JPH01154620A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- JPH01154620A JPH01154620A JP62313512A JP31351287A JPH01154620A JP H01154620 A JPH01154620 A JP H01154620A JP 62313512 A JP62313512 A JP 62313512A JP 31351287 A JP31351287 A JP 31351287A JP H01154620 A JPH01154620 A JP H01154620A
- Authority
- JP
- Japan
- Prior art keywords
- input
- inverter
- integrated circuit
- input terminal
- pull
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims description 11
- 241001508691 Martes zibellina Species 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
Landscapes
- Logic Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Electronic Switches (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体集積回路に関し、特に集積回路の入力端
子のプルアップあるいはプルダウンを行う半導体集積回
路に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor integrated circuit, and particularly to a semiconductor integrated circuit that pulls up or pulls down an input terminal of an integrated circuit.
従来、この種の半導体集積回路は、第3図(a)〜(d
)に示すように入力端子5から入力保護回路1を通して
インバータ3の出力側にインバータ出力6を設け、入力
保護抵抗のいずれかの端子と電源の一端とを抵抗で接続
し、プルアップ又はプルダウン回路を形成していた。ま
た、さらに第3図(e)および(f)に示すように、入
力側に入力保護回路2を抵抗41の代りに設け、さらに
P型MO5FETあるいはN型MO3FETを通してそ
れぞれ電源の正端子または負端子に接続しプルアップま
たはプルダウン回路を構成していた。Conventionally, this type of semiconductor integrated circuit is shown in FIGS.
), the inverter output 6 is provided on the output side of the inverter 3 from the input terminal 5 through the input protection circuit 1, and either terminal of the input protection resistor and one end of the power supply are connected with a resistor to create a pull-up or pull-down circuit. was forming. Further, as shown in FIGS. 3(e) and 3(f), an input protection circuit 2 is provided on the input side in place of the resistor 41, and a P-type MO5FET or an N-type MO3FET is connected to the positive terminal or negative terminal of the power supply, respectively. was connected to form a pull-up or pull-down circuit.
上述した従来の半導体集積回路は、第3図(a)〜(d
)に示すような場合、抵抗値を大きくするためには大き
な面積を必要とし半導体集積回路のサイズを大きくして
しまうという欠点をもつ、第3図(e)および(f)の
場合、MOSFETのオン抵抗を利用しているので第3
図(a)〜(d)の場合に比べ小面積にできるという長
所はあるものの、第3図(a)、(c)および(e)の
回路は、入力端子5を強制的にロウにする場合、入力端
子5とプルアップの電源端子との間に電源電圧と同じ電
位差が生じ、第3図(b)、(d)および(f)の回路
は入力端子5を強制的にハイにする場合、入力端子5と
プルダウンのグランド端子の間に電源電圧と同じ電位差
が生じ、いずれもプルアッププルダウンの素子(すなわ
ち抵抗41またはMOSFET4)及び保護回路2に、
集積回路の動作には不要な直流電流が流れるという欠点
がある。The conventional semiconductor integrated circuit described above is shown in FIGS. 3(a) to 3(d).
), the disadvantage is that increasing the resistance requires a large area and increases the size of the semiconductor integrated circuit. Since it uses on-resistance, the third
Although the circuits in FIGS. 3(a), (c), and (e) have the advantage of being smaller in area than the cases in FIGS. 3(a) to 3(d), the input terminal 5 is forced to be low. In this case, a potential difference equal to the power supply voltage occurs between the input terminal 5 and the pull-up power supply terminal, and the circuits of FIGS. 3(b), (d), and (f) force input terminal 5 to be high. In this case, a potential difference equal to the power supply voltage occurs between the input terminal 5 and the pull-down ground terminal, and the pull-up/pull-down element (i.e., resistor 41 or MOSFET 4) and protection circuit 2 in both cases
The operation of integrated circuits has the disadvantage that unnecessary direct current flows through them.
本発明の半導体集積回路は、第1の入力保護回路と、前
記第1の入力保護回路を介してインバータの入力に接続
される集積回路の入力端子に一端が接続される第2の入
力保護回路と、前記第2の入力保護回路の他端にドレイ
ンが接続され、ゲートが前記インバータの出力に接続さ
れソースが電源端子のいずれか一方に接続されたMOS
FETとを備えて構成される。The semiconductor integrated circuit of the present invention includes a first input protection circuit and a second input protection circuit, one end of which is connected to an input terminal of an integrated circuit that is connected to an input of an inverter via the first input protection circuit. and a MOS whose drain is connected to the other end of the second input protection circuit, whose gate is connected to the output of the inverter, and whose source is connected to either one of the power supply terminals.
