JPH01181966A - Substrate heating device - Google Patents

Substrate heating device

Info

Publication number
JPH01181966A
JPH01181966A JP515088A JP515088A JPH01181966A JP H01181966 A JPH01181966 A JP H01181966A JP 515088 A JP515088 A JP 515088A JP 515088 A JP515088 A JP 515088A JP H01181966 A JPH01181966 A JP H01181966A
Authority
JP
Japan
Prior art keywords
heating chamber
heating
chamber
substrate
hot air
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP515088A
Other languages
Japanese (ja)
Other versions
JPH0751273B2 (en
Inventor
Naoki Suzuki
直樹 鈴木
Hiroyuki Naka
裕之 中
Tomohide Hirono
広野 友英
Takashi Ichiyanagi
一柳 高畤
Susumu Saito
進 斉藤
Takao Naito
孝夫 内藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63005150A priority Critical patent/JPH0751273B2/en
Publication of JPH01181966A publication Critical patent/JPH01181966A/en
Publication of JPH0751273B2 publication Critical patent/JPH0751273B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Tunnel Furnaces (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To improve the defect in soldering and to stabilize the quality of an element by equipping the means capable of feeding a hot blast to a heating chamber at >=one place at least and the partition plate at >=one place at least in the range of blocking no substrate to be transferred. CONSTITUTION:The chip packaging P plate 11 coated with a creamy solder is mounted on a transfer conveyor 12, fed to a preheating chamber 6 and heated at about 150 deg.C by an exothermic body 10 first. It is then fed to a heating chamber 7 and heated at about 250 deg.C by the hot blast of 250 deg.C approx. fed from the exothermic body 10 and a hot blast feeding port 9, cooled by a cooling fan 13 finally and taken off. The temp. inside the heating chamber 7 for soldering can be uniformized by feeding the hot blast of a constant temp. because the gaseous body is flowed from the inside of the heating chamber 7 to the outside thereof and no outside air is flowed into the heating chamber 6. The heating chamber 7 can be kept at specified temp. by feeding the hot blast of the specified temp. and detective soldering rate due to the temp. ununiformity can be reduced.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は回路基板上に塗布したクリーム半田を加熱溶融
して、電子部品を半田付けするための加熱装置に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a heating device for heating and melting cream solder coated on a circuit board to solder electronic components.

従来の技術 家電製品に代表される様に、プリント基板(以下甲板」
と略記する。)上への電子部品の高密度実装技術におい
て、リフロー炉を用いた素子の半田付工法が採用されつ
つある。ここでは、このリフロー炉による半田付工法を
例に本加熱方法について説明する。リフロー工法は、こ
れまでの溶融ハンダ槽に素子の載ったP板をデイツプす
るフロー工法と異なシ、半田の微細粒子と、ペーストか
ら成るクリーム状半田をP板の所定位置に塗布した後に
素子を置き、赤外線によシ加熱溶融させて、半田付けす
るというものである。
Conventional technology As typified by home appliances, printed circuit boards (hereinafter referred to as decks)
It is abbreviated as ) In high-density mounting technology for electronic components on top of electronic devices, a method of soldering devices using a reflow oven is being adopted. Here, the present heating method will be explained using the soldering method using this reflow oven as an example. The reflow method is different from the conventional flow method in which the P plate with the device mounted on it is dipped in a molten solder bath.The reflow method is different from the conventional flow method in which the P plate with the device mounted on it is dipped in a molten solder bath. It is then heated and melted using infrared rays, and then soldered.

以下図面を参照しながら、上述した従来の基板3ヘーシ 加熱装置の一例について説明する。Below, with reference to the drawings, the conventional board 3 hesi An example of a heating device will be explained.

第3図は、従来の基板加熱装置の概略構成を示す。第3
図において、1はコンベアで、2はP板、3は発熱体、
4は加熱室、5は冷却ファンである。
FIG. 3 shows a schematic configuration of a conventional substrate heating device. Third
In the figure, 1 is a conveyor, 2 is a P plate, 3 is a heating element,
4 is a heating chamber, and 5 is a cooling fan.

