JPH0124632Y2 - - Google Patents

Info

Publication number
JPH0124632Y2
JPH0124632Y2 JP1984055249U JP5524984U JPH0124632Y2 JP H0124632 Y2 JPH0124632 Y2 JP H0124632Y2 JP 1984055249 U JP1984055249 U JP 1984055249U JP 5524984 U JP5524984 U JP 5524984U JP H0124632 Y2 JPH0124632 Y2 JP H0124632Y2
Authority
JP
Japan
Prior art keywords
electronic component
rotating drum
lead wires
terminals
rotating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984055249U
Other languages
Japanese (ja)
Other versions
JPS60168077U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5524984U priority Critical patent/JPS60168077U/en
Publication of JPS60168077U publication Critical patent/JPS60168077U/en
Application granted granted Critical
Publication of JPH0124632Y2 publication Critical patent/JPH0124632Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【考案の詳細な説明】 イ 産業上の利用分野 この考案はダイオード等のアキシヤルリード形
電子部品の特性測定装置に関する。
[Detailed description of the invention] A. Field of industrial application This invention relates to a characteristic measuring device for axial lead type electronic components such as diodes.

ロ 従来技術 ダイオードや抵抗等の電子部品は、部品本体の
両端からリード線を本体軸方向に沿つて導出した
アキシヤルリード形が一般的である。前記リード
線はFe−Ni合金などの磁性金属のリード線が使
用されることが多く、アキシヤルリード形電子部
品は、磁性リード線の表面を酸化防止、外部機器
との半田付け性を良好にする等の目的でもつて半
田メツキ処理してから特性測定、捺印工程等を経
て製品化が完了する。
B. Prior Art Electronic components such as diodes and resistors are generally of the axial lead type, in which lead wires are led out along the axis of the component body from both ends of the component body. Lead wires made of magnetic metal such as Fe-Ni alloy are often used for the lead wires, and axial lead type electronic components are designed to prevent oxidation on the surface of the magnetic lead wires and improve solderability with external devices. The product is soldered and plated for various purposes such as measurement of characteristics, stamping, etc., and then completed as a product.

このようなアキシヤルリード形電子部品の特性
測定は従来:例えば第4図乃至第6図に示す装置
でもつて1個ずつ順次に行われている。即ち、第
4図乃至第6図において、1,1…はアキシヤル
リード形電子部品、2は定位置に枢設された回転
ドラム、3は回転ドラム2に電子部品1を1個ず
つ供給する電子部品供給部、4は回転ドラム2か
ら測定済み電子部品1を1個ずつ取出す電子部品
取出部、5,5は回転ドラム2の外周近傍の2箇
所の測定用定ポジシヨンに固定配置された測定端
子、6は測定端子5,5に電気的配線された特性
測定器である。
Conventionally, characteristic measurements of such axial lead type electronic components have been carried out one by one using, for example, the apparatus shown in FIGS. 4 to 6. That is, in FIGS. 4 to 6, 1, 1, . . . are axial lead type electronic components, 2 is a rotating drum pivotally installed in a fixed position, and 3 is a rotating drum 2 in which electronic components 1 are supplied one by one. An electronic component supply section 4 takes out the measured electronic components 1 one by one from the rotating drum 2; 5, 5 a measurement unit fixedly arranged at two fixed measurement positions near the outer periphery of the rotating drum 2; Terminal 6 is a characteristic measuring device electrically wired to the measurement terminals 5, 5.

