JP7719063B2 - 異常変調原因表示装置、異常変調原因表示方法及び異常変調原因表示プログラム - Google Patents

異常変調原因表示装置、異常変調原因表示方法及び異常変調原因表示プログラム

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Publication number
JP7719063B2
JP7719063B2 JP2022526580A JP2022526580A JP7719063B2 JP 7719063 B2 JP7719063 B2 JP 7719063B2 JP 2022526580 A JP2022526580 A JP 2022526580A JP 2022526580 A JP2022526580 A JP 2022526580A JP 7719063 B2 JP7719063 B2 JP 7719063B2
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Japan
Prior art keywords
cause
process data
modulation
output
degree
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JP2022526580A
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English (en)
Japanese (ja)
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JPWO2021241577A5 (https=
JPWO2021241577A1 (https=
Inventor
英俊 小園
祐樹 武次
弘康 近藤
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Daicel Corp
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Daicel Corp
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Publication of JPWO2021241577A5 publication Critical patent/JPWO2021241577A5/ja
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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0262—Confirmation of fault detection, e.g. extra checks to confirm that a failure has indeed occurred
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2022526580A 2020-05-29 2021-05-25 異常変調原因表示装置、異常変調原因表示方法及び異常変調原因表示プログラム Active JP7719063B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020095037 2020-05-29
JP2020095037 2020-05-29
PCT/JP2021/019799 WO2021241577A1 (ja) 2020-05-29 2021-05-25 異常変調原因表示装置、異常変調原因表示方法及び異常変調原因表示プログラム

Publications (3)

Publication Number Publication Date
JPWO2021241577A1 JPWO2021241577A1 (https=) 2021-12-02
JPWO2021241577A5 JPWO2021241577A5 (https=) 2024-05-30
JP7719063B2 true JP7719063B2 (ja) 2025-08-05

Family

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Family Applications (1)

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JP2022526580A Active JP7719063B2 (ja) 2020-05-29 2021-05-25 異常変調原因表示装置、異常変調原因表示方法及び異常変調原因表示プログラム

Country Status (5)

Country Link
US (1) US20230205194A1 (https=)
EP (1) EP4160338A4 (https=)
JP (1) JP7719063B2 (https=)
CN (1) CN115698880B (https=)
WO (1) WO2021241577A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4250035A1 (en) * 2022-03-24 2023-09-27 Rolls-Royce Deutschland Ltd & Co KG System and method for machine diagnosis
JP2024145659A (ja) 2023-03-31 2024-10-15 株式会社ダイセル ガイダンス表示方法、ガイダンス表示システム及びガイダンス表示プログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006276924A (ja) 2005-03-28 2006-10-12 Hitachi Ltd 設備機器診断装置及び設備機器診断プログラム

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US4862950A (en) * 1988-11-22 1989-09-05 Gribble Robert L Apparatus and method for controlling the environment in a substantially enclosed and pressurized work area such as a textile manufacturing plant
JPH02236199A (ja) * 1989-03-09 1990-09-19 Toshiba Corp プロセス診断装置
JPH06309584A (ja) * 1993-04-27 1994-11-04 Toshiba Corp プラント運転支援装置
US6907545B2 (en) * 2001-03-02 2005-06-14 Pitney Bowes Inc. System and method for recognizing faults in machines
JP3699676B2 (ja) 2001-11-29 2005-09-28 ダイセル化学工業株式会社 プラント制御監視装置
JP2009284119A (ja) * 2008-05-21 2009-12-03 Yokogawa Electric Corp フィールドバス通信システム及びデータ管理装置
JP2014056598A (ja) * 2013-11-14 2014-03-27 Hitachi Ltd 異常検知方法及びそのシステム
CN104298225B (zh) * 2014-09-25 2017-07-04 中国石油化工股份有限公司 化工过程异常工况因果关系推理模型建模与图形化展示方法
JPWO2017109903A1 (ja) * 2015-12-24 2018-03-22 株式会社東芝 異常原因推定装置及び異常原因推定方法
CN107196780A (zh) * 2016-03-15 2017-09-22 伊姆西公司 用于管理设备的故障的方法和装置
US10169133B2 (en) * 2016-04-26 2019-01-01 Juniper Networks, Inc. Method, system, and apparatus for debugging networking malfunctions within network nodes
US20210116331A1 (en) * 2016-12-08 2021-04-22 Nec Corporation Anomaly analysis method, program, and system
EP3598350A4 (en) * 2017-03-15 2020-04-22 FUJIFILM Corporation OPTIMAL SOLUTION EVALUATION METHOD, OPTIMAL SOLUTION EVALUATION PROGRAM, AND OPTIMAL SOLUTION EVALUATION DEVICE
US11586981B2 (en) * 2017-12-11 2023-02-21 Nec Corporation Failure analysis device, failure analysis method, and failure analysis program
JP6698715B2 (ja) * 2018-01-23 2020-05-27 三菱重工業株式会社 設備状態監視装置および設備状態監視方法
CN108596229B (zh) * 2018-04-13 2021-09-10 北京华电智慧科技产业有限公司 在线异常的监测诊断方法和系统

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006276924A (ja) 2005-03-28 2006-10-12 Hitachi Ltd 設備機器診断装置及び設備機器診断プログラム

Also Published As

Publication number Publication date
CN115698880A (zh) 2023-02-03
EP4160338A1 (en) 2023-04-05
CN115698880B (zh) 2026-02-24
US20230205194A1 (en) 2023-06-29
EP4160338A4 (en) 2024-07-10
WO2021241577A1 (ja) 2021-12-02
JPWO2021241577A1 (https=) 2021-12-02

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