加熱室4はトンネル状でかつ内部が水平方向に空洞とな
っており、加熱室4の上部に発熱体3が設置されていて
加熱室4内をP板2搬送用のコンベア1が走行するよう
になっている。
The heating chamber 4 has a tunnel-like shape and is hollow in the horizontal direction. A heating element 3 is installed at the top of the heating chamber 4, and a conveyor 1 for conveying the P plate 2 runs inside the heating chamber 4. It has become.

以上のように構成された基板加熱装置について、以下そ
の動作を説明する。一定速度Vで動くコンベア1上で、
素子を載せたP板2は、一定の熱量を発生し続ける発熱
体3によシ加熱される。炉の前の前半部Aは予熱部で、
通常150℃前後にP板2を暖める。次いでB部で約2
50℃に加熱し、半田付けを行い、その後、冷却ファン
5で冷却ししかしながら上記のような構成では、加熱室
4外の雰囲気からの加熱室4内への逆流あるいは、冷却
ファン5による加熱室4内への大気温度の雰囲気の逆流
等が起とシ、加熱室4内の温度不均一が発生し、部分的
に半田付けができない半田付不良が生じるという問題が
あった。実際、熱電対を高温半田で固着”されたP板2
の温度を測定すると均一性は±4%であった。また、発
熱体3の調整によシ、予熱部Aと半田付は加熱部Bをそ
れぞれ所定の温度に保つことは非常に困難であった。
The operation of the substrate heating device configured as described above will be described below. On conveyor 1 moving at a constant speed V,
The P plate 2 on which the elements are mounted is heated by a heating element 3 that continues to generate a constant amount of heat. The first half A in front of the furnace is the preheating section.
The P plate 2 is usually heated to around 150°C. Then in part B about 2
It is heated to 50° C., soldered, and then cooled by the cooling fan 5. However, in the above configuration, the atmosphere outside the heating chamber 4 flows back into the heating chamber 4, or the cooling fan 5 cools the heating chamber. There is a problem in that the backflow of the atmospheric temperature atmosphere into the heating chamber 4 causes non-uniformity in temperature within the heating chamber 4, resulting in soldering defects in which soldering cannot be performed in some areas. In fact, the P plate 2 to which the thermocouple was fixed with high-temperature solder
When the temperature was measured, the uniformity was ±4%. Furthermore, due to the adjustment of the heating element 3, it was extremely difficult to maintain the preheating section A and the soldering heating section B at predetermined temperatures.

本発明は上記問題点に鑑み、加熱室内の温度均一性を向
上させ、予熱部、半田付は部をそれぞれ所定の温度に保
つ手段を設けることによシ、半田付不良の改善と素子品
質の安定を図ることができ上記問題点を解決するために
本発明の第1の発明は、加熱室において、少なくとも1
ケ所以上熱風を加熱室に供給できる手段と、搬送される
基板を阻止しない範囲で少なくとも1ケ所以上の仕切板
を備えたものである。
In view of the above-mentioned problems, the present invention improves temperature uniformity in the heating chamber and provides means for maintaining the preheating section and the soldering section at predetermined temperatures, thereby improving soldering defects and improving element quality. In order to achieve stability and solve the above problems, the first invention of the present invention provides at least one
The heating chamber is equipped with means for supplying hot air to the heating chamber at more than one location, and at least one partition plate within a range that does not block the substrates being transported.

また、本発明の第2の発明は、加熱室において、搬送さ
れる基板を阻止しない範囲で少なくとも15ヘーノ ケ所以上の仕切板を有し、前記仕切板を境として、前記
加熱室に異なった温度の熱風を供給する手段と、前記仕
切板近傍に排気口を備えたものである。
Further, the second invention of the present invention is characterized in that the heating chamber has at least 15 or more partition plates within a range that does not block the substrate being transported, and the heating chamber has different temperatures separated by the partition plates. and an exhaust port near the partition plate.

