjuster 5 is moved in the opposite direction to the above, the phase of the induced voltage e〓 2 advances and becomes e〓' 2 ,
The difference from the induced voltage e〓 1 is e〓′ 2 −e〓 1 = e〓 D , and the vector e〓 D leads e〓 2 by approximately 90°. 6 is an amplitude adjuster consisting of a variable resistor, etc., and 6a is its sliding piece, and by moving this, e〓 1 −e〓 2 = e〓 D
The ratio of extracting e〓 1 and e〓 2 changes. For example , when the sliding piece 6a of the amplitude adjuster 6 is moved upward in FIG . , e〓 1 appears in phase with e〓 1 as shown in the vector diagram of Fig. 3 due to an increase in the output thereof. 7 is an amplifier, 8a and 8b are synchronous detectors, and 9 is a phase shifter.

このような構成の従来の金属検出器において
は、検査ライン4に被検査物Mを流さない状態
で、位相調整器5と振幅調整器6とを調整し、同
期検波器8a,8bから出力が出ないようにして
おき、次いで鉄の標準球を検査ライン4に流した
とき、受信コイル3aを通過するときは誘起電圧
e〓1が、また、受信コイル3bを通過するときは誘
起電圧e〓2が増加するので、同期検波器8aから出
力が得られる。したがつて、この場合は同期検波
器8aの出力の有無からその金属検出器の動作が
正常かどうかが判別できる。
In the conventional metal detector having such a configuration, the phase adjuster 5 and the amplitude adjuster 6 are adjusted without the object to be inspected M flowing through the inspection line 4, and the output from the synchronous detectors 8a and 8b is adjusted. Then, when the iron standard ball is passed through the inspection line 4, the induced voltage will be generated when it passes through the receiving coil 3a.
When e〓 1 also passes through the receiving coil 3b, the induced voltage e〓 2 increases, so that an output is obtained from the synchronous detector 8a. Therefore, in this case, it can be determined from the presence or absence of the output of the synchronous detector 8a whether or not the metal detector is operating normally.

次に、ステンレスの標準球を検査ライン4に流
すと、この標準球の中を渦電流が流れることによ
りロスが生ずる。すなわち、標準球が通過する受
信コイル3aまたは3bの抵抗成分が変化するの
で、位相調整器5を動かしたのと等価になり、こ
れにより出力e〓Dが現われる。この出力は誘起電圧
e〓1に対し90゜進んだベクトルであるので、同期検
波器8bから出力が得られる。したがつて、この
場合は同期検波器8bの出力の有無からその金属
検出器の動作が正常かどうかが判別できる。
Next, when a stainless steel standard ball is passed through the inspection line 4, an eddy current flows through the standard ball, causing a loss. That is, since the resistance component of the receiving coil 3a or 3b through which the standard sphere passes changes, this is equivalent to moving the phase adjuster 5, and as a result, the output e〓D appears. This output is the induced voltage
Since it is a vector advanced by 90 degrees with respect to e〓1 , an output is obtained from the synchronous detector 8b. Therefore, in this case, it can be determined from the presence or absence of the output of the synchronous detector 8b whether or not the metal detector is operating normally.

上記の動作をまとめて示すと第4図、第5図の
ようになる。
The above operations are summarized as shown in FIGS. 4 and 5.

第4図は被検査物としてイに示すように鉄の標
準球MFeを検査ライン4に流したとき、同期検波
器8a,8bの出力をロとハに示したものであ
る。鉄の場合には同期検波器8bの出力は0であ
り、同期検波器8aの出力はその標準球MFeの速
度に応じた正弦波形となる。すなわち、受信コイ
ル3aを通過中はe〓1>e〓2となり、受信コイル3b
を通過中はe〓1<e〓2となる。
FIG . 4 shows the outputs of the synchronous detectors 8a and 8b, shown in FIG. In the case of iron, the output of the synchronous detector 8b is 0, and the output of the synchronous detector 8a has a sine waveform corresponding to the speed of the standard ball M Fe . That is, while passing through the receiving coil 3a, e〓 1 > e〓 2 , and the receiving coil 3b
While passing through, e〓 1 < e〓 2 .

