JPH01204294A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

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Publication number
JPH01204294A
JPH01204294A JP63026893A JP2689388A JPH01204294A JP H01204294 A JPH01204294 A JP H01204294A JP 63026893 A JP63026893 A JP 63026893A JP 2689388 A JP2689388 A JP 2689388A JP H01204294 A JPH01204294 A JP H01204294A
Authority
JP
Japan
Prior art keywords
inverter
node
output
current
potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63026893A
Other languages
Japanese (ja)
Other versions
JP2549686B2 (en
Inventor
Takashi Oya
大矢 隆司
Satoru Kishida
悟 岸田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2689388A priority Critical patent/JP2549686B2/en
Publication of JPH01204294A publication Critical patent/JPH01204294A/en
Application granted granted Critical
Publication of JP2549686B2 publication Critical patent/JP2549686B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To cause power consumption to be low by turning-on and off a switching means, which is provided in the power source supplying route of an inverter in an output step, and adjusting a through current period to flow between the power source of the output inverter and a GND. CONSTITUTION:An n-MOST 12 to constitute an inverter 10 and an n-MOST 16, which is a transistor for through current limit with a ground, are provided. When an H is inputted to the gate of an n-MOST 14 and an L is inputted to the gate of the n-MOST 16, the n-MOST 16 is turned off and a through current does not flow during the period. Next, when the L is inputted to the base of the n-MOST 14, the potential of a node 9 goes to be the H. Then, when an output is needed, the H is inputted to the gate of the n-MOST 16 and the n-MOST 16 is turned on. Then, the output is removed. Thus, a time, during which the trough current flows most, can be shortened and the energy consumption can be made the lowest.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、半導体集積回路装置に関し、特に半導体メ
モリの電流型センスアンプに関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor integrated circuit device, and particularly to a current type sense amplifier for a semiconductor memory.

〔従来の技術) 第4図は従来の電流型ヒンスアンブを示す回路図である
。図において、1はセンスアンプ、2はインバータであ
り、インバータ2はp型MO8トランジスタ(以下p−
M OS Tと略す)3及び0111MO3トランジス
タ(以下n−MO3Tと略す)4により構成されている
。インバー92の出力はn−MO3T5及び6のゲート
に接続されている。
[Prior Art] FIG. 4 is a circuit diagram showing a conventional current-type Hinsamplifier. In the figure, 1 is a sense amplifier, 2 is an inverter, and inverter 2 is a p-type MO8 transistor (hereinafter p-
MOS T) 3 and an 0111 MO3 transistor (hereinafter abbreviated as n-MO3T) 4. The output of inverter 92 is connected to the gates of n-MO3Ts 5 and 6.

n−MO8T5はドレインが高電位側に、ソースがイン
バータ2の入力に各々接続され、ONすることによりソ
ースとインバータ2の入力との共通接続点であるノード
7の電位を“1−ビ′にしようとりる。n−MO3T6
はドレインがp−MO3T8のドレインに、ソースがノ
ード7に各々接続されティる。そして、n −M OS
 −r 6及びp−MO3T8のドレイン共通接続点を
ノード9としている。p−vosTsはゲートが接地さ
れ、ソースが高電位側に各々接続されている。
The drain of the n-MO8T5 is connected to the high potential side, and the source is connected to the input of the inverter 2. When turned on, the potential of the node 7, which is the common connection point between the source and the input of the inverter 2, becomes "1-bi". Let's try.n-MO3T6
has a drain connected to the drain of p-MO3T8, and a source connected to node 7. And n-M OS
The common connection point of the drains of -r6 and p-MO3T8 is designated as node 9. The gates of the p-vosTs are grounded, and the sources are connected to the high potential side.

10はp−MO8T11及びn−MO8T12より成る
出力段のインバータでおり、入力がノード9に接続され
、出力をノード13としている。
Reference numeral 10 denotes an output stage inverter consisting of p-MO8T11 and n-MO8T12, whose input is connected to node 9 and whose output is node 13.

14はビット線15に直列に接続されたn−MO8Tで
あり、ゲートに接続されているワード線が1」′′にな
った時に、ONするが否かにより0″又は1″を記憶す
るメ七すセル群のうちの1つを示す。
14 is an n-MO8T connected in series to the bit line 15, and when the word line connected to the gate becomes 1'', it is a memory that stores 0'' or 1'' depending on whether it is turned on or not. One of seven cell groups is shown.

