WO2021036137A1 - Contact, contact structure, electronic device and charging device - Google Patents

Contact, contact structure, electronic device and charging device Download PDF

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Publication number
WO2021036137A1
WO2021036137A1 PCT/CN2019/129053 CN2019129053W WO2021036137A1 WO 2021036137 A1 WO2021036137 A1 WO 2021036137A1 CN 2019129053 W CN2019129053 W CN 2019129053W WO 2021036137 A1 WO2021036137 A1 WO 2021036137A1
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WO
WIPO (PCT)
Prior art keywords
contact
layer
plating layer
metal
plating
Prior art date
Application number
PCT/CN2019/129053
Other languages
French (fr)
Chinese (zh)
Inventor
杨飞
宋彪
王越
董广立
刘玉友
曾森
Original Assignee
问问智能信息科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from CN201910782607.2A external-priority patent/CN110504573A/en
Priority claimed from CN201910798942.1A external-priority patent/CN110416782A/en
Priority claimed from CN201910795448.XA external-priority patent/CN110504574A/en
Priority claimed from CN201910831565.7A external-priority patent/CN110534949B/en
Priority claimed from CN201910831583.5A external-priority patent/CN110556644A/en
Application filed by 问问智能信息科技有限公司 filed Critical 问问智能信息科技有限公司
Publication of WO2021036137A1 publication Critical patent/WO2021036137A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70Coupling devices
    • H01R12/71Coupling devices for rigid printing circuits or like structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/03Contact members characterised by the material, e.g. plating, or coating materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted

Definitions

  • the present invention relates to electronic power technology, and more specifically, to a contact, a contact structure, an electronic device, and a charging device.
  • the existing electronic equipment is equipped with a charging interface
  • the charging device is equipped with a charging plug.
  • Both the charging interface and the charging head are equipped with clamping parts.
  • the charging plug can be inserted into the charging interface and held in the charging interface by the clamping part , So that the electronic device and the charging device are electrically connected.
  • the clamping part will be worn out.
  • the charging interface and the charging plug cannot achieve a stable connection, which is prone to problems such as loosening and power failure. , The use reliability is low.
  • embodiments of the present invention provide a contact, a contact structure, an electronic device, and a charging device to improve the reliability of the charging process.
  • an embodiment of the present invention provides a contact, the contact includes a magnetic element and a conductive layer, the conductive layer is on the outer side of the magnetic element, the magnetic element is disposed on a circuit board, and the conductive layer The layer is electrically connected to the circuit board.
  • the magnetic member includes a first base and a contact, the base and the contact are both cylindrical, the contact is connected to the base, and the axis of the base and the contact extend in the same direction, The diameter of the base is larger than the diameter of the contact, and the bottom surface of the base is connected to the circuit board.
  • the base and the contact are both cylindrical.
  • the base and the contact are coaxial.
  • the base and the contact are an integrally formed structure.
  • the conductive layer is a conductive material plating layer, and the conductive layer is formed on the outer surface of the magnetic member.
  • the conductive layer is a conductive anticorrosive plating layer.
  • the conductive layer includes an anti-corrosion metal layer, an acid copper layer or an acid nickel layer, a metal barrier layer, and an artificial sweat-resistant electrolytic metal layer, and the conductive anticorrosion layer, an acid copper layer or an acid nickel layer, and a metal barrier layer And the anti-artificial sweat electrolytic metal layer is sequentially formed on the outer surface of the magnetic member.
  • the corrosion-resistant metal layer is a coke copper plating layer or a neutral nickel plating layer.
  • the thickness of the anti-corrosion metal layer ranges from 8 ⁇ m to 10 ⁇ m.
  • the thickness of the acid copper layer ranges from 18 ⁇ m to 20 ⁇ m.
  • the outermost layer of the conductive layer is a plating layer that has been sealed.
  • the conductive layer is a metal shell, a containing cavity is formed in the metal shell, and the magnetic member is arranged in the containing cavity.
  • the metal shell includes a barrel-shaped main body and a second base
  • the receiving cavity is formed in the barrel-shaped main body
  • the bottom of the barrel-shaped main body is formed with an opening
  • the second base is formed in the barrel-shaped main body. At the edge of the opening.
  • the second base is ring-shaped and coaxial with the barrel-shaped main body, the outer diameter of the second base is larger than the outer diameter of the barrel-shaped main body, and the bottom surface of the second base is connected to the circuit
  • the board is welded and fixed so that the metal shell is electrically connected to the circuit board.
  • the magnetic member is closely attached to the inner wall of the barrel-shaped body.
  • the metal shell is a copper alloy shell.
  • a conductive anticorrosive coating is formed on the outer surface of the metal shell.
  • the conductive anticorrosive coating is a gold coating.
  • a first plating layer is formed on the surface of the magnetic member, and a second plating layer is formed on the surface of the metal casing.
  • the first plating layer is a coke copper layer and a nickel layer in order from the inside to the outside.
  • the thickness of the coke copper layer ranges from 18 ⁇ m to 20 ⁇ m
  • the thickness of the nickel layer ranges from 5 ⁇ m to 8 ⁇ m.
  • the second plating layer is an acid copper layer or an acid nickel layer, a metal barrier layer, and an artificial sweat-resistant electrolytic metal layer in order from the inside to the outside.
  • the thickness of the acid copper layer ranges from 3 ⁇ m to 5 ⁇ m.
  • the outermost layer of the first plating layer and the outermost layer of the second plating layer are plating layers that have been sealed.
  • the anti-artificial sweat electrolytic metal layer is a rhodium plating layer, a ruthenium plating layer, or a rhodium ruthenium alloy plating layer.
  • the thickness of the anti-artificial sweat electrolytic metal layer ranges from 0.75 ⁇ m to 1 ⁇ m.
  • the metal barrier layer is a palladium plating layer, a platinum plating layer, a palladium cobalt alloy plating layer, a palladium platinum alloy plating layer, a palladium silver alloy plating layer, a palladium gold alloy plating layer, or a palladium indium alloy plating layer.
  • the thickness of the metal barrier layer ranges from 0.6 ⁇ m to 1 ⁇ m.
  • an anti-oxidation metal layer is further provided between the acid copper layer and the metal barrier layer.
  • the anti-oxidation metal layer is a silver plating layer, a tin-silver alloy plating layer, or a copper-tin-zinc alloy plating layer.
  • the thickness of the anti-oxidation metal layer ranges from 2 ⁇ m to 4.5 ⁇ m.
  • a conductive metal layer is further provided between the metal barrier layer and the anti-artificial sweat electrolysis metal layer.
  • the conductive metal layer is a silver plating layer, a tin-silver alloy plating layer, a copper-tin-zinc alloy plating layer, or a gold plating layer.
  • the thickness of the conductive metal layer ranges from 0.5 ⁇ m to 0.75 ⁇ m.
  • an easy-to-weld metal layer is formed outside the artificial sweat-resistant electrolytic metal layer.
  • the solderable metal plating layer is a gold plating layer, a tin plating layer, a copper-tin-zinc alloy plating layer, or a tin-silver alloy plating layer.
  • the thickness of the easy-to-weld metal layer ranges from 0.125 ⁇ m to 0.25 ⁇ m.
  • the magnetic member is a neodymium iron boron magnet or a samarium cobalt magnet.
  • an embodiment of the present invention provides a contact structure, and the contact structure includes:
  • a contact piece connected to the frame
  • the contact is connected to the frame through an elastic member, and the elastic member is used to apply an elastic force to the contact to position the contact relative to the frame, and to make the contact and the contact
  • the element has a set distance in the first direction, and the elastic element stretches along the first direction under the action of an external force so that the contact can contact the contact element and form an electrical connection.
  • a cavity is formed in the frame, the contact member is located in the cavity, and the elastic member closes the gap between the contact and the frame to seal the cavity.
  • a first clamping portion is formed on the contact, the first clamping portion extends along the circumferential direction of the contact, the elastic member is plate-shaped, and a connection is formed on the elastic member Hole and a second clamping portion, the second clamping portion is provided at the edge of the connecting hole and extending along the circumference of the connecting hole, the first clamping portion and the second clamping portion Card connection.
  • the first clamping portion is a tenon
  • the second clamping portion is a clamping slot
  • a third clamping portion is formed on the outer edge of the elastic member, a fourth clamping portion is formed on the frame, and the third clamping portion and the fourth clamping portion are connected in a clamping manner.
  • the third clamping portion is a tenon
  • the fourth clamping portion is a clamping slot
  • a groove is further formed on the elastic member, and the groove extends along the circumferential direction of the connecting member to surround the connecting hole, and there is a setting between the groove and the connecting hole. distance.
  • the elastic piece is a silicone piece.
  • the elastic member is an elastic piece on the circuit board.
  • an embodiment of the present invention provides an electronic device, and the electronic device includes:
  • the main body of the electronic equipment The main body of the electronic equipment.
  • an embodiment of the present invention provides a charging device, and the charging device includes:
  • the main body of the charging device The main body of the charging device.
  • the contact includes a magnetic element and a conductive layer, the conductive layer is on the outer side of the magnetic element, the magnetic element is disposed on a circuit board, and the conductive layer is electrically connected to the circuit board. connection. Therefore, when using the contact charging of this embodiment, the contact on the electronic device can be adsorbed and positioned with the contact on the charging device under the suction effect of the magnetic member, so as to realize the electrical connection between the electronic device and the charging device. In addition, there will be no wear during the process of connecting or separating the contacts on the electronic device with the contacts on the charging device, and the adsorption force will not decrease during long-term use, which improves the contact and charging on the electronic device. The stability and reliability of the connection of the contacts on the equipment. At the same time, since the conductive layer is formed on the outer side of the magnetic member, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of electronic equipment and charging equipment.
  • FIG. 1 is a schematic cross-sectional view of the contact structure of the first embodiment of the present invention.
  • FIG. 2 is a schematic diagram of the contact structure of the first embodiment of the present invention.
  • FIG. 3-6 are schematic diagrams of the contact plating layer of the first embodiment of the present invention.
  • FIG. 7 is a schematic diagram of an electrolysis test of artificial sweat according to an embodiment of the present invention.
  • FIG. 8 is a schematic cross-sectional view of the contact of the second embodiment of the present invention.
  • FIG. 9 is a schematic diagram of the metal shell plating layer in the contact of the second embodiment of the present invention.
  • FIG. 10 is a schematic diagram of the plating layer of the magnetic element in the contact of the second embodiment of the present invention.
  • FIG. 11 is a schematic cross-sectional view of the contact structure of the second embodiment of the present invention.
  • FIG. 13 is a schematic diagram of the switching of the contacts of the fourth embodiment of the present invention.
  • FIG. 15 is a schematic diagram of an electronic device and a charging device in a use state according to a fourth embodiment of the present invention.
  • 16 is a schematic diagram of a partial structure of an electronic device according to a fifth embodiment of the present invention.
  • Fig. 17 is a partial structural diagram of the contact structure of the fifth embodiment of the present invention.
  • the terms “installed”, “connected”, “connected”, “fixed” and other terms should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or a whole; It can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediary, and it can be an internal communication between two elements or an interaction relationship between two elements, unless specifically defined otherwise.
  • installed can be a fixed connection, a detachable connection, or a whole
  • It can be a mechanical connection or an electrical connection
  • it can be a direct connection or an indirect connection through an intermediary, and it can be an internal communication between two elements or an interaction relationship between two elements, unless specifically defined otherwise.
  • the specific meaning of the above-mentioned terms in the present utility model can be understood according to specific circumstances.
  • any range described in the present invention includes an end value and any value between the end values, and any sub-range formed by the end value or any value between the end values.
  • embodiments of the present invention provide a contact and a contact structure, which include a magnetic element and a conductive layer.
  • the conductive layer is on the outer layer of the magnetic member
  • the magnetic member is arranged on the circuit board of the charging device or the electronic device
  • the conductive layer is electrically connected to the circuit board.
  • the conductive layer may be a plating layer formed on the surface of the magnetic member, or may be a metal shell covering the magnetic member.
  • the magnetic part of this embodiment may be a neodymium iron boron magnet or a samarium cobalt magnet, but This embodiment does not limit this.
  • the magnetic part can be set on the circuit board of the electronic device and the charging device. Since the conductive layer is electrically connected to the circuit board of the electronic device and the charging device, when the electronic device needs to be charged, the The contacts are in contact with the contacts on the charging equipment, and the magnetic parts can make the contacts on the electronic equipment and the contacts on the charging equipment adsorb and position. Therefore, when the contacts on the electronic equipment and the charging equipment When the contacts are in contact, the electronic device and the charging device can be electrically connected, so that the charging device can charge the electronic device. Since the contacts on the electronic device and the contacts on the charging device are relatively positioned by adsorption, there will be no wear and tear during the process of connecting or separating the contacts on the electronic device and the contacts on the charging device.
  • the adsorption force will not decrease during long-term use, which improves the stability of the connection between the contacts on the electronic equipment and the contacts on the charging equipment, avoids the problems of loosening and power failure, and improves the reliability of the use of the contacts.
  • the conductive layer is formed on the outer side of the magnetic member, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of electronic equipment and charging equipment.
  • FIG. 1 is a schematic cross-sectional view of the contact structure of the first embodiment of the present invention.
  • Fig. 2 is a schematic diagram of the contact structure of the second embodiment of the present invention.
  • the contact structure 1 is the contact 11 and the circuit board 12.
  • the contact 11 includes a magnetic member 111 and a conductive layer 112. Wherein, the conductive layer 112 is on the outer layer of the magnetic member 111, the magnetic member 111 is disposed on the circuit board 12 of the charging device or the electronic device, and the conductive layer 112 is electrically connected to the circuit board 12.
  • the magnetic member 111 is a cylinder. It should be understood that the shape of the magnetic member is not specifically limited in this embodiment, and other shapes such as cubes can be applied in this embodiment.
  • the conductive layer 112 is a conductive material plating layer, which is formed on the outer surface of the magnetic member 111.
  • the conductive layer 112 is a conductive anticorrosive coating.
  • the conductive layer 112 is a gold coating to improve the conductivity and corrosion resistance of the conductive layer.
  • the conductive layer 112 may also be a nickel plating layer, a copper plating layer, or a nickel copper alloy plating layer, etc., which is not limited in this embodiment.
  • the electrical connection between the charging device and the electronic device is achieved through the circuit board 12 of the contact 1, and the contact 1 on the electronic device and the contact 1 on the charging device are relatively positioned by the adsorption of the magnetic member.
  • the contact 1 on the device and the contact 1 on the charging device will not be worn during the process of connecting or separating, and the adsorption force will not decrease during long-term use, which improves the contact 1 on the electronic device and the charging device
  • the stability of the connection of the contact 1 on the upper side avoids the problems of loosening and power failure, and improves the reliability of the use of the contact 1.
  • the conductive layer 12 is formed on the outer surface of the magnetic member 11, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of electronic equipment and charging equipment.
  • 3-6 are schematic diagrams of the contact plating layer of the third embodiment of the present invention.
  • the contact 11 includes a magnetic member 31 and a conductive layer 32.
  • the conductive layer 32 includes an anti-corrosion metal layer 321, an acid copper layer or an acid nickel layer 322, a metal barrier layer 323, and an anti-artificial sweat electrolysis metal layer 324.
  • an anti-corrosion metal layer 321, an acid copper layer or an acid nickel layer 322, a metal barrier layer 323, and an anti-artificial sweat electrolytic metal layer 324 are sequentially formed on the outer surface of the magnetic member.
  • the magnetic member 31 may be cylindrical as shown in FIG. 1, or may have a shape as shown in FIG. 2, or other shapes, which is not limited in this embodiment.
  • the corrosion-resistant metal layer 321 is plated on the surface of the magnetic member 31 to avoid corrosion of the magnetic member 31 by the acid copper layer or the acid nickel layer 322. Electroplating the acid copper layer or the acid nickel layer 322 on the corrosion-resistant metal layer 321, on the one hand, is to fill the small pores on the surface of the magnetic part 31 to make the surface smooth and flat, reduce the surface roughness of the magnetic part 31, and improve other metals.
  • the adhesion of the coating; on the other hand, the gloss of the overall coating can be controlled, and the surface gloss of the contact 3 meets the required requirements.
  • the metal barrier layer 323 is electroplated on the acid copper layer or the acid nickel layer 322.
  • the electroplating process can be implemented using a conventional electroplating process.
  • the thickness of the acid copper layer 322 ranges from 10 ⁇ m to 100 ⁇ m, 100 ⁇ m (for example, 10 ⁇ m, 18 ⁇ m, 18.5 ⁇ m, 19 ⁇ m, 19.5 ⁇ m, 20 ⁇ m, or 100 ⁇ m, etc.); in a further embodiment The thickness of the acid copper layer 322 is 18 ⁇ m-20 ⁇ m (for example, 18 ⁇ m, 18.5 ⁇ m, 19 ⁇ m, 19.5 ⁇ m, or 20 ⁇ m, etc.).
  • the anti-artificial sweat electrolytic metal layer 324 is a rhodium (Rh) plating layer, a ruthenium (Ru) plating layer, or a rhodium ruthenium (RhRu) alloy plating layer.
  • the anti-artificial sweat electrolysis metal layer 324 is a RhRu alloy coating.
  • the thickness of the anti-artificial sweat electrolytic metal layer 324 ranges from 0.75 ⁇ m to 100 ⁇ m (for example, 0.75 ⁇ m, 0.8 ⁇ m, 0.85 ⁇ m, 0.9 ⁇ m, 1 ⁇ m, 10 ⁇ m, or 100 ⁇ m, etc.); in a further step In the implementation manner, the thickness of the anti-artificial sweat electrolytic metal layer 324 ranges from 0.75 ⁇ m to 1 ⁇ m (for example, 0.75 ⁇ m, 0.8 ⁇ m, 0.85 ⁇ m, 0. ⁇ m9, or 1 ⁇ m, etc.).
  • the corrosion-resistant metal layer 321 is a coke copper plating layer or a neutral nickel layer. In a further implementation manner, the corrosion-resistant metal layer 321 is a coke copper plating layer. Since the magnetic parts 31 are easily corroded when they are in contact with strong alkaline substances, and the coke copper electroplating solution is neutral, electroplating the coke copper coating on the surface of the magnetic parts 31 can effectively block the acid copper electroplating solution and the magnetic parts 31 on the one hand. In order to ensure that the magnetic part 31 is not corroded, on the other hand, since the scorched copper coating has good adhesion with the magnetic part 31, the electroplated scorched copper coating can improve the adhesion of subsequent other metal coatings.
  • the thickness of the corrosion-resistant metal layer 321 ranges from 8 ⁇ m to 100 ⁇ m (for example, 8 ⁇ m, 8.5 ⁇ m, 9 ⁇ m, 9.5 ⁇ m, 10 ⁇ m, 50 ⁇ m, or 100 ⁇ m, etc.); in a further implementation manner, the corrosion-resistant metal layer The thickness of the layer 321 ranges from 8 ⁇ m to 10 ⁇ m (for example, 8 ⁇ m, 8.5 ⁇ m, 9 ⁇ m, 9.5 or 10 ⁇ m, etc.).
  • the metal barrier layer 323 may be a palladium (Pd) layer or platinum (Pt).
  • the metal barrier layer in order to improve the heat resistance of the coating on the surface of the magnetic member 31 and to prevent the coating on the surface of the magnetic member 31 from bursting, the metal barrier layer may be a Pd coating.
  • the thickness of the metal barrier layer 323 ranges from 0.4 ⁇ m to 100 ⁇ m (for example, 0.4 ⁇ m, 0.6 ⁇ m, 0.63 ⁇ m, 0.65 ⁇ m, 0.7 ⁇ m, 0.8 ⁇ m, 1 ⁇ m, 10 ⁇ m, 50 ⁇ m, or 100 ⁇ m, etc.); In a further implementation, the thickness of the metal barrier layer 323 ranges from 0.6 ⁇ m to 0.75 ⁇ m (for example, 0.6 ⁇ m, 0.63 ⁇ m, 0.65 ⁇ m, 0.7 ⁇ m, or 0.75 ⁇ m, etc.).
  • the outermost layer of the conductive layer 32 is sealed.
  • the sealing treatment refers to the use of a sealing agent to seal the micropores on the surface of the outermost plating layer.
  • the sealing treatment of the plating layer can not only protect the outermost plating layer from oxidation, improve the welding effect of the plating layer during SMT (Surface Mount Technology), but also prevent air from oxidizing the magnetic parts 31 through the microholes, thereby preventing SMT At this time, the plating layer on the surface of the magnetic member 31 bursts.
  • the outermost layer of the conductive layer 32 refers to a metal layer that is resistant to artificial sweat electrolysis.
  • the coating of traditional magnetic parts is prone to burst due to high temperature, so that the traditional magnet base material cannot be SMT.
  • the traditional electroplated magnetic parts SMT are subjected to a charging artificial sweat electrolysis test, and all the coatings will be electrolyzed within 1 minute, which will cause the charging contact structure to fail to be charged.
  • This implementation method not only improves the flatness and smoothness of the surface of the magnetic part, but also realizes magnetism by covering the surface of the magnetic part with an anti-corrosion metal layer, an acid copper layer or an acid nickel layer, a metal barrier layer, and an anti-artificial sweat electrolytic metal layer.
  • the parts After SMT, the parts have the performance of salt spray resistance test, artificial sweat resistance static test, and artificial sweat resistance electrolysis test, so that the contacts cannot be subjected to SMT or cannot be charged after SMT.
  • the conductive layer 32 further includes an anti-oxidation metal layer 325, wherein the anti-oxidation metal layer 325 is formed between the acid copper layer 322 and the metal barrier layer 323.
  • the oxidation-resistant metal coating 325 may be a silver (Ag) coating, a tin-silver (SnAg) alloy coating, or a copper-tin-zinc (CuSnZn) alloy coating.
  • the anti-oxidation metal layer 325 is a CuSnZn plating layer to improve the anti-oxidation effect of the anti-oxidation metal layer 325.
  • the thickness of the anti-oxidation metal layer 325 ranges from 1 ⁇ m to 100 ⁇ m (for example, 1 ⁇ m, 2 ⁇ m, 2.5 ⁇ m, 3 ⁇ m, 3.5 ⁇ m, 4 ⁇ m, 4.5 ⁇ m, 10 ⁇ m, 50 ⁇ m, or 100 ⁇ m, etc.); In an implementation manner, the thickness of the oxidation-resistant metal layer 325 ranges from 2 ⁇ m to 4.5 ⁇ m (for example, 2 ⁇ m, 2.5 ⁇ m, 3 ⁇ m, 3.5 ⁇ m, 4 ⁇ m, 4.5 ⁇ m, etc.).
  • the conductive layer 32 further includes a conductive metal layer 326.
  • the conductive metal layer 326 is formed between the metal barrier layer 323 and the anti-artificial sweat electrolysis metal layer 324.
  • the conductive metal layer 326 may be a silver (Ag) plating layer, a tin-silver (SnAg) alloy plating layer, a copper tin zinc (CuSnZn) alloy plating layer, or a gold (Au) plating layer.
  • the conductive metal layer 326 is an Au plating layer.
  • the Au coating has the characteristics of low impedance and good conductivity, and the Au coating can improve the salt spray test and artificial sweat static test performance of the overall coating.
  • the thickness of the conductive metal layer 326 ranges from 0.3 ⁇ m to 100 ⁇ m (for example, 0.3 ⁇ m, 0.5 ⁇ m, 0.55 ⁇ m, 0.6 ⁇ m, 0.65 ⁇ m, 0.7 ⁇ m, 0.75 ⁇ m, 10 ⁇ m, or 100 ⁇ m, etc.). In a further implementation manner, the thickness of the conductive metal layer 326 ranges from 0.5 ⁇ m to 0.75 ⁇ m (for example, 0.5 ⁇ m, 0.55 ⁇ m, ⁇ m 0.6, 0.65 ⁇ m, 0.7 ⁇ m, or 0.75 ⁇ m, etc.).
  • the conductive layer 32 further includes an easy-to-weld metal layer 327.
  • the easy-to-weld metal layer 327 is formed on the outer side of the artificial sweat resistant metal layer 324.
  • the solderable metal plating layer 327 may be a gold (Au) plating layer, a tin (Sn) plating layer, a copper tin zinc (CuSnZn) alloy plating layer, or a tin silver (SnAg) alloy plating layer.
  • the easily weldable metal layer 327 is an Au plating layer to improve the conductivity, weldability, salt spray test resistance and artificial sweat static test performance of the plating layer. Since the solder can easily infiltrate the Au plating layer during SMT, the use of the Au plating layer for the easily solderable metal layer 327 can improve the soldering performance of the overall plating layer, so as to quickly achieve soldering.
  • the thickness of the easily solderable metal plating layer 327 ranges from 0.125 ⁇ m to 100 ⁇ m (for example, 0.125 ⁇ m, 0.15 ⁇ m, 0.18 ⁇ m, 0.20 ⁇ m, 0.25 ⁇ m, 10 ⁇ m, or 100 ⁇ m, etc.); in a further embodiment The thickness of the easily solderable metal plating layer 327 ranges from 0.125 ⁇ m to 0.25 ⁇ m (for example, 0.125 ⁇ m, 0.15 ⁇ m, 0.18 ⁇ m, 0.20 ⁇ m, 10 ⁇ m, 0.25 ⁇ m, etc.).
  • this embodiment also provides a method for preparing the contact 11 of the first embodiment, which includes: selecting a magnetic member 31 of a specific specification; electroplating on the surface of the magnetic member 31 to form a conductive layer 32; and performing a method on the surface of the conductive layer 32.
  • the sealing process is performed to obtain a plated magnetic piece 31; the plated magnetic piece 31 is subjected to a magnetization treatment to obtain a contact 11.
  • the manufacturing method of the contact 11 further includes: SMT the plated magnetic part 31 into the circuit board, and then perform magnetization treatment on the plated magnetic part 31 to obtain a contact structure.
  • the plated magnetic component 31SMT is applied to the circuit board and then magnetized; this not only solves the problem of attracting other components in the traditional SMT with magnetic magnet, but also solves the high temperature demagnetization of the magnetic magnet in SMT It is convenient to contact the SMT to the circuit board to form a contact structure.
  • the contact structure 1 shown in FIG. 2 is described by taking the magnetic member as a cylindrical shape as an example.
  • the contact structure includes: a magnetic member 31 (E.g. neodymium iron boron magnet), the surface of the magnetic part 31 is covered with a plating layer 32; the plating layer 32 consists of coke copper plating, acid copper layer, CuSnZn plating, Pd plating, first Au plating, RhRu alloy plating, and second plating from the inside to the outside. Au plating.
  • the thickness of the scorched copper coating is 8 ⁇ m-10 ⁇ m, the thickness of the acid copper layer is 18 ⁇ m-20 ⁇ m, the thickness of the CuSnZn coating is 2 ⁇ m-4.5 ⁇ m, and the thickness of the Pd coating is 0.6 ⁇ m-0.75 ⁇ m.
  • the thickness range is 0.5 ⁇ m-0.75 ⁇ m, the thickness range of the RhRu alloy plating layer is 0.75 ⁇ m-1 ⁇ m, and the thickness range of the second Au plating layer is 0.125 ⁇ m-0.25 ⁇ m.
  • the second Au plating layer is the plating layer after the sealing treatment.
  • a method for preparing a contact structure includes the following steps:
  • Step 1 Preparation of the plated magnetic part 31.
  • the magnetic part 31 is a neodymium iron boron magnet:
  • the glue may be 502 glue or other glues that can realize pasting.
  • the glue may be 502 glue or other glues that can realize pasting.
  • ⁇ 5mm abrasive grain lead angle for the quasi-cylindrical neodymium iron boron that passed the test; pickling the quasi-cylindrical neodymium iron boron after the lead angle, and then ultrasonic cleaning; obtain the neodymium iron boron of specific specifications;
  • the specifications of NdFeB are NdFeB with clean surface and specific dimensions.
  • the aqueous solution for pickling is nitric acid, the volume concentration is 5%, and the pickling time can be 30S.
  • the coating appearance inspection standard is: the coating surface must not have chipping, scorching, cracking, peeling, wrinkling, knife marks and other undesirable phenomena, the coating must be uniform, and the surface must be smooth and smooth.
  • the overall size of the coated NdFeB should be controlled within the tolerance range of +/-0.05mm.
  • Step 2 Carrying out tape-carrying packaging on the plated magnetic parts, and then performing magnetizing treatment to obtain a contact structure.
  • the carrier tape packaging in this embodiment means that the electroplated products are placed in the holes of the carrier tape according to the placement requirements, and the product is covered with a transparent top film.
  • the edge of the top film is glued to the carrier tape, and the carrier tape is attached at the same time.
  • the implementation method of the electroplating process in this embodiment Put the quasi-cylindrical neodymium iron boron and the plating steel balls into the electroplating bath together, and conduct electroplating with current.
  • Co-plating steel balls is mainly to prevent the phenomenon of lamination of small-sized quasi-cylindrical NdFeB, and the problem of uneven plating when the current is small.
  • Each coating has a corresponding electroplating bath. After each coating is plated, the thickness of the coating needs to be measured. After the thickness of the coating reaches the required requirements, it is placed in the next electroplating bath, and electroplating is carried out in sequence.
  • the surface of the magnetic part is provided with a corrosion-resistant metal layer, an acid copper layer or an acid nickel layer, a metal barrier layer, and an anti-artificial sweat electrolytic metal layer, etc., so that the surface of the contact has good flatness and smoothness, It can also protect the contacts through salt spray test, artificial sweat static test and charging artificial sweat electrolysis test.
  • the contact structure 1 shown in Figure 2 the magnetic part in the contact 11 is connected to the circuit board 12 by surface mount, the surface of the magnetic part is covered with a plating layer, and the plating layer from the inside to the outside is a scorched copper plating layer and an acid copper layer.
  • the second Au plating layer is the plating layer after the sealing treatment (the magnetic part plating layer as shown in FIG. 6).
  • the preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that step 2 is different.
  • step 2 Put the plated neodymium iron boron SMT on the circuit board, and then magnetize the plated neodymium iron boron to obtain the contact structure.
  • the contact structure 1 shown in Figure 2 the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer.
  • the plating layer from the inside to the outside is a pyro-copper plating layer and an acid copper layer.
  • Pd coating, and RhRu alloy coating (magnetic part coating as shown in Figure 3).
  • the thickness of the scorched copper coating is 8 ⁇ m-10 ⁇ m
  • the thickness of the acid copper layer is 18 ⁇ m-20 ⁇ m
  • the thickness of the Pd coating is 0.6 ⁇ m-0.75 ⁇ m
  • the thickness of the RhRu alloy coating is 0.75 ⁇ m-1 ⁇ m
  • the thickness of the RhRu alloy coating is Plating after sealing.
  • the preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
  • Step 2 Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
  • the contact structure 1 shown in Figure 2 the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer; the plating layer is a neutral nickel layer and an acid copper layer from the inside to the outside.
  • Layer, Pd coating, RhRu alloy coating (magnetic part coating as shown in Figure 3).
  • the thickness range of the neutral nickel coating is 8 ⁇ m-10 ⁇ m
  • the thickness of the acid copper layer is 18 ⁇ m-20 ⁇ m
  • the thickness of the Pd coating is 0.6 ⁇ m-0.75 ⁇ m
  • the thickness of the RhRu alloy coating is 0.75 ⁇ m-1 ⁇ m
  • the thickness of the RhRu alloy coating is It is the plating layer after sealing.
  • the RhRu alloy coating is a coating that undergoes sealing treatment.
  • the preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
  • the sealing agent is processed to obtain the neodymium iron boron with plating layer.
  • Step 2 Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
  • the contact structure 1 shown in Figure 2 the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer; the plating layer from the inside to the outside is a pyro-copper plating layer and an acid copper layer. , CuSnZn coating, Pd coating, RhRu alloy coating (magnetic part coating as shown in Figure 4).
  • the thickness of the scorched copper coating is 8 ⁇ m-10 ⁇ m
  • the thickness of the acid copper layer is 18 ⁇ m-20 ⁇ m
  • the thickness of CuSnZn coating is 2 ⁇ m-4.5 ⁇ m
  • the thickness of Pd coating is 0.6 ⁇ m-0.75 ⁇ m
  • the thickness of RhRu alloy coating The range is 0.75 ⁇ m-1 ⁇ m
  • the RhRu alloy coating is the coating after sealing.
  • the preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
  • the sealing agent is used for sealing treatment to obtain neodymium iron boron with plating layer.
  • Step 2 Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
  • the contact structure 1 shown in Figure 2 the magnetic part in the contact 11 is connected to the circuit board 12 by surface mount, and the surface of the magnetic part is covered with a plating layer; the plating layer is scorched copper plating layer (that is, anti-corrosion) from the inside to the outside.
  • Corrosion metal layer includes acid copper layer, Pd plating layer (ie metal barrier layer), first Au plating layer (ie conductive metal layer), RhRu alloy plating layer (ie anti-artificial sweat electrolytic metal layer).
  • the thickness of the scorched copper coating is 8 ⁇ m-10 ⁇ m
  • the thickness of the acid copper layer is 18 ⁇ m-20 ⁇ m
  • the thickness of the Pd coating is 0.6 ⁇ m-0.75 ⁇ m
  • the thickness of the first Au coating is 0.5 ⁇ m-0.75 ⁇ m
  • RhRu alloy The thickness of the plating layer ranges from 0.75 ⁇ m to 1 ⁇ m
  • the RhRu alloy plating layer is the plating layer after the sealing treatment.
  • the preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
  • step 1:7) electroplating is performed on the neodymium iron boron of specific specifications, and then the scorched copper plating layer, the acid copper layer, the Pd plating layer, the first Au plating layer, and the RhRu alloy plating layer are sequentially plated; and then the RhRu alloy plating layer
  • the hole sealing agent is used for sealing treatment to obtain the neodymium iron boron with plating layer.
  • Step 2 Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
  • the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer.
  • a samarium cobalt magnet is used as the magnetic member.
  • the coating on the surface of the samarium cobalt magnet is from the inside to the outside in order of coke copper coating (also known as anti-corrosion metal layer), acid copper layer, Pd coating (also known as metal barrier layer), RhRu alloy coating (also known as anti-artificial sweat electrolytic metal layer) ), the second Au plating layer (that is, the easy-to-weld metal layer).
  • the thickness of the scorched copper coating is 8 ⁇ m-10 ⁇ m
  • the thickness of the acid copper layer is 18 ⁇ m-20 ⁇ m
  • the thickness of the Pd coating is 0.6 ⁇ m-0.75 ⁇ m
  • the thickness of the RhRu alloy coating is 0.75 ⁇ m-1 ⁇ m
  • the second Au coating The thickness range is 0.125 ⁇ m-0.25 ⁇ m
  • the second Au plating layer is the plating layer after sealing.
  • the preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
  • the porogen is subjected to sealing treatment to obtain samarium cobalt with a plating layer.
  • Step 2 Put the plated samarium cobalt SMT into the circuit board, and then magnetize the plated samarium cobalt to obtain a contact structure.
  • the contact structure 1 shown in Figure 2 the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer; the plating layer from the inside to the outside is a pyro-copper plating layer and an acid copper layer.
  • CuSnZn coating, Pd coating, first Au coating, RhRu alloy coating, and second Au coating (magnetic part coating as shown in Figure 6).
  • the thickness of the scorched copper coating is 8 ⁇ m-100 ⁇ m
  • the thickness of the acid copper layer is 10 ⁇ m-100 ⁇ m
  • the thickness of the CuSnZn coating is 1 ⁇ m-100 ⁇ m
  • the thickness of the Pd coating is 0.4 ⁇ m-100 ⁇ m
  • the thickness of the first Au coating is 0.3 ⁇ m-100 ⁇ m.
  • the thickness of the RhRu alloy plating layer is 0.75 ⁇ m-100 ⁇ m
  • the thickness of the second Au plating layer is 0.125 ⁇ m-100 ⁇ m
  • the second Au plating layer is the plating layer after the sealing treatment.
