JP7705904B2 - インビトロ診断システムにおける制御ループベースの値調整 - Google Patents

インビトロ診断システムにおける制御ループベースの値調整 Download PDF

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JP7705904B2
JP7705904B2 JP2023114841A JP2023114841A JP7705904B2 JP 7705904 B2 JP7705904 B2 JP 7705904B2 JP 2023114841 A JP2023114841 A JP 2023114841A JP 2023114841 A JP2023114841 A JP 2023114841A JP 7705904 B2 JP7705904 B2 JP 7705904B2
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vitro diagnostic
deviations
assay
reference value
control
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JP2024012164A5 (enExample
JP2024012164A (ja
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マイク・ボルンマン
ウルリヒ・シュレーダー
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シーメンス ヘルスケア ダイアグノスティクス プロダクツ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G01N2035/00702—Curve-fitting; Parameter matching; Calibration constants

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  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
JP2023114841A 2022-07-14 2023-07-13 インビトロ診断システムにおける制御ループベースの値調整 Active JP7705904B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP22184856.7 2022-07-14
EP22184856.7A EP4306963A1 (de) 2022-07-14 2022-07-14 Regelkreis-basierte wertanpassung in in-vitro-diagnose-systemen

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JP2024012164A JP2024012164A (ja) 2024-01-25
JP2024012164A5 JP2024012164A5 (enExample) 2024-02-26
JP7705904B2 true JP7705904B2 (ja) 2025-07-10

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US (1) US20240019452A1 (enExample)
EP (1) EP4306963A1 (enExample)
JP (1) JP7705904B2 (enExample)
CN (1) CN117405910A (enExample)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001165934A (ja) 1999-12-06 2001-06-22 Toshiba Corp 自動分析装置及び自動分析システム
CN101038293A (zh) 2006-03-14 2007-09-19 株式会社日立高新技术 精度管理系统
JP2017187473A (ja) 2016-03-31 2017-10-12 シスメックス株式会社 診断分析装置において精度管理を行う方法およびシステム
DE102019202633A1 (de) 2019-02-27 2019-05-16 Siemens Schweiz Ag Verfahren und Vorrichtung zum Abgleich eines Gasmelders sowie eines kombinierten Rauch-/Gasmelders
JP2019527359A (ja) 2016-07-21 2019-09-26 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． キュベット間の基準測定値を用いた電源ランプの強度ドリフト効果の除去

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60238202D1 (de) * 2001-08-22 2010-12-16 Instrumentation Lab Co Verfahren und vorrichtung zur kalibrierung von sensoren
GB201811927D0 (en) * 2018-07-20 2018-09-05 Experiment X Ltd Lateral flow test strip immunoassay in vitro diagnostic device
JP7573247B2 (ja) * 2020-09-23 2024-10-25 国立研究開発法人産業技術総合研究所 アッセイ装置及びアッセイ方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001165934A (ja) 1999-12-06 2001-06-22 Toshiba Corp 自動分析装置及び自動分析システム
CN101038293A (zh) 2006-03-14 2007-09-19 株式会社日立高新技术 精度管理系统
JP2017187473A (ja) 2016-03-31 2017-10-12 シスメックス株式会社 診断分析装置において精度管理を行う方法およびシステム
JP2019527359A (ja) 2016-07-21 2019-09-26 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． キュベット間の基準測定値を用いた電源ランプの強度ドリフト効果の除去
DE102019202633A1 (de) 2019-02-27 2019-05-16 Siemens Schweiz Ag Verfahren und Vorrichtung zum Abgleich eines Gasmelders sowie eines kombinierten Rauch-/Gasmelders

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Publication number Publication date
EP4306963A1 (de) 2024-01-17
CN117405910A (zh) 2024-01-16
JP2024012164A (ja) 2024-01-25
US20240019452A1 (en) 2024-01-18

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