また、第5図は被検査物としてイに示すように
ステンレスの標準球MSUSを検査ライン4に流し
たとき、同期検波器8a,8bの出力をロとハに
示したものである。ステンレスの場合には同期検
波器8aの出力は0であり、同期検波器8bの出
力は標準球MSUSの速度に応じた正弦波形となる。
そして、受信コイル3aを標準球MSUSが通過す
るときは、誘起電圧e〓1の位相が進み、受信コイル
3bを標準球MSUSが通過するときは、誘起電圧e〓2
の位相が進み、それぞれの同期検波信号は、正、
負の両極性の出力となる。
Moreover, FIG. 5 shows the outputs of the synchronous detectors 8a and 8b in (b) and (c) when a stainless steel standard ball M SUS as shown in (a) is passed through the inspection line 4 as an object to be inspected. In the case of stainless steel, the output of the synchronous detector 8a is 0, and the output of the synchronous detector 8b has a sine waveform corresponding to the speed of the standard sphere M SUS .
When the standard sphere M SUS passes through the receiving coil 3a, the phase of the induced voltage e〓 1 advances, and when the standard sphere M SUS passes through the receiving coil 3b, the induced voltage e〓 2
The phase of is advanced, and each synchronous detection signal is positive,
Output with negative polarity.

しかしながら、上記の従来の金属検出器では、
テストピースとして鉄およびステンレスの標準球
MFe,MSUSを人手により検査ライン4に流さなく
てはならない等の欠点があることは既述したとお
りである。
However, with the above conventional metal detector,
Iron and stainless steel standard balls as test pieces
As already mentioned, there are drawbacks such as the need to manually flow M Fe and M SUS into the inspection line 4.

この発明は、上述の欠点を解消するためになさ
れたもので、金属検出コイルの受信コイルに鉄ま
たは非鉄金属が検知された場合と等価な位相変化
を与える回路をあらかじめ設けておき、スイツチ
によりこれを選択して位相変化や振幅変化を受信
コイルに与え、テストピースを検査ラインに流す
ことなく、金属検出器の動作および検出感度の確
認診断を行えるようにしたものであり、生産ライ
ンを停止することなく高速で鉄または非鉄金属そ
れぞれの検出を、その感度まで自動的に診断でき
るようにした金属検出器を提供することを目的と
する。以下図面によりこの発明を説明する。
This invention was made in order to eliminate the above-mentioned drawbacks.A circuit is provided in advance to give a phase change equivalent to that when ferrous or non-ferrous metal is detected in the receiving coil of the metal detection coil, and this is changed by a switch. By applying phase changes and amplitude changes to the receiving coil by selecting the To provide a metal detector capable of automatically diagnosing the detection of ferrous or non-ferrous metals at high speed and sensitivity without any trouble. The present invention will be explained below with reference to the drawings.

第6図はこの発明の一実施例を示す回路図であ
る。この図で第1図と同一符号は同じものを示し
ており、10a,10bはバンドパスフイルタで
同期検波器8a,8bの後段にそれぞれ設けられ
る。S1,S2はスイツチの接片で、閉成時に抵抗器
R1,R2をそれぞれ受信コイル3a,3bに並列
に接続する。S3,S4もスイツチの接片で、閉成時
に抵抗器R3,R4をそれぞれ振幅調整器6の摺動
片6aと両端との間に並列に接続する。なお、1
1は位相変化回路、12は振幅変化回路を示す。
FIG. 6 is a circuit diagram showing an embodiment of the present invention. In this figure, the same reference numerals as in FIG. 1 indicate the same elements, and 10a and 10b are band pass filters provided after the synchronous detectors 8a and 8b, respectively. S 1 and S 2 are the contact pieces of the switch, which connect the resistor when closed.
R 1 and R 2 are connected in parallel to receiving coils 3a and 3b, respectively. S 3 and S 4 are also contact pieces of the switch, and when closed, resistors R 3 and R 4 are respectively connected in parallel between the sliding piece 6a of the amplitude regulator 6 and both ends thereof. In addition, 1
1 represents a phase change circuit, and 12 represents an amplitude change circuit.