  • the preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
  • step 1:7) electroplating is performed on the neodymium iron boron of specific specifications, and then the scorched copper plating layer, acid copper layer, CuSnZn plating layer, Pd plating layer, first Au plating layer, RhRu alloy plating layer, and the second Au plating layer; then on the second Au plating layer, a hole sealing agent is used for hole sealing treatment to obtain a neodymium iron boron plating layer.
  • Step 2 Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
  • Fig. 7 is a schematic diagram of an artificial sweat electrolysis test according to an embodiment of the present invention.
  • the electronic device is an earphone and the charging device is a charging box as an example. It should be understood that this embodiment does not limit this.
  • the standard for passing the artificial sweat electrolysis test the damage time of the coating is required to be ⁇ 2min.
  • the standard for passing the salt spray test is: the appearance and function are the same as before the salt spray test, and there is no change. Generally, the appearance should not have rust, corrosion and discoloration.
  • the charging contact structure of this embodiment has passed the above-mentioned artificial sweat electrolysis test, salt spray test and artificial sweat static test. Moreover, the charging contact structures of the fourth and fifth embodiments have the best performance in the artificial sweat electrolysis test, the salt spray test and the artificial sweat static test.
  • the embodiment of the present invention not only improves the flatness and smoothness of the surface of the magnetic part by electroplating a special functional coating on the magnetic part, but also realizes the SMT of the magnetic part, and solves the problem that the magnet cannot be SMT in the existing charging contact structure.
  • the charging contact structure has the performance of salt spray resistance test, artificial sweat resistance static test, and artificial sweat electrolysis test performance, which solves the problem of charging artificial sweat electrolysis test after the traditional magnet electroplating process SMT. All coatings will be tested within 1 minute. Electrolysis causes the problem of not being able to charge.
  • Fig. 8 is a schematic cross-sectional view of the contact of the second embodiment of the present invention.
  • Fig. 9 is a schematic diagram of the metal shell plating layer in the contact of the second embodiment of the present invention.
  • FIG. 10 is a schematic diagram of the plating layer of the magnetic element in the contact of the second embodiment of the present invention.
  • 11 is a schematic cross-sectional view of the contact structure of the second embodiment of the present invention.
  • the contact 8 includes a magnetic member 81 and a conductive layer 82.
  • the conductive layer 82 is on the outer layer of the magnetic member 81.
  • the conductive layer 82 is a metal shell, and a containing cavity is formed in the metal shell, and the magnetic member 81 is arranged in the containing cavity.
  • the magnetic member 81 and the metal casing 82 may be cylindrical, and optionally, the magnetic member 81 and the metal casing 82 are coaxial. It should be understood that this embodiment does not specifically limit the shape of the magnetic member, and other shapes such as cubes can be applied in this embodiment.
  • the charging device and the electronic device are electrically connected through the contact 8, and the contact 8 on the electronic device and the contact 8 on the charging device are adsorbed by the magnetic member 81 Relative positioning, therefore, the contact 8 on the electronic device and the contact 8 on the charging device will not be worn during the connection or separation process, and the adsorption force will not be reduced during long-term use, which improves the electronic equipment
  • the stability of the connection between the contact 8 and the contact 8 on the charging device avoids the problems of loosening and power failure, and improves the reliability of the use of the contact 8.
  • the metal shell 82 is formed on the outer surface of the magnetic member 81, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of electronic equipment and charging equipment.
  • the surface of the magnetic element 81 is provided with a first plating layer; the surface of the metal shell 82 is provided with a second plating layer, and the metal shell 82 is sleeved outside the magnetic element 81 to connect the magnetic element 81 with the outside.
  • the power source conducts and conducts the magnetism of the magnetic member 81.
  • the second plating layer may be an acid copper layer, a metal barrier layer, and an artificial sweat-resistant electrolytic metal layer in order from the inside to the outside.
  • the implementation of the present invention is to electroplate an acid copper layer on the surface of the metal shell 82.
  • it is to make use of the good ductility of the acid copper layer to make the surface of the metal shell smooth and flat, reduce the surface roughness of the metal shell, and improve the performance of other metal coatings.
  • Adhesion on the other hand, it can control the matt degree of the second plating layer, so that the matt degree of the surface of the contact structure meets the required requirements.
  • the metal barrier layer has high density.
  • Electroplating the metal barrier layer on the acid copper layer is to effectively prevent the Cu layer on the surface of the metal shell from being released and diffused into other metal coatings, which will affect the performance of other metal coatings; on the other hand; It is to improve the salt spray resistance and artificial sweat resistance of the second coating static test.
  • Electroplating the anti-artificial sweat electrolytic metal layer outside the metal barrier layer, the anti-artificial sweat electrolytic metal layer is Rh, Ru, or RhRu alloy plating; this is to enhance the metal shell resistance to salt spray test, artificial sweat static test and artificial sweat during charging Performance of electrolysis test.
  • the electroplating process can all be implemented using a conventional electroplating process.
  • the contact of this embodiment can be used as a contact structure to be arranged in an electronic device or a charging device, so that the metal shell in the contact is electrically connected to the circuit board in the electronic device/charging device. Therefore, when the contact structure in the electronic device and the contact structure in the charging device are in contact with each other, the charging device can charge the electronic device.
  • this embodiment also provides another contact structure.
  • the contact structure includes a contact and a circuit board; both the magnetic component and the metal shell are connected to the circuit board by surface mounting .
  • the metal shell with the second plating layer is sleeved on the surface of the magnet substrate with the first plating layer, so that the magnet substrate and the metal shell are combined in the same structure, which has both a magnetic absorption function and a charging function, and then Reduce the space of the contact structure.
  • an acid copper layer, a metal barrier layer, and an anti-artificial sweat electrolytic metal layer are sequentially arranged on the surface of the metal shell to protect the magnet substrate and pass the salt spray test, artificial sweat static test and artificial sweat electrolysis test .
  • the anti-artificial sweat electrolysis metal layer is a RhRu alloy plating layer.
  • the thickness of the anti-artificial sweat electrolytic metal layer ranges from 0.75 ⁇ m to 100 ⁇ m (for example, 0.75 ⁇ m, 0.8 ⁇ m, 0.85 ⁇ m, 0.9 ⁇ m, 1 ⁇ m, 10 ⁇ m, or 100 ⁇ m, etc.); in a further implementation In the manner, the thickness of the anti-artificial sweat electrolytic metal layer ranges from 0.75 ⁇ m to 1 ⁇ m (for example, 0.75 ⁇ m, 0.8 ⁇ m, 0.85 ⁇ m, 0.9 ⁇ m, or 1 ⁇ m).
  • the metal barrier layers are Pd coatings, Pt coatings, PdCo coatings, PdPt coatings, PdAg plating, PdAu plating, or PdIn plating.
  • the metal barrier layer in order to improve the salt spray resistance test and artificial sweat resistance static test performance of the metal shell; is a Pd plating layer. Since the Pd plating layer has heat resistance, it can prevent the second plating layer on the surface of the metal shell from bursting.
  • the thickness of the metal barrier layer ranges from 0.4 ⁇ m to 100 ⁇ m (for example, 0.4 ⁇ m, 0.6 ⁇ m, 0.63 ⁇ m, 0.65 ⁇ m, 0.7 ⁇ m, 0.8 ⁇ m, 1 ⁇ m, 10 ⁇ m, 50 ⁇ m, or 100 ⁇ m, etc.); In a further implementation manner, the thickness of the metal barrier layer ranges from 0.75 ⁇ m to 1 ⁇ m (for example, 0.75 ⁇ m, 0.8 ⁇ m, 0.85 ⁇ m, 0.9 ⁇ m, or 1 ⁇ m, etc.).
  • the second plating layer further includes: an easy-to-weld metal layer provided on the artificial sweat-resistant electrolytic metal layer.
  • the easy-to-weld metal layer is Au, Sn, CuSnZn, or SnAg plating.
  • the weldable metal layer is an Au plating layer. The Au plating layer improves the soldering performance of the second plating layer, because SMT is the solder that can easily infiltrate the Au plating layer, which facilitates rapid soldering.
  • the thickness of the easily solderable metal layer ranges from 0.125 ⁇ m to 100 ⁇ m (for example, 0.125 ⁇ m, 0.15 ⁇ m, 0.18 ⁇ m, 0.20 ⁇ m, 0.25 ⁇ m, 10 ⁇ m, or 100 ⁇ m, etc.); in a further embodiment Wherein, the thickness of the easily solderable metal layer ranges from 0.125 ⁇ m to 0.25 ⁇ m (for example, 0.125 ⁇ m, 0.15 ⁇ m, 0.18 ⁇ m, 0.20 ⁇ m, 0.25 ⁇ m, etc.).
  • the second plating layer further includes: a conductive metal layer disposed between the metal barrier layer and the anti-artificial sweat electrolysis metal layer.
  • the conductive metal layer is Ag, SnAg, CuSnZn, or Au plating.
  • the conductive metal layer is an Au plating layer. The choice of Au plating as the conductive metal plating is due to the low impedance and good conductivity of the Au plating; on the other hand, the Au plating can improve the salt spray test and artificial sweat static test performance of the second plating.
  • the thickness of the conductive metal layer ranges from 0.3 ⁇ m to 100 ⁇ m (for example, 0.3 ⁇ m, 0.5 ⁇ m, 0.6 ⁇ m, 0.63 ⁇ m, 0.65 ⁇ m, 0.7 ⁇ m, 0.75 ⁇ m, 1 ⁇ m, 10 ⁇ m, 50 ⁇ m, or 100 ⁇ m. Etc.); In a further implementation manner, the thickness of the conductive metal layer ranges from 0.5 ⁇ m to 0.75 ⁇ m (for example, 0.5 ⁇ m, 0.6 ⁇ m, 0.63 ⁇ m, 0.65 ⁇ m, 0.7 ⁇ m, or 0.75 ⁇ m, etc.).
  • the first plating layer is a coke copper layer and a Ni layer in order from the inside to the outside.
  • the reason for electroplating the scorched copper layer on the surface of the magnet substrate is that the Cu material is soft, and it is easy to be evenly electroplated on a small-sized magnet substrate, and there are few problems such as surface bubbles and edge bursts.
  • Electroplating the Ni layer on the coke copper layer, on the one hand, is to protect the coke copper layer from copper from being oxidized, and on the other hand, to facilitate the soldering of the magnet base material and the solder during SMT, that is, to improve the soldering performance.
  • the thickness of the burnt copper layer ranges from 3 ⁇ m to 100 ⁇ m (for example, 3 ⁇ m, 5 ⁇ m, 10 ⁇ m, 20 ⁇ m, 50 ⁇ m, or 100 ⁇ m, etc.), and the thickness of the Ni layer ranges from 5 ⁇ m to 100 ⁇ m (for example, 5 ⁇ m, 8 ⁇ m, 10 ⁇ m, 20 ⁇ m, 50 ⁇ m or 100 ⁇ m, etc.); in a further implementation manner, the thickness of the burnt copper layer ranges from 18 ⁇ m-20 ⁇ m (for example, 18 ⁇ m, 18.5 ⁇ m, 19 ⁇ m, 19.5 ⁇ m or 20 ⁇ m, etc.), The thickness of the Ni layer ranges from 5 ⁇ m to 8 ⁇ m (for example, 5 ⁇ m, 5.5 ⁇ m, 6 ⁇ m, 6.5 ⁇ m, 7 ⁇ m, 7.5 ⁇ m, or 8 ⁇ m, etc.).
  • the thickness of the acid copper layer ranges from 2 ⁇ m to 100 ⁇ m (2 ⁇ m, 5 ⁇ m, 10 ⁇ m, 20 ⁇ m, 50 ⁇ m, or 100 ⁇ m, etc.); in a further implementation manner, the thickness range of the acid copper layer It is 3 ⁇ m-5 ⁇ m (for example, 3 ⁇ m, 3.5 ⁇ m, 4 ⁇ m, 4.5 ⁇ m, 5 ⁇ m, etc.); the acid copper layer can be replaced by the acid nickel layer.
  • the first plating layer and the second plating layer are both the outermost plating layers that have been sealed; the outermost layer of the first plating layer refers to a nickel layer, and the outermost layer of the second plating layer is a nickel layer.
  • the outer layer refers to the anti-artificial sweat electrolytic metal layer or the weldable metal plating layer.
  • Sealing on the Ni layer in the first plating layer can not only protect the Ni layer from oxidation and improve the welding effect of the first plating layer during SMT; it can also prevent air from passing through the microporous oxide magnet substrate, thereby preventing the magnet base during SMT.
  • the first coating on the surface of the material bursts.
  • the sealing treatment on the second plating layer can protect the anti-artificial sweat electrolytic metal layer or the weldable metal plating layer from being oxidized, and improve the welding effect of the second plating layer during SMT.
  • the material of the metal casing in order to improve the magnetic permeability of the metal casing, is selected as a stainless steel substrate; in order to improve the magnetism of the magnetic part, the magnetic part is selected as neodymium iron boron or samarium cobalt.
  • the material of the metal shell is a SUS430 base material; this is because the SUS430 base material has low resistance to magnetism and good magnetic permeability.
  • the contact structure of the implementation of the present invention realizes the direct magnetic attraction charging function of a magnet for the first time in wearable devices such as earphones, watches, glasses or VR, and electronic products such as electronic cigarettes on the market.
  • the structure is combined into one, which has achieved a new technological breakthrough for the product slimming.
  • the implementation mode of the present invention is provided with a second plating layer on the surface of the metal shell, which can protect the magnet substrate SMT after passing the salt spray test, artificial sweat static test, and artificial sweat electrolysis test; thus, the contact structure of wearable products or electronic products is realized
  • the contact structure with the charging box (the charging box has a contact structure, and the contact structure and the contact structure of the product form a magnetic charging). It works normally when charging for a long time in the state of human sweat, which greatly extends the wearable The service life of the product or electronic product and the charging box.
  • this embodiment also provides a method for manufacturing the contact structure, which includes the following steps:
  • the magnet substrate that is, the basic material of the magnetic element
  • electroplating on the surface of the magnet substrate to form a plating layer
  • performing a sealing treatment on the surface of the plating layer to obtain a first plating layer Magnet substrate
  • the metal shell with the second plating layer is sleeved on the outer surface of the magnet substrate with the first plating layer, so that the upper surface of the magnet substrate with the first plating layer is in contact with the metal with the second plating layer.
  • the inner upper surface of the shell is connected by HONDE9736 glue to obtain the contact structure to be magnetized;
  • Magnetizing treatment is performed on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
  • the sealing treatment refers to sealing the micropores on the surface of the outermost plating layer with a sealing agent.
  • performing magnetization processing on the magnet substrate in the contact structure to be magnetized includes: mounting the surface of the contact structure to be magnetized into the circuit board, and then Magnetizing treatment is performed on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
  • the implementation mode of the present invention assembles the magnetic part with the first plating layer and the metal shell with the second plating layer to the SMT to the circuit board, and then magnetizes the magnetic part; it solves the problem of SMT after the traditional contact structure is magnetized
  • the high temperature demagnetization and mutual attraction problems facilitate the contact structure SMT to the circuit board.
  • a contact structure of this embodiment includes a magnetic member 81 and a metal casing 82, and the metal casing 82 is sleeved outside the magnetic member 81 for connecting the magnetic member 81 81 is connected to an external power source and conducts the magnetism of the magnetic element 81.
  • the surface of the magnetic member 81 is provided with a first plating layer 10, which is a coke copper layer 101 and a Ni layer 102 from the inside to the outside.
  • the thickness of the coke copper layer 101 ranges from 18 ⁇ m-20 ⁇ m; the Ni layer
  • the thickness of 102 ranges from 5 ⁇ m to 8 ⁇ m.
  • the second plating layer 9 is an acid copper layer 91, a Pd plating layer 92, a first Au plating layer 93, a RhRu alloy plating layer 94, and a second Au plating layer from the inside to the outside. ⁇ 95 ⁇ Plated layer 95.
  • the thickness of the acid copper layer 201 in the second plating layer 9 is 3 ⁇ m-5 ⁇ m
  • the thickness of the Pd plating layer 202 is 0.75 ⁇ m-1 ⁇ m
  • the thickness of the first Au plating layer 203 is 0.5 ⁇ m-0.75 ⁇ m
  • the thickness of the RhRu alloy plating layer 204 The range is 0.75 ⁇ m-1 ⁇ m
  • the thickness of the second Au plating layer 205 is in the range of 0.125 ⁇ m-0.25 ⁇ m
  • the second Au plating layer 205 is the plating layer after the sealing treatment.
  • Step 1 Preparation of the magnetic member 81 with the first plating layer.
  • the magnetic member 81 is a neodymium iron boron magnet:
  • the glue may be 502 glue. It should be understood that this embodiment does not limit the glue.
  • the length direction of the quasi-cylindrical neodymium iron boron is cut by a cutting machine to obtain a quasi-cylindrical neodymium iron boron; the quality inspection is performed on the cylindrical neodymium iron boron; among them, the quasi-cylindrical neodymium iron boron refers to a cylindrical neodymium iron boron with a specific length.
  • the pickling solution is nitric acid, the volume concentration is 5%, and the pickling time is 30S.
  • the first specific specification NdFeB refers to NdFeB with a clean surface and a specific size.
  • Electroplating is performed on the neodymium iron boron of the first specific specification, followed by the coke copper layer and the nickel layer; then the hole sealing agent is used for the hole sealing treatment on the nickel layer to obtain the neodymium iron boron with the first plating layer.
  • the appearance inspection standard of the first coating layer is: the surface of the first coating layer must not have chipping, scorching, cracking, peeling, wrinkling, knife marks and other undesirable phenomena.
  • the first coating layer must be uniform and the surface must be flat.
  • the overall size of the coated NdFeB should be controlled within the tolerance range of +/-0.05mm.
  • Step 2 Preparation of a metal shell with a second plating layer.
  • the metal shell is made of stainless steel SUS430. It should be understood that this embodiment does not limit this.
  • the appearance inspection standard of SUS430 metal shell with the second coating is: the surface is smooth, no knives, no deformation, flatness ⁇ 0.1mm, and the second coating surface must not have undesirable phenomena such as scorching, cracking, and peeling.
  • Step 3 Paste the neodymium iron boron with the first coating layer (such as HONDE 9736 glue) into the SUS430 metal casing with the second coating layer, and connect the upper surface of the neodymium iron boron with the inner upper surface of the SUS430 metal casing.
  • the carrier tape packaging means that the electroplated product is placed in the hole of the carrier tape according to the placement requirements, and the product is covered with a transparent top film. The edge of the top film is glued to the carrier tape, and the carrier tape is rolled at the same time.
  • the carrier tape after the packaging is completed, use the film to roll a few more times to fix the carrier tape on the carrier tape to prevent the carrier tape from loosening and falling off.
  • Step 4 Magnetizing the magnet substrate in the contact structure to be magnetized to obtain the contact structure.
  • vacuum packaging can prevent the neodymium iron boron with the first coating layer or the SUS430 metal shell with the second coating layer from being corroded by the acid gas during storage and transportation. ; On the other hand, vacuum packaging can also prevent the neodymium iron boron with the first plating layer or the SUS430 metal shell with the second plating layer from being scattered and leaking during transportation.
  • the realization method of the electroplating process in this embodiment Put the quasi-cylindrical neodymium iron boron or SUS430 metal shell together with the plated steel balls into the electroplating bath, and apply electric current for electroplating.
  • Co-plating steel ball is mainly to prevent the phenomenon of lamination of small-sized quasi-cylindrical NdFeB or SUS430 metal shell, and the problem of uneven plating in small currents.
  • Each coating has a corresponding electroplating bath. After each coating is plated, the thickness of the coating needs to be measured. After the thickness of the coating reaches the required requirements, it is placed in the next electroplating bath, and electroplating is carried out in sequence.
  • the magnet is separated from the copper POGO PIN, and the magnet is assembled into the casing for magnetic attraction, and the copper material POGO PIN is assembled on the casing for charging;
  • the combination of NdFeB and SUS430 metal casing in this embodiment is Combining the magnet and the metal shell into the same structural space can achieve both the magnetic attraction function and the charging function, and the contact structure can be reduced.
  • a first plating layer of Cu-Ni is provided on the surface of the magnet substrate, and a second plating layer of Cu-Pd-Au-RhRu-Au is provided on the surface of the metal shell; so that the surface of the contact structure has good flatness and smoothness It can also protect the contact structure through salt spray test, artificial sweat static test and charging artificial sweat electrolysis test.
  • FIG. 11 is a schematic cross-sectional view of the contact structure of the second embodiment of the present invention.
  • the appearance of the contact structure of this embodiment is similar to the appearance of the contact structure of the first embodiment.
  • FIG. 2 please refer to FIG. 2, which will not be repeated here.
  • the contact structure includes a magnetic element 81, a metal casing 82 and a circuit board 110.
  • the metal housing 82 can be made of stainless steel material with a model of SUS430.
  • the metal casing 82 is sleeved outside the magnetic part 81 for connecting the magnetic part 81 with an external power source and conducts the magnetism of the magnetic part 81; the magnetic part 81 and the metal casing 82 are both connected to the circuit board 110 by surface mounting .
  • the surface of the magnetic member 81 is provided with a first plating layer, the first plating layer is a coke copper layer and a Ni layer from the inside to the outside.
  • the thickness of the coke copper layer ranges from 18 ⁇ m to 20 ⁇ m; the thickness of the Ni layer ranges from 5 ⁇ m to 8 ⁇ m.
  • the surface of the SUS430 metal shell is provided with a second plating layer.
  • the second plating layer is acid copper layer, Pd plating layer, first Au plating layer, RhRu alloy plating layer and second Au plating layer from the inside to the outside; the thickness range of the acid copper layer in the second plating layer
  • the thickness of the Pd coating is 3 ⁇ m-5 ⁇ m, the thickness of the Pd coating is 0.75 ⁇ m-1 ⁇ m, the thickness of the first Au coating is 0.5 ⁇ m-0.75 ⁇ m, the thickness of the RhRu alloy coating is 0.75 ⁇ m-1 ⁇ m, and the thickness of the second Au coating is 0.125 ⁇ m-0.25 ⁇ m, the second Au plating layer is the plating layer after sealing treatment.
  • the preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is step 4.
  • step 4 SMT the contact structure to be magnetized into the circuit board, and then magnetize the magnet substrate in the contact structure to be magnetized to obtain the contact structure.
  • a first plating layer of Cu-Ni is provided on the surface of the magnetic member 81, and a second plating layer of Cu-Pd-Au-RhRu-Au is provided on the surface of the metal casing; and then the unmagnetized magnetic member 81 and the metal casing are SMT to In the circuit board, magnetization is performed last.
  • This can protect the magnet SMT in the contact structure and pass the salt spray test, artificial sweat static test and charging artificial sweat electrolysis test.
  • the problem that the magnet in the contact structure of the related technology cannot be SMT or cannot be charged after SMT is solved.
  • the contact structure of this embodiment includes: magnetic parts (such as neodymium iron boron magnets), a metal shell (such as SUS430 stainless steel) and a circuit board; the SUS430 metal shell is sleeved outside the neodymium iron boron to connect the neodymium iron boron with The external power supply conducts and conducts the magnetism of the neodymium iron boron; the neodymium iron boron and the SUS430 metal shell are both connected to the circuit board by surface mounting.
  • the surface of the neodymium iron boron is provided with a first plating layer.
  • the first plating layer is a coke copper layer and a Ni layer from the inside to the outside.
  • the thickness of the coke copper layer ranges from 18 ⁇ m to 20 ⁇ m; the thickness of the Ni layer ranges from 5 ⁇ m to 8 ⁇ m.
  • the surface of the metal shell is provided with a second plating layer.
  • the second plating layer is acid copper layer, Pd plating layer, and RhRu alloy plating layer from the inside to the outside; the thickness of the acid copper layer in the second plating layer ranges from 3 ⁇ m to 5 ⁇ m, and the thickness range of the Pd plating layer is
  • the thickness of the RhRu alloy coating is 0.75 ⁇ m-1 ⁇ m, and the thickness of the RhRu alloy coating is 0.75 ⁇ m-1 ⁇ m.
  • the RhRu alloy coating is the coating after the sealing treatment.
  • the preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is 3) and step 4 in step 2.
  • step 2:3) pickling the SUS430 metal shell that passed the test, and then ultrasonic cleaning, to obtain the second specific specification of SUS430 metal shell; electroplating is performed on the surface of the second specific specification of SUS430 metal shell, Plating acid copper layer, Pd plating layer, RhRu alloy plating layer in sequence.
  • the outermost plating layer is sealed with a sealing agent to obtain a SUS430 metal shell with a second plating layer.
  • pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the pickling solution is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
  • Step 4 Put the SMT of the contact structure to be magnetized into the circuit board, and then perform magnetization treatment on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
  • the contact structure of this embodiment includes: magnetic parts (such as neodymium iron boron magnets), a metal shell (such as SUS430 stainless steel) and a circuit board; the SUS430 metal shell is sleeved outside the neodymium iron boron to connect the neodymium iron boron with The external power supply conducts and conducts the magnetism of the neodymium iron boron; the neodymium iron boron and the SUS430 metal shell are both connected to the circuit board by surface mounting.
  • the surface of the neodymium iron boron is provided with a first plating layer.
  • the first plating layer is a coke copper layer and a Ni layer from the inside to the outside.
  • the thickness of the coke copper layer is 18 ⁇ -20 ⁇ ; the thickness of the Ni layer is 5 ⁇ -8 ⁇ .
  • the surface of the metal shell is provided with a second plating layer.
  • the second plating layer is acid copper layer, Pd plating layer, RhRu alloy plating layer, and Au plating layer from the inside to the outside; the thickness of the acid copper layer in the second plating layer is 3-5 ⁇ , and the Pd plating layer
  • the thickness of the RhRu alloy plating layer is 0.75 ⁇ -1 ⁇
  • the thickness of the RhRu alloy plating layer is 0.75 ⁇ -1 ⁇
  • the thickness of the Au plating layer is 0.125 ⁇ -0.25 ⁇
  • the Au plating layer is the plating layer after the sealing treatment.
  • the preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is 3) and step 4 in step 2.
  • step 2:3) pickling the SUS430 metal shell that passed the test, and then ultrasonic cleaning, to obtain the second specific specification of SUS430 metal shell; electroplating is performed on the surface of the second specific specification of SUS430 metal shell, Plating acid copper layer, Pd plating layer, RhRu alloy plating layer and Au plating layer in sequence.
  • the outermost plating layer is sealed with a sealing agent to obtain a SUS430 metal shell with a second plating layer.
  • pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the pickling solution is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
  • Step 4 Put the SMT of the contact structure to be magnetized into the circuit board, and then perform magnetization treatment on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
  • the contact structure of this embodiment includes: magnetic parts (such as neodymium iron boron magnets), a metal shell (such as SUS430 stainless steel) and a circuit board; the SUS430 metal shell is sleeved outside the neodymium iron boron to connect the neodymium iron boron with The external power supply conducts and conducts the magnetism of the neodymium iron boron; the neodymium iron boron and the SUS430 metal shell are both connected to the circuit board by surface mounting.
  • the surface of the neodymium iron boron is provided with a first plating layer.
  • the first plating layer is a coke copper layer and a Ni layer from the inside to the outside.
  • the thickness of the coke copper layer ranges from 18 ⁇ m to 20 ⁇ m; the thickness of the Ni layer ranges from 5 ⁇ m to 8 ⁇ m.
  • the surface of the metal shell is provided with a second plating layer.
  • the second plating layer is acid copper layer, Pd plating layer, Au plating layer, and RhRu alloy plating layer from the inside to the outside; the thickness of the acid copper layer in the second plating layer ranges from 3 ⁇ m-5 ⁇ m, and the thickness of the Pd plating layer
  • the thickness range is 0.75 ⁇ m-1 ⁇ m, the thickness range of the Au plating layer is 0.5 ⁇ m-0.75 ⁇ m, the thickness range of the RhRu alloy plating layer is 0.75 ⁇ m-1 ⁇ m, and the RhRu alloy plating layer is the plating layer after the sealing treatment.
  • the preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is: 3) in step 2 and step 4.
  • step 2:3) pickling the passed SUS430 metal shell and then ultrasonic cleaning to obtain the second specific specification SUS430 metal shell; electroplating on the surface of the second specific specification SUS430 metal shell, in turn Acid copper plating, Pd plating, Au plating, RhRu alloy plating.
  • the outermost plating layer is sealed with a sealing agent to obtain a SUS430 metal shell with a second plating layer.
  • pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the pickling solution is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
  • Step 4 Put the SMT of the contact structure to be magnetized into the circuit board, and then perform magnetization treatment on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
  • the contact structure of this embodiment includes: a magnetic component (such as a samarium cobalt magnet), a metal shell (such as SUS430 stainless steel) and a circuit board; the SUS430 metal shell is sleeved outside the samarium cobalt magnet to connect the samarium cobalt magnet to the outside
  • the power supply conducts and conducts the magnetism of the samarium cobalt magnet; both the samarium cobalt magnet and the SUS430 metal shell are connected to the circuit board by surface mounting.
  • the surface of the samarium cobalt is provided with a first plating layer.
  • the first plating layer is a coke copper layer and a Ni layer from the inside to the outside.
  • the thickness of the coke copper layer ranges from 18 ⁇ m to 20 ⁇ m; the thickness of the Ni layer ranges from 5 ⁇ m to 8 ⁇ m.
  • the surface of the metal shell is provided with a second plating layer.
  • the second plating layer is acid nickel layer, Pt plating layer, SnAg plating layer, Rh plating layer, and Sn plating layer from the inside to the outside; the thickness of the acid nickel layer in the second plating layer ranges from 3 ⁇ m to 5 ⁇ m,
  • the thickness range of Pt coating is 0.75 ⁇ m-1 ⁇ m, the thickness of SnAg coating is 0.5 ⁇ m-0.75 ⁇ m, the thickness of Rh coating is 0.75 ⁇ m-1 ⁇ m; the thickness of Sn coating is 0.125 ⁇ m-0.25 ⁇ m, and the Sn coating is sealing. Plating after hole treatment.
  • the preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is: 3) and step 4 in step 2.
  • step 2:3) pickling the metal shell that passes the test and then ultrasonic cleaning to obtain a metal shell of the second specific specification; electroplating on the surface of the metal shell of the second specific specification, followed by nickel plating Layer, Pt plating, SnAg plating, Rh plating, and Sn plating.
  • the outermost plating layer is sealed with a sealing agent to obtain a metal shell with a second plating layer.
  • pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the pickling solution is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
  • Step 4 Put the SMT of the contact structure to be magnetized into the circuit board, and then magnetize the samarium cobalt in the contact structure to be magnetized to obtain the contact structure.
  • the principle of the artificial sweat electrolysis test in this embodiment is similar to that in the first embodiment, and the principle diagram can refer to FIG. 7.
  • the electronic device is an earphone and the charging device is a charging box as an example. It should be understood that this embodiment does not limit this.
  • the standard for passing the artificial sweat electrolysis test the damage time of the coating is required to be ⁇ 2min.
  • the standard for passing the salt spray test is: the appearance and function are the same as before the salt spray test, and there is no change. Generally, the appearance should not have rust, corrosion and discoloration.
  • the contact structure of this embodiment has passed the above-mentioned artificial sweat electrolysis test, salt spray test and artificial sweat static test. Moreover, the contact structure of Example 2 has the best performance in the artificial sweat electrolysis test, the salt spray test and the artificial sweat static test.
  • the magnetic parts and the metal shell are respectively electroplated, which not only ensures the flatness and smoothness of the product surface, but also greatly helps to maintain the beauty of the product; electroplating the metal shell can protect the magnetic parts after SMT Pass salt spray test, artificial sweat static test, artificial sweat electrolysis test.
  • Fig. 12 is a schematic cross-sectional view of a contact structure according to a third embodiment of the present invention.
  • this embodiment provides a contact, which includes a magnetic element 121 and a metal shell 122.
  • a receiving cavity 1221 is formed in the metal shell 122; the magnetic member 121 is arranged in the receiving cavity 1221.
  • the contacts in this embodiment can be arranged on electronic equipment and/or charging equipment.
  • the metal shell 122 can be electrically connected to the circuit of the electronic equipment. When it is necessary to electrically connect with an external electronic equipment (such as a charging equipment), the metal shell 122 can be electrically connected to an external electronic equipment (such as a charging equipment).
  • the metal casing 122 is in contact with the connecting end of the external electronic device (such as a terminal provided in the external electronic device), so that the electronic device is electrically connected to the external electronic device, and at the same time, the magnetic member 121 can adsorb the external electronic device to ensure The stability of the connection between the contact and the connection terminal of the external electronic device is improved.
  • the magnetic element 121 Since the magnetic element 121 is arranged in the accommodating cavity 1221 in the metal shell 122, it does not occupy the external space of the contact, which is conducive to the miniaturization of the contact, improves the flexibility and convenience of the use of the contact, and the metal shell 122 is resistant The wear performance is good, it can resist the abrasion when contacting the connecting end of the external electronic equipment and other internal components, and is not easy to be damaged. Since the magnetic part 121 is arranged in the receiving cavity 1221 in the metal housing 122, the metal housing 122 is opposite to the magnetic part. 121 forms a layer of protection to avoid the wear caused by the contact between the magnetic part 121 and the internal components of the electronic device, and at the same time prevent the magnetic part 121 from being directly exposed to the air to oxidize, which improves the reliability of the contact.
  • the metal shell 122 is a copper alloy shell.
  • the metal shell 122 made of copper alloy is easily soldered on the circuit board, which improves the convenience of using the contacts.
  • the magnetic member 121 is a neodymium iron boron magnet.
  • the neodymium iron boron magnet has high magnetic strength and good magnetic attraction performance, which improves the reliability of the contact.
  • the neodymium iron boron magnet has a high magnetic strength per unit volume. In practice, without affecting the magnetic attraction performance, it can be made into a smaller size magnetic part 121, which can be installed on a smaller electronic device to improve the contact Ease of use.
  • a conductive anticorrosive coating 124 is formed on the outer surface of the metal shell 122.
  • Multiple dense conductive anticorrosive coatings 124 can be formed on the metal shell 122, which improves the conductivity and anticorrosion ability of the metal shell 122. As a result, the reliability of the use of the contacts is improved.
  • the conductive anticorrosive plating layer 122 is a gold plating layer.
  • the gold coating has strong corrosion resistance and better electrical conductivity.
  • this embodiment also provides a contact structure.
  • the contact structure includes the contacts of this embodiment and the circuit board 123, and the circuit board 123 is electrically connected to the metal casing 122.
  • the circuit board 123 can be electrically connected to the circuit of the electronic device, so that the metal shell 122 is electrically connected to the circuit of the electronic device.
  • the connection is convenient, and the circuit board 123 occupies a small space, thus facilitating the miniaturization of the contacts.
  • the metal housing 122 includes a barrel-shaped main body 1222 and a base 1223.
  • the accommodating cavity 1221 is formed in the barrel-shaped main body 1222.
  • the bottom of the barrel-shaped main body 1222 is formed with an opening 1224.
  • the base 1223 is formed in the barrel-shaped main body. At the edge of the 1222 opening 1224, the base 1223 is ring-shaped and coaxial with the barrel-shaped main body 1222.
  • the outer diameter of the base 1223 is larger than that of the barrel-shaped main body 1222; the bottom surface of the base 1223 is welded and fixed to the circuit board 123 to make the metal shell 122 Electrically connected to the circuit board 123.
  • the magnetic element 121 is sealed in the sealed cavity formed by the metal casing 1222 and the circuit board 123, which avoids contact and wear with internal components of the electronic device.
  • the base 1223 is ring-shaped and the outer diameter of the base 1223 is larger than the outer diameter of the barrel-shaped body 1222, which increases the contact area with the circuit board 123, and is more stable when welded on the circuit board 123, which improves the reliability of the contact. .
  • the magnetic member 121 is closely attached to the inner wall of the barrel-shaped main body 1222.
  • the magnetic part 121 and the barrel-shaped main body 1222 are seamlessly connected, and the magnetic part 121 is prevented from being displaced in the barrel-shaped main body 1222.