FET.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の第1の実施例の構成を示す回路図であ
る。FIG. 1 is a circuit diagram showing the configuration of a first embodiment of the present invention.
1・2は集積回路の入力保護回路、3は入力インバータ
、5は入力端子、6は集積回路の内部へ接続されるイン
バータ出力、4はプルアップの働きをする(ここではP
型の)MOSFETであり、FET4のソースは電源端
子に、ドレインは保護回路2に接続されている。ここで
、本発明の特徴はFET4のゲートがインバータ3の出
力に接続されている点である。1 and 2 are input protection circuits for the integrated circuit, 3 is an input inverter, 5 is an input terminal, 6 is an inverter output connected to the inside of the integrated circuit, and 4 acts as a pull-up (here, P
The source of the FET 4 is connected to the power supply terminal, and the drain is connected to the protection circuit 2. Here, the feature of the present invention is that the gate of FET 4 is connected to the output of inverter 3.
集積回路の入力端子5がオープンで使用されている場合
、FET4のサブスレッショルドリークにより入力端子
5は電源端子と同電位となり、インバータ3の出力6は
ロウとなり、P型のMOSFET4のゲートは零電位と
なってMOSFET4はオン状態で安定する。入力端子
5にハイが印加された場合も上述の状態と同じである0
次に、入力端子5にロウが印加された場合、インバータ
3の出力6はハイとなり、P型のMOSFET4のゲー
ト電位は電源電圧となってMOSFET4はオフ状態と
なり、電源端子と入力端子5との間はオープンとなる。When the input terminal 5 of the integrated circuit is used open, the input terminal 5 becomes the same potential as the power supply terminal due to subthreshold leakage of the FET 4, the output 6 of the inverter 3 becomes low, and the gate of the P-type MOSFET 4 becomes zero potential. As a result, MOSFET 4 is stabilized in the on state. When high is applied to input terminal 5, the state is 0, which is the same as the above state.
Next, when a low voltage is applied to the input terminal 5, the output 6 of the inverter 3 becomes high, the gate potential of the P-type MOSFET 4 becomes the power supply voltage, the MOSFET 4 turns off, and the connection between the power supply terminal and the input terminal 5 becomes high. The space will be open.
すなわち、過渡的には電流は流れるものの、入力保護回
路2とMOSFET4に定常的な電流が流れることはな
い。That is, although current flows transiently, no steady current flows through the input protection circuit 2 and MOSFET 4.
次に、第2図は本発明の第2の実施例の構成を示す回路
図である。これは、プルダウン入力の場合であり、MO
SFET4はN型のMOSFETを使用している。入力
端子5がオープンの場合、インバータ3の出力6がハイ
となりMOSFET4がオン状態となり安定となる。入
力端子5が口つの場合も同じである。また入力端子5が
ハイの場合は、インバータ3の出力6がロウとなりM
03FET4がオフとなって、保護回路2とMOSFE
T4に定常的な電流は流れない。Next, FIG. 2 is a circuit diagram showing the configuration of a second embodiment of the present invention. This is the case for pull-down inputs and MO
SFET4 uses an N-type MOSFET. When the input terminal 5 is open, the output 6 of the inverter 3 becomes high, and the MOSFET 4 becomes on and stable. The same applies when the input terminal 5 is open. Furthermore, when the input terminal 5 is high, the output 6 of the inverter 3 becomes low and M
03FET4 is turned off, protection circuit 2 and MOSFE
No steady current flows through T4.
なお、入力保護回路2は、いずれの実施例でも−mに抵
抗と半導体ダイオードとの直列素子で構成され、ダイオ
ードの導電方向に対し逆方向の電位が加わるように接続
されている。In all embodiments, the input protection circuit 2 is composed of a series element of a resistor and a semiconductor diode connected to -m so that a potential in the opposite direction to the conduction direction of the diode is applied.
以上説明したように本発明は、プルアップあるいはプル
ダウン入力に用いているFETのゲートを入力インバー
タの出力に接続することによって、入力をオープンで使
用する場合はもとより入力に強制的にハイあるいはロウ
レベルを印加しても入力に定常的な電流が流れないとい
う効果がある。As explained above, by connecting the gate of the FET used for the pull-up or pull-down input to the output of the input inverter, the present invention can be used not only when the input is open but also when the input is forced to a high or low level. This has the effect that no steady current flows through the input even when applied.
