JPH0124273B2 - - Google Patents

Info

Publication number
JPH0124273B2
JPH0124273B2 JP56205915A JP20591581A JPH0124273B2 JP H0124273 B2 JPH0124273 B2 JP H0124273B2 JP 56205915 A JP56205915 A JP 56205915A JP 20591581 A JP20591581 A JP 20591581A JP H0124273 B2 JPH0124273 B2 JP H0124273B2
Authority
JP
Japan
Prior art keywords
voltage
circuit
constant current
resistance element
variable resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56205915A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58106474A (ja
Inventor
Ryuichi Ando
Hisataka Kobayashi
Yoshiharu Kabasawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Seiki Co Ltd
Original Assignee
Nippon Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Seiki Co Ltd filed Critical Nippon Seiki Co Ltd
Priority to JP56205915A priority Critical patent/JPS58106474A/ja
Publication of JPS58106474A publication Critical patent/JPS58106474A/ja
Publication of JPH0124273B2 publication Critical patent/JPH0124273B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP56205915A 1981-12-18 1981-12-18 測定装置における異常検出回路 Granted JPS58106474A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56205915A JPS58106474A (ja) 1981-12-18 1981-12-18 測定装置における異常検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56205915A JPS58106474A (ja) 1981-12-18 1981-12-18 測定装置における異常検出回路

Publications (2)

Publication Number Publication Date
JPS58106474A JPS58106474A (ja) 1983-06-24
JPH0124273B2 true JPH0124273B2 (de) 1989-05-10

Family

ID=16514849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56205915A Granted JPS58106474A (ja) 1981-12-18 1981-12-18 測定装置における異常検出回路

Country Status (1)

Country Link
JP (1) JPS58106474A (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0726995B2 (ja) * 1987-08-10 1995-03-29 株式会社東芝 センサの断線検出回路
CN105403790A (zh) * 2015-12-09 2016-03-16 珠海格力电器股份有限公司 串联电弧故障检测电路和方法
JP6289587B1 (ja) * 2016-11-08 2018-03-07 三菱電機株式会社 電力変換装置
CN108196184B (zh) * 2018-01-25 2023-06-20 昆明理工大学 一种xl系列升压芯片检测装置及方法

Also Published As

Publication number Publication date
JPS58106474A (ja) 1983-06-24

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