  • the bottom surface of the magnetic member 121 is in contact with the circuit board 123.
  • the circuit board 123 can support the magnetic element 121, so that the magnetic element 121 can be firmly positioned in the sealed cavity formed by the metal casing 122 and the circuit board 123.
  • an embodiment of the present invention also provides an electronic device, including a device body and the contact or contact structure described in any embodiment of the present invention.
  • the circuit in the device body is electrically connected to the metal casing 123. connection.
  • the metal housing 123 can be contacted with the connecting end of the external electronic device, so that the electronic device is electrically connected with the external electronic device, and at the same time, the magnetic member 121
  • the external electronic device can be adsorbed, thereby ensuring the stability of the connection between the contact and the connection terminal of the external electronic device.
  • the magnetic element 121 is arranged in the accommodating cavity 1221 in the metal casing 122, it does not occupy the external space of the contact, which is conducive to the miniaturization of the contact, and improves the flexibility and convenience of the use of electronic equipment, and the metal casing 122 is resistant to The wear performance is good, it can resist the abrasion when contacting the connecting end of the external electronic equipment and other internal components, and is not easy to be damaged. Since the magnetic part 121 is arranged in the receiving cavity 1221 in the metal housing 122, the metal housing 122 is opposite to the magnetic part.
  • the magnetic part 121 forms a layer of protection to avoid the wear caused by the contact between the magnetic part 121 and the internal components of the electronic device, and at the same time prevent the magnetic part 121 from being directly exposed to the air to oxidize, which improves the reliability of the use of the electronic device.
  • Fig. 13 is a schematic diagram of the switching of contacts in the fourth embodiment of the present invention.
  • Fig. 14 is a schematic diagram of the contact structure of the fourth embodiment of the present invention.
  • Fig. 15 is a schematic diagram of an electronic device and a charging device according to a fourth embodiment of the present invention in a use state.
  • the present embodiment provides a contact 1300, including a magnetic member 1301 and a conductive layer 1302, the conductive layer 1302 is formed on the outer surface of the magnetic member 1301, the magnetic member 1301 is used to set On the circuit board 1400, the conductive layer 1302 is used to electrically connect with the circuit board 1400.
  • the conductive layer 1302 is a conductive material plating layer formed on the outer surface of the magnetic member 1301.
  • the conductive layer 1302 is a conductive anticorrosive coating.
  • the conductive layer 1302 is a gold coating to improve the conductivity and corrosion resistance of the conductive layer.
  • the conductive layer 1302 may also be a nickel plating layer, a copper plating layer, or a nickel copper alloy plating layer, etc., which is not limited in this embodiment.
  • the magnetic member 1301 when in use, can be disposed on the circuit board 1400 of the electronic device 1000 and the charging device 1500, and the conductive layer 1302 is electrically connected to the circuit board 1400 of the electronic device 1000 and the charging device 1500,
  • the contact 1300 on the electronic device 1000 can be brought into contact with the contact 1300 on the charging device 1500, and the contact 1300 on the electronic device 1000 can be charged with the adsorption of the magnetic member 1301.
  • the contact 1300 on the device 1500 is adsorbed and positioned.
  • the conductive layer 1302 is a conductive material plating layer 1302, when the contact 1300 on the electronic device 1000 is in contact with the contact 1300 on the charging device 1500, the electronic device 1000 and the charging device 1500 can be brought into contact with each other. It is electrically connected, so that the charging device 1500 can charge the electronic device 1000.
  • the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 are relatively positioned by adsorption, the contact 1300 on the electronic device 1000 is connected or separated from the contact 1300 on the charging device 1500 There will be no wear during long-term use, and the adsorption force will not be reduced during long-term use, which improves the stability of the connection between the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500, and avoids loosening and power failure. The problem has improved the reliability of the use of the contact 1300.
  • the conductive layer 1302 is formed on the outer surface of the magnetic member 1301, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of the electronic device 1000 and the charging device 1500.
  • the conductive layer 1302 is a conductive and corrosion-resistant material plating layer 1302. This prevents the conductive layer 1302 from being corroded during the use of the contact 1300 and affecting the conductive effect.
  • the conductive layer 1302 is a gold conductive layer 1302. Therefore, it is beneficial to improve the conductivity and corrosion resistance of the conductive layer 1302.
  • the conductive layer 1302 can also be a nickel conductive layer 1302, a copper conductive layer 1302, and the like.
  • the magnetic member 1301 includes a base 103 and a contact 104, the base 1303 and the contact 1304 are both cylindrical, the contact 1304 is connected to the base 1303, and the base 1303 and the contact
  • the axis of the head 1304 extends in the same direction, the diameter of the base 1303 is larger than the diameter of the contact 1304, and the bottom surface of the base 1303 is used to connect with the circuit board 1400.
  • the base 1303 and the contact 1304 are both cylindrical. As a result, the stability of the connection of the magnetic member 1301 is better, and the force-receiving performance of the magnetic member 1301 is improved.
  • the base 1303 and the contact 1304 are coaxial. Therefore, it is beneficial to improve the force-receiving performance of the magnetic member 1301.
  • the base 1303 and the contact 1304 are integrally formed. Therefore, it is beneficial to improve the connection strength between the base 1303 and the contact 1304.
  • the embodiment of the present invention provides a contact structure, including a circuit board 1400 and the contact 1300 according to any embodiment of the present invention.
  • the magnetic member 1301 is disposed on the circuit board 1400, and the conductive layer 1302 is connected to the The circuit board 1400 is electrically connected.
  • the contact structure in this embodiment can be set on the electronic device 1000 and the charging device 1500 when in use.
  • the contact 1300 on the electronic device 1000 can be made to touch the charging device 1500.
  • the point 1300 is in contact with each other.
  • the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 can be adsorbed and positioned under the adsorption of the magnetic member 1301. Since the conductive layer 1302 is a conductive material plating layer 1302, when the electronic device 1000 is When the contact 1300 of is in contact with the contact 1300 on the charging device 1500, the electronic device 1000 and the charging device 1500 can be electrically connected, so that the charging device 1500 can charge the electronic device 1000.
  • the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 are relatively positioned by adsorption, the contact 1300 on the electronic device 1000 is connected or separated from the contact 1300 on the charging device 1500 There will be no wear during long-term use, and the adsorption force will not be reduced during long-term use, which improves the stability of the connection between the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500, and avoids loosening and power failure. The problem has improved the reliability of the use of the contact 1300.
  • the conductive layer 1302 is formed on the outer surface of the magnetic member 1301, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of the electronic device 1000 and the charging device 1500.
  • An embodiment of the present invention also provides an electronic device 1000, which includes an electronic device main body and the contact structure described in the embodiment of the present invention, and the contact structure is disposed on the electronic device main body.
  • An embodiment of the present invention further provides a charging device 1500, which includes a charging device main body and the contact structure described in the embodiment of the present invention, and the contact structure is disposed on the charging device main body.
  • the contact 1300 on the electronic device 1000 when the electronic device 1000 needs to be charged, the contact 1300 on the electronic device 1000 can be brought into contact with the contact 1300 on the charging device 1500, and the magnetic member 1301 is adsorbed The contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 can be adsorbed and positioned. Since the conductive layer 1302 is a conductive material plating layer 1302, when the contact 1300 on the electronic device 1000 and the contact on the charging device 1500 are When 1300 is in contact, the electronic device 1000 and the charging device 1500 can be electrically connected, so that the charging device 1500 can charge the electronic device 1000.
  • the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 are relatively positioned by adsorption, the contact 1300 on the electronic device 1000 is connected or separated from the contact 1300 on the charging device 1500 There will be no wear during long-term use, and the adsorption force will not be reduced during long-term use, which improves the stability of the connection between the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500, and avoids loosening and power failure. The problem has improved the reliability of the use of the contact 1300.
  • the conductive layer 1302 is formed on the outer surface of the magnetic member 1301, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of the electronic device 1000 and the charging device 1500.
  • FIG. 16 is a schematic diagram of a partial structure of an electronic device according to a fifth embodiment of the present invention.
  • Fig. 17 is a partial structural diagram of the contact structure of the fifth embodiment of the present invention.
  • the embodiment of the present invention provides a contact structure, including a frame 161, a contact 162 and a contact 163, the contact 162 is connected to the frame 161; the contact 163 is connected to the frame 161 through an elastic member 164, elastic
  • the member 164 is used to apply elastic force to the contact 163 to position the contact 163 relative to the frame 161, and to make the contact 163 and the contact 162 have a set distance in the first direction.
  • the elastic member 164 can move along the edge under the action of external force.
  • the first direction extends toward the contact 162 so that the contact 163 can contact and be electrically connected to the contact 162.
  • the contact structure in this embodiment can be set on an electronic device, and the contact 162 is electrically connected to the circuit of the electronic device.
  • an external electronic device such as a charging device
  • electrical connection terminal such as the contact of the charging device
  • point When point, the connecting end of the external electronic device will contact the contact 163 and apply pressure to the contact 163.
  • the elastic member 164 will also be pressed and stretched toward the contact 162 in the first direction to make the contact 163 It is in contact with and electrically connected to the contact 162, thereby electrically connecting the electronic device and the external electronic device.
  • the elastic member 164 drives the contact 163 back to the contact member 162 in the first direction under the elastic action to reset and position the contact 163 relative to the frame 161.
  • the contact 163 and the contact 162 maintain a set distance in the first direction. Since the contact 163 and the contact 162 are kept at a set distance in the first direction, the contact 163 and the contact 162 are not conducted, which prevents the exposed contact 163 from forming a closed inside in the case of external water seepage or metal overlap.
  • the internal battery power loss and circuit damage of the electronic device caused by the circuit improve the reliability and safety of the structure of the contact 163.
  • the contact 163 is connected to the frame 161 through the elastic member 164.
  • the elastic member 164 can produce a certain buffer effect, preventing the contact 163 and the contact 162 from violently colliding, and improving the structure of the contact 163. Reliability.
  • a cavity 165 is formed in the frame 161
  • the contact member 162 is located in the cavity 165
  • the elastic member 164 closes the gap between the contact 163 and the frame 161 to seal the cavity 165. Due to the sealing effect of the elastic member 164, external liquid can be prevented from entering the cavity 165 and contacting the contact member 162, which further improves the reliability and safety of the structure of the contact 163.
  • a first clamping portion 166 is formed on the contact 163, the first clamping portion 166 extends along the circumference of the contact 163, the elastic member 164 is plate-shaped, and the elastic member 164 is formed with a connection A hole 167 and a second clamping portion 168.
  • the second clamping portion 168 is provided at the edge of the connecting hole 167 and extends along the circumference of the connecting hole 167.
  • the first clamping portion 166 and the second clamping portion 168 are connected by clamping .
  • the contact 163 passes through the connecting hole 167 of the elastic member 164, and the first clamping portion 166 on the contact 163 and the second clamping portion 168 on the elastic member 164 are clamped with each other, thereby making the contact 163 and
  • the elastic member 164 is convenient and stable in connection, and the contact 163 and the frame 161 can achieve a more stable relative positioning through the elastic member 164, which improves the reliability of the structure of the contact 163.
  • the first clamping portion 166 is a tenon
  • the second clamping portion 168 is a clamping slot. Therefore, the structure of the connection structure between the contact 163 and the frame 161 is simple and the cost is low.
  • a third clamping portion 169 is formed on the outer edge of the elastic member 164, a fourth clamping portion 1610 is formed on the frame 161, and the third clamping portion 169 is clamped with the fourth clamping portion 1610. connection.
  • the connection between the elastic member 164 and the frame 161 is convenient and stable, and the contact 163 and the frame 161 can achieve a more stable relative positioning through the elastic member 164, which improves the reliability of the structure of the contact 163.
  • the third clamping portion 169 is a tenon
  • the fourth clamping portion 1610 is a clamping slot. Therefore, the structure of the connection structure between the contact 163 and the frame 161 is simple and the cost is low.
  • a groove 1611 is further formed on the elastic member 164.
  • the groove 1611 extends along the circumference of the connecting hole 167 to surround the connecting hole 167, and there is a set distance between the groove 1611 and the connecting hole 167. . Therefore, the arrangement of the groove 1611 can reduce the thickness of the elastic member 164 at the position of the groove 1611. Therefore, the elastic force of the elastic member 164 at the position of the groove 1611 is relatively small, and the groove 1611 is along the circumferential direction of the connecting hole 167.
  • the elastic member 164 is a silicone member.
  • the silicone element itself has elasticity, and can play a role in sealing the contact 163 and the contact 162, and can also buffer the movement of the contact 163 relative to the frame 161. Improve the reliability of the structure of the contact 163.
  • the contact structure further includes a circuit board, the circuit board is connected to the frame 161, and the contact 162 is an elastic piece on the circuit board. Therefore, when the contact 163 is in contact with the elastic piece, the elastic piece can play a buffering effect to prevent damage to the circuit board.
  • An embodiment of the present invention provides an electronic device, including an electronic device main body and the contact 163 structure according to any embodiment of the present invention.
  • the electronic device main body is connected to the frame 161, and the contact 162 is electrically connected to the circuit of the electronic device main body.
  • the connection terminal of the external electronic device When the electronic device in this embodiment needs to be connected to an electrical connection terminal of an external electronic device, the connection terminal of the external electronic device will contact the contact 163 and apply pressure to the contact 163, and at the same time, the elastic member 164 will also be subjected to The pressure extends toward the contact 162 in the first direction, so that the contact 163 and the contact 162 are in contact and electrically connected, thereby electrically connecting the electronic device and the external electronic device.
  • the elastic member 164 drives the contact 163 to reset back to the contact member 162 in the first direction under the elastic action and position the contact 163 relative to the frame 161. At this time, the contact 163 and The contact 162 maintains a set distance in the first direction.
  • the contact 163 and the contact 162 are kept at a set distance in the first direction, the contact 163 and the contact 162 are not conductive, which prevents the exposed contact 163 from forming a closed inside in the case of external water seepage or metal overlap.
  • the internal battery power loss and circuit damage of the electronic device caused by the circuit improve the reliability and safety of the structure of the contact 163.
  • the contact 163 is connected to the frame 161 through the elastic member 164.
  • the elastic member 164 can produce a certain buffering effect, preventing the contact 163 and the contact 162 from violently colliding, and improving the reliability of the use of electronic equipment. Sex.

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Abstract

Embodiments of the present invention provide a contact, a contact structure, an electronic device and a charging device. The contact comprises a magnetic member and a conducting layer. The conducting layer is provided outside the magnetic member. The magnetic member is provided on a circuit board. The conducting layer is electrically connected to the circuit board. Hence, when the contact of this embodiment is used for charging, the contact on the electronic device and the contact on the charging device are adsorbed and positioned under the absorption of the magnetic member, no abrasion is not generated in the process of connecting or separating the contact on the electronic device to or frame the contact on the charging device, and the adsorption capacity may not be reduced in the process of long-term use, thereby improving the stability and reliability of connection of the contact on the electronic device and the contact on the charging device. Moreover, since the conducting layer is formed outside the magnetic member, the space occupied and difficulty of installation are effectively reduced, which facilitates miniaturization of the electronic device and the charging device.

Description

触点、触点结构、电子设备和充电设备Contact, contact structure, electronic equipment and charging equipment
本申请要求了2019年08月23日提交的、申请号为201910782607.2、发明名称为“触点、触点结构、电子设备和充电设备”的中国专利申请,2019年09月04日提交的、申请号为201910831565.7、发明名称为“充电装置及电子设备”的中国专利申请,2019年09月04日提交的、申请号为201910831583.5、发明名称为“触点及电子设备”的中国专利申请,2019年08月27日提交的、申请号为201910795448.X、发明名称为“一种充电触点结构及其制备方法”的中国专利申请,2019年08月27日提交的、申请号为201910798942.1、发明名称为“一种触点结构及其制备方法”的中国专利申请的优先权,其全部内容通过引用结合在本申请中。This application requires a Chinese patent application filed on August 23, 2019, with an application number of 201910782607.2, and an invention title of "contacts, contact structures, electronic equipment, and charging equipment". The application filed on September 4, 2019 The Chinese patent application with the number of 201910831565.7 and the invention name of "Charging Device and Electronic Equipment", the Chinese patent application with the application number of 201910831583.5 and the invention name of "Contacts and Electronic Equipment" filed on September 4, 2019, in 2019 The Chinese patent application filed on August 27, with the application number 201910795448.X, and the invention titled "A charging contact structure and its preparation method", filed on August 27, 2019, with the application number 201910798942.1, invention title It is the priority of the Chinese patent application of "a contact structure and its preparation method", the entire content of which is incorporated into this application by reference.
技术领域Technical field
本发明涉及电子电力技术,更具体地,涉及一种触点、触点结构、电子设备和充电设备。The present invention relates to electronic power technology, and more specifically, to a contact, a contact structure, an electronic device, and a charging device.
背景技术Background technique
随着科技的发展和社会的进步,电子设备在生活中的应用越来越普遍,当电子设备电量不足时,需要通过充电设备进行充电。With the development of science and technology and the progress of society, electronic devices are becoming more and more common in daily life. When the power of electronic devices is insufficient, they need to be charged by charging devices.
现有的电子设备中设有充电接口,充电设备设有充电插头,充电接口内和充电头上均设有卡持部,充电插头能够插入充电接口内并通过卡持部卡持在充电接口中,以使得电子设备与充电设备电连接。The existing electronic equipment is equipped with a charging interface, and the charging device is equipped with a charging plug. Both the charging interface and the charging head are equipped with clamping parts. The charging plug can be inserted into the charging interface and held in the charging interface by the clamping part , So that the electronic device and the charging device are electrically connected.
然而,在充电接口和充电插头的插拔过程中,卡持部会出现磨损,当卡持部磨损程度较大时充电接口和充电插头则无法实现稳定连接,从而容易出现松脱、断电等问题,使用可靠性较低。However, in the process of plugging and unplugging the charging interface and the charging plug, the clamping part will be worn out. When the clamping part is worn to a large extent, the charging interface and the charging plug cannot achieve a stable connection, which is prone to problems such as loosening and power failure. , The use reliability is low.
发明内容Summary of the invention
有鉴于此,本发明实施例提供一种触点、触点结构、电子设备和充电设备,以提高充电过程的可靠性。In view of this, embodiments of the present invention provide a contact, a contact structure, an electronic device, and a charging device to improve the reliability of the charging process.
第一方面,本发明实施例提供一种触点,所述触点包括磁性件和导电层,所述导电层在所述磁性件的外侧,所述磁性件设置在电路板上,所述导电层与所述电路板电 连接。In a first aspect, an embodiment of the present invention provides a contact, the contact includes a magnetic element and a conductive layer, the conductive layer is on the outer side of the magnetic element, the magnetic element is disposed on a circuit board, and the conductive layer The layer is electrically connected to the circuit board.
可选的,所述磁性件包括第一底座和触头,所述底座和触头均为柱状,所述触头连接在所述底座上,所述底座和触头的轴线沿相同方向延伸,所述底座的直径大于所述触头的直径,所述底座的底面与所述电路板连接。Optionally, the magnetic member includes a first base and a contact, the base and the contact are both cylindrical, the contact is connected to the base, and the axis of the base and the contact extend in the same direction, The diameter of the base is larger than the diameter of the contact, and the bottom surface of the base is connected to the circuit board.
可选的,所述底座和所述触头均为圆柱体。Optionally, the base and the contact are both cylindrical.
可选的,所述底座和所述触头共轴线。Optionally, the base and the contact are coaxial.
可选的,所述底座和所述触头为一体成型结构。Optionally, the base and the contact are an integrally formed structure.
可选的,所述导电层为导电材料镀层,所述导电层形成在所述磁性件的外表面。Optionally, the conductive layer is a conductive material plating layer, and the conductive layer is formed on the outer surface of the magnetic member.
可选的,所述导电层为导电防腐镀层。Optionally, the conductive layer is a conductive anticorrosive plating layer.
可选的,所述导电层包括抗腐蚀金属层、酸铜层或酸镍层、金属阻挡层以及抗人工汗液电解金属层,所述导电防腐层、酸铜层或酸镍层、金属阻挡层以及抗人工汗液电解金属层依次形成在所述磁性件的外表面。Optionally, the conductive layer includes an anti-corrosion metal layer, an acid copper layer or an acid nickel layer, a metal barrier layer, and an artificial sweat-resistant electrolytic metal layer, and the conductive anticorrosion layer, an acid copper layer or an acid nickel layer, and a metal barrier layer And the anti-artificial sweat electrolytic metal layer is sequentially formed on the outer surface of the magnetic member.
可选的,所述抗腐蚀金属层为焦铜镀层或中性镍镀层。Optionally, the corrosion-resistant metal layer is a coke copper plating layer or a neutral nickel plating layer.
可选的,所述抗腐蚀金属层的厚度范围为8μm-10μm。Optionally, the thickness of the anti-corrosion metal layer ranges from 8 μm to 10 μm.
可选的,所述酸铜层的厚度范围为18μm-20μm。Optionally, the thickness of the acid copper layer ranges from 18 μm to 20 μm.
可选的,所述导电层的最外层为进行了封孔处理的镀层。Optionally, the outermost layer of the conductive layer is a plating layer that has been sealed.
可选的,所述导电层为金属外壳,所述金属外壳内形成有容纳腔,所述磁性件设置在容纳腔内。Optionally, the conductive layer is a metal shell, a containing cavity is formed in the metal shell, and the magnetic member is arranged in the containing cavity.
可选的,所述金属外壳包括桶形主体和第二底座,所述容纳腔形成在所述桶形主体内,所述桶形主体的底部形成有开口部,所述第二底座形成在所述开口部的边缘处。Optionally, the metal shell includes a barrel-shaped main body and a second base, the receiving cavity is formed in the barrel-shaped main body, the bottom of the barrel-shaped main body is formed with an opening, and the second base is formed in the barrel-shaped main body. At the edge of the opening.
可选的,所述第二底座为环形且与所述桶形主体共轴线,所述第二底座的外径大于所述桶形主体的外径,所述第二底座的底面与所述电路板焊接固定以使得所述金属外壳与所述电路板电连接。Optionally, the second base is ring-shaped and coaxial with the barrel-shaped main body, the outer diameter of the second base is larger than the outer diameter of the barrel-shaped main body, and the bottom surface of the second base is connected to the circuit The board is welded and fixed so that the metal shell is electrically connected to the circuit board.
可选的,所述磁性件与所述桶形主体的内壁紧密贴合。Optionally, the magnetic member is closely attached to the inner wall of the barrel-shaped body.
可选的,所述金属外壳为铜合金外壳。Optionally, the metal shell is a copper alloy shell.
可选的,所述金属外壳的外表面形成有导电防腐镀层。Optionally, a conductive anticorrosive coating is formed on the outer surface of the metal shell.
可选的,所述导电防腐镀层为金镀层。Optionally, the conductive anticorrosive coating is a gold coating.
可选的,所述磁性件表面形成有第一镀层,所述金属外壳表面形成有第二镀层。Optionally, a first plating layer is formed on the surface of the magnetic member, and a second plating layer is formed on the surface of the metal casing.
可选的,所述第一镀层从里到外依次为焦铜层和镍层。Optionally, the first plating layer is a coke copper layer and a nickel layer in order from the inside to the outside.
可选的,所述焦铜层的厚度范围为18μm-20μm,所述镍层的厚度范围为5μm-8μm。Optionally, the thickness of the coke copper layer ranges from 18 μm to 20 μm, and the thickness of the nickel layer ranges from 5 μm to 8 μm.
可选的,所述第二镀层从里到外依次为酸铜层或酸镍层、金属阻挡层、以及抗人工汗液电解金属层。Optionally, the second plating layer is an acid copper layer or an acid nickel layer, a metal barrier layer, and an artificial sweat-resistant electrolytic metal layer in order from the inside to the outside.
可选的,所述酸铜层的厚度范围3μm-5μm。Optionally, the thickness of the acid copper layer ranges from 3 μm to 5 μm.
可选的,所述第一镀层的最外层和所述第二镀层的最外层为进行了封孔处理的镀层。Optionally, the outermost layer of the first plating layer and the outermost layer of the second plating layer are plating layers that have been sealed.
可选的,所述抗人工汗液电解金属层为铑镀层、钌镀层、或铑钌合金镀层。Optionally, the anti-artificial sweat electrolytic metal layer is a rhodium plating layer, a ruthenium plating layer, or a rhodium ruthenium alloy plating layer.
可选的,所述抗人工汗液电解金属层的厚度范围为0.75μm-1μm。Optionally, the thickness of the anti-artificial sweat electrolytic metal layer ranges from 0.75 μm to 1 μm.
可选的,所述金属阻挡层为钯镀层、铂镀层、钯钴合金镀层、钯铂合金镀层、钯银合金镀层、钯金合金镀层,或钯铟合金镀层。Optionally, the metal barrier layer is a palladium plating layer, a platinum plating layer, a palladium cobalt alloy plating layer, a palladium platinum alloy plating layer, a palladium silver alloy plating layer, a palladium gold alloy plating layer, or a palladium indium alloy plating layer.
可选的,所述金属阻挡层的厚度范围为0.6μm-1μm。Optionally, the thickness of the metal barrier layer ranges from 0.6 μm to 1 μm.
可选的,所述酸铜层和所述金属阻挡层之间还设置有抗氧化金属层。Optionally, an anti-oxidation metal layer is further provided between the acid copper layer and the metal barrier layer.
可选的,所述抗氧化金属层为银镀层、锡银合金镀层,或铜锡锌合金镀层。Optionally, the anti-oxidation metal layer is a silver plating layer, a tin-silver alloy plating layer, or a copper-tin-zinc alloy plating layer.
可选的,所述抗氧化金属层的厚度范围为2μm-4.5μm。Optionally, the thickness of the anti-oxidation metal layer ranges from 2 μm to 4.5 μm.
可选的,所所述金属阻挡层和抗人工汗液电解金属层之间还设置有导电金属层。Optionally, a conductive metal layer is further provided between the metal barrier layer and the anti-artificial sweat electrolysis metal layer.
可选的,所述导电金属层为银镀层、锡银合金镀层、铜锡锌合金镀层、或金镀层。Optionally, the conductive metal layer is a silver plating layer, a tin-silver alloy plating layer, a copper-tin-zinc alloy plating layer, or a gold plating layer.
可选的,所述导电金属层的厚度范围为0.5μm-0.75μm。Optionally, the thickness of the conductive metal layer ranges from 0.5 μm to 0.75 μm.
可选的,所述抗人工汗液电解金属层外形成有易焊接金属层。Optionally, an easy-to-weld metal layer is formed outside the artificial sweat-resistant electrolytic metal layer.
可选的,所述易焊接金属镀层为金镀层、锡镀层、铜锡锌合金镀层、或锡银合金镀层。Optionally, the solderable metal plating layer is a gold plating layer, a tin plating layer, a copper-tin-zinc alloy plating layer, or a tin-silver alloy plating layer.
可选的,所述易焊接金属层的厚度范围为0.125μm-0.25μm。Optionally, the thickness of the easy-to-weld metal layer ranges from 0.125 μm to 0.25 μm.
可选的,所述磁性件为钕铁硼磁铁或钐钴磁铁。Optionally, the magnetic member is a neodymium iron boron magnet or a samarium cobalt magnet.
第二方面,本发明实施例提供一种触点结构,所述触点结构包括:In a second aspect, an embodiment of the present invention provides a contact structure, and the contact structure includes:
框架;frame;
接触件,与所述框架连接;以及A contact piece connected to the frame; and
如上所述的触点;Contacts as described above;
其中,所述触点通过弹性件与所述框架连接,所述弹性件用于对所述触点施加弹性力以使所述触点与所述框架相对定位,并使所述触点和接触件在第一方向上具有设定距离,且所述弹性件在外力作用下沿所述第一方向伸展以使得所述触点能够与所述接触件接触并形成电连接。Wherein, the contact is connected to the frame through an elastic member, and the elastic member is used to apply an elastic force to the contact to position the contact relative to the frame, and to make the contact and the contact The element has a set distance in the first direction, and the elastic element stretches along the first direction under the action of an external force so that the contact can contact the contact element and form an electrical connection.
可选的,所述框架内形成有腔体,所述接触件位于所述腔体内,所述弹性件封闭 所述触点和框架之间的间隙以密封所述腔体。Optionally, a cavity is formed in the frame, the contact member is located in the cavity, and the elastic member closes the gap between the contact and the frame to seal the cavity.
可选的,所述触点上形成有第一卡持部,所述第一卡持部沿所述触点的周向延伸,所述弹性件为板状,所述弹性件上形成有连接孔和第二卡持部,所述第二卡持部设置在所述连接孔的边缘处并沿所述连接孔的周向延伸,所述第一卡持部和所述第二卡持部卡持连接。Optionally, a first clamping portion is formed on the contact, the first clamping portion extends along the circumferential direction of the contact, the elastic member is plate-shaped, and a connection is formed on the elastic member Hole and a second clamping portion, the second clamping portion is provided at the edge of the connecting hole and extending along the circumference of the connecting hole, the first clamping portion and the second clamping portion Card connection.
可选的,所述第一卡持部为卡榫,所述第二卡持部为卡槽。Optionally, the first clamping portion is a tenon, and the second clamping portion is a clamping slot.
可选的,所述弹性件的外边缘形成有第三卡持部,所述框架上形成有第四卡持部,所述第三卡持部和所述第四卡持部卡持连接。Optionally, a third clamping portion is formed on the outer edge of the elastic member, a fourth clamping portion is formed on the frame, and the third clamping portion and the fourth clamping portion are connected in a clamping manner.
可选的,所述第三卡持部为卡榫,所述第四卡持部为卡槽。Optionally, the third clamping portion is a tenon, and the fourth clamping portion is a clamping slot.
可选的,所述弹性件上还形成有凹槽,所述凹槽沿所述连接件的周向延伸以围绕所述连接孔设置,所述凹槽与所述连接孔之间具有设定距离。Optionally, a groove is further formed on the elastic member, and the groove extends along the circumferential direction of the connecting member to surround the connecting hole, and there is a setting between the groove and the connecting hole. distance.
可选的,所述弹性件为硅胶件。Optionally, the elastic piece is a silicone piece.
可选的,所述弹性件为所述电路板上的弹片。Optionally, the elastic member is an elastic piece on the circuit board.
第三方面,本发明实施例提供一种电子设备,所述电子设备包括:In a third aspect, an embodiment of the present invention provides an electronic device, and the electronic device includes:
电子设备主体;以及The main body of the electronic equipment; and
如本发明实施例第一方面所述的触点或本发明第二实施例所述的触点结构。The contact according to the first aspect of the embodiment of the present invention or the contact structure according to the second embodiment of the present invention.
第四方面,本发明实施例提供一种充电设备,所述充电设备包括:In a fourth aspect, an embodiment of the present invention provides a charging device, and the charging device includes:
充电设备主体;以及The main body of the charging device; and
如本发明实施例第一方面所述的触点或本发明第二实施例所述的触点结构。The contact according to the first aspect of the embodiment of the present invention or the contact structure according to the second embodiment of the present invention.
在本发明实施例中,所述触点包括磁性件和导电层,所述导电层在所述磁性件的外侧,所述磁性件设置在电路板上,所述导电层与所述电路板电连接。由此,在采用本实施例的触点充电时,在磁性件的吸附作用下能够使电子设备上的触点与充电设备上的触点吸附定位,以实现电子设备和充电设备的电连接,并且,在电子设备上的触点与充电设备上的触点相连接或相分离过程中不会产生磨损,且在长期使用过程中吸附力不会降低,提高了电子设备上的触点与充电设备上的触点相连接的稳定性和可靠性。同时,由于导电层形成在磁性件的外侧,因此有效降低了所占空间和安装难度,利于电子设备和充电设备的小型化。In an embodiment of the present invention, the contact includes a magnetic element and a conductive layer, the conductive layer is on the outer side of the magnetic element, the magnetic element is disposed on a circuit board, and the conductive layer is electrically connected to the circuit board. connection. Therefore, when using the contact charging of this embodiment, the contact on the electronic device can be adsorbed and positioned with the contact on the charging device under the suction effect of the magnetic member, so as to realize the electrical connection between the electronic device and the charging device. In addition, there will be no wear during the process of connecting or separating the contacts on the electronic device with the contacts on the charging device, and the adsorption force will not decrease during long-term use, which improves the contact and charging on the electronic device. The stability and reliability of the connection of the contacts on the equipment. At the same time, since the conductive layer is formed on the outer side of the magnetic member, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of electronic equipment and charging equipment.
附图说明Description of the drawings
通过以下参照附图对本发明实施例的描述,本发明的上述以及其它目的、特征 和优点将更为清楚,在附图中:Through the following description of the embodiments of the present invention with reference to the accompanying drawings, the above and other objectives, features and advantages of the present invention will be more apparent. In the accompanying drawings:
图1是本发明第一实施例的触点结构的切面示意图;1 is a schematic cross-sectional view of the contact structure of the first embodiment of the present invention;
图2是本发明第一实施例的触点结构的示意图;2 is a schematic diagram of the contact structure of the first embodiment of the present invention;
图3-6是本发明第一实施例的触点镀层的示意图;3-6 are schematic diagrams of the contact plating layer of the first embodiment of the present invention;
图7是本发明实施例的人工汗液电解测试的原理图;FIG. 7 is a schematic diagram of an electrolysis test of artificial sweat according to an embodiment of the present invention;
图8是本发明第二实施例的触点的切面示意图;FIG. 8 is a schematic cross-sectional view of the contact of the second embodiment of the present invention;
图9是本发明第二实施例的触点中的金属外壳镀层的示意图;9 is a schematic diagram of the metal shell plating layer in the contact of the second embodiment of the present invention;
图10是本发明第二实施例的触点中的磁性件镀层的示意图;FIG. 10 is a schematic diagram of the plating layer of the magnetic element in the contact of the second embodiment of the present invention;
图11是本发明第二实施例的触点结构的切面示意图;11 is a schematic cross-sectional view of the contact structure of the second embodiment of the present invention;
图12是本发明第三实施例的触点结构的切面示意图;12 is a schematic cross-sectional view of the contact structure of the third embodiment of the present invention;
图13是本发明第四实施例的触点的切换示意图;13 is a schematic diagram of the switching of the contacts of the fourth embodiment of the present invention;
图14是本发明第四实施例的触点结构的示意图;14 is a schematic diagram of the contact structure of the fourth embodiment of the present invention;
图15是本发明第四实施例的电子设备和充电设备在使用状态下的示意图;15 is a schematic diagram of an electronic device and a charging device in a use state according to a fourth embodiment of the present invention;
图16是本发明第五实施例的电子设备的局部结构示意图;16 is a schematic diagram of a partial structure of an electronic device according to a fifth embodiment of the present invention;
图17是本发明第五实施例的触点结构的局部结构示意图。Fig. 17 is a partial structural diagram of the contact structure of the fifth embodiment of the present invention.
具体实现方式Specific implementation
以下基于实施例对本发明进行描述,但是本发明并不仅仅限于这些实施例。在下文对本发明的细节描述中,详尽描述了一些特定的细节部分。对本领域技术人员来说没有这些细节部分的描述也可以完全理解本发明。为了避免混淆本发明的实质,公知的方法、过程、流程、元件和电路并没有详细叙述。The present invention will be described below based on examples, but the present invention is not limited to these examples. In the following detailed description of the present invention, some specific details are described in detail. Those skilled in the art can fully understand the present invention without the description of these details. In order to avoid obscuring the essence of the present invention, the well-known methods, processes, procedures, components and circuits are not described in detail.
此外,本领域普通技术人员应当理解,在此提供的附图都是为了说明的目的,并且附图不一定是按比例绘制的。In addition, those of ordinary skill in the art should understand that the drawings provided herein are for illustrative purposes, and the drawings are not necessarily drawn to scale.
除非上下文明确要求,否则在说明书的“包括”、“包含”等类似词语应当解释为包含的含义而不是排他或穷举的含义;也就是说,是“包括但不限于”的含义。Unless clearly required by the context, similar words such as "including" and "including" in the specification should be interpreted as inclusive rather than exclusive or exhaustive meanings; that is to say, "including but not limited to".
