JPH01181450A - Resin sealed semiconductor device - Google Patents
Resin sealed semiconductor deviceInfo
- Publication number
- JPH01181450A JPH01181450A JP259888A JP259888A JPH01181450A JP H01181450 A JPH01181450 A JP H01181450A JP 259888 A JP259888 A JP 259888A JP 259888 A JP259888 A JP 259888A JP H01181450 A JPH01181450 A JP H01181450A
- Authority
- JP
- Japan
- Prior art keywords
- tab
- resin
- shape
- curved
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011347 resin Substances 0.000 title claims abstract description 45
- 229920005989 resin Polymers 0.000 title claims abstract description 45
- 239000004065 semiconductor Substances 0.000 title claims description 25
- 239000002131 composite material Substances 0.000 claims description 14
- 238000007789 sealing Methods 0.000 claims description 5
- 239000000853 adhesive Substances 0.000 abstract description 11
- 238000004299 exfoliation Methods 0.000 abstract 1
- 230000001070 adhesive effect Effects 0.000 description 10
- 230000000694 effects Effects 0.000 description 5
- 230000002093 peripheral effect Effects 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000000452 restraining effect Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、樹脂封止盛半導体装置において、装置の構造
に係り。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to the structure of a resin-sealed semiconductor device.
籍に、はんだリフロー時に発生する樹脂クラックの防止
に好適な、同装置の構造技術に関する。In particular, it relates to a structural technology for the same device suitable for preventing resin cracks that occur during solder reflow.
〔従来の技術」
ICパッケージを、高温・高湿環境中で保存すると、N
止した樹脂が水分を収収し、はんだ付は加熱(リフロー
)時にタブと樹脂の界面にはく離が生じ、この空間で水
分が蒸気となり、それによる圧力で第7図、第8図に示
すようにタブFコーナ部にクラック8が生じる。このは
く離を防止するために、タブの反素子搭載面に凸凹7や
溝、穴等を設け、同界面の接層強さを向上させる。なお
。[Conventional technology] When an IC package is stored in a high temperature and high humidity environment, N
The resin that has stopped absorbs moisture, and during soldering, during heating (reflow), peeling occurs at the interface between the tab and the resin, and the moisture turns into steam in this space, and the resulting pressure causes the soldering to occur as shown in Figures 7 and 8. A crack 8 appears at the corner of the tab F. In order to prevent this peeling, unevenness 7, grooves, holes, etc. are provided on the surface of the tab opposite to the element mounting surface to improve the contact strength of the same interface. In addition.
この種の装置として関連するものには例えば特開昭58
−199548.同60−186044号各公報等が挙
げられる。Related devices of this type include, for example, Japanese Unexamined Patent Publication No. 58
-199548. 60-186044 and the like.
〔発明が解決しようとする課題J
上記従来技術は、タブと樹脂との接着面内の変位を拘束
する効果はめるものの1両者を引き離す方向の変位につ
いて配慮がなさnておらず、凹部に入り込んだ樹脂が抜
けるか、るるいはその部分からちぎれるという問題があ
った。[Problem to be Solved by the Invention J] Although the above-mentioned prior art has the effect of restraining the displacement within the adhesive surface between the tab and the resin, it does not take into consideration the displacement in the direction of separating the two, and the tab may enter the recess. There was a problem that the resin would come off or the rurui would tear off from that part.
本発明の目的は、同従来技術の入点を克服し。The object of the present invention is to overcome the disadvantages of the prior art.
蒸気圧によシ生じるクラックを防止することにある。The purpose is to prevent cracks caused by steam pressure.
上記目的は、タブ下方の樹脂を、中央部において周辺部
よりも素子に近い工うな湾曲形状とすることにより、達
成される。The above object is achieved by making the resin below the tab into a curved shape such that the central portion is closer to the element than the peripheral portion.
本願第1着目の発明は、半導体素子と、これを搭載する
ためのタブとリードフレームの集合体を備え、これらを
樹脂で封止することにより成形した樹脂封止盛半導体装
置において、装置において、タブ下面と装置下面の形状
を、タブ中央部において素子に近く。The first invention of the present application is a resin-sealed semiconductor device comprising a semiconductor element, an assembly of a tab and a lead frame for mounting the semiconductor element, and molded by sealing these with resin. The bottom surface of the tab and the bottom surface of the device are shaped close to the device at the center of the tab.