作  用 本発明の第1の発明の作用は、一定温度の熱風を加熱室
に供給することによシ、気流の流れとして加熱室内から
加熱室外へと流れ、加熱室外の雰囲気が流れ込むことが
ないため、加熱室内の温度均一化を図ることができる。
Effect The effect of the first aspect of the present invention is that by supplying hot air at a constant temperature to the heating chamber, the air flows from the heating chamber to the outside of the heating chamber as an air current, and the atmosphere outside the heating chamber does not flow into the heating chamber. Therefore, the temperature inside the heating chamber can be made uniform.

また所定の温度の熱風を供給することによシ、所定の温
度に加熱室を保つことができるという効果を有する。
Furthermore, by supplying hot air at a predetermined temperature, it is possible to maintain the heating chamber at a predetermined temperature.

本発明の第2の発明の作用は、加熱室に搬送基板を阻止
しない範囲で仕切板を設け、仕切板を境として、各加熱
室に異なった所定の温度の熱風を供給することによシ、
各加熱室の雰囲気温度を異なった所定の温度に保つこと
ができる。また仕切板を境として、仕切板近傍に排気口
を設けることによシ、各加熱室の所定の雰囲気温度によ
る相互作用を減少させることができ、よシいっそう各加
熱室を所定の温度に保つことができる。
The operation of the second aspect of the present invention is achieved by providing a partition plate in the heating chamber within a range that does not block the substrate to be transported, and supplying hot air at a different predetermined temperature to each heating chamber using the partition plate as a boundary. ,
The ambient temperature in each heating chamber can be maintained at a different predetermined temperature. In addition, by providing an exhaust port near the partition plate, it is possible to reduce the interaction caused by the specified atmospheric temperature of each heating chamber, and to better maintain each heating chamber at the specified temperature. be able to.

6ヘージ 実施例 以下本発明の一実施例の基板加熱装置について、図面を
参照しながら説明する。
Embodiment 6 A substrate heating apparatus according to an embodiment of the present invention will be described below with reference to the drawings.

第1図は本発明の第1の実施例における基板加熱装置を
示すものである。
FIG. 1 shows a substrate heating device according to a first embodiment of the present invention.

第1図において、6は予備加熱室、7は半田付加熱室、
8は仕切板、9は熱風供給口、10は発熱体、11はP
板、12は搬送コンベア、13は冷却ファンである。
In Fig. 1, 6 is a preheating chamber, 7 is a soldering heating chamber,
8 is a partition plate, 9 is a hot air supply port, 10 is a heating element, 11 is P
12 is a conveyor, and 13 is a cooling fan.

以上のように構成された基板加熱装置について、以下そ
の動作を説明する。
The operation of the substrate heating device configured as described above will be described below.

まずクリーム半田を塗布したチップ実装P板11は搬送
コンベア12に載せられ、予備加熱室6に送られ、発熱
体10によって150℃前後に加熱される。次に半田付
加熱室7に送られ、発熱体1゜及び熱風供給口9から供
給される250℃前後の熱風によって、P板は約250
℃に加熱され、最終的には冷却ファン13によって冷却
され、取シ出される。
First, the chip mounting plate 11 coated with cream solder is placed on the conveyor 12, sent to the preheating chamber 6, and heated to around 150° C. by the heating element 10. Next, the P board is heated to approximately 250°C by hot air of around 250°C sent to the soldering heat chamber 7 and supplied from the heating element 1° and the hot air supply port 9.
℃ and finally cooled down by the cooling fan 13 and taken out.

以上のように本実施例によれば、一定温度の熱7ヘー。As described above, according to this embodiment, the heat is kept at a constant temperature of 7 h.

風を加熱室に供給することにょシ、気流の流れとして、
半田付加熱室γ内から半田付加熱室T外へと流れ、半田
付加熱室T内へ外気が流れ込むことがないため、半田付
加熱室内の温度均一化を図ることができる。また所定の
温度の熱風を供給することにより、所定の温度に半田付
加熱室7を保つことができ、温度不均一による半田不良
率を低減することができる。
In order to supply wind to the heating chamber, as an air flow,
Since outside air flows from inside the soldering heat chamber γ to outside the soldering heat chamber T and does not flow into the soldering heat chamber T, the temperature inside the soldering heat chamber T can be made uniform. Further, by supplying hot air at a predetermined temperature, the soldering heat chamber 7 can be maintained at a predetermined temperature, and the solder failure rate due to temperature non-uniformity can be reduced.

