JPH01100409A - Apparatus for inspecting positional shift of chip component - Google Patents

Apparatus for inspecting positional shift of chip component

Info

Publication number
JPH01100409A
JPH01100409A JP62257192A JP25719287A JPH01100409A JP H01100409 A JPH01100409 A JP H01100409A JP 62257192 A JP62257192 A JP 62257192A JP 25719287 A JP25719287 A JP 25719287A JP H01100409 A JPH01100409 A JP H01100409A
Authority
JP
Japan
Prior art keywords
chip component
image
positional shift
light
light cutting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62257192A
Other languages
Japanese (ja)
Other versions
JPH0726810B2 (en
Inventor
Yuji Takagi
Daisuke Katsuta
Seiji Hata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62257192A priority Critical patent/JPH0726810B2/en
Priority claimed from EP88117015A external-priority patent/EP0312046B1/en
Publication of JPH01100409A publication Critical patent/JPH01100409A/en
Publication of JPH0726810B2 publication Critical patent/JPH0726810B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE: To always stably inspect positional shift, by performing imaging so that the light cutting line projected on a substrate and a mounting chip component becomes horizontal in an image and analyzing the shape of the light cutting line in the image to detect the positional shift of the chip component.
CONSTITUTION: A printed circuit board having a chip component being an object to be inspected mounted thereon is mounted on an XY stage 5 and two slit light projectors 3 are arranged so that the light cutting lines allowed to irradiate the printed circuit board cross each other at a right angle. Further, the galvano mirror 4 controlled by an image processing control apparatus 8 is provided in order to control the irradiation positions of the projected slit light beams by reflecting said light. Then, two light cutting lines allowed to irradiate the printed circuit board are imaged in the horizontal direction within an image by two television cameras 1 and a half mirror 2. The shapes of the light cutting lines in the image are analyzed by the image processing control apparatus 8 to detect the positional shift of the chip component.
COPYRIGHT: (C)1989,JPO&Japio
JP62257192A 1987-10-14 1987-10-14 Chip component misalignment inspection device Expired - Lifetime JPH0726810B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62257192A JPH0726810B2 (en) 1987-10-14 1987-10-14 Chip component misalignment inspection device

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP62257192A JPH0726810B2 (en) 1987-10-14 1987-10-14 Chip component misalignment inspection device
EP88117015A EP0312046B1 (en) 1987-10-14 1988-10-13 Apparatus and method for inspecting defect of mounted component with slit light
DE3850840T DE3850840T2 (en) 1987-10-14 1988-10-13 Device and method for fault inspection in fastened components, using a light slot.
US07/257,969 US5076697A (en) 1987-10-14 1988-10-14 Apparatus and method for inspecting defect of mounted component with slit light

Publications (2)

Publication Number Publication Date
JPH01100409A true JPH01100409A (en) 1989-04-18
JPH0726810B2 JPH0726810B2 (en) 1995-03-29

Family

ID=17302957

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62257192A Expired - Lifetime JPH0726810B2 (en) 1987-10-14 1987-10-14 Chip component misalignment inspection device

Country Status (1)

Country Link
JP (1) JPH0726810B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003002311A (en) * 2001-06-20 2003-01-08 Japan Crown Cork Co Ltd Inspection method for bottle.cap assembly and apparatus for the same

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10224099A (en) 1997-02-04 1998-08-21 Fuji Mach Mfg Co Ltd Method for mounting circuit component and circuit component mounting system
JP5317468B2 (en) * 2007-12-19 2013-10-16 株式会社日立ハイテクノロジーズ Defect inspection equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003002311A (en) * 2001-06-20 2003-01-08 Japan Crown Cork Co Ltd Inspection method for bottle.cap assembly and apparatus for the same

Also Published As

Publication number Publication date
JPH0726810B2 (en) 1995-03-29

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