JPH01117580U - - Google Patents

Info

Publication number
JPH01117580U
JPH01117580U JP1288088U JP1288088U JPH01117580U JP H01117580 U JPH01117580 U JP H01117580U JP 1288088 U JP1288088 U JP 1288088U JP 1288088 U JP1288088 U JP 1288088U JP H01117580 U JPH01117580 U JP H01117580U
Authority
JP
Japan
Prior art keywords
array package
pin grid
grid array
lands
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1288088U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1288088U priority Critical patent/JPH01117580U/ja
Publication of JPH01117580U publication Critical patent/JPH01117580U/ja
Pending legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例1を示す斜視図、第2
図は同拡大断面図、第3図は本考案の実施例2を
示す拡大断面図、第4図は従来例を示す斜視図で
ある。 1……PGAパツケージ半導体、1a……ピン
、2……検査用治具、3……回路基板、4……ソ
ケツト、21……フレキシブルプリント基板、2
2……押え、23……穴、24……ランド、25
……信号線、26……プローブ接続端子、27…
…反発力、28……突起又はバンプ状導体。
Fig. 1 is a perspective view showing the first embodiment of the present invention; Fig. 2 is a perspective view showing the first embodiment of the present invention;
3 is an enlarged sectional view showing a second embodiment of the present invention, and FIG. 4 is a perspective view showing a conventional example. 1...PGA package semiconductor, 1a...pin, 2...inspection jig, 3...circuit board, 4...socket, 21...flexible printed circuit board, 2
2... Presser foot, 23... Hole, 24... Land, 25
...Signal line, 26...Probe connection terminal, 27...
...Repulsive force, 28...Protrusion or bump-shaped conductor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ピン・グリツド・アレイ・パツケージ半導体の
ピンに電気的に接触させるランド及び該ランドか
ら引き出された信号線を印刷したフレキシブルプ
リント基板と、該基板の裏面(ピン・グリツド・
アレイ・パツケージの装着面の反対側面)に設け
た弾力性のある押えとを有することを特徴とする
ピン・グリツド・アレイ・パツケージ半導体の検
査用治具。
Pin Grid Array Package A flexible printed circuit board with printed lands that electrically contact the pins of the semiconductor and signal lines drawn out from the lands, and the back side of the board (pin grid array package).
1. A jig for inspecting pin grid array package semiconductors, comprising a resilient presser provided on the opposite side of the mounting surface of the array package.
JP1288088U 1988-02-02 1988-02-02 Pending JPH01117580U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1288088U JPH01117580U (en) 1988-02-02 1988-02-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1288088U JPH01117580U (en) 1988-02-02 1988-02-02

Publications (1)

Publication Number Publication Date
JPH01117580U true JPH01117580U (en) 1989-08-08

Family

ID=31222715

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1288088U Pending JPH01117580U (en) 1988-02-02 1988-02-02

Country Status (1)

Country Link
JP (1) JPH01117580U (en)

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