在本发明的描述中,需要理解的是,术语“第一”、“第二”等仅用于描述目的,而不能理解为指示或暗示相对重要性。此外,在本发明的描述中,除非另有说明,“多个”的含义是两个或两个以上。In the description of the present invention, it should be understood that the terms "first", "second", etc. are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance. In addition, in the description of the present invention, unless otherwise specified, "plurality" means two or more.
除非另有明确的规定和限定,术语“安装”、“相连”、“连接”、“固定”等术语应做广义理解,例如,可以是固定连接,也可以是可拆卸连接,或成一体;可以是机 械连接,也可以是电连接;可以是直接相连,也可以通过中间媒介间接相连,可以是两个元件内部的连通或两个元件的相互作用关系,除非另有明确的限定。对于本领域的普通技术人员而言,可以根据具体情况理解上述术语在本实用新型中的具体含义。Unless otherwise clearly stipulated and limited, the terms "installed", "connected", "connected", "fixed" and other terms should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or a whole; It can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediary, and it can be an internal communication between two elements or an interaction relationship between two elements, unless specifically defined otherwise. For those of ordinary skill in the art, the specific meaning of the above-mentioned terms in the present utility model can be understood according to specific circumstances.
另外注意的是,如果没有特别说明,本发明所记载的任何范围包括端值以及端值之间的任何数值以及以端值或者端值之间的任意数值所构成的任意子范围。In addition, it should be noted that, unless otherwise specified, any range described in the present invention includes an end value and any value between the end values, and any sub-range formed by the end value or any value between the end values.
在本说明书的描述中,描述的具体特征、结构、材料或者特点可以在任一个或多个实施例或示例中以合适的方式结合。此外,在不相互矛盾的情况下,本领域的技术人员可以将本说明书中描述的不同实施例或示例以及不同实施例或示例的特征进行结合和组合。In the description of this specification, the described specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine the different embodiments or examples and the features of the different embodiments or examples described in this specification without contradicting each other.
为了解决现有的充电方式可靠性较低的问题,本发明实施例提供了一种触点以及触点结构,包括磁性件和导电层。其中,导电层在磁性件的外层,磁性件设置在充电设备或电子设备的电路板上,导电层与电路板电连接。In order to solve the problem of low reliability of existing charging methods, embodiments of the present invention provide a contact and a contact structure, which include a magnetic element and a conductive layer. Wherein, the conductive layer is on the outer layer of the magnetic member, the magnetic member is arranged on the circuit board of the charging device or the electronic device, and the conductive layer is electrically connected to the circuit board.
可选的,导电层可以为形成在磁性件表面的镀层,也可以为一覆盖磁性件的金属外壳。在本实现方式中,由于钕铁硼磁铁或钐钴磁铁具有较大的磁通量,在充磁后磁铁吸力较大,因此,本实施例的磁性件可以为钕铁硼磁铁或钐钴磁铁,但本实施例并不对此进行限制。Optionally, the conductive layer may be a plating layer formed on the surface of the magnetic member, or may be a metal shell covering the magnetic member. In this implementation manner, since the neodymium iron boron magnet or the samarium cobalt magnet has a relatively large magnetic flux, the magnet has a relatively large attractive force after magnetization. Therefore, the magnetic part of this embodiment may be a neodymium iron boron magnet or a samarium cobalt magnet, but This embodiment does not limit this.
在采用触点充电时,磁性件可设置在电子设备和充电设备的电路板上,由于导电层与电子设备和充电设备的电路板电连接,当电子设备需要充电时,可使电子设备上的触点与充电设备上的触点相接触,在磁性件的吸附作用下能够使电子设备上的触点与充电设备上的触点吸附定位,因此,当电子设备上的触点与充电设备上的触点相接触时能够使电子设备和充电设备电连接,从而使充电设备能够对电子设备进行充电。由于电子设备上的触点与充电设备上的触点通过吸附作用相对定位,因此,在电子设备上的触点与充电设备上的触点相连接或相分离过程中不会产生磨损,且在长期使用过程中吸附力不会降低,提高了电子设备上的触点与充电设备上的触点相连接的稳定性,避免了松脱、断电的问题,提高了触点使用的可靠性。同时,由于导电层形成在磁性件的外侧,因此有效降低了所占空间和安装难度,利于电子设备和充电设备的小型化。When using contact charging, the magnetic part can be set on the circuit board of the electronic device and the charging device. Since the conductive layer is electrically connected to the circuit board of the electronic device and the charging device, when the electronic device needs to be charged, the The contacts are in contact with the contacts on the charging equipment, and the magnetic parts can make the contacts on the electronic equipment and the contacts on the charging equipment adsorb and position. Therefore, when the contacts on the electronic equipment and the charging equipment When the contacts are in contact, the electronic device and the charging device can be electrically connected, so that the charging device can charge the electronic device. Since the contacts on the electronic device and the contacts on the charging device are relatively positioned by adsorption, there will be no wear and tear during the process of connecting or separating the contacts on the electronic device and the contacts on the charging device. The adsorption force will not decrease during long-term use, which improves the stability of the connection between the contacts on the electronic equipment and the contacts on the charging equipment, avoids the problems of loosening and power failure, and improves the reliability of the use of the contacts. At the same time, since the conductive layer is formed on the outer side of the magnetic member, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of electronic equipment and charging equipment.
以下采用具体实施例对本发明实施例的触点、触点结构以及应用触点的电子设备和充电设备进行描述,应理解,以下的仅为部分实施例,其他满足上述结构并能够实现上述功能的触点及触点结构均在本发明实施例的保护范围内。The following uses specific embodiments to describe the contacts, the contact structure, and the electronic equipment and charging equipment using the contacts of the embodiments of the present invention. It should be understood that the following are only some of the embodiments, and others that meet the above-mentioned structure and can realize the above-mentioned functions The contacts and the contact structure are both within the protection scope of the embodiments of the present invention.
实施例一Example one
图1是本发明第一实施例的触点结构的切面示意图。图2是本发明第二实施例的触点结构的示意图。如图1所示,触点结构1触点11和电路板12。触点11包括磁性件111和导电层112。其中,导电层112在磁性件111的外层,磁性件111设置在充电设备或电子设备的电路板12上,导电层112与电路板12电连接。FIG. 1 is a schematic cross-sectional view of the contact structure of the first embodiment of the present invention. Fig. 2 is a schematic diagram of the contact structure of the second embodiment of the present invention. As shown in FIG. 1, the contact structure 1 is the contact 11 and the circuit board 12. The contact 11 includes a magnetic member 111 and a conductive layer 112. Wherein, the conductive layer 112 is on the outer layer of the magnetic member 111, the magnetic member 111 is disposed on the circuit board 12 of the charging device or the electronic device, and the conductive layer 112 is electrically connected to the circuit board 12.
在本实施例中,磁性件111为圆柱体,应理解,本实施例并不对磁性件的形状进行具体限制,其他形状例如正方体等均可应用于本实施例中。In this embodiment, the magnetic member 111 is a cylinder. It should be understood that the shape of the magnetic member is not specifically limited in this embodiment, and other shapes such as cubes can be applied in this embodiment.
在一种可选的实现方式中,导电层112为导电材料镀层,其形成在磁性件111的外表面。可选的,导电层112为导电防腐镀层,优选地,导电层112为金镀层,以提高导电层的导电性能和耐腐蚀性能。应理解,导电层112还可以为镍镀层、铜镀层或镍铜合金镀层等,本实施例并不对此进行限制。In an optional implementation manner, the conductive layer 112 is a conductive material plating layer, which is formed on the outer surface of the magnetic member 111. Optionally, the conductive layer 112 is a conductive anticorrosive coating. Preferably, the conductive layer 112 is a gold coating to improve the conductivity and corrosion resistance of the conductive layer. It should be understood that the conductive layer 112 may also be a nickel plating layer, a copper plating layer, or a nickel copper alloy plating layer, etc., which is not limited in this embodiment.
本实施例通过触点1的电路板12使得充电设备和电子设备实现电连接,并且电子设备上的触点1与充电设备上的触点1通过磁性件的吸附作用相对定位,因此,在电子设备上的触点1与充电设备上的触点1相连接或相分离过程中不会产生磨损,且在长期使用过程中吸附力不会降低,提高了电子设备上的触点1与充电设备上的触点1相连接的稳定性,避免了松脱、断电的问题,提高了触点1使用的可靠性。同时,由于导电层12形成在磁性件11的外表面,因此有效降低了所占空间和安装难度,利于电子设备和充电设备的小型化。In this embodiment, the electrical connection between the charging device and the electronic device is achieved through the circuit board 12 of the contact 1, and the contact 1 on the electronic device and the contact 1 on the charging device are relatively positioned by the adsorption of the magnetic member. The contact 1 on the device and the contact 1 on the charging device will not be worn during the process of connecting or separating, and the adsorption force will not decrease during long-term use, which improves the contact 1 on the electronic device and the charging device The stability of the connection of the contact 1 on the upper side avoids the problems of loosening and power failure, and improves the reliability of the use of the contact 1. At the same time, since the conductive layer 12 is formed on the outer surface of the magnetic member 11, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of electronic equipment and charging equipment.
图3-6是本发明第三实施例的触点镀层的示意图。3-6 are schematic diagrams of the contact plating layer of the third embodiment of the present invention.
在另一种可选的实现方式中,如图3所示,触点11包括磁性件31和导电层32。在本实施例中,优选地,导电层32包括抗腐蚀金属层321、酸铜层或酸镍层322、金属阻挡层323以及抗人工汗液电解金属层324。其中,抗腐蚀金属层321、酸铜层或酸镍层322、金属阻挡层323以及抗人工汗液电解金属层324依次形成在所述磁性件的外表面。在本实施例中,可选的,磁性件31可以为如图1所示的圆柱形,也可以如图2所示的形状,或其他形状,本实施例并不对此进行限制。In another alternative implementation manner, as shown in FIG. 3, the contact 11 includes a magnetic member 31 and a conductive layer 32. In this embodiment, preferably, the conductive layer 32 includes an anti-corrosion metal layer 321, an acid copper layer or an acid nickel layer 322, a metal barrier layer 323, and an anti-artificial sweat electrolysis metal layer 324. Wherein, an anti-corrosion metal layer 321, an acid copper layer or an acid nickel layer 322, a metal barrier layer 323, and an anti-artificial sweat electrolytic metal layer 324 are sequentially formed on the outer surface of the magnetic member. In this embodiment, optionally, the magnetic member 31 may be cylindrical as shown in FIG. 1, or may have a shape as shown in FIG. 2, or other shapes, which is not limited in this embodiment.
在本实施例中,在磁性件31表面电镀抗腐蚀金属层321是为了避免酸铜层或酸镍层322对磁性件31的腐蚀。在抗腐蚀金属层321上电镀酸铜层或酸镍层322,一方面是为了将磁性件31表面的小孔隙填平使其表面光滑平整,降低磁性件31表面的粗糙度,从而提高其他金属镀层的附着力;另一方面是可控制整体镀层的光哑度,触点3表面光哑度达到所需要求。在酸铜层或酸镍层322上电镀金属阻挡层323,一方面 是为了有效防止覆盖在磁性件31表面的酸铜层322以及抗腐蚀金属层321中的铜释放扩散到其他镀层中,进而影响其他镀层的性能;另一方面是为了提高整体镀层的耐盐雾和耐人工汗液静态测试。在金属阻挡层323上电镀抗人工汗液电解金属层324,这是为了增强磁性件31外整体镀层耐盐雾测试、耐人工汗液静态测试及充电时人工汗液电解测试的性能。在本实现方式中,电镀过程可以采用的常规电镀工艺实现的。In this embodiment, the corrosion-resistant metal layer 321 is plated on the surface of the magnetic member 31 to avoid corrosion of the magnetic member 31 by the acid copper layer or the acid nickel layer 322. Electroplating the acid copper layer or the acid nickel layer 322 on the corrosion-resistant metal layer 321, on the one hand, is to fill the small pores on the surface of the magnetic part 31 to make the surface smooth and flat, reduce the surface roughness of the magnetic part 31, and improve other metals. The adhesion of the coating; on the other hand, the gloss of the overall coating can be controlled, and the surface gloss of the contact 3 meets the required requirements. The metal barrier layer 323 is electroplated on the acid copper layer or the acid nickel layer 322. On the one hand, it is to effectively prevent the copper in the acid copper layer 322 and the corrosion-resistant metal layer 321 covering the surface of the magnetic member 31 from being released and diffusing into other plating layers. Affect the performance of other coatings; on the other hand, it is to improve the salt spray and artificial sweat resistance of the overall coating static test. The anti-artificial sweat electrolysis metal layer 324 is electroplated on the metal barrier layer 323, which is to enhance the performance of the salt spray resistance test, the artificial sweat resistance static test and the artificial sweat electrolysis test during charging of the overall coating of the magnetic member 31. In this implementation manner, the electroplating process can be implemented using a conventional electroplating process.
在一种可选的实现方式中,酸铜层322的厚度范围为10μm-100μm,100μm(例如10μm、18μm、18.5μm、19μm、19.5μm、20μm或100μm等);在更进一步的实现方式中,酸铜层322的厚度为18μm-20μm(例如18μm、18.5μm、19μm、19.5μm或20μm等)。In an optional implementation manner, the thickness of the acid copper layer 322 ranges from 10 μm to 100 μm, 100 μm (for example, 10 μm, 18 μm, 18.5 μm, 19 μm, 19.5 μm, 20 μm, or 100 μm, etc.); in a further embodiment The thickness of the acid copper layer 322 is 18 μm-20 μm (for example, 18 μm, 18.5 μm, 19 μm, 19.5 μm, or 20 μm, etc.).
在一种可选的实现方式中,抗人工汗液电解金属层324为铑(Rh)镀层、钌(Ru)镀层,或铑钌(RhRu)合金镀层。优选地,为了使磁性件31外的镀层具有良好的耐人工汗液电解测试性能,抗人工汗液电解金属层324为RhRu合金镀层。在一种可选的实现方式中,抗人工汗液电解金属层324的厚度范围为0.75μm-100μm(例如0.75μm、0.8μm、0.85μm、0.9μm、1μm、10μm或100μm等);在更进一步的实现方式中,抗人工汗液电解金属层324的厚度范围为0.75μm-1μm(例如0.75μm、0.8μm、0.85μm、0.μm9或1μm等)。In an optional implementation manner, the anti-artificial sweat electrolytic metal layer 324 is a rhodium (Rh) plating layer, a ruthenium (Ru) plating layer, or a rhodium ruthenium (RhRu) alloy plating layer. Preferably, in order to make the coating on the outside of the magnetic member 31 have good resistance to artificial sweat electrolysis test performance, the anti-artificial sweat electrolysis metal layer 324 is a RhRu alloy coating. In an optional implementation, the thickness of the anti-artificial sweat electrolytic metal layer 324 ranges from 0.75 μm to 100 μm (for example, 0.75 μm, 0.8 μm, 0.85 μm, 0.9 μm, 1 μm, 10 μm, or 100 μm, etc.); in a further step In the implementation manner, the thickness of the anti-artificial sweat electrolytic metal layer 324 ranges from 0.75 μm to 1 μm (for example, 0.75 μm, 0.8 μm, 0.85 μm, 0. μm9, or 1 μm, etc.).
在一种可选的实现方式中,抗腐蚀金属层321为焦铜镀层或中性镍层。在更进一步的实现方式中,抗腐蚀金属层321为焦铜镀层。由于磁性件31与强碱性物质接触时容易被腐蚀,而焦铜电镀液偏中性,因此在磁性件31表面电镀焦铜镀层,一方面可以很好的阻隔酸铜电镀液与磁性件31的接触,从而保证磁性件31不被腐蚀,另一方面由于焦铜镀层与磁性件31有很好的附着力,因此电镀焦铜镀层可以提高后续其他金属镀层的附着力。In an optional implementation manner, the corrosion-resistant metal layer 321 is a coke copper plating layer or a neutral nickel layer. In a further implementation manner, the corrosion-resistant metal layer 321 is a coke copper plating layer. Since the magnetic parts 31 are easily corroded when they are in contact with strong alkaline substances, and the coke copper electroplating solution is neutral, electroplating the coke copper coating on the surface of the magnetic parts 31 can effectively block the acid copper electroplating solution and the magnetic parts 31 on the one hand. In order to ensure that the magnetic part 31 is not corroded, on the other hand, since the scorched copper coating has good adhesion with the magnetic part 31, the electroplated scorched copper coating can improve the adhesion of subsequent other metal coatings.
在进一步的实现方式中,抗腐蚀金属层321的厚度范围为8μm-100μm(例如8μm、8.5μm、9μm、9.5μm、10μm、50μm或100μm等);在更进一步的实现方式中,抗腐蚀金属层321的厚度范围为8μm-10μm(例如8μm、8.5μm、9μm、9.5或10μm等)。In a further implementation manner, the thickness of the corrosion-resistant metal layer 321 ranges from 8 μm to 100 μm (for example, 8 μm, 8.5 μm, 9 μm, 9.5 μm, 10 μm, 50 μm, or 100 μm, etc.); in a further implementation manner, the corrosion-resistant metal layer The thickness of the layer 321 ranges from 8 μm to 10 μm (for example, 8 μm, 8.5 μm, 9 μm, 9.5 or 10 μm, etc.).
在进一步的实现方式中,为了有效防止磁性件31表面的铜层释放扩散到其他金属镀层中,进而影响其他金属镀层的性能;金属阻挡层323可以为钯镀(Pd)层、铂(Pt)镀层、钯钴(PdCo)合金镀层、钯铂(PdPt)合金镀层、钯银(PdAg)合金镀层、钯金(PdAu)合金镀层,或钯铟(PdIn)合金镀层。在更进一步的实现方式中,为了提高磁性件31表面镀层的耐热性,进而防止磁性件31表面的镀层出现爆裂现象, 所述金属阻挡层可以为Pd镀层。In a further implementation, in order to effectively prevent the copper layer on the surface of the magnetic member 31 from being released and diffused into other metal coatings, thereby affecting the performance of other metal coatings; the metal barrier layer 323 may be a palladium (Pd) layer or platinum (Pt). Plating layer, palladium cobalt (PdCo) alloy plating layer, palladium platinum (PdPt) alloy plating layer, palladium silver (PdAg) alloy plating layer, palladium gold (PdAu) alloy plating layer, or palladium indium (PdIn) alloy plating layer. In a further implementation manner, in order to improve the heat resistance of the coating on the surface of the magnetic member 31 and to prevent the coating on the surface of the magnetic member 31 from bursting, the metal barrier layer may be a Pd coating.
在进一步的实现方式中,金属阻挡层323的厚度范围为0.4μm-100μm(例如0.4μm、0.6μm、0.63μm、0.65μm、0.7μm、0.8μm、1μm、10μm、50μm或100μm等);在更一步的实现方式中,金属阻挡层323的厚度范围为0.6μm-0.75μm(例如0.6μm、0.63μm、0.65μm、0.7μm或0.75μm等)。In a further implementation, the thickness of the metal barrier layer 323 ranges from 0.4 μm to 100 μm (for example, 0.4 μm, 0.6 μm, 0.63 μm, 0.65 μm, 0.7 μm, 0.8 μm, 1 μm, 10 μm, 50 μm, or 100 μm, etc.); In a further implementation, the thickness of the metal barrier layer 323 ranges from 0.6 μm to 0.75 μm (for example, 0.6 μm, 0.63 μm, 0.65 μm, 0.7 μm, or 0.75 μm, etc.).
在进一步的实现方式中,导电层32的最外层进行了封孔处理。其中,封孔处理是指利用封孔剂对最外层镀层表面上的微孔进行封孔处理。镀层进行封孔处理不仅可以保护最外层的镀层不被氧化,提高SMT(Surface Mount Technology,表面装贴技术)时镀层的焊接效果,而且可以避免空气通过微孔氧化磁性件31,进而防止SMT时磁性件31表面的镀层发生爆裂现象。应理解,在本实现方式中,导电层32的最外层是指抗人工汗液电解金属层。In a further implementation, the outermost layer of the conductive layer 32 is sealed. Among them, the sealing treatment refers to the use of a sealing agent to seal the micropores on the surface of the outermost plating layer. The sealing treatment of the plating layer can not only protect the outermost plating layer from oxidation, improve the welding effect of the plating layer during SMT (Surface Mount Technology), but also prevent air from oxidizing the magnetic parts 31 through the microholes, thereby preventing SMT At this time, the plating layer on the surface of the magnetic member 31 bursts. It should be understood that, in this implementation, the outermost layer of the conductive layer 32 refers to a metal layer that is resistant to artificial sweat electrolysis.
传统磁性件的镀层由于高温容易发生爆裂,因此导致传统磁铁基材不能进行SMT。另外,传统具有镀层的磁性件SMT后进行充电人工汗液电解测试,在1分钟内所有镀层会电解掉,进而造成充电触点结构无法充电。本实现方式通过在磁性件表面覆盖抗腐蚀金属层、酸铜层或酸镍层、金属阻挡层以及抗人工汗液电解金属层,不仅提高了磁性件表面的平整性及光滑度,而且实现了磁性件在SMT后具有耐盐雾测试、耐人工汗液静态测试,以及耐人工汗液电解测试的性能,以使得触点不能进行SMT或SMT后不能充电的问题。The coating of traditional magnetic parts is prone to burst due to high temperature, so that the traditional magnet base material cannot be SMT. In addition, the traditional electroplated magnetic parts SMT are subjected to a charging artificial sweat electrolysis test, and all the coatings will be electrolyzed within 1 minute, which will cause the charging contact structure to fail to be charged. This implementation method not only improves the flatness and smoothness of the surface of the magnetic part, but also realizes magnetism by covering the surface of the magnetic part with an anti-corrosion metal layer, an acid copper layer or an acid nickel layer, a metal barrier layer, and an anti-artificial sweat electrolytic metal layer. After SMT, the parts have the performance of salt spray resistance test, artificial sweat resistance static test, and artificial sweat resistance electrolysis test, so that the contacts cannot be subjected to SMT or cannot be charged after SMT.
在一种可选的实现方式中,如图4所示,为了保护酸铜层322和/或焦铜镀层(抗腐蚀金属层321为焦铜镀层时)中的铜在整个镀层电镀过程中不被氧化,导电层32还包括抗氧化金属层325,其中,抗氧化金属层325形成在设置在酸铜层322和金属阻挡层323之间。In an optional implementation manner, as shown in FIG. 4, in order to protect the copper in the acid copper layer 322 and/or the scorched copper plating layer (when the corrosion-resistant metal layer 321 is the scorched copper plating layer), the copper in the entire plating process is not After being oxidized, the conductive layer 32 further includes an anti-oxidation metal layer 325, wherein the anti-oxidation metal layer 325 is formed between the acid copper layer 322 and the metal barrier layer 323.
在一种可选的实现方式中,抗氧化金属镀层325可以为银(Ag)镀层、锡银(SnAg)合金镀层,或铜锡锌(CuSnZn)合金镀层。在进一步的实现方式中,抗氧化金属层325为CuSnZn镀层,以提高抗氧化金属层325的抗氧化效果。In an optional implementation manner, the oxidation-resistant metal coating 325 may be a silver (Ag) coating, a tin-silver (SnAg) alloy coating, or a copper-tin-zinc (CuSnZn) alloy coating. In a further implementation manner, the anti-oxidation metal layer 325 is a CuSnZn plating layer to improve the anti-oxidation effect of the anti-oxidation metal layer 325.
在进一步的实现方式中,抗氧化金属层325的厚度范围为1μm-100μm(例如1μm、2μm、2.5μm、3μm、3.5μm、4μm、4.5μm、10μm、50μm或100μm等);在更进一步的实现方式中,抗氧化金属层325的厚度范围为2μm-4.5μ(例如2μm、2.5μm、3μm、3.5μm、4μm或4.5μm等)。In a further implementation, the thickness of the anti-oxidation metal layer 325 ranges from 1 μm to 100 μm (for example, 1 μm, 2 μm, 2.5 μm, 3 μm, 3.5 μm, 4 μm, 4.5 μm, 10 μm, 50 μm, or 100 μm, etc.); In an implementation manner, the thickness of the oxidation-resistant metal layer 325 ranges from 2 μm to 4.5 μm (for example, 2 μm, 2.5 μm, 3 μm, 3.5 μm, 4 μm, 4.5 μm, etc.).
在一种可选的实现方式中,如图5所示,为了提高整体镀层的导电性,导电层32 还包括导电金属层326。其中,导电金属层326形成在金属阻挡层323和抗人工汗液电解金属层324之间。In an optional implementation manner, as shown in FIG. 5, in order to improve the conductivity of the overall plating layer, the conductive layer 32 further includes a conductive metal layer 326. Wherein, the conductive metal layer 326 is formed between the metal barrier layer 323 and the anti-artificial sweat electrolysis metal layer 324.
在一种可选的实现方式中,导电金属层326可以为银(Ag)镀层、锡银(SnAg)合金镀层、铜锡锌(CuSnZn)合金镀层、或金(Au)镀层。在进一步的实现方式中,导电金属层326为Au镀层。其中,Au镀层具有阻抗小和导电性好的特点,并且Au镀层可以提高整体镀层的耐盐雾测试和耐人工汗液静态测试的性能。In an optional implementation manner, the conductive metal layer 326 may be a silver (Ag) plating layer, a tin-silver (SnAg) alloy plating layer, a copper tin zinc (CuSnZn) alloy plating layer, or a gold (Au) plating layer. In a further implementation, the conductive metal layer 326 is an Au plating layer. Among them, the Au coating has the characteristics of low impedance and good conductivity, and the Au coating can improve the salt spray test and artificial sweat static test performance of the overall coating.
在进一步的实现方式中,导电金属层326的厚度范围为0.3μm-100μm(例如0.3μm、0.5μm、0.55μm、0.6μm、0.65μm、0.7μm、0.75μm、10μm或100μm等)。在更进一步的实现方式中,导电金属层326的厚度范围为0.5μm-0.75μm(例如0.5μm、0.55μm、μm0.6、0.65μm、0.7μm或0.75μm等)。In a further implementation, the thickness of the conductive metal layer 326 ranges from 0.3 μm to 100 μm (for example, 0.3 μm, 0.5 μm, 0.55 μm, 0.6 μm, 0.65 μm, 0.7 μm, 0.75 μm, 10 μm, or 100 μm, etc.). In a further implementation manner, the thickness of the conductive metal layer 326 ranges from 0.5 μm to 0.75 μm (for example, 0.5 μm, 0.55 μm, μm 0.6, 0.65 μm, 0.7 μm, or 0.75 μm, etc.).
在一种可选的实现方式中,如图6所示,为了提高SMT时磁性件31外镀层与焊锡的焊接性能,导电层32还包括易焊接金属层327。其中,易焊接金属层327形成在抗人工汗液电解金属层324的外侧。In an optional implementation manner, as shown in FIG. 6, in order to improve the welding performance between the outer plating layer of the magnetic component 31 and the solder during SMT, the conductive layer 32 further includes an easy-to-weld metal layer 327. Among them, the easy-to-weld metal layer 327 is formed on the outer side of the artificial sweat resistant metal layer 324.
在一种可选的实现方式中,易焊接金属镀层327可以为金(Au)镀层、锡(Sn)镀层、铜锡锌(CuSnZn)合金镀层、或锡银(SnAg)合金镀层。在更进一步的实现方式中,易焊接金属层327为Au镀层,以提高镀层的导电性、焊接性、耐盐雾测试和耐人工汗液静态测试的性能。由于在SMT时焊锡能够很容易的浸润到Au镀层,因此,易焊接金属层327采用Au镀层可以提高整体镀层的焊接性能,以快速地实现焊接。In an optional implementation manner, the solderable metal plating layer 327 may be a gold (Au) plating layer, a tin (Sn) plating layer, a copper tin zinc (CuSnZn) alloy plating layer, or a tin silver (SnAg) alloy plating layer. In a further implementation manner, the easily weldable metal layer 327 is an Au plating layer to improve the conductivity, weldability, salt spray test resistance and artificial sweat static test performance of the plating layer. Since the solder can easily infiltrate the Au plating layer during SMT, the use of the Au plating layer for the easily solderable metal layer 327 can improve the soldering performance of the overall plating layer, so as to quickly achieve soldering.
在进一步的实现方式中,易焊接金属镀层327的厚度范围为0.125μm-100μm(例如0.125μm、0.15μm、0.18μm、0.20μm、0.25μm、10μm或100μm等);在更进一步的实现方式中,易焊接金属镀层327的厚度范围为0.125μm-0.25μm(例如0.125μm、0.15μm、0.18μm、0.20μm、10μm或0.25μm等)。In a further implementation manner, the thickness of the easily solderable metal plating layer 327 ranges from 0.125 μm to 100 μm (for example, 0.125 μm, 0.15 μm, 0.18 μm, 0.20 μm, 0.25 μm, 10 μm, or 100 μm, etc.); in a further embodiment The thickness of the easily solderable metal plating layer 327 ranges from 0.125 μm to 0.25 μm (for example, 0.125 μm, 0.15 μm, 0.18 μm, 0.20 μm, 10 μm, 0.25 μm, etc.).
同时,本实施例还提供了实施例一的触点11的制备方法,包括:选取特定规格的磁性件31;在所述磁性件31表面进行电镀,形成导电层32;在导电层32表面进行封孔处理,得到具有镀层的磁性件31;对所述具有镀层的磁性件31进行充磁处理,得到触点11。At the same time, this embodiment also provides a method for preparing the contact 11 of the first embodiment, which includes: selecting a magnetic member 31 of a specific specification; electroplating on the surface of the magnetic member 31 to form a conductive layer 32; and performing a method on the surface of the conductive layer 32. The sealing process is performed to obtain a plated magnetic piece 31; the plated magnetic piece 31 is subjected to a magnetization treatment to obtain a contact 11.
在进一步的实现方式中,触点11的制备方法还包括:将具有镀层的磁性件31SMT至电路板中,然后对所述具有镀层的磁性件31进行充磁处理,以得到触点结构。In a further implementation, the manufacturing method of the contact 11 further includes: SMT the plated magnetic part 31 into the circuit board, and then perform magnetization treatment on the plated magnetic part 31 to obtain a contact structure.
本实现方式将具有镀层的磁性件31SMT到电路板上,然后进行充磁;这样不仅 可解决传统带磁磁铁SMT时吸附其他件器件的问题,而且可解决带磁磁铁在SMT时出现的高温退磁的问题,方便触点SMT至电路板上,形成触点结构。In this implementation method, the plated magnetic component 31SMT is applied to the circuit board and then magnetized; this not only solves the problem of attracting other components in the traditional SMT with magnetic magnet, but also solves the high temperature demagnetization of the magnetic magnet in SMT It is convenient to contact the SMT to the circuit board to form a contact structure.
实施方式1-1Embodiment 1-1
在一种可选的实现方式中,如图2所示的触点结构1,以磁性件为圆柱形为例进行说明,如图6所示的触点11,触点结构包括:磁性件31(例如钕铁硼磁铁),磁性件31表面覆盖有镀层32;镀层32从里到外依次为焦铜镀层、酸铜层、CuSnZn镀层、Pd镀层、第一Au镀层、RhRu合金镀层以及第二Au镀层。焦铜镀层的厚度范围为8μm-10μm,酸铜层的厚度范围为18μm-20μm,CuSnZn镀层的厚度范围为2μm-4.5μm,Pd镀层的厚度范围为0.6μm-0.75μm,第一Au镀层的厚度范围为0.5μm-0.75μm,RhRu合金镀层的厚度范围为0.75μm-1μm,第二Au镀层的厚度范围为0.125μm-0.25μm,第二Au镀层是进行封孔处理后的镀层。In an alternative implementation manner, the contact structure 1 shown in FIG. 2 is described by taking the magnetic member as a cylindrical shape as an example. As shown in the contact 11 in FIG. 6, the contact structure includes: a magnetic member 31 (E.g. neodymium iron boron magnet), the surface of the magnetic part 31 is covered with a plating layer 32; the plating layer 32 consists of coke copper plating, acid copper layer, CuSnZn plating, Pd plating, first Au plating, RhRu alloy plating, and second plating from the inside to the outside. Au plating. The thickness of the scorched copper coating is 8μm-10μm, the thickness of the acid copper layer is 18μm-20μm, the thickness of the CuSnZn coating is 2μm-4.5μm, and the thickness of the Pd coating is 0.6μm-0.75μm. The thickness range is 0.5 μm-0.75 μm, the thickness range of the RhRu alloy plating layer is 0.75 μm-1 μm, and the thickness range of the second Au plating layer is 0.125 μm-0.25 μm. The second Au plating layer is the plating layer after the sealing treatment.
一种触点结构的制备方法,包括如下步骤:A method for preparing a contact structure includes the following steps:
步骤1:具有镀层的磁性件31的制备,在本实施例中,磁性件31采用钕铁硼磁铁:Step 1: Preparation of the plated magnetic part 31. In this embodiment, the magnetic part 31 is a neodymium iron boron magnet:
1)将钕铁硼毛胚用胶水粘贴到切割板上,然后采用切割机进行切割,得方条状钕铁硼。可选的,胶水可以为502胶水或者其他能够实现粘贴的胶水。1) Paste the neodymium iron boron embryo onto the cutting board with glue, and then cut it with a cutting machine to obtain a square strip of neodymium iron boron. Optionally, the glue may be 502 glue or other glues that can realize pasting.
2)将粘在切割板上的方条状钕铁硼和水加入至煮料桶内,水加热至沸腾后进行煮料;当方条状钕铁硼上的胶水煮开时,将方条状钕铁硼取出并利用烘干机烘干;对方条状钕铁硼的规格进行质量检测。2) Add the rectangular NdFeB and water that are stuck on the cutting board into the cooking bucket. The water is heated to boiling and then cook; when the glue on the rectangular NdFeB is boiled, the rectangular The NdFeB is taken out and dried with a dryer; the quality of the bar-shaped NdFeB is tested.
3)将检测通过的方条状钕铁硼利用滚圆机滚圆,制得圆柱形钕铁硼;对圆柱形钕铁硼的规格进行质量检测。3) The rectangular NdFeB that has passed the test is rounded by a spheroning machine to obtain a cylindrical NdFeB; the quality of the specifications of the cylindrical NdFeB is tested.
4)将检测通过的多根圆柱形钕铁硼的一端对齐,然后将对齐的一端通过胶水粘贴至切割板上,多根圆柱形钕铁硼之间用胶水粘牢,在圆柱形钕铁硼的长度方向上采用切割机进行切割,得准圆柱形钕铁硼;对准圆柱形钕铁硼进行质量检测;其中,准圆柱形钕铁硼是指特定长度的圆柱形钕铁硼。可选的,胶水可以为502胶水或者其他能够实现粘贴的胶水。4) Align one end of the multiple cylindrical NdFeB that passed the test, and then glue the aligned end to the cutting board. Use glue between the multiple cylindrical NdFeB to fix the cylindrical NdFeB The length direction of the quasi-cylindrical neodymium iron boron is cut by a cutting machine to obtain a quasi-cylindrical neodymium iron boron; the quality inspection is performed on the cylindrical neodymium iron boron; among them, the quasi-cylindrical neodymium iron boron refers to a cylindrical neodymium iron boron with a specific length. Optionally, the glue may be 502 glue or other glues that can realize pasting.
5)将检测通过的准圆柱形钕铁硼和水加入至煮料桶内,水加热至沸腾后进行煮料;当准圆柱形钕铁硼上的胶水煮开时,将准圆柱形钕铁硼取出并利用烘干机烘干。对烘干后的准圆柱形钕铁硼进行质量检测。5) Add the quasi-cylindrical neodymium iron boron and water that have passed the test into the cooking barrel, and the water is heated to boiling for cooking; when the glue on the quasi-cylindrical neodymium iron boron is boiled, the quasi-cylindrical neodymium iron The boron is taken out and dried in a dryer. Perform quality inspection on the dried quasi-cylindrical NdFeB.