回転ドラム2の外周中央には、第6図により明
らかなように電子部品1の部品本体1aが入る程
度の溝7が形成され、またこの溝7の両側の外周
面には等間隔で複数個の粒状磁石8,8…が埋設
される。1つの磁石8は電子部品1の1本のリー
ド線1bを磁気吸着する大きさで、1個の電子部
品1は、回転ドラム2の軸方向と平行な軸方向で
もつて、部品本体1aが溝7に嵌まり2本のリー
ド線1b,1bの根元近くが溝7の両側の2個一
組の磁石8,8に吸引されて回転ドラム2と共に
回転移動する。この回転ドラム2に電子部品1を
供給する電子部品供給部3は例えばマグネツトフ
イーダで、このマグネツトフイーダでもつて多数
の電子部品1,1…は水平に方向規制されて回転
ドラム2へと送られ、回転ドラム2に達したもの
が上記磁石8,8…の吸着にて順次1つずつ切出
される。
As is clear from FIG. 6, a groove 7 is formed in the center of the outer circumference of the rotating drum 2, and the groove 7 is large enough to accommodate the component main body 1a of the electronic component 1. On the outer circumferential surface on both sides of this groove 7, a plurality of grooves are formed at equal intervals. granular magnets 8, 8... are buried. One magnet 8 has a size that magnetically attracts one lead wire 1b of the electronic component 1, and one electronic component 1 is arranged so that the component main body 1a is in the groove even in the axial direction parallel to the axial direction of the rotating drum 2. Near the bases of the two lead wires 1b, 1b fitted in the groove 7 are attracted by a pair of magnets 8, 8 on both sides of the groove 7, and rotate together with the rotating drum 2. The electronic component supply unit 3 that supplies the electronic components 1 to the rotating drum 2 is, for example, a magnetic feeder, and in this magnetic feeder, a large number of electronic components 1, 1, . . . are fed to the rotating drum 2 while being horizontally regulated. The pieces that reach the rotating drum 2 are successively cut out one by one by the attraction of the magnets 8, 8, . . . .

上記2つの測定端子5,5は、回転ドラム2と
共に回転して測定ポジシヨンに送られてきた電子
部品1,1…のリード線1b,1bに電気的接続
して通電し特性測定を行うためのもので、図面で
は2つを配備したが電子部品1の種類、特性測定
内容に応じ1つ又は2つ以上配備されている。こ
の2つの測定端子5,5は同一構造なので、以下
1つについて説明する。測定端子5は、回転ドラ
ム2の溝7の両側の外周とリード線1b,1bの
線径より少し小さい間隔でもつて固定配置された
2つの固定端子5a,5bでもつて構成される。
回転ドラム2の外周に吸着されて測定ポジシヨン
に電子部品1が送られてくると、この電子部品1
の2つのリード線1b,1bが固定端子5a,5
bに接触し、この時両固定端子5a,5b間に電
圧が印加されて特性測定器6にて電子部品1の特
性測定が行われる。
The two measurement terminals 5, 5 are electrically connected to the lead wires 1b, 1b of the electronic components 1, 1, . In the drawing, two are provided, but one or more may be provided depending on the type of electronic component 1 and the content of characteristic measurement. Since these two measurement terminals 5, 5 have the same structure, only one will be explained below. The measurement terminal 5 is composed of two fixed terminals 5a and 5b which are fixedly arranged at an interval slightly smaller than the diameter of the lead wires 1b and 1b from the outer periphery of both sides of the groove 7 of the rotating drum 2.
When the electronic component 1 is attracted to the outer periphery of the rotating drum 2 and sent to the measurement position, the electronic component 1
The two lead wires 1b, 1b are fixed terminals 5a, 5
At this time, a voltage is applied between both fixed terminals 5a and 5b, and the characteristic of the electronic component 1 is measured by the characteristic measuring device 6.

尚、電子部品取出部4は、回転ドラム2と共に
回転する測定済み電子部品1を、例えば、回転ド
ラム2の下部両側方に配置した切出爪9,9にて
回転ドラム2から引き外して外部電子部品選択機
構等へと取出すためのものである。
The electronic component extraction section 4 removes the measured electronic component 1, which rotates together with the rotary drum 2, from the rotary drum 2 using, for example, cutting claws 9 disposed on both sides of the lower part of the rotary drum 2, and removes the measured electronic component 1 from the rotary drum 2. This is for taking out to an electronic component selection mechanism, etc.