次に動作について説明する。ノード7がL″の場合、イ
ンバータ2はH11を出力し、この”11”がn−MO
8T5及び6のゲートに人力されるため、n−MO8T
5及び6はONL、ノード7の電位は°’II”に上背
しようどする。しかし、ノード7の電位がインバータ2
の反転電位以上になるとインバータ2はL″を出力し、
この°“L″がn−MO3T5及び6のゲートに入力さ
れn−MO8T5及び6はOFFするので、ノード7の
電位はインバータ2の反転電位以上にならない。
Next, the operation will be explained. When node 7 is L'', inverter 2 outputs H11, and this “11” is n-MO
Since the gates of 8T5 and 6 are manually operated, n-MO8T
5 and 6 are ONL, and the potential of node 7 is about to exceed °'II". However, the potential of node 7 is
When the potential exceeds the inversion potential of , inverter 2 outputs L'',
Since this "L" is input to the gates of n-MO3T5 and 6 and n-MO8T5 and 6 are turned off, the potential of node 7 does not exceed the inverted potential of inverter 2.

ノード7の電位がインバータ2の反転電位以上になった
とすると、ノード7からビット線15及びn−MO8T
I 4を通じGND側に電流が流れノード7の電位は低
くなる。これはn−MO8T14がONしている場合は
ちらろん、OFFの状態でもリーク電流によりGND側
にわずかな電流パスができるためである。そして、ノー
ド7の電位が低くなっていさ、インバータ2の反転電位
以下になるとインバータ2は゛トビ′を出力し、この”
 l−1”がn −M OS −r 5及び6のゲー1
〜に入力されn−MO3T5及び6はONするので、ノ
ード7の電位はインバータ2の反転電位以下にならない
。このように、ノード7の°電位はほぼインバータ2の
反転電位に自己バイアスされる。
If the potential of node 7 becomes higher than the inverted potential of inverter 2, the bit line 15 and n-MO8T are connected from node 7 to
A current flows to the GND side through I4, and the potential of node 7 becomes low. This is because, of course, when the n-MO8T14 is ON, even when it is OFF, a slight current path is created on the GND side due to leakage current. Then, when the potential of the node 7 becomes low and becomes less than the inverted potential of the inverter 2, the inverter 2 outputs "tobi'".
l-1'' is n -M OS-r Game 1 of 5 and 6
Since the n-MO3Ts 5 and 6 are turned on, the potential of the node 7 does not become lower than the inverted potential of the inverter 2. In this way, the potential of node 7 is self-biased to approximately the inverted potential of inverter 2.

そして、n−MO8T14のゲートに’ l−1”が入
力されることによりn−MO3TI 4がONするとノ
ード7の電位が下がり、n−MO3T6はONL、n−
MO8T6.ノード7、ビット線15及びn−MOS−
r’14を通じ電流が流れ、インバータ10の入ツノで
あるノード9がL″となるためインバータ10の出力で
あるノード13は“′H″となる。
Then, when 'l-1' is input to the gate of n-MO8T14, n-MO3TI4 turns on, the potential of node 7 decreases, and n-MO3T6 becomes ONL, n-
MO8T6. Node 7, bit line 15 and n-MOS-
A current flows through r'14, and node 9, which is the input terminal of inverter 10, becomes "L", so that node 13, which is the output of inverter 10, becomes "'H".

一方、n−MO8T14のゲートにL″が入力されるこ
とによりn−MO8T14がOFFするとノード7の電
位が一ヒ昇し、n−MO3T6はOFFするので、イン
バータ10の入力が’ H”となるためインバータ10
の出力であるノード13は′L″となる。
On the other hand, when the n-MO8T14 is turned off by inputting L'' to the gate of the n-MO8T14, the potential of the node 7 rises, and the n-MO3T6 is turned off, so the input of the inverter 10 becomes 'H'. Inverter 10
The output of node 13 becomes 'L'.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の電流型センスアンプは以上のように構成されてい
るので、n−MO8TI 4がONするとn−MO8T
6もONL、、インバータ10の入力であるノード9の
電位は低くなる。しかし、前述のようにノード7の電位
はほぼインバータ2の反転電位に自己バイアスされてい
るため、ノード9の電位もほぼインバータ2の反転電位
程度にしか低下せず、インバータ10の入力であるL″
は完全にO■にはならない。このためトランジスタ14
がONLでいる場合、インバータ10を構成するml−
M08T12は完全に0FFt!ず、インバータ10の
電源とGND間に常に貫通電流が流れており、消費電力
が大きいという問題点があった。
The conventional current type sense amplifier is configured as described above, so when n-MO8TI 4 is turned on, n-MO8T
6 is also ONL, the potential of node 9, which is the input of inverter 10, becomes low. However, as mentioned above, since the potential of node 7 is self-biased to almost the inverted potential of inverter 2, the potential of node 9 also decreases only to about the inverted potential of inverter 2, ″
does not become completely O■. Therefore, the transistor 14
is ONL, ml- which constitutes the inverter 10
M08T12 is completely 0FFt! First, there is a problem in that a through current always flows between the power source of the inverter 10 and GND, resulting in large power consumption.