6)对检测通过的准圆柱形钕铁硼用∮5mm的磨粒导角;将导角后的准圆柱形钕铁 硼进行酸洗,然后超声波清洗;得特定规格的钕铁硼;其中特定规格的钕铁硼为表面干净和具有特定尺寸的钕铁硼。可选的,酸洗的水溶液为硝酸,体积浓度为5%,酸洗时间可以为30S。6) Use ∮5mm abrasive grain lead angle for the quasi-cylindrical neodymium iron boron that passed the test; pickling the quasi-cylindrical neodymium iron boron after the lead angle, and then ultrasonic cleaning; obtain the neodymium iron boron of specific specifications; The specifications of NdFeB are NdFeB with clean surface and specific dimensions. Optionally, the aqueous solution for pickling is nitric acid, the volume concentration is 5%, and the pickling time can be 30S.
7)在特定规格的钕铁硼上进行电镀,依次镀焦铜镀层、酸铜层、CuSnZn镀层、Pd镀层、第一Au镀层、RhRu合金镀层以及第二Au镀层;然后在第二Au镀层上利用封孔剂进行封孔处理,得具有镀层的钕铁硼。7) Electroplating on specific specifications of neodymium iron boron, successively plating scorched copper coating, acid copper coating, CuSnZn coating, Pd coating, first Au coating, RhRu alloy coating and second Au coating; then on the second Au coating Use the sealing agent to carry out the sealing treatment, and obtain the neodymium iron boron with plating layer.
8)检测镀层的厚度、外观及尺寸,然后将检测通过的具有镀层的钕铁硼真空包装。其中,镀层外观检测标准是:镀层表面不能有崩缺,烧焦,破裂,起皮,起皱、刀纹等不良现象,镀层需均匀,表面需平整光滑。具有镀层的钕铁硼整体尺寸需控制在+/-0.05mm的公差范围内。8) Detect the thickness, appearance and size of the coating, and then vacuum package the neodymium iron boron with the coating that passed the test. Among them, the coating appearance inspection standard is: the coating surface must not have chipping, scorching, cracking, peeling, wrinkling, knife marks and other undesirable phenomena, the coating must be uniform, and the surface must be smooth and smooth. The overall size of the coated NdFeB should be controlled within the tolerance range of +/-0.05mm.
步骤2:对具有镀层的磁性件进行载带包装,然后进行充磁处理,得到触点结构。Step 2: Carrying out tape-carrying packaging on the plated magnetic parts, and then performing magnetizing treatment to obtain a contact structure.
本实施例载带包装是指将电镀好的产品按摆放要求放入载带的孔槽内,用透明上膜覆盖住产品,上膜边缘自带胶粘到载带上,同时将载带卷到载带盘上,包装完成后用上膜多卷几圈将载带固定到载带盘上,防止载带松开脱落。The carrier tape packaging in this embodiment means that the electroplated products are placed in the holes of the carrier tape according to the placement requirements, and the product is covered with a transparent top film. The edge of the top film is glued to the carrier tape, and the carrier tape is attached at the same time. Roll onto the carrier tape, and after the packaging is completed, use the film to roll several times to fix the carrier tape on the carrier tape to prevent the carrier tape from loosening and falling off.
本实施例中电镀工艺的实现方法:将准圆柱形钕铁硼与陪镀钢球一起放入电镀池中,加电流进行电镀。陪镀钢球主要是为了防止小尺寸准圆柱形钕铁硼出现叠片现象,以及通过电流小时出现镀层不均匀的问题。每一镀层有对应的电镀池,每一镀层镀完后均需测镀层的膜厚,镀层厚度达到所需要求后再放入下一电镀池,按顺序依次进行电镀。The implementation method of the electroplating process in this embodiment: Put the quasi-cylindrical neodymium iron boron and the plating steel balls into the electroplating bath together, and conduct electroplating with current. Co-plating steel balls is mainly to prevent the phenomenon of lamination of small-sized quasi-cylindrical NdFeB, and the problem of uneven plating when the current is small. Each coating has a corresponding electroplating bath. After each coating is plated, the thickness of the coating needs to be measured. After the thickness of the coating reaches the required requirements, it is placed in the next electroplating bath, and electroplating is carried out in sequence.
本实施例在磁性件表面设有抗腐蚀金属层、酸铜层或酸镍层、金属阻挡层以及抗人工汗液电解金属层等的镀层;从而使触点表面具有好的平整度及光滑度,而且还可以保护触点通过盐雾测试、人工汗液静态测试和充电人工汗液电解测试。In this embodiment, the surface of the magnetic part is provided with a corrosion-resistant metal layer, an acid copper layer or an acid nickel layer, a metal barrier layer, and an anti-artificial sweat electrolytic metal layer, etc., so that the surface of the contact has good flatness and smoothness, It can also protect the contacts through salt spray test, artificial sweat static test and charging artificial sweat electrolysis test.
实施方式1-2Embodiment 1-2
如图2所示的触点结构1,触点11中的磁性件通过表面贴装连接至电路板12上,磁性件表面覆盖有镀层,其镀层从里到外依次为焦铜镀层、酸铜层、CuSnZn镀层、Pd镀层、第一Au镀层、RhRu合金镀层以及第二Au镀层。其中,第二Au镀层是进行封孔处理后的镀层(如图6所示的磁性件镀层)。The contact structure 1 shown in Figure 2, the magnetic part in the contact 11 is connected to the circuit board 12 by surface mount, the surface of the magnetic part is covered with a plating layer, and the plating layer from the inside to the outside is a scorched copper plating layer and an acid copper layer. Layer, CuSnZn coating, Pd coating, first Au coating, RhRu alloy coating, and second Au coating. Wherein, the second Au plating layer is the plating layer after the sealing treatment (the magnetic part plating layer as shown in FIG. 6).
本实施例的触点结构的制备方法与实施方式1-1类似,其中不同的是步骤2。The preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that step 2 is different.
在本实施例中,步骤2:将具有镀层的钕铁硼SMT至电路板上,然后对具有镀层的钕铁硼进行充磁处理,得到触点结构。In this embodiment, step 2: Put the plated neodymium iron boron SMT on the circuit board, and then magnetize the plated neodymium iron boron to obtain the contact structure.
实施方式1-3Embodiment 1-3
如图2所示的触点结构1,触点11中的磁性件通过表面贴装连接至电路板12上,磁性件表面覆盖有镀层,镀层从里到外依次为焦铜镀层、酸铜层、Pd镀层,以及RhRu合金镀层(如图3所示的磁性件镀层)。焦铜镀层的厚度范围为8μm-10μm,酸铜层的厚度范围为18μm-20μm,Pd镀层的厚度范围为0.6μm-0.75μm,RhRu合金镀层的厚度范围为0.75μm-1μm,RhRu合金镀层是进行封孔处理后的镀层。The contact structure 1 shown in Figure 2, the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer. The plating layer from the inside to the outside is a pyro-copper plating layer and an acid copper layer. , Pd coating, and RhRu alloy coating (magnetic part coating as shown in Figure 3). The thickness of the scorched copper coating is 8μm-10μm, the thickness of the acid copper layer is 18μm-20μm, the thickness of the Pd coating is 0.6μm-0.75μm, the thickness of the RhRu alloy coating is 0.75μm-1μm, and the thickness of the RhRu alloy coating is Plating after sealing.
本实施例的触点结构的制备方法与实施方式1-1类似,其中不同的是步骤1中的7)和步骤2。The preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
在本实施例中,步骤1:7)在特定规格的钕铁硼上进行电镀,依次镀焦铜镀层、酸铜层、Pd镀层,以及RhRu合金镀层;然后在RhRu合金镀层上利用封孔剂进行封孔处理,得具有镀层的钕铁硼。In this embodiment, step 1:7) electroplating on a specific specification of neodymium iron boron, followed by scorched copper plating layer, acid copper layer, Pd plating layer, and RhRu alloy plating layer; then use a sealing agent on the RhRu alloy plating layer The sealing process is carried out to obtain the neodymium iron boron with plating layer.
步骤2:将具有镀层的钕铁硼SMT至电路板中,然后对具有镀层的钕铁硼进行充磁处理,得到触点结构。Step 2: Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
实施方式1-4Embodiment 1-4
如图2所示的触点结构1,触点11中的磁性件通过表面贴装连接至电路板12上,磁性件表面覆盖有镀层;镀层从里到外依次为中性镍层、酸铜层、Pd镀层、RhRu合金镀层(如图3所示的磁性件镀层)。中性镍镀层的厚度范围为8μm-10μm,酸铜层的厚度范围为18μm-20μm,Pd镀层的厚度范围为0.6μm-0.75μm,RhRu合金镀层的厚度范围为0.75μm-1μm,RhRu合金镀层是进行封孔处理后的镀层。RhRu合金镀层是进行封孔处理的镀层。The contact structure 1 shown in Figure 2, the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer; the plating layer is a neutral nickel layer and an acid copper layer from the inside to the outside. Layer, Pd coating, RhRu alloy coating (magnetic part coating as shown in Figure 3). The thickness range of the neutral nickel coating is 8μm-10μm, the thickness of the acid copper layer is 18μm-20μm, the thickness of the Pd coating is 0.6μm-0.75μm, the thickness of the RhRu alloy coating is 0.75μm-1μm, and the thickness of the RhRu alloy coating is It is the plating layer after sealing. The RhRu alloy coating is a coating that undergoes sealing treatment.
本实施例的触点结构的制备方法与实施方式1-1类似,其中不同的是步骤1中的7)和步骤2。The preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
在本实施例中,步骤1:7)在特定规格的钕铁硼上进行电镀,依次镀中性镍层、酸铜层、Pd镀层,以及RhRu合金镀层;然后在RhRu合金镀层上利用封孔剂进行封孔处理,得具有镀层的钕铁硼。In this embodiment, step 1:7) electroplating on a specific specification of neodymium iron boron, followed by a neutral nickel layer, an acid copper layer, a Pd plating layer, and a RhRu alloy plating layer; and then sealing holes on the RhRu alloy plating layer The sealing agent is processed to obtain the neodymium iron boron with plating layer.
步骤2:将具有镀层的钕铁硼SMT至电路板中,然后对具有镀层的钕铁硼进行充磁处理,得到触点结构。Step 2: Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
实施方式1-5Embodiment 1-5
如图2所示的触点结构1,触点11中的磁性件通过表面贴装连接至电路板12上,磁性件表面覆盖有镀层;镀层从里到外依次为焦铜镀层、酸铜层、CuSnZn镀层、Pd 镀层、RhRu合金镀层(如图4所示的磁性件镀层)。焦铜镀层的厚度范围为8μm-10μm,酸铜层的厚度范围为18μm-20μm,CuSnZn镀层的厚度范围为2μm-4.5μm,Pd镀层的厚度范围为0.6μm-0.75μm,RhRu合金镀层的厚度范围为0.75μm-1μm,RhRu合金镀层是进行封孔处理后的镀层。The contact structure 1 shown in Figure 2, the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer; the plating layer from the inside to the outside is a pyro-copper plating layer and an acid copper layer. , CuSnZn coating, Pd coating, RhRu alloy coating (magnetic part coating as shown in Figure 4). The thickness of the scorched copper coating is 8μm-10μm, the thickness of the acid copper layer is 18μm-20μm, the thickness of CuSnZn coating is 2μm-4.5μm, the thickness of Pd coating is 0.6μm-0.75μm, and the thickness of RhRu alloy coating The range is 0.75μm-1μm, and the RhRu alloy coating is the coating after sealing.
本实施例的触点结构的制备方法与实施方式1-1类似,其中不同的是步骤1中的7)和步骤2。The preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
在本实施例中,步骤1:7)在特定规格的钕铁硼上进行电镀,依次镀焦铜镀层、酸铜层、CuSnZn镀层、Pd镀层,以及RhRu合金镀层;然后在RhRu合金镀层上利用封孔剂进行封孔处理,得具有镀层的钕铁硼。In this embodiment, step 1:7) electroplating on a specific specification of neodymium iron boron, followed by scorched copper coating, acid copper layer, CuSnZn coating, Pd coating, and RhRu alloy coating; then use on the RhRu alloy coating The sealing agent is used for sealing treatment to obtain neodymium iron boron with plating layer.
步骤2:将具有镀层的钕铁硼SMT至电路板中,然后对具有镀层的钕铁硼进行充磁处理,得到触点结构。Step 2: Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
实施方式1-6Embodiment 1-6
如图2所示的触点结构1,触点11中的磁性件通过表面贴装连接至电路板12上,磁性件表面覆盖有镀层;镀层从里到外依次为焦铜镀层(也即抗腐蚀金属层)、酸铜层、Pd镀层(也即金属阻挡层)、第一Au镀层(也即导电金属层)、RhRu合金镀层(也即抗人工汗液电解金属层)。焦铜镀层的厚度范围为8μm-10μm,酸铜层的厚度范围为18μm-20μm,Pd镀层的厚度范围为0.6μm-0.75μm,第一Au镀层的厚度范围为0.5μm-0.75μm,RhRu合金镀层的厚度范围为0.75μm-1μm,RhRu合金镀层是进行封孔处理后的镀层。The contact structure 1 shown in Figure 2, the magnetic part in the contact 11 is connected to the circuit board 12 by surface mount, and the surface of the magnetic part is covered with a plating layer; the plating layer is scorched copper plating layer (that is, anti-corrosion) from the inside to the outside. Corrosion metal layer), acid copper layer, Pd plating layer (ie metal barrier layer), first Au plating layer (ie conductive metal layer), RhRu alloy plating layer (ie anti-artificial sweat electrolytic metal layer). The thickness of the scorched copper coating is 8μm-10μm, the thickness of the acid copper layer is 18μm-20μm, the thickness of the Pd coating is 0.6μm-0.75μm, the thickness of the first Au coating is 0.5μm-0.75μm, RhRu alloy The thickness of the plating layer ranges from 0.75 μm to 1 μm, and the RhRu alloy plating layer is the plating layer after the sealing treatment.
本实施例的触点结构的制备方法与实施方式1-1类似,其中不同的是步骤1中的7)和步骤2。The preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
在本实施例中,步骤1:7)在特定规格的钕铁硼上进行电镀,依次镀焦铜镀层、酸铜层、Pd镀层、第一Au镀层,以及RhRu合金镀层;然后在RhRu合金镀层上利用封孔剂进行封孔处理,得具有镀层的钕铁硼。In this embodiment, step 1:7) electroplating is performed on the neodymium iron boron of specific specifications, and then the scorched copper plating layer, the acid copper layer, the Pd plating layer, the first Au plating layer, and the RhRu alloy plating layer are sequentially plated; and then the RhRu alloy plating layer The hole sealing agent is used for sealing treatment to obtain the neodymium iron boron with plating layer.
步骤2:将具有镀层的钕铁硼SMT至电路板中,然后对具有镀层的钕铁硼进行充磁处理,得到触点结构。Step 2: Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
实施方式1-7Embodiment 1-7
如图2所示的触点结构1,触点11中的磁性件通过表面贴装连接至电路板12上,磁性件表面覆盖有镀层。在本实施例中,磁性件采用钐钴磁铁。钐钴磁铁表面的镀层从里到外依次为焦铜镀层(也即抗腐蚀金属层)、酸铜层、Pd镀层(也即金属阻挡层)、 RhRu合金镀层(也即抗人工汗液电解金属层)、第二Au镀层(也即易焊接金属层)。焦铜镀层的厚度范围为8μm-10μm,酸铜层的厚度范围为18μm-20μm,Pd镀层的厚度范围为0.6μm-0.75μm,RhRu合金镀层的厚度范围为0.75μm-1μm,第二Au镀层的厚度范围为0.125μm-0.25μm,第二Au镀层是进行封孔处理后的镀层。In the contact structure 1 shown in FIG. 2, the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer. In this embodiment, a samarium cobalt magnet is used as the magnetic member. The coating on the surface of the samarium cobalt magnet is from the inside to the outside in order of coke copper coating (also known as anti-corrosion metal layer), acid copper layer, Pd coating (also known as metal barrier layer), RhRu alloy coating (also known as anti-artificial sweat electrolytic metal layer) ), the second Au plating layer (that is, the easy-to-weld metal layer). The thickness of the scorched copper coating is 8μm-10μm, the thickness of the acid copper layer is 18μm-20μm, the thickness of the Pd coating is 0.6μm-0.75μm, the thickness of the RhRu alloy coating is 0.75μm-1μm, the second Au coating The thickness range is 0.125μm-0.25μm, and the second Au plating layer is the plating layer after sealing.
本实施例的触点结构的制备方法与实施方式1-1类似,其中不同的是步骤1中的7)和步骤2。The preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
在本实施中,步骤1:7)在特定规格的钐钴上进行电镀,依次镀焦铜镀层、酸铜层、Pd镀层、RhRu合金镀层,以及第二Au镀层;然后在Au镀层上利用封孔剂进行封孔处理,得具有镀层的钐钴。In this implementation, step 1:7) electroplating on the samarium cobalt of specific specifications, and then plating the scorched copper plating layer, acid copper layer, Pd plating layer, RhRu alloy plating layer, and the second Au plating layer; and then sealing on the Au plating layer. The porogen is subjected to sealing treatment to obtain samarium cobalt with a plating layer.
步骤2:将具有镀层的钐钴SMT至电路板中,然后对具有镀层的钐钴进行充磁处理,得到触点结构。Step 2: Put the plated samarium cobalt SMT into the circuit board, and then magnetize the plated samarium cobalt to obtain a contact structure.
实施方式1-8Embodiment 1-8
如图2所示的触点结构1,触点11中的磁性件通过表面贴装连接至电路板12上,磁性件表面覆盖有镀层;镀层从里到外依次为焦铜镀层、酸铜层、CuSnZn镀层、Pd镀层、第一Au镀层、RhRu合金镀层,以及第二Au镀层(如图6所示的磁性件镀层)。焦铜镀层的厚度为8μm-100μm,酸铜层的厚度为10μm-100μm,CuSnZn镀层的厚度为1μm-100μm,Pd镀层的厚度为0.4μm-100μm,第一Au镀层的厚度为0.3μm-100μm,RhRu合金镀层的厚度为0.75μm-100μm,第二Au镀层的厚度为0.125μm-100μm,第二Au镀层是进行封孔处理后的镀层。The contact structure 1 shown in Figure 2, the magnetic part in the contact 11 is connected to the circuit board 12 by surface mounting, and the surface of the magnetic part is covered with a plating layer; the plating layer from the inside to the outside is a pyro-copper plating layer and an acid copper layer. , CuSnZn coating, Pd coating, first Au coating, RhRu alloy coating, and second Au coating (magnetic part coating as shown in Figure 6). The thickness of the scorched copper coating is 8μm-100μm, the thickness of the acid copper layer is 10μm-100μm, the thickness of the CuSnZn coating is 1μm-100μm, the thickness of the Pd coating is 0.4μm-100μm, and the thickness of the first Au coating is 0.3μm-100μm. The thickness of the RhRu alloy plating layer is 0.75 μm-100 μm, the thickness of the second Au plating layer is 0.125 μm-100 μm, and the second Au plating layer is the plating layer after the sealing treatment.
本实施例的触点结构的制备方法与实施方式1-1类似,其中不同的是步骤1中的7)和步骤2。The preparation method of the contact structure of this embodiment is similar to that of Embodiment 1-1, except that the difference is step 1 in step 7) and step 2.
在本实施例中,步骤1:7)在特定规格的钕铁硼上进行电镀,依次镀焦铜镀层、酸铜层、CuSnZn镀层、Pd镀层、第一Au镀层、RhRu合金镀层,以及第二Au镀层;然后在第二Au镀层上利用封孔剂进行封孔处理,得具有镀层的钕铁硼。In this embodiment, step 1:7) electroplating is performed on the neodymium iron boron of specific specifications, and then the scorched copper plating layer, acid copper layer, CuSnZn plating layer, Pd plating layer, first Au plating layer, RhRu alloy plating layer, and the second Au plating layer; then on the second Au plating layer, a hole sealing agent is used for hole sealing treatment to obtain a neodymium iron boron plating layer.
步骤2:将具有镀层的钕铁硼SMT至电路板中,然后对具有镀层的钕铁硼进行充磁处理,得到触点结构。Step 2: Put the plated NdFeB SMT into the circuit board, and then perform magnetization treatment on the plated NdFeB to obtain the contact structure.
图7为本发明实施例的人工汗液电解测试的原理图。在一种可选的实现方式中,电子设备以耳机,充电设备为充电盒为例,应理解,本实施例并不对此进行限制。Fig. 7 is a schematic diagram of an artificial sweat electrolysis test according to an embodiment of the present invention. In an optional implementation manner, the electronic device is an earphone and the charging device is a charging box as an example. It should be understood that this embodiment does not limit this.
1、人工汗液电解测试:1. Artificial sweat electrolysis test:
1)将适用于耳机的触点结构71的pad端和适用于充电盒的触点结构72的pin端 分别用导线焊接;其中,触点结构进行了SMT的焊锡不能覆盖在测试接触面,保持测试接触面的清洁。1) The pad end of the contact structure 71 suitable for earphones and the pin end of the contact structure 72 suitable for the charging box are respectively welded with wires; among them, the contact structure with SMT solder cannot cover the test contact surface, keep it Test the cleanliness of the contact surface.
2)分别对两个触点结构的磁性件充磁,使触点结构71的中pad端和触点结构72的pin端吸到一起(即与正常充电时pad端和pin端的接触状态一致),得到一组充电触点结构7。2) Magnetize the magnetic parts of the two contact structures separately, so that the pad end of the contact structure 71 and the pin end of the contact structure 72 are attracted together (that is, the contact state of the pad end and the pin end during normal charging is consistent) , Get a set of charging contact structure 7.
3)将上述处理后的两组充电触点结构7放在盛有人工汗液(PH4.7)的同一容器中,且充电触点结构7能完全浸没在人工汗液中;以分别作为电解槽的正极和负极,正负极间距为1-3cm,将55Ω电阻串联于两套充电触点结构7之间,并与电源连接成回路。3) Put the two sets of charging contact structures 7 after the above treatment in the same container filled with artificial sweat (PH4.7), and the charging contact structures 7 can be completely immersed in the artificial sweat; they are used as electrolytic cells respectively. The positive electrode and the negative electrode, the distance between the positive and negative electrodes is 1-3cm, a 55Ω resistor is connected in series between the two sets of charging contact structures 7 and connected to the power supply to form a loop.
4)将电流调节到90mA(DC的电压为5V左右)并进行稳流,接通回路,保持通电状态,每通电一分钟后断开电路,将靠近正极端的pad从人工汗液中取出,擦拭干净后在显微镜下观察镀层破损情况,若镀层为银色,则继续测试;若镀层出现发黑情况露出底层磁铁,则停止测试。如图7所示。4) Adjust the current to 90mA (DC voltage is about 5V) and stabilize the current, turn on the circuit, keep it energized, disconnect the circuit every minute after energizing, take out the pad near the positive terminal from the artificial sweat, and wipe it After cleaning, observe the damage of the coating under a microscope. If the coating is silver, continue the test; if the coating appears black and expose the underlying magnet, stop the test. As shown in Figure 7.
通过人工汗液电解测试的标准:要求镀层破损时间≥2min。The standard for passing the artificial sweat electrolysis test: the damage time of the coating is required to be ≥2min.
2、盐雾测试:2. Salt spray test:
将充电触点结构置于盐雾机试验箱中,在温度35±2℃,湿度>85%条件下连续喷48小时盐雾浓度为5%的NaCl溶液,PH值6.5-7.2,喷雾压力1±0.3kg/cm2;测试结束后常温下放置2H,再检查外观、功能;Place the charging contact structure in a salt spray machine test box, and spray NaCl solution with a salt spray concentration of 5% for 48 hours at a temperature of 35±2°C and a humidity of >85%, with a PH value of 6.5-7.2, and a spray pressure of 1 ±0.3kg/cm2; after the test, place it at room temperature for 2 hours, and then check the appearance and function;
通过盐雾测试的标准是:要求外观和功能同进行盐雾测试之前一样,没有变化。通常外观不能有生锈腐蚀变色现象。The standard for passing the salt spray test is: the appearance and function are the same as before the salt spray test, and there is no change. Generally, the appearance should not have rust, corrosion and discoloration.
3、人工汗液静态测试:3. Artificial sweat static test:
将充电触点结构置于汗液(酸性ph4.7)浸泡,浸泡后用无尘布包裹样品,并于60℃,90%的温湿度条件下放置48h,测试结束后常温下放置2h,再检查外观、功能;Soak the charging contact structure in sweat (acidic ph4.7), wrap the sample with a dust-free cloth after soaking, and place it at 60°C and 90% temperature and humidity for 48 hours. After the test, place it at room temperature for 2 hours, and then check Appearance and function;
标准:要求外观和功能同进行人工汗液静态测试之前一样,没有变化。通常外观不能有生锈腐蚀变色现象。Standard: The appearance and function are the same as before the artificial sweat static test, without change. Generally, the appearance should not have rust, corrosion and discoloration.
经验证,本实施例的充电触点结构均通过了上述人工汗液电解测试、盐雾测试和人工汗液静态测试。而且实施例四及实施例五的充电触点结构耐人工汗液电解测试、盐雾测试和人工汗液静态测试的性能最优。It has been verified that the charging contact structure of this embodiment has passed the above-mentioned artificial sweat electrolysis test, salt spray test and artificial sweat static test. Moreover, the charging contact structures of the fourth and fifth embodiments have the best performance in the artificial sweat electrolysis test, the salt spray test and the artificial sweat static test.
本发明实施例通过在磁性件上电镀特殊的功能镀层不仅提高了磁性件表面的平整性及光滑度,而且实现了磁性件的SMT,解决了现有充电触点结构中磁铁不能SMT的问题。本实施例中充电触点结构具有耐盐雾测试、耐人工汗液静态测试,以及耐人 工汗液电解测试的性能,解决了传统磁铁电镀工艺SMT后进行充电人工汗液电解测试在1分钟内所有镀层会电解掉造成无法充电的问题。The embodiment of the present invention not only improves the flatness and smoothness of the surface of the magnetic part by electroplating a special functional coating on the magnetic part, but also realizes the SMT of the magnetic part, and solves the problem that the magnet cannot be SMT in the existing charging contact structure. In this embodiment, the charging contact structure has the performance of salt spray resistance test, artificial sweat resistance static test, and artificial sweat electrolysis test performance, which solves the problem of charging artificial sweat electrolysis test after the traditional magnet electroplating process SMT. All coatings will be tested within 1 minute. Electrolysis causes the problem of not being able to charge.
实施例二Example two
图8是本发明第二实施例的触点的切面示意图。图9是本发明第二实施例的触点中的金属外壳镀层的示意图。图10是本发明第二实施例的触点中的磁性件镀层的示意图。图11是本发明第二实施例的触点结构的切面示意图。Fig. 8 is a schematic cross-sectional view of the contact of the second embodiment of the present invention. Fig. 9 is a schematic diagram of the metal shell plating layer in the contact of the second embodiment of the present invention. FIG. 10 is a schematic diagram of the plating layer of the magnetic element in the contact of the second embodiment of the present invention. 11 is a schematic cross-sectional view of the contact structure of the second embodiment of the present invention.
如图8所示,触点8包括磁性件81和导电层82。其中,导电层82在磁性件81的外层。导电层82为金属外壳,所述金属外壳内形成有容纳腔,磁性件81设置在容纳腔内。在一种可选的实现方式中,磁性件81和金属外壳82可以为圆柱体,可选的,磁性件81和金属外壳82共轴线。应理解,本实施例并不对磁性件的形状进行具体限制,其他形状例如正方体等均可应用于本实施例中。As shown in FIG. 8, the contact 8 includes a magnetic member 81 and a conductive layer 82. Among them, the conductive layer 82 is on the outer layer of the magnetic member 81. The conductive layer 82 is a metal shell, and a containing cavity is formed in the metal shell, and the magnetic member 81 is arranged in the containing cavity. In an optional implementation manner, the magnetic member 81 and the metal casing 82 may be cylindrical, and optionally, the magnetic member 81 and the metal casing 82 are coaxial. It should be understood that this embodiment does not specifically limit the shape of the magnetic member, and other shapes such as cubes can be applied in this embodiment.
在一种可选的实现方式中,本实施例通过触点8使得充电设备和电子设备实现电连接,并且电子设备上的触点8与充电设备上的触点8通过磁性件81的吸附作用相对定位,因此,在电子设备上的触点8与充电设备上的触点8相连接或相分离过程中不会产生磨损,且在长期使用过程中吸附力不会降低,提高了电子设备上的触点8与充电设备上的触点8相连接的稳定性,避免了松脱、断电的问题,提高了触点8使用的可靠性。同时,由于金属外壳82形成在磁性件81的外表面,因此有效降低了所占空间和安装难度,利于电子设备和充电设备的小型化。In an optional implementation manner, in this embodiment, the charging device and the electronic device are electrically connected through the contact 8, and the contact 8 on the electronic device and the contact 8 on the charging device are adsorbed by the magnetic member 81 Relative positioning, therefore, the contact 8 on the electronic device and the contact 8 on the charging device will not be worn during the connection or separation process, and the adsorption force will not be reduced during long-term use, which improves the electronic equipment The stability of the connection between the contact 8 and the contact 8 on the charging device avoids the problems of loosening and power failure, and improves the reliability of the use of the contact 8. At the same time, since the metal shell 82 is formed on the outer surface of the magnetic member 81, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of electronic equipment and charging equipment.
在一种可选的实现方式中,磁性件81表面设有第一镀层;金属外壳82表面设有第二镀层,且金属外壳82套设在磁性件81外,用于将磁性件81与外部电源导通并传导磁性件81的磁性。在一种可选的实现方式中,所述第二镀层从里到外可以依次为酸铜层、金属阻挡层,以及抗人工汗液电解金属层。In an alternative implementation, the surface of the magnetic element 81 is provided with a first plating layer; the surface of the metal shell 82 is provided with a second plating layer, and the metal shell 82 is sleeved outside the magnetic element 81 to connect the magnetic element 81 with the outside. The power source conducts and conducts the magnetism of the magnetic member 81. In an optional implementation manner, the second plating layer may be an acid copper layer, a metal barrier layer, and an artificial sweat-resistant electrolytic metal layer in order from the inside to the outside.
本发明实现方式在所述金属外壳82的表面电镀酸铜层,一方面是为了利用酸铜层延展性好的性能使金属外壳表面光滑平整,降低金属外壳表面的粗糙度,提高其他金属镀层的附着力;另一方面是可控制第二镀层的光哑度,使触点结构表面光哑度达到所需要求。金属阻挡层具有高的致密度,在酸铜层上电镀金属阻挡层,一方面是为了有效防止金属外壳表面的Cu层释放扩散到其他金属镀层中,进而影响其他金属镀层的性能;另一方面是为了提高第二镀层的耐盐雾和耐人工汗液静态测试。在金属阻挡层外电镀抗人工汗液电解金属层,抗人工汗液电解金属层为Rh、Ru,或RhRu合 金镀层;这是为了增强金属外壳耐盐雾测试、耐人工汗液静态测试及充电时人工汗液电解测试的性能。在本实现方式中,电镀过程均可以采用的常规电镀工艺实现。The implementation of the present invention is to electroplate an acid copper layer on the surface of the metal shell 82. On the one hand, it is to make use of the good ductility of the acid copper layer to make the surface of the metal shell smooth and flat, reduce the surface roughness of the metal shell, and improve the performance of other metal coatings. Adhesion; on the other hand, it can control the matt degree of the second plating layer, so that the matt degree of the surface of the contact structure meets the required requirements. The metal barrier layer has high density. Electroplating the metal barrier layer on the acid copper layer is to effectively prevent the Cu layer on the surface of the metal shell from being released and diffused into other metal coatings, which will affect the performance of other metal coatings; on the other hand; It is to improve the salt spray resistance and artificial sweat resistance of the second coating static test. Electroplating the anti-artificial sweat electrolytic metal layer outside the metal barrier layer, the anti-artificial sweat electrolytic metal layer is Rh, Ru, or RhRu alloy plating; this is to enhance the metal shell resistance to salt spray test, artificial sweat static test and artificial sweat during charging Performance of electrolysis test. In this implementation manner, the electroplating process can all be implemented using a conventional electroplating process.
在进一步的实现方式中,本实施例的触点可以作为一种触点结构设置于电子设备或充电设备中,使得触点中的金属外壳与电子设备/充电设备中的电路板进行电连接,由此在电子设备中的触点结构和充电设备中的触点结构相互接触时,可以实现充电设备对电子设备充电。In a further implementation manner, the contact of this embodiment can be used as a contact structure to be arranged in an electronic device or a charging device, so that the metal shell in the contact is electrically connected to the circuit board in the electronic device/charging device. Therefore, when the contact structure in the electronic device and the contact structure in the charging device are in contact with each other, the charging device can charge the electronic device.
在进一步的实现方式中,本实施例还提供另一种触点结构,触点结构包括触点和电路板;所述磁性件和所述金属外壳均通过表面贴装连接至所述电路板上。In a further implementation manner, this embodiment also provides another contact structure. The contact structure includes a contact and a circuit board; both the magnetic component and the metal shell are connected to the circuit board by surface mounting .
本发明实现方式将具有第二镀层的金属外壳套设在具有第一镀层的磁铁基材表面,从而使磁铁基材和金属外壳合并在同一结构中,既具有吸磁功能又具有充电功能,进而缩小了触点结构的空间。另外,通过在金属外壳的表面上依次设有酸铜层、金属阻挡层,以及抗人工汗液电解金属层,从而保护磁铁基材,使其通过盐雾测试、人工汗液静态测试和人工汗液电解测试。In the implementation of the present invention, the metal shell with the second plating layer is sleeved on the surface of the magnet substrate with the first plating layer, so that the magnet substrate and the metal shell are combined in the same structure, which has both a magnetic absorption function and a charging function, and then Reduce the space of the contact structure. In addition, an acid copper layer, a metal barrier layer, and an anti-artificial sweat electrolytic metal layer are sequentially arranged on the surface of the metal shell to protect the magnet substrate and pass the salt spray test, artificial sweat static test and artificial sweat electrolysis test .
在进一步的实现方式中,为了使具有第二镀层的金属外壳具有良好的耐人工汗液电解测试性能,所述抗人工汗液电解金属层为RhRu合金镀层。In a further implementation manner, in order to make the metal shell with the second plating layer have a good performance of resistance to artificial sweat electrolysis test, the anti-artificial sweat electrolysis metal layer is a RhRu alloy plating layer.
在进一步的实现方式中,所述抗人工汗液电解金属层的厚度范围为0.75μm-100μm(例如0.75μm、0.8μm、0.85μm、0.9μm、1μm、10μm或100μm等);在更进一步的实现方式中,所述抗人工汗液电解金属层的厚度范围为0.75μm-1μm(例如0.75μm、0.8μm、0.85μm、0.9μm或1μm)。In a further implementation manner, the thickness of the anti-artificial sweat electrolytic metal layer ranges from 0.75 μm to 100 μm (for example, 0.75 μm, 0.8 μm, 0.85 μm, 0.9 μm, 1 μm, 10 μm, or 100 μm, etc.); in a further implementation In the manner, the thickness of the anti-artificial sweat electrolytic metal layer ranges from 0.75 μm to 1 μm (for example, 0.75 μm, 0.8 μm, 0.85 μm, 0.9 μm, or 1 μm).
在进一步的实现方式中,为了有效防止金属外壳表面的Cu层释放扩散到其他金属镀层中,进而影响其他金属镀层的性能;所述金属阻挡层为Pd镀层、Pt镀层、PdCo镀层、PdPt镀层、PdAg镀层、PdAu镀层,或PdIn镀层。在更进一步的实现方式中,为了提高金属外壳的耐盐雾测试和耐人工汗液静态测试的性能;所述金属阻挡层为Pd镀层。由于所述Pd镀层具有耐热性,进而能够防止金属外壳表面的第二镀层出现爆裂现象。In a further implementation manner, in order to effectively prevent the Cu layer on the surface of the metal shell from being released and diffused into other metal coatings, thereby affecting the performance of other metal coatings; the metal barrier layers are Pd coatings, Pt coatings, PdCo coatings, PdPt coatings, PdAg plating, PdAu plating, or PdIn plating. In a further implementation manner, in order to improve the salt spray resistance test and artificial sweat resistance static test performance of the metal shell; the metal barrier layer is a Pd plating layer. Since the Pd plating layer has heat resistance, it can prevent the second plating layer on the surface of the metal shell from bursting.
