JPH01250702A - Apparatus for measuring straightness - Google Patents

Apparatus for measuring straightness

Info

Publication number
JPH01250702A
JPH01250702A JP7588488A JP7588488A JPH01250702A JP H01250702 A JPH01250702 A JP H01250702A JP 7588488 A JP7588488 A JP 7588488A JP 7588488 A JP7588488 A JP 7588488A JP H01250702 A JPH01250702 A JP H01250702A
Authority
JP
Japan
Prior art keywords
measured
axis direction
straightness
air slide
stylus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7588488A
Other languages
Japanese (ja)
Other versions
JPH0786405B2 (en
Inventor
Masahiro Kondo
近藤 昌弘
Tatsuo Teichi
竜男 定地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP63075884A priority Critical patent/JPH0786405B2/en
Publication of JPH01250702A publication Critical patent/JPH01250702A/en
Publication of JPH0786405B2 publication Critical patent/JPH0786405B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To measure the straightness of the surface of an object to be measured in an X-axis direction with high accuracy, by bringing a stylus into contract with the surface of the object to be measured to scan an air slide table in the X-axis direction. CONSTITUTION:The reference surface 22 of an object 21 to be measured is horizontally set by an inclined table 10 and a displacement sensor 13 and the height of a detection part 16 is properly set by an up-and-down column 14. Next, an air slide table 3 is moved on the object 21 to be measured in an X-axis direction to perform scanning. Then, the height of a surface 20 to be measured and that of the reference surface on a left side and the height of the reference surface 22 and that of the surface 20 to be measured on a right side are respectively detected by a stylus 16 and, by operating the difference in level between a reference line and the surface 20 to be measured on the basis of the signal from the detection part 16, the straightness of the surface 20 to be measured can be measured with high accuracy.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、被測定物面の真直度を測定するための真直度
測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a straightness measuring device for measuring the straightness of a surface of an object to be measured.

(従来の技術及び解決すべき課題) 従来、例えばPIIJS図及び第4図のような被測定物
上面の平面度の測定は、光学的手段によりオプチカル7
う・ントと比較して行っていた。しがし、これでは平面
度の測定結果を高精度(サブミクロンオーダー)の具体
的数値として得ることができない嫌いがある。
(Prior art and problems to be solved) Conventionally, the flatness of the upper surface of the object to be measured as shown in the PIIJS diagram and FIG.
I was comparing it with U-nt. However, this method has the disadvantage that it is not possible to obtain a flatness measurement result as a concrete numerical value with high precision (submicron order).

本発明は、上記の、αに鑑み、被測定物の真直度、ひい
ては平面度、円筒度、同軸度等の形状の測定を高精度で
実行可能で、測定結果をコンピュータ等の処理が容易な
電気信号として得ることができる真直度測定装置を提供
することを目的とする。
In view of the above-mentioned α, the present invention makes it possible to measure the straightness of the object to be measured, as well as its shape such as flatness, cylindricity, coaxiality, etc. with high precision, and to easily process the measurement results on a computer, etc. It is an object of the present invention to provide a straightness measuring device that can obtain an electrical signal.

(課題を解決するための手段) 本発明は、上記課題を解決するために、防振台上に配置
されていてX軸方向に摺動自在なエアスライドテーブル
と、該エアスライドテーブル上に配設されたY軸方向に
移動自在な前後テーブルと、該前後テーブル上に配設さ
れた傾斜テーブルと、該傾斜テーブル上に配設されてい
て被測定物を保持するチャックと、前記被測定物のX軸
との平行度を測定する傾き・測定部と、前記防振台上に
立設された上下コラムに取り付けられていて前記被測定
物の真直度を測定する検出部とを備えた構成としている
(Means for Solving the Problems) In order to solve the above problems, the present invention provides an air slide table placed on a vibration isolating table and slidable in the X-axis direction, and an air slide table placed on the air slide table. A front and rear table movable in the Y-axis direction, a tilting table disposed on the front and rear table, a chuck disposed on the tilting table to hold a workpiece, and a chuck for holding a workpiece. an inclination/measuring unit that measures the parallelism with the X-axis of the object, and a detection unit that is attached to upper and lower columns erected on the vibration isolation table and measures the straightness of the object to be measured. It is said that