この発明は、上Jのような問題点を解決するためになさ
れたもので、貫通電流の流れる期間を制限し低消費電力
化した半導体集積回路装置を得ることを目的とする。
The present invention has been made to solve the above problem, and aims to provide a semiconductor integrated circuit device that reduces power consumption by limiting the period during which a through current flows.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係る半導体集積回路装置は、自己バイアスに
よりほぼ一定電位に保持される第1の端子を右し、該第
1の端子から一定値以上の電流が流出するか否かにより
出力段のインバータを介しl−1”又は°“l I+を
出力するセンスアンプと、メモリセルが接続され情報読
み出し時に前記メモリセルの記憶内容に応じ当該メモリ
セルを介し電流パスができるビット線とを備えた半導体
集積回路装置において、前記出力段のインバータの電源
供給経路にスイッチング手段を設けた構成とし【いる。
The semiconductor integrated circuit device according to the present invention has a first terminal that is held at a substantially constant potential by self-biasing, and an output stage inverter depending on whether a current of a certain value or more flows out from the first terminal. A semiconductor device comprising: a sense amplifier that outputs l-1" or °"l I+ through a memory cell; and a bit line to which a memory cell is connected and which allows a current path to flow through the memory cell depending on the memory content of the memory cell when reading information. In the integrated circuit device, a switching means is provided in a power supply path of the inverter in the output stage.

〔作用〕[Effect]

この発明におけるスイッチング手段は、OFFすること
により出力段のインバータの電源とGN1〕闇に流れる
貫通電流をカットする。
The switching means in this invention cuts the through current flowing between the power source of the inverter in the output stage and GN1 by turning off.

〔実施例〕〔Example〕

第1図は、この発明の一実施例である半導体集積回路装
置における電流型センスアンプを示す回路図で・ある。
FIG. 1 is a circuit diagram showing a current type sense amplifier in a semiconductor integrated circuit device which is an embodiment of the present invention.

図においで、第4図に示す従来回路との相違点は、イン
バータ10を構成するn−MO8T12と接地j11に
貫通電流制限用トランジスタであるn−MO3T16を
設けたことである。
In the figure, the difference from the conventional circuit shown in FIG. 4 is that an n-MO3T16, which is a through-current limiting transistor, is provided between the n-MO8T12 constituting the inverter 10 and the ground j11.

その他の構成は第4図の従来回路と同様である。Other configurations are similar to the conventional circuit shown in FIG.

上記構成において、ノード7がほぼインバータ20反転
型位に自己バイアスされる動作は第4図の従来回路と同
様である。
In the above configuration, the operation in which the node 7 is self-biased to approximately the inverting type of the inverter 20 is similar to the conventional circuit shown in FIG.

次tこ、n−MO81’1417)ゲートニ゛トビ′あ
るいは“L′°が入力された場合、インバータ10に流
れるv4通電流の期間を制限する動作について説明1J
る。前jホのようにn−MO8T14のゲートに”II
”が入力されるとn−MO8T14がON覆ることによ
りn−MO8T6.ノード7、ピッ1へ線15及びn−
MO3T14を通じ゛電流が流れノード9の電位が低下
する。この場合、n−MO3T16のゲートに°L″を
入力しておくと、n−MO3T16は0FFL、上記期
間中には貫通′電流は流れない。次に、n−MO3T1
4のベースに°L″が入力されると、ノード9の電位は
前述のように“l−1”になる。そして、出力が必要な
時(例えば出力段のラッチの切換時)に、n−fvlO
8T16のゲートに’ l−1”を入力し、n−MOS
”r16をONにして出力を取り出1!ばよい。」ニ)
小の場合、最しL1流′市流の流れる1111間が短か
くでさ、最も低消費電力化が図れる。そして、貫通電流
をカットJ−る期間はn−MO8T16のゲートに入力
する°°lド′及び“L″のタイミングにJ、り自由に
設定できる。
Next, n-MO81'1417) Explanation of the operation to limit the period of v4 current flowing to the inverter 10 when gate bias' or "L'° is input. 1J
Ru. "II" on the gate of n-MO8T14 like in the previous j-ho
” is input, n-MO8T14 turns ON, and the line 15 and n- MO8T6. to node 7 and pin 1 are
A current flows through MO3T14 and the potential of node 9 decreases. In this case, if °L'' is input to the gate of n-MO3T16, n-MO3T16 is 0FFL, and no through current flows during the above period. Next, n-MO3T1
When °L" is input to the base of node 4, the potential of node 9 becomes "l-1" as described above. Then, when an output is required (for example, when switching the latch in the output stage), n -fvlO
Input 'l-1' to the gate of 8T16, n-MOS
``Turn on r16 and take out the output 1!'' d)
If it is small, the length between 1111 and 1111 where the L1 flow is the shortest, and the lowest power consumption can be achieved. The period during which the through current is cut can be freely set according to the timing of the "L" and "L" signals input to the gate of the n-MO8T16.