ハ 考案が解決しようとする問題点 上記従来装置においてアキシヤルリード形電子
部品1の特性測定は、回転ドラム2と共に回転す
る電子部品1のリード線1b,1bと固定端子5
a,5bに軽く接触させて摺動させる状態で行わ
れるため、次の問題を含んでいた。
C. Problems to be Solved by the Invention In the conventional device described above, the characteristics of the axial lead type electronic component 1 are measured using the lead wires 1b and 1b of the electronic component 1 rotating together with the rotating drum 2 and the fixed terminal 5.
Since it is carried out in a state in which the parts a and 5b are slid in light contact with each other, the following problems are involved.

電子部品1のリード線1b,1bは、半田メツ
キ処理にて表面に半田被膜を有する。そのためリ
ード線1b,1bを固定端子5a,5bに、接触
良好とするために、強く押し当てて摺動させる
と、リード線1b,1bの半田被膜が固定端子5
a,5bに擦られて剥がれ、固定端子5a,5b
に付着することがあつた。このように固定端子5
a,5bに半田が付着すると以後の電子部品1の
リード線1b,1bとの接触抵抗が変わり、均一
な条件下での特性測定ができず、信頼性に欠ける
問題があつた。
The lead wires 1b, 1b of the electronic component 1 have a solder coating on their surfaces by solder plating. Therefore, when the lead wires 1b, 1b are strongly pressed and slid against the fixed terminals 5a, 5b in order to make good contact, the solder coating of the lead wires 1b, 1b is removed from the fixed terminals 5a, 5b.
Fixed terminals 5a, 5b peel off due to rubbing by a, 5b
It sometimes adhered to the surface. Fixed terminal 5 like this
When solder adheres to a and 5b, the contact resistance with the lead wires 1b and 1b of the electronic component 1 changes thereafter, making it impossible to measure characteristics under uniform conditions, resulting in a problem of lack of reliability.

上記問題の解決手段として固定端子5a,5b
に付着した半田を定期的に除去することが行われ
ている。しかし、この手段は半田除去の度に全装
置を停止させねばならないので装置の稼動率を悪
くし、また固定端子5a,5bの寿命を短くする
問題があつた。
As a solution to the above problem, fixed terminals 5a and 5b
Solder adhering to the device is removed periodically. However, this method has the problem that the entire device must be stopped every time the solder is removed, which reduces the operating rate of the device and shortens the life of the fixed terminals 5a and 5b.

また電子部品1においては、リード線1b,1
bの半田被膜が部分的に剥がれるので結果的に半
田仕上不良品となる確率が高く、製品の商品的価
値を下げる要因となつていた。
Furthermore, in the electronic component 1, the lead wires 1b, 1
Since the solder film b is partially peeled off, there is a high probability that the solder finish will be defective as a result, which is a factor that lowers the commercial value of the product.

ニ 考案の目的 本考案は上記従来問題点に鑑みてなされたもの
で、本考案の目的はアキシヤルリード形電子部品
の半田メツキ処理されたリード線の半田被膜を剥
がすこと無く測定端子を接触させて特性測定を行
わしめることにある。
D. Purpose of the invention The present invention was made in view of the above-mentioned conventional problems, and the purpose of the present invention is to bring measurement terminals into contact without peeling off the solder coating of the solder-plated lead wires of axial lead type electronic components. The objective is to perform characteristic measurements.

ホ 考案の構成 この目的を完遂する本考案の技術的手段は、測
定端子を可動式にすることである。具体的にはこ
の技術的手段は、電子部品のリード線を磁気吸着
する磁石を外周に有する回転ドラムの外周近傍の
定位置に配置し、その中心点より若干離れた偏心
点を中心として前記回転ドラムと同一方向に、か
つ、その回転中心から最も遠い周面が前記回転ド
ラム側に来たとき回転ドラムと同一周速で回転し
て、回転ドラム外周上の電子部品のリード線を回
転ドラムとでもつて適宜挟持する可動式測定端子
を使用することである。
E. Structure of the invention The technical means of the invention to accomplish this purpose is to make the measurement terminal movable. Specifically, this technical means involves placing magnets on the outer periphery of a rotating drum that magnetically attracts lead wires of electronic components at fixed positions near the outer periphery of the drum, and rotating the drum around an eccentric point slightly away from the center point. In the same direction as the drum, when the peripheral surface farthest from the center of rotation comes to the rotating drum side, it rotates at the same peripheral speed as the rotating drum, and connects the lead wires of electronic components on the outer periphery of the rotating drum to the rotating drum. The method is to use a movable measurement terminal that can be held appropriately.