次に第6図の実施例の動作を第7図と第8図を
参照して説明する。
Next, the operation of the embodiment shown in FIG. 6 will be explained with reference to FIGS. 7 and 8.

まず、位相調整器5側に設けた接片S1を閉成す
ると、誘起電圧e〓1側の位相が位相変化回路11中
の抵抗器R1の抵抗値に応じただけ進み、また、
接片S1が開き接片S2が閉じると、抵抗器R2の抵
抗値に応じただけ誘起電圧e〓2の位相が進み、第2
図に示したベクトルのように出力e〓Dが得られるた
め、検査ライン4にステンレスの標準球MSUS
流した場合と同じ信号が得られる。各部の波形は
第7図のイ〜ニに示すようになる。
First, when the contact piece S 1 provided on the phase adjuster 5 side is closed, the phase of the induced voltage e 〓 1 side advances by an amount corresponding to the resistance value of the resistor R 1 in the phase change circuit 11, and
When the contact piece S 1 opens and the contact piece S 2 closes, the phase of the induced voltage e〓 2 advances by an amount corresponding to the resistance value of the resistor R 2 , and the second
Since the output e〓 D is obtained as shown in the vector shown in the figure, the same signal as when the stainless steel standard ball M SUS is passed through the inspection line 4 is obtained. The waveforms of each part are as shown in A to D of FIG.

次に、接片S3を閉じると振幅変化回路12中の
抵抗器R3の抵抗値に応じた分だけ誘起電圧e〓1
振幅が大きくなり、出力e〓Dは第3図に示すように
誘起電圧e〓1の方向の電圧となる。また、接片S3
開き接片S4が閉じると、前記とは逆に誘起電圧e〓2
と同じ方向の出力e〓Dが得られる。したがつて、検
査ライン4を鉄の標準球MFeを流した場合と同じ
信号が得られる。この場合の各部の波形を第8図
に示す。
Next, when the contact piece S3 is closed, the amplitude of the induced voltage e〓1 increases by an amount corresponding to the resistance value of the resistor R3 in the amplitude change circuit 12, and the output e〓D becomes as shown in Fig. 3. The induced voltage e 〓 is the voltage in the direction of 1 . Moreover, when the contact piece S 3 opens and the contact piece S 4 closes, the induced voltage e〓 2
The output e〓 D in the same direction as is obtained. Therefore, the same signal as when the iron standard ball M Fe is passed through the inspection line 4 can be obtained. The waveforms of each part in this case are shown in FIG.

第9図はこの発明の他の実施例を示すもので、
その動作説明のための要部の波形を第10図と第
11図に示す。
FIG. 9 shows another embodiment of this invention,
Waveforms of essential parts for explaining the operation are shown in FIGS. 10 and 11.

第9図の実施例は、第6図の実施例における接
片S3,S4を1個の接片S5に、また、接片S3,S4
1個の接片S6にしたものである。位相変化回路1
1としては抵抗器R5,R6,R7が直列に接続され、
それぞれの接続点に接点a,bが設けられ、この
接点a,bに接片S5が切り換えにより接続される
ように構成されている。振幅変化回路12も同様
に、抵抗器R8,R9,R10と、接点a,bにより構
成され、これにスイツチの接片S6が設けられる。
In the embodiment of FIG. 9, the contact pieces S 3 and S 4 in the embodiment of FIG. 6 are combined into one contact piece S 5 , and the contact pieces S 3 and S 4 are combined into one contact piece S 6 . This is what I did. Phase change circuit 1
1, resistors R 5 , R 6 , R 7 are connected in series,
Contacts a and b are provided at each connection point, and the contact piece S5 is connected to these contacts a and b by switching. Similarly, the amplitude change circuit 12 is composed of resistors R 8 , R 9 , R 10 and contacts a and b, to which a switch contact piece S 6 is provided.

