JPH01207637A - Analytic inspecting method for signal frequency - Google Patents

Abstract

PURPOSE:To automate inspection and to make the inspection accurate by converting a signal to be measured into a frequency-range signal, comparing it with the specific criterion of a preset frequency range and making an acceptance decision. CONSTITUTION:A substrate 2 where an electric circuit to be inspected is mounted is carried in and out of an inspecting device 4 and made to abut on a fixture part 12 at an inspection position P by a robot part 6, thereby inspecting the substrate. A fast Fourier transform analytic measuring instrument 18 connected to the fixture part 12 fetch the signal to be measured which is outputted by the sound part of the substrate 2 and converts the signal to the frequency range. Then this is compared with the specific criterion of the preset frequency range and a controller 20 decides whether or not the substrate is accepted according to the measurement result.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a signal frequency analysis and inspection method, and in particular, the present invention relates to a signal frequency analysis and inspection method, and in particular, it analyzes the frequency components of a signal under test from a product under test, and analyzes the frequency components of a signal to be measured from a product under test. The present invention relates to a signal frequency analysis inspection method that can determine whether

[Conventional technology]

2. Description of the Related Art Conventionally, the following procedure has been used to check whether or not audio signals output from a personal computer, word processor, etc. are being output normally.

That is, the acoustic signals output from the computer or processor are arranged in a predetermined pattern (for example,
This audio signal is amplified and output from the speaker in the order of "E, F, G, U, C, C", so that the person inspecting it can listen to it (depending on whether it is normal or not). - By such a testing method, it is possible to determine whether the acoustic signal output from the computer or processor is a normal acoustic signal or an abnormal acoustic signal. Further, there is an advantage that the inspection device for implementing the acoustic signal inspection method may be relatively simple.

[Problem to be solved by the invention]

However, the above-mentioned conventional inspection method requires the inspector to have the ability to analyze acoustic signals and has a certain level of skill. In addition, the above-mentioned testing method has the disadvantage that if the test is continued for a long time, not only will errors occur in the test, but the tester will be under excessive stress.

The present invention has been made in order to solve the problems of the prior art described above, and an object of the present invention is to provide a signal frequency analysis test method that can perform tests automatically and accurately.

[Means for Solving the Problems] In order to achieve the above object, the signal frequency analysis inspection method according to the present invention includes a mechanism capable of carrying an item to be inspected into an inspection position and carrying it out from the inspection position. In a method for inspecting a signal to be measured from a product to be inspected that has been brought into the inspection position and made measurable, the signal to be measured is converted into a signal in the frequency domain, and the converted signal is set in advance. The method is characterized in that it is compared with a predetermined criterion in the frequency domain, and a pass/fail decision is made based on the comparison result.

[Operation] According to the present invention, the signal under test is first converted into a signal in the frequency domain. The converted signal is then compared with a predetermined criterion in the frequency domain set in advance. Pass/fail judgment is automatically made based on the measurement results.

According to the present invention, it is possible to automatically determine whether the frequency of the signal to be measured of the product to be inspected is within a predetermined reference range, and the inspection results are accurate. This eliminates variations in results and allows long-term testing.

〔Example〕

Embodiments of the present invention will be described below based on the drawings.

1 to 4 are diagrams for explaining the present invention in detail.

FIG. 3 is a block diagram of an apparatus for realizing an embodiment of the signal frequency analysis and inspection method according to the present invention, and FIG. 4 is a block diagram showing the main parts of the apparatus.

The inspection apparatus shown in FIGS. 3 and 4 is constructed as follows. That is, the reference numeral 2 in the figure is a board on which an electronic circuit is mounted, which is an item to be inspected. This board 2 is
It is carried into the signal frequency analysis and testing device 4 by a transport means (not shown), and when a predetermined test is completed in the signal frequency analysis and testing device 4, it is carried out and transported from the signal frequency analysis and testing device 4 by a transport means (not shown). The signal frequency analysis/inspection apparatus 4 includes a mechanism (not shown except for a part) for carrying the board 2 carried into the apparatus into the inspection position P, setting it, and carrying it out of the apparatus from the inspection position P. )have. A part of this mechanism is called a robot section 6, and the robot section 6 is composed of a plate 8 on which a robot 7 is provided, and a driver 10 that can move the plate 8 up and down.

When the substrate 2 reaches a certain position N, the robot section 6 pushes the substrate 2 down to the inspection position P with the holding pin 9 of the plate body 8 and abuts it against the fixture part 12. After the inspection is completed, the substrate 2 is returned to a fixed position N.