ヘ 考案の作用 上記可動式測定端子使用により、電子部品のリ
ード線は、測定端子で押圧されるのみで擦られる
ことが無くなり、従つてリード線の表面に半田被
膜が在つてもこれが測定端子で剥がされる心配が
無くなり、従来の上記各問題点が解決される。ま
た、測定端子は偏心点を中心として回転するの
で、電子部品が測定位置に来たときのみリード線
に接触し、他の時間帯はリード線や回転ドラムに
接触しないので、これらの摩耗が少なくなる。
F. Effect of the invention By using the movable measuring terminal described above, the lead wire of the electronic component is only pressed by the measuring terminal and is not rubbed. Therefore, even if there is a solder coating on the surface of the lead wire, it is not affected by the measuring terminal. There is no need to worry about it being peeled off, and the above-mentioned problems of the prior art are solved. In addition, since the measurement terminal rotates around an eccentric point, it comes into contact with the lead wire only when the electronic component comes to the measurement position, and does not come into contact with the lead wire or rotating drum at other times, reducing wear on these parts. Become.

ト 考案の実施例 本考案の一実施例を第1図乃至第2図を参照し
て説明する。
G. Example of the invention An example of the invention will be described with reference to FIGS. 1 and 2.

第1図において、従来の装置を示した第4図と
同一内容のものには同一参照符合を付して説明は
省略する。この実施例の特性測定装置における従
来の装置との相違点は、回転ドラム2の外周近傍
の例えば2つの測定ポジシヨンに配置した次の可
動式測定端子10,10及びその支持手段にあ
る。2つの測定端子10,10及びその支持手段
は同一構造なので、以下一方について説明を行
う。
In FIG. 1, the same components as those in FIG. 4, which shows a conventional device, are given the same reference numerals and their explanation will be omitted. The characteristic measuring device of this embodiment differs from conventional devices in the following movable measuring terminals 10, 10 arranged at, for example, two measuring positions near the outer periphery of the rotary drum 2 and their supporting means. Since the two measurement terminals 10, 10 and their support means have the same structure, one will be explained below.

