JPH01153596A - Base plate holder for molecular beam epitaxy apparatus - Google Patents
Base plate holder for molecular beam epitaxy apparatusInfo
- Publication number
- JPH01153596A JPH01153596A JP62312855A JP31285587A JPH01153596A JP H01153596 A JPH01153596 A JP H01153596A JP 62312855 A JP62312855 A JP 62312855A JP 31285587 A JP31285587 A JP 31285587A JP H01153596 A JPH01153596 A JP H01153596A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- plate
- base plate
- carbon plate
- ring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001451 molecular beam epitaxy Methods 0.000 title claims description 8
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 18
- 238000010438 heat treatment Methods 0.000 claims abstract description 7
- 239000004065 semiconductor Substances 0.000 claims abstract description 4
- 239000000758 substrate Substances 0.000 claims description 46
- 229910052715 tantalum Inorganic materials 0.000 abstract description 5
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 abstract description 5
- 230000000694 effects Effects 0.000 abstract description 4
- 238000010186 staining Methods 0.000 abstract 1
- 239000000853 adhesive Substances 0.000 description 9
- 230000001070 adhesive effect Effects 0.000 description 9
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000002109 crystal growth method Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Landscapes
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、分子線エピタキシィ装置(MBE)に用いる
基板ホルダに関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a substrate holder used in a molecular beam epitaxy apparatus (MBE).
従来のMBE用基板基板ホルダ第3図に示すように板状
体からなり、この板状基板ホルダ13に接着剤12で基
板11を取り付けるように構成されていた。そして熱電
対14で温度制御されたヒータ15により基板ホルダ1
3を熱することにより接着剤12を介して基板11を熱
していた。A conventional MBE substrate substrate holder, as shown in FIG. 3, consists of a plate-shaped body, and is configured such that a substrate 11 is attached to this plate-shaped substrate holder 13 with an adhesive 12. Then, the substrate holder 1 is heated by a heater 15 whose temperature is controlled by a thermocouple 14.
By heating 3, the substrate 11 was heated via the adhesive 12.
MBEによる結晶成長法は、成長膜厚、不純物ドーピン
グの制御性に優れているが、GaAs等の半導体基板を
加熱する際に、温度の不均一性から素子特性がばらつく
ためデバイスを作る上で問題となっている。これらの温
度の不均一性が生ずる原、因の1つとして、基板と基板
ホルダを接着する接着剤(例えばIn)の密着度の影響
が考えられている。この温度の不均一さをなすくことが
現在MBEによる結晶成長の大きな課題となっている。The crystal growth method using MBE has excellent controllability of the grown film thickness and impurity doping, but when heating a semiconductor substrate such as GaAs, the element characteristics vary due to temperature non-uniformity, which poses a problem when manufacturing devices. It becomes. One of the causes of these temperature non-uniformities is considered to be the influence of the degree of adhesion of the adhesive (for example, In) that bonds the substrate and the substrate holder. Eliminating this temperature non-uniformity is currently a major issue in crystal growth by MBE.
前述した従来の基板ホルダは基板を接着剤を用いて固定
していたため、基板を加熱する際に接着剤の密着度の違
いにより基板温度が不均一になるという欠点があった。Since the conventional substrate holder described above fixed the substrate using an adhesive, there was a drawback that when the substrate was heated, the temperature of the substrate became uneven due to the difference in the degree of adhesion of the adhesive.
又、基板のはり付けはがしの際に基板あるいは成長膜表
面を接着剤で汚してしまうという欠点もあった。Another drawback is that the surface of the substrate or the grown film is contaminated with adhesive when the substrate is attached or removed.
本発明の基板ホルダは、基板を均一に加熱するためのカ
ーボン板と、基板とカーボン板を固定するリングを有し
、基板をカーボン板に密着させてリングで固定し加熱す
ることを特徴とする。The substrate holder of the present invention has a carbon plate for uniformly heating the substrate and a ring for fixing the substrate and the carbon plate, and is characterized in that the substrate is brought into close contact with the carbon plate and fixed by the ring for heating. .
次に本発明を図面を用いて説明する。第1図は本発明の
第1の実施例の断面図である。基板ホルダ3の中に基板
1が入り、その裏面にカーボン板2が接している。さら
にリング7によって基板1とカーボン板2は基板ホルダ
3に固定されている。熱電対4はタンタル板6に接して
いてヒータ5は熱電対4によって制御させる。ヒータ5
を加熱するとカーボン板2が熱せられ続いてカーボン板
6に接した熱電対4によりヒータ5を制御し基板温度は
一定に保たれる。Next, the present invention will be explained using the drawings. FIG. 1 is a sectional view of a first embodiment of the invention. A substrate 1 is placed in a substrate holder 3, and a carbon plate 2 is in contact with the back surface of the substrate 1. Further, the substrate 1 and the carbon plate 2 are fixed to the substrate holder 3 by a ring 7. The thermocouple 4 is in contact with the tantalum plate 6, and the heater 5 is controlled by the thermocouple 4. Heater 5
When heated, the carbon plate 2 is heated, and then the heater 5 is controlled by the thermocouple 4 in contact with the carbon plate 6 to keep the substrate temperature constant.