在进一步的实现方式中,所述金属阻挡层的厚度范围为0.4μm-100μμm(例如0.4μm、0.6μm、0.63μm、0.65μm、0.7μm、0.8μm、1μm、10μm、50μm或100μm等);在更进一步的实现方式中,所述金属阻挡层的厚度范围为0.75μμm-1μm(例如0.75μm、0.8μm、0.85μm、0.9μm或1μm等)。In a further implementation manner, the thickness of the metal barrier layer ranges from 0.4 μm to 100 μm (for example, 0.4 μm, 0.6 μm, 0.63 μm, 0.65 μm, 0.7 μm, 0.8 μm, 1 μm, 10 μm, 50 μm, or 100 μm, etc.); In a further implementation manner, the thickness of the metal barrier layer ranges from 0.75 μm to 1 μm (for example, 0.75 μm, 0.8 μm, 0.85 μm, 0.9 μm, or 1 μm, etc.).
在进一步的实现方式中,所述第二镀层还包括:设置在抗人工汗液电解金属层上 的易焊接金属层。为了提高SMT时第二镀层与焊锡的焊接性能,所述易焊接金属层为Au、Sn、CuSnZn,或SnAg镀层。在更进一步的实现方式中,为了提高第二镀层的导电性、焊接性、耐盐雾测试和耐人工汗液静态测试的性能,所述易焊接金属层为Au镀层。Au镀层提高了第二镀层的焊接性能,是由于SMT是焊锡能够很容易的浸润到Au镀层,从而有利于快速地实现焊接。In a further implementation manner, the second plating layer further includes: an easy-to-weld metal layer provided on the artificial sweat-resistant electrolytic metal layer. In order to improve the welding performance of the second plating layer and the solder during SMT, the easy-to-weld metal layer is Au, Sn, CuSnZn, or SnAg plating. In a further implementation manner, in order to improve the conductivity, weldability, salt spray resistance test and artificial sweat resistance static test performance of the second plating layer, the weldable metal layer is an Au plating layer. The Au plating layer improves the soldering performance of the second plating layer, because SMT is the solder that can easily infiltrate the Au plating layer, which facilitates rapid soldering.
在进一步的实现方式中,所述易焊接金属层的厚度范围为0.125μm-100μm(例如0.125μm、0.15μm、0.18μm、0.20μm、0.25μm、10μm或100μm等);在更进一步的实现方式中,所述易焊接金属层的厚度范围为0.125μm-0.25μm(例如0.125μm、0.15μm、0.18μm、0.20μm或0.25μm等)。In a further implementation manner, the thickness of the easily solderable metal layer ranges from 0.125 μm to 100 μm (for example, 0.125 μm, 0.15 μm, 0.18 μm, 0.20 μm, 0.25 μm, 10 μm, or 100 μm, etc.); in a further embodiment Wherein, the thickness of the easily solderable metal layer ranges from 0.125 μm to 0.25 μm (for example, 0.125 μm, 0.15 μm, 0.18 μm, 0.20 μm, 0.25 μm, etc.).
在进一步的实现方式中,所述第二镀层还包括:设置在所述金属阻挡层和抗人工汗液电解金属层之间的导电金属层。为了提高第二镀层的导电性,所述导电金属层为Ag、SnAg、CuSnZn,或Au镀层。在更进一步的本实现方式中,所述导电金属层为Au镀层。选用Au镀层作为导电金属镀层,一方面是由于Au镀层具有阻抗小和导电性好的特点;另一方面Au镀层可以提高第二镀层的耐盐雾测试和耐人工汗液静态测试的性能。In a further implementation manner, the second plating layer further includes: a conductive metal layer disposed between the metal barrier layer and the anti-artificial sweat electrolysis metal layer. In order to improve the conductivity of the second plating layer, the conductive metal layer is Ag, SnAg, CuSnZn, or Au plating. In a further embodiment, the conductive metal layer is an Au plating layer. The choice of Au plating as the conductive metal plating is due to the low impedance and good conductivity of the Au plating; on the other hand, the Au plating can improve the salt spray test and artificial sweat static test performance of the second plating.
在进一步的实现方式中,所述导电金属层的厚度范围为0.3μm-100μm(例如0.3μm、0.5μm、0.6μm、0.63μm、0.65μm、0.7μm、0.75μm、1μm、10μm、50μm或100μm等);在更进一步的实现方式中,所述导电金属层的厚度范围为0.5μm-0.75μm(例如0.5μm、0.6μm、0.63μm、0.65μm、0.7μm或0.75μm等)。In a further implementation manner, the thickness of the conductive metal layer ranges from 0.3 μm to 100 μm (for example, 0.3 μm, 0.5 μm, 0.6 μm, 0.63 μm, 0.65 μm, 0.7 μm, 0.75 μm, 1 μm, 10 μm, 50 μm, or 100 μm. Etc.); In a further implementation manner, the thickness of the conductive metal layer ranges from 0.5 μm to 0.75 μm (for example, 0.5 μm, 0.6 μm, 0.63 μm, 0.65 μm, 0.7 μm, or 0.75 μm, etc.).
在进一步的实现方式中,所述第一镀层从里到外依次为焦铜层和Ni层。在磁铁基材表面电镀焦铜层是因为Cu的材质软,在小尺寸的磁铁基材上容易电镀均匀,且表面气泡、爆边等问题少。在焦铜层上电镀Ni层,一方面是为了保护焦铜层铜不被氧化,另一方面是为了在SMT时使磁铁基材与焊锡容易焊接,即提高焊接性能。In a further implementation manner, the first plating layer is a coke copper layer and a Ni layer in order from the inside to the outside. The reason for electroplating the scorched copper layer on the surface of the magnet substrate is that the Cu material is soft, and it is easy to be evenly electroplated on a small-sized magnet substrate, and there are few problems such as surface bubbles and edge bursts. Electroplating the Ni layer on the coke copper layer, on the one hand, is to protect the coke copper layer from copper from being oxidized, and on the other hand, to facilitate the soldering of the magnet base material and the solder during SMT, that is, to improve the soldering performance.
在进一步的实现方式中,所述焦铜层的厚度范围为3μm-100μm(例如3μm、5μm、10μm、20μm、50μm或100μm等),所述Ni层的厚度范围为5μm-100μm(例如5μm、8μm、10μm、20μm、50μm或100μm等);在更进一步的实现方式中,所述焦铜层的厚度范围为18μm-20μm(例如18μm、18.5μm、19μm、19.5μm或20μm等),所述Ni层的厚度范围为5μm-8μm(例如5μm、5.5μm、6μm、6.5μm、7μm、7.5μm或8μm等)。In a further implementation manner, the thickness of the burnt copper layer ranges from 3 μm to 100 μm (for example, 3 μm, 5 μm, 10 μm, 20 μm, 50 μm, or 100 μm, etc.), and the thickness of the Ni layer ranges from 5 μm to 100 μm (for example, 5 μm, 8μm, 10μm, 20μm, 50μm or 100μm, etc.); in a further implementation manner, the thickness of the burnt copper layer ranges from 18μm-20μm (for example, 18μm, 18.5μm, 19μm, 19.5μm or 20μm, etc.), The thickness of the Ni layer ranges from 5 μm to 8 μm (for example, 5 μm, 5.5 μm, 6 μm, 6.5 μm, 7 μm, 7.5 μm, or 8 μm, etc.).
在进一步的实现方式中,所述酸铜层的厚度范围为2μm-100μm(2μm、5μm、10μm、20μm、50μm或100μm等);在更进一步的实现方式中,所述酸铜层的厚度范围为 3μm-5μm(例如3μm、3.5μm、4μm、4.5μm或5μm等);所述酸铜层能被所述酸镍层所替换。In a further implementation manner, the thickness of the acid copper layer ranges from 2 μm to 100 μm (2 μm, 5 μm, 10 μm, 20 μm, 50 μm, or 100 μm, etc.); in a further implementation manner, the thickness range of the acid copper layer It is 3 μm-5 μm (for example, 3 μm, 3.5 μm, 4 μm, 4.5 μm, 5 μm, etc.); the acid copper layer can be replaced by the acid nickel layer.
在进一步的实现方式中,所述第一镀层和第二镀层均是最外层进行了封孔处理的镀层;所述第一镀层的最外层是指镍层,所述第二镀层的最外层是指抗人工汗液电解金属层或易焊接金属镀层。在第一镀层中的Ni层上进行封孔处理不仅可以保护Ni层不被氧化,提高SMT时第一镀层的焊接效果;而且可以避免空气通过微孔氧化磁铁基材,进而防止SMT时磁铁基材表面的第一镀层发生爆裂现象。在第二镀层中的上进行封孔处理可以保护抗人工汗液电解金属层或易焊接金属镀层不被氧化,提高SMT时第二镀层的焊接效果。In a further implementation manner, the first plating layer and the second plating layer are both the outermost plating layers that have been sealed; the outermost layer of the first plating layer refers to a nickel layer, and the outermost layer of the second plating layer is a nickel layer. The outer layer refers to the anti-artificial sweat electrolytic metal layer or the weldable metal plating layer. Sealing on the Ni layer in the first plating layer can not only protect the Ni layer from oxidation and improve the welding effect of the first plating layer during SMT; it can also prevent air from passing through the microporous oxide magnet substrate, thereby preventing the magnet base during SMT. The first coating on the surface of the material bursts. The sealing treatment on the second plating layer can protect the anti-artificial sweat electrolytic metal layer or the weldable metal plating layer from being oxidized, and improve the welding effect of the second plating layer during SMT.
在进一步的实现方式中,为了提高金属外壳的导磁性,金属外壳的材质选取为不锈钢基材;为了提高磁性件的磁性,磁性件选用为钕铁硼或钐钴。在更进一步实现方式中,所述金属外壳的材质为SUS430基材;这是由于SUS430基材的阻磁性小,导磁性好。In a further implementation manner, in order to improve the magnetic permeability of the metal casing, the material of the metal casing is selected as a stainless steel substrate; in order to improve the magnetism of the magnetic part, the magnetic part is selected as neodymium iron boron or samarium cobalt. In a further implementation manner, the material of the metal shell is a SUS430 base material; this is because the SUS430 base material has low resistance to magnetism and good magnetic permeability.
本发明实现方式的触点结构在现市场上耳机、手表、眼镜或VR等可穿戴设备以及电子烟等电子产品中,首次实现了磁铁直接磁吸充电的功能,将传统的磁铁与充电POGO PIN结构合二为一,为产品瘦身实现了新的技术突破。The contact structure of the implementation of the present invention realizes the direct magnetic attraction charging function of a magnet for the first time in wearable devices such as earphones, watches, glasses or VR, and electronic products such as electronic cigarettes on the market. The structure is combined into one, which has achieved a new technological breakthrough for the product slimming.
本发明实现方式通过在金属外壳表面设有第二镀层,可保护磁铁基材SMT后通过盐雾测试、人工汗液静态测试、人工汗液电解测试;因此实现了可穿戴产品或电子产品的触点结构与充电盒的触点结构(充电盒里有触点结构,且该触点结构与产品的触点结构形成磁吸充电)在有人体汗液的状态下长时间充电正常工作,大大延长了可穿戴产品或电子产品与充电盒的使用寿命。The implementation mode of the present invention is provided with a second plating layer on the surface of the metal shell, which can protect the magnet substrate SMT after passing the salt spray test, artificial sweat static test, and artificial sweat electrolysis test; thus, the contact structure of wearable products or electronic products is realized The contact structure with the charging box (the charging box has a contact structure, and the contact structure and the contact structure of the product form a magnetic charging). It works normally when charging for a long time in the state of human sweat, which greatly extends the wearable The service life of the product or electronic product and the charging box.
在一种可选的实现方式中,本实施例还提供了一种触点结构的制备方法,包括如下步骤:In an optional implementation manner, this embodiment also provides a method for manufacturing the contact structure, which includes the following steps:
选取第一特定规格的所述磁铁基材(也即磁性件的基本材料);在所述磁铁基材表面进行电镀,形成镀层;在所述镀层表面进行封孔处理,得到具有第一镀层的磁铁基材;Select the first specific specification of the magnet substrate (that is, the basic material of the magnetic element); electroplating on the surface of the magnet substrate to form a plating layer; performing a sealing treatment on the surface of the plating layer to obtain a first plating layer Magnet substrate;
选取第二特定规格的金属外壳;在所述金属外壳表面进行电镀,形成镀层;在所述镀层表面进行封孔处理,得到具有第二镀层的金属外壳;Selecting a metal shell of a second specific specification; electroplating on the surface of the metal shell to form a plating layer; performing hole sealing treatment on the surface of the plating layer to obtain a metal shell with a second plating layer;
将所述具有第二镀层的金属外壳套设在所述具有第一镀层的磁铁基材的外表面,使所述具有第一镀层的磁铁基材的上表面与所述具有第二镀层的金属外壳的内部上 表面通过HONDE9736胶水相连接,得到待充磁的触点结构;The metal shell with the second plating layer is sleeved on the outer surface of the magnet substrate with the first plating layer, so that the upper surface of the magnet substrate with the first plating layer is in contact with the metal with the second plating layer. The inner upper surface of the shell is connected by HONDE9736 glue to obtain the contact structure to be magnetized;
对所述待充磁的触点结构内的磁铁基材进行充磁处理,得到触点结构。Magnetizing treatment is performed on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
在本实现方式中,封孔处理是指利用封孔剂对最外层镀层表面上的微孔进行封孔处理。In this implementation, the sealing treatment refers to sealing the micropores on the surface of the outermost plating layer with a sealing agent.
在进一步实现方式中,对所述待充磁的触点结构内的磁铁基材进行充磁处理,具体包括:将所述待充磁的触点结构表面贴装至所述电路板中,然后对所述待充磁的触点结构内的磁铁基材进行充磁处理,得到触点结构。In a further implementation manner, performing magnetization processing on the magnet substrate in the contact structure to be magnetized includes: mounting the surface of the contact structure to be magnetized into the circuit board, and then Magnetizing treatment is performed on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
本发明实现方式将具有第一镀层的磁性件和具有第二镀层的金属外壳组装后SMT至电路板,然后再对磁性件进行充磁处理;解决了传统触点结构充磁后进行SMT时出现的高温退磁以及相互吸引的问题,方便触点结构SMT至电路板上。The implementation mode of the present invention assembles the magnetic part with the first plating layer and the metal shell with the second plating layer to the SMT to the circuit board, and then magnetizes the magnetic part; it solves the problem of SMT after the traditional contact structure is magnetized The high temperature demagnetization and mutual attraction problems facilitate the contact structure SMT to the circuit board.
实施方式2-1Embodiment 2-1
在一种可选的实现方式中,如图8所示,本实施例的一种触点结构包括磁性件81和金属外壳82,金属外壳82套设在磁性件81外,用于将磁性件81与外部电源导通并传导磁性件81的磁性。如图10所示,磁性件81表面设有第一镀层10,第一镀层10从里到外依次为焦铜层101和Ni层102,焦铜层101的厚度范围为18μm-20μm;Ni层102的厚度范围为5μm-8μm。如图9所示,金属外壳82表面设有第二镀层9,第二镀层9从里到外依次为酸铜层91、Pd镀层92、第一Au镀层93、RhRu合金镀层94以及第二Au镀层95。第二镀层9中酸铜层201的厚度范围为3μm-5μm,Pd镀层202的厚度范围为0.75μm-1μm,第一Au镀层203的厚度范围为0.5μm-0.75μm,RhRu合金镀层204的厚度范围为0.75μm-1μm,第二Au镀层205的厚度范围为0.125μm-0.25μm,第二Au镀层205是封孔处理后的镀层。In an optional implementation manner, as shown in FIG. 8, a contact structure of this embodiment includes a magnetic member 81 and a metal casing 82, and the metal casing 82 is sleeved outside the magnetic member 81 for connecting the magnetic member 81 81 is connected to an external power source and conducts the magnetism of the magnetic element 81. As shown in Figure 10, the surface of the magnetic member 81 is provided with a first plating layer 10, which is a coke copper layer 101 and a Ni layer 102 from the inside to the outside. The thickness of the coke copper layer 101 ranges from 18μm-20μm; the Ni layer The thickness of 102 ranges from 5 μm to 8 μm. As shown in Fig. 9, the surface of the metal shell 82 is provided with a second plating layer 9. The second plating layer 9 is an acid copper layer 91, a Pd plating layer 92, a first Au plating layer 93, a RhRu alloy plating layer 94, and a second Au plating layer from the inside to the outside.层95。 Plated layer 95. The thickness of the acid copper layer 201 in the second plating layer 9 is 3μm-5μm, the thickness of the Pd plating layer 202 is 0.75μm-1μm, the thickness of the first Au plating layer 203 is 0.5μm-0.75μm, and the thickness of the RhRu alloy plating layer 204 The range is 0.75 μm-1 μm, the thickness of the second Au plating layer 205 is in the range of 0.125 μm-0.25 μm, and the second Au plating layer 205 is the plating layer after the sealing treatment.
本实施方式的触点结构的制备方法,包括如下步骤:The manufacturing method of the contact structure of this embodiment includes the following steps:
步骤1:具有第一镀层的磁性件81的制备,在本实施例中,磁性件81采用钕铁硼磁铁:Step 1: Preparation of the magnetic member 81 with the first plating layer. In this embodiment, the magnetic member 81 is a neodymium iron boron magnet:
1)将所述钕铁硼毛胚用胶水粘贴到切割板上,然后采用切割机进行切割,得方条状钕铁硼。可选的,胶水可以为502胶水,应理解,本实施例并不对胶水进行限制。1) Paste the neodymium iron boron blank onto the cutting board with glue, and then cut it with a cutting machine to obtain a rectangular neodymium iron boron. Optionally, the glue may be 502 glue. It should be understood that this embodiment does not limit the glue.
2)将粘在切割板上的方条状钕铁硼和水加入至煮料桶内,水加热至沸腾后进行煮料;当方条状钕铁硼上的胶水煮开时,将方条状钕铁硼取出并利用烘干机烘干;对方条状钕铁硼的规格进行质量检测。2) Add the rectangular NdFeB and water that are stuck on the cutting board into the cooking bucket. The water is heated to boiling and then cook; when the glue on the rectangular NdFeB is boiled, the rectangular The NdFeB is taken out and dried with a dryer; the quality of the bar-shaped NdFeB is tested.
3)将检测通过的方条状钕铁硼利用滚圆机滚圆,制得圆柱形钕铁硼;对圆柱形钕 铁硼的规格进行质量检测。3) The rectangular NdFeB that has passed the test is rounded with a spheroning machine to prepare a cylindrical NdFeB; the quality of the specifications of the cylindrical NdFeB is tested.
4)将检测通过的多根圆柱形钕铁硼的一端对齐,然后将对齐的一端通过胶水粘贴至切割板上,多根圆柱形钕铁硼之间用胶水粘牢,在圆柱形钕铁硼的长度方向上采用切割机进行切割,得准圆柱形钕铁硼;对准圆柱形钕铁硼进行质量检测;其中,准圆柱形钕铁硼是指特定长度的圆柱形钕铁硼。4) Align one end of the multiple cylindrical NdFeB that passed the test, and then glue the aligned end to the cutting board. Use glue between the multiple cylindrical NdFeB to fix the cylindrical NdFeB The length direction of the quasi-cylindrical neodymium iron boron is cut by a cutting machine to obtain a quasi-cylindrical neodymium iron boron; the quality inspection is performed on the cylindrical neodymium iron boron; among them, the quasi-cylindrical neodymium iron boron refers to a cylindrical neodymium iron boron with a specific length.
5)将检测通过的准圆柱形钕铁硼和水加入至煮料桶内,水加热至沸腾后进行煮料;当准圆柱形钕铁硼上的胶水煮开时,将准圆柱形钕铁硼取出并利用烘干机烘干。对烘干后的准圆柱形钕铁硼进行质量检测。5) Add the quasi-cylindrical neodymium iron boron and water that have passed the test into the cooking barrel, and the water is heated to boiling for cooking; when the glue on the quasi-cylindrical neodymium iron boron is boiled, the quasi-cylindrical neodymium iron The boron is taken out and dried in a dryer. Perform quality inspection on the dried quasi-cylindrical NdFeB.
6)对检测通过的准圆柱形钕铁硼用∮5mm的磨粒导角;将导角后的准圆柱形钕铁硼进行酸洗,然后超声波清洗;得第一特定规格的钕铁硼。其中酸洗的溶液为硝酸,体积浓度为5%,酸洗时间为30S。其中第一特定规格的钕铁硼是指表面干净和具有特定尺寸的钕铁硼。6) Use ∮5mm abrasive grain lead angle for the quasi-cylindrical neodymium iron boron that passed the inspection; pickling the quasi-cylindrical neodymium iron boron after the lead angle, and then ultrasonic cleaning; obtain the first specific specification neodymium iron boron. The pickling solution is nitric acid, the volume concentration is 5%, and the pickling time is 30S. The first specific specification NdFeB refers to NdFeB with a clean surface and a specific size.
7)在第一特定规格的钕铁硼上进行电镀,依次焦铜层和镍层;然后在镍层上利用封孔剂进行封孔处理,得具有第一镀层的钕铁硼。7) Electroplating is performed on the neodymium iron boron of the first specific specification, followed by the coke copper layer and the nickel layer; then the hole sealing agent is used for the hole sealing treatment on the nickel layer to obtain the neodymium iron boron with the first plating layer.
8)检测第一镀层的厚度、外观及尺寸,然后将检测通过的具有第一镀层的钕铁硼真空包装。其中,第一镀层外观检测标准是:第一镀层表面不能有崩缺,烧焦,破裂,起皮,起皱、刀纹等不良现象,第一镀层需均匀,表面需平整。具有镀层的钕铁硼整体尺寸需控制在+/-0.05mm的公差范围内。8) Detect the thickness, appearance and size of the first plating layer, and then vacuum package the neodymium iron boron with the first plating layer that passed the inspection. Among them, the appearance inspection standard of the first coating layer is: the surface of the first coating layer must not have chipping, scorching, cracking, peeling, wrinkling, knife marks and other undesirable phenomena. The first coating layer must be uniform and the surface must be flat. The overall size of the coated NdFeB should be controlled within the tolerance range of +/-0.05mm.
步骤2:具有第二镀层的金属外壳的制备,可选的,金属外壳为不锈钢材料SUS430。应理解,本实施例并不对此进行限制。Step 2: Preparation of a metal shell with a second plating layer. Optionally, the metal shell is made of stainless steel SUS430. It should be understood that this embodiment does not limit this.
1)在车床上将棒状SUS430基材直径尺寸车成金属外壳所需的外形直径尺寸;然后将SUS430基材置于车床上,并在SUS430基材内部车出用于放置磁铁基材的圆槽(也即容纳腔),然后用车床对车出后SUS430金属外壳的外形与内圆边倒角去毛刺,最后按照金属外壳的高度尺寸将金属外壳从棒状SUS430基材上切割下来,得SUS430金属外壳。1) Turn the rod-shaped SUS430 substrate diameter size on the lathe into the outer diameter size required for the metal shell; then place the SUS430 substrate on the lathe, and turn the SUS430 substrate inside the circular groove for placing the magnet substrate (I.e. containment cavity), and then use a lathe to deburr the shape and inner round edge of the SUS430 metal shell after being turned out, and finally cut the metal shell from the rod-shaped SUS430 base material according to the height of the metal shell to obtain SUS430 metal shell.
2)用磨床将SUS430金属外壳的外端面磨平;然后对其规格和外观进行检测。2) Use a grinder to grind the outer end surface of the SUS430 metal shell; then inspect its specifications and appearance.
3)将检测通过的SUS430金属外壳进行酸洗,然后超声波清洗,得第二特定规格的SUS430金属外壳;在第二特定规格的SUS430金属外壳表面进行电镀,依次镀酸铜层、Pd镀层、第一Au镀层、RhRu合金镀层以及第二Au镀层。将最外层的镀层用封孔剂进行封孔处理,得具有第二镀层的SUS430金属外壳。其中酸洗与超声波清 洗主要是为了去除SUS430金属外壳上的杂质与油污;酸洗的溶液为硫酸,体积浓度为8%,酸洗时间为60s。3) Pickling the SUS430 metal shell that passed the test and then ultrasonic cleaning to obtain the second specific specification of SUS430 metal shell; electroplating on the surface of the second specific specification of SUS430 metal shell, and then plating acid copper layer, Pd plating layer, and second specific specification. An Au plating layer, RhRu alloy plating layer and a second Au plating layer. The outermost plating layer is sealed with a sealing agent to obtain a SUS430 metal shell with a second plating layer. Among them, pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the solution of pickling is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
4)检验具有第二镀层的SUS430金属外壳的厚度、外观及尺寸,然后将检测通过的具有第二镀层的SUS430金属外壳真空包装。其中具有第二镀层的SUS430金属外壳外观检测标准是:表面光滑无刀纹、无变形、平整度≤0.1mm,第二镀层表面不能有烧焦,破裂,起皮等不良现象。4) Inspect the thickness, appearance and size of the SUS430 metal shell with the second plating layer, and then vacuum package the SUS430 metal shell with the second plating layer that passed the test. Among them, the appearance inspection standard of SUS430 metal shell with the second coating is: the surface is smooth, no knives, no deformation, flatness ≤0.1mm, and the second coating surface must not have undesirable phenomena such as scorching, cracking, and peeling.
步骤3:将具有第一镀层的钕铁硼用胶水(例如HONDE 9736胶水)粘贴到具有第二镀层的SUS430金属外壳内,使钕铁硼的上表面与SUS430金属外壳的内部上表面相连接,然后载带包装;得到待充磁的触点结构。其中,载带包装是指将电镀好的产品按摆放要求放入载带的孔槽内,用透明上膜覆盖住产品,上膜边缘自带胶粘到载带上,同时将载带卷到载带盘上,包装完成后用上膜多卷几圈将载带固定到载带盘上,防止载带松开脱落。Step 3: Paste the neodymium iron boron with the first coating layer (such as HONDE 9736 glue) into the SUS430 metal casing with the second coating layer, and connect the upper surface of the neodymium iron boron with the inner upper surface of the SUS430 metal casing. Then the carrier tape is packaged; the contact structure to be magnetized is obtained. Among them, the carrier tape packaging means that the electroplated product is placed in the hole of the carrier tape according to the placement requirements, and the product is covered with a transparent top film. The edge of the top film is glued to the carrier tape, and the carrier tape is rolled at the same time. On the carrier tape, after the packaging is completed, use the film to roll a few more times to fix the carrier tape on the carrier tape to prevent the carrier tape from loosening and falling off.
步骤4:对待充磁的触点结构内的磁铁基材进行充磁处理,得到触点结构。Step 4: Magnetizing the magnet substrate in the contact structure to be magnetized to obtain the contact structure.
在本实施例中,由于电镀厂空气的酸性大,因此采用真空包装一方面可防止具有第一镀层的钕铁硼或具有第二镀层的SUS430金属外壳在存储及运输过程中被酸性气体所腐蚀;另一方面真空包装还可防止具有第一镀层的钕铁硼或具有第二镀层的SUS430金属外壳在运输过程中散落漏出。In this embodiment, due to the high acidity of the air in the electroplating plant, vacuum packaging can prevent the neodymium iron boron with the first coating layer or the SUS430 metal shell with the second coating layer from being corroded by the acid gas during storage and transportation. ; On the other hand, vacuum packaging can also prevent the neodymium iron boron with the first plating layer or the SUS430 metal shell with the second plating layer from being scattered and leaking during transportation.
本实施例中电镀工艺的实现方法:将准圆柱形钕铁硼或SUS430金属外壳与陪镀钢球一起放入电镀池中,加电流进行电镀。陪镀钢球主要是为了防止小尺寸准圆柱形钕铁硼或SUS430金属外壳出现叠片现象,以及通过电流小时出现镀层不均匀的问题。每一镀层有对应的电镀池,每一镀层镀完后均需测镀层的膜厚,镀层厚度达到所需要求后再放入下一电镀池,按顺序依次进行电镀。The realization method of the electroplating process in this embodiment: Put the quasi-cylindrical neodymium iron boron or SUS430 metal shell together with the plated steel balls into the electroplating bath, and apply electric current for electroplating. Co-plating steel ball is mainly to prevent the phenomenon of lamination of small-sized quasi-cylindrical NdFeB or SUS430 metal shell, and the problem of uneven plating in small currents. Each coating has a corresponding electroplating bath. After each coating is plated, the thickness of the coating needs to be measured. After the thickness of the coating reaches the required requirements, it is placed in the next electroplating bath, and electroplating is carried out in sequence.
相关技术中磁铁跟铜材质POGO PIN分开,磁铁组装到壳体内起到磁吸作用,铜材质POGO PIN组装到壳体上起到充电作用;本实施例钕铁硼和SUS430金属外壳结合的方案是将磁铁与金属外壳合并到同一结构空间,既可以实现磁吸功能又可以实现充电功能,而且还可以缩小了触点结构。本实施例在磁铁基材表面设有第一镀层Cu-Ni,在金属外壳表面设有第二镀层Cu-Pd-Au-RhRu-Au;从而使触点结构表面具有好的平整度及光滑度,而且还可以保护触点结构通过盐雾测试、人工汗液静态测试和充电人工汗液电解测试。In the related art, the magnet is separated from the copper POGO PIN, and the magnet is assembled into the casing for magnetic attraction, and the copper material POGO PIN is assembled on the casing for charging; the combination of NdFeB and SUS430 metal casing in this embodiment is Combining the magnet and the metal shell into the same structural space can achieve both the magnetic attraction function and the charging function, and the contact structure can be reduced. In this embodiment, a first plating layer of Cu-Ni is provided on the surface of the magnet substrate, and a second plating layer of Cu-Pd-Au-RhRu-Au is provided on the surface of the metal shell; so that the surface of the contact structure has good flatness and smoothness It can also protect the contact structure through salt spray test, artificial sweat static test and charging artificial sweat electrolysis test.
实施方式2-2Embodiment 2-2
图11是本发明第二实施例的触点结构的切面示意图。其中,本实施例的触点结构的外观与实施例一种的触点结构的外观类似,具体可参照图2,在此不再赘述。11 is a schematic cross-sectional view of the contact structure of the second embodiment of the present invention. The appearance of the contact structure of this embodiment is similar to the appearance of the contact structure of the first embodiment. For details, please refer to FIG. 2, which will not be repeated here.
在实施方式中,触点结构包括磁性件81、金属外壳82和电路板110。可选的,金属外壳82可采用型号为SUS430的不锈钢材料。金属外壳82套设在磁性件81外,用于将磁性件81与外部电源导通并传导所述磁性件81的磁性;磁性件81和金属外壳82均通过表面贴装连接至电路板110上。磁性件81表面设有第一镀层,第一镀层从里到外依次为焦铜层和Ni层,焦铜层的厚度范围为18μm-20μm;Ni层的厚度范围为5μm-8μm。SUS430金属外壳表面设有第二镀层,第二镀层从里到外依次为酸铜层、Pd镀层、第一Au镀层、RhRu合金镀层以及第二Au镀层;第二镀层中酸铜层的厚度范围为3μm-5μm,Pd镀层的厚度范围为0.75μm-1μm,第一Au镀层的厚度范围为0.5μm-0.75μm,RhRu合金镀层的厚度范围为0.75μm-1μm,第二Au镀层的厚度范围为0.125μm-0.25μm,第二Au镀层是封孔处理后的镀层。In the embodiment, the contact structure includes a magnetic element 81, a metal casing 82 and a circuit board 110. Optionally, the metal housing 82 can be made of stainless steel material with a model of SUS430. The metal casing 82 is sleeved outside the magnetic part 81 for connecting the magnetic part 81 with an external power source and conducts the magnetism of the magnetic part 81; the magnetic part 81 and the metal casing 82 are both connected to the circuit board 110 by surface mounting . The surface of the magnetic member 81 is provided with a first plating layer, the first plating layer is a coke copper layer and a Ni layer from the inside to the outside. The thickness of the coke copper layer ranges from 18 μm to 20 μm; the thickness of the Ni layer ranges from 5 μm to 8 μm. The surface of the SUS430 metal shell is provided with a second plating layer. The second plating layer is acid copper layer, Pd plating layer, first Au plating layer, RhRu alloy plating layer and second Au plating layer from the inside to the outside; the thickness range of the acid copper layer in the second plating layer The thickness of the Pd coating is 3μm-5μm, the thickness of the Pd coating is 0.75μm-1μm, the thickness of the first Au coating is 0.5μm-0.75μm, the thickness of the RhRu alloy coating is 0.75μm-1μm, and the thickness of the second Au coating is 0.125μm-0.25μm, the second Au plating layer is the plating layer after sealing treatment.
本实施方式的触点结构的制备方法与实施方式2-1类似,其中与实施方式2-1不同的是步骤4。The preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is step 4.
在本实施方式中,步骤4:将待充磁的触点结构SMT至电路板中,然后对待充磁的触点结构内的磁铁基材进行充磁处理,得触点结构。In this embodiment, step 4: SMT the contact structure to be magnetized into the circuit board, and then magnetize the magnet substrate in the contact structure to be magnetized to obtain the contact structure.
本实施例在磁性件81表面设有第一镀层Cu-Ni,在金属外壳表面设有第二镀层Cu-Pd-Au-RhRu-Au;而后将未充磁磁性件81与金属外壳一起SMT到电路板中,最后进行充磁。这样可以保护触点结构中的磁铁SMT后通过盐雾测试、人工汗液静态测试和充电人工汗液电解测试。解决了相关技术触点结构中的磁铁不能SMT或SMT后不能充电的问题。In this embodiment, a first plating layer of Cu-Ni is provided on the surface of the magnetic member 81, and a second plating layer of Cu-Pd-Au-RhRu-Au is provided on the surface of the metal casing; and then the unmagnetized magnetic member 81 and the metal casing are SMT to In the circuit board, magnetization is performed last. This can protect the magnet SMT in the contact structure and pass the salt spray test, artificial sweat static test and charging artificial sweat electrolysis test. The problem that the magnet in the contact structure of the related technology cannot be SMT or cannot be charged after SMT is solved.
实施方式2-3Embodiment 2-3
本实施方式的触点结构包括:磁性件(例如钕铁硼磁铁),金属外壳(例如SUS430不锈钢)和电路板;SUS430金属外壳套设在钕铁硼外,用于将所述钕铁硼与外部电源导通并传导所述钕铁硼的磁性;钕铁硼和SUS430金属外壳均通过表面贴装连接至电路板上。钕铁硼表面设有第一镀层,第一镀层从里到外依次为焦铜层和Ni层,焦铜层的厚度范围为18μm-20μm;Ni层的厚度范围为5μm-8μm。金属外壳表面设有第二镀层,第二镀层从里到外依次为酸铜层、Pd镀层、RhRu合金镀层;第二镀层中酸铜层的厚度范围为3μm-5μm,Pd镀层的厚度范围为0.75μm-1μm,RhRu合金镀层的厚度范围为0.75μm-1μm,RhRu合金镀层是封孔处理后的镀层。The contact structure of this embodiment includes: magnetic parts (such as neodymium iron boron magnets), a metal shell (such as SUS430 stainless steel) and a circuit board; the SUS430 metal shell is sleeved outside the neodymium iron boron to connect the neodymium iron boron with The external power supply conducts and conducts the magnetism of the neodymium iron boron; the neodymium iron boron and the SUS430 metal shell are both connected to the circuit board by surface mounting. The surface of the neodymium iron boron is provided with a first plating layer. The first plating layer is a coke copper layer and a Ni layer from the inside to the outside. The thickness of the coke copper layer ranges from 18 μm to 20 μm; the thickness of the Ni layer ranges from 5 μm to 8 μm. The surface of the metal shell is provided with a second plating layer. The second plating layer is acid copper layer, Pd plating layer, and RhRu alloy plating layer from the inside to the outside; the thickness of the acid copper layer in the second plating layer ranges from 3 μm to 5 μm, and the thickness range of the Pd plating layer is The thickness of the RhRu alloy coating is 0.75μm-1μm, and the thickness of the RhRu alloy coating is 0.75μm-1μm. The RhRu alloy coating is the coating after the sealing treatment.
