JP7687768B2 - 不揮発性メモリの自動インクリメント書き込みカウント - Google Patents

不揮発性メモリの自動インクリメント書き込みカウント Download PDF

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JP7687768B2
JP7687768B2 JP2020150180A JP2020150180A JP7687768B2 JP 7687768 B2 JP7687768 B2 JP 7687768B2 JP 2020150180 A JP2020150180 A JP 2020150180A JP 2020150180 A JP2020150180 A JP 2020150180A JP 7687768 B2 JP7687768 B2 JP 7687768B2
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memory
write
write count
data
memory arrays
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JP2021111333A5 (enExample
JP2021111333A (ja
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カワミ シェコウフェー
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Intel Corp
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Intel Corp
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    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1044Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution
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    • G06F11/0751Error or fault detection not based on redundancy
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    • G06F9/30Arrangements for executing machine instructions, e.g. instruction decode
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    • G06F9/46Multiprogramming arrangements
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    • G06F9/46Multiprogramming arrangements
    • G06F9/54Interprogram communication
    • G06F9/546Message passing systems or structures, e.g. queues
    • GPHYSICS
    • G11INFORMATION STORAGE
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    • G11C16/06Auxiliary circuits, e.g. for writing into memory
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    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • G11C16/3495Circuits or methods to detect or delay wearout of nonvolatile EPROM or EEPROM memory devices, e.g. by counting numbers of erase or reprogram cycles, by using multiple memory areas serially or cyclically
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/004Error avoidance
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    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/3003Monitoring arrangements specially adapted to the computing system or computing system component being monitored
    • G06F11/3034Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system component is a storage system, e.g. DASD based or network based
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/3003Monitoring arrangements specially adapted to the computing system or computing system component being monitored
    • G06F11/3037Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system component is a memory, e.g. virtual memory, cache
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/34Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/88Monitoring involving counting
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021Auxiliary circuits
    • G11C13/0069Writing or programming circuits or methods
    • G11C2013/0076Write operation performed depending on read result
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22Control and timing of internal memory operations
    • G11C2207/2263Write conditionally, e.g. only if new data and old data differ

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Software Systems (AREA)
  • Quality & Reliability (AREA)
  • Computer Security & Cryptography (AREA)
  • Multimedia (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Memory System (AREA)
JP2020150180A 2020-01-14 2020-09-07 不揮発性メモリの自動インクリメント書き込みカウント Active JP7687768B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/742,332 2020-01-14
US16/742,332 US11200113B2 (en) 2020-01-14 2020-01-14 Auto-increment write count for nonvolatile memory

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JP2021111333A JP2021111333A (ja) 2021-08-02
JP2021111333A5 JP2021111333A5 (enExample) 2025-01-29
JP7687768B2 true JP7687768B2 (ja) 2025-06-03

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US (1) US11200113B2 (enExample)
EP (1) EP3852109B1 (enExample)
JP (1) JP7687768B2 (enExample)
KR (1) KR20210091647A (enExample)
CN (1) CN113129949A (enExample)

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US11373705B2 (en) * 2020-11-23 2022-06-28 Micron Technology, Inc. Dynamically boosting read voltage for a memory device
US11971815B2 (en) * 2021-08-31 2024-04-30 Micron Technology, Inc. Write budget control of time-shift buffer for streaming devices
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JP2007517320A (ja) 2003-12-30 2007-06-28 サンディスク コーポレイション ホストの使用特性に基づいたフラッシュメモリのアドレスマッピングの適応的モード切り換え
JP2012027649A (ja) 2010-07-22 2012-02-09 Toshiba Corp データ記憶装置及びデータ読み出し方法
JP2013246533A (ja) 2012-05-24 2013-12-09 Sony Corp 電子機器、メモリ管理システムおよびメモリ管理方法
JP2017504920A (ja) 2013-12-30 2017-02-09 インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation 不揮発性メモリ・アレイを含むデータ・ストレージ・システムを動作させるための方法、システム及びコンピュータ・プログラム
JP2016133874A (ja) 2015-01-16 2016-07-25 ルネサスエレクトロニクス株式会社 情報処理装置及びフラッシュメモリ制御方法
JP2017157214A (ja) 2016-03-03 2017-09-07 三星電子株式会社Samsung Electronics Co.,Ltd. インモジュール機能を遂行するメモリモジュール
JP2018120346A (ja) 2017-01-24 2018-08-02 日本電気株式会社 情報処理システムおよび情報処理システムの制御方法
JP2019106174A (ja) 2017-12-14 2019-06-27 インテル・コーポレーション 記憶デバイスにおけるシステムタイムスタンプを用いたバックグラウンドデータ・リフレッシュ
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CN113129949A (zh) 2021-07-16
EP3852109A1 (en) 2021-07-21
US20200151052A1 (en) 2020-05-14
US11200113B2 (en) 2021-12-14
JP2021111333A (ja) 2021-08-02
KR20210091647A (ko) 2021-07-22
EP3852109B1 (en) 2025-04-30

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