実際、P板11に熱電対を高温半田に固着して温度を測
定すると、均一性は±1.5%に向上した。
In fact, when the temperature was measured by fixing a thermocouple to the P plate 11 with high-temperature solder, the uniformity improved to ±1.5%.

次に、本発明の第2の実施例について、図面を参照しな
がら説明する。
Next, a second embodiment of the present invention will be described with reference to the drawings.

第2図は本発明の第2の実施例における基板加熱装置を
示すものである。
FIG. 2 shows a substrate heating device according to a second embodiment of the present invention.

第2図において、14は予備加熱室、15は半田付加熱
室、16は仕切板、17は第一熱風供給口、18は第二
熱風供給口、19は発熱体、2゜はP板、21は搬送コ
ンベア、22は冷却ファン、23は上部排気口、24は
下部排気口である。
In FIG. 2, 14 is a preheating chamber, 15 is a soldering heat chamber, 16 is a partition plate, 17 is a first hot air supply port, 18 is a second hot air supply port, 19 is a heating element, 2° is a P plate, 21 is a conveyor, 22 is a cooling fan, 23 is an upper exhaust port, and 24 is a lower exhaust port.

以上のように構成された基板加熱装置について、以下そ
の動作を説明する。
The operation of the substrate heating device configured as described above will be described below.

まずクリーム半田を塗布したチップ実装P板2゜は、搬
送コンベア21に載せられ、予備加熱室14に送られる
。発熱体19及び、第二熱風供給口18から供給される
約150 ’c 1m/sの熱風によって予備加熱室1
4内には、約150℃前後の雰囲気の均熱ゾーンが形成
されておシ、P板2oも、予備加熱室14内で約150
℃に均一に加熱される。
First, the chip mounting P board 2° coated with cream solder is placed on the conveyor 21 and sent to the preheating chamber 14. The preheating chamber 1 is heated by the heating element 19 and hot air of about 150'c 1m/s supplied from the second hot air supply port 18.
In the preheating chamber 14, a soaking zone with an atmosphere of about 150°C is formed.
heated evenly to ℃.

次に半田付加熱室15に搬送され、発熱体19及び、第
一熱風供給口17から供給される約230℃。
Next, the temperature of about 230° C. is transferred to the soldering heat chamber 15 and supplied from the heating element 19 and the first hot air supply port 17 .

1m/sの熱風によって形成された均熱ゾーン内で、P
板20は約250℃に加熱される。その後、冷却ファン
22で冷却され取シ出される。また、予備加熱室14と
半田付加熱室15の各々に異なった温度の熱風を供給し
ているため、互いの雰囲気の影響を少なくするために、
上部排気口23(排気速度0.5m/sと下部排気口2
4(排気速度0.5m/s )で排気を行なっている。
In the soaking zone formed by hot air of 1 m/s, P
Plate 20 is heated to approximately 250°C. Thereafter, it is cooled by the cooling fan 22 and taken out. In addition, since hot air of different temperatures is supplied to each of the preheating chamber 14 and the soldering heat chamber 15, in order to reduce the influence of each other's atmosphere,
Upper exhaust port 23 (exhaust speed 0.5 m/s and lower exhaust port 2
4 (exhaust speed 0.5 m/s).