同周辺部において素子から遠い曲面、もしくは平面の合
成形、もしくは曲面と平面の合成形にしたことを特徴と
する。この際タグ下面と装置下面の形状を1球面にする
ことが好lしい。またタブ下面と装置下面の形状を1円
筒形にすることが好ましい。It is characterized by having a curved surface far from the element in the same periphery, a composite shape of a flat surface, or a composite shape of a curved surface and a flat surface. At this time, it is preferable that the shape of the lower surface of the tag and the lower surface of the device be one spherical surface. Further, it is preferable that the bottom surface of the tab and the bottom surface of the device have a cylindrical shape.
本願第2番目の発明は、半導体系子と、これを搭載する
ためのタブとリードフレームの集合体を備え、これらを
樹脂で封止することにより成形した樹脂封止盛半導体装
置において、装置において、タブ下面の樹脂中に、下面
の形状が中央部において素子に近く。The second invention of the present application is a resin-sealed semiconductor device comprising a semiconductor device, an assembly of a tab and a lead frame for mounting the same, and molded by sealing these with resin. , the shape of the bottom surface is close to the element in the center of the resin on the bottom surface of the tab.
周辺部において素子から遠い曲面、もしくは平面の合成
形、もしくは曲面と平面の合成形の板を設け、さらに装
置下面の形状を、前述の板の中央部において素子に近く
、同周辺部において素子から遠い曲面、もしくは平面の
合成形、もしくは曲面好ましい。A curved surface far from the element, a composite plate of a flat surface, or a composite plate of a curved surface and a flat surface are provided in the peripheral part, and the shape of the bottom surface of the device is changed so that the central part of the plate is close to the element and the peripheral part is away from the element. Preferably a distant curved surface, a composite shape of a plane, or a curved surface.
本願第3番目の発明は、半導体素子とこれを搭載するた
めのタブとリードフレームの集合体を備え、これらを樹
脂で封止することにょシ成形した樹脂封止盛半導体装置
において、装置において、装置ド面とタブρ為らリード
にかけその形状を、タブ中央部において素子に近く、同
周辺部において素子から遠い連続的な曲面、もしくは平
面の合成形、もしくは曲面や平面の合成形にすることを
特徴とする。この際、装置下面とタブからリードにかけ
ての形状を、球面にすることが好1しく、また、装置下
面とタブからリードにかけての形状を1円筒形にするこ
とが好ましい。The third invention of the present application is a resin-sealed semiconductor device comprising a semiconductor element, an assembly of a tab for mounting the same, and a lead frame, and in which these are molded to be sealed with resin. The device surface and the tab ρ are connected to the lead so that its shape is a continuous curved surface that is close to the element at the center of the tab and far from the element at the periphery, or a composite shape of flat surfaces, or a composite shape of curved surfaces and flat surfaces. It is characterized by At this time, it is preferable that the bottom surface of the device and the area from the tab to the lead be spherical, and it is also preferable that the bottom surface of the device and the area from the tab to the lead be cylindrical.
〔作用」
タブ下コーナ部の樹脂クラックは、タグ下面と樹脂との
界面のはく離、及びこの部分に発生する蒸気圧による膨
張により、タブ下コーナ部に過大な引張16カが生じる
ために起こる現象である。[Operation] Resin cracks at the bottom corner of the tab are a phenomenon that occurs due to excessive tensile force being generated at the bottom corner of the tab due to peeling at the interface between the bottom surface of the tag and the resin and expansion due to the vapor pressure generated in this area. It is.
本発明でタブ下面の樹脂を湾曲させたことにより、ダム
のアーチと同様の原理で、上部からの圧力に対し、樹脂
に生じる引vi応カが小さくなるので、従来の平面形よ
りも耐圧強度が向上し、ざらに界面の膨張を抑制できる
。よって、同界面における樹脂クラックを防止すること
ができる。By curving the resin on the bottom surface of the tab in the present invention, based on the same principle as the arch of a dam, the tensile stress generated in the resin against pressure from above is reduced, so it has higher pressure resistance than the conventional flat type. It is possible to roughly suppress the expansion of the interface. Therefore, resin cracks at the same interface can be prevented.