(作用) 本発明の真直度測定装置においては、被測定物面に検出
部となるスタイラスを接触させ、エアスライドテーブル
をX軸方向に走査することにより、被測定物面のX軸方
向の真直度を測定する。スタイラスは被測定物上面の高
さ(Z軸方向の位置)に応じた電気信号を出すから、こ
れをA/D変換してコンビ・−夕処理する。また、前後
テーブルをX軸方向に移動して、異なるX軸方向の位置
に対して上記スタイラスのX軸方向の走査を行い、同−
X軸方向位置における2点以上のX軸方向位置の測定値
を比較することにより、X軸方向の真直度の測定もでき
る。
(Function) In the straightness measuring device of the present invention, by bringing the stylus serving as the detection unit into contact with the surface of the object to be measured and scanning the air slide table in the X-axis direction, the straightness of the surface of the object to be measured in the measure degree. The stylus outputs an electrical signal corresponding to the height (position in the Z-axis direction) of the top surface of the object to be measured, which is A/D converted and processed by the combination processor. Furthermore, the front and rear tables are moved in the X-axis direction, and the stylus is scanned in the X-axis direction to different positions in the X-axis direction.
By comparing the measured values of two or more X-axis positions in the X-axis direction, the straightness in the X-axis direction can also be measured.

これらのX軸方向及びX軸方向の測定により、被測定物
の平面度、円筒度、同軸度等の形状の測定を高精度で実
行可能である。
By measuring these in the X-axis direction and the X-axis direction, it is possible to measure the shape of the object to be measured, such as flatness, cylindricity, coaxiality, etc., with high precision.

(実施例) 以下、本発明に係る真直度測定装置の実施例を図面に従
って説明する。
(Example) Hereinafter, an example of the straightness measuring device according to the present invention will be described with reference to the drawings.

第1図は真直度測定装置の機械的構成を示し、第2図は
真直度測定装置の制御及び信号処理系を示すものである
FIG. 1 shows the mechanical configuration of the straightness measuring device, and FIG. 2 shows the control and signal processing system of the straightness measuring device.

第1図において、防振台1上にはエアスライドガイド2
が立設固定され、該エアスライドガイド2に対してエア
スライドテーブル3がX軸方向に摺動自在に設けられて
いる。該エアスライドテーブル3のX軸方向の位置は防
振台1上に配置されたリニアスケール4で検出される。
In Figure 1, an air slide guide 2 is placed on the vibration isolation table 1.
is fixed upright, and an air slide table 3 is provided to be slidable in the X-axis direction with respect to the air slide guide 2. The position of the air slide table 3 in the X-axis direction is detected by a linear scale 4 placed on the vibration isolating table 1.

エアスライドテーブル3は例えば上下方向の真直度(単
体)が0.1μm7100 am程度以下のものである
The air slide table 3 has, for example, vertical straightness (single unit) of about 0.1 μm 7100 am or less.

前記防振台1とは別の基台5上にはモータ6が配置固定
され、該モータ6の回転軸に固着されたプーリー7A、
エアスライドガイド2の両端上下に配置されたプーリー
7 B、7 C,7D、7 E間にワイヤ8が張架され
、該ワイヤ8の両端はエアスライドテーブル3に接続さ
れている。従って、モータ6の回転によりエアスライド
テーブル3はX軸方向に駆動される。
A motor 6 is arranged and fixed on a base 5 different from the vibration isolation table 1, and a pulley 7A fixed to the rotating shaft of the motor 6;
A wire 8 is stretched between pulleys 7 B, 7 C, 7 D, and 7 E arranged above and below both ends of the air slide guide 2, and both ends of the wire 8 are connected to the air slide table 3. Therefore, the rotation of the motor 6 drives the air slide table 3 in the X-axis direction.

該エアスライドテーブル3上にはX軸方向に摺動自在な
前後テーブル9が取付固定され、該前後テーブル9のテ
ーブル面上には傾斜テーブル10が取付固定されている
。傾斜テーブル10のテーブル面は例えば±2°の範囲
で傾動可能である。
A front and rear table 9 slidable in the X-axis direction is mounted and fixed on the air slide table 3, and a tilting table 10 is mounted and fixed on the table surface of the front and rear table 9. The table surface of the tilting table 10 can be tilted within a range of ±2°, for example.