そのため、例えばGaAs結晶を本発明の基板のホルダ
を用いて成長した場合、接着(例えばIn)の密着度の
ちがいに起因する温度不均一性はなくなり素子特性のば
らつきが改善された。Therefore, for example, when a GaAs crystal is grown using the substrate holder of the present invention, temperature non-uniformity caused by differences in the degree of adhesion (for example, In) is eliminated, and variations in device characteristics are improved.
又、基板の取り付け、取りはすしの作業時間は1/20
に短縮された。Also, the work time for installing and removing the board is 1/20
was shortened to
第2図は本発明の第2の実施例の断面図である。基板ホ
ルダ3にカーボン板2が入りその上に基板1が接してい
る。さらに基板1を平板リング8で押さえ、丸リング7
で基板ホルダ3に固定しているために、カーボン板2と
の密着を良くし基板温度の均一性を増している。又、カ
ーボン板2にはタンタル板6が固定されていて、このタ
ンタル板6に接している熱電対4によってヒータ5が制
御され基板温度は一定に保たれている。従って、温度の
均一性から素子特性のばらつきが小さくなり、従来の基
板ホルダと比べて素子特性の安定が得られた。FIG. 2 is a sectional view of a second embodiment of the invention. A carbon plate 2 is inserted into a substrate holder 3, and a substrate 1 is in contact with it. Further, hold the board 1 with the flat ring 8, and press the round ring 7.
Since it is fixed to the substrate holder 3, it improves the close contact with the carbon plate 2 and increases the uniformity of the substrate temperature. Further, a tantalum plate 6 is fixed to the carbon plate 2, and a heater 5 is controlled by a thermocouple 4 in contact with the tantalum plate 6 to keep the substrate temperature constant. Therefore, due to temperature uniformity, variations in device characteristics are reduced, and device characteristics are more stable than in conventional substrate holders.
以上説明したように本発明は、接着剤なしにカーボン板
とリングで基板ホルダに基板を固定するために、接着剤
を使用することにより生ずる温度不均一性がなくなり、
さらに、基板のはりつけ。As explained above, the present invention fixes a substrate to a substrate holder using a carbon plate and a ring without using an adhesive, thereby eliminating temperature non-uniformity caused by using an adhesive.
Furthermore, crucifixion of the board.
はがしの際に基板゛および成長膜表面を汚すことなしに
基板の取り付は取りはすしができることにより、素子を
作製する上での歩留を大幅に増加させることができると
いう効果がある。さらに作業時間が1/20に短縮され
ることから製品の生産性が向上するという効果もある。Since the substrate can be attached and removed without contaminating the substrate and the surface of the grown film during peeling off, there is an effect that the yield in producing devices can be greatly increased. Furthermore, since the working time is shortened to 1/20, there is also the effect of improving product productivity.
第1区は本発明の第1の実施例の断面図、第2図は本発
明の第2の実施例の断面図、第3図は従来の分子線エピ
タキシィ装置用基板ホルダの断面図である。
1.11・・・基板、2・・・カーボン板、3,13・
・・基板ホルダ、4,14・・・熱電対、5,15・・
・ヒータ、6・・・タンタル板、7・・・リング(丸)
、8・・・リング(平板)、12・・・接着剤。Section 1 is a sectional view of the first embodiment of the present invention, FIG. 2 is a sectional view of the second embodiment of the invention, and FIG. 3 is a sectional view of a conventional substrate holder for molecular beam epitaxy equipment. . 1.11...Substrate, 2...Carbon plate, 3,13.
...Substrate holder, 4, 14...Thermocouple, 5, 15...
・Heater, 6...Tantalum plate, 7...Ring (round)
, 8... ring (flat plate), 12... adhesive.
Claims (1)
一に加熱するためのカーボン板と、基板とカーボン板を
固定するリングを有し、基板をカーボ板に密着させてリ
ングで固定し加熱するようにしたことを特徴とする分子
線エピタキシィ装置用基板ホルダ。A substrate holder for heating a semiconductor substrate has a carbon plate to uniformly heat the substrate and a ring to fix the substrate and the carbon plate, so that the substrate is heated while being held in close contact with the carbon plate and fixed by the ring. A substrate holder for molecular beam epitaxy equipment, characterized in that:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62312855A JPH01153596A (en) | 1987-12-09 | 1987-12-09 | Base plate holder for molecular beam epitaxy apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62312855A JPH01153596A (en) | 1987-12-09 | 1987-12-09 | Base plate holder for molecular beam epitaxy apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01153596A true JPH01153596A (en) | 1989-06-15 |
Family
ID=18034245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62312855A Pending JPH01153596A (en) | 1987-12-09 | 1987-12-09 | Base plate holder for molecular beam epitaxy apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01153596A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002019400A1 (en) * | 2000-08-30 | 2002-03-07 | Ibiden Co., Ltd. | Ceramic heater for semiconductor manufacturing and inspecting equipment |
-
1987
- 1987-12-09 JP JP62312855A patent/JPH01153596A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002019400A1 (en) * | 2000-08-30 | 2002-03-07 | Ibiden Co., Ltd. | Ceramic heater for semiconductor manufacturing and inspecting equipment |
US6878906B2 (en) | 2000-08-30 | 2005-04-12 | Ibiden Co., Ltd. | Ceramic heater for semiconductor manufacturing and inspecting equipment |
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