まず、測定端子10は、1つの定測定ポジシヨ
ンに回転可能に配備された2つの絶縁性回転ロー
ラ11,11の周辺部両側に固定され、第3図に
明らかな計4つの可動端子10a〜10dで構成
される。2つの回転ローラ11,11は、円形
で、各々はその中心点pより若干離れた偏心点を
中心とする回転軸12に連結されて偏心回転す
る。この各回転ローラ11,11は、回転ドラム
2の溝7の両側外周に対向して回転ドラム2と同
一方向に同一周速で同期回転する。4つの可動端
子10a〜10dは、各回転ローラ11,11の
夫々両側に固定され、各可動端子10a〜10d
の外周は回転ローラ11,11の外周の一部を形
成する。そして各回転ローラ11,11の両側面
周辺部には一方向から各々バネ材13,13…に
て支持された計4つの電極端子14,14…が常
時摺動可能に弾性的に接触し、回転ローラ11,
11の回転で可動端子10a〜10dが回転ドラ
ム2側にくると各電極端子14,14…が対応す
る可動端子10a〜10dに電気的に接触する。
各電極端子14,14…は、特性測定器6′に配
線され、電極端子14,14…と可動端子10a
〜10dを介して測定ポジシヨンにおける1つの
電子部品1の特性測定が次の要領で行われる。
First, the measurement terminals 10 are fixed on both sides of the periphery of two insulating rotary rollers 11, 11 which are rotatably arranged at one fixed measurement position, and a total of four movable terminals 10a to 10d as shown in FIG. Consists of. The two rotating rollers 11, 11 are circular, and each is connected to a rotating shaft 12 centered at an eccentric point slightly apart from its center point p, and rotates eccentrically. These rotating rollers 11, 11 are opposed to the outer peripheries on both sides of the groove 7 of the rotating drum 2, and rotate synchronously in the same direction as the rotating drum 2 at the same circumferential speed. The four movable terminals 10a to 10d are fixed to both sides of each rotating roller 11, 11, respectively.
The outer periphery of the rotary rollers 11 forms a part of the outer periphery of the rotating rollers 11, 11. A total of four electrode terminals 14, 14... supported by spring members 13, 13... from one direction are always slidably and elastically in contact with the periphery of both side surfaces of each rotating roller 11, 11, rotating roller 11,
When the movable terminals 10a to 10d come to the rotating drum 2 side by rotation 11, each electrode terminal 14, 14... electrically contacts the corresponding movable terminal 10a to 10d.
Each electrode terminal 14, 14... is wired to the characteristic measuring device 6', and the electrode terminal 14, 14... and the movable terminal 10a
10d, the characteristics of one electronic component 1 at the measurement position are measured in the following manner.

回転ローラ11,11は、回転ドラム2との最
小間隔が電子部品1のリード線1b,1bの線径
より若干小さく、最大間隔がリード線1b,1b
の線径より若干大きくなる関係で偏心回転し、回
転ドラム2の外周に磁気吸着された1つの電子部
品1が測定ポジシヨンまでくると、このタイミン
グに合わせて可動端子10a〜10dが回転ドラ
ム2と対向する最小間隔の位置まで回動して2つ
の可動端子10a,10bが1本のリード線1b
の根元近くの2点に、他の可動端子10c,10
dが他のリード線1bの根元近くの2点に夫々に
同時に接触する。この接触は各可動端子10a〜
10dとリード線1b,1bの移動速度が同一な
ので、各可動端子10a〜10dはリード線1
b,1bを回転ドラム2の外周とでもつて徐々に
強く挟持する如くして行われ、十分に電気的に接
触した時点で特性測定器6′により電極端子14,
14…、可動端子10a〜10dを介して両リー
ド線1b,1b間に電圧が印加され、電子部品1
の特性測定が行われる。測定完了後は、回転ドラ
ム2、回転ローラ11,11の回転でもつて可動
端子10a〜10dは、リード線1b,1bから
摺動すること無く徐々に離れる。
The minimum distance between the rotating rollers 11, 11 and the rotating drum 2 is slightly smaller than the wire diameter of the lead wires 1b, 1b of the electronic component 1, and the maximum distance between the rotating rollers 11, 11 is slightly smaller than the wire diameter of the lead wires 1b, 1b.
When one electronic component 1 magnetically attracted to the outer periphery of the rotating drum 2 reaches the measuring position, the movable terminals 10a to 10d are connected to the rotating drum 2 at the same timing. The two movable terminals 10a, 10b are rotated to the position with the minimum distance facing each other, and the lead wire 1b is connected to the single lead wire 1b.
The other movable terminals 10c, 10 are placed at two points near the base of
d simultaneously contacts two points near the base of the other lead wire 1b. This contact is made with each movable terminal 10a~
10d and the lead wires 1b, 1b are moved at the same speed, each movable terminal 10a to 10d is connected to the lead wire 1.
The electrode terminals 14, 1b are gradually held firmly between the outer periphery of the rotating drum 2, and when sufficient electrical contact is made, the characteristics measuring device 6' measures the electrode terminals 14, 1b.
14..., a voltage is applied between both lead wires 1b, 1b via the movable terminals 10a to 10d, and the electronic component 1
Characteristic measurements are performed. After the measurement is completed, the movable terminals 10a to 10d gradually separate from the lead wires 1b and 1b without sliding even as the rotating drum 2 and the rotating rollers 11 and 11 rotate.