第2図はこの発明の他の実施例を承り回路図である。第
1図の実施例との相)を点は、インパーク10の出力に
n−MO8丁17をさらに接続したことである。n−M
O3T14のゲートニ” l−”が入力されると前)小
のようにノード9の電(&が−L響してくる。この場合
、n−MO8r16がONしていな(〕ればn−MO8
T12のソースは接地されない。そのためインバータ1
0の出力であるノード13は完全に接地レベルに4【ら
ない。この場合、インバータ10の出力を入力とする回
路を次段に直接接続すると誤動作等の原因となる。そこ
で、n−MO8T17を設け、n−MO8TI6が0に
Fの場合はn−MO8T17も0FFFあるようにゲー
トに信号を与え、インバータ10の出力を高インピーダ
ンス状態にし、次段回路への影響を排除することにした
FIG. 2 is a circuit diagram of another embodiment of the invention. The difference from the embodiment shown in FIG. 1 is that an n-MO8 17 is further connected to the output of the impark 10. n-M
When the gate ``l-'' of O3T14 is input, the voltage of node 9 (& will sound -L as shown in the previous example).In this case, if n-MO8r16 is not ON, n-MO8
The source of T12 is not grounded. Therefore, inverter 1
Node 13, which is the output of 0, is not completely at ground level. In this case, if a circuit whose input is the output of the inverter 10 is directly connected to the next stage, malfunctions may occur. Therefore, n-MO8T17 is provided, and when n-MO8TI6 is 0 to F, a signal is given to the gate so that n-MO8T17 is also 0FFF, and the output of inverter 10 is placed in a high impedance state, eliminating the influence on the next stage circuit. I decided to do it.

−[記実施例ではセンスアンプ1を単体で用いたが、メ
モリセルに対ηる同じワード信号に対し力うl\を選択
するため第3図で示すようにセンスアンプ1を複数個用
いる場合には、出ツノ段にラッチ1つを設けることに3
」;す、センスアンプ1の出力段のインバータ10の出
力端に接続したn−MO8T17をカラム選択用のヒレ
フタとして使用することができる。
- [In the above embodiment, a single sense amplifier 1 is used, but in order to select the output power for the same word signal η for a memory cell, a plurality of sense amplifiers 1 may be used as shown in FIG. 3. In this case, one latch is provided on the protruding horn step.
The n-MO8T17 connected to the output terminal of the inverter 10 in the output stage of the sense amplifier 1 can be used as a filler for column selection.

なお、L記実施例ではセンスアンプ1が直接ビット線1
5に接続されているが、ビット線15とセンスアンプ1
の間にビット線選択用トランスミッションゲートを設け
た場合でも同様の効果が冑られる。
Note that in the embodiment L, the sense amplifier 1 directly connects the bit line 1.
5, but the bit line 15 and sense amplifier 1
A similar effect can be achieved even when a transmission gate for bit line selection is provided between the two.

また、n−MO3T16を高電位側に介挿してら同様の
効果が得られる。
Furthermore, the same effect can be obtained by inserting n-MO3T16 on the high potential side.

また、「)〜MO8T16及び17の両方、あるいは一
方をp−MO8Tで構成してもよく、この場合にも上記
実施例と同様の効果が19られる。
Further, both or one of MO8T 16 and 17 may be formed of p-MO8T, and in this case, the same effects as in the above embodiment can be obtained.

また、上記実施例ではセンスアンプ1を0MO8で構成
したが、これをNMO3F描成しても同様の効果が得ら
れる。
Further, in the above embodiment, the sense amplifier 1 is composed of 0MO8, but the same effect can be obtained even if it is written with NMO3F.