傾斜テーブル10のテーブル面上にはバキュームチャッ
ク11が固着されている。該バキュームチャック11は
、fjIJ3図及び第4図のように測定対象面20と基
準面22とを上面に有する被測定物21を吸着保持する
ものである。基準面22は予め平坦に研摩されている。
A vacuum chuck 11 is fixed on the table surface of the tilting table 10. The vacuum chuck 11 is for suctioning and holding an object to be measured 21 having a surface to be measured 20 and a reference surface 22 on its upper surface as shown in FIGS. fjIJ3 and FIG. The reference surface 22 has been polished flat in advance.

前記防振台1上にはセンサスタンド12が立設固定され
、該センサスタンド12に2個の変位センサ13が取り
付けられる。2個の変位センサ13は前記被測定物21
の2箇所の基準面22に対向するように配置されていて
、各変位センサ13と2箇所の基準面22との間隔をそ
れぞれ測定するものである。そして、2箇所の基準面2
2に対応したそれぞれの間隔が等しくなるように前記傾
斜テーブル10の傾斜を調整し、X軸方向と前記2箇所
の基準面22の平行度を一定値以下(例えば1μI11
以下)にする。これは、後述の検出部16における真直
度測定においてZ軸方向の測定倍率が太きく(X500
0〜X20000)、オーバーレンジにならぬようにす
るためである。
A sensor stand 12 is erected and fixed on the vibration isolation table 1, and two displacement sensors 13 are attached to the sensor stand 12. The two displacement sensors 13 are connected to the object to be measured 21
The displacement sensors 13 are arranged to face the reference surfaces 22 at two locations, and measure the distance between each displacement sensor 13 and the reference surfaces 22 at the two locations. Then, two reference planes 2
The inclination of the tilting table 10 is adjusted so that the respective intervals corresponding to
below). This is because the measurement magnification in the Z-axis direction is large (X500
0 to X20000), to avoid overrange.

また、前記防振台1上には上下コラム14が立設固定さ
れ、該上下コラム14のZ軸方向に昇降する昇降ブロッ
ク15に前記被測定物21の上面の真直度を測定する検
出部16が取り付けられている。該検出部16は粗さ測
定用のスタイラスで構成され、スタイラス先端を被測定
物21の上面に0.4g程度の測定荷重で接触させて測
定を実行するものである。スタイラスの分解能は0.0
1μm程度である。
Further, an upper and lower column 14 is erected and fixed on the vibration isolating table 1, and a detection unit 16 for measuring the straightness of the upper surface of the object to be measured 21 is mounted on an elevating block 15 that moves up and down in the Z-axis direction of the upper and lower columns 14. is installed. The detection unit 16 is composed of a stylus for measuring roughness, and performs measurement by bringing the tip of the stylus into contact with the upper surface of the object to be measured 21 with a measurement load of about 0.4 g. Stylus resolution is 0.0
It is about 1 μm.

第2図に示すように、X軸駆動用のモータ6及び上下コ
ラム14のZ軸駆動用モータは、シーケンサ30でシー
ケンス制御されるドライバ31゜32を介して駆動制御
されるようになっており、前記検出部16の出力である
電気信号はヘッドアンプ33、レンジアンプ34で所定
電圧にまで増幅され、コンピュータ40のA/D基板4
1に入力される。コンピュータ40はA/D基板41の
他に、CPU42、I10基板43、マウス44及びメ
モリ45を有している。コンピュータ出力は、CRT4
6やX−Yブロック47で表示されるようになっている
。前記リニアスケール4の出力は分周回路48で分周さ
れてI10基板43に加えられる。また、I10基板4
3内ではサンプリングパルスが作成される。コンピュー
タ40はサンプリングパルス毎にX紬の値及びこれに対
応したZ軸の値をA/D変換してメモリ45に記憶する
。記憶データはCRT46やX−Yプ0.2り47で表
示することができる。
As shown in FIG. 2, the X-axis drive motor 6 and the Z-axis drive motors of the upper and lower columns 14 are controlled via drivers 31 and 32 that are sequentially controlled by a sequencer 30. The electrical signal output from the detection section 16 is amplified to a predetermined voltage by a head amplifier 33 and a range amplifier 34, and then sent to the A/D board 4 of the computer 40.
1 is input. In addition to the A/D board 41, the computer 40 has a CPU 42, an I10 board 43, a mouse 44, and a memory 45. Computer output is CRT4
6 and XY block 47. The output of the linear scale 4 is frequency-divided by a frequency dividing circuit 48 and applied to the I10 board 43. In addition, I10 board 4
3, a sampling pulse is created. The computer 40 performs A/D conversion on the X-axis value and the corresponding Z-axis value for each sampling pulse, and stores it in the memory 45 . The stored data can be displayed on a CRT 46 or an X-Y printer 47.

