JPH01210268A - Polishing method and device - Google Patents

Polishing method and device

Info

Publication number
JPH01210268A
JPH01210268A JP63034361A JP3436188A JPH01210268A JP H01210268 A JPH01210268 A JP H01210268A JP 63034361 A JP63034361 A JP 63034361A JP 3436188 A JP3436188 A JP 3436188A JP H01210268 A JPH01210268 A JP H01210268A
Authority
JP
Japan
Prior art keywords
abrasive
polishing
supply means
workpiece
work
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63034361A
Other languages
Japanese (ja)
Inventor
Hideo Kawakami
川上 英雄
Shinichi Tazawa
田澤 進一
Osamu Yoneya
米屋 修
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Machine Co Ltd
Original Assignee
Toshiba Machine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Machine Co Ltd filed Critical Toshiba Machine Co Ltd
Priority to JP63034361A priority Critical patent/JPH01210268A/en
Publication of JPH01210268A publication Critical patent/JPH01210268A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To suppress damage of wafer and to perform polishing work stably by providing an ejector for spraying polishing agent onto a work such as a polishing cloth or a wafer prior to polishing work thereby reducing vibration during polishing work. CONSTITUTION:An ejector 18 for spraying polishing agent is provided independently from a polishing agent supply means 10 assembled into the body of a polishing device. The ejector 18 sprays polishing agent sufficiently onto the surface of a polishing cloth 9 and a work 3 prior to polishing work. Then upper and lower lathes 1, 2 are lowered to hold the work 3 mounted in a carrier 7 between the lathes 1, 2. Under this state, a solenoid valve 16 in the polishing agent supply means 10 is excited to feed polishing agent through a receiver 12, a tube 15 and a supply port 14 to the polishing cloth 8, the work 3 and the polishing cloth 9 sequentially. Then an inner gear 5 and a sun gear 6 are rotated to rotate the lathes 1, 2 relatively so as to polish the upper and lower faces of the work 3 with low vibration.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、ウェハおよびメモリーディスクなどの研磨加
工において、研磨時の振動を小さくし、ウェハ等の被カ
ロエ物の損傷を抑え安定した研磨加工を行なえるように
した研磨方法および研磨装置に関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention provides a stable polishing process for polishing wafers, memory disks, etc. by reducing vibration during polishing and suppressing damage to the wafer or other object to be eroded. The present invention relates to a polishing method and a polishing apparatus that can perform the following steps.

〔従来の技術〕[Conventional technology]

従来使用されている両面研磨装置の場合で説明する。第
2図に示すように下定盤1と下定盤2は不図示の駆動源
によりそれぞれ単独に駆動されており、上定盤1と下定
盤2の間には、円板状で内側にウエノ・等の被加工物3
を平面状に保持できるようにした被加工物保持穴4を有
するとともに外周面に歯部を有し、内歯車5と太陽歯車
6に噛合い自転しながら公転させるキャリア7が複数個
セットされている。寸た、下定盤lと下定盤2の対向面
にはそれぞれ研磨布8.9が貼られている。
The case of a conventionally used double-sided polishing device will be explained. As shown in FIG. 2, the lower surface plate 1 and the lower surface plate 2 are each driven independently by a drive source (not shown), and between the upper surface plate 1 and the lower surface plate 2 there is a disc-shaped inner surface of Ueno. Workpiece 3 such as
A plurality of carriers 7 are set, each having a workpiece holding hole 4 capable of holding the workpiece in a flat shape and having toothed portions on the outer circumferential surface, and meshing with an internal gear 5 and a sun gear 6 to rotate and revolve. There is. In addition, polishing cloths 8.9 are pasted on the opposing surfaces of the lower surface plate 1 and the lower surface plate 2, respectively.