The fixture part 12 has a contact needle 16 installed in the upper part of the box 14, and the box 14 is equipped with a necessary pre-processing circuit (not shown) and a power supply circuit for testing the function of the board 2. (not shown) to supply command signals and power to the substrate 2 via the contact needle 16,
The structure is such that a signal can be extracted from the contact needle 16 through the contact needle 16. The fixture part 12 is connected to a fast Fourier transform analysis and measurement device 18 via a signal line 17.
is connected. In addition, this fast Fourier transform analysis and measurement device 1B converts the signal to be measured outputted from the sound section 2A of the board 2 into the contact needle 16 and the fixture part 1.
2. A configuration capable of capturing the signal via the signal line 17, converting this signal into a frequency domain signal, comparing the converted signal with a predetermined criterion in the frequency domain set in advance, and outputting the comparison result. It has become.

The fast Fourier transform analysis and measurement device 18 is connected to a control device 20 via a multipurpose interface bus (GP-IB) 19, and receives commands from the control device 20 to set predetermined judgment criteria in the frequency domain. The measurement results can be sent to the control device 20 via the GP-1B 19. Similarly, the board 2 is connected to the input/output interface of the control device 20 via the contact needle 16, part of the fixture 12, and signal line 21! (Ilo) 22, and commands from the control device 20 can be sent through I1022, the fixture part 12, and the contact needle 16. This control device 20 is configured to take in the measurement results from the fast Fourier transform analysis and measurement device 18, make a pass/fail determination, and output the pass/fail result.

The robot 7 of the robot section 6 is driven and controlled by a control device 20, and the driver 1
0 is such that its vertical movement is controlled by the control device 20. The robot section 6 is capable of placing the substrate 2 at an inspection position P and moving a predetermined movable member.

The operation of the inspection device configured in this way is illustrated in Figs. 1 to 4.
This will be explained based on the diagram.

FIG. 1 is a flowchart shown to explain an embodiment of the present signal frequency analysis and inspection method. FIG. 2 is a waveform diagram shown to explain the same embodiment, in which the horizontal axis represents frequency and the vertical axis represents voltage.

First, the substrate 2 is carried into the signal frequency analysis/inspection apparatus 4 by a transport means (not shown) and placed at a predetermined position N. Then, the driver 10 is driven by the control device 20 to lower the plate 8, so that the board 2 is at the inspection position P.
placed in When the substrate 2 is placed in the test position fftP, it is ready for test by being contacted by the contact needles 16 of the fixture part 12, and is then put into operation.

When the board 2 is put into operation in this way, the control bag W
20 sets each circuit of the board 2 and the fixture part 12 to an initial state (step 100). Further, in this step 100, the control device 20 initializes its own desired registers, counters n, etc. (n=o), and performs an acoustic test for, for example, "do", "mi", and "so". In this case, the number of test items Max is set to May=2. Next, check whether the test has been completed or not, that is, n>May(-
2) is determined (step 101).

In this step 101, since the counter n is initially n=o, n<Max, and the process moves to step 102.

In this Stella 7'102, the control device 20 sends the fast Fourier transform analysis and measurement device 18 OK and No. 1N for the next pass/fail judgment standard window regarding "Do". H,Nt,
Set NN. That is, as shown in FIG. 2, the fast Fourier transform analysis measurement bag W18 has a fundamental frequency f.
Acceptance judgment window OK for 0ゎ, failure window N set around the fundamental frequency fllD. L i N O□, subharmonic f
A rejection window NL for Lll and a rejection window N for harmonic r are set. Next, a command is given to the board 2 via the control device 2041, signal line 2, fixture part 12 and contact needle 16 to output an acoustic signal of "do" (step 103);
As a result, the board 2 outputs the designated acoustic signal of "do". The fast Fourier transform analysis and measurement device 18 then performs predetermined measurements. Here, upon completion of the measurement, the fast Fourier transform analysis and measurement device 18 outputs the measurement result (step 104).

The control device 20 that has taken in this measurement result determines whether or not it passes (step 105). If it is determined in step 105 that the product has failed, the process moves to step 106, and the fact that it is defective is recorded. Further, if a pass is determined in step 105 and if the process in step 106 is completed, the process moves to step 107, where n=n+1 is calculated (n=1), and the process returns to step 101.

Further, in step 101, it is determined whether the inspection has ended, that is, whether n > Max (= 2) has been reached (step 101). In this step 101,
Since the counter n is n=1, n< Max,
Proceed to step 102. In this step 102, the control device 20 instructs the fast Fourier transform analysis and measurement device 18 to accept the next pass/fail criteria window for "Mi",
Set N ot , N ON , N t and NH. That is, as shown in FIG. 2, the fast Fourier transform analysis and measurement device 18 has a pass judgment window OK for the fundamental frequency ros, and a fail window N set around the fundamental frequency fON. L i N all, failure window NL for subharmonic f LM, and failure window N for harmonic f
, will be set.

