JP7724024B2 - 量子ドット-遷移金属ダイカルコゲナイド異種接合を含む光活性層を備える光電子シナプス素子 - Google Patents
量子ドット-遷移金属ダイカルコゲナイド異種接合を含む光活性層を備える光電子シナプス素子Info
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- JP7724024B2 JP7724024B2 JP2024137059A JP2024137059A JP7724024B2 JP 7724024 B2 JP7724024 B2 JP 7724024B2 JP 2024137059 A JP2024137059 A JP 2024137059A JP 2024137059 A JP2024137059 A JP 2024137059A JP 7724024 B2 JP7724024 B2 JP 7724024B2
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- H10K30/35—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising bulk heterojunctions, e.g. interpenetrating networks of donor and acceptor material domains comprising inorganic nanostructures, e.g. CdSe nanoparticles
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- C09K11/00—Luminescent materials, e.g. electroluminescent or chemiluminescent
- C09K11/02—Use of particular materials as binders, particle coatings or suspension media therefor
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- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B19/00—Selenium; Tellurium; Compounds thereof
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- C09K11/00—Luminescent materials, e.g. electroluminescent or chemiluminescent
- C09K11/08—Luminescent materials, e.g. electroluminescent or chemiluminescent containing inorganic luminescent materials
- C09K11/74—Luminescent materials, e.g. electroluminescent or chemiluminescent containing inorganic luminescent materials containing arsenic, antimony or bismuth
- C09K11/7492—Arsenides; Nitrides; Phosphides
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
- H10F30/287—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors the devices having PN heterojunction gates
- H10F30/2877—Field-effect phototransistors having PN heterojunction gates
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
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- H10F77/12—Active materials
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/143—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies comprising quantum structures
- H10F77/1433—Quantum dots
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/20—Particle morphology extending in two dimensions, e.g. plate-like
- C01P2004/24—Nanoplates, i.e. plate-like particles with a thickness from 1-100 nanometer
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/40—Electric properties
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- Inorganic Chemistry (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Light Receiving Elements (AREA)
- Manufacturing & Machinery (AREA)
Description
10:基板
20:無機系量子ドット
30:2次元半導体物質
40:光活性層
50:電極
Claims (10)
- シリコンオキシド基板の上に2次元半導体物質を合成するステップと、
前記2次元半導体物質を他の半導体基板の上にウェット転写して2次元半導体物質層を形成するステップと、
前記2次元半導体物質層上の一部に互いに離れて配置される複数の金属層を蒸着して電極層を形成するステップと、
前記2次元半導体物質層上の他の一部の表面に無機系量子ドットを含むコロイド溶液及びリガンド溶液を塗布し、コーティングした後に乾燥させて光活性層を形成するステップと、
を含み、
前記無機系量子ドットと前記2次元半導体物質層は、直接的に接触して異種接合を形成する部分を有し、
前記リガンド溶液は、有機リガンドと有機溶媒とが混合された混合溶液であって、前記有機リガンドは、C1~C8の短い炭素鎖又は環を備え、チオール(thiol)基、アミン(amine)基、カルボキシル基(carboxyl group)及びこれらの組み合わせのうちから選択されるいずれか1種以上の官能基を含み、
前記無機系量子ドットのうち、前記異種接合の形成されない表面の少なくとも一部が前記有機リガンドにより覆われる
ことを特徴とする光電子シナプス素子の製造方法。 - 前記光活性層において受け入れ可能な光の波長は、可視光~近赤外線の波長範囲を含む
請求項1に記載の光電子シナプス素子の製造方法。 - 前記無機系量子ドットは、バンドギャップが1.2eV以下である
請求項1に記載の光電子シナプス素子の製造方法。 - 前記無機系量子ドットは、InAs、PbS、CdS、GaAs、InGaAs、InP、GaInP及びこれらのうちから選択される2種以上の組み合わせを含む
請求項1に記載の光電子シナプス素子の製造方法。 - 前記2次元半導体物質は、遷移金属ダイカルコゲナイドを含む
請求項1に記載の光電子シナプス素子の製造方法。 - 前記遷移金属ダイカルコゲナイドは、化学式MX2で表され、
前記Mは、遷移金属元素であって、Mo、W、Nb、V、Ta、Ti、Zr、Hf、Tc、Re、Ru、Co、Pd、Pt、Cu、Ga、In、Sn、Ge、Pb又はこれらのうちから選択される2種以上の組み合わせを含み、
前記Xは、カルコゲン(chalcogen)元素であって、S、Se、Te又はこれらのうちから選択される2種以上の組み合わせを含む
請求項5に記載の光電子シナプス素子の製造方法。 - 前記2次元半導体物質層は、単層又は2層以上の複層である