本实施方式的触点结构的制备方法与实施方式2-1类似,其中与实施方式2-1不同的是步骤2中的3)和步骤4。The preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is 3) and step 4 in step 2.
在本实施方式中,步骤2:3)将检测通过的SUS430金属外壳先进行酸洗,然后超声波清洗,得第二特定规格的SUS430金属外壳;在第二特定规格的SUS430金属外壳表面进行电镀,依次镀酸铜层、Pd镀层、RhRu合金镀层。将最外层的镀层用封孔剂进行封孔处理,得具有第二镀层的SUS430金属外壳。其中酸洗与超声波清洗主要是为了去除SUS430金属外壳上的杂质与油污;酸洗的溶液为硫酸,体积浓度为8%,酸洗时间为60s。In this embodiment, step 2:3) pickling the SUS430 metal shell that passed the test, and then ultrasonic cleaning, to obtain the second specific specification of SUS430 metal shell; electroplating is performed on the surface of the second specific specification of SUS430 metal shell, Plating acid copper layer, Pd plating layer, RhRu alloy plating layer in sequence. The outermost plating layer is sealed with a sealing agent to obtain a SUS430 metal shell with a second plating layer. Among them, pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the pickling solution is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
步骤4:将待充磁的触点结构SMT至电路板中,然后对待充磁的触点结构内的磁铁基材进行充磁处理,得触点结构。Step 4: Put the SMT of the contact structure to be magnetized into the circuit board, and then perform magnetization treatment on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
实施方式2-4Embodiment 2-4
本实施方式的触点结构包括:磁性件(例如钕铁硼磁铁),金属外壳(例如SUS430不锈钢)和电路板;SUS430金属外壳套设在钕铁硼外,用于将所述钕铁硼与外部电源导通并传导所述钕铁硼的磁性;钕铁硼和SUS430金属外壳均通过表面贴装连接至电路板上。钕铁硼表面设有第一镀层,第一镀层从里到外依次为焦铜层和Ni层,焦铜层的厚度为18μ-20μ;Ni层的厚度为5μ-8μ。金属外壳表面设有第二镀层,第二镀层从里到外依次为镀酸铜层、Pd镀层、RhRu合金镀层,以及Au镀层;第二镀层中酸铜层的厚度为3-5μ,Pd镀层的厚度为0.75μ-1μ,RhRu合金镀层的厚度为0.75μ-1μ,Au镀层的厚度为0.125μ-0.25μ,Au镀层是封孔处理后的镀层。The contact structure of this embodiment includes: magnetic parts (such as neodymium iron boron magnets), a metal shell (such as SUS430 stainless steel) and a circuit board; the SUS430 metal shell is sleeved outside the neodymium iron boron to connect the neodymium iron boron with The external power supply conducts and conducts the magnetism of the neodymium iron boron; the neodymium iron boron and the SUS430 metal shell are both connected to the circuit board by surface mounting. The surface of the neodymium iron boron is provided with a first plating layer. The first plating layer is a coke copper layer and a Ni layer from the inside to the outside. The thickness of the coke copper layer is 18μ-20μ; the thickness of the Ni layer is 5μ-8μ. The surface of the metal shell is provided with a second plating layer. The second plating layer is acid copper layer, Pd plating layer, RhRu alloy plating layer, and Au plating layer from the inside to the outside; the thickness of the acid copper layer in the second plating layer is 3-5μ, and the Pd plating layer The thickness of the RhRu alloy plating layer is 0.75μ-1μ, the thickness of the RhRu alloy plating layer is 0.75μ-1μ, the thickness of the Au plating layer is 0.125μ-0.25μ, and the Au plating layer is the plating layer after the sealing treatment.
本实施方式的触点结构的制备方法与实施方式2-1类似,其中与实施方式2-1不同的是步骤2中的3)和步骤4。The preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is 3) and step 4 in step 2.
在本实施方式中,步骤2:3)将检测通过的SUS430金属外壳先进行酸洗,然后超声波清洗,得第二特定规格的SUS430金属外壳;在第二特定规格的SUS430金属外壳表面进行电镀,依次镀酸铜层、Pd镀层、RhRu合金镀层以及Au镀层。将最外层的镀层用封孔剂进行封孔处理,得具有第二镀层的SUS430金属外壳。其中酸洗与超声波清洗主要是为了去除SUS430金属外壳上的杂质与油污;酸洗的溶液为硫酸,体积浓度为8%,酸洗时间为60s。In this embodiment, step 2:3) pickling the SUS430 metal shell that passed the test, and then ultrasonic cleaning, to obtain the second specific specification of SUS430 metal shell; electroplating is performed on the surface of the second specific specification of SUS430 metal shell, Plating acid copper layer, Pd plating layer, RhRu alloy plating layer and Au plating layer in sequence. The outermost plating layer is sealed with a sealing agent to obtain a SUS430 metal shell with a second plating layer. Among them, pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the pickling solution is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
步骤4:将待充磁的触点结构SMT至电路板中,然后对待充磁的触点结构内的磁铁基材进行充磁处理,得触点结构。Step 4: Put the SMT of the contact structure to be magnetized into the circuit board, and then perform magnetization treatment on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
实施方式2-5Embodiment 2-5
本实施方式的触点结构包括:磁性件(例如钕铁硼磁铁),金属外壳(例如SUS430不锈钢)和电路板;SUS430金属外壳套设在钕铁硼外,用于将所述钕铁硼与外部电源导通并传导所述钕铁硼的磁性;钕铁硼和SUS430金属外壳均通过表面贴装连接至电路板上。钕铁硼表面设有第一镀层,第一镀层从里到外依次为焦铜层和Ni层,焦铜层的厚度范围为18μm-20μm;Ni层的厚度范围为5μm-8μm。金属外壳表面设有第二镀层,第二镀层从里到外依次为酸铜层、Pd镀层、Au镀层、RhRu合金镀层;第二镀层中酸铜层的厚度范围为3μm-5μm,Pd镀层的厚度范围为0.75μm-1μm,Au镀层的厚度范围为0.5μm-0.75μm,RhRu合金镀层的厚度范围为0.75μm-1μm,RhRu合金镀层是封孔处理后的镀层。The contact structure of this embodiment includes: magnetic parts (such as neodymium iron boron magnets), a metal shell (such as SUS430 stainless steel) and a circuit board; the SUS430 metal shell is sleeved outside the neodymium iron boron to connect the neodymium iron boron with The external power supply conducts and conducts the magnetism of the neodymium iron boron; the neodymium iron boron and the SUS430 metal shell are both connected to the circuit board by surface mounting. The surface of the neodymium iron boron is provided with a first plating layer. The first plating layer is a coke copper layer and a Ni layer from the inside to the outside. The thickness of the coke copper layer ranges from 18 μm to 20 μm; the thickness of the Ni layer ranges from 5 μm to 8 μm. The surface of the metal shell is provided with a second plating layer. The second plating layer is acid copper layer, Pd plating layer, Au plating layer, and RhRu alloy plating layer from the inside to the outside; the thickness of the acid copper layer in the second plating layer ranges from 3μm-5μm, and the thickness of the Pd plating layer The thickness range is 0.75μm-1μm, the thickness range of the Au plating layer is 0.5μm-0.75μm, the thickness range of the RhRu alloy plating layer is 0.75μm-1μm, and the RhRu alloy plating layer is the plating layer after the sealing treatment.
本实施方式的触点结构的制备方法与实施方式2-1类似,其中与实施方式2-1不同的是:步骤2中的3)和步骤4。The preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is: 3) in step 2 and step 4.
在本实施方式中,步骤2:3)将检测通过的SUS430金属外壳进行酸洗,然后超声波清洗,得第二特定规格的SUS430金属外壳;在第二特定规格的SUS430金属外壳表面进行电镀,依次镀酸铜层、Pd镀层、Au镀层、RhRu合金镀层。将最外层的镀层用封孔剂进行封孔处理,得具有第二镀层的SUS430金属外壳。其中酸洗与超声波清洗主要是为了去除SUS430金属外壳上的杂质与油污;酸洗的溶液为硫酸,体积浓度为8%,酸洗时间为60s。In this embodiment, step 2:3) pickling the passed SUS430 metal shell and then ultrasonic cleaning to obtain the second specific specification SUS430 metal shell; electroplating on the surface of the second specific specification SUS430 metal shell, in turn Acid copper plating, Pd plating, Au plating, RhRu alloy plating. The outermost plating layer is sealed with a sealing agent to obtain a SUS430 metal shell with a second plating layer. Among them, pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the pickling solution is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
步骤4:将待充磁的触点结构SMT至电路板中,然后对待充磁的触点结构内的磁铁基材进行充磁处理,得触点结构。Step 4: Put the SMT of the contact structure to be magnetized into the circuit board, and then perform magnetization treatment on the magnet base material in the contact structure to be magnetized to obtain the contact structure.
实施方式2-6Embodiment 2-6
本实施方式的触点结构包括:磁性件(例如钐钴磁铁),金属外壳(例如SUS430不锈钢)和电路板;SUS430金属外壳套设在钐钴磁铁外,用于将所述钐钴磁铁与外部电源导通并传导所述钐钴磁铁的磁性;钐钴磁铁和SUS430金属外壳均通过表面贴装连接至电路板上。钐钴表面设有第一镀层,第一镀层从里到外依次为焦铜层和Ni层,焦铜层的厚度范围为18μm-20μm;Ni层的厚度范围为5μm-8μm。金属外壳表面设有第二镀层,第二镀层从里到外依次为酸镍层、Pt镀层、SnAg镀层、Rh镀层,以及Sn镀层;第二镀层中酸镍层的厚度范围为3μm-5μm,Pt镀层的厚度范围为0.75μm-1μm,SnAg镀层的厚度范围为0.5μm-0.75μm,Rh镀层的厚度范围为0.75μm-1μm;Sn镀层的厚度范围为0.125μm-0.25μm,Sn镀层是封孔处理后的镀层。The contact structure of this embodiment includes: a magnetic component (such as a samarium cobalt magnet), a metal shell (such as SUS430 stainless steel) and a circuit board; the SUS430 metal shell is sleeved outside the samarium cobalt magnet to connect the samarium cobalt magnet to the outside The power supply conducts and conducts the magnetism of the samarium cobalt magnet; both the samarium cobalt magnet and the SUS430 metal shell are connected to the circuit board by surface mounting. The surface of the samarium cobalt is provided with a first plating layer. The first plating layer is a coke copper layer and a Ni layer from the inside to the outside. The thickness of the coke copper layer ranges from 18 μm to 20 μm; the thickness of the Ni layer ranges from 5 μm to 8 μm. The surface of the metal shell is provided with a second plating layer. The second plating layer is acid nickel layer, Pt plating layer, SnAg plating layer, Rh plating layer, and Sn plating layer from the inside to the outside; the thickness of the acid nickel layer in the second plating layer ranges from 3 μm to 5 μm, The thickness range of Pt coating is 0.75μm-1μm, the thickness of SnAg coating is 0.5μm-0.75μm, the thickness of Rh coating is 0.75μm-1μm; the thickness of Sn coating is 0.125μm-0.25μm, and the Sn coating is sealing. Plating after hole treatment.
本实施方式的触点结构的制备方法与实施方式2-1类似,其中与实施方式2-1不 同的是:步骤2中的3)和步骤4。The preparation method of the contact structure of this embodiment is similar to that of the embodiment 2-1, and the difference from the embodiment 2-1 is: 3) and step 4 in step 2.
在本实施方式中,步骤2:3)将检测通过的金属外壳进行酸洗,然后超声波清洗,得第二特定规格的金属外壳;在第二特定规格的金属外壳表面进行电镀,依次镀酸镍层、Pt镀层、SnAg镀层、Rh镀层,以及Sn镀层。将最外层的镀层用封孔剂进行封孔处理,得具有第二镀层的金属外壳。其中酸洗与超声波清洗主要是为了去除SUS430金属外壳上的杂质与油污;酸洗的溶液为硫酸,体积浓度8%,酸洗时间为60s。In this embodiment, step 2:3) pickling the metal shell that passes the test and then ultrasonic cleaning to obtain a metal shell of the second specific specification; electroplating on the surface of the metal shell of the second specific specification, followed by nickel plating Layer, Pt plating, SnAg plating, Rh plating, and Sn plating. The outermost plating layer is sealed with a sealing agent to obtain a metal shell with a second plating layer. Among them, pickling and ultrasonic cleaning are mainly to remove impurities and oil on the SUS430 metal shell; the pickling solution is sulfuric acid, the volume concentration is 8%, and the pickling time is 60s.
步骤4:将待充磁的触点结构SMT至电路板中,然后对待充磁的触点结构内的钐钴进行充磁处理,得触点结构。Step 4: Put the SMT of the contact structure to be magnetized into the circuit board, and then magnetize the samarium cobalt in the contact structure to be magnetized to obtain the contact structure.
本实施例的人工汗液电解测试的原理与实施例一类似,其原理图可参考图7。在一种可选的实现方式中,电子设备以耳机,充电设备为充电盒为例,应理解,本实施例并不对此进行限制。The principle of the artificial sweat electrolysis test in this embodiment is similar to that in the first embodiment, and the principle diagram can refer to FIG. 7. In an optional implementation manner, the electronic device is an earphone and the charging device is a charging box as an example. It should be understood that this embodiment does not limit this.
1、人工汗液电解测试:1. Artificial sweat electrolysis test:
1)将适用于耳机的触点结构的pad端和适用于充电盒的触点结构的pin端分别用导线焊接;其中,触点结构进行了SMT的焊锡不能覆盖在测试接触面,保持测试接触面的清洁。1) Solder the pad end of the contact structure suitable for earphones and the pin end of the contact structure suitable for the charging box with wires respectively; among them, the contact structure with SMT solder can not cover the test contact surface to keep the test contact The cleanliness of the surface.
2)分别对两个触点结构的磁性件充磁,使触点结构的中pad端和pin端吸到一起(即与正常充电时pad端和pin端的接触状态一致),得到一组触点结构。2) Magnetize the magnetic parts of the two contact structures separately, so that the pad end and pin end of the contact structure are attracted together (that is, the contact state of the pad end and the pin end during normal charging is consistent), and a set of contacts is obtained structure.
3)将上述处理后的两组触点结构放在盛有人工汗液(PH4.7)的同一容器中,且两组触点结构能完全浸没在汗液中,以分别作为电解槽的正极和负极。正负极间距为1-3cm,将55Ω电阻串联于两组触点结构之间,并与电源连接成回路。3) Put the two groups of contact structures after the above treatment in the same container filled with artificial sweat (PH4.7), and the two groups of contact structures can be completely immersed in the sweat to serve as the positive and negative electrodes of the electrolytic cell, respectively . The distance between the positive and negative poles is 1-3cm, and a 55Ω resistor is connected in series between the two sets of contact structures and connected to the power supply to form a loop.
4)将电流调节到90mA(电压为5V左右)并进行稳流,接通回路,保持通电状态,每通电一分钟后断开电路,将靠近正极端的pad从人工汗液中取出,擦拭干净后在显微镜下观察镀层破损情况,若镀层为银色,则继续测试;若镀层出现发黑情况露出底层SUS430金属外壳,则停止测试。4) Adjust the current to 90mA (voltage is about 5V) and stabilize the current, turn on the loop, keep the power on, disconnect the circuit after each power on for one minute, take out the pad near the positive pole from the artificial sweat, and wipe it clean Observe the damage of the coating under the microscope. If the coating is silver, continue the test; if the coating appears black and expose the bottom SUS430 metal shell, stop the test.
通过人工汗液电解测试的标准:要求镀层破损时间≥2min。The standard for passing the artificial sweat electrolysis test: the damage time of the coating is required to be ≥2min.
2、盐雾测试:2. Salt spray test:
将触点结构置于盐雾机试验箱中,在温度35±2℃,湿度>85%条件下连续喷48小时盐雾浓度为5%的NaCl溶液,PH值6.5-7.2,喷雾压力1±0.3kg/cm2;测试结束后常温下放置2H晾干,再检查外观、功能;Place the contact structure in the salt spray machine test box, and spray NaCl solution with 5% salt spray concentration at a temperature of 35±2℃ and humidity >85% for 48 hours, PH value 6.5-7.2, spray pressure 1± 0.3kg/cm2; After the test, place it to dry at room temperature for 2H, and then check the appearance and function;
通过盐雾测试的标准是:要求外观和功能同进行盐雾测试之前一样,没有变化。 通常外观不能有生锈腐蚀变色现象。The standard for passing the salt spray test is: the appearance and function are the same as before the salt spray test, and there is no change. Generally, the appearance should not have rust, corrosion and discoloration.
3、人工汗液静态测试:3. Artificial sweat static test:
将触点结构置于人工汗液(酸性ph4.7)浸泡,浸泡后用无尘布包裹样品,并于60℃,90%的温湿度条件下放置48h,测试结束后常温下放置2H,再检查外观、功能;Soak the contact structure in artificial sweat (acidic ph4.7), wrap the sample with a dust-free cloth after soaking, and place it at 60°C and 90% temperature and humidity for 48 hours. After the test, place it at room temperature for 2 hours, and then check Appearance and function;
标准:要求外观和功能同进行人工汗液静态测试之前一样,没有变化。通常外观不能有生锈腐蚀变色现象。Standard: The appearance and function are the same as before the artificial sweat static test, without change. Generally, the appearance should not have rust, corrosion and discoloration.
经验证,本实施例的触点结构均通过了上述人工汗液电解测试、盐雾测试和人工汗液静态测试。而且实施例2的触点结构耐人工汗液电解测试、盐雾测试和人工汗液静态测试的性能最优。It has been verified that the contact structure of this embodiment has passed the above-mentioned artificial sweat electrolysis test, salt spray test and artificial sweat static test. Moreover, the contact structure of Example 2 has the best performance in the artificial sweat electrolysis test, the salt spray test and the artificial sweat static test.
本发明的实施例将磁性件和金属外壳分别进行了电镀,不仅保证了产品表面的平整度及光滑度,而且对保持产品的美观有极大帮助;对金属外壳进行电镀可保护磁性件SMT后通过盐雾测试、人工汗液静态测试、人工汗液电解测试。In the embodiment of the present invention, the magnetic parts and the metal shell are respectively electroplated, which not only ensures the flatness and smoothness of the product surface, but also greatly helps to maintain the beauty of the product; electroplating the metal shell can protect the magnetic parts after SMT Pass salt spray test, artificial sweat static test, artificial sweat electrolysis test.
实施例三Example three
图12是本发明第三实施例的触点结构的切面示意图。如图12所示,本实施例提供一种触点,包括:磁性件121和金属外壳122。其中,金属外壳122内形成有容纳腔1221;磁性件121,设置在容纳腔1221内。Fig. 12 is a schematic cross-sectional view of a contact structure according to a third embodiment of the present invention. As shown in FIG. 12, this embodiment provides a contact, which includes a magnetic element 121 and a metal shell 122. Wherein, a receiving cavity 1221 is formed in the metal shell 122; the magnetic member 121 is arranged in the receiving cavity 1221.
本实施例中的触点,可设置在电子设备和/或充电设备上,金属外壳122可以与电子设备的电路电连接,当需要与外部电子设备(例如充电设备)进行电连接时,可将金属外壳122与外部电子设备的连接端(例如外部电子设备中设置的端子等)相接触,从而使电子设备与外部电子设备电连接,同时,磁性件121能够对外部电子设备进行吸附,从而保证了触点与外部电子设备的连接端之间连接的稳定性。由于磁性件121设置在金属外壳122内的容纳腔1221内,因此不会占用触点的外部空间,利于触点的小型化,提高了触点使用的灵活性和便利性,且金属外壳122耐磨性能好,能抵抗住与外部电子设备的连接端及其他内部元件相接触时的磨损且不易损坏,由于磁性件121设置在金属外壳122内的容纳腔1221内,因此金属外壳122对磁性件121形成了一层保护,避免了磁性件121与电子设备内部元件相接触产生的磨损,同时也避免了磁性件121直接暴露在空气中发生氧化,提高了触点使用的可靠性。The contacts in this embodiment can be arranged on electronic equipment and/or charging equipment. The metal shell 122 can be electrically connected to the circuit of the electronic equipment. When it is necessary to electrically connect with an external electronic equipment (such as a charging equipment), the metal shell 122 can be electrically connected to an external electronic equipment (such as a charging equipment). The metal casing 122 is in contact with the connecting end of the external electronic device (such as a terminal provided in the external electronic device), so that the electronic device is electrically connected to the external electronic device, and at the same time, the magnetic member 121 can adsorb the external electronic device to ensure The stability of the connection between the contact and the connection terminal of the external electronic device is improved. Since the magnetic element 121 is arranged in the accommodating cavity 1221 in the metal shell 122, it does not occupy the external space of the contact, which is conducive to the miniaturization of the contact, improves the flexibility and convenience of the use of the contact, and the metal shell 122 is resistant The wear performance is good, it can resist the abrasion when contacting the connecting end of the external electronic equipment and other internal components, and is not easy to be damaged. Since the magnetic part 121 is arranged in the receiving cavity 1221 in the metal housing 122, the metal housing 122 is opposite to the magnetic part. 121 forms a layer of protection to avoid the wear caused by the contact between the magnetic part 121 and the internal components of the electronic device, and at the same time prevent the magnetic part 121 from being directly exposed to the air to oxidize, which improves the reliability of the contact.
本实施例中,优选的,金属外壳122为铜合金外壳。铜合金材质的金属外壳122容易焊接在电路板上,提高了触点使用的便利性。In this embodiment, preferably, the metal shell 122 is a copper alloy shell. The metal shell 122 made of copper alloy is easily soldered on the circuit board, which improves the convenience of using the contacts.
本实施例中,优选的,磁性件121为钕铁硼磁铁。钕铁硼磁铁磁力强度高,磁吸性能好,提高了触点使用的可靠性。同时,钕铁硼磁铁单位体积磁力强度高,实践中在不影响磁吸性能的情况下,可以做成较小尺寸的磁性件121,可设置于体积较小的电子设备上,提高了触点使用的便利性。In this embodiment, preferably, the magnetic member 121 is a neodymium iron boron magnet. The neodymium iron boron magnet has high magnetic strength and good magnetic attraction performance, which improves the reliability of the contact. At the same time, the neodymium iron boron magnet has a high magnetic strength per unit volume. In practice, without affecting the magnetic attraction performance, it can be made into a smaller size magnetic part 121, which can be installed on a smaller electronic device to improve the contact Ease of use.
本实施例中,优选的,金属外壳122的外表面形成有导电防腐镀层124。金属外壳122上可以形成多层致密的导电防腐镀层124,提高了金属外壳122的导电性能和防腐能力。由此,提高了触点使用的可靠性。In this embodiment, preferably, a conductive anticorrosive coating 124 is formed on the outer surface of the metal shell 122. Multiple dense conductive anticorrosive coatings 124 can be formed on the metal shell 122, which improves the conductivity and anticorrosion ability of the metal shell 122. As a result, the reliability of the use of the contacts is improved.
本实施例中,优选的,导电防腐镀层122为金镀层。金镀层抗腐蚀能力强,导电性能更优。In this embodiment, preferably, the conductive anticorrosive plating layer 122 is a gold plating layer. The gold coating has strong corrosion resistance and better electrical conductivity.
在一种可选的实现方式中,本实施例还提供一种触点结构,触点结构包括本实施例的触点和电路板123,电路板123与金属外壳122电连接。在使用时,可将电路板123与电子设备的电路电连接,从而使金属外壳122与电子设备的电路电连接,连接方便,且电路板123占用空间小,因此利于触点的小型化。In an optional implementation manner, this embodiment also provides a contact structure. The contact structure includes the contacts of this embodiment and the circuit board 123, and the circuit board 123 is electrically connected to the metal casing 122. When in use, the circuit board 123 can be electrically connected to the circuit of the electronic device, so that the metal shell 122 is electrically connected to the circuit of the electronic device. The connection is convenient, and the circuit board 123 occupies a small space, thus facilitating the miniaturization of the contacts.
本实施例中,优选的,金属外壳122包括桶形主体1222和底座1223,容纳腔1221形成在桶形主体1222内,桶形主体1222的底部形成有开口部1224,底座1223形成在桶形主体1222开口部1224的边缘处,底座1223为环形且与桶形主体1222共轴线,底座1223的外径大于桶形主体1222的外径;底座1223的底面与电路板123焊接固定以使金属外壳122与电路板123电连接。由此,磁性件121密封在金属外壳1222与电路板123形成的密封腔体内,避免了与电子设备内部元件的接触磨损。同时,底座1223为环形且底座1223的外径大于桶形主体1222的外径,增大了与电路板123的接触面积,焊接在电路板123上更为稳固,提高了触点使用的可靠性。In this embodiment, preferably, the metal housing 122 includes a barrel-shaped main body 1222 and a base 1223. The accommodating cavity 1221 is formed in the barrel-shaped main body 1222. The bottom of the barrel-shaped main body 1222 is formed with an opening 1224. The base 1223 is formed in the barrel-shaped main body. At the edge of the 1222 opening 1224, the base 1223 is ring-shaped and coaxial with the barrel-shaped main body 1222. The outer diameter of the base 1223 is larger than that of the barrel-shaped main body 1222; the bottom surface of the base 1223 is welded and fixed to the circuit board 123 to make the metal shell 122 Electrically connected to the circuit board 123. As a result, the magnetic element 121 is sealed in the sealed cavity formed by the metal casing 1222 and the circuit board 123, which avoids contact and wear with internal components of the electronic device. At the same time, the base 1223 is ring-shaped and the outer diameter of the base 1223 is larger than the outer diameter of the barrel-shaped body 1222, which increases the contact area with the circuit board 123, and is more stable when welded on the circuit board 123, which improves the reliability of the contact. .
本实施例中,优选的,磁性件121与桶形主体1222的内壁紧密贴合。由此,磁性件121和桶形主体1222无缝连接,防止磁性件121在桶形主体1222内产生位移,当触点与外部电子设备连接时,利于缩小磁性件121与外部电子设备之间的距离,从而提高了对于外部电子设备的吸附力,提高了触点与外部电子设备的连接端连接的稳定性。In this embodiment, preferably, the magnetic member 121 is closely attached to the inner wall of the barrel-shaped main body 1222. Thus, the magnetic part 121 and the barrel-shaped main body 1222 are seamlessly connected, and the magnetic part 121 is prevented from being displaced in the barrel-shaped main body 1222. When the contact is connected with an external electronic device, it is beneficial to reduce the gap between the magnetic part 121 and the external electronic device. Distance, thereby improving the adsorption force for the external electronic device, and improving the stability of the connection between the contact and the connection end of the external electronic device.
本实施例中,优选的,磁性件121的底面与所述电路板123相接触。由此,电路板123能够对磁性件121形成支撑,使磁性件121能够稳固的定位在金属外壳122与电路板123形成的密封腔体内。In this embodiment, preferably, the bottom surface of the magnetic member 121 is in contact with the circuit board 123. Thus, the circuit board 123 can support the magnetic element 121, so that the magnetic element 121 can be firmly positioned in the sealed cavity formed by the metal casing 122 and the circuit board 123.
在一种可选的实现方式中,本发明实施例还提供一种电子设备,包括设备主体和 本发明任意实施例所述的触点或触点结构,设备主体内的电路与金属外壳123电连接。In an optional implementation manner, an embodiment of the present invention also provides an electronic device, including a device body and the contact or contact structure described in any embodiment of the present invention. The circuit in the device body is electrically connected to the metal casing 123. connection.
本实施例中的电子设备,当需要与外部电子设备进行电连接时,可将金属外壳123与外部电子设备的连接端相接触,从而使电子设备与外部电子设备电连接,同时,磁性件121能够对外部电子设备进行吸附,从而保证了触点与外部电子设备的连接端之间连接的稳定性。由于磁性件121设置在金属外壳122内的容纳腔1221内,因此不会占用触点的外部空间,利于触点的小型化,提高了电子设备使用的灵活性和便利性,且金属外壳122耐磨性能好,能抵抗住与外部电子设备的连接端及其他内部元件相接触时的磨损且不易损坏,由于磁性件121设置在金属外壳122内的容纳腔1221内,因此金属外壳122对磁性件121形成了一层保护,避免了磁性件121与电子设备内部元件相接触产生的磨损,同时也避免了磁性件121直接暴露在空气中发生氧化,提高了电子设备使用的可靠性。When the electronic device in this embodiment needs to be electrically connected with an external electronic device, the metal housing 123 can be contacted with the connecting end of the external electronic device, so that the electronic device is electrically connected with the external electronic device, and at the same time, the magnetic member 121 The external electronic device can be adsorbed, thereby ensuring the stability of the connection between the contact and the connection terminal of the external electronic device. Since the magnetic element 121 is arranged in the accommodating cavity 1221 in the metal casing 122, it does not occupy the external space of the contact, which is conducive to the miniaturization of the contact, and improves the flexibility and convenience of the use of electronic equipment, and the metal casing 122 is resistant to The wear performance is good, it can resist the abrasion when contacting the connecting end of the external electronic equipment and other internal components, and is not easy to be damaged. Since the magnetic part 121 is arranged in the receiving cavity 1221 in the metal housing 122, the metal housing 122 is opposite to the magnetic part. 121 forms a layer of protection to avoid the wear caused by the contact between the magnetic part 121 and the internal components of the electronic device, and at the same time prevent the magnetic part 121 from being directly exposed to the air to oxidize, which improves the reliability of the use of the electronic device.
实施例四Example four
图13是本发明第四实施例的触点的切换示意图。图14是本发明第四实施例的触点结构的示意图。图15是本发明第四实施例的电子设备和充电设备在使用状态下的示意图。Fig. 13 is a schematic diagram of the switching of contacts in the fourth embodiment of the present invention. Fig. 14 is a schematic diagram of the contact structure of the fourth embodiment of the present invention. Fig. 15 is a schematic diagram of an electronic device and a charging device according to a fourth embodiment of the present invention in a use state.
参考图13-图15,本实施例提供一种触点1300,包括磁性件1301和导电层1302,所述导电层1302形成在所述磁性件1301的外表面,所述磁性件1301用于设置在电路板1400上,所述导电层1302用于与所述电路板1400电连接。在一种可选的实现方式中,导电层1302为导电材料镀层,其形成在磁性件1301的外表面。可选的,导电层1302为导电防腐镀层,优选地,导电层1302为金镀层,以提高导电层的导电性能和耐腐蚀性能。应理解,导电层1302还可以为镍镀层、铜镀层或镍铜合金镀层等,本实施例并不对此进行限制。13-15, the present embodiment provides a contact 1300, including a magnetic member 1301 and a conductive layer 1302, the conductive layer 1302 is formed on the outer surface of the magnetic member 1301, the magnetic member 1301 is used to set On the circuit board 1400, the conductive layer 1302 is used to electrically connect with the circuit board 1400. In an optional implementation manner, the conductive layer 1302 is a conductive material plating layer formed on the outer surface of the magnetic member 1301. Optionally, the conductive layer 1302 is a conductive anticorrosive coating. Preferably, the conductive layer 1302 is a gold coating to improve the conductivity and corrosion resistance of the conductive layer. It should be understood that the conductive layer 1302 may also be a nickel plating layer, a copper plating layer, or a nickel copper alloy plating layer, etc., which is not limited in this embodiment.
本实施例中的触点1300,在使用时,磁性件1301可设置在电子设备1000和充电设备1500的电路板1400上,导电层1302与电子设备1000和充电设备1500的电路板1400电连接,当电子设备1000需要充电时,可使电子设备1000上的触点1300与充电设备1500上的触点1300相接触,在磁性件1301的吸附作用下能够使电子设备1000上的触点1300与充电设备1500上的触点1300吸附定位,由于导电层1302为导电材料镀层1302,当电子设备1000上的触点1300与充电设备1500上的触点1300相接触时能够使电子设备1000和充电设备1500电连接,从而使充电设备1500能够 对电子设备1000进行充电。由于电子设备1000上的触点1300与充电设备1500上的触点1300通过吸附作用相对定位,因此,在电子设备1000上的触点1300与充电设备1500上的触点1300相连接或相分离过程中不会产生磨损,且在长期使用过程中吸附力不会降低,提高了电子设备1000上的触点1300与充电设备1500上的触点1300相连接的稳定性,避免了松脱、断电的问题,提高了触点1300使用的可靠性。同时,由于导电层1302形成在磁性件1301的外表面,因此有效降低了所占空间和安装难度,利于电子设备1000和充电设备1500的小型化。For the contact 1300 in this embodiment, when in use, the magnetic member 1301 can be disposed on the circuit board 1400 of the electronic device 1000 and the charging device 1500, and the conductive layer 1302 is electrically connected to the circuit board 1400 of the electronic device 1000 and the charging device 1500, When the electronic device 1000 needs to be charged, the contact 1300 on the electronic device 1000 can be brought into contact with the contact 1300 on the charging device 1500, and the contact 1300 on the electronic device 1000 can be charged with the adsorption of the magnetic member 1301. The contact 1300 on the device 1500 is adsorbed and positioned. Since the conductive layer 1302 is a conductive material plating layer 1302, when the contact 1300 on the electronic device 1000 is in contact with the contact 1300 on the charging device 1500, the electronic device 1000 and the charging device 1500 can be brought into contact with each other. It is electrically connected, so that the charging device 1500 can charge the electronic device 1000. Since the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 are relatively positioned by adsorption, the contact 1300 on the electronic device 1000 is connected or separated from the contact 1300 on the charging device 1500 There will be no wear during long-term use, and the adsorption force will not be reduced during long-term use, which improves the stability of the connection between the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500, and avoids loosening and power failure. The problem has improved the reliability of the use of the contact 1300. At the same time, since the conductive layer 1302 is formed on the outer surface of the magnetic member 1301, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of the electronic device 1000 and the charging device 1500.
本实施例中,优选的,导电层1302为导电且耐腐材料镀层1302。由此防止在触点1300在使用过程中导电层1302被腐蚀而影响导电效果。In this embodiment, preferably, the conductive layer 1302 is a conductive and corrosion-resistant material plating layer 1302. This prevents the conductive layer 1302 from being corroded during the use of the contact 1300 and affecting the conductive effect.
本实施例中,优选的,导电层1302为金导电层1302。由此,利于提高导电层1302的导电性能和耐腐蚀性能。当然,导电层1302还可为镍导电层1302、铜导电层1302等。In this embodiment, preferably, the conductive layer 1302 is a gold conductive layer 1302. Therefore, it is beneficial to improve the conductivity and corrosion resistance of the conductive layer 1302. Of course, the conductive layer 1302 can also be a nickel conductive layer 1302, a copper conductive layer 1302, and the like.
本实施例中,优选的,磁性件1301包括底座103和触头104,所述底座1303和触头1304均为柱状,所述触头1304连接在所述底座1303上,所述底座1303和触头1304的轴线沿相同方向延伸,所述底座1303的直径大于所述触头1304的直径,所述底座1303的底面用于与所述电路板1400连接。由此,使磁性件1301连接的稳定性更好,且利于提高磁性件1301的受力性能。In this embodiment, preferably, the magnetic member 1301 includes a base 103 and a contact 104, the base 1303 and the contact 1304 are both cylindrical, the contact 1304 is connected to the base 1303, and the base 1303 and the contact The axis of the head 1304 extends in the same direction, the diameter of the base 1303 is larger than the diameter of the contact 1304, and the bottom surface of the base 1303 is used to connect with the circuit board 1400. As a result, the stability of the connection of the magnetic member 1301 is better, and the force-receiving performance of the magnetic member 1301 is improved.
