JPH01105855U - - Google Patents
Info
- Publication number
- JPH01105855U JPH01105855U JP190688U JP190688U JPH01105855U JP H01105855 U JPH01105855 U JP H01105855U JP 190688 U JP190688 U JP 190688U JP 190688 U JP190688 U JP 190688U JP H01105855 U JPH01105855 U JP H01105855U
- Authority
- JP
- Japan
- Prior art keywords
- phosphorus
- rays
- fluorescent
- nickel
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 14
- 229910052759 nickel Inorganic materials 0.000 claims description 7
- 238000007747 plating Methods 0.000 claims description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims 5
- 229910052698 phosphorus Inorganic materials 0.000 claims 5
- 239000011574 phosphorus Substances 0.000 claims 5
- 239000000470 constituent Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000011088 calibration curve Methods 0.000 description 1
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
第１図は、本考案実施例のシステムブロツク図
であり、第２図は、無電解ニツケルメツキの検量
線の一例を示す説明図である。
であり、第２図は、無電解ニツケルメツキの検量
線の一例を示す説明図である。
Claims (1)
- 無電解ニツケルメツキ試料の構成元素であるニ
ツケルとリンのケイ光Ｘ線を発生させる為のＸ線
発生部と、それぞれのケイ光Ｘ線を検出する為の
半導体検出器と、軽元素のリンを検出する為の真
空試料室と、リンのケイ光Ｘ線を発生させる為の
低電圧とニツケルのケイ光Ｘ線を発生させる為の
高電圧を切換え可能な電源と、検出器からの信号
を処理するマルチチヤンネルアナライザーと厚み
演算部から構成され、リンのＸ線強度とニツケル
のＸ線強度から無電解ニツケルメツキのトータル
厚みと、リン濃度を測定する無電解ニツケルメツ
キ測定装置。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP190688U JPH01105855U (ja) | 1988-01-11 | 1988-01-11 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP190688U JPH01105855U (ja) | 1988-01-11 | 1988-01-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01105855U true JPH01105855U (ja) | 1989-07-17 |
Family
ID=31202204
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP190688U Pending JPH01105855U (ja) | 1988-01-11 | 1988-01-11 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01105855U (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06123717A (ja) * | 1992-10-11 | 1994-05-06 | Horiba Ltd | 複数条件螢光ｘ線定性分析方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57125834A (en) * | 1981-01-22 | 1982-08-05 | Le Nauchinoopuroizubuodosutobu | Fluorescent x rays spectrometer |
| JPS61170606A (ja) * | 1985-01-24 | 1986-08-01 | Seiko Instr & Electronics Ltd | 螢光ｘ線膜厚計 |
-
1988
- 1988-01-11 JP JP190688U patent/JPH01105855U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57125834A (en) * | 1981-01-22 | 1982-08-05 | Le Nauchinoopuroizubuodosutobu | Fluorescent x rays spectrometer |
| JPS61170606A (ja) * | 1985-01-24 | 1986-08-01 | Seiko Instr & Electronics Ltd | 螢光ｘ線膜厚計 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06123717A (ja) * | 1992-10-11 | 1994-05-06 | Horiba Ltd | 複数条件螢光ｘ線定性分析方法 |
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