JPH01124580U - - Google Patents

Info

Publication number
JPH01124580U
JPH01124580U JP1952588U JP1952588U JPH01124580U JP H01124580 U JPH01124580 U JP H01124580U JP 1952588 U JP1952588 U JP 1952588U JP 1952588 U JP1952588 U JP 1952588U JP H01124580 U JPH01124580 U JP H01124580U
Authority
JP
Japan
Prior art keywords
pallet
socket
laser diode
cylindrical shafts
holes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1952588U
Other languages
English (en)
Japanese (ja)
Other versions
JPH079109Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988019525U priority Critical patent/JPH079109Y2/ja
Publication of JPH01124580U publication Critical patent/JPH01124580U/ja
Application granted granted Critical
Publication of JPH079109Y2 publication Critical patent/JPH079109Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1988019525U 1988-02-17 1988-02-17 レーザダイオードの測定用治具 Expired - Lifetime JPH079109Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988019525U JPH079109Y2 (ja) 1988-02-17 1988-02-17 レーザダイオードの測定用治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988019525U JPH079109Y2 (ja) 1988-02-17 1988-02-17 レーザダイオードの測定用治具

Publications (2)

Publication Number Publication Date
JPH01124580U true JPH01124580U (US20020051482A1-20020502-M00012.png) 1989-08-24
JPH079109Y2 JPH079109Y2 (ja) 1995-03-06

Family

ID=31235112

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988019525U Expired - Lifetime JPH079109Y2 (ja) 1988-02-17 1988-02-17 レーザダイオードの測定用治具

Country Status (1)

Country Link
JP (1) JPH079109Y2 (US20020051482A1-20020502-M00012.png)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008153178A1 (ja) * 2007-06-14 2008-12-18 Chichibu Fuji Co., Ltd. 半導体レーザ用エージングボード
JP2010122182A (ja) * 2008-11-21 2010-06-03 Daitron Technology Co Ltd 検査治具及び検査装置
JP2010122181A (ja) * 2008-11-21 2010-06-03 Daitron Technology Co Ltd 押さえ板及びそれを用いた検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58158372U (ja) * 1982-04-19 1983-10-22 日本電気株式会社 半導体装置の測定治具

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58158372U (ja) * 1982-04-19 1983-10-22 日本電気株式会社 半導体装置の測定治具

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008153178A1 (ja) * 2007-06-14 2008-12-18 Chichibu Fuji Co., Ltd. 半導体レーザ用エージングボード
JP5292290B2 (ja) * 2007-06-14 2013-09-18 株式会社秩父富士 半導体レーザ用エージングボード
JP2010122182A (ja) * 2008-11-21 2010-06-03 Daitron Technology Co Ltd 検査治具及び検査装置
JP2010122181A (ja) * 2008-11-21 2010-06-03 Daitron Technology Co Ltd 押さえ板及びそれを用いた検査装置

Also Published As

Publication number Publication date
JPH079109Y2 (ja) 1995-03-06

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