JPH01227983A - 放射線線量測定器 - Google Patents
放射線線量測定器Info
- Publication number
- JPH01227983A JPH01227983A JP63053520A JP5352088A JPH01227983A JP H01227983 A JPH01227983 A JP H01227983A JP 63053520 A JP63053520 A JP 63053520A JP 5352088 A JP5352088 A JP 5352088A JP H01227983 A JPH01227983 A JP H01227983A
- Authority
- JP
- Japan
- Prior art keywords
- energy
- radiation
- semiconductor
- rays
- atomic number
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Landscapes
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63053520A JPH01227983A (ja) | 1988-03-09 | 1988-03-09 | 放射線線量測定器 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63053520A JPH01227983A (ja) | 1988-03-09 | 1988-03-09 | 放射線線量測定器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01227983A true JPH01227983A (ja) | 1989-09-12 |
JPH0574029B2 JPH0574029B2 (enrdf_load_stackoverflow) | 1993-10-15 |
Family
ID=12945097
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63053520A Granted JPH01227983A (ja) | 1988-03-09 | 1988-03-09 | 放射線線量測定器 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01227983A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07311272A (ja) * | 1994-05-17 | 1995-11-28 | Aloka Co Ltd | 放射線検出器 |
US6013916A (en) * | 1997-07-23 | 2000-01-11 | The Regents Of The University Of Michigan | Flat panel dosimeter |
-
1988
- 1988-03-09 JP JP63053520A patent/JPH01227983A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07311272A (ja) * | 1994-05-17 | 1995-11-28 | Aloka Co Ltd | 放射線検出器 |
US6013916A (en) * | 1997-07-23 | 2000-01-11 | The Regents Of The University Of Michigan | Flat panel dosimeter |
Also Published As
Publication number | Publication date |
---|---|
JPH0574029B2 (enrdf_load_stackoverflow) | 1993-10-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20071015 Year of fee payment: 14 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20081015 Year of fee payment: 15 |
|
EXPY | Cancellation because of completion of term | ||
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20081015 Year of fee payment: 15 |