JP7845453B2 - 顕微鏡、画像処理装置、画像処理方法、及び画像処理プログラム - Google Patents

顕微鏡、画像処理装置、画像処理方法、及び画像処理プログラム

Info

Publication number
JP7845453B2
JP7845453B2 JP2024500745A JP2024500745A JP7845453B2 JP 7845453 B2 JP7845453 B2 JP 7845453B2 JP 2024500745 A JP2024500745 A JP 2024500745A JP 2024500745 A JP2024500745 A JP 2024500745A JP 7845453 B2 JP7845453 B2 JP 7845453B2
Authority
JP
Japan
Prior art keywords
state
image
optical system
sample
estimated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2024500745A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023157098A5 (https=
JPWO2023157098A1 (https=
Inventor
勇輝 照井
陽輔 藤掛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of JPWO2023157098A1 publication Critical patent/JPWO2023157098A1/ja
Publication of JPWO2023157098A5 publication Critical patent/JPWO2023157098A5/ja
Application granted granted Critical
Publication of JP7845453B2 publication Critical patent/JP7845453B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/006Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/241Devices for focusing
    • G02B21/244Devices for focusing using image analysis techniques
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
JP2024500745A 2022-02-15 2022-02-15 顕微鏡、画像処理装置、画像処理方法、及び画像処理プログラム Active JP7845453B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/006016 WO2023157098A1 (ja) 2022-02-15 2022-02-15 顕微鏡、画像処理装置、画像処理方法、及び画像処理プログラム

Publications (3)

Publication Number Publication Date
JPWO2023157098A1 JPWO2023157098A1 (https=) 2023-08-24
JPWO2023157098A5 JPWO2023157098A5 (https=) 2024-09-30
JP7845453B2 true JP7845453B2 (ja) 2026-04-14

Family

ID=87577768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024500745A Active JP7845453B2 (ja) 2022-02-15 2022-02-15 顕微鏡、画像処理装置、画像処理方法、及び画像処理プログラム

Country Status (5)

Country Link
US (1) US20240418971A1 (https=)
EP (1) EP4481464A4 (https=)
JP (1) JP7845453B2 (https=)
CN (1) CN118511103A (https=)
WO (1) WO2023157098A1 (https=)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015108837A (ja) 2015-01-07 2015-06-11 キヤノン株式会社 画像処理装置及び画像処理方法
JP2020154314A (ja) 2019-03-21 2020-09-24 カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh 高分解能走査顕微鏡のための方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6253266B2 (ja) * 2013-06-11 2017-12-27 オリンパス株式会社 共焦点画像生成装置
JP6284372B2 (ja) * 2014-01-21 2018-02-28 オリンパス株式会社 走査型レーザ顕微鏡および超解像画像生成方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015108837A (ja) 2015-01-07 2015-06-11 キヤノン株式会社 画像処理装置及び画像処理方法
JP2020154314A (ja) 2019-03-21 2020-09-24 カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh 高分解能走査顕微鏡のための方法

Also Published As

Publication number Publication date
US20240418971A1 (en) 2024-12-19
JPWO2023157098A1 (https=) 2023-08-24
EP4481464A4 (en) 2025-12-24
EP4481464A1 (en) 2024-12-25
WO2023157098A1 (ja) 2023-08-24
CN118511103A (zh) 2024-08-16

Similar Documents

Publication Publication Date Title
US10310246B2 (en) Converter, illuminator, and light sheet fluorescence microscope
JP6118441B2 (ja) 適応光学網膜結像装置及び方法
JP5721195B2 (ja) 光学特性測定装置及び光学特性測定方法
CN108601505B (zh) 成像设备、成像方法和成像系统
US10976532B2 (en) Structured illumination microscopy system using digital micromirror device and time-complex structured illumination, and operation method therefor
US12055491B2 (en) Focus scan type imaging device for imaging target object in sample that induces aberration
EP4212938B1 (en) Flying-over beam pattern scanning hologram microscope device using scan mirror and translation stage
JP2017219826A (ja) 波面制御器を用いた3次元屈折率映像撮影および蛍光構造化照明顕微鏡システムと、これを利用した方法
WO2019097587A1 (ja) 定量位相画像生成方法、定量位相画像生成装置およびプログラム
JP7472134B2 (ja) 試料の3次元領域の蛍光信号を検出するための方法および装置
EP3611549B1 (en) Aberration correction method and optical device
US10437050B2 (en) Phase-modulation-element adjustment system and method for decreasing wavefront aberration
US20160313548A1 (en) Method for capturing image of three-dimensional structure of specimen and microscopic device
Gilaberte Basset et al. Experimental analysis of image resolution of quantum imaging with undetected light through position correlations
KR101356706B1 (ko) 광량 변조와 스캐닝 시스템 기반의 구조 조명 현미경
EP3520074B1 (en) Method for the analysis of spatial and temporal information of samples by means of optical microscopy
KR101505745B1 (ko) 이중 검출 반사 공초점 현미경 및 이를 사용하는 시편의 높이의 정보를 검출하는 방법
WO2014150536A1 (en) Lightsheet microscopy with rotational-shear interferometry
JP7845453B2 (ja) 顕微鏡、画像処理装置、画像処理方法、及び画像処理プログラム
JP4852758B2 (ja) 電子顕微方法およびそれを用いた電子顕微鏡
RU2579640C1 (ru) Конфокальный спектроанализатор изображений
EP4546028A1 (en) Microscope device and data generation method
JP2019074594A (ja) 顕微鏡装置
Clark et al. Nonscanning three-dimensional differential holographic fluorescence microscopy
WO2016051283A2 (en) Interferometric system with variable optics for non-coherent light source and method of interferometric system alignment

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20240718

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240912

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20250729

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20250925

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20251121

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20260303

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20260316

R150 Certificate of patent or registration of utility model

Ref document number: 7845453

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150