以下1本発明の実施例を、図を用いて説明する。 An embodiment of the present invention will be described below with reference to the drawings.
ag1図は1本発明の第1実施例の断面図である。Figure ag1 is a sectional view of a first embodiment of the present invention.
湾曲したタブ3aの上面に接着剤2を介し、素子lを搭
載しである。これらを、下部に湾曲部5aを設けた樹脂
5によって封止したものである。The element 1 is mounted on the upper surface of the curved tab 3a via the adhesive 2. These are sealed with a resin 5 having a curved portion 5a at the bottom.
第2図は、本発明の第2実施例の断面図である。FIG. 2 is a sectional view of a second embodiment of the invention.
接着剤2を介して上部に素子lを搭載したタブ3の下面
に、湾曲した板6aを設け、両者を接層剤2aにて接着
しである。これらを、下部に湾曲部5aを設けた樹脂5
によって封止したものである。A curved plate 6a is provided on the lower surface of the tab 3 on which the element 1 is mounted via the adhesive 2, and both are bonded together using the adhesive 2a. These are assembled into a resin 5 with a curved portion 5a at the bottom.
It is sealed by.
なお、この際に接着剤2aは省略し、樹脂5を充てんし
てもよい。Note that, at this time, the adhesive 2a may be omitted and the resin 5 may be filled.
上記2実施例によれば、タブ下方の樹脂が湾曲している
ので、タブと樹脂との界面で発生する蒸気圧に対する樹
脂の強度を向上させる効果がある。According to the above two embodiments, since the resin below the tab is curved, there is an effect of improving the strength of the resin against the vapor pressure generated at the interface between the tab and the resin.
第3図は1本発明の第3実施例の断面図である。FIG. 3 is a sectional view of a third embodiment of the present invention.
タブ3aからリード4の湾曲部4aにかけての形状を、
連続的な曲面で構成し、タブ3aの上面に接着剤2を介
して素子1を搭載しである。これらを、下部に湾曲部5
at−設けた樹脂5で封止したものである。なお、リー
ド4における湾曲部4aの及ぶ範囲は限定しない。The shape from the tab 3a to the curved part 4a of the lead 4 is as follows:
It is composed of a continuous curved surface, and the element 1 is mounted on the upper surface of the tab 3a via an adhesive 2. These curved parts 5 at the bottom.
It is sealed with the resin 5 provided at-. Note that the range of the curved portion 4a of the lead 4 is not limited.
本実施例によれば、タブからリードにかけての形状を連
続的な曲面で構成しであるため、前述した2実施例よシ
も樹脂の曲面の及ぶ範囲が広くなり、樹脂の強度を向上
させることができる。According to this embodiment, since the shape from the tab to the lead is constituted by a continuous curved surface, the range covered by the curved surface of the resin is wider than in the above-mentioned two embodiments, and the strength of the resin is improved. Can be done.
以下、第4図、第5図、第6図に1本発明の第4、第5
.第6実施例の素子、接着剤、及びタブの断面図を示す
。Hereinafter, FIGS. 4, 5, and 6 show the fourth and fifth aspects of the present invention.
.. A cross-sectional view of the element, adhesive, and tab of the sixth example is shown.
第4図は、タブの周辺部に%湾曲形状の頂上部と同じ高
さの折り曲げ部3bt−設けたものである。In FIG. 4, a bent portion 3bt having the same height as the top portion of the curved shape is provided at the periphery of the tab.
第5図は、タブの周辺部に、fIj曲形状の頂上部と同
じ高さの突起3Cを設は友ものでるる。In FIG. 5, a protrusion 3C having the same height as the top of the fIj curved shape is provided on the periphery of the tab.
第6図は、タブの中央部に平面部を設け1周辺部につい
てのみ曲面形状としたものである。なお、この際に周辺
部についても必ずしも曲面形状とする必要はなく、装置
下方に向けて傾斜した平面で構成してもよい。In FIG. 6, a flat portion is provided at the center of the tab, and only one peripheral portion is curved. In this case, the peripheral portion does not necessarily have to have a curved surface shape, but may be configured as a flat surface that is inclined toward the bottom of the device.