Next, the control device 20 gives a command to the substrate 2 via the signal line 2 and the contact needle 16 to output an acoustic signal of "mi" (step 103). The board 2 has the specified “
It will output the MiJ acoustic signal. The fast Fourier transform analysis and measurement device 18 then performs predetermined measurements according to preset standards shown in FIG.

Here, upon completion of the measurement, the fast Fourier transform analysis and measurement device 18 outputs the measurement result (step 104).
). The control device 20 that has taken in this measurement result determines whether or not it passes (step 105). This step 10
If it is determined in step 5 that the product has failed, the process moves to step 106, and the fact that it is defective is recorded. In addition, if a pass is determined in step 105 and if the process in step 106 is completed, the process moves to step 107, where n=n+1 is calculated (n=2), and the process returns to step 101.

Furthermore, in step 101, whether or not the inspection has been completed is determined.
That is, it is determined whether n>Max(-2) has been reached (step 101). In step 101, the counter n is n=2, so n = Max ・, n>
Since it is not Max, the process moves to step 102. In this step 102, the control word! 20 indicates that the next pass/fail judgment standard window for "S" is OK for the fast Fourier transform analysis and measurement device 18.

No. Set H+ NL and NM. That is,
As shown in FIG. 2, the fast Fourier transform analysis and measurement device 18 has a pass judgment window for fundamental frequency
, fundamental frequency f. Failure window N set around S. L
i N OH1 subharmonic f Rejection window NL for L3,
and harmonic f, 1. A failure window N I+ will be set for the test. Next, the control device 20 gives a command to the substrate 2 through the signal line 2, the fixture part 12, and the contact needle 16 to output an acoustic signal of "G" (step 103). As a result, the board 2
will output the specified "G" sound signal. Then, the fast Fourier transform analysis and measurement device 18
Predetermined measurements will be made according to preset standards shown in the figure. Here, when the fast Fourier transform analysis and measurement device 1fffi1B completes the measurement, it outputs the measurement result (step 104). The control device 20 that has taken in this measurement result determines whether or not it passes (step 105). If it is determined in step 105 that the product has failed, the process moves to step 106, and the fact that it is defective is recorded. In addition, if a pass is determined in step 105 and if the process in step 106 is completed, step 107
Then, the calculation of n=n+1 is performed (n=3)--the process returns to step 101. In this step 1oi, n=3, so n>Max, and step 10
We will move on to 8. In step 108, the test results are output from the control device 20, and the process ends. Then, by driving the driver IO, the plate 8 is raised, and the board 2 is raised from the inspection position P to a predetermined position N,
After that, the board 2 is carried out and all inspections are completed. When this is completed, the operation starts again from the p person of the board 2.

According to this embodiment, the inspection of the signal to be measured of the inspected product, which was conventionally carried out manually, can be automatically carried out, and the inspection results are accurate and there is no variation in the inspection results.

In the above embodiment, Max was explained as Max = 2, but it is not limited to this.
All you need to do is set ay = 15, and based on this, 1
This means that a five-tone test can be performed.

〔Effect of the invention〕

As described above, according to the present invention, loading and unloading, inspection preparation, and inspection are automatically possible, and the measured signal of the inspected product is converted into a frequency domain signal and the signal is based on the frequency domain signal. Since it is possible to determine whether a predetermined acoustic signal is being output by comparing with the desk signal, it is possible to automate the inspection and to perform the inspection accurately and quickly.

[Brief explanation of the drawing]

Fig. 1 is a flowchart showing an embodiment of the present invention, Fig. 2 is a waveform diagram shown to explain the embodiment, Fig. 3 is a block diagram showing an inspection device for realizing the embodiment, and Fig. 4 is a flowchart showing an embodiment of the present invention. It is a block diagram showing the waist part of the same device. 2... Board (product to be inspected), 4... Signal frequency analysis and inspection device, 12... Part of the finch, 18... Fast Fourier transform analysis and measurement device, 20... Control device, P
...Inspection position. Agent Patent Attorney Tomo Murakami - Figure 1 Seconda (o-kaku) and

Claims (1)

[Claims] (1) The product to be inspected is carried into the inspection position, has a mechanism that allows it to be carried out from the inspection position, and the signal to be measured from the product to be inspected is carried into the inspection position and made measurable. The method is characterized in that the signal under test is converted into a signal in the frequency domain, the converted signal is compared with a predetermined criterion in the frequency domain set in advance, and a pass/fail judgment is made based on the comparison result. Signal frequency analysis test method.