本实施例中,优选的,底座1303和触头1304均为圆柱体。由此,使磁性件1301连接的稳定性更好,且利于提高磁性件1301的受力性能。In this embodiment, preferably, the base 1303 and the contact 1304 are both cylindrical. As a result, the stability of the connection of the magnetic member 1301 is better, and the force-receiving performance of the magnetic member 1301 is improved.
本实施例中,优选的,所述底座1303和触头1304共轴线。由此,利于提高磁性件1301的受力性能。In this embodiment, preferably, the base 1303 and the contact 1304 are coaxial. Therefore, it is beneficial to improve the force-receiving performance of the magnetic member 1301.
本实施例中,优选的,底座1303和触头1304为一体成型结构。由此,利于提高底座1303和触头1304的连接强度。In this embodiment, preferably, the base 1303 and the contact 1304 are integrally formed. Therefore, it is beneficial to improve the connection strength between the base 1303 and the contact 1304.
本发明实施例提供一种触点结构,包括电路板1400和本发明任意实施例所述的触点1300,所述磁性件1301设置在所述电路板1400上,所述导电层1302与所述电路板1400电连接。The embodiment of the present invention provides a contact structure, including a circuit board 1400 and the contact 1300 according to any embodiment of the present invention. The magnetic member 1301 is disposed on the circuit board 1400, and the conductive layer 1302 is connected to the The circuit board 1400 is electrically connected.
本实施例中的触点结构,在使用时,可设置在电子设备1000和充电设备1500上,当电子设备1000需要充电时,可使电子设备1000上的触点1300与充电设备1500上的触点1300相接触,在磁性件1301的吸附作用下能够使电子设备1000上的触点1300与充电设备1500上的触点1300吸附定位,由于导电层1302为导电材料镀层1302, 当电子设备1000上的触点1300与充电设备1500上的触点1300相接触时能够使电子设备1000和充电设备1500电连接,从而使充电设备1500能够对电子设备1000进行充电。由于电子设备1000上的触点1300与充电设备1500上的触点1300通过吸附作用相对定位,因此,在电子设备1000上的触点1300与充电设备1500上的触点1300相连接或相分离过程中不会产生磨损,且在长期使用过程中吸附力不会降低,提高了电子设备1000上的触点1300与充电设备1500上的触点1300相连接的稳定性,避免了松脱、断电的问题,提高了触点1300使用的可靠性。同时,由于导电层1302形成在磁性件1301的外表面,因此有效降低了所占空间和安装难度,利于电子设备1000和充电设备1500的小型化。The contact structure in this embodiment can be set on the electronic device 1000 and the charging device 1500 when in use. When the electronic device 1000 needs to be charged, the contact 1300 on the electronic device 1000 can be made to touch the charging device 1500. The point 1300 is in contact with each other. The contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 can be adsorbed and positioned under the adsorption of the magnetic member 1301. Since the conductive layer 1302 is a conductive material plating layer 1302, when the electronic device 1000 is When the contact 1300 of is in contact with the contact 1300 on the charging device 1500, the electronic device 1000 and the charging device 1500 can be electrically connected, so that the charging device 1500 can charge the electronic device 1000. Since the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 are relatively positioned by adsorption, the contact 1300 on the electronic device 1000 is connected or separated from the contact 1300 on the charging device 1500 There will be no wear during long-term use, and the adsorption force will not be reduced during long-term use, which improves the stability of the connection between the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500, and avoids loosening and power failure. The problem has improved the reliability of the use of the contact 1300. At the same time, since the conductive layer 1302 is formed on the outer surface of the magnetic member 1301, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of the electronic device 1000 and the charging device 1500.
本发明实施例还提供一种电子设备1000,包括电子设备主体和本发明实施例所述的触点结构,所述触点结构设置在所述电子设备主体上。An embodiment of the present invention also provides an electronic device 1000, which includes an electronic device main body and the contact structure described in the embodiment of the present invention, and the contact structure is disposed on the electronic device main body.
本发明实施例还提供一种充电设备1500,包括充电设备主体和本发明实施例所述的触点结构,所述触点结构设置在所述充电设备主体上。An embodiment of the present invention further provides a charging device 1500, which includes a charging device main body and the contact structure described in the embodiment of the present invention, and the contact structure is disposed on the charging device main body.
本实施例中的电子设备1000和充电设备1500,当电子设备1000需要充电时,可使电子设备1000上的触点1300与充电设备1500上的触点1300相接触,在磁性件1301的吸附作用下能够使电子设备1000上的触点1300与充电设备1500上的触点1300吸附定位,由于导电层1302为导电材料镀层1302,当电子设备1000上的触点1300与充电设备1500上的触点1300相接触时能够使电子设备1000和充电设备1500电连接,从而使充电设备1500能够对电子设备1000进行充电。由于电子设备1000上的触点1300与充电设备1500上的触点1300通过吸附作用相对定位,因此,在电子设备1000上的触点1300与充电设备1500上的触点1300相连接或相分离过程中不会产生磨损,且在长期使用过程中吸附力不会降低,提高了电子设备1000上的触点1300与充电设备1500上的触点1300相连接的稳定性,避免了松脱、断电的问题,提高了触点1300使用的可靠性。同时,由于导电层1302形成在磁性件1301的外表面,因此有效降低了所占空间和安装难度,利于电子设备1000和充电设备1500的小型化。For the electronic device 1000 and the charging device 1500 in this embodiment, when the electronic device 1000 needs to be charged, the contact 1300 on the electronic device 1000 can be brought into contact with the contact 1300 on the charging device 1500, and the magnetic member 1301 is adsorbed The contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 can be adsorbed and positioned. Since the conductive layer 1302 is a conductive material plating layer 1302, when the contact 1300 on the electronic device 1000 and the contact on the charging device 1500 are When 1300 is in contact, the electronic device 1000 and the charging device 1500 can be electrically connected, so that the charging device 1500 can charge the electronic device 1000. Since the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500 are relatively positioned by adsorption, the contact 1300 on the electronic device 1000 is connected or separated from the contact 1300 on the charging device 1500 There will be no wear during long-term use, and the adsorption force will not be reduced during long-term use, which improves the stability of the connection between the contact 1300 on the electronic device 1000 and the contact 1300 on the charging device 1500, and avoids loosening and power failure. The problem has improved the reliability of the use of the contact 1300. At the same time, since the conductive layer 1302 is formed on the outer surface of the magnetic member 1301, the occupied space and installation difficulty are effectively reduced, which is beneficial to the miniaturization of the electronic device 1000 and the charging device 1500.
实施例五Example five
图16是本发明第五实施例的电子设备的局部结构示意图。图17是本发明第五实施例的触点结构的局部结构示意图。FIG. 16 is a schematic diagram of a partial structure of an electronic device according to a fifth embodiment of the present invention. Fig. 17 is a partial structural diagram of the contact structure of the fifth embodiment of the present invention.
参考图16-17,本发明实施例提供一种触点结构,包括框架161、接触件162和 触点163,接触件162与框架161连接;触点163通过弹性件164与框架161连接,弹性件164用于对触点163施加弹性力以使触点163与框架161相对定位,并使触点163和接触件162在第一方向上具有设定距离,弹性件164能够在外力作用下沿第一方向朝向接触件162伸展以使触点163能够与接触件162相接触并电连接。16-17, the embodiment of the present invention provides a contact structure, including a frame 161, a contact 162 and a contact 163, the contact 162 is connected to the frame 161; the contact 163 is connected to the frame 161 through an elastic member 164, elastic The member 164 is used to apply elastic force to the contact 163 to position the contact 163 relative to the frame 161, and to make the contact 163 and the contact 162 have a set distance in the first direction. The elastic member 164 can move along the edge under the action of external force. The first direction extends toward the contact 162 so that the contact 163 can contact and be electrically connected to the contact 162.
本实施例中的触点结构,可设置在电子设备上,接触件162与电子设备的电路电连接,当电子设备需要与外部电子设备电(例如充电设备)的连接端(例如充电设备的触点)连接时,外部电子设备的连接端会与触点163相接触并对触点163施加压力,同时,弹性件164也会受到压力而沿第一方向朝向接触件162伸展,使触点163与接触件162相接触并电连接,从而使电子设备和外部电子设备电连接。当电子设备与外部电子设备的连接端分离时,弹性件164在弹性作用下带动触点163沿第一方向背向接触件162复位并使触点163与框架161相对定位,此时,触点163与接触件162在第一方向上保持设定距离。由于触点163与接触件162在第一方向上保持设定距离,因此触点163与接触件162不导通,避免了外露触点163在外部渗水或金属搭接的情况下在内部形成封闭电路所造成的电子设备内部电池电量损失及电路损坏,提高了触点163结构使用的可靠性和安全性。同时,触点163通过弹性件164与框架161相连,触点163相对框架161移动时弹性件164可产生一定缓冲作用,防止触点163与接触件162出现剧烈碰撞,提高了触点163结构使用的可靠性。The contact structure in this embodiment can be set on an electronic device, and the contact 162 is electrically connected to the circuit of the electronic device. When the electronic device needs to be connected to an external electronic device (such as a charging device) electrical connection terminal (such as the contact of the charging device) When point) is connected, the connecting end of the external electronic device will contact the contact 163 and apply pressure to the contact 163. At the same time, the elastic member 164 will also be pressed and stretched toward the contact 162 in the first direction to make the contact 163 It is in contact with and electrically connected to the contact 162, thereby electrically connecting the electronic device and the external electronic device. When the connecting end of the electronic device is separated from the external electronic device, the elastic member 164 drives the contact 163 back to the contact member 162 in the first direction under the elastic action to reset and position the contact 163 relative to the frame 161. At this time, the contact 163 and the contact 162 maintain a set distance in the first direction. Since the contact 163 and the contact 162 are kept at a set distance in the first direction, the contact 163 and the contact 162 are not conducted, which prevents the exposed contact 163 from forming a closed inside in the case of external water seepage or metal overlap. The internal battery power loss and circuit damage of the electronic device caused by the circuit improve the reliability and safety of the structure of the contact 163. At the same time, the contact 163 is connected to the frame 161 through the elastic member 164. When the contact 163 moves relative to the frame 161, the elastic member 164 can produce a certain buffer effect, preventing the contact 163 and the contact 162 from violently colliding, and improving the structure of the contact 163. Reliability.
本实施例中,优选的,框架161内形成有腔体165,接触件162位于腔体165内,弹性件164封闭触点163和框架161之间的间隙以密封腔体165。由于弹性件164的密封作用,能够防止外部液体进入到腔体165内与接触件162接触,进一步提高了触点163结构使用的可靠性和安全性。In this embodiment, preferably, a cavity 165 is formed in the frame 161, the contact member 162 is located in the cavity 165, and the elastic member 164 closes the gap between the contact 163 and the frame 161 to seal the cavity 165. Due to the sealing effect of the elastic member 164, external liquid can be prevented from entering the cavity 165 and contacting the contact member 162, which further improves the reliability and safety of the structure of the contact 163.
本实施例中,优选的,触点163上形成有第一卡持部166,第一卡持部166沿触点163的周向延伸,弹性件164为板状,弹性件164上形成有连接孔167和第二卡持部168,第二卡持部168设置在连接孔167的边缘处并沿连接孔167的周向延伸,第一卡持部166和第二卡持部168卡持连接。触点163穿设在弹性件164的连接孔167内,触点163上的第一卡持部166与弹性件164上的第二卡持部168相互卡接,由此,使触点163与弹性件164连接方便且连接稳固,且触点163与框架161通过弹性件164能够实现更稳定地相对定位,提高了触点163结构使用的可靠性。In this embodiment, preferably, a first clamping portion 166 is formed on the contact 163, the first clamping portion 166 extends along the circumference of the contact 163, the elastic member 164 is plate-shaped, and the elastic member 164 is formed with a connection A hole 167 and a second clamping portion 168. The second clamping portion 168 is provided at the edge of the connecting hole 167 and extends along the circumference of the connecting hole 167. The first clamping portion 166 and the second clamping portion 168 are connected by clamping . The contact 163 passes through the connecting hole 167 of the elastic member 164, and the first clamping portion 166 on the contact 163 and the second clamping portion 168 on the elastic member 164 are clamped with each other, thereby making the contact 163 and The elastic member 164 is convenient and stable in connection, and the contact 163 and the frame 161 can achieve a more stable relative positioning through the elastic member 164, which improves the reliability of the structure of the contact 163.
本实施例中,优选的,第一卡持部166为卡榫,第二卡持部168为卡槽。由此,使触点163与框架161的连接结构结构简单,成本较低。In this embodiment, preferably, the first clamping portion 166 is a tenon, and the second clamping portion 168 is a clamping slot. Therefore, the structure of the connection structure between the contact 163 and the frame 161 is simple and the cost is low.
本实施例中,优选的,弹性件164的外边缘形成有第三卡持部169,框架161上形成有第四卡持部1610,第三卡持部169与第四卡持部1610卡持连接。由此,使弹性件164与框架161的连接方便、稳固,且触点163与框架161通过弹性件164能够实现更稳定地相对定位,提高了触点163结构使用的可靠性。In this embodiment, preferably, a third clamping portion 169 is formed on the outer edge of the elastic member 164, a fourth clamping portion 1610 is formed on the frame 161, and the third clamping portion 169 is clamped with the fourth clamping portion 1610. connection. As a result, the connection between the elastic member 164 and the frame 161 is convenient and stable, and the contact 163 and the frame 161 can achieve a more stable relative positioning through the elastic member 164, which improves the reliability of the structure of the contact 163.
本实施例中,优选的,第三卡持部169为卡榫,第四卡持部1610为卡槽。由此,使触点163与框架161的连接结构结构简单,成本较低。In this embodiment, preferably, the third clamping portion 169 is a tenon, and the fourth clamping portion 1610 is a clamping slot. Therefore, the structure of the connection structure between the contact 163 and the frame 161 is simple and the cost is low.
本实施例中,优选的,弹性件164上还形成有凹槽1611,凹槽1611沿连接孔167的周向延伸以围绕连接孔167设置,凹槽1611与连接孔167之间具有设定距离。由此,凹槽1611的设置能够使弹性件164在凹槽1611位置处的厚度降低,因此弹性件164在凹槽1611位置处的弹力相对较小,且凹槽1611沿连接孔167的周向延伸并围绕连接孔167设置,当触点163受到压力时能够引起弹性件164更大的形变,使触点163在第一方向上的移动更为灵活、自由,确保触点163能够在压力作用下能够与接触件162相接触,进一步提高了触点163结构使用的可靠性和安全性。In this embodiment, preferably, a groove 1611 is further formed on the elastic member 164. The groove 1611 extends along the circumference of the connecting hole 167 to surround the connecting hole 167, and there is a set distance between the groove 1611 and the connecting hole 167. . Therefore, the arrangement of the groove 1611 can reduce the thickness of the elastic member 164 at the position of the groove 1611. Therefore, the elastic force of the elastic member 164 at the position of the groove 1611 is relatively small, and the groove 1611 is along the circumferential direction of the connecting hole 167. Extending and setting around the connecting hole 167, when the contact 163 is pressed, it can cause greater deformation of the elastic member 164, making the movement of the contact 163 in the first direction more flexible and free, and ensuring that the contact 163 can act under pressure. The lower part can be in contact with the contact 162, which further improves the reliability and safety of the structure of the contact 163.
本实施例中,优选的,弹性件164为硅胶件。硅胶件本身具有弹性能力,且能起到密封触点163与接触件162之间的作用,又能给触点163相对框架161之间移动起到缓冲作用。提高了触点163结构使用的可靠性。In this embodiment, preferably, the elastic member 164 is a silicone member. The silicone element itself has elasticity, and can play a role in sealing the contact 163 and the contact 162, and can also buffer the movement of the contact 163 relative to the frame 161. Improve the reliability of the structure of the contact 163.
本实施例中,优选的,触点结构还包括电路板,电路板与框架161连接,所述接触件162为电路板上的弹片。由此,当触点163与弹片相接触时,弹片能够起到缓冲作用,防止对电路板造成损坏。In this embodiment, preferably, the contact structure further includes a circuit board, the circuit board is connected to the frame 161, and the contact 162 is an elastic piece on the circuit board. Therefore, when the contact 163 is in contact with the elastic piece, the elastic piece can play a buffering effect to prevent damage to the circuit board.
本发明实施例提供一种电子设备,包括电子设备主体和本发明任意实施例所述的触点163结构,电子设备主体与框架161连接,接触件162与电子设备主体的电路电连接。An embodiment of the present invention provides an electronic device, including an electronic device main body and the contact 163 structure according to any embodiment of the present invention. The electronic device main body is connected to the frame 161, and the contact 162 is electrically connected to the circuit of the electronic device main body.
本实施例中的电子设备,当需要与外部电子设备电的连接端连接时,外部电子设备的连接端会与触点163相接触并对触点163施加压力,同时,弹性件164也会受到压力而沿第一方向朝向接触件162伸展,使触点163与接触件162相接触并电连接,从而使电子设备和外部电子设备电连接。当电子设备与外部电子设备的分离时,弹性件164在弹性作用下带动触点163沿第一方向背向接触件162复位并使触点163与框架161相对定位,此时,触点163与接触件162在第一方向上保持设定距离。由于触点163与接触件162在第一方向上保持设定距离,因此触点163与接触件162不导通,避免了外露触点163在外部渗水或金属搭接的情况下在内部形成封闭电路所造成的电 子设备内部电池电量损失及电路损坏,提高了触点163结构使用的可靠性和安全性。同时,触点163通过弹性件164与框架161相连,触点163相对框架161移动时弹性件164可产生一定缓冲作用,防止触点163与接触件162出现剧烈碰撞,提高了电子设备使用的可靠性。When the electronic device in this embodiment needs to be connected to an electrical connection terminal of an external electronic device, the connection terminal of the external electronic device will contact the contact 163 and apply pressure to the contact 163, and at the same time, the elastic member 164 will also be subjected to The pressure extends toward the contact 162 in the first direction, so that the contact 163 and the contact 162 are in contact and electrically connected, thereby electrically connecting the electronic device and the external electronic device. When the electronic device is separated from the external electronic device, the elastic member 164 drives the contact 163 to reset back to the contact member 162 in the first direction under the elastic action and position the contact 163 relative to the frame 161. At this time, the contact 163 and The contact 162 maintains a set distance in the first direction. Since the contact 163 and the contact 162 are kept at a set distance in the first direction, the contact 163 and the contact 162 are not conductive, which prevents the exposed contact 163 from forming a closed inside in the case of external water seepage or metal overlap. The internal battery power loss and circuit damage of the electronic device caused by the circuit improve the reliability and safety of the structure of the contact 163. At the same time, the contact 163 is connected to the frame 161 through the elastic member 164. When the contact 163 moves relative to the frame 161, the elastic member 164 can produce a certain buffering effect, preventing the contact 163 and the contact 162 from violently colliding, and improving the reliability of the use of electronic equipment. Sex.
以上所述仅为本发明的优选实施例,并不用于限制本发明,对于本领域技术人员而言,本发明可以有各种改动和变化。凡在本发明的精神和原理之内所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The above are only preferred embodiments of the present invention and are not used to limit the present invention. For those skilled in the art, the present invention can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (50)

  1. 一种触点,其特征在于,所述触点包括磁性件和导电层,所述导电层在所述磁性件的外侧,所述磁性件设置在电路板上,所述导电层与所述电路板电连接。A contact, characterized in that the contact includes a magnetic part and a conductive layer, the conductive layer is on the outside of the magnetic part, the magnetic part is arranged on a circuit board, and the conductive layer is connected to the circuit The board is electrically connected.
  2. 根据权利要求1所述的触点,其特征在于,所述磁性件包括第一底座和触头,所述底座和触头均为柱状,所述触头连接在所述底座上,所述底座和触头的轴线沿相同方向延伸,所述底座的直径大于所述触头的直径,所述底座的底面与所述电路板连接。The contact according to claim 1, wherein the magnetic member comprises a first base and a contact, the base and the contact are both cylindrical, the contact is connected to the base, and the base Extending in the same direction as the axis of the contact, the diameter of the base is larger than the diameter of the contact, and the bottom surface of the base is connected to the circuit board.
  3. 根据权利要求2所述的触点,其特征在于,所述底座和所述触头均为圆柱体。The contact according to claim 2, wherein the base and the contact are both cylindrical.
  4. 根据权利要求2所述的触点,其特征在于,所述底座和所述触头共轴线。The contact of claim 2, wherein the base and the contact are coaxial.
  5. 根据权利要求2所述的触点,其特征在于,所述底座和所述触头为一体成型结构。The contact according to claim 2, wherein the base and the contact are integrally formed.
  6. 根据权利要求1所述的触点,其特征在于,所述导电层为导电材料镀层,所述导电层形成在所述磁性件的外表面。The contact according to claim 1, wherein the conductive layer is a plating layer of conductive material, and the conductive layer is formed on an outer surface of the magnetic member.
  7. 根据权利要求6所述的触点,其特征在于,所述导电层为导电防腐镀层。The contact according to claim 6, wherein the conductive layer is a conductive anticorrosive plating layer.
  8. 根据权利要求6所述的触点,其特征在于,所述导电层包括抗腐蚀金属层、酸铜层或酸镍层、金属阻挡层以及抗人工汗液电解金属层,所述导电防腐层、酸铜层或酸镍层、金属阻挡层以及抗人工汗液电解金属层依次形成在所述磁性件的外表面。The contact according to claim 6, wherein the conductive layer comprises an anti-corrosion metal layer, an acid copper layer or an acid nickel layer, a metal barrier layer and an anti-artificial sweat electrolysis metal layer, the conductive anticorrosion layer, acid A copper layer or an acid nickel layer, a metal barrier layer and an anti-artificial sweat electrolytic metal layer are sequentially formed on the outer surface of the magnetic member.
  9. 根据权利要求8所述的触点,其特征在于,所述抗腐蚀金属层为焦铜镀层或中性镍镀层。The contact according to claim 8, wherein the corrosion-resistant metal layer is a coke copper plating layer or a neutral nickel plating layer.
  10. 根据权利要求9所述的触点,其特征在于,所述抗腐蚀金属层的厚度范围为8μm-10μm。The contact according to claim 9, wherein the thickness of the corrosion-resistant metal layer ranges from 8 μm to 10 μm.
  11. 根据权利要求8所述的触点,其特征在于,所述酸铜层的厚度范围为18μm-20μm。The contact according to claim 8, wherein the thickness of the acid copper layer ranges from 18 μm to 20 μm.
  12. 根据权利要求8所述的触点,其特征在于,所述导电层的最外层为进行了封孔处理的镀层。The contact according to claim 8, wherein the outermost layer of the conductive layer is a plating layer that has been sealed.
  13. 根据权利要求1所述的触点,其特征在于,所述导电层为金属外壳,所述金属外壳内形成有容纳腔,所述磁性件设置在容纳腔内。The contact according to claim 1, wherein the conductive layer is a metal shell, a receiving cavity is formed in the metal shell, and the magnetic member is arranged in the receiving cavity.
  14. 根据权利要求13所述的触点,其特征在于,所述金属外壳包括桶形主体和第二底座,所述容纳腔形成在所述桶形主体内,所述桶形主体的底部形成有开口部, 所述第二底座形成在所述开口部的边缘处。The contact according to claim 13, wherein the metal shell comprises a barrel-shaped main body and a second base, the receiving cavity is formed in the barrel-shaped main body, and an opening is formed at the bottom of the barrel-shaped main body. Part, the second base is formed at the edge of the opening part.
  15. 根据所述权利要求14所述的触点,其特征在于,所述第二底座为环形且与所述桶形主体共轴线,所述第二底座的外径大于所述桶形主体的外径,所述第二底座的底面与所述电路板焊接固定以使得所述金属外壳与所述电路板电连接。The contact according to claim 14, wherein the second base is ring-shaped and coaxial with the barrel-shaped main body, and the outer diameter of the second base is larger than the outer diameter of the barrel-shaped main body , The bottom surface of the second base is welded and fixed to the circuit board so that the metal shell is electrically connected to the circuit board.
  16. 根据权利要求15所述的触点,其特征在于,所述磁性件与所述桶形主体的内壁紧密贴合。The contact according to claim 15, wherein the magnetic member is closely attached to the inner wall of the barrel-shaped body.
  17. 根据权利要求13所述的触点,其特征在于,所述金属外壳为铜合金外壳。The contact according to claim 13, wherein the metal shell is a copper alloy shell.
  18. 根据权利要求13所述的触点,其特征在于,所述金属外壳的外表面形成有导电防腐镀层。The contact according to claim 13, wherein a conductive anticorrosive coating is formed on the outer surface of the metal shell.
  19. 根据权利要求7或18所述的触点,其特征在于,所述导电防腐镀层为金镀层。The contact according to claim 7 or 18, wherein the conductive anticorrosive plating layer is a gold plating layer.
  20. 根据权利要求13所述的触点,其特征在于,所述磁性件表面形成有第一镀层,所述金属外壳表面形成有第二镀层。The contact according to claim 13, wherein a first plating layer is formed on the surface of the magnetic member, and a second plating layer is formed on the surface of the metal shell.
  21. 根据权利要求20所述的触点,其特征在于,所述第一镀层从里到外依次为焦铜层和镍层。The contact according to claim 20, wherein the first plating layer is a coke copper layer and a nickel layer in order from the inside to the outside.
  22. 根据权利要求21所述的触点,其特征在于,所述焦铜层的厚度范围为18μm-20μm,所述镍层的厚度范围为5μm-8μm。The contact according to claim 21, wherein the thickness of the burnt copper layer is in the range of 18 μm-20 μm, and the thickness of the nickel layer is in the range of 5 μm-8 μm.
  23. 根据权利要求20所述的触点,其特征在于,所述第二镀层从里到外依次为酸铜层或酸镍层、金属阻挡层、以及抗人工汗液电解金属层。The contact according to claim 20, wherein the second plating layer is an acid copper layer or an acid nickel layer, a metal barrier layer, and an anti-artificial sweat electrolytic metal layer in order from the inside to the outside.
  24. 根据权利要求23所述的触点,其特征在于,所述酸铜层的厚度范围3μm-5μm。The contact according to claim 23, wherein the thickness of the acid copper layer ranges from 3 μm to 5 μm.
  25. 根据权利要求20所述的触点,其特征在于,所述第一镀层的最外层和所述第二镀层的最外层为进行了封孔处理的镀层。The contact according to claim 20, wherein the outermost layer of the first plating layer and the outermost layer of the second plating layer are plating layers that have been sealed.
  26. 根据权利要求8或23所述的触点,其特征在于,所述抗人工汗液电解金属层为铑镀层、钌镀层、或铑钌合金镀层。The contact according to claim 8 or 23, wherein the anti-artificial sweat electrolytic metal layer is a rhodium plating layer, a ruthenium plating layer, or a rhodium ruthenium alloy plating layer.
  27. 根据权利要求25或26所述的触点,其特征在于,所述抗人工汗液电解金属层的厚度范围为0.75μm-1μm。The contact according to claim 25 or 26, wherein the thickness of the anti-artificial sweat electrolysis metal layer ranges from 0.75 μm to 1 μm.
  28. 根据权利要求8或23所述的触点,其特征在于,所述金属阻挡层为钯镀层、铂镀层、钯钴合金镀层、钯铂合金镀层、钯银合金镀层、钯金合金镀层,或钯铟合金镀层。The contact according to claim 8 or 23, wherein the metal barrier layer is palladium plating, platinum plating, palladium-cobalt alloy plating, palladium-platinum alloy plating, palladium-silver alloy plating, palladium-gold alloy plating, or palladium Indium alloy coating.
  29. 根据权利要求27或28所述的触点,其特征在于,所述金属阻挡层的厚度范 围为0.6μm-1μm。The contact according to claim 27 or 28, wherein the thickness of the metal barrier layer ranges from 0.6 m to 1 m.
  30. 根据权利要求8或23所述的触点,其特征在于,所述酸铜层和所述金属阻挡层之间还设置有抗氧化金属层。The contact according to claim 8 or 23, wherein an anti-oxidation metal layer is further provided between the acid copper layer and the metal barrier layer.
  31. 根据权利要求30所述的触点,其特征在于,所述抗氧化金属层为银镀层、锡银合金镀层,或铜锡锌合金镀层。The contact according to claim 30, wherein the anti-oxidation metal layer is a silver plating layer, a tin-silver alloy plating layer, or a copper-tin-zinc alloy plating layer.
  32. 根据权利要求30或31所述的触点,其特征在于,所述抗氧化金属层的厚度范围为2μm-4.5μm。The contact according to claim 30 or 31, wherein the thickness of the anti-oxidation metal layer ranges from 2 μm to 4.5 μm.
  33. 根据权利要求8或23所述的触点,其特征在于,所所述金属阻挡层和抗人工汗液电解金属层之间还设置有导电金属层。The contact according to claim 8 or 23, wherein a conductive metal layer is further provided between the metal barrier layer and the anti-artificial sweat electrolysis metal layer.
  34. 根据权利要求33所述的触点,其特征在于,所述导电金属层为银镀层、锡银合金镀层、铜锡锌合金镀层、或金镀层。The contact according to claim 33, wherein the conductive metal layer is a silver plating layer, a tin-silver alloy plating layer, a copper-tin-zinc alloy plating layer, or a gold plating layer.
  35. 根据权利要求33或34所述的触点,其特征在于,所述导电金属层的厚度范围为0.5μm-0.75μm。The contact according to claim 33 or 34, wherein the thickness of the conductive metal layer ranges from 0.5 μm to 0.75 μm.
  36. 根据权利要求8或23所述的触点,其特征在于,所述抗人工汗液电解金属层外形成有易焊接金属层。The contact according to claim 8 or 23, wherein an easy-to-weld metal layer is formed outside the anti-artificial sweat electrolysis metal layer.
  37. 根据权利要求36所述的触点,其特征在于,所述易焊接金属镀层为金镀层、锡镀层、铜锡锌合金镀层、或锡银合金镀层。The contact according to claim 36, wherein the solderable metal plating layer is a gold plating layer, a tin plating layer, a copper-tin-zinc alloy plating layer, or a tin-silver alloy plating layer.
  38. 根据权利要求36或37所述的触点,其特征在于,所述易焊接金属层的厚度范围为0.125μm-0.25μm。The contact according to claim 36 or 37, wherein the thickness of the easily solderable metal layer ranges from 0.125 μm to 0.25 μm.
  39. 根据权利要求1-38中任一项所述的触点,其特征在于,所述磁性件为钕铁硼磁铁或钐钴磁铁。The contact according to any one of claims 1-38, wherein the magnetic member is a neodymium iron boron magnet or a samarium cobalt magnet.
  40. 一种触点结构,其特征在于,所述触点结构包括:A contact structure, characterized in that the contact structure includes:
    框架;frame;
    接触件,与所述框架连接;以及A contact piece connected to the frame; and
    如权利要求1-39中任一项所述的触点;The contact according to any one of claims 1-39;
    其中,所述触点通过弹性件与所述框架连接,所述弹性件用于对所述触点施加弹性力以使所述触点与所述框架相对定位,并使所述触点和接触件在第一方向上具有设定距离,且所述弹性件在外力作用下沿所述第一方向伸展以使得所述触点能够与所述接触件接触并形成电连接。Wherein, the contact is connected to the frame through an elastic member, and the elastic member is used to apply an elastic force to the contact to position the contact relative to the frame, and to make the contact and the contact The element has a set distance in the first direction, and the elastic element stretches along the first direction under the action of an external force so that the contact can contact the contact element and form an electrical connection.
  41. 根据权利要求40所述的触点结构,其特征在于,所述框架内形成有腔体, 所述接触件位于所述腔体内,所述弹性件封闭所述触点和框架之间的间隙以密封所述腔体。The contact structure according to claim 40, wherein a cavity is formed in the frame, the contact member is located in the cavity, and the elastic member closes the gap between the contact and the frame to Seal the cavity.
  42. 根据权利要求40所述的触点结构,其特征在于,所述触点上形成有第一卡持部,所述第一卡持部沿所述触点的周向延伸,所述弹性件为板状,所述弹性件上形成有连接孔和第二卡持部,所述第二卡持部设置在所述连接孔的边缘处并沿所述连接孔的周向延伸,所述第一卡持部和所述第二卡持部卡持连接。The contact structure according to claim 40, wherein a first clamping portion is formed on the contact, the first clamping portion extends along the circumferential direction of the contact, and the elastic member is A plate shape, a connecting hole and a second clamping portion are formed on the elastic member, the second clamping portion is arranged at the edge of the connecting hole and extends along the circumferential direction of the connecting hole, the first The clamping portion and the second clamping portion are connected in a clamping manner.
  43. 根据权利要求42所述的触点结构,其特征在于,所述第一卡持部为卡榫,所述第二卡持部为卡槽。42. The contact structure according to claim 42, wherein the first clamping portion is a tenon, and the second clamping portion is a clamping slot.
  44. 根据权利要求42所述的触点结构,其特征在于,所述弹性件的外边缘形成有第三卡持部,所述框架上形成有第四卡持部,所述第三卡持部和所述第四卡持部卡持连接。The contact structure according to claim 42, wherein a third clamping portion is formed on the outer edge of the elastic member, a fourth clamping portion is formed on the frame, and the third clamping portion and The fourth clamping part clamps the connection.
  45. 根据权利要求44所述的触点结构,其特征在于,所述第三卡持部为卡榫,所述第四卡持部为卡槽。The contact structure according to claim 44, wherein the third clamping portion is a tenon, and the fourth clamping portion is a clamping slot.
  46. 根据权利要求42所述的触点结构,其特征在于,所述弹性件上还形成有凹槽,所述凹槽沿所述连接件的周向延伸以围绕所述连接孔设置,所述凹槽与所述连接孔之间具有设定距离。The contact structure according to claim 42, wherein a groove is further formed on the elastic member, the groove extends in the circumferential direction of the connecting member to surround the connecting hole, and the groove There is a set distance between the groove and the connecting hole.
  47. 根据权利要求40-46中任一项所述的触点结构,其特征在于,所述弹性件为硅胶件。The contact structure according to any one of claims 40-46, wherein the elastic member is a silicone member.
  48. 根据权利要求40-46中任一项所述的触点结构,其特征在于,所述弹性件为所述电路板上的弹片。The contact structure according to any one of claims 40-46, wherein the elastic member is an elastic piece on the circuit board.
  49. 一种电子设备,其特征在于,所述电子设备包括:An electronic device, characterized in that, the electronic device includes:
    电子设备主体;以及The main body of the electronic equipment; and
    如权利要求1-39中任一项所述的触点或权利要求40-48中任一项所述的触点结构。The contact according to any one of claims 1-39 or the contact structure according to any one of claims 40-48.
  50. 一种充电设备,其特征在于,所述充电设备包括:A charging device, characterized in that, the charging device includes:
    充电设备主体;以及The main body of the charging device; and
    如权利要求1-39中任一项所述的触点或权利要求40-48中任一项所述的触点结构。The contact according to any one of claims 1-39 or the contact structure according to any one of claims 40-48.
PCT/CN2019/129053 2019-08-23 2019-12-27 Contact, contact structure, electronic device and charging device WO2021036137A1 (en)

Applications Claiming Priority (10)

Application Number Priority Date Filing Date Title
CN201910782607.2A CN110504573A (en) 2019-08-23 2019-08-23 Contact, contact structure, electronic equipment and charging equipment
CN201910782607.2 2019-08-23
CN201910798942.1A CN110416782A (en) 2019-08-27 2019-08-27 A kind of charging contact composite structure and preparation method thereof
CN201910795448.XA CN110504574A (en) 2019-08-27 2019-08-27 A kind of charging contact structure and preparation method thereof
CN201910798942.1 2019-08-27
CN201910795448.X 2019-08-27
CN201910831565.7A CN110534949B (en) 2019-09-04 2019-09-04 Charging device and electronic apparatus
CN201910831583.5A CN110556644A (en) 2019-09-04 2019-09-04 Terminal and electronic equipment
CN201910831565.7 2019-09-04
CN201910831583.5 2019-09-04

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