以上の実施例の構成において、傾斜テーブル10、変位
センサ13により被測定物21の2つの基準面22を水
平にセラ)(X軸に平行に)し、上下コラム14で検出
部16の高さ(Z軸方向の位置)を適当に設定した後、
測定対象面20及び基準面22を持つ被測定物21上を
第3図の線(i)のようにX軸方向に走査しくエアスラ
イドテーブル3をX軸方向に移動させ)、検出部(スタ
イラス)16で左側の測定対象面20、左側の基準面2
2、右側の基準面22及び右側の測定対象面20のそれ
ぞれ上面の高さ(Z軸方向の位置)を検出する。
In the configuration of the above embodiment, the two reference planes 22 of the object to be measured 21 are set horizontally (parallel to the After setting the (position in the Z-axis direction) appropriately,
The air slide table 3 is moved in the X-axis direction to scan the object 21 having the measurement target surface 20 and the reference surface 22 in the X-axis direction as shown by line (i) in FIG. ) 16, the measurement target surface 20 on the left side, the reference surface 2 on the left side
2. Detect the heights (positions in the Z-axis direction) of the upper surfaces of the right reference plane 22 and the right measurement target surface 20, respectively.

これにより、検出部16の信号を増幅したレンツアンプ
34の出力として例えば第5図のような波形が得られ、
これがCRT46で拡大表示される。
As a result, a waveform as shown in FIG. 5, for example, is obtained as the output of the Lenz amplifier 34 which amplifies the signal of the detection section 16,
This is enlarged and displayed on the CRT 46.

そして、左側の基準面22の中央部(例えば0点)、右
側の基準面22の中央部(例えばd点)の高さ(Z軸方
向の位置)をピックアップして最小自乗法により第5図
の点線で示される基準線(平均線)Pをコンピュータ4
0で演算する。それから、基準線Pと測定対象面20の
上面との開の段差ZI乃至Z、(測定点atb、etf
はマウス44で適当な位置を選択でさる)を算出し、段
差が所定範囲内かどうか、すなわち真直度の良否を判定
する。
Then, the heights (positions in the Z-axis direction) of the center part of the left reference plane 22 (for example, point 0) and the center part of the right reference plane 22 (for example, point d) are picked up and determined by the least square method as shown in FIG. The reference line (average line) P indicated by the dotted line is calculated by the computer 4.
Calculate with 0. Then, the open steps ZI to Z, (measurement points atb, etf
is calculated by selecting an appropriate position with the mouse 44), and it is determined whether the step is within a predetermined range, that is, whether the straightness is good or bad.

次に、前後テーブル9を動かしてY軸方向の位置を変え
、X軸方向の走査を第3図の線(旨)に沿つて行い、前
述の第5図の場合と同じ様式の波形を得る。そして、基
準線を同様に算出し、被測定物の測定対象面との段差を
算出して真直度の評価を同様に実施する。Y軸方向の測
定回数、測定位置は適当に選択できる。
Next, move the front and rear table 9 to change the position in the Y-axis direction, and scan in the X-axis direction along the line in Figure 3 to obtain the same waveform as in Figure 5 above. . Then, the reference line is calculated in the same way, the level difference between the reference line and the surface to be measured of the object to be measured is calculated, and the straightness is evaluated in the same way. The number of measurements in the Y-axis direction and the measurement position can be selected appropriately.