また、研磨加工に不可欠な研摩剤供給手段10が下定盤
lから上部に設けられており、この研摩剤供給手段IO
は下定盤Iの上部中火に設けた上定盤保持軸11に取付
けの研磨側受12と、研磨側受12に研磨剤を供給する
研磨剤供給ライン13と、研磨側受12から上定盤1を
」1下方向に貫通して設けた研磨剤供給口I4との間に
配設したチューブ15から構成されており、研磨剤は研
磨剤供給ライン13から研磨側受12に供給され次にチ
ューブ15、研磨剤供給口14’を流下し、研磨布8、
被加工物3そして研磨布9に供給されるようになってい
る。なお、上定盤1、上定盤保持軸11等は下定盤2上
にキャリア7を残して上昇し、下定盤2から離れるよう
になっている。
Further, an abrasive supply means 10 essential for polishing is provided above the lower surface plate l, and this abrasive supply means IO
The polishing side support 12 is attached to the upper surface plate holding shaft 11 provided at the upper medium heat of the lower surface plate I, the abrasive supply line 13 that supplies abrasive to the polishing side support 12, and the upper polishing side support 12 from the polishing side support 12. It consists of a tube 15 disposed between an abrasive supply port I4 that penetrates downward through the disk 1, and the abrasive is supplied from the abrasive supply line 13 to the polishing side receiver 12. The tube 15 flows down the abrasive supply port 14', and the abrasive cloth 8,
It is supplied to the workpiece 3 and the polishing cloth 9. Note that the upper surface plate 1, the upper surface plate holding shaft 11, etc. are moved up leaving the carrier 7 on the lower surface plate 2, and are separated from the lower surface plate 2.

以上のように構成されており研磨加工においてはキャリ
ア7の被加工物保持穴4にウニ/・等の被加工物3を保
持させ研磨剤全供給するとともに一ヒ定盤lと下定盤2
で被加工物3を押圧しながらキャリア7を自転、公転さ
せ上、下定盤1.2の相対運動により研磨加工が行なわ
れる。
It is constructed as described above, and during polishing, the workpiece 3 such as a sea urchin is held in the workpiece holding hole 4 of the carrier 7, and the polishing agent is fully supplied, while the surface plate 1 and the lower surface plate 2
While pressing the workpiece 3, the carrier 7 rotates and revolves, and the polishing process is performed by the relative movement of the upper and lower surface plates 1.2.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の研磨装置において、研磨布全新品のものと貼り換
えた直後の時や、純水等を使用し研磨布のクリーニング
を行った直後の被カロエ物の研磨力ロ工においては、研
磨布に研磨剤が十分に浸透していないことや被加工物表
面に十分に研磨剤が供給されていないなどの理由から被
加工物表面上に十分な研磨剤の層が形成されていない、
そのため研磨布と被加工物間および被加工物とキャリア
間での滑りが不安定となり振動が生じ、キシミ音となっ
て現われてくることがある。研磨時にこの状態が長く続
くと所望の除去速度が得られないばかりか抜力ロエ物に
損傷を与えるという問題があるとともに安定した研磨が
できなかった。
In conventional polishing equipment, when polishing an object with a polishing force immediately after replacing the polishing cloth with a new one or cleaning the polishing cloth using pure water, etc., the polishing cloth is A sufficient layer of abrasive is not formed on the surface of the workpiece due to reasons such as the abrasive has not penetrated sufficiently or the abrasive has not been sufficiently supplied to the surface of the workpiece.
Therefore, the slippage between the polishing cloth and the workpiece and between the workpiece and the carrier becomes unstable, causing vibrations, which may appear as a squeaking sound. If this state continues for a long time during polishing, not only the desired removal rate cannot be obtained, but also there is a problem that the removal force is damaged, and stable polishing cannot be performed.