以上3実施例は、素子を搭載する際の精度やその後の安
定性の向上、及び接層剤の流出防止等を考慮した例で、
前述した第1.第2.第3の各実施例のいずれにも共通
する。The above three embodiments are examples that take into consideration the accuracy of mounting the element, the improvement of the subsequent stability, and the prevention of the outflow of the adhesive.
The above-mentioned 1. Second. This is common to all of the third embodiments.
上記のタブ、あるいはタブ下面に設けられた板とリード
、及び樹脂下面の湾曲形状には、大別して第8図、第9
図に示す2種類に分けられる。The above-mentioned tabs, the plates and leads provided on the bottom surface of the tabs, and the curved shape of the bottom surface of the resin are roughly classified into Figs. 8 and 9.
It can be divided into two types as shown in the figure.
第8図は円筒形をしておシ、細長い形状をした半導体装
置(SOP、SOJ等)において、装置短辺方向につい
て湾曲させることによシ、その曲率を小さくすることが
可能となる之め、著しい効果がある。Figure 8 shows that in a cylindrical, elongated semiconductor device (SOP, SOJ, etc.), it is possible to reduce the curvature of the device by curving it in the direction of the short side of the device. , has a significant effect.
本実施例によれば、比較的正方形に近い形状をした半導
体装置CMSP、PPP等)に適用することにより、各
辺について均等の効果t−Sけることができる。According to this embodiment, by applying it to a semiconductor device (CMSP, PPP, etc.) having a shape relatively close to a square, it is possible to obtain an equal effect t-S on each side.
本発明によれば、タブ下面と樹脂との界面から下向きに
作用する蒸気圧による樹脂の引張応力の低減と、同界面
の膨張を抑制できるので、それらに伴う樹脂クラックの
発生を防止する効果がある。According to the present invention, it is possible to reduce the tensile stress of the resin due to the vapor pressure acting downward from the interface between the bottom surface of the tab and the resin, and to suppress the expansion of the same interface, so that it is possible to prevent the occurrence of resin cracks due to this. be.
第1図は本発明の第1実施例の装置短辺方向断面図、第
2図は同第2実施例の同断面図、第3図は同第3実施例
の同断面図、第4図は同第4実施例の素子、接層剤、及
びタブの装置短辺方向断面図、第5図は同第5実施例の
同断面図、第6図は同第6実施例の同断面図で、第7図
、第8図は従来の半導体装置の樹脂クランク発生の状況
を示す断面図、第9図、第10図は本発明に適用される
タブのその他の形状例を示す斜視図である。
1・・・半導体素子+ 2 、2 a・・・接着剤、3
・・・タブ。
3a・・・本発明による湾曲タブ、3b・・・同タブ折
り曲げ部、3C・・・同タブ突起部、3d・・・タブ平
面部。
4・・・リード%4a・・・本発明によるリード湾曲部
、5・・・樹脂、5a・・・本発明による樹脂湾曲部、
6a・・・同湾曲板、7・・・タブ下面凸凹、8・・・
樹脂クラック。FIG. 1 is a cross-sectional view in the short side direction of the device according to the first embodiment of the present invention, FIG. 2 is a cross-sectional view of the second embodiment, FIG. 3 is a cross-sectional view of the third embodiment of the present invention, and FIG. 5 is a cross-sectional view of the element, adhesive, and tab of the fourth embodiment in the short side direction of the device, FIG. 5 is a cross-sectional view of the fifth embodiment, and FIG. 6 is a cross-sectional view of the sixth embodiment. 7 and 8 are cross-sectional views showing how resin cranks occur in conventional semiconductor devices, and FIGS. 9 and 10 are perspective views showing examples of other shapes of tabs applied to the present invention. be. 1... Semiconductor element + 2, 2 a... Adhesive, 3
···tab. 3a...Curved tab according to the present invention, 3b...Tab bent portion, 3C...Tab protrusion, 3d...Tab flat portion. 4... Lead % 4a... Lead curved part according to the present invention, 5... Resin, 5a... Resin curved part according to the present invention,
6a...Same curved plate, 7...Tab bottom surface unevenness, 8...
Resin crack.
