JPH01118382U - - Google Patents

Info

Publication number
JPH01118382U
JPH01118382U JP1144988U JP1144988U JPH01118382U JP H01118382 U JPH01118382 U JP H01118382U JP 1144988 U JP1144988 U JP 1144988U JP 1144988 U JP1144988 U JP 1144988U JP H01118382 U JPH01118382 U JP H01118382U
Authority
JP
Japan
Prior art keywords
station
test
setting
tests
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1144988U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1144988U priority Critical patent/JPH01118382U/ja
Publication of JPH01118382U publication Critical patent/JPH01118382U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1144988U 1988-01-29 1988-01-29 Pending JPH01118382U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1144988U JPH01118382U (ko) 1988-01-29 1988-01-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1144988U JPH01118382U (ko) 1988-01-29 1988-01-29

Publications (1)

Publication Number Publication Date
JPH01118382U true JPH01118382U (ko) 1989-08-10

Family

ID=31220014

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1144988U Pending JPH01118382U (ko) 1988-01-29 1988-01-29

Country Status (1)

Country Link
JP (1) JPH01118382U (ko)

Similar Documents

Publication Publication Date Title
GB8918829D0 (en) On chip semiconductor memory arbitrary pattern,parallel test apparatus and method
JPH01118382U (ko)
JPS6447148U (ko)
JPS63159778U (ko)
GB9213630D0 (en) On chip semiconductor memory arbitrary pattern,parallel test apparatus and method
JPS5914443U (ja) 電話交換機の稼動状況測定装置
JPS6448684U (ko)
JPH02675U (ko)
JPH0215734U (ko)
JPS61127469U (ko)
JPH0259476U (ko)
JPH0227578U (ko)
JPS62170575U (ko)
JPS61117251U (ko)
JPS58189532U (ja) ウエ−ハ試験装置
JPS646044U (ko)
JPS60180086U (ja) 販売装置
JPS61139481U (ko)
JPS62187872U (ko)
JPS5970249U (ja) 信号テスト装置
JPS612202U (ja) 色覚異常検査表
JPS60144237U (ja) 半導体装置の検査装置
JPS59192839U (ja) ウエハの測定装置
JPS61143068U (ko)
JPH032273U (ko)