次に動作について説明する。まず、接片S5が第
9図に示すように接点bに接触しているときは、
e〓1=e〓2となるように、すなわち、誘起電圧e〓1とe
2
が位相と振幅がともに同一の状態になるように、
また、接片S5が接点aに切り換わつたときは、誘
起電圧e〓1の位相が進むように抵抗器R5〜R7の値
が選定される。接片S5が接点aに接触している時
間は、標準球MFeまたはMSUSが受信コイル3aま
たは3bの1つを通過するのにほぼ等しい値に選
んでおく。この時の同期検波器8bからの出力は
第10図のハに示すように方形波となるが、バン
ドパスフイルタ10bを通すことにより直流分が
カツトされ、方形波の約半分の振幅の交流波形が
ニのように得られる。したがつて、交流波形ニの
振幅が標準球MSUSの検出と同じ値になるように
抵抗器R5〜R7の値を選ぶことにより、第6図の
実施例の接片S1,S2を1個の接片S5によつて同等
な作用をさせることができる。
Next, the operation will be explained. First, when contact piece S5 is in contact with contact point b as shown in Fig. 9,
e〓 1 = e〓 2 , that is, the induced voltage e〓 1 and e
2
so that both phase and amplitude are the same,
Further, when the contact piece S5 is switched to the contact point a, the values of the resistors R5 to R7 are selected so that the phase of the induced voltage e〓1 advances. The time during which the contact piece S5 is in contact with the contact point a is selected to be approximately equal to the time required for the standard sphere M Fe or M SUS to pass through one of the receiving coils 3a or 3b. The output from the synchronous detector 8b at this time becomes a square wave as shown in Fig. 10C, but the DC component is cut off by passing through the bandpass filter 10b, resulting in an AC waveform with approximately half the amplitude of the square wave. is obtained like d. Therefore, by selecting the values of the resistors R 5 to R 7 so that the amplitude of the AC waveform D becomes the same value as that detected by the standard sphere M SUS , the contact pieces S 1 and S of the embodiment shown in FIG. 2 can be made to have the same effect with one contact piece S5 .

次に、接片S6を接点aに切り換えた場合の要部
の出力波形を第11図に示す。すなわち、この場
合には、鉄の標準球MFeを検査ライン4に流した
場合と全く同等の診断を行うことができる。
Next, FIG. 11 shows the output waveform of the main part when the contact piece S6 is switched to the contact point a. That is, in this case, it is possible to perform a diagnosis that is exactly the same as when the iron standard ball M Fe is passed through the inspection line 4.

なお、前記各実施例における位相変化回路11
および振幅変化回路12における調整手段は抵抗
器のみに限定されず、他のインピーダンス素子を
用いることもできる。また、自己診断のための動
作は、被検査物Mが検査ライン4を通過したあと
次の被検査物Mが到着するまでの間に行うように
すれば、常時自己診断を生産ラインを止めること
なく行うことができる。この時、自己診断時に生
じる筈の検出信号が検知されない場合は検査ライ
ン4を停止するか被検査物Mを不良と判断するよ
うにすれば金属検出装置の故障によつて不良品が
流れるということも未然に防止することができ
る。
Note that the phase change circuit 11 in each of the above embodiments
The adjustment means in the amplitude change circuit 12 is not limited to resistors, and other impedance elements may also be used. In addition, if the operation for self-diagnosis is performed after the inspected object M passes through the inspection line 4 and until the next inspected object M arrives, the production line can be constantly stopped for self-diagnosis. It can be done without. At this time, if the detection signal that is supposed to be generated during self-diagnosis is not detected, the inspection line 4 can be stopped or the inspected object M can be determined to be defective, which will prevent defective products from flowing due to a failure of the metal detection device. can also be prevented.