なお、被測定物の形状及び配置は適宜変更可能であり、
第6図(A)の螺子頭面50の真直度(円筒度)や、第
6図(B)の螺子溝面51の真直度(同軸度、深さ、ば
らつき)や、第6図(C)の平板上の溝底52の真直度
(平行度、平面度、粗さ)等を測定できる。また、基準
線の算出のためのピックアップ点は被測定物の形状に応
じて適宜変更すればよい。
Note that the shape and arrangement of the object to be measured can be changed as appropriate.
The straightness (cylindricity) of the screw head surface 50 in FIG. 6(A), the straightness (coaxiality, depth, variation) of the screw groove surface 51 in FIG. 6(B), ) can measure the straightness (parallelism, flatness, roughness), etc. of the groove bottom 52 on a flat plate. Further, the pickup point for calculating the reference line may be changed as appropriate depending on the shape of the object to be measured.

(発明の効果) 以上説明したように、本発明の真直度測定装置によれば
、防振台上に配置されていてX軸方向に摺動自在なエア
スライドテーブルと、該エアスライドテーブル上に配設
されたY軸方向に移動自在な前後テーブルと、該前後テ
ーブル上に配設された傾斜テーブルと、該傾斜テーブル
上に配設されていて被測定物を保持するチャックと、前
記被測定物のX紬との平行度を測定する傾き測定部と、
前記防振台上に立設された上下コラムに取り付けられて
いて前記被測定物の真直度を測定する検出部とを備えた
構成としたので、被測定物面の真直度の測定を高精度(
例えばサブミクロン以下)で実行可能である。また、測
定結果を電気信号として得ることができ、コンピュータ
処理が容易である。
(Effects of the Invention) As explained above, according to the straightness measuring device of the present invention, an air slide table placed on a vibration isolating table and slidable in the X-axis direction, A front and rear table movable in the Y-axis direction, a tilting table disposed on the front and rear table, a chuck disposed on the tilting table to hold an object to be measured, and a chuck disposed on the tilting table to hold an object to be measured; an inclination measurement unit that measures the parallelism of the object to the X pongee;
The configuration includes a detection unit that is attached to the upper and lower columns erected on the vibration isolating table and measures the straightness of the object to be measured, so that the straightness of the object to be measured can be measured with high precision. (
(for example, submicron or smaller). Furthermore, measurement results can be obtained as electrical signals, making computer processing easy.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係る真直度測定装置の実施例であって
磯↑戒的構成を示す正面図、第2図は実施例の制御及び
信号処理系を示すブロック図、第3図は被測定物の形状
を示す平面図、第4図は同正面図、第5図は検出部出力
を増幅して得た波形図、第6図は他の被測定物の形状を
示す説明図である。 1・・・防振台、2・・・エアスライドガイド、3・・
・エアスライドテーブル、4・・・リニアスケール、6
・・・モータ、7 A、7 B、7 C,7D、7 E
・・・プーリー、8・・・ワイヤ、9・・・前後テーブ
ル、10・・・傾斜テーブル、11・・・バキュームチ
ャック、13・・・変位センサ、14・・・上下コラム
、16・・・検出部、20・・・測定対象面、21・・
・被測定物、22・・・基準面、30・・・シーケンサ
、40・・・コンピュータ、46・・・CRT、47・
・・X−Y7”o79゜
Fig. 1 shows an embodiment of the straightness measuring device according to the present invention, and is a front view showing the configuration of the straightness measurement device, Fig. 2 is a block diagram showing the control and signal processing system of the embodiment, and Fig. 3 shows the straightness measuring device. FIG. 4 is a plan view showing the shape of the object to be measured, FIG. 4 is a front view of the same, FIG. 5 is a waveform diagram obtained by amplifying the output of the detection section, and FIG. 6 is an explanatory diagram showing the shape of another object to be measured. . 1... Vibration isolation table, 2... Air slide guide, 3...
・Air slide table, 4...Linear scale, 6
...Motor, 7 A, 7 B, 7 C, 7 D, 7 E
... Pulley, 8... Wire, 9... Front and rear tables, 10... Inclined table, 11... Vacuum chuck, 13... Displacement sensor, 14... Upper and lower columns, 16... Detection unit, 20...Measurement target surface, 21...
・Object to be measured, 22...Reference surface, 30...Sequencer, 40...Computer, 46...CRT, 47...
・・X-Y7”o79゜