尚、本考案は上記実施例に限らず、特に可動式
測定端子における可動端子の数やその支持手段、
特性測定器との電気的接続手段は各種変更が可能
である。
Note that the present invention is not limited to the above-mentioned embodiments, but particularly the number of movable terminals in the movable measuring terminal, their supporting means,
Various changes can be made to the electrical connection means with the characteristic measuring device.

チ 考案の効果 以上のように、本考案によれば電子部品のリー
ド線が半田被膜が在つても、この半田被膜が測定
端子により剥がされて測定端子に付着する心配が
無くなり、従つて測定端子とリード線との接触抵
抗の均一化による電子部品特性測定条件の均一化
が可能で、高信頼度の特性測定装置が提供でき、
また測定端子に半田が付着しないので、半田除去
作業が省略できて装置の稼動率向上、測定端子の
長寿命化が図れる。またリード線の測定端子との
接触による損傷が軽減されるので、電子部品のリ
ード線半田仕上不良の発生率が少なくなり、電子
部品の商品的価値の改善が図れる。さらに、測定
端子は偏心点を軸として回転することにより、電
子部品のリード線以外の回転ドラム等には接触し
ないので、これらの摩耗も著しく軽減され、稼動
率が向上、長寿命化が図れる。
H. Effects of the invention As described above, according to the invention, even if the lead wire of an electronic component has a solder coating, there is no need to worry about the solder coating being peeled off by the measurement terminal and adhering to the measurement terminal. By equalizing the contact resistance between the wire and the lead wire, it is possible to equalize the conditions for measuring the characteristics of electronic components, and we can provide a highly reliable characteristic measuring device.
Furthermore, since no solder adheres to the measurement terminals, the solder removal work can be omitted, improving the operating rate of the device and extending the life of the measurement terminals. Furthermore, since damage caused by contact between the lead wire and the measurement terminal is reduced, the incidence of defective solder finish of the lead wires of electronic components is reduced, and the commercial value of the electronic components can be improved. Furthermore, since the measurement terminal rotates around an eccentric point, it does not come into contact with any rotating drum or the like other than the lead wires of electronic components, so wear on these components is significantly reduced, improving operating efficiency and extending life.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案の一実施例を示す電子部品特
性測定装置の要部側面図、第2図は、第1図の一
部拡大図、第3図は、第2図のB−B線に沿う断
面図、第4図及び第5図は、従来のアキシヤルリ
ード形電子部品特性測定装置の要部側面図及び平
面図、第6図は、第4図のA−A線に沿う拡大断
面図である。 1……電子部品、1a……部品本体、1b……
リード線、2……回転ドラム、8……磁石、10
……測定端子、10a〜10d……可動端子、1
1……回転ローラ、14……電極端子。
FIG. 1 is a side view of the main parts of an electronic component characteristic measuring device showing an embodiment of the present invention, FIG. 2 is a partially enlarged view of FIG. 1, and FIG. 4 and 5 are a side view and a plan view of a main part of a conventional axial lead type electronic component characteristic measuring device, and FIG. 6 is a sectional view taken along line A-A in FIG. 4. It is an enlarged sectional view. 1...Electronic component, 1a...Component body, 1b...
Lead wire, 2... Rotating drum, 8... Magnet, 10
...Measurement terminal, 10a to 10d...Movable terminal, 1
1... Rotating roller, 14... Electrode terminal.