請求項1に記載の光電子シナプス素子の製造方法。 - 前記有機リガンドは、1,2-エタンジチオール(EDT)、3-メルカプトプロピオン酸(MPA)、ベンゼンジチオール(BZT)のチオール(thiol)系リガンド;エチレンジアミン(EDA)、チオシアン酸アンモニウム(SCN)のアミン(amine)系リガンド;及びこれらのうちから選択される少なくとも2種以上の組み合わせを含む
請求項1に記載の光電子シナプス素子の製造方法。 - 前記光活性層を形成するステップは、常温下で行われる
請求項1に記載の光電子シナプス素子の製造方法。 - 前記電極層は、金属又は金属化合物を含み、
前記金属又は金属化合物は、Ti、Ni、Cr/Au、Ag及びこれらのうちから選択される2種以上の組み合わせを含む金属元素を含む
請求項1に記載の光電子シナプス素子の製造方法。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2023-0151914 | 2023-11-06 | ||
| KR1020230151914A KR102686025B1 (ko) | 2023-11-06 | 2023-11-06 | 양자점-전이금속 디칼코게나이드 이종접합을 포함하는 광활성층을 구비하는 광전자 시냅스 소자 |
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| Publication Number | Publication Date |
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| JP2025077985A JP2025077985A (ja) | 2025-05-19 |
| JP7724024B2 true JP7724024B2 (ja) | 2025-08-15 |
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| JP2024137059A Active JP7724024B2 (ja) | 2023-11-06 | 2024-08-16 | 量子ドット-遷移金属ダイカルコゲナイド異種接合を含む光活性層を備える光電子シナプス素子 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12428595B2 (ja) |
| EP (1) | EP4550986B1 (ja) |
| JP (1) | JP7724024B2 (ja) |
| KR (1) | KR102686025B1 (ja) |
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| JP2001156298A (ja) | 1999-11-26 | 2001-06-08 | Sony Corp | 半導体素子 |
| US20140374699A1 (en) | 2013-06-20 | 2014-12-25 | Seoul National University R&Db Foundation | Single photon device, apparatus for emitting and transferring single photon, and methods of manufacturing and operating the same |
| CN111211186A (zh) | 2020-01-17 | 2020-05-29 | 长春理工大学 | 一种提高光电探测性能的MoS2光电晶体管及其制备方法 |
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| CN111628038A (zh) | 2019-02-27 | 2020-09-04 | 中国科学院苏州纳米技术与纳米仿生研究所 | 神经元系统、感光类神经元器件及其制作方法和应用 |
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- 2023-11-06 KR KR1020230151914A patent/KR102686025B1/ko active Active
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- 2024-08-14 US US18/804,518 patent/US12428595B2/en active Active
- 2024-08-16 JP JP2024137059A patent/JP7724024B2/ja active Active
- 2024-08-21 EP EP24195527.7A patent/EP4550986B1/en active Active
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| JP2001156298A (ja) | 1999-11-26 | 2001-06-08 | Sony Corp | 半導体素子 |
| US20140374699A1 (en) | 2013-06-20 | 2014-12-25 | Seoul National University R&Db Foundation | Single photon device, apparatus for emitting and transferring single photon, and methods of manufacturing and operating the same |
| JP2020526933A (ja) | 2017-07-11 | 2020-08-31 | フンダシオ インスティチュート デ サイエンセズ フォトニクス | 光電子装置、光電子装置のノイズを抑制するための方法、及びその使用 |
| CN111628038A (zh) | 2019-02-27 | 2020-09-04 | 中国科学院苏州纳米技术与纳米仿生研究所 | 神经元系统、感光类神经元器件及其制作方法和应用 |
| CN111211186A (zh) | 2020-01-17 | 2020-05-29 | 长春理工大学 | 一种提高光电探测性能的MoS2光电晶体管及其制备方法 |
| CN113410320A (zh) | 2021-05-25 | 2021-09-17 | 常熟理工学院 | 一种宽光谱响应光电探测器及其制备方法 |
| CN113990971A (zh) | 2021-10-11 | 2022-01-28 | 华南师范大学 | 一种基于量子点超晶格和二维材料复合的光电探测器 |
| US20230022795A1 (en) | 2022-07-07 | 2023-01-26 | Beihang University | Dual-floating gates optoelectronic self-exciting synaptic memristor |
| CN115666142A (zh) | 2022-11-01 | 2023-01-31 | 同济大学 | 一种具有宽光谱响应的突触晶体管器件及其制备方法 |
| CN116156976A (zh) | 2022-12-20 | 2023-05-23 | 深圳大学 | 一种光电突触器件及其制备方法 |
| CN116914015A (zh) | 2023-07-07 | 2023-10-20 | 电子科技大学 | 一种基于碲-二硫化钼异质结光电人工突触及其制备方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP4550986B1 (en) | 2025-10-22 |
| US12428595B2 (en) | 2025-09-30 |
| KR102686025B1 (ko) | 2024-07-18 |
| EP4550986A1 (en) | 2025-05-07 |
| US20250145884A1 (en) | 2025-05-08 |
| JP2025077985A (ja) | 2025-05-19 |
| EP4550986C0 (en) | 2025-10-22 |
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