本発明は研磨時の振動を小さくし、ウェハ等の損傷を抑
え安定した研磨加工できる研磨装置および研磨方法を提
供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a polishing apparatus and a polishing method that can reduce vibration during polishing, suppress damage to wafers, etc., and perform stable polishing.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の研磨方法は太陽歯車と内歯車に噛合い上下定盤
間を自転および公転するキャリアの穴に被加工物を装填
し、前記上下定盤に設けた研磨布と研磨剤により、研摩
剤供給手段で研磨剤を供給しながら前記被加工物を研磨
する研磨方法において、上定盤を上方に移動させて下定
盤より離し、研磨加工に先立って研磨装置本体に組込ん
だ研摩剤供給手段とは別に設けた研磨剤の噴射装置で研
磨布に研磨剤を撒布し、研磨剤が研磨布に十分に浸透し
た後、上定盤を下降させキャリア内に装填されている被
加工物を上下両盤で押圧しながら研磨加工を行なう方法
である。
In the polishing method of the present invention, a workpiece is loaded into a hole in a carrier that meshes with a sun gear and an internal gear and rotates and revolves between upper and lower surface plates. In the polishing method of polishing the workpiece while supplying an abrasive with a supply means, the abrasive supply means is incorporated into the main body of the polishing apparatus prior to the polishing process, by moving the upper surface plate upward and separating it from the lower surface plate. The abrasive is sprayed onto the polishing cloth using a separate abrasive spray device, and after the abrasive has sufficiently penetrated into the polishing cloth, the upper surface plate is lowered to move the workpiece loaded in the carrier up and down. This is a method of polishing while pressing with both discs.

才だ、研磨装置は研磨装置本体に組込んだ研摩剤供給手
段に接続の研磨剤供給源を供給源とする力・、寸たは前
記研摩剤供給手段に接続の研磨剤供給源とは別の研磨剤
の供給源を供給源として研磨剤を供給し、前記研摩剤供
給手段とは別に研磨剤の撒布および停止が可能な噴射装
置を設けた装置である。
The polishing device uses a power source connected to an abrasive supply means built into the main body of the polishing device, or is separate from the abrasive supply source connected to the abrasive supply means. This apparatus supplies an abrasive using the abrasive supply source as a supply source, and is provided with an injection device that can spray and stop the abrasive separately from the abrasive supply means.

〔作用〕 研磨加工に先立って研磨布に研磨装置本体に組込みの研
摩剤供給手段とは別に設はプj研磨剤の噴射装置で研磨
剤を撒布した後研磨加工を行なうことにより振動がなく
被加工物の損傷を抑え安定した研磨加工が行なえる。
[Function] Prior to polishing, a polishing cloth is sprayed with abrasive by an abrasive injection device that is installed separately from the abrasive supply means built into the main body of the polishing device. Stable polishing can be performed with less damage to the workpiece.

寸た、研磨装置は本体に組込んだ研摩剤供給手段とは別
に研磨剤k P?布する噴射装置を設けて研磨削の撒布
を行なう。
In fact, the polishing device supplies the abrasive separately from the abrasive supply means built into the main body. A spraying device is installed to spray the abrasive material.

〔実施例〕〔Example〕

以下、本発明の一実施例である第1図に基づいて説明す
る。本図は両面研磨装置の実施例で前述した第2図の従
来装置と同等部材は同一符号を付して詳しい説明は省略
し異なる部分についてのみ説明する。
Hereinafter, an explanation will be given based on FIG. 1, which is an embodiment of the present invention. This figure shows an embodiment of a double-sided polishing apparatus, and the same parts as those of the conventional apparatus shown in FIG.

研磨剤供給ライン13には電磁弁16が設けられ、この
電磁弁16ヲ励磁させた時研磨剤が研磨剤供給ラインI
3から研磨側受12に供給され研磨側受12に溜められ
ながら研磨剤はチューブ15、研磨剤供給口14を流下
し研磨布8、被加工物3そして研磨布9に順次供給され
るように構成されている。なお、研磨剤の供給源は簡易
形のタンクにポンプを設け、このポンプによシ研磨削を
供給するものであってもよい。
The abrasive supply line 13 is provided with a solenoid valve 16, and when the solenoid valve 16 is energized, the abrasive flows into the abrasive supply line I.
3 to the polishing side receiver 12, and while being stored in the polishing side receiver 12, the abrasive flows through the tube 15 and the abrasive supply port 14, and is sequentially supplied to the polishing cloth 8, the workpiece 3, and the polishing cloth 9. It is configured. The abrasive supply source may be a simple tank equipped with a pump, and the abrasive material may be supplied by this pump.

