JPH01124576U - - Google Patents
Info
- Publication number
- JPH01124576U JPH01124576U JP1903588U JP1903588U JPH01124576U JP H01124576 U JPH01124576 U JP H01124576U JP 1903588 U JP1903588 U JP 1903588U JP 1903588 U JP1903588 U JP 1903588U JP H01124576 U JPH01124576 U JP H01124576U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- holder
- bolt
- fixed
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 1
Description
第１図は本考案の一実施例の側面図、第２図は
動作説明のための模式図である。
１：接触子、２：板ばね、３：板ばね、４：支
持体、５：水平可動基台、６：垂直可動基台、７
：基台、１０：ホルダ、１１：ボルト、２０：当
板、２１：ボルト、２２：電極、２３：延出腕、
２４：ボルト、４０：支持腕、４１：ボルト、４
２：垂直可動板、４３：止めネジ、４４：長孔、
４５：水平腕、４６：当接突起、４７：ボルト、
４８：電極、５０：あり溝、５１：バネ、５２：
ボルト、５３：ボルト、６０：あり溝、６１：バ
ネ、６２：ボルト、６３：長孔、６４：長孔、６
５：ボルト。
FIG. 1 is a side view of an embodiment of the present invention, and FIG. 2 is a schematic diagram for explaining the operation. 1: Contactor, 2: Leaf spring, 3: Leaf spring, 4: Support body, 5: Horizontal movable base, 6: Vertical movable base, 7
: base, 10: holder, 11: bolt, 20: backing plate, 21: bolt, 22: electrode, 23: extending arm,
24: Bolt, 40: Support arm, 41: Bolt, 4
2: Vertical movable plate, 43: Set screw, 44: Long hole,
45: Horizontal arm, 46: Contact projection, 47: Bolt,
48: Electrode, 50: Dovetail groove, 51: Spring, 52:
Bolt, 53: Bolt, 60: Dovetail groove, 61: Spring, 62: Bolt, 63: Long hole, 64: Long hole, 6
5: Bolt.
Claims (1)
成る保持体の基部を固定し、その先端部に接触子
を装着し、該保持体を上下方向任意位置で下から
支持することにより接触子の接触圧力を調整する
支持体を設けたことを特徴とする接触センサ。 The base of a holder consisting of at least two leaf springs fixed at both ends is fixed, a contact is attached to the tip of the holder, and the holder is supported from below at any position in the vertical direction, thereby making contact with the contact. A contact sensor characterized by being provided with a support that adjusts pressure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988019035U JPH0619095Y2 (en) | 1988-02-16 | 1988-02-16 | Contact sensor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988019035U JPH0619095Y2 (en) | 1988-02-16 | 1988-02-16 | Contact sensor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01124576U true JPH01124576U (en) | 1989-08-24 |
| JPH0619095Y2 JPH0619095Y2 (en) | 1994-05-18 |
Family
ID=31234194
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988019035U Expired - Lifetime JPH0619095Y2 (en) | 1988-02-16 | 1988-02-16 | Contact sensor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0619095Y2 (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0459146U (en) * | 1990-09-28 | 1992-05-21 | ||
| JPH0459144U (en) * | 1990-09-28 | 1992-05-21 | ||
| JP4717144B2 (en) * | 2010-01-08 | 2011-07-06 | 日置電機株式会社 | Contact probe fixture |
| JP2014035335A (en) * | 2012-08-10 | 2014-02-24 | Micronics Japan Co Ltd | Contact probe and probe card |
| JP2016205911A (en) * | 2015-04-20 | 2016-12-08 | 日置電機株式会社 | Probe unit and method for manufacturing probe unit |
| JP2016205912A (en) * | 2015-04-20 | 2016-12-08 | 日置電機株式会社 | Probe unit and method for manufacturing probe unit |
| JP2017122663A (en) * | 2016-01-08 | 2017-07-13 | 日置電機株式会社 | Probe unit, probing mechanism, and substrate inspection device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6150048A (en) * | 1984-08-20 | 1986-03-12 | Nippon Seiko Kk | Probe-needle lifting device |
| JPS62163763U (en) * | 1986-04-08 | 1987-10-17 |
-
1988
- 1988-02-16 JP JP1988019035U patent/JPH0619095Y2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6150048A (en) * | 1984-08-20 | 1986-03-12 | Nippon Seiko Kk | Probe-needle lifting device |
| JPS62163763U (en) * | 1986-04-08 | 1987-10-17 |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0459146U (en) * | 1990-09-28 | 1992-05-21 | ||
| JPH0459144U (en) * | 1990-09-28 | 1992-05-21 | ||
| JP4717144B2 (en) * | 2010-01-08 | 2011-07-06 | 日置電機株式会社 | Contact probe fixture |
| JP2014035335A (en) * | 2012-08-10 | 2014-02-24 | Micronics Japan Co Ltd | Contact probe and probe card |
| JP2016205911A (en) * | 2015-04-20 | 2016-12-08 | 日置電機株式会社 | Probe unit and method for manufacturing probe unit |
| JP2016205912A (en) * | 2015-04-20 | 2016-12-08 | 日置電機株式会社 | Probe unit and method for manufacturing probe unit |
| JP2017122663A (en) * | 2016-01-08 | 2017-07-13 | 日置電機株式会社 | Probe unit, probing mechanism, and substrate inspection device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0619095Y2 (en) | 1994-05-18 |