Claims (2)

【特許請求の範囲】[Claims] (1)防振台上に配置されていてX軸方向に摺動自在な
エアスライドテーブルと、該エアスライドテーブル上に
配設されたY軸方向に移動自在な前後テーブルと、該前
後テーブル上に配設された傾斜テーブルと、該傾斜テー
ブル上に配設されていて被測定物を保持するチャックと
、前記被測定物のX軸との平行度を測定する傾き測定部
と、前記防振台上に立設された上下コラムに取り付けら
れていて前記被測定物の真直度を測定する検出部とを備
えたことを特徴とする真直度測定装置。
(1) An air slide table placed on a vibration isolating table and slidable in the X-axis direction, a front and rear table placed on the air slide table and movable in the Y-axis direction, and a top of the front and rear table. a tilting table disposed on the tilting table; a chuck disposed on the tilting table for holding the object to be measured; a tilt measuring section for measuring the parallelism of the object to the X-axis; 1. A straightness measuring device comprising: a detection section that is attached to upper and lower columns erected on a table and measures the straightness of the object to be measured.
(2)前記検出部が粗さ測定用スタイラスで構成されて
いる請求項1記載の真直度測定装置。
(2) The straightness measuring device according to claim 1, wherein the detecting section comprises a stylus for measuring roughness.
JP63075884A 1988-03-31 1988-03-31 Straightness measuring device Expired - Lifetime JPH0786405B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63075884A JPH0786405B2 (en) 1988-03-31 1988-03-31 Straightness measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63075884A JPH0786405B2 (en) 1988-03-31 1988-03-31 Straightness measuring device

Publications (2)

Publication Number Publication Date
JPH01250702A true JPH01250702A (en) 1989-10-05
JPH0786405B2 JPH0786405B2 (en) 1995-09-20

Family

ID=13589162

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63075884A Expired - Lifetime JPH0786405B2 (en) 1988-03-31 1988-03-31 Straightness measuring device

Country Status (1)

Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106382909A (en) * 2016-11-02 2017-02-08 合肥工业大学 Method of improving straightness error measurement precision of level with fixed bridge plate span
CN111121708A (en) * 2019-12-19 2020-05-08 无锡日升量仪有限公司 Long tube straightness accuracy intellectual detection system mechanism

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50118748A (en) * 1974-01-25 1975-09-17
JPS5197458A (en) * 1975-02-24 1976-08-27 Bannokeijoseidono sokuteihoho
JPS5284846U (en) * 1975-12-22 1977-06-24
JPS5728206A (en) * 1980-07-26 1982-02-15 Tokyo Seimitsu Co Ltd Shape measuring device
JPS5750241A (en) * 1980-09-09 1982-03-24 Hitachi Metals Ltd Casting method
JPS6288906U (en) * 1985-11-25 1987-06-06
JPS62177409A (en) * 1986-01-31 1987-08-04 Toshiba Corp Noncontact straightness measuring instrument
JPS62261916A (en) * 1986-05-08 1987-11-14 Kobe Steel Ltd Measuring instrument for surface shape

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50118748A (en) * 1974-01-25 1975-09-17
JPS5197458A (en) * 1975-02-24 1976-08-27 Bannokeijoseidono sokuteihoho
JPS5284846U (en) * 1975-12-22 1977-06-24
JPS5728206A (en) * 1980-07-26 1982-02-15 Tokyo Seimitsu Co Ltd Shape measuring device
JPS5750241A (en) * 1980-09-09 1982-03-24 Hitachi Metals Ltd Casting method
JPS6288906U (en) * 1985-11-25 1987-06-06
JPS62177409A (en) * 1986-01-31 1987-08-04 Toshiba Corp Noncontact straightness measuring instrument
JPS62261916A (en) * 1986-05-08 1987-11-14 Kobe Steel Ltd Measuring instrument for surface shape

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106382909A (en) * 2016-11-02 2017-02-08 合肥工业大学 Method of improving straightness error measurement precision of level with fixed bridge plate span
CN111121708A (en) * 2019-12-19 2020-05-08 无锡日升量仪有限公司 Long tube straightness accuracy intellectual detection system mechanism

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