JPH01175351U - - Google Patents
Info
- Publication number
- JPH01175351U JPH01175351U JP6947188U JP6947188U JPH01175351U JP H01175351 U JPH01175351 U JP H01175351U JP 6947188 U JP6947188 U JP 6947188U JP 6947188 U JP6947188 U JP 6947188U JP H01175351 U JPH01175351 U JP H01175351U
- Authority
- JP
- Japan
- Prior art keywords
- counting
- counted
- equal
- foreign matter
- predetermined value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6947188U JPH01175351U (enExample) | 1988-05-26 | 1988-05-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6947188U JPH01175351U (enExample) | 1988-05-26 | 1988-05-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01175351U true JPH01175351U (enExample) | 1989-12-13 |
Family
ID=31294749
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6947188U Pending JPH01175351U (enExample) | 1988-05-26 | 1988-05-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01175351U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997043623A1 (en) * | 1996-05-10 | 1997-11-20 | Komatsu Ltd. | Defect detecting apparatus and method |
-
1988
- 1988-05-26 JP JP6947188U patent/JPH01175351U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997043623A1 (en) * | 1996-05-10 | 1997-11-20 | Komatsu Ltd. | Defect detecting apparatus and method |
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