つまり、同一の集積回路をある装置は入力をオープンで
使用し別の装置では入力をハイあるいはロウレベルで使
用したい場合にも、入力電流が流れる事なく集積回路を
使用することができ、外付のプルアップまたはプルダウ
ン抵抗を必要としないという従来の回路の長所を有し、
入力に電圧を印加する場合にも回路の動作に不要な直流
電流を流すことはなく集積回路の低消費電流化にも大き
な役割をはなすという効果がある。In other words, even if you want to use the same integrated circuit with the input open in one device and the input at high or low level in another device, the integrated circuit can be used without input current flowing, and external It has the advantage of traditional circuits of not requiring pull-up or pull-down resistors,
Even when voltage is applied to the input, direct current unnecessary for circuit operation is not caused to flow, and this plays a major role in reducing the current consumption of integrated circuits.
第1図は本発明の第1の実施例の構成を示す回路図、第
2図は本発明の第2の実施例の構成を示す回路図、第3
図は従来の技術による構成を示す回路図である。
1・2・・・入力保護回路、3・・・インバータ、4・
・・MOSFET、5・・・入力端子、6・・・インバ
ータ出力。FIG. 1 is a circuit diagram showing the configuration of a first embodiment of the present invention, FIG. 2 is a circuit diagram showing the configuration of a second embodiment of the present invention, and FIG.
The figure is a circuit diagram showing a configuration according to a conventional technique. 1.2...Input protection circuit, 3.Inverter, 4.
...MOSFET, 5...input terminal, 6...inverter output.
Claims (3)
を介してインバータの入力に接続される集積回路の入力
端子に一端が接続される第2の入力保護回路と、前記第
2の入力保護回路の他端にドレインが接続され、ゲート
が前記インバータの出力に接続されソースが電源端子の
いずれか一方に接続されたMOSFETとを備えて成る
ことを特徴とする半導体集積回路。(1) a first input protection circuit; a second input protection circuit having one end connected to an input terminal of an integrated circuit connected to an input of an inverter via the first input protection circuit; 1. A semiconductor integrated circuit comprising: a MOSFET having a drain connected to the other end of the input protection circuit, a gate connected to the output of the inverter, and a source connected to either one of the power supply terminals.
記Pチャネル型FETのソースが正の電源端子に接続さ
れた特許請求の範囲第1項に示す半導体集積回路。(2) The semiconductor integrated circuit according to claim 1, wherein the MOSFET is a P-channel FET, and the source of the P-channel FET is connected to a positive power supply terminal.
記Nチャネル型FETのソースが負の電源端子に接続さ
れた特許請求の範囲第1項に示す半導体集積回路。(3) The semiconductor integrated circuit according to claim 1, wherein the MOSFET is an N-channel FET, and the source of the N-channel FET is connected to a negative power supply terminal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62313512A JPH01154620A (en) | 1987-12-10 | 1987-12-10 | Semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62313512A JPH01154620A (en) | 1987-12-10 | 1987-12-10 | Semiconductor integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01154620A true JPH01154620A (en) | 1989-06-16 |
Family
ID=18042206
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62313512A Pending JPH01154620A (en) | 1987-12-10 | 1987-12-10 | Semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01154620A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03125531U (en) * | 1990-03-29 | 1991-12-18 | ||
JPH07176735A (en) * | 1993-12-17 | 1995-07-14 | Nec Corp | Input protective circuit of semiconductor circuit |
WO2019113220A1 (en) * | 2017-12-05 | 2019-06-13 | Texas Instruments Incorporated | Power unit with an integrated pull-down transistor |
US11472373B2 (en) | 2017-04-17 | 2022-10-18 | 3E Nano Inc. | Energy control coatings, structures, devices, and methods of fabrication thereof |
-
1987
- 1987-12-10 JP JP62313512A patent/JPH01154620A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03125531U (en) * | 1990-03-29 | 1991-12-18 | ||
JPH07176735A (en) * | 1993-12-17 | 1995-07-14 | Nec Corp | Input protective circuit of semiconductor circuit |
US11472373B2 (en) | 2017-04-17 | 2022-10-18 | 3E Nano Inc. | Energy control coatings, structures, devices, and methods of fabrication thereof |
WO2019113220A1 (en) * | 2017-12-05 | 2019-06-13 | Texas Instruments Incorporated | Power unit with an integrated pull-down transistor |
US10826487B2 (en) | 2017-12-05 | 2020-11-03 | Texas Instruments Incorporated | Power unit with an integrated pull-down transistor |
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