また、研磨剤供給ライン13には人手によって動かし研
磨剤の撒布が容易にできるようにした可撓性のチューブ
(軟質チューブ等)17が接続され、このチューブI7
の先端に研磨剤を噴射させるジャワ式の噴射装置1とが
接続されている。この噴射装置18は不図示のレバーを
有し、このレバーを押すと研磨剤が噴射し離すと止まる
ようになっている。なお、本実施例では噴射装置18に
供給される研磨剤は研磨装置本体に組込みの研摩剤供給
手段に供給される研磨剤供給源からとしたが、この研磨
剤供給源とは別の供給源から供給することも可能である
。また、噴射装置は研磨剤を撒布できるものであれば他
の形式のものでもよいことは云うまでもない。
Further, a flexible tube (such as a soft tube) 17 that can be moved manually to easily spread the abrasive is connected to the abrasive supply line 13, and this tube I7
A Java-type spraying device 1 for spraying abrasive is connected to the tip. This spraying device 18 has a lever (not shown), and when the lever is pushed, the abrasive is sprayed, and when it is released, it stops. In this embodiment, the abrasive supplied to the injection device 18 was supplied from an abrasive supply source that is supplied to an abrasive supply means built into the main body of the polishing apparatus, but a supply source other than this abrasive supply source may be used. It is also possible to supply from It goes without saying that the spraying device may be of any other type as long as it can spray the abrasive.

このように構成されているため研磨加工に当っては先ず
上定盤1を上方に移動させた後ウェハ等の被加工物3を
キャリア7の被加工物保持穴4内にセヴトする。次いで
噴射装置18ヲ手で握ってレバーを押え被加工物30表
面や研磨布9に研磨剤を十分に撒布する。この場合研磨
布8に撒布することも可能である。そして上定盤1を下
降させ被加工物3を上下定盤1.2間で挾んだ後電磁弁
16ヲ励磁させ研磨剤を研磨側受I2に供給する。
With this structure, during polishing, the upper surface plate 1 is first moved upward, and then the workpiece 3 such as a wafer is placed into the workpiece holding hole 4 of the carrier 7. Next, the sprayer 18 is grasped by hand and the lever is pressed to sufficiently spray the abrasive onto the surface of the workpiece 30 and the abrasive cloth 9. In this case, it is also possible to sprinkle it on the polishing cloth 8. After lowering the upper surface plate 1 and sandwiching the workpiece 3 between the upper and lower surface plates 1.2, the solenoid valve 16 is energized to supply abrasive to the polishing side receiver I2.

研磨側受12に供給された研磨剤はチューブ15、研磨
剤供給口14’に流下−し研磨布8、被加工物3そして
研磨布9に順次供給される。そこで内歯車5と太陽歯車
6を回転させキャリア75自転、公転を与えるとともに
上下定盤112を回転させ、上下定盤1.2に相対運動
与えて被加工物3の上下面を同時に研磨する。
The polishing agent supplied to the polishing side receiver 12 flows down into the tube 15 and the polishing agent supply port 14', and is sequentially supplied to the polishing cloth 8, the workpiece 3, and the polishing cloth 9. Therefore, the internal gear 5 and the sun gear 6 are rotated to cause the carrier 75 to rotate and revolve, and the upper and lower surface plates 112 are rotated, giving relative motion to the upper and lower surface plates 1.2 to simultaneously polish the upper and lower surfaces of the workpiece 3.