以上のように本実施例によれば、予備加熱室14と半田
付加熱室15の間に仕切板16を設け、予9ヘーシ 偏加熱室14と半田付加熱室15にそれぞれに異なった
所定の温度の熱風を供給することにょ9、各加熱室の雰
囲気温度を異なった所定の温度に保つことができ、まだ
熱風送風の効果により均熱な領域を拡大することができ
る。まだ、仕切板1θを境として、仕切板16近傍に上
部排気口23と下部排気口24を設けることにょシ、予
熱加熱室14と半田付加熱室15の所定の雰囲気温度に
よる相互作用を減少させることができ、よシいっそう加
熱室を所定の温度に保つことができる。
As described above, according to this embodiment, the partition plate 16 is provided between the preheating chamber 14 and the soldering heat chamber 15, and the preheating chamber 14 and the soldering heat chamber 15 have different predetermined values. By supplying hot air at a certain temperature, the ambient temperature in each heating chamber can be maintained at a different predetermined temperature, and the uniformly heated area can be expanded due to the effect of blowing hot air. However, by providing the upper exhaust port 23 and the lower exhaust port 24 in the vicinity of the partition plate 16 with the partition plate 1θ as the boundary, interaction between the preheating chamber 14 and the soldering heating chamber 15 due to the predetermined ambient temperature is reduced. This makes it possible to better maintain the heating chamber at a predetermined temperature.

次に、本発明の第3の実施例について、図面を参照しな
がら説明する。
Next, a third embodiment of the present invention will be described with reference to the drawings.

第3の実施例における基板加熱装置は、第2の実施例の
第2図と全く同じ構造であり、違うのは、上部排気口2
3の排気速度は0.2 m/s、下部排気口24の排気
速度は0.8m/sであることである。
The substrate heating device in the third embodiment has exactly the same structure as that in FIG. 2 of the second embodiment, except that the upper exhaust port 2
The exhaust speed of No. 3 is 0.2 m/s, and the exhaust speed of the lower exhaust port 24 is 0.8 m/s.

この場合の基板加熱装量について、以下その動作を説明
する。
The operation of the substrate heating amount in this case will be explained below.

動作は第2の実施例と同じであるが、違うのは、第一熱
風供給口1了(温度230℃、流入速度110・\−7 m/s )と第二熱風供給口18(温度150℃、流入
速度1rn//s)から供給される熱風の気流流れを乱
さないため、上部排気口22の排気速度を0.2m/s
 、下部排気口24の排気速度をQ、8rV′Sとした
ことにある。
The operation is the same as the second embodiment, but the difference is that the first hot air supply port 1 (temperature 230°C, inflow velocity 110·\-7 m/s) and the second hot air supply port 18 (temperature 150°C) The exhaust speed of the upper exhaust port 22 was set to 0.2 m/s in order not to disturb the air flow of hot air supplied from the inflow speed of 1rn//s).
, the exhaust speed of the lower exhaust port 24 is set to Q, 8rV'S.

以上のように第3の実施例について、予備加熱室14と
半田付加熱室15の間に仕切板を設け、予備加熱室14
と半田加熱室15それぞれに異なった所定の温度の熱風
を供給することによシ、各加熱室の雰囲気温度を異なっ
た所定の温度に保つことができ、また熱風送風の効果に
よシ均熱な領域を拡大することができる。また仕切板1
6を境として、仕切板16近傍に上部排気口23と下部
排気口24を設け、上部排気口23の排気速度より下部
排気口24の排気速度を大きくすることによシ、供給さ
れた熱風の流れを乱すことなく、予備加熱室14と半田
付加熱室15の所定の雰囲気温度による相互作用を減少
させることができ、よシいっそう予備加熱室14と半田
付加熱室15をそれぞれ所定の温度に保つことができる
As described above, in the third embodiment, a partition plate is provided between the preheating chamber 14 and the soldering heat chamber 15, and the preheating chamber 14
By supplying hot air at different predetermined temperatures to each of the solder heating chambers 15 and 15, the ambient temperature of each heating chamber can be maintained at a different predetermined temperature, and the hot air blowing effect can evenly heat the heating chambers. It is possible to expand the area. Also, partition plate 1
6, an upper exhaust port 23 and a lower exhaust port 24 are provided in the vicinity of the partition plate 16, and by making the exhaust speed of the lower exhaust port 24 higher than the exhaust speed of the upper exhaust port 23, the supplied hot air can be It is possible to reduce the interaction between the preheating chamber 14 and the soldering heat chamber 15 due to the predetermined atmospheric temperatures without disturbing the flow, and it is possible to further reduce the interaction between the preheating chamber 14 and the soldering heat chamber 15 at the predetermined temperatures. can be kept.

