JPH01136060A - 基準電極及びその製造方法 - Google Patents
基準電極及びその製造方法Info
- Publication number
- JPH01136060A JPH01136060A JP62293957A JP29395787A JPH01136060A JP H01136060 A JPH01136060 A JP H01136060A JP 62293957 A JP62293957 A JP 62293957A JP 29395787 A JP29395787 A JP 29395787A JP H01136060 A JPH01136060 A JP H01136060A
- Authority
- JP
- Japan
- Prior art keywords
- silver
- insulating material
- reference electrode
- silver chloride
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 4
- 238000000034 method Methods 0.000 claims abstract description 20
- 229910021607 Silver chloride Inorganic materials 0.000 claims abstract description 17
- HKZLPVFGJNLROG-UHFFFAOYSA-M silver monochloride Chemical compound [Cl-].[Ag+] HKZLPVFGJNLROG-UHFFFAOYSA-M 0.000 claims abstract description 17
- 239000000758 substrate Substances 0.000 claims abstract description 15
- 239000011810 insulating material Substances 0.000 claims abstract description 14
- 229910052709 silver Inorganic materials 0.000 claims abstract description 13
- 239000004332 silver Substances 0.000 claims abstract description 13
- 239000000463 material Substances 0.000 claims description 5
- 238000010884 ion-beam technique Methods 0.000 claims description 4
- 239000004020 conductor Substances 0.000 claims 2
- 239000012212 insulator Substances 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000004544 sputter deposition Methods 0.000 claims 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 abstract description 10
- 239000004809 Teflon Substances 0.000 abstract description 10
- 229920006362 Teflon® Polymers 0.000 abstract description 10
- 238000001659 ion-beam spectroscopy Methods 0.000 abstract description 10
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 abstract description 9
- 229910052786 argon Inorganic materials 0.000 abstract description 5
- 229910000906 Bronze Inorganic materials 0.000 abstract description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract description 3
- 239000010974 bronze Substances 0.000 abstract description 3
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 abstract description 3
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 abstract 2
- 229910019142 PO4 Inorganic materials 0.000 abstract 1
- 239000006185 dispersion Substances 0.000 abstract 1
- 229910052738 indium Inorganic materials 0.000 abstract 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 abstract 1
- 239000000075 oxide glass Substances 0.000 abstract 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 abstract 1
- 239000010452 phosphate Substances 0.000 abstract 1
- 238000002360 preparation method Methods 0.000 abstract 1
- 150000002500 ions Chemical class 0.000 description 9
- 239000010408 film Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- ZOMNIUBKTOKEHS-UHFFFAOYSA-L dimercury dichloride Chemical class Cl[Hg][Hg]Cl ZOMNIUBKTOKEHS-UHFFFAOYSA-L 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000004925 denaturation Methods 0.000 description 1
- 230000036425 denaturation Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- GPRLSGONYQIRFK-UHFFFAOYSA-N hydron Chemical compound [H+] GPRLSGONYQIRFK-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 239000012047 saturated solution Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical group FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Liquid Crystal (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62293957A JPH01136060A (ja) | 1987-11-24 | 1987-11-24 | 基準電極及びその製造方法 |
| PCT/JP1988/001188 WO1989004959A1 (en) | 1987-11-24 | 1988-11-24 | Reference electrode |
| EP19880910119 EP0393188A4 (en) | 1987-11-24 | 1988-11-24 | Reference electrode |
| US07/490,636 US5200053A (en) | 1987-11-24 | 1988-11-24 | Reference electrode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62293957A JPH01136060A (ja) | 1987-11-24 | 1987-11-24 | 基準電極及びその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01136060A true JPH01136060A (ja) | 1989-05-29 |
| JPH0561580B2 JPH0561580B2 (https=) | 1993-09-06 |
Family
ID=17801373
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62293957A Granted JPH01136060A (ja) | 1987-11-24 | 1987-11-24 | 基準電極及びその製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01136060A (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009513983A (ja) * | 2005-10-31 | 2009-04-02 | アボット ダイアベティス ケア インコーポレイテッド | 分析物センサおよびその作成方法 |
| JP2012520462A (ja) * | 2009-03-10 | 2012-09-06 | セノバ システムズ インコーポレイテッド | 電気化学センサにおける内部較正のための手段を提供するためのデバイス |
-
1987
- 1987-11-24 JP JP62293957A patent/JPH01136060A/ja active Granted
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009513983A (ja) * | 2005-10-31 | 2009-04-02 | アボット ダイアベティス ケア インコーポレイテッド | 分析物センサおよびその作成方法 |
| US20110031110A1 (en) * | 2005-10-31 | 2011-02-10 | Yi Wang | Methods of Making, and, Analyte Sensor |
| US8795477B2 (en) | 2005-10-31 | 2014-08-05 | Abbott Diabetes Care Inc. | Methods of making, and, analyte sensor |
| US9290839B2 (en) | 2005-10-31 | 2016-03-22 | Abbott Diabetes Care Inc. | Method of making, and, analyte sensor |
| JP2012520462A (ja) * | 2009-03-10 | 2012-09-06 | セノバ システムズ インコーポレイテッド | 電気化学センサにおける内部較正のための手段を提供するためのデバイス |
| US8877037B2 (en) | 2009-03-10 | 2014-11-04 | Senova Systems, Inc. | Device for providing a means for internal calibration in an electrochemical sensor |
| US9347907B2 (en) | 2009-03-10 | 2016-05-24 | Senova Systems, Inc. | Device for providing a means for internal calibration in an electrochemical sensor |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0561580B2 (https=) | 1993-09-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |