JPH01128179U - - Google Patents
Info
- Publication number
- JPH01128179U JPH01128179U JP2478588U JP2478588U JPH01128179U JP H01128179 U JPH01128179 U JP H01128179U JP 2478588 U JP2478588 U JP 2478588U JP 2478588 U JP2478588 U JP 2478588U JP H01128179 U JPH01128179 U JP H01128179U
- Authority
- JP
- Japan
- Prior art keywords
- board
- inspection
- plate
- holes
- mesh
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 18
- 230000007246 mechanism Effects 0.000 claims description 18
- 239000000523 sample Substances 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims 2
- 238000013500 data storage Methods 0.000 claims 1
- 238000003780 insertion Methods 0.000 claims 1
- 230000037431 insertion Effects 0.000 claims 1
- 230000002950 deficient Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000002372 labelling Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図は本考案の実施例１のアドレス変換装置
の構成図、第２図は本考案の実施例１の専用板の
検査貫通孔と網目板の格子状貫通孔の１対１対応
データー作成中のアドレス変換装置の断面図、第
３図は専用板側プローブと網目板側プローブが接
触ピンに接触し１対１対応データー作成中の印刷
配線板布線検査治具の断面図、第４図は印刷配線
板布線検査治具を示す図、第５図は接触ピンによ
り１対１に接続された検査貫通孔と格子状貫通孔
の接続図、第６図は接触ピンにより１対１に接続
された検査貫通孔と格子状貫通孔の断面図、第７
図は本考案の実施例２のアドレス変換装置の構成
図、第８図は本考案の実施例２の専用板の検査貫
通孔と網目板の格子状貫通孔の１対１の対応デー
ター作成中のアドレス変換装置の断面図、第９図
は本考案の実施例２の印刷配線板の不良位置指示
中のアドレス変換装置の断面図、第１０図は本考
案の実施例３の印刷配線板の不良位置指示中のア
ドレス変換装置の専用板側上下駆動機構の断面図
、第１１図は本考案の実施例４の印刷配線板の不
良位置ラベル貼り中のアドレス変換装置の専用板
側上下駆動機構の断面図である。
１……コンピユーター、２……入出力部、３…
…測定部制御回路、４……ＸＹ軸駆動機構制御回
路、５……信号線、６……専用板側プローブ、７
……接触ピン、８……専用板、９……網目板、１
０……印刷配線板布線検査治具、１１……網目板
側プローブ、１２……専用板側Ｘ軸駆動機構、１
３……専用板側Ｙ軸駆動機構、１４……網目板側
Ｘ軸駆動機構、１５……網目板側Ｙ軸駆動機構、
１６……専用板側上下駆動機構、１７……網目板
側上下駆動機構、１８……検査貫通孔、１９……
格子状貫通孔、２０……固定治具、２１……キー
ボード、２２……格子状貫通孔に挿入された接触
ピン先、２３……板、２４……不良位置指示ピン
、２５……検査ピン、２６……不良検出プローブ
、２７……印刷配線板、２８……フツトスイツチ
、２９……ペン、３０……Ｘ，Ｙ軸、３１……Ｚ
軸、３２……不良指示板、３３……不良指示光照
射機構、３４……不良位置ラベル貼り機構、３５
……ラベル、３６……光、３７……ピン上下機構
。
Figure 1 is a block diagram of the address conversion device according to the first embodiment of the present invention, and Figure 2 is the creation of one-to-one correspondence data between the inspection through-holes of the dedicated board and the grid-like through-holes of the mesh plate according to the first embodiment of the present invention. Figure 3 is a cross-sectional view of the printed wiring board wiring inspection jig in which the dedicated board side probe and the mesh board side probe are in contact with the contact pins to create one-to-one correspondence data. The figure shows a printed wiring board wiring inspection jig, Figure 5 is a connection diagram of inspection through holes and grid-like through holes connected one to one by contact pins, and Figure 6 shows a one to one connection by contact pins. Cross-sectional view of the inspection through-hole and the grid-like through-hole connected to the seventh
The figure is a block diagram of the address conversion device according to the second embodiment of the present invention, and Figure 8 is the one-to-one correspondence data being created between the inspection through-holes of the special plate and the grid-like through-holes of the mesh plate according to the second embodiment of the present invention. FIG. 9 is a cross-sectional view of the address converter during indication of the defective location of the printed wiring board according to the second embodiment of the present invention, and FIG. 10 is a cross-sectional view of the address converter according to the third embodiment of the present invention. A sectional view of the vertical drive mechanism on the dedicated board side of the address translation device during defective location indication, and FIG. 11 is a cross-sectional view of the vertical drive mechanism on the dedicated board side of the address translation device during labeling of the defective location on a printed wiring board according to the fourth embodiment of the present invention. FIG. 1...computer, 2...input/output section, 3...
...Measuring unit control circuit, 4...XY-axis drive mechanism control circuit, 5...Signal line, 6...Special plate side probe, 7
...Contact pin, 8...Special plate, 9...Mesh plate, 1
0... Printed wiring board wiring inspection jig, 11... Mesh plate side probe, 12... Dedicated board side X-axis drive mechanism, 1
3... Dedicated plate side Y-axis drive mechanism, 14... Mesh plate side X-axis drive mechanism, 15... Mesh plate side Y-axis drive mechanism,
16... Dedicated plate side vertical drive mechanism, 17... Mesh plate side vertical drive mechanism, 18... Inspection through hole, 19...
Grid-shaped through hole, 20... Fixing jig, 21... Keyboard, 22... Contact pin tip inserted into grid-shaped through hole, 23... Plate, 24... Defective position indicating pin, 25... Inspection pin , 26...Failure detection probe, 27...Printed wiring board, 28...Foot switch, 29...Pen, 30...X, Y axis, 31...Z
Axis, 32...Failure indication plate, 33...Failure indication light irradiation mechanism, 34...Failure position labeling mechanism, 35
...Label, 36...Light, 37...Pin up and down mechanism.
Claims (1)
定されたピツチで格子状に植立された検査ピンに
合致するようにＸ方向及びＹ方向に規定されたピ
ツチで格子状貫通孔を設けた網目板と、印刷配線
板のスルホール等の布線検査個所に検査貫通孔を
設けた専用板と、前記網目板と前記専用板を一定
の距離を保つて平行に固定する固定治具と、前記
専用板の検査貫通孔と前記網目板の格子状貫通孔
の両方に挿入されて１対１に対応させている接触
ピンと、前記専用板、網目板、固定治具及び接触
ピンより構成される印刷配線板布線検査治具と、
前記網目板の格子状貫通孔と前記専用板の検査貫
通孔を１対１に対応させている接触ピンの挿入位
置を検出するためコンピユーターに入出力部を介
して接続されているＸＹ軸駆動機構制御回路と、
信号線を介して前記ＸＹ軸駆動機構制御回路に接
続されている専用板側及び網目板側Ｘ軸及びＹ軸
駆動機構と、前記コンピユーターに入出力部を介
して接続されている測定部制御回路と、信号線を
介して前記測定部制御回路に接続されている専用
板側プローブ、７×７のマトリツクス状の網目板
側プローブ、専用板側上下駆動機構及び網目板側
上下駆動機構と、前記専用板の布線検査個所の座
標を入力する入力機構と、前記専用板の検査貫通
孔と前記網目板の格子状貫通孔を１対１に対応さ
せたデーターを記憶するデーター記憶部とを有す
ることを特徴とするアドレス変換装置。 A lattice-shaped through hole is provided at a pitch defined in the X and Y directions to match the inspection pins set up in a lattice shape at a pitch defined in the X and Y directions of the printed wiring board wiring inspection machine. a special board having inspection through holes at wiring inspection locations such as through-holes of a printed wiring board, and a fixing jig for fixing the mesh board and the special board in parallel while maintaining a certain distance; Consisting of a contact pin that is inserted into both the inspection through-hole of the special plate and the grid-like through-hole of the mesh plate so as to have a one-to-one correspondence, and the special plate, the mesh plate, a fixing jig, and the contact pin. Printed wiring board wiring inspection jig,
an XY-axis drive mechanism connected to a computer via an input/output section for detecting the insertion position of a contact pin that has a one-to-one correspondence between the grid-like through holes of the mesh plate and the inspection through holes of the special plate; a control circuit;
The dedicated plate side and mesh plate side X-axis and Y-axis drive mechanisms are connected to the XY-axis drive mechanism control circuit via signal lines, and the measurement unit control circuit is connected to the computer via the input/output section. , a dedicated plate-side probe connected to the measurement unit control circuit via a signal line, a 7×7 matrix-shaped mesh plate-side probe, a dedicated plate-side vertical drive mechanism, and a mesh-board side vertical drive mechanism; It has an input mechanism for inputting the coordinates of a wiring inspection point on the dedicated board, and a data storage unit that stores data on a one-to-one correspondence between the inspection through holes of the dedicated board and the grid-like through holes of the mesh board. An address translation device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2478588U JPH0611498Y2 (en) | 1988-02-26 | 1988-02-26 | Address translator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2478588U JPH0611498Y2 (en) | 1988-02-26 | 1988-02-26 | Address translator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01128179U true JPH01128179U (en) | 1989-09-01 |
| JPH0611498Y2 JPH0611498Y2 (en) | 1994-03-23 |
Family
ID=31244943
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2478588U Expired - Lifetime JPH0611498Y2 (en) | 1988-02-26 | 1988-02-26 | Address translator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0611498Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004069447A (en) * | 2002-08-06 | 2004-03-04 | Ibiden Engineering Kk | Inspection device for conduction inspection jig for printed wiring board |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6788078B2 (en) | 2001-11-16 | 2004-09-07 | Delaware Capital Formation, Inc. | Apparatus for scan testing printed circuit boards |
-
1988
- 1988-02-26 JP JP2478588U patent/JPH0611498Y2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004069447A (en) * | 2002-08-06 | 2004-03-04 | Ibiden Engineering Kk | Inspection device for conduction inspection jig for printed wiring board |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0611498Y2 (en) | 1994-03-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ATE137338T1 (en) | TEST ARRANGEMENT WITH FILM ADAPTOR FOR CIRCUIT BOARDS | |
| JP2001210685A5 (en) | ||
| CN104897998B (en) | A kind of ICT tests system | |
| JPH01128179U (en) | ||
| JPH0469779U (en) | ||
| CN107728041A (en) | A kind of electronic circuit board electric property detection device | |
| JPH06230081A (en) | Abnormal position detector for electronic equipment board and probe used in this | |
| CN206819715U (en) | OLED screen LTU line test unit | |
| JPH06331653A (en) | Measuring method for probe-to-probe error in x-y circuit substrate inspection device | |
| JP2523483B2 (en) | Probe point determination device | |
| JPS63159775U (en) | ||
| JPH0248877U (en) | ||
| JPS63157675U (en) | ||
| CN221306177U (en) | PCB board capable of monitoring solder mask alignment accuracy and solder mask definition PAD | |
| CN215420952U (en) | PCB structure for improving accuracy of temperature sensor in measuring ambient temperature | |
| CN213497168U (en) | High-precision marking machine | |
| JPH0299373U (en) | ||
| CN1159731A (en) | Method for testing copper slag of grounding layer of power source on inner layer of printed-circuit board and equipment | |
| JPS62140466U (en) | ||
| JPH06230078A (en) | Abnormal position detecting method for electronic equipment board, device thereof and electronic equipment board used therefor | |
| JPH02136762A (en) | Apparatus for inspecting wiring of printed circuit board | |
| JPS6117671U (en) | Printed board testing equipment | |
| JPH0420847A (en) | Inspection-pattern projecting apparatus | |
| JPH0447668U (en) | ||
| CN114520019A (en) | DDR signal test fixture and test method |