以上詳細に説明したように、この発明は従来の
金属検出器において、2つの受信コイルの少なく
とも一方の誘起電圧の位相を変化させる位相変化
回路と、これを開閉するスイツチを設けたので、
位相変化回路を動作させたときは検査ラインに非
鉄金属の標準球が流れたのと同等の位相変化を上
記受信コイルの誘起電圧に与えることができる。
また、同じく2つの受信コイルの少なくとも一方
の誘起電圧の振幅を変化させる振幅変化回路と、
これを開閉するスイツチを設けたので、振幅変化
回路を動作させたときは検査ラインに鉄の標準球
が流れたのと同等の振幅変化を上記受信コイルの
誘起電圧に与えることができる。このため、従来
人手により行つていた動作確認を自動化すること
ができるばかりでなく、金属検出器自体の感度の
低下も直ちに判別することができる。さらに、自
動的に自己診断することが可能なため、被検査物
と被検査物との間の時間を利用して高速にスイツ
チグのみで診断を行うことができる等の優れた効
果がある。
As explained in detail above, the present invention provides a conventional metal detector with a phase change circuit that changes the phase of the induced voltage in at least one of the two receiving coils, and a switch that opens and closes the circuit.
When the phase change circuit is operated, it is possible to apply a phase change to the induced voltage of the receiving coil, which is equivalent to when a non-ferrous metal standard bulb flows through the inspection line.
Further, an amplitude change circuit that similarly changes the amplitude of the induced voltage of at least one of the two receiving coils;
Since a switch is provided to open and close this, when the amplitude change circuit is operated, it is possible to give an amplitude change to the induced voltage in the receiving coil that is equivalent to when a standard iron ball flows through the inspection line. Therefore, it is not only possible to automate the operation check that was conventionally performed manually, but also to immediately detect a decrease in the sensitivity of the metal detector itself. Furthermore, since self-diagnosis can be performed automatically, there are excellent effects such as the ability to perform diagnosis at high speed by just switching by utilizing the time between the objects to be inspected.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の金属検出器の一例を示す回路
図、第2図、第3図は第1図の回路の動作を説明
するためのベクトル図、第4図、第5図は同じく
第1図の回路の動作を説明するための送信コイル
を受信コイルの配置と出力波形を示す図、第6図
はこの発明の一実施例を示す回路図、第7図、第
8図は第6図の実施例の動作を説明するための要
部の波形図、第9図はこの発明の他の実施例を示
す回路図、第10図、第11図は第9図の実施例
の動作を説明するための要部の波形図である。 図中、1は高周波電源、2は送信コイル、3
a,3bは受信コイル、4は検査ライン、5は位
相調整器、5aは摺動片、6は振幅調整器、7は
増幅器、8a,8bは同期検波器、9は移相器、
10a,10bはバンドパスフイルタ、11は位
相変化回路、12は振幅変化回路、S1〜S6は接
片、a,bは接点、R1〜R9は抵抗器、MFeは鉄
の標準球、MSUSはステンレスの標準球である。
Fig. 1 is a circuit diagram showing an example of a conventional metal detector, Figs. 2 and 3 are vector diagrams for explaining the operation of the circuit in Fig. 1, and Figs. 6 is a circuit diagram showing an embodiment of the present invention, and FIGS. FIG. 9 is a circuit diagram showing another embodiment of the present invention, and FIGS. 10 and 11 explain the operation of the embodiment of FIG. 9. FIG. In the figure, 1 is a high frequency power supply, 2 is a transmitting coil, and 3
a, 3b are receiving coils, 4 is an inspection line, 5 is a phase adjuster, 5a is a sliding piece, 6 is an amplitude adjuster, 7 is an amplifier, 8a, 8b is a synchronous detector, 9 is a phase shifter,
10a and 10b are band pass filters, 11 is a phase change circuit, 12 is an amplitude change circuit, S 1 to S 6 are contact pieces, a and b are contacts, R 1 to R 9 are resistors, and M Fe is an iron standard. The ball, M SUS , is a standard stainless steel ball.

Claims (1)

【特許請求の範囲】[Claims] 1 交流信号で駆動される送信コイルと、この送
信コイルの電磁界内に被検査物が流れる検査ライ
ンをはさんで配置された2つの受信コイルと、こ
の2つの受信コイルの両出力信号の差の出力信号
を前記交流信号と同期し、かつ、位相がほぼ90゜
異なる2つの同期検波信号によつて同期検波する
2つの同期検波器とからなる金属検出器におい
て;前記受信コイルの少なくとも一方の誘起電圧
の位相を非鉄金属の標準球が前記検査ラインを通
過したとき生ずる位相差と同等だけ変化させる位
相変化回路と;この位相変化回路を開閉する第1
のスイツチと;前記受信コイルの少なくとも一方
の誘起電圧の振幅を鉄の標準球が前記検査ライン
を通過したとき生ずる振幅差と同等だけ変化させ
る振幅変化回路と;この振幅変化回路を開閉する
第2のスイツチとを備え、前記第1、及び第2の
スイツチは被検査体が通過した後であつて、か
つ、次の被検査体が到着する前に開閉制御される
ことを特徴とする自己診断式金属検出器。
1 A transmitting coil driven by an AC signal, two receiving coils placed across the inspection line in which the test object flows within the electromagnetic field of this transmitting coil, and the difference between the output signals of these two receiving coils. In a metal detector comprising two synchronous detectors that synchronize the output signal of the AC signal with the AC signal and synchronously detect the output signal using two synchronous detection signals having a phase difference of approximately 90°; a phase change circuit that changes the phase of the induced voltage by an amount equivalent to the phase difference that occurs when a non-ferrous metal standard ball passes the inspection line; a first phase change circuit that opens and closes this phase change circuit;
an amplitude changing circuit that changes the amplitude of the induced voltage in at least one of the receiving coils by an amount equivalent to the amplitude difference that occurs when an iron standard ball passes the inspection line; a second amplitude changing circuit that opens and closes this amplitude changing circuit; and a switch, wherein the first and second switches are controlled to open and close after the object to be inspected has passed and before the next object to be inspected arrives. type metal detector.
JP57169646A 1982-09-30 1982-09-30 Self-diagnostic metal detector Granted JPS5960278A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57169646A JPS5960278A (en) 1982-09-30 1982-09-30 Self-diagnostic metal detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57169646A JPS5960278A (en) 1982-09-30 1982-09-30 Self-diagnostic metal detector

Publications (2)

Publication Number Publication Date
JPS5960278A JPS5960278A (en) 1984-04-06
JPS6335946B2 true JPS6335946B2 (en) 1988-07-18

Family

ID=15890334

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57169646A Granted JPS5960278A (en) 1982-09-30 1982-09-30 Self-diagnostic metal detector

Country Status (1)

Country Link
JP (1) JPS5960278A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0248848U (en) * 1988-09-29 1990-04-04

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011237287A (en) * 2010-05-11 2011-11-24 Eminet Co Ltd Metal detecting device
JP6950931B2 (en) * 2017-06-12 2021-10-13 日新電子工業株式会社 Metal detector and diagnostic method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5047684A (en) * 1973-08-14 1975-04-28

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5820944Y2 (en) * 1978-08-10 1983-05-02 電測工業株式会社 Display device for balancing metal detectors

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5047684A (en) * 1973-08-14 1975-04-28

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0248848U (en) * 1988-09-29 1990-04-04

Also Published As

Publication number Publication date
JPS5960278A (en) 1984-04-06

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