11ヘーノ なお、本発明の第二及び第三の実施例において、上部排
気口23と下部排気口24としたが、下部排気口24の
みでも良い。
In the second and third embodiments of the present invention, the upper exhaust port 23 and the lower exhaust port 24 are provided, but only the lower exhaust port 24 may be used.

又、本発明の発熱体10.19は上部のみとしたが、上
下両数から加熱しても良い。
Further, although the heating elements 10 and 19 of the present invention are used only from the upper part, heating may be performed from both the upper and lower parts.

又、本発明の第一、第二及び第三の実施例において、P
板冷却用に冷却ファン13.22を取シ付けたが、無く
ても良い。
Furthermore, in the first, second and third embodiments of the present invention, P
Cooling fans 13 and 22 are installed to cool the board, but they do not need to be provided.

また、これまで基板のりフロー半田付けを例に説明した
が、この内容は一般の任意の基板加熱に適用できること
は言うまでもない。
Further, although the explanation has been given using board glue flow soldering as an example, it goes without saying that this content can be applied to heating any general board.

発明の効果 以上述べたように、本発明の第1の発明によれば、一定
の温度の熱風を加熱室に供給することにより、気流の流
れとして加熱室内から加熱室外へと流れ、加熱室外の雰
囲気が流れ込むことがないため、加熱室内の温度均一化
を図ることができる。
Effects of the Invention As described above, according to the first aspect of the present invention, by supplying hot air at a constant temperature to the heating chamber, the air flows from the heating chamber to the outside of the heating chamber as a flow of air, and the air outside the heating chamber is heated. Since the atmosphere does not flow in, the temperature inside the heating chamber can be made uniform.

また所定の温度の熱風を供給することによシ、所定の温
度に加熱室を保つことができ、その効果は大なるもので
ある。
Furthermore, by supplying hot air at a predetermined temperature, the heating chamber can be maintained at a predetermined temperature, which is highly effective.

また本発明の第2の発明によれば、加熱室に搬送基板を
阻止しない範囲で仕切板を設け、仕切板を境として、各
加熱室に異なった所定の温度の熱風を供給することによ
シ、各加熱室の雰囲気温度を異なった所定の温度に保つ
ことができる。また仕切板を境として、仕切板近傍に排
気口を設けることにより、各加熱室の所定の雰囲気温度
による相互作用を減少させることができ、よシいっそう
各加熱室を所定の温度に保つことができる。
According to the second aspect of the present invention, a partition plate is provided in the heating chamber within a range that does not block the substrate to be transported, and hot air of a different predetermined temperature is supplied to each heating chamber with the partition plate as a boundary. Second, the ambient temperature in each heating chamber can be maintained at a different predetermined temperature. In addition, by providing an exhaust port near the partition plate, it is possible to reduce the interaction caused by the predetermined atmospheric temperature of each heating chamber, making it possible to maintain each heating chamber at a predetermined temperature. can.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第一の実施例における基板加熱装置の
断面図、第2図は本発明の第二の実施例における基板加
熱装置の断面図、第3図は従来の基板加熱装量の断面図
である。 6.14・−・・・・予備加熱室、7,15・・・・−
・半田加熱室、8,16・・・・・・仕切板、9・・・
・・・熱風供給口、17・・・・・・第一熱風供給口、
18・・・・・・第二熱風供給口、10,19・・・・
・・発熱体、11.20・・・・・・P板、12.21
・・・・・・搬送コンベア、23・・・・・・上部排気
口、24・・・・・・下部排気口。
FIG. 1 is a cross-sectional view of a substrate heating device according to a first embodiment of the present invention, FIG. 2 is a cross-sectional view of a substrate heating device according to a second embodiment of the present invention, and FIG. 3 is a conventional substrate heating device. FIG. 6.14...- Preheating chamber, 7,15...-
・Solder heating chamber, 8, 16... Partition plate, 9...
...Hot air supply port, 17...First hot air supply port,
18...Second hot air supply port, 10,19...
...Heating element, 11.20... P plate, 12.21
...Transportation conveyor, 23...Top exhaust port, 24...Bottom exhaust port.

