JP7550970B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP7550970B2
JP7550970B2 JP2023517057A JP2023517057A JP7550970B2 JP 7550970 B2 JP7550970 B2 JP 7550970B2 JP 2023517057 A JP2023517057 A JP 2023517057A JP 2023517057 A JP2023517057 A JP 2023517057A JP 7550970 B2 JP7550970 B2 JP 7550970B2
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measured
data
output information
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Japanese (ja)
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JPWO2022230282A1 (https=
JPWO2022230282A5 (https=
Inventor
真 野上
陸 田村
健一郎 西木
和之 杉目
雄一郎 橋本
敏明 片野
益之 杉山
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Hitachi High Tech Corp
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Hitachi High Tech Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8665—Signal analysis for calibrating the measuring apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/88—Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N2030/022—Column chromatography characterised by the kind of separation mechanism
    • G01N2030/027—Liquid chromatography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/88—Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86
    • G01N2030/8804—Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86 automated systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G01N2035/009—Displaying information to the operator alarms, e.g. audible
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0006—Calibrating gas analysers

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  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2023517057A 2021-04-27 2022-02-02 自動分析装置 Active JP7550970B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021074742 2021-04-27
JP2021074742 2021-04-27
PCT/JP2022/004104 WO2022230282A1 (ja) 2021-04-27 2022-02-02 自動分析装置

Publications (3)

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JPWO2022230282A1 JPWO2022230282A1 (https=) 2022-11-03
JPWO2022230282A5 JPWO2022230282A5 (https=) 2024-03-29
JP7550970B2 true JP7550970B2 (ja) 2024-09-13

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JP2023517057A Active JP7550970B2 (ja) 2021-04-27 2022-02-02 自動分析装置

Country Status (5)

Country Link
US (1) US20240361346A1 (https=)
EP (1) EP4332579A4 (https=)
JP (1) JP7550970B2 (https=)
CN (1) CN117321421A (https=)
WO (1) WO2022230282A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026069869A1 (ja) * 2024-09-26 2026-04-02 株式会社日立ハイテク 自動分析装置のギアポンプの性能予兆システムおよびギアポンプの性能予兆方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115834363B (zh) * 2022-11-07 2025-01-24 国网黑龙江省电力有限公司供电服务中心 一种基于hplc的通信故障诊断定位装置及系统
JPWO2024218866A1 (https=) * 2023-04-18 2024-10-24
CN121443948A (zh) 2023-07-06 2026-01-30 株式会社日立高新技术 液相色谱装置及其异常检知方法
JP2025024282A (ja) * 2023-08-07 2025-02-20 株式会社日立ハイテク 故障個所推定方法、及び液体クロマトグラフ
WO2026070108A1 (ja) * 2024-09-27 2026-04-02 株式会社日立ハイテク 自動分析装置
CN119936426B (zh) * 2025-04-08 2025-10-03 深圳市帝迈生物技术有限公司 一种样本分析仪及样本分析仪故障的处理方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005283332A (ja) 2004-03-30 2005-10-13 Shimadzu Corp バリデーションシステム及びバリデーションプログラム
WO2019111312A1 (ja) 2017-12-05 2019-06-13 株式会社島津製作所 生体試料分析システム
JP2020525798A (ja) 2017-07-04 2020-08-27 エフ ホフマン−ラ ロッシュ アクチェン ゲゼルシャフト 自動臨床診断システムおよび方法
WO2020212431A1 (en) 2019-04-16 2020-10-22 De Leeneer Yves Joseph Guy Breakwater

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006009251A1 (ja) * 2004-07-22 2006-01-26 Wako Pure Chemical Industries, Ltd. 分析支援方法、分析装置、遠隔コンピュータ、データ解析方法及びプログラム並びに試薬容器
JP4578519B2 (ja) 2007-12-28 2010-11-10 シスメックス株式会社 臨床検体処理装置および臨床検体処理システム
US9953141B2 (en) * 2009-11-18 2018-04-24 Becton, Dickinson And Company Laboratory central control unit method and system
WO2020084886A1 (ja) * 2018-10-25 2020-04-30 株式会社日立ハイテク 自動分析装置
US12529709B2 (en) * 2019-07-04 2026-01-20 Hitachi High-Tech Corporation Automatic analysis device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005283332A (ja) 2004-03-30 2005-10-13 Shimadzu Corp バリデーションシステム及びバリデーションプログラム
JP2020525798A (ja) 2017-07-04 2020-08-27 エフ ホフマン−ラ ロッシュ アクチェン ゲゼルシャフト 自動臨床診断システムおよび方法
WO2019111312A1 (ja) 2017-12-05 2019-06-13 株式会社島津製作所 生体試料分析システム
WO2020212431A1 (en) 2019-04-16 2020-10-22 De Leeneer Yves Joseph Guy Breakwater

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026069869A1 (ja) * 2024-09-26 2026-04-02 株式会社日立ハイテク 自動分析装置のギアポンプの性能予兆システムおよびギアポンプの性能予兆方法

Also Published As

Publication number Publication date
JPWO2022230282A1 (https=) 2022-11-03
US20240361346A1 (en) 2024-10-31
WO2022230282A1 (ja) 2022-11-03
EP4332579A1 (en) 2024-03-06
EP4332579A4 (en) 2025-04-02
CN117321421A (zh) 2023-12-29

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