Claims (1)

【実用新案登録請求の範囲】 部品本体の両端から本体軸方向に沿つてリード
線を導出した電子部品の特性測定装置であつて、 前記電子部品のリード線を磁気吸着する磁石を
外周に等間隔で複数個有し定位置で回転する回転
ドラムと、 この回転ドラムの外周近傍の定位置に配置さ
れ、その中心点より若干離れた偏心点を中心とし
て前記回転ドラムと同一方向に、かつ、その偏心
点から最も遠い周面が前記回転ドラム側に来たと
き前記回転ドラムと同一周速で回転して回転ドラ
ム外周上に吸着された電子部品のリード線を、回
転ドラムとでもつて適宜挟持してリード線に通電
する測定端子とを具備したことを特徴とする電子
部品特性測定装置。
[Scope of Claim for Utility Model Registration] A characteristic measuring device for an electronic component in which lead wires are led out from both ends of the component body along the axial direction of the component body, wherein magnets for magnetically attracting the lead wires of the electronic component are arranged at regular intervals around the outer circumference. A rotary drum having a plurality of rotary drums and rotating at a fixed position; When the circumferential surface farthest from the eccentric point comes to the rotating drum side, the lead wire of the electronic component rotated at the same circumferential speed as the rotating drum and adsorbed on the outer circumference of the rotating drum is appropriately clamped with the rotating drum. What is claimed is: 1. An electronic component characteristic measuring device comprising: a measuring terminal for supplying current to a lead wire;
JP5524984U 1984-04-13 1984-04-13 Electronic component characteristic measuring device Granted JPS60168077U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5524984U JPS60168077U (en) 1984-04-13 1984-04-13 Electronic component characteristic measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5524984U JPS60168077U (en) 1984-04-13 1984-04-13 Electronic component characteristic measuring device

Publications (2)

Publication Number Publication Date
JPS60168077U JPS60168077U (en) 1985-11-07
JPH0124632Y2 true JPH0124632Y2 (en) 1989-07-25

Family

ID=30577744

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5524984U Granted JPS60168077U (en) 1984-04-13 1984-04-13 Electronic component characteristic measuring device

Country Status (1)

Country Link
JP (1) JPS60168077U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4518174Y1 (en) * 1967-11-27 1970-07-24
JPS562572A (en) * 1979-06-20 1981-01-12 Matsushita Electric Ind Co Ltd Measuring instrument for characteristic of electronic parts

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4518174Y1 (en) * 1967-11-27 1970-07-24
JPS562572A (en) * 1979-06-20 1981-01-12 Matsushita Electric Ind Co Ltd Measuring instrument for characteristic of electronic parts

Also Published As

Publication number Publication date
JPS60168077U (en) 1985-11-07

Similar Documents

Publication Publication Date Title
KR101216105B1 (en) Apparatus for inspecting and sorting the characteristics of chip-type electronic part
JP3295097B2 (en) Rotating electrical contacts
WO2003005042A1 (en) Conductive contact
JP4159473B2 (en) Roller contact with conductive brush
JPH0124632Y2 (en)
TW345625B (en) Device and method for manufacturing display device
JP2008267865A (en) Manufacturing method and manufacturing equipment of magnetostriction-type torque sensor shaft
CN205483524U (en) Brush elasticity testing arrangement
JPS5745A (en) Commutator of small dc machine
WO2021036137A1 (en) Contact, contact structure, electronic device and charging device
JP3043318B2 (en) Power supply method and apparatus for continuous plating apparatus
JP3064854U (en) Hard chrome plating equipment for vertical rolls
JPH0632366B2 (en) Electric plating method on flexible printed wiring board
JPH0337132Y2 (en)
JPS60235074A (en) Contact piece of ic inspection apparatus
JPH0331382B2 (en)
JPH027882Y2 (en)
US2041067A (en) Testing apparatus
US6184613B1 (en) Electrode assembly, cathode device and plating apparatus including a gap configured to eliminate a concentration of a line of electrical force at a boundary between a cathode and plate forming surface of an object
JPS623912Y2 (en)
JPH0536698A (en) Jig for plating wafer
JPH085548Y2 (en) Thin film forming equipment
JPH0521550A (en) Testing apparatus for semiconductor device
JPH0352553B2 (en)
JPH08181363A (en) Magnetoresistive element and fixing method of magnetoresistive element