Claims (3)

【特許請求の範囲】[Claims] (1)加熱手段を有したトンネル状の加熱室と、基板を
前記加熱室内で搬送することができる手段とを有した基
板加熱装置において、少なくとも1ケ所以上熱風を前記
加熱室内に供給できる手段と、搬送される前記基板を阻
止しない範囲で少なくとも1ヶ所以上のを有することを
特徴とする基板加熱装置。
(1) In a substrate heating apparatus having a tunnel-shaped heating chamber having heating means and means capable of transporting a substrate within the heating chamber, means capable of supplying hot air into the heating chamber at least at one or more locations; . A substrate heating device characterized in that it has at least one or more locations within a range that does not block the substrate being transported.
(2)加熱手段を有したトンネル状の加熱室と、基板を
前記加熱室内で搬送することができる手段とを有した基
板加熱装置において、搬送される前記基板を阻止しない
範囲で少なくとも1ヶ所以上の仕切板を有し、前記仕切
板を境として、各前記加熱室に異なった温度の熱風を供
給する手段と、前記仕切板近傍に排気口を有することを
特徴とする基板加熱装置
(2) In a substrate heating apparatus having a tunnel-shaped heating chamber having a heating means and means capable of transporting the substrate within the heating chamber, at least one or more locations are provided within a range that does not block the substrate being transported. A substrate heating device comprising a partition plate, means for supplying hot air at different temperatures to each of the heating chambers with the partition plate as a boundary, and an exhaust port near the partition plate.
(3)仕切板近傍の排気口の位置が、少なくとも一ヶ所
以上熱風供給側と反対側にあることを特徴とする特許請
求の範囲第2項記載の基板加熱装置。
(3) The substrate heating device according to claim 2, wherein at least one exhaust port near the partition plate is located on the side opposite to the hot air supply side.
JP63005150A 1988-01-13 1988-01-13 Substrate heating device Expired - Fee Related JPH0751273B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63005150A JPH0751273B2 (en) 1988-01-13 1988-01-13 Substrate heating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63005150A JPH0751273B2 (en) 1988-01-13 1988-01-13 Substrate heating device

Publications (2)

Publication Number Publication Date
JPH01181966A true JPH01181966A (en) 1989-07-19
JPH0751273B2 JPH0751273B2 (en) 1995-06-05

Family

ID=11603248

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63005150A Expired - Fee Related JPH0751273B2 (en) 1988-01-13 1988-01-13 Substrate heating device

Country Status (1)

Country Link
JP (1) JPH0751273B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0440569U (en) * 1990-08-04 1992-04-07
JPH0498364U (en) * 1990-08-13 1992-08-25
CN111442641A (en) * 2019-01-16 2020-07-24 日本碍子株式会社 Heat treatment furnace

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS614870U (en) * 1984-06-08 1986-01-13 千住金属工業株式会社 reflow oven
JPS63278668A (en) * 1987-05-11 1988-11-16 Eiteitsuku Tekutoron Kk Reflow soldering device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS614870U (en) * 1984-06-08 1986-01-13 千住金属工業株式会社 reflow oven
JPS63278668A (en) * 1987-05-11 1988-11-16 Eiteitsuku Tekutoron Kk Reflow soldering device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0440569U (en) * 1990-08-04 1992-04-07
JPH0498364U (en) * 1990-08-13 1992-08-25
CN111442641A (en) * 2019-01-16 2020-07-24 日本碍子株式会社 Heat treatment furnace
JP2020112336A (en) * 2019-01-16 2020-07-27 日本碍子株式会社 Heat treatment furnace
CN111442641B (en) * 2019-01-16 2023-09-19 日本碍子株式会社 heat treatment furnace
TWI839439B (en) * 2019-01-16 2024-04-21 日商日本碍子股份有限公司 Heat treatment furnace

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