Claims (1)
フレームの集合体を備え、これらを樹脂で封止すること
により成形した樹脂封止型半導体装置において、タブ下
面と装置下面の形状を、タブ中央部において素子に近く
、同周辺部において素子から遠い曲面、もしくは平面の
合成形、もしくは曲面と平面の合成形にしたことを特徴
とする樹脂封止型半導体装置。 2、半導体素子と、これを搭載するためのタブとリード
フレームの集合体を備え、これらを樹脂で封止すること
により成形した樹脂封止型半導体装置において、タブ下
面の樹脂中に、下面の形状が中央部において素子に近く
、周辺部において素子から遠い曲面、もしくは平面の合
成形もしくは曲面と平面の合成形の板を設け、さらに装
置下面の形状を、前述の板の中央部において素子に近く
、同周辺部において素子から遠い曲面、もしくは平面の
合成形、もしくは曲面と平面の合成形にしたことを特徴
とする樹脂封止型半導体装置。 3、半導体素子と、これを搭載するためのタブとリード
フレームの集合体を備え、これらを樹脂で封止すること
により成形した樹脂封止盛半導体装置において、装置下
面とタブからリードにかけての形状を、タブ中央部にお
いて素子に近く、同周辺部において素子から遠い連続的
な曲面、もしくは平面の合成形、もしくは曲面や平面の
合成形にしたことを特徴とする樹脂封止型半導体装置。[Claims] 1. A resin-sealed semiconductor device comprising a semiconductor element, an assembly of a tab and a lead frame for mounting the semiconductor element, and molded by sealing these with resin. A resin-sealed semiconductor device characterized in that the shape of the lower surface of the device is a curved surface that is close to the element at the center of the tab and far from the element at the periphery, or a composite shape of a flat surface, or a composite shape of a curved surface and a flat surface. 2. In a resin-sealed semiconductor device that includes a semiconductor element, an assembly of a tab and a lead frame for mounting the semiconductor element, and is molded by sealing these with resin, a resin on the bottom surface of the tab is contained in the resin on the bottom surface of the tab. A plate with a shape close to the element at the center and far from the element at the periphery, or a composite shape of a flat surface or a composite shape of a curved surface and a flat surface is provided, and the shape of the bottom surface of the device is changed to the shape of the element at the center of the aforementioned plate. 1. A resin-sealed semiconductor device characterized in that it has a curved surface or a flat surface that is far from an element in the same periphery, or a composite shape of a curved surface and a flat surface. 3. In a resin-sealed semiconductor device that includes a semiconductor element, an assembly of tabs and lead frames for mounting the semiconductor element, and is molded by sealing these with resin, the shape of the bottom surface of the device and from the tab to the lead A resin-sealed semiconductor device characterized in that the tab has a composite shape of a continuous curved surface or a flat surface, or a composite shape of a curved surface or a flat surface, close to the element at the center of the tab and far from the element at the periphery.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP259888A JPH01181450A (en) | 1988-01-11 | 1988-01-11 | Resin sealed semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP259888A JPH01181450A (en) | 1988-01-11 | 1988-01-11 | Resin sealed semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01181450A true JPH01181450A (en) | 1989-07-19 |
Family
ID=11533823
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP259888A Pending JPH01181450A (en) | 1988-01-11 | 1988-01-11 | Resin sealed semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01181450A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6101101A (en) * | 1998-05-28 | 2000-08-08 | Sampo Semiconductor Corporation | Universal leadframe for semiconductor devices |
JP2011003680A (en) * | 2009-06-18 | 2011-01-06 | Hitachi Automotive Systems Ltd | Electronic circuit sealing device |
WO2022195757A1 (en) * | 2021-03-17 | 2022-09-22 | 三菱電機株式会社 | Semiconductor device and method for producing semiconductor device |
-
1988
- 1988-01-11 JP JP259888A patent/JPH01181450A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6101101A (en) * | 1998-05-28 | 2000-08-08 | Sampo Semiconductor Corporation | Universal leadframe for semiconductor devices |
JP2011003680A (en) * | 2009-06-18 | 2011-01-06 | Hitachi Automotive Systems Ltd | Electronic circuit sealing device |
WO2022195757A1 (en) * | 2021-03-17 | 2022-09-22 | 三菱電機株式会社 | Semiconductor device and method for producing semiconductor device |
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