また、センスアンプ1を構成しているトランジスタと電
瞭間あるいは接地間に余分な電流をカットして消¥i電
力を軽減さけるための各種パワーカット川のトランジス
タを介1111シた場合に適用しても同様の効果が得ら
れる。
It can also be applied to cases where various power cut transistors are used to reduce power consumption by cutting excess current between the transistors that make up the sense amplifier 1 and the amplifier or ground. The same effect can be obtained.

(発明の効果〕 以上のようにこの発明によれば、出力段のインバータの
電源供給経路にスイッチング手段を設け、このスイッチ
を0N10FFさVることにより出力インバータの電源
とG N Dどの間に流れるし1通電流朋間を調整でき
るようにしたので、半導体集積回路装置の低量でダミ力
化が図れるという効果がある。
(Effects of the Invention) As described above, according to the present invention, a switching means is provided in the power supply path of the inverter in the output stage, and by switching this switch to 0N10FF, the current flows between the power supply of the output inverter and G N D. Since the current interval can be adjusted, it is possible to reduce the amount of dummy power in the semiconductor integrated circuit device.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例である半導体集積回路装置
を示づ回路図、第2図及び第3図はこの発明の他の実施
例を示す回路図、第4図は従来の半導体集積回路装置を
承り回路図である。 図において、1はセンスアンプ、7はノード、10はイ
ンバータ、14はメモリ廿ル、15はビット・線、16
はt]通電流制限用トランジスタである。 なお、各図中向−符シウは同一または相当部分を示づ。
Fig. 1 is a circuit diagram showing a semiconductor integrated circuit device which is an embodiment of the present invention, Figs. 2 and 3 are circuit diagrams showing other embodiments of the invention, and Fig. 4 is a circuit diagram showing a conventional semiconductor integrated circuit device. It is a circuit diagram of a circuit device. In the figure, 1 is a sense amplifier, 7 is a node, 10 is an inverter, 14 is a memory cell, 15 is a bit/line, and 16 is a
is a current limiting transistor. Note that the arrows in each figure indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] (1)自己バイアスによりほぼ一定電位に保持される第
1の端子を有し、該第1の端子から一定値以上の電流が
流出するか否かにより出力段のインバータを介し“H”
又は“L”を出力するセンスアンプと、メモリセルが接
続され情報読み出し時に前記メモリセルの記憶内容に応
じ当該メモリセルを介し電流パスができるビット線とを
備えた半導体集積回路装置において、 前記出力段のインバータの電源供給経路にスイッチング
手段を設けたことを特徴とする半導体集積回路装置。
(1) It has a first terminal that is held at a substantially constant potential by self-biasing, and is set to "H" via the output stage inverter depending on whether a current of a certain value or more flows out from the first terminal.
Alternatively, in a semiconductor integrated circuit device comprising a sense amplifier that outputs "L" and a bit line to which a memory cell is connected and which allows a current path to flow through the memory cell depending on the storage content of the memory cell when reading information, the output A semiconductor integrated circuit device characterized in that a switching means is provided in a power supply path of an inverter in a stage.
JP2689388A 1988-02-08 1988-02-08 Semiconductor integrated circuit device Expired - Fee Related JP2549686B2 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0745090A (en) * 1993-07-26 1995-02-14 Nec Corp Semiconductor memory integrated circuit

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56130884A (en) * 1980-03-14 1981-10-14 Toshiba Corp Semiconductor memory device
JPS57186293A (en) * 1981-05-12 1982-11-16 Fujitsu Ltd Semiconductor storing unit
JPS5924493A (en) * 1982-07-30 1984-02-08 Nec Corp Sense amplifier circuit
JPS6161297A (en) * 1984-08-31 1986-03-29 Hitachi Ltd Memory reading circuit
JPS6299980A (en) * 1985-10-25 1987-05-09 Hitachi Vlsi Eng Corp Signal transmission equipment
JPS62140292A (en) * 1985-12-13 1987-06-23 Toshiba Corp Semiconductor memory

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56130884A (en) * 1980-03-14 1981-10-14 Toshiba Corp Semiconductor memory device
JPS57186293A (en) * 1981-05-12 1982-11-16 Fujitsu Ltd Semiconductor storing unit
JPS5924493A (en) * 1982-07-30 1984-02-08 Nec Corp Sense amplifier circuit
JPS6161297A (en) * 1984-08-31 1986-03-29 Hitachi Ltd Memory reading circuit
JPS6299980A (en) * 1985-10-25 1987-05-09 Hitachi Vlsi Eng Corp Signal transmission equipment
JPS62140292A (en) * 1985-12-13 1987-06-23 Toshiba Corp Semiconductor memory

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0745090A (en) * 1993-07-26 1995-02-14 Nec Corp Semiconductor memory integrated circuit

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