〔発明の効果〕〔Effect of the invention〕

研磨加工に先立って研磨布やウエノ・等の被加工物に研
磨剤を十分に撒布することにより、被加工物表面は十分
な研磨剤の層で覆われ研磨布と被加工物の間および被加
工物とキャリア間での滑りが安定し、また、振動が少な
く被加工物に損傷を与えることがなく所望の研磨除去速
度が得られるとともに安定した研磨加工が可能になった
Prior to polishing, by sufficiently sprinkling abrasive onto the workpiece, such as an abrasive cloth or wax, the surface of the workpiece will be covered with a sufficient layer of abrasive, and the space between the polishing cloth and the workpiece and the surface of the workpiece will be covered. The sliding between the workpiece and the carrier is stabilized, vibration is small, and the desired polishing removal rate can be obtained without damaging the workpiece, making stable polishing possible.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の研磨装置の一実施例を示す断面図、第
2図は従来の研磨装置の断面図である。 ′   1・・・上定盤、 2・・・下定盤、 3・・
・被加工物、5・・・内歯車、 6・・・太陽歯車、 
7・・・キャリア、8.9・・・研磨布、  10・・
・研摩剤供給手段、18・・・噴射装置。 ・  出願人 東芝機械株式会社
FIG. 1 is a sectional view showing an embodiment of the polishing apparatus of the present invention, and FIG. 2 is a sectional view of a conventional polishing apparatus. ' 1...Upper surface plate, 2...Lower surface plate, 3...
・Workpiece, 5... Internal gear, 6... Sun gear,
7...Carrier, 8.9...Abrasive cloth, 10...
- Abrasive supply means, 18... injection device.・Applicant: Toshiba Machine Co., Ltd.

Claims (1)

【特許請求の範囲】 1、太陽歯車と内歯車に噛合い上下定盤間を自転および
公転するキャリアの穴に被加工物を装填し、前記上下定
盤に設けた研磨布と研磨剤により装置に組込んだ研磨剤
供給手段で研磨剤を供給しながら前記被加工物を研磨す
る研磨方法において、上定盤を上方に移動させ、研磨加
工に先立って前記研摩剤供給手段とは別に設けた研磨剤
の噴射装置で研磨布に研磨剤を撒布し、研磨剤が研磨布
に十分に浸透した後研磨加工を行なうようにしたことを
特徴とする研磨方法。 2、太陽歯車と、内歯車と、前記両歯車に噛合って自転
および公転するキャリアと、同キャリアを上下より挾ん
でキャリア内に装填した被加工物を研磨する研磨布を張
付けた上下定盤と、研磨剤を供給する研磨剤供給手段と
を備え研磨剤を前記研磨剤供給手段で供給しながら前記
被加工物を研磨する研磨装置において、前記研磨装置に
組込んだ研磨剤供給手段に接続の研磨剤供給源を供給源
として研磨剤を供給し、前記研磨剤供給手段とは別に研
磨剤の撒布および停止が可能な噴射装置を設けたことを
特徴とする研磨装置。 3、太陽歯車と、内歯車と、前記両歯車に噛合って自転
および公転するキャリアと、同キャリアを上下より挾ん
でキャリア内に装填した被改工物を研磨する研磨布を張
付けた上下定盤と、研磨剤を供給する研磨剤供給手段と
を備え研磨剤を前記研磨剤供給手段で供給しながら前記
被加工物を研磨する研磨装置において、前記研磨装置に
組込んだ前記研磨剤供給手段に接続の研磨剤供給源とは
別の研磨剤の供給源を供給源として研磨剤を供給し、前
記研磨剤供給手段とは別に研磨剤の撒布および停止が可
能な噴射装置を設けたことを特徴とする研磨装置。
[Scope of Claims] 1. A workpiece is loaded into a hole in a carrier that meshes with a sun gear and an internal gear and rotates and revolves between upper and lower surface plates, and the abrasive cloth and abrasive agent provided on the upper and lower surface plates are used to process the device. In the polishing method of polishing the workpiece while supplying the abrasive with an abrasive supply means incorporated in the workpiece, the upper surface plate is moved upward and, prior to the polishing process, an abrasive supply means provided separately from the abrasive supply means is provided. A polishing method characterized in that an abrasive is sprayed onto a polishing cloth using an abrasive jetting device, and the polishing process is performed after the abrasive has sufficiently penetrated into the polishing cloth. 2. A sun gear, an internal gear, a carrier that rotates and revolves in mesh with both gears, and an upper and lower surface plate that holds the carrier from above and below and is attached with abrasive cloth for polishing the workpiece loaded in the carrier. and an abrasive supply means for supplying an abrasive, the polishing apparatus for polishing the workpiece while supplying an abrasive by the abrasive supply means, the polishing apparatus being connected to the abrasive supply means built into the polishing apparatus. A polishing apparatus, characterized in that an abrasive is supplied using an abrasive supply source as a supply source, and an injection device capable of spraying and stopping the abrasive is provided separately from the abrasive supply means. 3. A sun gear, an internal gear, a carrier that meshes with both gears and rotates and revolves, and an upper and lower setter that holds the carrier from above and below and is attached with abrasive cloth that polishes the workpiece loaded in the carrier. A polishing apparatus comprising a disc and an abrasive supply means for supplying an abrasive and polishing the workpiece while supplying an abrasive by the abrasive supply means, wherein the abrasive supply means is incorporated in the polishing apparatus. The abrasive is supplied from an abrasive supply source different from the abrasive supply source connected to the abrasive, and an injection device capable of spraying and stopping the abrasive is provided separately from the abrasive supply means. Characteristic polishing equipment.
JP63034361A 1988-02-17 1988-02-17 Polishing method and device Pending JPH01210268A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63034361A JPH01210268A (en) 1988-02-17 1988-02-17 Polishing method and device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63034361A JPH01210268A (en) 1988-02-17 1988-02-17 Polishing method and device

Publications (1)

Publication Number Publication Date
JPH01210268A true JPH01210268A (en) 1989-08-23

Family

ID=12412023

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63034361A Pending JPH01210268A (en) 1988-02-17 1988-02-17 Polishing method and device

Country Status (1)

Country Link
JP (1) JPH01210268A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0355156U (en) * 1989-09-28 1991-05-28
JPH03228569A (en) * 1990-02-02 1991-10-09 Fujikoshi Kikai Kogyo Kk Polishing device and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0355156U (en) * 1989-09-28 1991-05-28
JPH03228569A (en) * 1990-02-02 1991-10-09 Fujikoshi Kikai Kogyo Kk Polishing device and method

Similar Documents

Publication Publication Date Title
KR100412542B1 (en) Method and device for cleaning work
CN100542748C (en) Polishing pad conditioner and manufacturing thereof and recycle method
US20020007840A1 (en) Substrate cleaning apparatus, substrate cleaning method and substrate processing apparatus
JP2001150345A (en) Washing and slurry-scattering system assembly used in chemical mechanical-polishing device
US20070042691A1 (en) Polishing pad cleaner and chemical mechanical polishing apparatus comprising the same
US7210984B2 (en) Shaped polishing pads for beveling microfeature workpiece edges, and associated systems and methods
EP0842738B1 (en) Method of and apparatus for polishing and cleaning planar workpiece
JP2010069601A (en) Method for dressing polishing pad and polishing device
JPH01210268A (en) Polishing method and device
JPH0957608A (en) Polishing pad and polishing method for work to be surface-treated using it
JP2833549B2 (en) Polishing cloth surface adjustment method and mechanism
JP2021181157A (en) CMP device and method
JPH0766160A (en) Abrasive method and apparatus for semiconductor substrate
JP2013517623A (en) Wafer unload system and wafer processing apparatus including the same
JPH0469813B2 (en)
JPH0557605A (en) Double side polishing machine for thin plate workpiece
CN214923338U (en) Transfer device used in silicon wafer polishing equipment and silicon wafer polishing equipment
JPH0966448A (en) Grinding machine
JPH04129664A (en) Polishing method for work
KR100508863B1 (en) Chemical mechanical polishing apparatus
JPH10337656A (en) Wafer polishing device, and washing method of insert for wafer holding
JP2023119795A (en) Processing device
JP2001088020A (en) Polishing method and device for workpiece
JP2000354948A (en) Substrate polishing method and substrate polishing device
JPH10296627A (en) Polishing device and method